CN1700020A - Test probe - Google Patents
Test probe Download PDFInfo
- Publication number
- CN1700020A CN1700020A CN 200410005055 CN200410005055A CN1700020A CN 1700020 A CN1700020 A CN 1700020A CN 200410005055 CN200410005055 CN 200410005055 CN 200410005055 A CN200410005055 A CN 200410005055A CN 1700020 A CN1700020 A CN 1700020A
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- CN
- China
- Prior art keywords
- accommodation section
- motion bar
- elastic component
- test probe
- sleeve
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Abstract
The invention relates to a test probe, which comprises first padding, first elastic unit, first active rod, second elastic unit, and at least second active rod. Wherein first padding has first inclusion part; first elastic unit is posited inside first inclusion part; first active rod part is located in first inclusion part and has first shield part and second inclusion part, wherein first shield part is posited inside first inclusion part and connected with first elastic unit so that first active rod relative to first inclusion part can slide; second elastic unit is posited inside second inclusion part; second active rod part is located in second inclusion part and has second shield part, wherein second shield part is posited inside second inclusion part and connected with second elastic unit so that second active rod relative to second inclusion part can slide.
Description
Technical field
The present invention is about a kind of test probe, especially in regard to a kind of test probe in order to test electrochemical capacitor (electrolytic capacitor).
Background technology
Electronic product is normally combined by many small electronic components, and wherein electrochemical capacitor (electrolytic capacitor) is a kind of common small electronic component.And when the electronic product assembling is finished, usually must be through a series of test, for example testing electrical property, functional test etc. is example with the test of electrochemical capacitor, and whether it must test the electrochemical capacitor of being assembled usually has specification mistake, polarity on the contrary and lack problem such as element.
Please refer to shown in Figure 1ly, it shows a circuit board 11, is arranged at an electrochemical capacitor 13 and a Testing apparatus 20 on the circuit board 11.Wherein, Testing apparatus 20 comprises a body 21 and a test probe 23; In the prior art; test probe 23 is an incompressible needle body; therefore when utilizing existing test probe 23 to carry out the test of electrochemical capacitor 13; usually can cause the fracture or the bending of test probe 23 owing to the application of force is improper; the result can influence the correctness of test result, and can reduce the life-span of Testing apparatus 20.
From the above, for the test probe that solves prior art ruptures or crooked problem easily, be familiar with this operator and disclose a kind of test probe 30 as shown in Figure 2, it comprises a sleeve 31, a spring 33 and a motion bar 35; Wherein, sleeve 31 has a holding part 311 and at least one reducing 313, and spring 33 is arranged in the holding part 311, and an end of motion bar 35 is a block end 351, and it is in holding part 311 and between reducing 313 and spring 33.As shown in Figure 2, because motion bar 35 can slide so that a probe stroke to be provided relatively with sleeve 31, so when use test probe 30 carries out the test of electrochemical capacitor, can utilize this probe stroke to come the suffered stress of buffering test probe 30, to avoid improper fracture that is caused of the application of force or bending.Wherein, the probe stroke can be defined as position (being the other end of motion bar 35) that test probe 30 contacts with electrochemical capacitor to be tested the distance that can move.
Yet, known test probe 30 only utilizes reducing 313 that block end 351 is maintained in the holding part 311, at this moment, when the ratio of length outside motion bar 35 is exposed to holding part 311 (being the probe stroke) and reducing 313 diameters is excessive, test probe 30 is the crooked or fracture from its reducing 313 places easily just, as shown in Figure 3.Therefore, known 30 of the test probes maximum probe stroke that can provide is restricted.
Therefore, how providing a kind of test probe that bigger probe stroke can be provided simultaneously and have preferable intensity of probe, is one of important topic of current electronic product manufacturing.
Summary of the invention
Because above-mentioned problem, purpose of the present invention is for providing a kind of test probe that can increase the probe stroke simultaneously and improve intensity of probe.
