CN1779863A - Method for producing bit-map information automatically during process of memory test - Google Patents
Method for producing bit-map information automatically during process of memory test Download PDFInfo
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- CN1779863A CN1779863A CN 200410084655 CN200410084655A CN1779863A CN 1779863 A CN1779863 A CN 1779863A CN 200410084655 CN200410084655 CN 200410084655 CN 200410084655 A CN200410084655 A CN 200410084655A CN 1779863 A CN1779863 A CN 1779863A
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Abstract
A method for automatically generating bit map information in storage test course includes storing all fault information is said course by fault information collecting module according to storage logic address, sending it to FBM converting module for converting it to be BMP image information of DIB format as per physical address of storage, sending it to BMP display module for displaying it in BMP image format, using mode control module to control FBM converting module to carry out multiple linear programs conversion process and to generate fault type displayed in FBM file.
Description
Technical field
The present invention relates to the failure message technology for automatically treating in the large scale integrated chip test, particularly relate to a kind ofly in the test process of storer, can produce the disposal route that comprises failure message (bitmap format) automatically.
Background technology
There is following problems in error message technology for automatically treating in the existing large scale integrated chip test: the failure message that obtains after 1, test finishes is not comprehensive.2, in fault bitmap (FBM, Fail Bit Map), can't know the failure mode of fault bit.3, in FBM, the fault bit bits number that can show very little.4, can't produce FBM file with device-independent bitmap (DIB, Device Independent Bitmap) form.5, failure message is not to arrange according to its physical address among the FBM.
The existence of all the problems referred to above has all influenced the analysis to test result, thereby for having brought difficulty in error analysis (F/A, the Fail Analysis) location of carrying out storer in the short time.
Summary of the invention
The technical problem to be solved in the present invention provides a kind of method that produces bitmap (BMP Bit Map) information in the memory test process automatically, it can preserve and convert to FBM automatically with the failure message of each bit, has comprised a large amount of failure messages that is used for F/A among this FBM.
For solving the problems of the technologies described above, of the present invention a kind of in the memory test process method of producing bit-map information automatically, comprise the steps:
At first, by the fault information acquisition module all failure messages of producing in test process logical address according to storer is stored, and this failure message is passed to the FBM modular converter;
Secondly, the FBM modular converter is the BMP graphical information of DIB form with described failure message according to the physical address translations of storer, and this BMP graphical information is passed to the FBM display module;
Then, by the information of FBM display module according to the display file of BMP graphical format;
Whether carry out the multithreading conversion process and generate the kind that shows fault in the FBM file by mode control module control FBM modular converter.
Adopt method of the present invention, all can operate as normal online (Online is and the production management system line, and carries out exchanges data in real time) of tester and non-online (Offline).In the process that memory chip is tested, the failure message of each bit of all logical addresses all can be collected.Utilize the failure message of the bit of being gathered to produce the DIB BMP file that comprises various failure messages automatically.In this document: therefore the color mode of DIB and device independent can be used for permanently preserving failure message; Employed color of pixel is independent of system palette among the BMP, has the color table of oneself.
What comprise among the FBM according to method generation of the present invention contains much information, and can position the failure message reason that produces in the memory test process more quickly, and expectation can be shortened the time of half than the method for using in the prior art.
Description of drawings
Accompanying drawing be the present invention a kind of in the memory test process method overall construction drawing of producing bit-map information automatically.
Embodiment
As shown in the figure, of the present invention a kind of in the memory test process method of producing bit-map information automatically, comprise a FBM modular converter 1, these FBM modular converter 1 one ends connect fault information acquisition module 2, the other end connects a FBM display module 3, and by 4 controls of a mode control module.
Described fault information acquisition module 2 can store all failure messages of producing in test process logical address according to storer get off, and this error message is passed to FBM modular converter 1.
Described FBM modular converter 1 can be the BMP graphical information of DTB form according to the physical address translations of storer with failure message, and this graphical information is passed to FBM display module 3.
By the information of FBM display module 3 according to the display file of BMP graphical format, and in shown graphical information:
The failure message situation of A, all bits all can obtain showing, comprise each bit 0 fault, 1 fault, 0/1 equal fault and trouble-free information.
B, different colors are represented different failure messages; The color of 0/1 equal fault is the synthetic of 0 fault and two kinds of colors of 1 fault.
