CN1786740A - Apparatus for controlling thickness of digital optical film - Google Patents
Apparatus for controlling thickness of digital optical film Download PDFInfo
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- CN1786740A CN1786740A CNA2005100615647A CN200510061564A CN1786740A CN 1786740 A CN1786740 A CN 1786740A CN A2005100615647 A CNA2005100615647 A CN A2005100615647A CN 200510061564 A CN200510061564 A CN 200510061564A CN 1786740 A CN1786740 A CN 1786740A
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Abstract
The invention relates to digital blooming thickness control instrument. It includes amplifier, filter, A/D module, embedded computing system, keyboard, display, switch, memory unit, and communicating interface. The amplifier is connected to reference signal, test signal, and filter. The filter is connected to A/D module. The embedded computing system is connected to A/D module, keyboard, display, switch, memory unit, and communicating interface. Its features are that the embedded computing system is set software program; and it practices control, tracing display, parameter setting and communicating according to initial setting value and keyboard entry. The invention has reasonable structure. And it is safe and reliable. It can use software to realize signal transformation, digital filtering, phase-locking and operation, reduce electron circuit mutual interference, and increase the complete machine anti-jamming capability and blooming production qualification rate.
Description
Technical field:
The present invention relates to a kind of apparatus for controlling thickness of digital optical film, it is mainly used in the optical coating field.
Background technology:
Optical thin film is widely used in sciemtifec and technical spheres such as spectral analysis, laser technology, chemical industry, space flight, large-scale precision instrument, and the accurate control of optical film thickness is the gordian technique of preparation optical thin film.The normally used method for supervising of people mainly contains optical monitor and quartz crystal vibration monitoring method.Optical monitor is at present in optical film thickness control method, and widely used a kind of, it adopts photoelectric photometry, and directly MEASUREMENTS OF THIN transmissivity or reflectivity extreme value realize the control to optical film thickness.Typical optical thin film instrument as shown in Figure 1.
The film thickness monitoring system antijamming capability of existing optical monitor, the main cause of less stable have:
1. monitoring light shines directly into this structure on the monochromator entrance slit in the existing system, make that anti-vibration ability, the eliminating parasitic light ability of system are more weak, and the job stability of light source, photomultiplier and power supply source thereof also influences the stability of monitor signal.Therefore in monitoring system, require the very high disturbance rejection ability of will having of film thickness monitoring system, and existing mimic channel optical thin film instrument is to reach.
2. the reliability and stability of the mimic channel Filtering Processing of existing mimic channel optical thin film instrument are lower, change the filtering parameter difficulty; And analog phase-locked look exist direct current zero point drift, parts saturated, must carry out problems such as initial calibration.
3. for the mimic channel of complexity, the phase mutual interference all affects Signal Processing between the quality good or not of electronic element and the circuit; Only adopt Design of Simulating Circuits in addition, also can't carry out the various algorithm process of specific aim, affect the precision and the stability of monitor signal various signal errorss.
4. existing plated film production run mainly relies on eye-observation and manual operations.Because the operator has artificial subjectivity and empirical when working, especially near extreme point, the variation of light intensity signal is very slow, promptly and accurately judge, is difficult to guarantee the quality and the repeatability of plated film.
5. part is furnished with composition systems such as computer control system great majority employing industrial computer or Programmable Logic Controller, hardware cost height; And generally only be used for the final data Treatment Analysis, rather than signal Processing.
6. have and adopt single-chip microcomputer, complete machine mainly still adopts Analog Circuit Design, because of the function restriction, also only carries out digital sample, conversion and transmission effect, is unrealized to realize extremum method and fixed value method control by algorithm, reach real and judge automatically.
Summary of the invention:
Technical matters to be solved by this invention is to overcome above shortcomings in the prior art, and provide a kind of simple in structure, with low cost, automatically operation and precision height, stability is high, reliability is high, the apparatus for controlling thickness of digital optical film of highly versatile.