For reaching above-mentioned purpose, comprise one first sleeve, one first elastic component, one first motion bar, one second elastic component and at least one second motion bar according to test probe of the present invention.In the present invention, first sleeve has one first accommodation section; First elastic component is arranged in first accommodation section; First motion bar to small part is positioned at first accommodation section, and has one first stopper and one second accommodation section, and first stopper is arranged in first accommodation section and with first elastic component and contacts so that first motion bar with respect to first accommodation section for slidably; Second elastic component is arranged in second accommodation section; Second motion bar at least partly is positioned at second accommodation section, and has one second stopper, and second stopper is arranged in second accommodation section and with second elastic component and contacts so that second motion bar with respect to second accommodation section for slidably.
From the above, because of utilizing first motion bar and second motion bar that the probe stroke of two-stage is provided, so can increase the probe stroke of test probe effectively according to test probe of the present invention; In addition, test probe of the present invention is with suffered stress distribution to the first motion bar and second motion bar, so can improve the intensity of test probe effectively.
Description of drawings
The synoptic diagram that Fig. 1 tests for the electrochemical capacitor that shows prior art;
Fig. 2 is the diagrammatic cross-section of the test probe of demonstration prior art;
Fig. 3 is for showing the diastrophic synoptic diagram of test probe of prior art;
Fig. 4 A is the diagrammatic cross-section of the test probe of demonstration preferred embodiment of the present invention;
Fig. 4 B is for showing the decomposing schematic representation of test probe shown in Fig. 4 A;
Fig. 5 A and 5B are the diagrammatic cross-section of the test probe of another preferred embodiment of demonstration the present invention;
Fig. 6 A and 6B are the diagrammatic cross-section of the test probe of the another preferred embodiment of demonstration the present invention;
Fig. 7 is the synoptic diagram of the Testing apparatus of demonstration preferred embodiment of the present invention.
Symbol description among the figure:
11 circuit boards
13 electrochemical capacitors
20 Testing apparatus
21 bodies
23 test probes
30 test probes
31 sleeves
311 holding parts
313 reducings
33 springs
35 motion bars
351 block ends
4 test probes
41 first sleeves
411 first accommodation sections
412 first reducings
42 first elastic components
43 first motion bars
431 first stoppers
432 second accommodation sections
433 second reducings
44 second elastic components
45 second motion bars
451 second stoppers
5 test probes
51 first sleeves
511 first accommodation sections
512 first reducings
52 first elastic components
53 first motion bars
531 first stoppers
532 second accommodation sections
533 second reducings
534 C shapes ring
54 second elastic components
55 second motion bars
551 second stoppers
552 C shapes ring
56 second sleeves
561 first perforation
57 the 3rd sleeves
571 second perforation
70 Testing apparatus
71 bodies
72 test probes
Embodiment
Hereinafter with reference to relevant drawings, the test probe according to preferred embodiment of the present invention is described, wherein components identical will be illustrated with identical reference marks.
Please refer to shown in Fig. 4 A and Fig. 4 B, comprise one first sleeve 41, one first elastic component 42, one first motion bar 43, one second elastic component 44 and at least one second motion bar 45 according to the test probe 4 of preferred embodiment of the present invention.
First elastic component 42 is arranged in first accommodation section 411.In the present embodiment, first elastic component 42 can be any one flexible member that displacement of one dimension direction can be provided, and for example is spring.
Second elastic component 44 is arranged in second accommodation section 432.In the present embodiment, second elastic component 44 can be any one flexible member that displacement of one dimension direction can be provided, that is is to first elastic component 42 is similar but size is less, for example is spring.
As mentioned above, because of first motion bar 43 can be relative first accommodation section 411 slide, and second motion bar 45 can slide relative second accommodation section 432, so the probe stroke of two-stage can be provided; And the suffered external force of whole test probe 4, can be dispersed in first motion bar 43 and second motion bar 45 effectively, that is be the latent potential energy (potential) that external force is disperseed to convert to first elastic component 42 and second elastic component 44.
