CN108132406A - A kind of electron device testing equipment - Google Patents
A kind of electron device testing equipment Download PDFInfo
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- CN108132406A CN108132406A CN201711329807.XA CN201711329807A CN108132406A CN 108132406 A CN108132406 A CN 108132406A CN 201711329807 A CN201711329807 A CN 201711329807A CN 108132406 A CN108132406 A CN 108132406A
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- needle
- electronic device
- pallet
- probe
- test probe
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention relates to test equipment technical fields, disclose a kind of electron device testing equipment.Effectively to detect whether electrolytic capacitor is correctly connected in electronic device, the dropped stitch situation of the needle stand of electronic device further can also be effectively detected.Electron device testing equipment, it is characterized in that, including pedestal and it is supported in lower needle bed, pallet and the upper stitch bed and controller of pedestal, lower needle bed includes lower plant needle plate, and lower plant corresponds to the electrolytic capacitor of electronic device and be connected to the positive extreme direction of electronic device respectively and two test poles in cathode direction are implanted with first time test probe respectively on needle plate；Pallet is located at the side that knit stitch bed deviates from pedestal, and the position that the test point of electronic device is corresponded to for placing electronic device, and on pallet offers the instrument connection that first time test probe is allowed to pass through；Upper stitch bed is located at the side that pallet deviates from pedestal, and including upper plant needle plate, the upper position of housing for planting the electrolytic capacitor that needle plate corresponds to electronic device is implanted with towards testing probe on the first of pallet.
Description
Technical field
The present invention relates to test equipment technical field, more particularly to a kind of electron device testing equipment.
Background technology
ICT (In-Circuit-Tester, automatic on-line tester, abbreviation ICT) is by the electrical of online component
A kind of standard test equipment of undesirable condition for being tested to check component can and be electrically connected, is mainly used for checking online
Single component and circuit open short-circuit conditions, have many advantages, such as that easy to operate, fault location is accurate and quick.PCB
(Printed Circuit Board, printed circuit board, abbreviation PCB) is each to ensure after the welding for completing all components
Component is in order, it is necessary to carry out ICT tests.
ICT generally comprises controller and needle bed, and needle bed has the test probe being connect with controller, connect by testing needle
The test point of PCB is touched to detect the welding situation of the open lines of PCB, short circuit and all parts.A kind of existing needle bed
Structure includes planting needle plate and by they sup-port in planting the pallet for being used to place PCB above needle plate, plants and corresponds on needle plate
The test point of PCB is implanted with multiple test probes, and the position that the test point of PCB is corresponded on pallet offers and allows to test probe
The instrument connection passed through.
Defect of the existing technology is, when needle bed using the above structure is detected the electrolytic capacitor on PCB,
Electrolytic capacitor is typically corresponded on needle plate is planted and is connected to the positive extreme direction of electronic device and two test poles difference in cathode direction
Setting test probe, when two test probes contact respectively with two test poles, can only obtain the electricity between two test poles
Pressure difference, and can not judge whether the positive and negative anodes of electrolytic capacitor are reversed；In addition, the needle bed of above structure can not also detect PCB
Needle stand whether there is the situation of dropped stitch.Based on this, how effectively to detect whether electrolytic capacitor positive and negative anodes reversed and needle stand
Dropped stitch situation, be a technical problem to be solved urgently.
Invention content
The purpose of the embodiment of the present invention is to provide a kind of electron device testing equipment, effectively whether to detect electrolytic capacitor
It is correctly connected in electronic device, further can also effectively detect the dropped stitch situation of the needle stand of electronic device, improve detection
As a result accuracy.
