CN1598503A - Co-target X-ray space-time resolution spectrographic method and its spectrograph - Google Patents
Co-target X-ray space-time resolution spectrographic method and its spectrograph Download PDFInfo
- Publication number
- CN1598503A CN1598503A CN 200410040789 CN200410040789A CN1598503A CN 1598503 A CN1598503 A CN 1598503A CN 200410040789 CN200410040789 CN 200410040789 CN 200410040789 A CN200410040789 A CN 200410040789A CN 1598503 A CN1598503 A CN 1598503A
- Authority
- CN
- China
- Prior art keywords
- ray
- oval
- target
- focus
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/02—Dosimeters
- G01T1/026—Semiconductor dose-rate meters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- X-Ray Techniques (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention relates to co-target X ray space time resolution spectrum method and its instrument. The optical system of the instrument includes two elliptical crystal analyzer and an upper and subjacent channel thin gaps, their position relation accords with the theory of geometry optical of ellipse focus. The method is: the target is placed at the first focus of the ellipse, the thin gap is a the second focus of the ellipse, the spectrum detector is behind of the thin gap, uses the two elliptical crystal analyzers superposed on the first focus to carry on spectrum, the plasma X ray generated by the laser by striking the target penetrates the thin gap and is imaged by the X ray CCD camera and stripe camera after through the elliptical crystal analyzer spectrum, the X ray CCD camera takes the space resolution spectrum, the X ray stripe camera takes the time resolution spectrum. The invention can acquires the space and time resolution spectrums at the same time, and the receiving efficiency and spectrum resolution are upgraded.
Description
Affiliated technical field:
The invention belongs to common target X ray time-space resolution spectrographic method and spectrometer thereof.
Background technology:
In the laser inertial confinement fusion experimental study, the high power pulses laser target shooting produces a large amount of high-temperature plasmas, gives off a large amount of X ray from laser plasma, and this X ray can be used in spectral measurement and plasma diagnostics.The high-temperature plasma X ray is carrying a large amount of useful informations, and it can be used for determining the speed of expansion of electron temperature, electron density, Electron energy distribution, plasma and state of ionization etc.In addition, in the experimental study that carries out radiopacity, because radiopacity depends on state of matter strongly, and change very fast in time by the condition of high temperature that the radiation heating material reaches, high temperature state of matter itself is sent X ray by spontaneous radiation again simultaneously, therefore to carry out the accurate quantitative examination of radiopacity, just must employing have spectrographic method and the spectrometer thereof that the X ray room and time is differentiated simultaneously.
In order to absorb the spectrum of laser plasma X-ray, adopted grating as dispersion element in the past usually, utilize X-ray film to come spectra re-recorded.Plasma X-ray behind optical grating diffraction, imaging on X-ray film.Film obtains X ray spectrum through flushing, scans with black densitometer then, is transformed into the data file of position and blackness relation, just can obtain spectral line through data processing at last.This spectrographic method is because loading and unloading, flushing, the data processing of film need long time, so can not obtain the spectrum of X ray in real time.In addition, grating is difficult to the short-wave band X ray is carried out beam split owing to be subjected to the restriction of cutting spacing, and this spectrographic method is under the situation of once practicing shooting, usually can only the record space resolved spectroscopy.In order to study the change in time and space process of laser plasma X-ray, the method and the spectrometer thereof of just essential invention picked-up X ray time-space resolution spectrum.
Summary of the invention:
In order to diagnose the laser plasma X-ray of short-wave band, and the room and time resolved spectroscopy of X ray is absorbed in realization simultaneously, the present invention is directed to the deficiency that prior art exists, purpose provides a kind of target X ray time-space resolution spectrographic method and spectrometer thereof altogether, be implemented under the situation of once practicing shooting, obtain the room and time resolved spectroscopy of X ray simultaneously.
