CN1587981A - 原子力显微镜的光点跟踪装置 - Google Patents
原子力显微镜的光点跟踪装置 Download PDFInfo
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- CN1587981A CN1587981A CN 200410053442 CN200410053442A CN1587981A CN 1587981 A CN1587981 A CN 1587981A CN 200410053442 CN200410053442 CN 200410053442 CN 200410053442 A CN200410053442 A CN 200410053442A CN 1587981 A CN1587981 A CN 1587981A
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CN 200410053442 CN1249419C (zh) | 2004-08-04 | 2004-08-04 | 原子力显微镜的光点跟踪装置 |
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CN 200410053442 CN1249419C (zh) | 2004-08-04 | 2004-08-04 | 原子力显微镜的光点跟踪装置 |
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CN1587981A true CN1587981A (zh) | 2005-03-02 |
CN1249419C CN1249419C (zh) | 2006-04-05 |
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100449257C (zh) * | 2005-06-09 | 2009-01-07 | 日立环球储存科技荷兰有限公司 | 用原子力显微镜确定样品的材料界面和计量信息的方法 |
CN103207035A (zh) * | 2013-05-14 | 2013-07-17 | 曹毅 | 一种用于测量分子间作用力的力谱仪 |
CN103645347A (zh) * | 2013-12-03 | 2014-03-19 | 中国科学院电工研究所 | 微纳米尺度动态耦合振动的单点跟踪测量方法 |
CN103645348A (zh) * | 2013-12-03 | 2014-03-19 | 中国科学院电工研究所 | 一种微纳米尺度耦合振动高分辨测量方法 |
CN106483337A (zh) * | 2015-09-01 | 2017-03-08 | 日本株式会社日立高新技术科学 | 扫描探针显微镜和扫描探针显微镜的光轴调整方法 |
CN107063115A (zh) * | 2017-01-17 | 2017-08-18 | 天津众科创谱科技有限公司 | 一种开尔文探针的光路系统 |
CN108489414A (zh) * | 2018-05-07 | 2018-09-04 | 中国矿业大学 | 一种微纳尺度记忆合金双程记忆应变测试装置及测试方法 |
-
2004
- 2004-08-04 CN CN 200410053442 patent/CN1249419C/zh not_active Expired - Fee Related
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100449257C (zh) * | 2005-06-09 | 2009-01-07 | 日立环球储存科技荷兰有限公司 | 用原子力显微镜确定样品的材料界面和计量信息的方法 |
CN103207035A (zh) * | 2013-05-14 | 2013-07-17 | 曹毅 | 一种用于测量分子间作用力的力谱仪 |
CN103207035B (zh) * | 2013-05-14 | 2015-07-15 | 南京因艾生生物科技有限公司 | 一种用于测量分子间作用力的力谱仪 |
CN103645347A (zh) * | 2013-12-03 | 2014-03-19 | 中国科学院电工研究所 | 微纳米尺度动态耦合振动的单点跟踪测量方法 |
CN103645348A (zh) * | 2013-12-03 | 2014-03-19 | 中国科学院电工研究所 | 一种微纳米尺度耦合振动高分辨测量方法 |
CN103645347B (zh) * | 2013-12-03 | 2016-08-17 | 中国科学院电工研究所 | 微纳米尺度动态耦合振动的单点跟踪测量方法 |
CN106483337A (zh) * | 2015-09-01 | 2017-03-08 | 日本株式会社日立高新技术科学 | 扫描探针显微镜和扫描探针显微镜的光轴调整方法 |
CN107063115A (zh) * | 2017-01-17 | 2017-08-18 | 天津众科创谱科技有限公司 | 一种开尔文探针的光路系统 |
CN108489414A (zh) * | 2018-05-07 | 2018-09-04 | 中国矿业大学 | 一种微纳尺度记忆合金双程记忆应变测试装置及测试方法 |
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Publication number | Publication date |
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CN1249419C (zh) | 2006-04-05 |
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Owner name: SHANGHAI AIJIAN NANOMETER TECHNOLOGY DEVELOPMENT Effective date: 20050304 |
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Effective date of registration: 20050304 Address after: Shanghai 800-211 post office box Applicant after: Shanghai Optical Precision Machinery Inst., Chinese Academy of Sciences Co-applicant after: Shanghai AJ Nano-Science Development Co., Ltd. Address before: Shanghai 800-211 post office box Applicant before: Shanghai Optical Precision Machinery Inst., Chinese Academy of Sciences |
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