An embodiment of the present invention provides a kind of electron device testing equipment, including pedestal and it is supported in the knit stitch of pedestal
Bed, pallet and upper stitch bed and controller, lower needle bed includes lower plant needle plate, lower to plant the electrolytic capacitor that electronic device is corresponded on needle plate
It is connected to the positive extreme direction of electronic device respectively and two test poles in cathode direction are implanted with first time test probe respectively；Pallet position
In lower needle bed away from the side of pedestal and for placing electronic device, and the position that the test point of electronic device is corresponded on pallet is opened
Equipped with the instrument connection that first time test probe is allowed to pass through；Upper stitch bed is located at the side that pallet deviates from pedestal, including upper plant needle plate,
The upper position of housing for planting the electrolytic capacitor that needle plate corresponds to electronic device is implanted with towards testing probe on the first of pallet；
Controller is connect respectively with testing probe on first time test probe and first, in test, passing through first
Lower test probe applies setting voltage to electrolytic capacitor；Two first time test probes are obtained to be detected with testing probe on first
Voltage value, determine to test the voltage difference between the voltage value that is detected of probe on each first time test probe and first,
And judge whether electrolytic capacitor is reversed according to the comparison result of two voltage differences.
Preferably, the controller is specifically used for：When voltage difference smaller is that corresponding electrolytic capacitor is connected to electronic device
Cathode direction test pole first time test probe and first on test probe between voltage difference when, judge the electricity
Solution capacitance is just connected in electronic device；Conversely, then judge the electrolytic capacitor reversal connection in electronic device.
Preferably, the lower position of pin hole for corresponding to electronic device needle stand on needle plate of planting is implanted with second time test probe,
The upper needle plate position of pin hole that corresponds to electronic device needle stand of planting is implanted with towards testing probe on the second of pallet；The control
Device on second time test probe and second test probe connect, for test when, when corresponding to the same needle of needle stand
When short circuit occurs between test probe on second time test probe in hole and second, judge to be equipped with contact pin in the pin hole of needle stand,
Conversely, then judge the pin hole dropped stitch of needle stand.
Preferably, the pedestal includes the first through hole set corresponding to the surrounding of the upper stitch bed, the electronic device
Test equipment further include one end be fixedly connected with the upper stitch bed, other end slidable fit in the first through hole first be oriented to
The first driving means that bar and driving first guide rod slide in the first through hole are set in the first through hole
It is equipped with first straight line bearing.
Preferably, the pedestal includes leading to corresponding to the second of the region setting for avoiding the instrument connection on the pallet
Hole, the electron device testing equipment further include that one end is fixedly connected with the pallet, other end slidable fit is in described second
The second driving device that the second guide rod and driving second guide rod of through-hole slide in second through-hole, institute
It states and second straight line bearing is provided in the second through-hole.
Optionally, first time test probe is flexible needle；And/or it is flexible needle that probe is tested on described first.
Preferably, the flexible needle includes syringe, shank and spring, the syringe has openend and blind end, institute
The inner wall for stating syringe is provided with annular stop step, and the first end of the shank is by the openend slidable fit in the needle
In cylinder and end is provided with the annular protrusion that can be limited in the annular stop step, and the second end of the shank stretches out the needle
Cylinder and end be provided with test probe, the spring retainer is between the first end of the blind end and the shank.
Preferably, there is the matched positioning column of location hole with being set to electronic device on the lower plant needle plate, it is described
The pallet position opposite with the positioning column offers the through-hole that the positioning column is allowed to pass through.
Preferably, the upper stitch bed is further included positioned at the upper partition board for planting needle plate away from the side of the pedestal and position
In the partition board away from the top plate of the side of the pedestal, distinguish between the top plate and partition board, between partition board and upper plant needle plate
It is connected by column, hole is provided through on the upper plant needle plate, the partition board is fixed with towards the upper side for planting needle plate
The fixed column for passing through hole and electronic device being pressed in pallet can be passed through.
Using electron device testing equipment provided in an embodiment of the present invention, needle is set by the bilateral in electronic device simultaneously
Bed, first time test probe of needle bed contacts respectively with two test poles of electrolytic capacitor instantly, upper stitch bed first on test
When probe is contacted with the housing of electrolytic capacitor, setting voltage is applied, and obtain respectively to electrolytic capacitor by first time test probe
The voltage difference tested on two first time test probes and first between probe is taken, finally according to the comparison of two voltage differences
As a result can just judge whether electrolytic capacitor reversed, compared with prior art in can only obtain electrolytic capacitor two test poles it
Between voltage difference, the program can effectively detect whether electrolytic capacitor is correctly connected in electronic device, improve detection knot
The accuracy of fruit.
