CN104880585A

CN104880585A - Test probe

Info

Publication number: CN104880585A
Application number: CN201510238754.5A
Authority: CN
Inventors: 高春瑞
Original assignee: Xiamen Dacol Photoelectronics Technology Co Ltd
Current assignee: Xiamen Dacol Photoelectronics Technology Co Ltd
Priority date: 2015-05-12
Filing date: 2015-05-12
Publication date: 2015-09-02

Abstract

The invention relates to structure improvement of a test probe. The invention provides the test probe, which includes a conductor rod, one end of which is connected to a sleeve body; the conductor sleeve body, which includes an enclosed wall and a bottom, wherein one end, away from the bottom, of the wall is provided with an opening, the bottom is provided with a through-hole, and the wall is fixedly connected to the end of the conductor rod; a conductor probe head, which is arranged in the sleeve body and includes a support rod part, which passes through the through-hole in the bottom of the sleeve body and a contact part, part of which is exposed out of the opening of the sleeve body, connected to the support rod part; a conductor spring, which sleeves the support rod part of the probe head and two ends of which are limited to the contact part of the probe head and the bottom of the sleeve body; and a conducting wire, one end of which is connected to the support rod part and the other end of which is connected to the rod. The test probe is used for testing electronic products.

Description

Test probe

Technical field

The structure that the present invention relates to test probe is improved.

Background technology

Existing electronic product all can relate to the operation of it being carried out in the situation that switches on power to correlation parameter detection in process of production, and test probe generally can be adopted to make it carry out contacting with the tested pilot of electronic product and to realize being electrically connected.As shown in Figure 1, it is current LED light source, as COB(chip on board) a kind of conventional test probe of light-source encapsulation product, it adopts by Metallic rod 1 ' being connected with a metallic sheath 2 ', one probe 4 ' and spring 3 ' is set in the cavity that the opening of this metallic sheath 2 ' and the Metallic rod 1 ' of bottom are formed, with the mode of the contact of the contact of probe 4 ', the measuring current loading on Metallic rod 1 ' is sent to probe 4 ' by Metallic rod 1 ' and spring 3 ', spring 3 '.But after repeatedly using, the distortion due to spring 3 ' causes probe 4 ', spring 3 ' and Metallic rod 1 ' three loose contact; And in addition due to Metallic rod 1 ' wider (need at least be greater than this metallic sheath 2 ' most external diameter), light source can be blocked, thus cause the inaccurate of test data, even test experiments failure.A kind of test probe of the proposition of one patent publication No. CN1700020, proposes improvement for the intensity of probe and stroke, but its one-piece construction and above-mentioned existing test probe main structure body similar, also there is above-mentioned technical matters.

Summary of the invention

Thus, the present invention is directed to above-mentioned deficiency, propose a kind of test probe of improvement.

For this reason, the present invention adopts following technical scheme to solve:

A kind of test probe, comprising:

The body of rod of one conductor, one end of this body of rod is connected to a body;

The body of one conductor, this body comprises a wall enclosed and a bottom surface, and this wall forms an opening away from one end of this bottom surface, and this bottom surface offers a through hole, and this wall is fixedly connected with one end of this body of rod;

The probe of one conductor, the contact site that this probe comprises a pole portion and is attached thereto, this probe is arranged in this body, and this pole portion is arranged in this through hole on the bottom surface of this body, and this contact site has at least part to expose outside this opening of this body;

The spring of one conductor, this spring housing is located at the pole portion of this probe, and its two ends are limited to the contact site of this probe and the bottom surface of this body;

One wire, one end of this wire is connected to this pole portion, and the other end of this wire is connected to this body of rod.

The present invention adopts as above technical scheme to realize, and can avoid causing test probe to be tested because of the deformation of spring bad.

Accompanying drawing explanation

Fig. 1 is the cut-open view of the test probe of prior art;

Fig. 2 is the cut-open view of one embodiment of the invention.

Embodiment

For further illustrating each embodiment, the invention provides drawings attached.These accompanying drawings are a part for disclosure of the present invention, and it is mainly in order to illustrate embodiment, and the associated description of instructions can be coordinated to explain the operation principles of embodiment.Coordinate with reference to these contents, those of ordinary skill in the art will be understood that other possible embodiments and advantage of the present invention.Assembly in figure not drawn on scale, and similar element numbers is commonly used to assembly like representation class.

Now the present invention is further described with embodiment by reference to the accompanying drawings.

Consult shown in Fig. 2, as the test probe of one embodiment of the invention, comprising:

The body of rod 1 of one conductor, one end of this body of rod 1 is connected to a body 2;

The body 2 of one conductor, this body 2 comprises the wall enclosed 21 and a bottom surface 22, and this wall 21 forms an opening 211 away from one end of this bottom surface 22, and this bottom surface 22 offers a through hole 221, and this wall 21 is fixedly connected with one end of this body of rod 1;

The probe 3 of one conductor, the contact site 31 that this probe 3 comprises a pole portion 32 and is attached thereto, in this contact site 31 and this junction, pole portion 32, the external diameter of this contact site 31 is greater than the external diameter in this pole portion 32, namely the two junction forms a terrace, this probe 3 is arranged in this body 2, and this pole portion 32 is arranged in this through hole 221 on the bottom surface 22 of this body 2, and this contact site 31 has at least part to expose outside this opening 211 of this body 2;

The spring 4 of one conductor, this spring 4 is set in the pole portion 32 of this probe 3, and its two ends are limited to the contact site 31 of this probe 3 and the bottom surface 22 of this body 2, thus Compress Spring 4 carries out accumulation of energy;

One wire 5, one end of this wire 5 is connected to this pole portion 32, and the other end of this wire 5 is connected to this body of rod 1.