In addition, please refer to shown in Fig. 5 A and Fig. 5 B, comprise one first sleeve 51, one first elastic component 52, one first motion bar 53, one second elastic component 54, at least one second motion bar 55 and one second sleeve 56 according to the test probe 5 of another preferred embodiment of the present invention.
In the present embodiment, first sleeve 51 has one first accommodation section 511, and it has one first reducing 512.First elastic component 52 is arranged in first accommodation section 511; At least one part of first motion bar 53 is positioned at first accommodation section 511, and have one first stopper 531 and one second accommodation section 532, first stopper 531 is arranged in first accommodation section 511 and with first elastic component 52 and contacts, so that first motion bar 53 with respect to first accommodation section 511 for slidably, and second accommodation section 532 has more one second reducing 533; Second elastic component 54 is arranged in second accommodation section 532; Each second motion bar, 55 at least one part is positioned at second accommodation section 532, and has one second stopper 551, second stopper 551 is arranged in second accommodation section 532 and with second elastic component 54 and contacts so that second motion bar 55 with respect to second accommodation section 532 for slidably; Second sleeve 56 is sheathed and be fixed in first accommodation section 511 and have one first perforation 561, and first motion bar 53 passes first perforation 561, and first stopper 531 is positioned at or part is positioned at outside second sleeve 56.Wherein, second sleeve 56 is fixed in first accommodation section 511 through first reducing 512 of first sleeve 51.
Shown in Fig. 5 A, first elastic component 52 is positioned at first accommodation section 511 and adjacent with second sleeve 56 and establish, and first stopper 531 is piercing in outside second sleeve 56, so that contact with first elastic component 52.
In addition, shown in Fig. 5 B, first elastic component 52 is positioned at first accommodation section 511 and is arranged at first perforation 561, at this moment, first motion bar 53 more passes first elastic component 52, and first stopper, 531 parts are positioned at outside second sleeve 56, and utilize one to be arranged at the outer C shapes ring of second sleeve 56 534 first motion bar, 53 parts are limited in second sleeve 56.
Moreover, please refer to shown in Fig. 6 A and Fig. 6 B, implement more to comprise one the 3rd sleeve 57 in aspect at another of the test probe 5 of another preferred embodiment of the present invention.
In the present embodiment, the 3rd sleeve 57 is sheathed and be fixed in second accommodation section 532 and have one second perforation 571, and second motion bar 55 passes second perforation 571, and second stopper 551 is positioned at or part is positioned at outside the 3rd sleeve 57.Wherein, the 3rd sleeve 57 is fixed in second accommodation section 532 through second reducing 533 of first motion bar 53.
As shown in Figure 6A, second elastic component 54 is positioned at second accommodation section 532 and adjacent with the 3rd sleeve 57 and establish, and second stopper 551 is positioned at outside the 3rd sleeve 57, so that contact with second elastic component 54.
In addition, shown in Fig. 6 B, second elastic component 54 is positioned at second accommodation section 532 and is arranged at second perforation 571, at this moment, second motion bar 55 more passes second elastic component 54, and second stopper, 551 parts are positioned at outside the 3rd sleeve 57, and utilize one to be arranged at the outer C shapes ring of the 3rd sleeve 57 552 second motion bar, 55 parts are limited in the 3rd sleeve 57.
The person of noting, first elastic component 52 the position is set can arranges in pairs or groups arbitrarily of the position and second elastic component 54 be set, for example first elastic component 52 can be to be arranged at outside second sleeve 56, and second elastic component 54 can be to be arranged in second perforation 571 of the 3rd sleeve 57 simultaneously; Or first elastic component 52 be arranged in first perforation 561 of second sleeve 56, simultaneously second elastic component 54 is arranged at outside the 3rd sleeve 57; Or first elastic component 52 be arranged in first perforation 561 of second sleeve 56, simultaneously second elastic component 54 can be to be arranged in second perforation 571 of the 3rd sleeve 57.