The embodiment of the present invention additionally provides another electron device testing equipment, including pedestal and is supported in pedestal
Lower needle bed, pallet and upper stitch bed and controller, lower needle bed include lower plant needle plate, electronic device needle stand are corresponded on lower plant needle plate
The position of pin hole is implanted with lower test probe；Pallet is located at the side that knit stitch bed deviates from pedestal, for placing electronic device, and pallet
The position of all test points of upper corresponding electronic device offers the instrument connection that lower test probe is allowed to pass through；Upper plant needle plate is located at
Pallet deviates from the side of pedestal, and including upper plant needle plate, the position of pin hole that upper plant needle plate corresponds to electronic device needle stand is implanted with direction
The upper test probe of pallet；
Controller connect respectively with lower test probe and upper test probe, in test, test probe and upper instantly
Probe connection is tested, short circuit occurs corresponding between the lower test probe of the same pin hole of needle stand and upper test probe for working as
When, judge to be equipped with contact pin in the pin hole of needle stand, conversely, then judging the pin hole dropped stitch of needle stand.
The electron device testing equipment provided using the embodiment, needle bed is set by the bilateral in electronic device simultaneously,
In test, when corresponding to short circuit occurs between the lower test probe of the same pin hole of needle stand and upper test probe, under explanation
Electrical connection is formd by contact pin between test probe and upper test probe, thus may determine that be equipped in the pin hole and insert
Needle；When short circuit does not occur corresponding between the lower test probe of the same pin hole of needle stand and upper test probe, illustrate that lower test is visited
Without forming electrical connection between needle and upper test probe, so as to judge the pin hole dropped stitch；Compared with prior art, the program can be with
It effectively detects the dropped stitch situation of the needle stand of electronic device, improves the accuracy of testing result.
Description of the drawings
Fig. 1 is the front view of electron device testing equipment of the embodiment of the present invention；
Fig. 2 is the structure diagram of electron device testing equipment of the embodiment of the present invention；
Fig. 3 is the enlarged drawing at A in embodiment illustrated in fig. 1；
Fig. 4 is the enlarged drawing at B in embodiment illustrated in fig. 1；
Fig. 5 is the structure diagram of needle bed under the embodiment of the present invention；
Fig. 6 is the structure diagram of upper stitch bed of the embodiment of the present invention；
Fig. 7 is that the embodiment of the present invention is stretched the structure diagram of needle.
Reference numeral：
10- pedestals；Needle bed under 20-；30- pallets；40- upper stitch beds；Needle plate is planted under 21-；
First time test probe of 22-；Needle plate is planted on 41-；Probe is tested on 42- first；
50- electronic devices；51- electrolytic capacitors；52- contact pins；Second time test probe of 23-；
Probe is tested on 43- second；The first guide rods of 60-；61- first straight line bearings；
The second guide rods of 70-；71- second straight line bearings；81- syringes；82- shanks；83- springs；
811- annular stop steps；821- annular protrusions；24- positioning columns；44- partition boards；
45- top plates；46- columns；47- fixed columns.
Specific embodiment
Effectively to detect whether electrolytic capacitor is correctly connected in electronic device and the dropped stitch feelings of the needle stand of electronic device
Condition improves the accuracy of detection structure, and an embodiment of the present invention provides a kind of electron device testing equipment.To make the mesh of the present invention
, technical solution and advantage it is clearer, the present invention is described in further detail by the following examples.
As shown in Figure 1, Figure 2 and Figure 4, electron device testing equipment provided in an embodiment of the present invention, including pedestal 10 and
Lower needle bed 20, pallet 30 and the upper stitch bed 40 and controller of pedestal 10 are supported in, lower needle bed 20 includes lower plant needle plate 21, corresponding
The electrolytic capacitor 51 of electronic device 50 is connected to the positive extreme direction of electronic device 50 and two test poles in cathode direction, lower plant needle plate
First time test probe 22 is implanted on 21 respectively, pallet 30 is located at the side that lower needle bed 20 deviates from pedestal 10, for placing electronics
Device 50, and the position that the test point of electronic device 50 is corresponded on pallet offers the survey that first time test probe 22 is allowed to pass through
Prospect hole；Upper stitch bed 40 is located at the side that pallet 30 deviates from pedestal 10, including upper plant needle plate 41, the electrolysis electricity of corresponding electronic device 50
Hold some position of 51 housing, upper plant needle plate 41 is implanted with towards test probe 42 on the first of pallet 30；
Controller is connect respectively with testing probe 42 on first time test probe 22 and first, in test, passing through
First time test probe 22 applies setting voltage to electrolytic capacitor 51；Two first time test probes 22 are obtained with being tested on first
The voltage value that probe 42 is detected determines to test the voltage value that probe 42 is detected on each first time test probe 22 and first
Between voltage difference, and judge whether electrolytic capacitor 51 reversed according to the comparison result of two voltage differences.