In the optical vacuum coating process, stable, the hot-tempered and accurate control of pressure of optical film thickness pilot signal are the gordian techniquies of preparation optical thin film, and it directly affects optical thin film components and parts performance parameter.In monitoring film thickness process, reflectivity (or transmissivity) to film is measured, and measurement result is used for the film Thickness Control, when in case measurement numerical value reaches with desired thickness, just stop deposit immediately, close baffle plate and cut off the evaporation source power supply stopping the rete evaporation, thereby realize control film thickness.
According to the principle of Film Optics, when adopting the extreme value monitoring, the accurate control of optical film thickness depends on the accurate judgement to extreme point, because light intensity signal in the variation of extreme value place slowly, so responsive especially to noise.The present invention adopts software engineering to address this problem in embedded computer system.
The present invention solves the problems of the technologies described above the technical scheme that is adopted: this apparatus for controlling thickness of digital optical film, comprise amplifier, wave filter, the A/D module, embedded computer system, keyboard, display, switch, storer and communication interface, amplifier and reference signal, test signal and wave filter connect, wave filter is connected with the A/D module, embedded computer system and A/D module, keyboard, display, switch, storer is connected with communication interface, it is characterized in that being provided with software program in the described embedded computer system, control according to initial set value and keyboard input, tracing display, parameter is provided with and communication.
Control setting of the present invention has the control initialization, keyboard scan, signal Processing, curve fitting, switch control, video data, display waveform and data storage, its utilization computerized optimization technique carries out signal Processing to reference signal and measuring-signal, the data that collect in a period of time are carried out curve fitting, obtain the overall variation trend of signal, and by analysis to this trend, prejudge the size of extreme value and the moment that extreme value occurs, thereby gauge tap is in time closed plate washer, stop the rete evaporation, realize exactly the extreme value monitoring is monitored and crossed to the extreme value of rete.
Signal Processing of the present invention is provided with the signal Processing initialization, read reference signal, numeral is phase-locked, the reference signal division, read measuring-signal, subtraction process, Fourier transform, digital filtering, inverse fourier transform and medium filtering, wherein reference signal obtains reference signal data with the measuring-signal balance through the reference signal division, automatic size state correction reference signal coefficient according to the measuring-signal source, reading measuring-signal collection and reference signal has the measuring-signal data of the phase-locked relation of same frequency, subtraction process is subtracted each other measuring-signal data and reference signal data and is obtained subtraction data, described numeral is phase-locked, the combination of reference signal division and subtraction process is used for carrying out optical compensation, eliminate the influence of touching interference altogether, suppress noise significantly, improve detection sensitivity and signal to noise ratio (S/N ratio), described Fourier transform, digital filtering, inverse fourier transform and medium filtering are used to eliminate the influence of differential mode and random disturbance.
Tracing display of the present invention is provided with tracing display initialization, keyboard scan, signal Processing, moving average calculating, shows linearization and the demonstration of LED charactron, LCD liquid crystal display data and LCD liquid crystal display waveform.
Parameter setting of the present invention is with keyboard input initial light value, control mode, coating process parameter, adjusts running parameter.
Display of the present invention is provided with LCD LCD and LED charactron display.
Keyboard of the present invention is a touch keyboard.
The present invention compared with prior art has the following advantages and effect:
1. whole detection control procedure is carried out with embedded computer system control, and is safe and reliable, utilizes software engineering to carry out judgement of extreme value or definite value and control automatically, can overcome the deficiency of manual operation, improves yield rate and repeatability that plated film is produced.
2. the hardware design that comprises embedded computer system is simple, with low cost, the reliability height, part hardware circuit function adopts software to realize in embedded computer system, comprise signal transformation, digital filtering, the phase-locked and digital operation of numeral, overcome the board design existing problems, and reduced the phase mutual interference of electronic circuit, improved the antijamming capability of complete machine.
3. in embedded computer system, according to the optical coating principle, adopt software engineering to carry out the automated optical compensation, promptly utilize the difference of two light intensity signals that record to replace (instead) radiance rate value, and automatic size state correction reference signal coefficient according to signal source, to reach best elimination interference effect; And utilize signal Processing optimisation technique software to eliminate the influence of differential mode and random disturbance.
4. panel adopts LCD liquid crystal display, LED charactron to show and the touch keyboard operation, uses simple.
5. provide this machine data to store and consult, and for host computer provides communication interface, so that to the process data administrative analysis.