As mentioned above, the test probe of preferred embodiment of the present invention utilizes second sleeve 56 and the 3rd sleeve 57 to increase its intensity, and then can effectively avoid probe fracture or crooked situation.
In addition, please refer to shown in Figure 7ly, in order to test an electrochemical capacitor 13, particularly suitable is with the electrochemical capacitor 13 of test setting on a circuit board 11 according to the Testing apparatus 70 of preferred embodiment of the present invention.As shown in Figure 7, Testing apparatus 70 comprises a body 71, reaches at least one test probe 72, and wherein test probe 72 is connected to body 71.
In the present embodiment, test probe 72 is aforesaid test probe 4 or test probe 5 (shown in Fig. 4～6B), so repeat no more.The person of noting has more a junction according to first sleeve of the test probe 72 of present embodiment, so that connecting portion and body 71 that test probe 72 sees through first sleeve are connected with.
In sum, because test probe of the present invention utilizes the slip of first motion bar and second motion bar that the probe stroke of two-stage is provided, so can increase the probe stroke of test probe effectively; In addition, test probe of the present invention is dispersed in first motion bar and second motion bar effectively with suffered stress, that is is that stress is disperseed to convert the latent potential energy of first elastic component and second elastic component to, so can improve the intensity of test probe effectively.
The above only is an illustrative, but not is restricted person.Anyly do not break away from spirit of the present invention and category, and, all should be contained in the described claim its equivalent modifications of carrying out or change.
Claims (10)
1. test probe comprises:
One first sleeve, it has one first accommodation section;
One first elastic component, it is arranged in this first accommodation section;
One first motion bar, its at least one part is positioned at this first accommodation section, and has one first stopper and one second accommodation section, and this first stopper is arranged in this first accommodation section of this first sleeve, and contact with this first elastic component, this first motion bar slides with respect to this first accommodation section;
One second elastic component, it is arranged in this second accommodation section; And
At least one second motion bar, its at least one part is positioned at this second accommodation section, and has one second stopper, and this second stopper is arranged in this second accommodation section of this first motion bar, and contact with this second elastic component, this second motion bar slides with respect to this second accommodation section.
2. test probe as claimed in claim 1, wherein this first accommodation section more comprises one first reducing.
3. test probe as claimed in claim 1, more comprise one second sleeve, this second sleeve setting and be fixed in this first accommodation section and have one first perforation, this first motion bar passes this first perforation, and at least a portion of this first stopper is positioned at outside this second sleeve.
4. test probe as claimed in claim 3, wherein this first elastic component is positioned at this first perforation, and this first motion bar more passes this first elastic component.
5. test probe as claimed in claim 3, wherein this first elastic component is a spring.
6. test probe as claimed in claim 3, wherein this first stopper more comprises C shape ring, and this C shape ring is arranged at outside this second sleeve.
7. test probe as claimed in claim 1, wherein this second accommodation section more comprises one second reducing.
8. test probe as claimed in claim 1, more comprise one the 3rd sleeve, the 3rd sleeve setting and be fixed in this second accommodation section and have one second perforation, this second motion bar passes this second perforation, and at least a portion of this second stopper is positioned at outside the 3rd sleeve.
9. test probe as claimed in claim 8, wherein this second elastic component is positioned at this second perforation, and this second motion bar more passes this second elastic component.