Wherein, the concrete numerical value for setting voltage is unlimited, in embodiments of the present invention, can be set to 3V.
It should be noted that lower plant not only is implanted with two on needle plate 21 in the position of the electrolytic capacitor 51 of corresponding electronic device 50
A first time test probe 22 is similarly implanted with test probe in other test point positions of corresponding electronic device 50, and existing
Similar in technology, controller judges according to the test information of the test probe of other test points of these correspondence electronic devices 50
The situation of the open lines of electronic device 50, short circuit or single component.The concrete type of electronic device 50 is unlimited, such as can
Think PCB.
Using electron device testing equipment provided in an embodiment of the present invention, set simultaneously by the bilateral in electronic device 50
Needle bed, instantly first time test probe 22 of the two of needle bed 20 contacted respectively with two test poles of electrolytic capacitor 51, upper stitch bed
Probe 42 is tested on the first of 40 when being contacted with the housing of electrolytic capacitor 51, by first time test probe 22 to electrolytic capacitor 51
Apply setting voltage, and obtain the voltage difference on two first time test probes 22 and first between test probe 42 respectively,
Finally can just judge whether electrolytic capacitor 51 reversed according to the comparison result of two voltage differences, compared with prior art in only
The voltage difference between two test poles of electrolytic capacitor 51 can be obtained, whether the program can effectively detect electrolytic capacitor 51
It is correctly connected in electronic device 50, improves the accuracy of testing result.
Preferably, controller is specifically used for：When voltage difference smaller is that corresponding electrolytic capacitor is connected to the negative of electronic device
When testing the voltage difference between probe on first time test probe of the test pole of extreme direction and first, judge electrolytic capacitor just
It is connected in electronic device；Conversely, then judge electrolytic capacitor reversal connection in electronic device.For example, in embodiments of the present invention, when to
After electrolytic capacitor applies the setting voltage of 3V, if corresponding electrolytic capacitor is connected to the first of the test pole of the positive extreme direction of electronic device
The voltage value that lower test probe is detected is 3V, and corresponding electrolytic capacitor is connected to the first of the test pole in the cathode direction of electronic device
The lower voltage value that is detected of test probe is 0V, the voltage of electrolytic capacitor housing that test probe is detected on first also close to
0V, at this point, voltage difference smaller be tested on first time test probe and first of the cathode of corresponding electrolytic capacitor probe it
Between voltage difference, illustrate that electrolytic capacitor is just connected in electronic device.
Preferably, as shown in figures 1 and 3, the lower position of pin hole for corresponding to 50 needle stand of electronic device on needle plate 21 of planting is implanted with
Second time test probe 23, the upper position for planting the pin hole that needle plate 41 corresponds to 50 needle stand of electronic device are implanted with towards on the second of pallet
Test probe 43；Controller is connect with testing probe 43 on second time test probe 23 and second, in test, working as correspondence
When short circuit occurs between probe 43 is tested on second time test probe 23 and second of the same pin hole of needle stand, needle stand is judged
Contact pin 51 is equipped in the pin hole, conversely, then judging the pin hole dropped stitch of needle stand.
