CN1559008A - Coaxial tilt pin fixture for testing high frequency circuit board - Google Patents
Coaxial tilt pin fixture for testing high frequency circuit board Download PDFInfo
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- CN1559008A CN1559008A CNA018237835A CN01823783A CN1559008A CN 1559008 A CN1559008 A CN 1559008A CN A018237835 A CNA018237835 A CN A018237835A CN 01823783 A CN01823783 A CN 01823783A CN 1559008 A CN1559008 A CN 1559008A
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- circuit board
- test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
A translator fixture for use in testing high frequency or high speed digital circuit boards. The fixture has a pin supporting top plate (29) and base plate (32) and coaxial constant impedance test pins (23) incorporated into the fixture to provide a signal path from a test analyzer to the circuit board (16) under test. The board under test is coupled to an upper surface of the top plate. The impedance of the coaxial pins is matched to the impedance of the board under test as well as the impedance of the test analyzer. Force exerted on the coaxial pins ensures contact of the pins with test points on the circuit board under test. The force may be exerted by spring loaded probes (12) mounted on a compliant test interface (10) below the base plate. The force may also be exerted by Euler buckling the pins by relative movement between the circuit board under test and a second circuit board coupled to the base plate or to the test analyzer.
Description
Technical field
The present invention relates to test automatically the element of installing on high frequency or high-speed figure printed circuit board and these plates, and relate more specifically to a kind of being used for the test signal from measuring and analysing meter is forwarded to impedance matching forwarder jig on these circuit boards or the element.
Background of invention
The ATE (automatic test equipment) that is used for checking printed circuit board (PCB) relates to during the use test " nail bed " detection clamp or breakout box of mounting circuit boards therein for a long time.This detection clamp comprise a large amount of under spring pressure and the spike spring that electrically contacts of the nominative testing point on the tested circuit board (being also referred to as tested unit or " UUT ") load test probe.Any particular electrical circuit of layout on printed circuit board is mostly different with other circuit, arranges thereby must customize out the nail bed that is used for contacting with the test point of plate for concrete circuit board.When the circuit that design will be tested, the pattern of the test point of using in selecting to check and the corresponding test probe of arranging of configuration in detection clamp.This typically relates to and getting out on the probe card and the hole pattern of the customized arrangement of test probe coupling and test interface or the probe field that then the installation testing probe is complied with formation in these holes that get out on the probe card.Then circuit board is installed in the jig that is laid in the test probe arrangement.At test period, make spring-loaded probe and contact with being estimated test point spring pressure on the circuit board.Electric test signal is sent to test probe and then is sent to the outside of jig from circuit board then, so that and the high-velocity electrons measuring and analysing meter communication of the continuity between each test point in each circuit or uncontinuity on the check-out console.
The detection clamp of one quasi-representative is so-called " grid " class testing jig, wherein contacts with pattern test point at random on the plate by the breakout box pin that test signal is sent on the interface pin group of arranging by lattice in the receiver.Typical case's grid jig comprises a latticed test interface or a probe field complied with, and the latter typically comprises the equidistant opening that forms by predetermined pattern.Because it constitutes the patterns of openings of predesignating of grid, such test interface of complying with is commonly referred to grid or grid base.The grid type detection clamp comprises the test electronic circuits that has a large amount of switches, these switches with is connected with test probe that grid base opening cooperates, thereby with the Electronic Testing analyser in the test circuit correspondence.In an embodiment of grid tester, use nearly 40,000 switch.When test on this tester during bare board, converter jig is supported the communication between the non-lattice test point on lattice test probe in the grid base and the Board Under Test.In a kind of grid jig of prior art, so-called " tilt pin " is used as the breakout box pin.These pins are straight solid pins and are installed in the corresponding aperture that gets out in advance on the breakout box plate as the part of converter jig.These tilt pins can tilt by various directions, with from the UUT at random, each test signal of the test point of non-lattice is sent on the test probe group of the lattice in the grid base.