10. test probe as claimed in claim 8, wherein this second stopper is a C shape ring, this C shape ring is arranged at outside the 3rd sleeve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100050558A CN100339714C (en) | 2004-05-20 | 2004-05-20 | Test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100050558A CN100339714C (en) | 2004-05-20 | 2004-05-20 | Test probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1700020A true CN1700020A (en) | 2005-11-23 |
| CN100339714C CN100339714C (en) | 2007-09-26 |
Family
ID=35476165
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004100050558A Expired - Fee Related CN100339714C (en) | 2004-05-20 | 2004-05-20 | Test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100339714C (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101644733B (en) * | 2008-08-06 | 2011-07-27 | 燿华电子股份有限公司 | Fixture for testing precise printed circuit board |
| CN102859370A (en) * | 2010-04-19 | 2013-01-02 | 日本电产理德株式会社 | Inspection Contact Element And Inspection Jig |
| CN104865425A (en) * | 2014-02-24 | 2015-08-26 | 旺矽科技股份有限公司 | Probe device with spring sleeve type probe |
| CN104880585A (en) * | 2015-05-12 | 2015-09-02 | 厦门多彩光电子科技有限公司 | Test probe |
| CN108132406A (en) * | 2017-12-13 | 2018-06-08 | 格力电器（武汉）有限公司 | Electronic device test equipment |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3904960A (en) * | 1973-04-11 | 1975-09-09 | Scripps Co E W | Extendable and retractable moisture sensing probe |
| US4504780A (en) * | 1982-08-25 | 1985-03-12 | Marsella John R | Test probe |
| EP0331163A1 (en) * | 1988-03-04 | 1989-09-06 | Manfred Prokopp | Contacting device for testing arrangements for testing circuit boards or the like |
| JPH10282142A (en) * | 1997-04-09 | 1998-10-23 | Morihiro Shimano | Circuit testing probe |
| JP3315683B2 (en) * | 1999-11-08 | 2002-08-19 | アルプス電気株式会社 | Electrical property measurement device |
| JP3981042B2 (en) * | 2003-06-09 | 2007-09-26 | アルプス電気株式会社 | Contact probe, probe socket, electrical characteristic measuring apparatus, and contact probe pressing method |
-
2004
- 2004-05-20 CN CNB2004100050558A patent/CN100339714C/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101644733B (en) * | 2008-08-06 | 2011-07-27 | 燿华电子股份有限公司 | Fixture for testing precise printed circuit board |
| CN102859370A (en) * | 2010-04-19 | 2013-01-02 | 日本电产理德株式会社 | Inspection Contact Element And Inspection Jig |
| CN104865425A (en) * | 2014-02-24 | 2015-08-26 | 旺矽科技股份有限公司 | Probe device with spring sleeve type probe |
| CN104865425B (en) * | 2014-02-24 | 2018-07-20 | 旺矽科技股份有限公司 | Probe device with spring sleeve type probe |
| CN104880585A (en) * | 2015-05-12 | 2015-09-02 | 厦门多彩光电子科技有限公司 | Test probe |
| CN108132406A (en) * | 2017-12-13 | 2018-06-08 | 格力电器（武汉）有限公司 | Electronic device test equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100339714C (en) | 2007-09-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: HESHUO JOINT SCIENCE AND TECHNOLOGY CO., LTD. ADD Free format text: FORMER OWNER: HUASHUO COMPUTER CO LTD ADDRESS Effective date: 20081121 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20081121 Address after: Taipei City, Taiwan Province, China Co-patentee after: Maintek Computer (Suzhou) Co., Ltd. Patentee after: Harmony with Polytron Technologies Inc Address before: Taipei city of Taiwan Province Patentee before: Huashuo Computer Co., Ltd. |
|
| ASS | Succession or assignment of patent right |
Owner name: HESHUO JOINT SCIENCE AND TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: HUASHUO COMPUTER CO LTD Effective date: 20081121 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20090605 Address after: Taiwan, Taipei, China Co-patentee after: Baishuo Computer (Suzhou) Co., Ltd. Patentee after: Harmony with Polytron Technologies Inc Address before: Taiwan, Taipei, China Co-patentee before: Maintek Computer (Suzhou) Co., Ltd. Patentee before: Harmony with Polytron Technologies Inc |
|
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070926 Termination date: 20140520 |