In order to realize the foregoing invention purpose, the technical solution adopted in the present invention is:
Focus on the principle of geometrical optics according to ellipse, the X ray that sends from a focus will focus at second focus place behind oval crystal diffraction.Around this principle, the present invention proposes common target X ray time-space resolution spectrographic method, this method is that two passages were made beam splitter about two identical oval analyzer crystals of employing were arranged in, utilize elliptic geometry optics to have the principle of self-focusing, target is placed on first focus of ellipse that two oval analyzer crystals coincide, two slits lay respectively on second focus of ellipse of two oval analyzer crystals, arrange X ray CCD camera and streak camera respectively in the slit back, two oval analyzer crystal beam split that the plasma X-ray that laser target shooting produces is coincided by first focus simultaneously adopt X ray CCD camera and streak camera at the back picked-up room and time resolved spectroscopy of two passage slit up and down respectively.The plasma X-ray that laser target shooting produces passes slit imaging on the cathode plane of X ray CCD camera of upper channel after the oval analyzer crystal beam split of upper channel, like this with X ray CCD camera picked-up spatially resolved spectroscopy.Meanwhile, laser plasma X-ray passes slit imaging on the cathode plane of X ray streak camera of lower channel after the oval analyzer crystal beam split of lower channel, like this with X ray streak camera picked-up time resolved spectroscopy.Be connected computing machine at X ray CCD camera with the streak camera back, can gather spectral signal in real time like this.Therefore, under the situation of once practicing shooting, can obtain the room and time resolved spectroscopy of laser plasma X-ray simultaneously.
Simultaneously, the present invention has designed the spectrometer that the common target X ray time-space resolution of realizing said method is taken the photograph spectrum: this spectrometer comprises optical system, image capturing system, support regulating system, vacuum system, point instrumentation and stainless steel casing.Described optical system comprises the oval analyzer crystal of upper channel, upper channel slit, the oval analyzer crystal of lower channel, lower channel slit, their position relation meets the oval principle that focuses on geometrical optics, first focus of the ellipse of the oval analyzer crystal of last lower channel overlaps, light source is positioned on first focus, two slits of last lower channel lay respectively on second focus of ellipse separately of two oval analyzer crystals, and two oval analyzer crystals are installed on the same riser.Image capturing system is made of X ray CCD camera, X ray streak camera and the computing machine that is connected separately respectively, and X ray CCD camera and X ray streak camera are arranged in the back of upper channel slit and lower channel slit.Optical system is installed in airtight casing the inside, and image capturing system is installed on two interfaces up and down of casing, and interface need seal.Support regulating system be installed in casing below, supporting box, and regulating before and after can carrying out up and down to the position of casing is to regulate the position relation between point instrumentation and the target.Vacuum system is connected with casing by the vacuum tube interface of casing side; Point instrumentation is installed in the back of casing, by the target in the aligning of the aperture on the riser that oval analyzer crystal the is installed target chamber.
Oval analyzer crystal in this spectrometer is selected the interplanar distance and the crystal that the X ray wavelength is close of surveying for use.
The invention has the beneficial effects as follows:
1, the crystal that adopts the interplanar distance and the X ray wavelength of surveying to be close carries out beam split, and crystal is bent to ellipse is made into oval analyzer crystal, compares with the flat crystal optical spectroscopy, can improve the receiving efficiency and the spectral resolution of X ray.
2, oval analyzer crystal is arranged on two passages, on a passage, absorb spatially resolved spectroscopy with X ray CCD camera, on another passage, absorb time resolved spectroscopy with the X ray streak camera, thereby under the situation of once practicing shooting, can realize absorbing simultaneously the room and time resolved spectroscopy of laser plasma X-ray, save the target practice expense.
3, compare with the X-ray film spectra re-recorded, adopt X ray CCD camera and streak camera spectra re-recorded to have the advantage of obtaining spectrum in real time, fast.