The detection clamp of other type comprises the detection clamp of non-" grid type ".These jigs comprise the test interface of complying with that has openings different with the standard network grid pattern on the pattern.For example, these openings may be not equidistant or unevenly spaced to form " non-lattice ".These jigs use tilt pins, with on the non-lattice that is forwarded to from the test signal of complying with the non-lattice on the test interface among the UUT.Non-lattice on the UUT is different with the non-lattice on complying with test interface.Typically, the interval between the test point on the UUT can be shorter than the interval between the corresponding probe of complying with on the test interface.
Recent method adopts the breakout box pin to keep system to the breakout box jig that is used for the printed circuit board tester, and this tester has the test probe pattern that deviates from base plate when installing this breakout box jig.This jig has a plurality of almost parallels and breakout box plate at interval, these plates have the breakout box pin that preformed sectional hole patterns is used to comprise and support to pass these plates extensions of breakout box jig, for using in the transmitted test signal between by the probe on the base plate of the test point on the printed circuit board of jig support and this tester.At the thin elasticity pin holding plate that is made of resilient material in the location, surface of one of these breakout box plates, thereby the breakout box pin that this breakout box jig carries passes this pin holding plate.This elasticity pin holding plate is exerted pressure around each breakout box pin in essence.When jig tilts or end face when downward, this pressure remains on pin in the jig.This is applied to other pin and each the breakout box plate that the pressure on these pins allows pin to be independent of this jig and moves with this holding plate.This has been avoided in jig in fact axially movable resistance of complying with of pin or restriction.This pin holding plate for example is described in 5,493, No. 230 patents of the U.S., and this patent is included as a reference.
For fear of the decay of high-frequency signal, the impedance matching of the impedance of the test request test source of high frequency or high-speed figure UUT (test source of electric signal promptly is provided) and load (being UUT).In addition, necessary and the impedance in source and the impedance matching of load of the interconnection impedance between UUT and the measuring and analysing meter.The problem of the present breakout box jig that is comprising pin is that the impedance of pin may change with each pin.This impedance variation is owing to the variation on the spacing between two pins (being signal pins and grounding pin) that are used for testing one group of test point causes.This variation is due to the fact that and causes, that is, spacing between the last set of test spots that will test of UUT and the spacing of complying with between the corresponding probe on the test interface are different.In essence, every group of one of pin formation is the capacitor of condenser dielectric with the air.Because the spacing of one group of pin can be different with another spacing of organizing pin, thereby electric capacity between every group of pin and the impedance carried out between every group of pin are also different.Thus, the present breakout box jig that has pin is not suitable for test high frequency or high speed UUT.
At present, typically utilize test jack test high frequency or high-speed figure UUT, for example digital circuit board, the digital circuit board that element is installed or discrete component.Typically, in the cavity that the whole thickness along socket forms, short spring probe is installed.The termination press contacts of the contact side of UUT and the spring probe that protrudes from socket one side.The contact plate that is connected with measuring and analysing meter contacts with the termination of the spring probe that protrudes from the opposite side of this socket.This measuring and analysing meter sends the high-frequency test signal to this contact plate, and these signals send to UUT from this plate through spring probe.But, because the spacing between the socket medi-spring probe core is by the physical size of spring probe, i.e. spring probe diameter, restriction, such testing scheme can not be used to test the short relatively UUT of center distance of its contact point.In addition, because the spacing between the probe reduces, it is out of the question that impedance matching may become.In order to make owing to spacing between the probe reduces the unmatched influence of impedance for minimum, the length that must make probe is for minimum.Be sure of that the matched impedance testing scheme is limited to its contact point center distance of test and is not less than 0.07 inch UUT.
Many prior art jigs need some mechanical hook-ups, and for example spring loads probe, are used for contacting with the appropriate of test point on the UUT guaranteeing applying resilience on the pin.The shortcoming of this jig is that they have very fast easily out of order moving-member.