The probe 3 of the body of rod 1 of the conductor of this enforcement, the body 2 of conductor, conductor and the spring 4 of conductor all can adopt metal material to realize, and have excellent conductive performance and physical strength.

Preferred in this embodiment, the pole portion 32 of this probe 3 also forms a limiting structure, deviates from from the through hole 221 of the bottom surface 22 of this body 2 for limiting this pole portion 32.This embodiment is concrete, and the limiting structure in this pole portion 32 is bent to form with " 7 " font by this pole portion 32.Certain, those skilled in the art can also adopt other modes to realize, and through hole 221 exposed parts being such as positioned at the bottom surface 22 of this body 2 in the pole portion 32 of probe 3 connects the parts that an external diameter is greater than through hole 221 aperture, to limit, avoids.But the design of " 7 " font in the pole portion 32 of this embodiment is also for matching with the cambered design of wire 5, plays better other technologies effect, will describe in detail below.

Preferred in this embodiment, the two ends of this wire 5 are connected respectively by welding to be arranged on this pole portion 32 and this body of rod 1; And this wire 5 curve there is an arcuate structure after connect.

Preferred in this embodiment, in order to avoid wire is aging and affect electric conductivity, an also coated layer insulating on this wire 5.The material that this wire 5 adopts electric conductivity excellent realizes, as adopted silicone rubber wire (a kind of copper core flexible cord).Cater to the design of " 7 " font in the pole portion 32 of this embodiment, wire 5 is curved there is an arcuate structure, then weld together with pole portion 32 and the body of rod 1 respectively.Probe 3 so both can have been allowed more movable.The cambered design of this wire 5 effectively can ensure that wire 5 Integral swinging amplitude is little at probe 3 under significantly active situation, and then reduces wire 5 causes wire 5 to damage problem because of metal fatigue.

The test probe of embodiment is when testing, and due to the effect of spring 4, probe 3 is exposed at outside body 2.During test, this body of rod 1 presses down, the electrode contact of probe 3 and tested object (as COB lamp), in now probe 3 indentation body 2 (thickness of the tested object such as the degree of pinch in and such as COB plate is relevant).Due to the deformation effect of spring 4, force probe 3 tightly to contact with the electrode of tested object (as COB lamp), thus reduce contact resistance, probe 3 is directly connected with the body of rod 1 by wire 5, to avoid in the test probe of prior art, because of spring deformation, causing the phenomenon of poor electric contact.

As fully visible, this embodiment advantage specific as follows compared with the test probe of prior art:

One, the test probe before improvement, electric current is through Metallic rod 1 ' and flows to spring 3 ' and arrive probe 4 ' again; And this embodiment after improvement, electric current is directly sent to probe 3 by the body of rod 1 by wire 5, avoids causing because of spring deformation testing bad defect;

Two, the Metallic rod 1 ' of test probe before improvement is the wider body of rod, at least need be greater than the most external diameter of this metallic sheath 2 '; And this embodiment after improvement, the body of rod 1 is just connected and fixed with the wall 21 of this body 2, can adopt thinner Metallic rod, thus does not affect the test of some products, as test LED light source;

Three, the test probe before improvement, its metallic sheath 2 ' needs bottom welding with Metallic rod 1 ', is connected insecure, easily damages, and is also not easy to change spring 3 '; This embodiment after improvement is then not enough without these.

As can be seen here, this embodiment overcomes original test probe and causes Metallic rod and probe loose contact to affect the defect of testing because of spring deformation, has long service life, decreases the advantage of contact resistance; And the body of rod of this embodiment can adopt columniform thin metal rod, in the test of such as LED light source, blocking the light that test light fixture sends can be reduced, thus reduce the advantage of test error.

Although specifically show in conjunction with preferred embodiment and describe the present invention; but those skilled in the art should be understood that; not departing from the spirit and scope of the present invention that appended claims limits; can make a variety of changes the present invention in the form and details, be protection scope of the present invention.

Claims

1. a test probe, is characterized in that, comprising:

2. test probe according to claim 1, is characterized in that: the pole portion of this probe also forms a limiting structure, deviates from from the through hole of the bottom surface of this body for limiting this pole portion.

3. test probe according to claim 2, is characterized in that: the limiting structure in this pole portion is bent to form with " 7 " font by this pole portion.

4. test probe according to claim 1, is characterized in that: the two ends of this wire are connected respectively by welding to be arranged on this pole portion and this body of rod.

5. test probe according to claim 1, is characterized in that: this wire connects after curving and having an arcuate structure.

6. test probe according to claim 1, is characterized in that: an also coated layer insulating on this wire.