The electron device testing equipment provided using the embodiment, by setting needle simultaneously in the bilateral of electronic device 50
Bed in test, is sent out between probe 43 is tested on second time test probe 23 and second corresponding to the same pin hole of needle stand
During raw short circuit, illustrate to test between probe 43 that electrical connection is formd by contact pin 51 on second time test probe 23 and second, this
Sample is equipped with contact pin 51 it may determine that going out in the pin hole；When second time test probe 23 of the same pin hole corresponding to needle stand and
Short circuit does not occur between test probe 43 on two, illustrates do not have shape between test probe 43 on second time test probe 23 and second
Into electrical connection, so as to judge the pin hole dropped stitch；Compared with prior art, the program can effectively detect the dropped stitch feelings of needle stand
Condition improves the accuracy of testing result.
As shown in Figure 2 and Figure 6, pedestal 10 includes the first through hole set corresponding to the surrounding of upper stitch bed, and electronic device is surveyed
Examination equipment further includes that one end is fixedly connected with upper stitch bed 40, other end slidable fit is in the first guide rod 60 of first through hole, with
And the first driving means slided in first through hole of the first guide rod 60 of driving, first straight line bearing is provided in first through hole
61.Using the embodiment scheme, upper stitch bed 40 it is height-adjustable, when will need electronic device 50 being positioned on pallet 30 or
When person takes away from pallet 30, the position of upper stitch bed 40 can be increased by first driving means；When to being positioned on pallet 30
Electronic device 50 when being detected, the height of upper stitch bed 40 is reduced by first driving means, the program improves electricity
The ease of use of sub- device detection equipment.Meanwhile the first straight line bearing 61 being set in first through hole can reduce first
Frictional resistance between guide rod 60 and first through hole, and the precision of rectilinear motion of the first guide rod 60 is improved, therefore the program
Stability and reliability that upper stitch bed 40 moves up and down can also be improved.Wherein, the quantity of the first guide rod 60 is unlimited, Ke Yiyan
The surrounding of upper stitch bed 40 is uniformly arranged multiple.
As shown in Figure 1, pedestal 10 includes the second through-hole for corresponding to the region setting that instrument connection is avoided on pallet 30, electronics
Device detection equipment further includes that one end is fixedly connected with pallet 30, other end slidable fit is in the second guide rod of the second through-hole
70 and the second driving device for being slided in the second through-hole of the second guide rod 70 of driving, it is straight that second is provided in the second through-hole
Spool holds 71.Similarly, it can be realized using the embodiment scheme and the height of pallet 30 is adjusted, set so as to improve electron device testing
Standby ease of use.The second straight line bearing 71 being set in the second through-hole can reduce the second guide rod 70 and the second through-hole
Between frictional resistance, and improve the precision of rectilinear motion of the second guide rod 70, therefore the program can also be improved on pallet 30
The stability and reliability of lower movement.
In embodiments of the present invention, first time test probe is flexible needle, can ensure that lower test probe can be in this way
The test point reliable contacts of electronic device.In other embodiments of the invention, test probe, second time test probe on first
With second on test probe may be flexible needle.
As shown in fig. 7, preferably, flexible needle includes syringe 81, shank 82 and spring 83, syringe 81 have openend and
Blind end, the inner wall of syringe 81 are provided with annular stop step 811, and the first end of shank 82 is by openend slidable fit in needle
In cylinder 81 and end is provided with the annular protrusion 821 that can be limited in annular stop step 811, and the second end of shank 82 stretches out syringe
81 and end be provided with test probe, spring 83 is limited between the first end of blind end and shank 82.
As shown in figure 5, in a preferred embodiment of the invention, have on lower plant needle plate 21 with being set to determining for electronic device
The matched positioning column 24 in position hole, the pallet position opposite with positioning column offer the through-hole that positioning column is allowed to pass through.Using this
Embodiment scheme passes through the cooperation of positioning column 24 and location hole, it can be ensured that and electronic device is positioned over the positional precision on pallet,
So as to which test probe be enable accurately to be aligned with the test point on electronic device.