Description of drawings:
Accompanying drawing 1 is the principle of common target X ray time-space resolution spectrographic method.In Fig. 1, each digital implication is as follows: 1. target; 2. the oval analyzer crystal of upper channel; 3. upper channel slit; 4.X ray CCD camera; 5. computing machine; 6. the oval analyzer crystal of lower channel; 7. lower channel slit; 8.X ray streak camera
Accompanying drawing 2 is spectrometer structural representations that common target X ray time-space resolution is taken the photograph spectrum.In Fig. 2, each digital implication is as follows: 1. target; 2. the oval analyzer crystal of upper channel; 3. upper channel slit; 4.X ray CCD camera; 6. the oval analyzer crystal of lower channel; 7. lower channel slit; 8.X ray streak camera; 9. the switching flange between spectrometer and the target chamber; 10. slide valve; 11. corrugated tube; 12. support regulating system; 13. casing; 14. riser; 15. vacuum system; 16. point instrumentation; 17. target chamber
Embodiment:
Referring to Fig. 1, the inventive method can be schemed to embody thus: this method is to adopt two identical oval analyzer crystals 2,6 are arranged in up and down two passages makes beam splitter, utilize elliptic geometry optics to have the principle of self-focusing, target 1 is placed on first focus of ellipse A that two oval analyzer crystals coincide, two slits 3,7 lay respectively at two oval analyzer crystals 2, second focus B1 of 6 ellipse, on the B2, at slit 3,7 back are arranged X ray CCD camera 4 and streak camera 8 respectively, are connected computing machine 5 at X ray CCD camera 4 respectively with streak camera 8 back.Two oval analyzer crystal beam split that the plasma X-ray that laser target shooting produces is coincided by oval first focus simultaneously, adopt X ray CCD camera and streak camera at the back picked-up room and time resolved spectroscopy of two passage slit up and down respectively, the plasma X-ray that laser target shooting produces is after the oval analyzer crystal beam split of upper channel, pass slit imaging on the cathode plane of X ray CCD camera of upper channel, like this with X ray CCD camera picked-up spatially resolved spectroscopy.Meanwhile, laser plasma X-ray passes slit imaging on the cathode plane of X ray streak camera of lower channel after the oval analyzer crystal beam split of lower channel, like this with X ray streak camera picked-up time resolved spectroscopy, and gathers spectral signal in real time.
Below in conjunction with accompanying drawing 2, a concrete spectrometer structure that realizes the inventive method is described:
This spectrometer comprises optical system, image capturing system, support regulating system, vacuum system, point instrumentation and stainless steel casing.Optical system comprises the oval analyzer crystal 2 of upper channel, upper channel slit 3, the oval analyzer crystal 6 of lower channel, lower channel slit 7.The crystal that oval analyzer crystal selects for use interplanar distance and X ray wavelength to be close.Oval analyzer crystal 2 of upper channel and the oval analyzer crystal 6 of lower channel are installed on the same riser 14.The position relation of the oval analyzer crystal 2 of upper channel, upper channel slit 3, the oval analyzer crystal 6 of lower channel and lower channel slit 7 meets the oval principle that focuses on geometrical optics, first focus of ellipse that is oval analyzer crystal 2,6 overlaps, target 1 is positioned on first focus, and two slits 3,7 of last lower channel lay respectively on second focus of ellipse of two oval analyzer crystals.Support regulating system 12 be positioned at casing 13 below, point instrumentation 16 is positioned at the back of casing, by supporting the aiming centering that regulating system 12, corrugated tube 11 and point instrumentation 16 are realized spectrometers, just makes all alignment targets 1 of two oval analyzer crystals 2,6.Whether point instrumentation 16 adopts laser range finder, can carry out centering by sending laser, meet the requirements by the oval analyzer crystal distance of Laser Measuring again.Support regulating system 12 also plays the supplemental support effect to casing 13, can adopt the support adjustment structure of existing similar spectrometer to realize.Image capturing system is made of X ray CCD camera 4, X ray streak camera 8 and the computing machine 5 that is connected separately, and X ray CCD camera 4 and X ray streak camera 8 are arranged in the back of upper channel slit 3 and lower channel slit 7.Vacuum system 18 is installed in the side of casing 13, and the vacuum tube interface 15 by the casing side is connected with casing, is used for pair spectrometer inside and vacuumizes, the vacuum system that vacuum system 18 can adopt conventional spectrometer to use.The spectrometer front end has switching flange 9, is used for spectrometer is installed in target chamber 17, is provided with slide valve 10 between switching flange 9 and the corrugated tube 11, is used for the atmosphere between spectrometer and the target chamber 17 is separated.
The process of using this spectrometer to take the photograph spectrum is:
1, spectrometer is installed: by switching flange 9 spectrometer is installed in target chamber 17 outsides.
2, aiming centering: utilize point instrumentation 16, support regulating system 12 and the corrugated tube 11 of casing 13 back to aim at centering.
3, vacuumize:, therefore must vacuumize pair spectrometer inside because X ray is absorbed in atmosphere easily.Close slide valve 10, spectrometer and target chamber 17 are separated, utilize the vacuum system 18 of spectrometer to vacuumize.
4, laser target shooting: the high power pulses laser focusing on target 1, is made the ionization of target height, produce the high-temperature plasma x-ray source.
5, take the photograph spectrum: utilize X ray CCD camera 4 and streak camera 8 to absorb the room and time resolved spectroscopy of X ray simultaneously on two passages up and down, the spectrum picture that obtains is presented on the computing machine 5.