Description of drawings:
Fig. 1 is the structural representation that existing optical film thickness meter and miscellaneous equipment are formed application system.
Fig. 2 is the structural representation that the present invention and relevant apparatus are formed application system.
Fig. 3 is a main program flow chart of the present invention.
Fig. 4 is a control flow chart of the present invention.
Fig. 5 is a tracing display process flow diagram of the present invention.
Fig. 6 is that parameter of the present invention is provided with process flow diagram.
Fig. 7 is signal processing flow figure of the present invention.
Embodiment:
Referring to Fig. 2, Fig. 3, embodiment of the invention apparatus for controlling thickness of digital optical film is provided with measuring amplifier 1, reference amplifier 2, measure wave filter 3, reference filter 4, A/D module 5, embedded computer system 6, touch keyboard 7, LCD LCD 8, LED charactron display 9, switch 10, storer 11 and communication interface 12, measuring amplifier 1 is connected with measurement wave filter 3 with measuring-signal, reference amplifier 2 is connected with reference filter 4 with reference signal, measure wave filter 3, reference filter 4 all is connected with A/D module 5, embedded computer system 6 and A/D module 5, touch keyboard 7, LCD LCD 8, LED charactron display 9, switch 10, storer 11 is connected with communication interface 12, LED charactron display 9 is used for the display light value, LCD LCD 8 is used to show the initial light value, the actual light value, instead (thoroughly) penetrate rate, the plated film time, material refractive index and plated film curve etc., be provided with software program in the described embedded computer system 6, control according to initial set value and touch keyboard 7 inputs, tracing display, parameter is provided with and communication.The present invention can also store data, send LCD LCD 8 to show historical data through touch keyboard 7, data storage of the present invention is provided and consults, and perhaps carries out communication by communication interface 12 and host computer, so that to the process data administrative analysis.
Referring to Fig. 4, control of the present invention is that the utilization computerized optimization technique carries out signal Processing to reference signal and measuring-signal, the data that collect in a period of time are carried out curve fitting, obtain the overall variation trend of signal, and, prejudge the size of extreme value and the moment that extreme value occurs, thereby gauge tap 10 is in time closed plate washer by analysis to this trend, stop the rete evaporation, realize exactly the extreme value monitoring is monitored and crossed to the extreme value of rete.Key step wherein comprises control initialization, keyboard scan, signal Processing, curve fitting, switch control, video data, display waveform and data storage.When adopting extreme value control, then, revise stop position in real time, to reach the purpose of accurate control according to default parameter and the timely extreme value of judging of film thickness gauge.
Curve fitting of the present invention adopts the least square method algorithm, promptly uses j (x) fitting n to data (x
k, y
k) (k=1,2 ..., n), make error sum of squares
Minimum is in the hope of j (x).Here use fitting a straight line, if y= (x)=a
0+ a
1X satisfies system of equations
Be a0, a1 is a solution of equations.Find the coefficient and the constant of system of linear equations with the principle of least square, separate system of linear equations then, obtain corresponding matched curve with this.
Referring to Fig. 7, signal Processing of the present invention comprises the signal Processing initialization, read reference signal, numeral is phase-locked, the reference signal division, read measuring-signal, subtraction process, Fourier transform, digital filtering, inverse fourier transform and medium filtering, wherein reference signal obtains reference signal data with the measuring-signal balance through the reference signal division, automatic size state correction reference signal coefficient according to the measuring-signal source, reading measuring-signal collection and reference signal has the measuring-signal data of the phase-locked relation of same frequency, subtraction process is subtracted each other measuring-signal data and reference signal data and is obtained subtraction data, described numeral is phase-locked, the combination of reference signal division and subtraction process is used for carrying out optical compensation, eliminate the influence of touching interference altogether, suppress noise significantly, improve detection sensitivity and signal to noise ratio (S/N ratio), described Fourier transform, digital filtering, inverse fourier transform and medium filtering are used to eliminate the influence of differential mode and random disturbance.