The present invention is based on and recognize and need a kind of impedance matching interconnection of its contact point center distance that can be used to test less than 0.07 inch high frequency UUT.In addition, the present invention is based on and recognize and need a kind of such breakout box jig, promptly it does not contain such as being used for pin in the breakout box jig and applies the mechanical hook-up of the spring probe of resilience.
Summary of the invention
The present invention relates to a kind of breakout box jig or be used to test high frequency or the interconnection of high-speed digital circuit plate or tested unit (UUT).The present invention is made of a kind of breakout box jig, and it has the apical grafting ground support plate and the end ground connection support plate at interval on the space, and every strip has passes the pin bores that its thickness forms.In one embodiment, there are four support plates that are positioned between top board and the base plate, although these data are changeable.The upper surface interface of UUT and top board.This top board have with UUT on the pin bores of one group of test point correspondence.This base plate and an interface of complying with (or probe field) butt joint, the latter has one group of elasticity of arranging by lattice or non-lattice and loads test probe.Hole on the base plate and this spring probe pattern correspondence.This probe pattern is typically different with this pattern of organizing test point formation on the UUT.Second circuit board and this measuring and analysing meter and this are complied with test interface and are connected.
The signal path of the test point of coaxial pin on providing from the measuring and analysing meter to UUT is provided, and the center of these test points can be by less than 0.07 inch even be separated by less than 0.025 inch distance.Coaxial pin is to be made of single signal pins of being surrounded by shielding.This signal pins is isolated by insulating material and this shielding.This shielding serves as ground.Spacing between the shielding that signal pins and each pin use is identical.Thereby each coaxial pin has identical impedance.
A point is worn in the termination of coaxial pin, thereby each signal pins surpasses shielding separately.One end of coaxial pin passes the hole on the top board, and the other end passes the hole on the base plate and loads test probe and contact with a predetermined spring in complying with test interface, this spring loads test probe and this coaxial pin is applied is obedient to power, contacts with the reliable of test point on the UUT guaranteeing.Load test probe and be sent to test point on the UUT through spring by second circuit board from the signal of measuring and analysing meter through coaxial pin.Also use grounding pin, be connected so that the earth point on the UUT loads test probe with the spring of ground connection in complying with test interface.
The impedance of coaxial pin, grounding pin, coaxial test probe, UUT, measuring and analysing meter and interface card is mated.The impedance of complying with each probe in the test interface is the adjacent signal probe and the function of the spacing between the grounded probe.Coupling in the impedance allows this interconnection applications in the test to high frequency or high-speed digital circuit plate.
In another embodiment, thus this breakout box jig does not comprise that any spring loads probe and discord is complied with the test interface butt joint.And UUT and top board butt joint.Second circuit board that is connected with measuring and analysing meter and base plate butt joint.Coaxial pin provide second and first circuit board between signal path.At test period, move relative to each other by the application vacuum or by these two circuit boards of mechanical hook-up, thereby make each coaxial pin fastening, be preferably Euler's fastening.The fastening of pin causes them that two circuit boards are applied to be obedient to power, thus guarantee between the test point on pin and the UUT and pin and second circuit board on suitable point between reliable contact.Point on second plate forms grid type or non-grid type pattern.
By this embodiment, utilize two formula poles that top board and base plate are separated.Each two formula pole comprise can with slide first member of engagement of second member.A member is connected with top board, and another member is connected with base plate.Before the fastening pin, first member does not stride across the whole distance between two plates.Between first member and a plate, there is the gap.Along with two circuit boards are movable relative to each other, each pin fastening.Simultaneously, the gap that should form between first member and plate disappears.Thereby, two amounts that circuit board moves relative to each other of the original width in this gap control, and the amount buckled of pin thus.Spacing between the signal pins of each coaxial pin and the shielding remains unchanged, even in the fastening during coaxial pin.Thereby even in the fastening, the impedance of coaxial pin remains unchanged.
Comply with spacing between test interface or test analysis instrument circuit mesopore by change, pin can fully tilt so that the interconnection to the contact point on the UUT to be provided, and the distance between these contact point centers can be less than 0.07 inch even less than 0.025 inch.In addition, because coaxial pin provides impedance matching, can be interconnection applications of the present invention in test high frequency UUT.