Claims (4)
1, a kind of target X ray time-space resolution spectrographic method altogether, it is characterized in that: adopt two identical oval analyzer crystals to be arranged in up and down two passages and make beam splitter, utilize elliptic geometry optics to have the principle of self-focusing, target is placed on first focus of ellipse that two oval analyzer crystals coincide, two slits lay respectively on second focus of ellipse of two oval analyzer crystals, arrange X ray CCD camera and streak camera respectively in the slit back, the plasma X-ray that laser target shooting produces is simultaneously by two oval analyzer crystal beam split, adopt X ray CCD camera and streak camera at the back picked-up room and time resolved spectroscopy of two passage slit up and down respectively, therefore under the situation of once practicing shooting, can obtain the room and time resolved spectroscopy of laser plasma X-ray simultaneously.
2, realize the spectrometer of target X ray time-space resolution spectrographic method altogether according to claim 1, it is characterized in that: this spectrometer comprises optical system, image capturing system, support regulating system, vacuum system, point instrumentation and stainless steel casing; Described optical system comprises the oval analyzer crystal of upper channel, upper channel slit, the oval analyzer crystal of lower channel, lower channel slit, their position relation meets the oval principle that focuses on geometrical optics, first focus of the ellipse of two oval analyzer crystals overlaps, light source is positioned on first focus, two slits of last lower channel lay respectively on second focus of ellipse of two oval analyzer crystals, and two oval analyzer crystals are installed on the same riser; Image capturing system is made of X ray CCD camera, X ray streak camera and the computing machine that is connected separately respectively, and X ray CCD camera and X ray streak camera are arranged in the back of upper channel slit and lower channel slit; Optical system is installed in closed stainless steel casing the inside, and image capturing system is installed on two interfaces up and down of stainless steel casing; Support regulating system be installed in casing below, support the position of regulating casing; Vacuum system is connected with casing by the vacuum tube interface of casing side; Point instrumentation is installed in the back of casing, by the target in the aligning of the aperture on the riser that oval analyzer crystal the is installed target chamber.
3, altogether target X ray time-space resolution according to claim 2 is taken the photograph the spectrum spectrometer, it is characterized in that: with laser range finder as point instrumentation.
4, target X ray time-space resolution altogether according to claim 2 is taken the photograph the spectrum spectrometer, and it is characterized in that: the interplanar distance of oval analyzer crystal is approaching with the wavelength of the X ray of surveying.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB200410040789XA CN100402994C (en) | 2004-09-27 | 2004-09-27 | Co-target X-ray space-time resolution spectrographic method and its spectrograph |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB200410040789XA CN100402994C (en) | 2004-09-27 | 2004-09-27 | Co-target X-ray space-time resolution spectrographic method and its spectrograph |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1598503A true CN1598503A (en) | 2005-03-23 |
| CN100402994C CN100402994C (en) | 2008-07-16 |
Family
ID=34664790
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB200410040789XA Expired - Fee Related CN100402994C (en) | 2004-09-27 | 2004-09-27 | Co-target X-ray space-time resolution spectrographic method and its spectrograph |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100402994C (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102778748A (en) * | 2011-05-11 | 2012-11-14 | 同济大学 | Aiming device for microscope for plasma diagnosis and use method thereof |
| CN106199677A (en) * | 2016-08-30 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | A kind of X-ray spectrum is measured and frame imaging system |
| CN106442565A (en) * | 2016-10-26 | 2017-02-22 | 中国科学院上海光学精密机械研究所 | Surface defect detection apparatus with high-speed laser line scanning |
| CN108013891A (en) * | 2018-01-26 | 2018-05-11 | 中国工程物理研究院激光聚变研究中心 | A kind of radiographic apparatus |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4051427B2 (en) * | 1998-03-26 | 2008-02-27 | 独立行政法人産業技術総合研究所 | Photoelectron spectrometer and surface analysis method |