As shown in figures 1 to 6, upper stitch bed 40 further include positioned at it is upper plant needle plate 41 away from pedestal 10 side partition board 44 with
And positioned at partition board 44 away from pedestal 10 side top plate 45, between top plate 45 and partition board 44, partition board 44 and it is upper plant needle plate 41 it
Between connected respectively by column 46, be provided through hole on upper plant needle plate 41, partition board 44 is fixed towards the upper side for planting needle plate 41
There is the fixed column 47 that can be passed through and pallet 30 is pressed in across hole and by electronic device 50.In this way, electronic device 50 is positioned over
Pallet 30 and after being positioned, electronic device 50 using fixed column 47 be pressed on pallet 30 and can be moved to avoid it,
Improve the use reliability of electron device testing equipment.It is noted that fixed column 47 contacted with electronic device 50 one
It can be truncated conical shape to hold end, in this way, will not be drawn while fixed column 47 and the contact area of electronic device 50 is reduced again
Hinder electronic device surface.
The embodiment of the present invention additionally provides another electron device testing equipment, including pedestal and is supported in pedestal
Lower needle bed, pallet and upper stitch bed and controller, lower needle bed include lower plant needle plate, electronic device needle stand are corresponded on lower plant needle plate
The position of pin hole is implanted with lower test probe；Pallet is located at the side that knit stitch bed deviates from pedestal, for placing electronic device, and pallet
The position of all test points of upper corresponding electronic device offers the instrument connection that lower test probe is allowed to pass through；Upper plant needle plate is located at
Pallet deviates from the side of pedestal, and including upper plant needle plate, the position of pin hole that upper plant needle plate corresponds to electronic device needle stand is implanted with direction
The upper test probe of pallet；
Controller connect respectively with lower test probe and upper test probe, in test, test probe and upper instantly
Probe connection is tested, short circuit occurs corresponding between the lower test probe of the same pin hole of needle stand and upper test probe for working as
When, judge to be equipped with contact pin in the pin hole of needle stand, conversely, then judging the pin hole dropped stitch of needle stand.
The electron device testing equipment provided using the embodiment, needle bed is set by the bilateral in electronic device simultaneously,
In test, when corresponding to short circuit occurs between the lower test probe of the same pin hole of needle stand and upper test probe, under explanation
Electrical connection is formd by contact pin between test probe and upper test probe, thus may determine that be equipped in the pin hole and insert
Needle；When short circuit does not occur corresponding between the lower test probe of the same pin hole of needle stand and upper test probe, illustrate that lower test is visited
Without forming electrical connection between needle and upper test probe, so as to judge the pin hole dropped stitch；Compared with prior art, the program can be with
It effectively detects the dropped stitch situation of needle stand, improves the accuracy of testing result.
Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art
God and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (10)
1. a kind of electron device testing equipment, which is characterized in that including pedestal and be supported in the lower needle bed of pedestal, pallet and on
Needle bed and controller, lower needle bed include lower plant needle plate, and the electrolytic capacitor that electronic device is corresponded on lower plant needle plate is connected to electricity respectively
The positive extreme direction of sub- device and two test poles in cathode direction are implanted with first time test probe respectively；Pallet is located at the knit stitch bed back of the body
Side from pedestal and for placing electronic device, and the position that the test point of electronic device is corresponded on pallet offers permission the
The instrument connection that once test probe passes through；Upper stitch bed is located at the side that pallet deviates from pedestal, including upper plant needle plate, upper plant needle plate pair
The position of the housing of the electrolytic capacitor of electronic device is answered to be implanted with towards testing probe on the first of pallet；
Controller is connect respectively with testing probe on first time test probe and first, in test, passing through first time survey
It sounds out needle and applies setting voltage to electrolytic capacitor；Obtain the electricity that test probe is detected on two first time test probes and first
Pressure value determines to test the voltage difference between the voltage value that probe is detected on each first time test probe and first, and root
Judge whether electrolytic capacitor is reversed according to the comparison result of two voltage differences.
2. electron device testing equipment as described in claim 1, which is characterized in that the controller is specifically used for：Work as voltage
Difference smaller is first time test probe and first of the test pole in the cathode direction that corresponding electrolytic capacitor is connected to electronic device
During voltage difference between upper test probe, judge that the electrolytic capacitor is just connected in electronic device；Conversely, then judge the electricity
Capacitance reversal connection is solved in electronic device.