The digital signal conversion technology that measuring-signal is used in handling is the method that the signal transformation in the territory is mapped to the signal in another territory.And discrete Fourier transform (DFT) is applied on spectral analysis and the signal Processing widely, and its transformation for mula is:
And the present invention has adopted fast discrete Fourier conversion (FFT) when not damaging transform effect, has quickened computing velocity, will be that the signal transformation one-tenth and the frequency of independent variable is the frequency spectrum of independent variable with time.
Here subtraction data X1 sends into Fourier transform, utilizes the quick computing way of FFT that subtraction data X1 is carried out discrete Fourier transform (DFT), and it is transformed into spectrum signal data X2; The frequency spectrum of analysis spectrum signal data X2 in digital filtering carries out filtering according to desirable frequency characteristic by adjusting cutoff frequency fc and bandwidth b then; The signal data X3 that digital filtering produces sends into inverse fourier transform, recovers time-domain signal X4, and time-domain signal X4 sends into medium filtering to reject bigger burr in the curve, produces signal transformation data X5.This method has frequency domain selectivity characteristic and dirigibility preferably, and computing velocity is fast, has eliminated the influence of differential mode and random disturbance in the data.
Referring to Fig. 5, tracing display of the present invention comprises that tracing display initialization, keyboard scan, signal Processing, moving average calculate, show that linearization and LED charactron show, LCD liquid crystal display data and LCD liquid crystal display waveform, and it is the treatment schemees of apparatus of the present invention when being in the tracing display state.
Referring to Fig. 6, parameter setting of the present invention is with touch keyboard 7 input initial light values, control mode, coating process parameter, and the function key and the numerical key operation of touch keyboard are handled, and adjusts running parameter.
During practical application, the present invention and relevant apparatus are formed application system and are finished plated film work, main process is as follows: after monitored flashlight carries out opto-electronic conversion by photomultiplier, be transformed into ac signal entering signal passage, the while reference light carries out opto-electronic conversion through photoelectric cell and becomes voltage signal to enter reference channel.Owing to be with becoming reference signal and measuring-signal after the same warbled signal source beam splitting, so the signal frequency of entering signal passage and reference channel is synchronous.Measuring-signal amplifies by measuring amplifier 1 and measurement wave filter 3, reference signal is amplified by reference amplifier 2 and reference filter 4, interference and noise in inhibition and the filtered signal, and after enlarging dynamic range of signals, be transported to respectively in binary channels high resolution A/D module 5.Measuring-signal and reference signal are converted into digital signal through binary channels high resolution A/D module 5, embedded computer system 6 carries out signal Processing with software after reading this signal data, with the method for numerical evaluation to signal gather, conversion, comprehensive, estimate and processing processing such as identification, so as to reaching information extraction and being convenient to application aims, and send result to LCD LCD 8, LED charactron display 9 and carry out the control corresponding action, finish plated film work.
Advantage of the present invention is as follows:
1) adopts signal amplifier and analog filter
Be difficult to avoid as influences such as spurious rays, dark current in measuring process, the light signal that photomultiplier received is very faint, and the signal of its output often also is deeply buried among the noise, need amplify it.The present invention selects high-gain, high input impedance, high stability, broadband, low output impedance, low drift, low noise operational amplifier for use according to the requirement of input signal and A/D module input range.
Analog filter of the present invention adopts isolation, the reasonable active filter circuit in gain performance aspect, to suppress unwanted noise, improves the signal to noise ratio (S/N ratio) of system.
2) adopt high-resolution A/D module
The present invention adopts binary channels high resolution A/D module, and chip A/D conversion is adopted and approached conversion regime one by one, can critically convert simulating signal to digital signal.It can guarantee that speed is fast, precision is high, synchronized sampling, and is consistent to guarantee the A/D conversion accuracy of testing with reference to two-way, is beneficial to eliminate common mode interference.
3) signal Processing adopt that numeral is phase-locked, automated optical compensation and digital operation
Adopt the structure of frequency modulation (PFM) optical system for testing and modulation reference light path to make the stability of test signal significantly rely on the job stability of light source, photomultiplier and power supply source thereof in the native system.
Phase-locked and the digital subtraction of this numeral of the present invention (two light intensity signals that record poor) combination, can be used for eliminating the influence of touching interference altogether, greatly reduce the job stability requirement of these key equipments of light source, and the static stability and the plated film that can significantly improve monitoring system repeat performance, suppress noise significantly, improve detection sensitivity and signal to noise ratio (S/N ratio).