| CN2399725Y (en) * | 1998-11-19 | 2000-10-04 | 中国科学院上海光学精密机械研究所 | Transmission raster spectrograph for soft x-ray waveband |
| CN1079159C (en) * | 1998-12-23 | 2002-02-13 | 中国科学院上海光学精密机械研究所 | Measuring device for laser plasma parameters and its measurement method |
| US6259763B1 (en) * | 1999-05-21 | 2001-07-10 | The United States Of America As Represented By The United States Department Of Energy | X-ray imaging crystal spectrometer for extended X-ray sources |
| JP2001153823A (en) * | 1999-11-29 | 2001-06-08 | Hitachi Ltd | Device and method for laser plasma x-ray spectroscopic analysis |
-
2004
- 2004-09-27 CN CNB200410040789XA patent/CN100402994C/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102778748A (en) * | 2011-05-11 | 2012-11-14 | 同济大学 | Aiming device for microscope for plasma diagnosis and use method thereof |
| CN102778748B (en) * | 2011-05-11 | 2014-08-13 | 同济大学 | Aiming device for microscope for plasma diagnosis and use method thereof |
| CN106199677A (en) * | 2016-08-30 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | A kind of X-ray spectrum is measured and frame imaging system |
| CN106199677B (en) * | 2016-08-30 | 2019-02-01 | 中国工程物理研究院激光聚变研究中心 | A kind of measurement of X-ray spectrum and frame imaging system |
| CN106442565A (en) * | 2016-10-26 | 2017-02-22 | 中国科学院上海光学精密机械研究所 | Surface defect detection apparatus with high-speed laser line scanning |
| CN106442565B (en) * | 2016-10-26 | 2019-06-21 | 中国科学院上海光学精密机械研究所 | The surface defect detection apparatus of high-rate laser line scanning |
| CN108013891A (en) * | 2018-01-26 | 2018-05-11 | 中国工程物理研究院激光聚变研究中心 | A kind of radiographic apparatus |
| CN108013891B (en) * | 2018-01-26 | 2023-08-04 | 中国工程物理研究院激光聚变研究中心 | X-ray diagnostic device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100402994C (en) | 2008-07-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Locher et al. | Versatile attosecond beamline in a two-foci configuration for simultaneous time-resolved measurements | |
| JP6208198B2 (en) | Adaptive cathodoluminescence detection system and microscope employing such a system | |
| CN111141701A (en) | Rapid super-resolution imaging method and system based on terahertz single pulse | |
| JP2013534692A5 (en) | ||
| CN1598503A (en) | Co-target X-ray space-time resolution spectrographic method and its spectrograph | |
| CN108398712B (en) | Conical strip crystal spectrometer and installation and adjustment method thereof | |
| Hou et al. | Fast-ion Dα spectrum diagnostic in the EAST | |
| CN206440616U (en) | A kind of light path system for laser microprobe analytical instrument | |
| Krupin et al. | Charge-exchange recombination spectroscopy of the plasma ion temperature at the T-10 tokamak | |
| Palutke et al. | Spectrometer for shot-to-shot photon energy characterization in the multi-bunch mode of the free electron laser at Hamburg | |
| Schmidt et al. | Development of a 10 kHz high harmonic source up to 140 eV photon energy for ultrafast time-, angle-, and phase-resolved photoelectron emission spectroscopy on solid targets | |
| Schlossberg et al. | Progress on thomson scattering in the pegasus toroidal experiment | |
| Hsieh et al. | Multipoint Thomson scattering diagnostic for DIII‐D | |
| CN107941831B (en) | A kind of electron-beam excitation fluorescence imaging and fluorescence spectrum measuring apparatus and its method | |
| CN108036930A (en) | A kind of detecting system of Transimission Grating Diffraction Efficiencies | |
| CN106645097A (en) | Optical path system for laser probe component analyzer | |
| Opachich et al. | A multi-wavelength streaked optical pyrometer for dynamic shock compression measurements above 2500 K | |
| CN105865626A (en) | Hyperspectral imager based on rotary filter monochromator | |
| Baldis et al. | Temporal multiplexing of Thomson scattering for the study of laser‐produced plasmas | |
| CN104977082A (en) | Ultraviolet spectrometer spectral resolution detection device and method | |
| Scheidt | UV and visible light diagnostics for the ESRF storage ring | |
| Wasser et al. | Full aperture backscatter diagnostics for characterization of laser plasma instabilities at the extreme light infrastructure (ELI) beamlines | |
| Sheftman et al. | Measurement of E× B drift of impurities in the C-2W inner divertor using spatial heterodyne spectroscopy | |
| Hubeny et al. | Thomson Scattering Setup | |
| Yoshikawa et al. | Calibration of space-resolving VUV and soft X-ray spectrographs for plasma diagnostics |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080716 Termination date: 20100927 |