Can more fully understand the present invention these and others by reference following detailed description and each accompanying drawing.
Description of drawings
Fig. 1 is a block schematic diagram, tester is shown and according to the ingredient of the breakout box jig that has the pin holding device of the principle of the invention.
Fig. 2 is the part sectioned view that has the breakout box jig of the coaxial pin of rigidity.
Fig. 3 is the sectional view of coaxial pin.
Fig. 4 A is the part sectioned view with the breakout box jig of the coaxial pin of rigidity that does not have spring loading probe.
Fig. 4 B is the part sectioned view of breakout box jig when buckling coaxial pin of Fig. 4 A.
Fig. 5 A is the front elevation of the breakout box jig of Fig. 4 A.
Fig. 5 B is the front elevation of the breakout box jig shown in Fig. 4 B.
Detailed description of the present invention
With reference to the block schematic diagram of Fig. 1, the circuit board testing instrument comprises that one is complied with test interface plate or probe field (being called " complying with test interface " herein) 10, and the latter has one group of spring of arranging and loads test probe 12 on two-dimensional pattern.The grid type pattern that this pattern can be made up of evenly spaced test probe on one group of ranks perhaps can be non-grid type pattern, i.e. the pattern that only is made of evenly spaced test probe.Test probe 12 comprise from the surface of complying with test interface projection, typically equally distributed spring loads inserted link on probe groups.High frequency or High-Speed Printed Circuit Board 16, the circuit board that element is installed, discrete component or element in groups (this paper is called " tested unit " or " UUT ") that the breakout box jig or 14 supports that interconnect will be tested.The breakout box jig serves as one group of test point 18 on the tested test plate (panel) and this and complies with interface between the test probe group 12 in the test interface.External electrical measuring and analysing meter 20 is electrically connected by test probe in this breakout box jig and the test point in the tested test plate (panel).These test probes (they can be several types) briefly illustrate at 22 places.
Measuring and analysing meter 20 comprises that the electronics interrogator circuit of each test point 18 of inquiring UUT electronically is so that the high frequency electrical connection performance between definite any two given test points.Between the test point on the UUT on the detected high frequency characteristics electronics and the benchmark result that obtains of the test point from prior inquiry non-fault mother (master) printed circuit board of having stored relatively.If the benchmark architecture of test result and this storage mates then Board Under Test is good,, can distinguish the bad plate plate of becoming reconciled thereby find this problem by this test result if having problems in the circuit still on the plate.
The electronics interrogator circuit can by a plurality of have be used to carry out the electronic component of Electronic Testing and the printed circuit card of printed circuit constitutes.Each test probe that uses in the test process can lead to this measuring and analysing meter inductive switch 24 is connected with test electronic circuits by one.In comprising the grid type tester of switch (tester of complying with test interface that is promptly comprising the lattice hole group that is used for admitting test probe), can there be nearly 40,000 switches that are used to test each test point on the Board Under Test.These switches preferably are included in one or more circuit boards.
These standard tilt pins pass the hole on base plate, lower plate, middle plate, upper plate and the top board.Hole drill on every block of breakout box plate becomes pattern, thereby this pattern makes tilt pin align so that realize complying with probe pattern on the test interface and the conversion between the non-grid type pattern on the UUT by various according to known process by the control of standard computer function software.
Tilt pin also passes and is positioned at the elasticity pin holding plate 34 that the bottom top below of lower plate (and be positioned in a preferred embodiment) is made of a thin resilient material public plate.This pin holding plate of explanation in 5,493, No. 230 patents of the U.S. that mentions in front.