C, can be in FBM display module 3 show the only bit on certain fault (such as 0 fault) selectively.
D, the FBM of each memory chip is lined up according to coordinate, can obtain the FBM of whole piece of wafer, in this FBM figure, on the position of click, can demonstrate the information of physical location.
Described mode control module 4 is used for controlling the kind whether FBM modular converter 1 carries out the multithreading conversion process and generate FBM file fault.
In the process that the engineering print of 2M SRAM (static RAM) is estimated, can adopt method of the present invention.
When the SRAM print was carried out test evaluation, industry had accumulated certain experience, can pass through various test vectors, as sheet wipe, test vectors such as sheet writes, diagonal line, fault mechanisms different in the sram chip is investigated.Though same chip is fault mechanism difference (also may have various faults mechanism) on different vectors, show as 0 the most basic fault and two kinds of patterns of 1 fault more.Adopt method of the present invention, it can fundamentally be judged error mechanism, thereby find the defective that exists in the manufacturing.
Claims (6)
1, a kind of in the memory test process method of producing bit-map information automatically, it is characterized in that: it comprises the steps:
At first, by fault information acquisition module (2) all failure messages of producing in test process logical address according to storer is stored, and this failure message is passed to FBM modular converter (1);
Secondly, FBM modular converter (1) is the BMP graphical information of DIB form with described failure message according to the physical address translations of storer, and this BMP graphical information is passed to FBM display module (3);
Then, by the information of FBM display module (3) according to the display file of BMP graphical format;
Whether carry out the multithreading conversion process and generate the kind that shows fault in the FBM file by mode control module (4) control FBM modular converter (1).
2, as claimed in claim 1 a kind of in the memory test process method of producing bit-map information automatically, it is characterized in that: in the described information according to the display file of BMP graphical format, the failure message situation of all bits all can obtain showing; The different different failure messages of color representative.
3, as claimed in claim 1 a kind of in the memory test process method of producing bit-map information automatically, it is characterized in that: in the described information, can in FBM display module (3), show the only bit on certain fault selectively according to the display file of BMP graphical format.
4, as claimed in claim 1 a kind of in the memory test process method of producing bit-map information automatically, it is characterized in that: in the described information according to the display file of BMP graphical format, the FBM of each memory chip is lined up according to coordinate, can obtain the FBM of whole piece of wafer; In this FBM figure, on the position of click, can demonstrate the information of physical location.
5, as claimed in claim 2 a kind of in the memory test process method of producing bit-map information automatically, it is characterized in that: the failure message of described bit comprises each bit 0 fault, 1 fault, 0/1 equal fault and trouble-free information.
6, as claim 2 or 5 described a kind of in the memory test process method of producing bit-map information automatically, it is characterized in that: the color of 0/1 equal fault is the synthetic of 0 fault and two kinds of colors of 1 fault.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410084655 CN1779863A (en) | 2004-11-26 | 2004-11-26 | Method for producing bit-map information automatically during process of memory test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410084655 CN1779863A (en) | 2004-11-26 | 2004-11-26 | Method for producing bit-map information automatically during process of memory test |
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| Publication Number | Publication Date |
|---|---|
| CN1779863A true CN1779863A (en) | 2006-05-31 |
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| CN 200410084655 Pending CN1779863A (en) | 2004-11-26 | 2004-11-26 | Method for producing bit-map information automatically during process of memory test |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107039084A (en) * | 2017-03-01 | 2017-08-11 | 上海华虹宏力半导体制造有限公司 | The crystal round test approach of memory chip with redundancy unit |
| CN110718261A (en) * | 2019-08-21 | 2020-01-21 | 深圳市金泰克半导体有限公司 | Memory bank management method and system |
-
2004
- 2004-11-26 CN CN 200410084655 patent/CN1779863A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107039084A (en) * | 2017-03-01 | 2017-08-11 | 上海华虹宏力半导体制造有限公司 | The crystal round test approach of memory chip with redundancy unit |
| CN107039084B (en) * | 2017-03-01 | 2020-04-14 | 上海华虹宏力半导体制造有限公司 | Wafer test method for memory chip with redundant unit |
| CN110718261A (en) * | 2019-08-21 | 2020-01-21 | 深圳市金泰克半导体有限公司 | Memory bank management method and system |
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