3. electron device testing equipment as described in claim 1, which is characterized in that correspond to electronic device on the lower plant needle plate
The position of the pin hole of needle stand is implanted with second time test probe, and the upper position for planting the pin hole that needle plate corresponds to electronic device needle stand is planted
Have towards testing probe on the second of pallet；The controller connects with test probe on second time test probe and second
Connect, for test when, when corresponding on second time test probe of the same pin hole of needle stand and second test probe between send out
During raw short circuit, judge to be equipped with contact pin in the pin hole of needle stand, conversely, then judging the pin hole dropped stitch of needle stand.
4. electron device testing equipment as described in claim 1, which is characterized in that the pedestal includes corresponding to the upper needle
The first through hole of the surrounding setting of bed, the electron device testing equipment further include one end and are fixedly connected with the upper stitch bed, separately
One end slidable fit in the first through hole the first guide rod and driving first guide rod in the first through hole
The first driving means of slip are provided with first straight line bearing in the first through hole.
5. electron device testing equipment as described in claim 1, which is characterized in that the pedestal includes corresponding to the pallet
On avoid the instrument connection region setting the second through-hole, the electron device testing equipment further includes one end and the pallet
Be fixedly connected, other end slidable fit in second through-hole the second guide rod and driving second guide rod in institute
The second driving device slided in the second through-hole is stated, second straight line bearing is provided in second through-hole.
6. electron device testing equipment as described in claim 1, which is characterized in that first time test probe is flexible
Needle；And/or it is flexible needle that probe is tested on described first.
7. electron device testing equipment as claimed in claim 6, which is characterized in that the flexible needle include syringe, shank with
And spring, the syringe have openend and blind end, the inner wall of the syringe is provided with annular stop step, the shank
First end is provided with by the openend slidable fit in the syringe and end can be limited in the annular stop step
Annular protrusion, the second end of the shank stretches out the syringe and end is provided with test probe, and the spring retainer is in institute
Between the first end for stating blind end and the shank.
8. electron device testing equipment as described in claim 1, which is characterized in that have on the lower plant needle plate with being set to
The matched positioning column of location hole of electronic device, it is described fixed that the pallet position opposite with the positioning column offers permission
The through-hole that position column passes through.
9. electron device testing equipment as described in claim 1, which is characterized in that the upper stitch bed is further included on described
Plant top plate of the needle plate away from the partition board of the side of the pedestal and positioned at the partition board away from the side of the pedestal, the top
It is connected respectively by column between plate and partition board, between partition board and upper plant needle plate, is provided through hole on the upper plant needle plate, institute
The side for stating partition board towards the upper plant needle plate, which is fixed with, can pass through hole described in and electronic device is pressed in pallet
Fixed column.
10. a kind of electron device testing equipment, which is characterized in that including pedestal and be supported in the lower needle bed of pedestal, pallet and
Upper stitch bed and controller, lower needle bed include lower plant needle plate, and the lower position for planting the pin hole that electronic device needle stand is corresponded on needle plate is planted
There is lower test probe；Pallet is located at the side that knit stitch bed deviates from pedestal, and electronics device is corresponded to for placing electronic device, and on pallet
The position of all test points of part offers the instrument connection that lower test probe is allowed to pass through；Upper plant needle plate is located at pallet away from pedestal
Side, including upper plant needle plate, the upper needle plate position of pin hole that corresponds to electronic device needle stand of planting is implanted with upper test towards pallet
Probe；
Controller is connect respectively with lower test probe and upper test probe, in test, testing probe and upper test instantly
Probe connects, for when corresponding to short circuit occurs between the lower test probe of the same pin hole of needle stand and upper test probe, sentencing
Contact pin is equipped in the pin hole of broken needle seat, conversely, then judging the pin hole dropped stitch of needle stand.
Priority Applications (1)
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|---|---|---|---|
| CN201711329807.XA CN108132406A (en) | 2017-12-13 | 2017-12-13 | A kind of electron device testing equipment |
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|---|---|---|---|
| CN201711329807.XA CN108132406A (en) | 2017-12-13 | 2017-12-13 | A kind of electron device testing equipment |
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| CN108132406A true CN108132406A (en) | 2018-06-08 |
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| CN201711329807.XA Pending CN108132406A (en) | 2017-12-13 | 2017-12-13 | A kind of electron device testing equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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Application publication date: 20180608 |