The present invention relates to utilize the breakout box jig test high frequency or the high-speed figure UUT that have tilt pin.The applicant finds to use tilt pin can the test contact center close, and promptly the spacing between the center, two contacts is less than 0.07 inch even less than 0.025 inch, UUT.High-frequency test comprises that frequency level surpasses the test that 100M is conspicuous, the test bandwidth is conspicuous above 1G.In the conspicuous scope of 1-2G even to test in the conspicuous scope of 4G be common.For fear of the decay of high-frequency signal, the impedance matching of the impedance of source (being test circuit) and load (being UUT).This requires the impedance of tilt pin and spring to load the impedance of probe and the impedance matching of load.The impedance that is installed in the common tilt pin in the breakout box jig may be different and different with pin.This be because in every group of pin that is used for testing one group of test point on the UUT between test signal pin and the adjacent grounding pin spacing be different.In essence, adjacent pin forms the capacitor that an air serves as medium.Because spacing is different between the pin set, thus electric capacity and and then impedance also be different.The present invention overcomes this problem by the breakout box jig that use has the coaxial pin of rigidity shown in Fig. 2.
Coaxial pin 23 comprises a central signal pin 40 that is surrounded by grounded shield 42 (Fig. 3).Medium 44 is isolated signal pins and shielding.From the end to end of pin, thereby the radial distance 46 between signal pins and the shielding and the radial thickness of this medium are constant.Thereby coaxial pin has the impedance of regulation.According to the present invention, in fact the coaxial pin that comprises in the breakout box jig has identical impedance.In one embodiment, the impedance of load and UUT all is 50 ohm.Thereby in this embodiment, the impedance of coaxial pin also is 50 ohm.
A point is worn in the termination of coaxial pin, thereby each signal pins 40 surpasses shielding.In addition, more close mutually by the end points of the coaxial pin that tilts by having end points, thus they are contacted less than 0.025 inch point with spacing on the UUT.
When locating in this converter jig, one of coaxial pin shielding terminates on the upper surface 50 of top board, and other end terminating is on the lower surface 52 of base plate.Top board and base plate be ground plate and utilize low-loss ground connection be connected 48 the two be connected to electrical ground.Signal pins is stretched out to contact with UUT and to be stretched into to carry spring with signal from base plate from top board and is loaded probe and contact.Spring loads probe is obedient to (compliant force) power and contacts with the reliable of test point on the UUT so that guarantee applying on the pin.
Can use grounding pin 54 with UUT on earthing test point and the spring of complying with the ground connection in the test interface load probe (being also referred to as " grounded probe ") and contact.The impedance of grounding pin also with the impedance matching of source, load and coaxial pin.The impedance of signal probe and grounded probe is a function of complying with the probe spacing in the test interface.Because the impedance of coaxial pin is not subjected to the influence of the spacing between the pin, design is complied with the spacing of the probe in the test interface to produce desired probe impedance and to admit the rational spring of size to load probe easily.
In a preferred embodiment, interface card 58 makes spring load probe and testing apparatus butt joint.In this embodiment, the signaling point on signal pins 23 and the interface card 58 is communicated with.The impedance of circuit board 58 also with the impedance matching of load.Like this, connect one from testing apparatus through this interface card, through a signal probe, through a test point on the UUT, on UUT earthing test point and through the circuit of a grounding pin to ground.Select ground fully, the earthing test point on the UUT can be directly grounded on the top board, thereby relaxes the needs of grounding pin.
In another embodiment, the converter jig comprises top board 126 and base plate 132 but does not use other intermediate plate (Fig. 4 A).Top board and UUT16 dock and base plate and 158 butt joints of measuring and analysing meter interface card.As last embodiment, top board and chassis ground.Each plate has the hole 60 of running through its whole thickness.Has a hole 60 for easy in Fig. 4 A, top board and base plate being illustrated.Each test point alignment on roof hole and the UUT.Each signaling point alignment on bottom plate hole and the interface card.They can also align with the earth point on the interface card.Earth point on the interface card can be distinguished directly with the earthing test point on the UUT and contacts with the base plate or the top board of ground connection.