The present invention adjusts reference signal by software automatic tracing and measuring signal, adjusts the balance of reference signal and measuring-signal, make because the reference signal that factors such as voltage, power supply cause changes synchronously, but their difference is constant.Compare with original system, adopt software to realize that numeral is phase-locked, also solved the problem of some analog loop, saturated as direct current zero point drift, parts, must carry out initial calibration etc., have processing capability in real time in addition to discrete sample value.
In addition, the present invention has cancelled this part hardware circuit, adopts software to realize, has reduced the phase mutual interference of Circuits System, has improved the antijamming capability of complete machine.
4) signal Processing adopts signal transformation, digital filtering and digital operation etc.
Because of containing various errors in the sampled data source, and steps such as signal digitalized process comprises time-domain sampling, blocks, frequency domain sample, each step may cause that all signal and its contain the distortion of information.Analyze by the variety of issue that digitized signal is occurred, can adopt the specific aim software engineering to address these problems.
The present invention adopts the integration software technology to comprise quick FFT conversion+digital filtering+quick FFT inverse transformation+medium filtering.Have that stability is high, precision is high, dirigibility is big, can Yin Wendu, the influence of humidity produces error, do not need outstanding advantages such as high precision components.By these signal processing technologies, can significantly reduce various stochastic errors and systematic error, reduce the coating machine vibration and when light transmission spurious rays the interference of measuring light signal is improved the precision and the stability of signal Processing.
5) data processing, data presentation and Data Control etc.
The present invention calculates data smoothing through moving average and handles in data processing, is sent to LCD LCD and LED charactron display through showing the data after the linearization calculation; Simultaneously the The data least square method algorithm that collects in a period of time is carried out local data's match, obtain the overall variation trend of signal, by the size of the analysis of trend being prejudged extreme value and the moment that extreme value occurs, just can the output signal gauge tap.
The present invention also provides data storage and consults in addition, and can provide communication interface to host computer, so that to the process data administrative analysis.
Claims (7)
1, a kind of apparatus for controlling thickness of digital optical film, comprise amplifier, wave filter, the A/D module, embedded computer system, keyboard, display, switch, storer and communication interface, amplifier and reference signal, test signal and wave filter connect, wave filter is connected with the A/D module, embedded computer system and A/D module, keyboard, display, switch, storer is connected with communication interface, it is characterized in that: be provided with software program in the described embedded computer system, control according to initial set value and keyboard input, tracing display, parameter is provided with and communication.
2, apparatus for controlling thickness of digital optical film according to claim 1, it is characterized in that: described control setting has the control initialization, keyboard scan, signal Processing, curve fitting, switch control, video data, display waveform and data storage, its utilization computerized optimization technique carries out signal Processing to reference signal and measuring-signal, the data that collect in a period of time are carried out curve fitting, obtain the overall variation trend of signal, and by analysis to this trend, prejudge the size of extreme value and the moment that extreme value occurs, thereby gauge tap is in time closed plate washer, stop the rete evaporation, realize exactly the extreme value monitoring is monitored and crossed to the extreme value of rete.
3, apparatus for controlling thickness of digital optical film according to claim 2, it is characterized in that: described signal Processing is provided with the signal Processing initialization, read reference signal, numeral is phase-locked, the reference signal division, read measuring-signal, subtraction process, Fourier transform, digital filtering, inverse fourier transform and medium filtering, wherein reference signal obtains reference signal data with the measuring-signal balance through the reference signal division, automatic size state correction reference signal coefficient according to the measuring-signal source, reading measuring-signal collection and reference signal has the measuring-signal data of the phase-locked relation of same frequency, subtraction process is subtracted each other measuring-signal data and reference signal data and is obtained subtraction data, described numeral is phase-locked, the combination of reference signal division and subtraction process is used for carrying out optical compensation, eliminate the influence of touching interference altogether, suppress noise significantly, improve detection sensitivity and signal to noise ratio (S/N ratio), described Fourier transform, digital filtering, inverse fourier transform and medium filtering are used to eliminate the influence of differential mode and random disturbance.
4, apparatus for controlling thickness of digital optical film according to claim 1 is characterized in that: described tracing display is provided with tracing display initialization, keyboard scan, signal Processing, moving average calculating, shows linearization and the demonstration of LED charactron, LCD liquid crystal display data and LCD liquid crystal display waveform.
5, apparatus for controlling thickness of digital optical film according to claim 1 is characterized in that: described parameter setting is with keyboard input initial light value, control mode, coating process parameter, adjusts running parameter.
6, apparatus for controlling thickness of digital optical film according to claim 1 is characterized in that: described display is provided with LCD LCD and LED charactron display.
7, apparatus for controlling thickness of digital optical film according to claim 1 or 5, it is characterized in that: described keyboard is a touch keyboard.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100615647A CN100350278C (en) | 2005-11-15 | 2005-11-15 | Apparatus for controlling thickness of digital optical film |
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| CNB2005100615647A CN100350278C (en) | 2005-11-15 | 2005-11-15 | Apparatus for controlling thickness of digital optical film |
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| CN1786740A true CN1786740A (en) | 2006-06-14 |
| CN100350278C CN100350278C (en) | 2007-11-21 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103575221A (en) * | 2012-07-23 | 2014-02-12 | 北方夜视技术股份有限公司 | System for measuring thickness of polybase photocathode membrane |
| CN108764528A (en) * | 2018-04-23 | 2018-11-06 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | A kind of Daily treatment cost interval prediction method of allowed for influencing factors analysis |
| CN109816810A (en) * | 2018-12-29 | 2019-05-28 | 西南技术物理研究所 | A kind of optical film layer monitoring method based on digital filtering |
| CN112783078A (en) * | 2020-12-29 | 2021-05-11 | 西南技术物理研究所 | Intermittent optical monitoring signal synchronous sampling method |
| CN115597501A (en) * | 2022-09-30 | 2023-01-13 | 中山吉联光电科技有限公司（Cn） | High-precision wide-spectrum optical film thickness online monitoring system |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1034763C (en) * | 1993-07-29 | 1997-04-30 | 陈赋 | Heterodyne frequency-shifting-type twin laser interferometer with common-mode suppressed frequency shift interference |
| JP2002373843A (en) * | 2001-06-14 | 2002-12-26 | Nec Corp | Coating system and method for controlling thickness of coating film |
| JP3848571B2 (en) * | 2001-12-28 | 2006-11-22 | Ｈｏｙａ株式会社 | Thin film forming method and apparatus |
| CN2552943Y (en) * | 2002-04-30 | 2003-05-28 | 西安工业学院 | Optical film thickness on line real time monitor |
| CN1276238C (en) * | 2003-12-31 | 2006-09-20 | 中山大学 | Optical film plating near infrared film thickness monitoring instrument |
-
2005
- 2005-11-15 CN CNB2005100615647A patent/CN100350278C/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103575221A (en) * | 2012-07-23 | 2014-02-12 | 北方夜视技术股份有限公司 | System for measuring thickness of polybase photocathode membrane |
| CN103575221B (en) * | 2012-07-23 | 2016-04-20 | 北方夜视技术股份有限公司 | A kind of measuring method of multialkali photocathode thicknesses of layers measuring system |
| CN108764528A (en) * | 2018-04-23 | 2018-11-06 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | A kind of Daily treatment cost interval prediction method of allowed for influencing factors analysis |
| CN109816810A (en) * | 2018-12-29 | 2019-05-28 | 西南技术物理研究所 | A kind of optical film layer monitoring method based on digital filtering |
| CN112783078A (en) * | 2020-12-29 | 2021-05-11 | 西南技术物理研究所 | Intermittent optical monitoring signal synchronous sampling method |
| CN115597501A (en) * | 2022-09-30 | 2023-01-13 | 中山吉联光电科技有限公司（Cn） | High-precision wide-spectrum optical film thickness online monitoring system |
| CN115597501B (en) * | 2022-09-30 | 2023-11-03 | 中山吉联光电科技有限公司 | High-precision wide-spectrum optical film thickness online monitoring system |
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| CN100350278C (en) | 2007-11-21 |
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