In the hole of one end of coaxial tilt pin 123 is packed in the hole on the base plate and the other end is packed into top board, thereby provide essential signal path between measuring and analysing meter and the UUT.Because the termination of coaxial tilt pin and terminal preferably wearing into make the central signal pin surpass the taper of shielding, the test point on the cusp that has only signal pins and the UUT and the signaling point of interface card contact.The ring wall in the hole 60 on shielding and top board and the base plate contacts.Under the earth-free situation to top board of the earth point on the UUT, can also adopt the grounding pin of this tilt pin shape.
Utilize pole 70 (Fig. 5 A) top board 126 to be connected with base plate 132.Each pole preferably includes first member 72 that slides and mesh with second member 74.Member is connected with top board and another member is connected with base plate.When tilt pin was installed, first member did not stride across the whole distance between two plates.Between first member and a plate, there is gap 76.Then be movable relative to each other UUT and interface card, thereby make coaxial pin fastening.This can realize by one or two that utilize that mechanical part 80 pushes away in UUT and the interface card.Alternatively, can be achieved by between UUT and interface card, introducing the vacuum that the two is relatively moved.Can introduce vacuum by vacuum plant 82.Utilizing mechanical part or vacuum plant that plate is movable relative to each other is known technically.Along with plate is movable relative to each other, each tilt pin fastening under Euler's fastening (Fig. 4 B).When to elongate rod, promptly Euler's fastening appears in pin when applying load with Pcr, and Pcr equals 4 π
2EI/l
2, wherein E is the elastic modulus of coaxial pin, I is a moment of inertia and l is the drift 64 of pin.
When UUT and interface card move relative to each other, the closed gap 76 thereby two members of each pole also slide relative to one another.In case this gap-closing (Fig. 5 B), UUT and interface card can not further relatively move each other.Thereby, can design gap width be limited on the desired level with fastening pin.
In case applying the suitable point on test point on the UUT and the interface card, fastening, coaxial pin be obedient to power.Therefore, do not need to be used for apply on the pin be obedient to power so as to guarantee pin and UUT on test point between the spring of reliable contact load probe.
Spacing between central signal pin between each coaxial pin during Euler's fastening and shielding remains unchanged.Like this, although fastening may change the spacing between the pin, the impedance of coaxial pin remains unchanged.Therefore, adopt the coaxial pin can be interconnection applications of the present invention under high frequency, testing UUT.
The advantage of this embodiment is needn't make to be spring-loaded probe in test circuit.The result is, can also reduce in order to make these probes have suitable space on the test interface so that make their impedance and required time and the cost of impedance matching of UUT complying with.As last embodiment, also need the impedance of interface card and the impedance matching of UUT.In addition, if use grounding pin, the impedance of grounding pin also should with the impedance matching of UUT.
In an alternate embodiment, top board can with one be not the first circuit board (not shown) butt joint of UUT.In such an embodiment, UUT is connected with this first circuit board or otherwise butt joint.Similarly, base plate can dock with the second circuit board (not shown).In this case, this second circuit board and this interface card 158 can be connected to each other or butt joint otherwise.
Claims (34)
1. one kind is used to make a breakout box jig that circuit board is connected with the measuring and analysing meter equipment that the high-frequency test signal is provided will testing under high frequency, and this jig comprises:
One is used for the top board that is connected with tested circuit board;
One is used for the base plate that is connected with the measuring and analysing meter equipment that is used to provide the high-frequency test signal source; And
A plurality of coaxial test pin of supporting by this top board and this base plate, each test pin comprises a solid center pin, wherein each center pin has and extends to first end on this top board and extend to second end on this base plate with the test signal path of the test point on providing from this measuring and analysing meter equipment to this circuit board, and described coaxial test pin has identical impedance in fact to promote to be enough to realize the impedance matching to this circuit board Validity Test under high frequency.
2. jig according to claim 1, wherein each coaxial pin also comprises the shielding of one deck coaxial surrounding center pin, by electrically non-conductive material Isolated Shield and center pin, wherein each the end center pin at pin exceeds shielding.
3. jig according to claim 2, wherein top board and base plate are ground connection, wherein top board and base plate have the hole of the thickness that runs through them, wherein the ring wall in the hole on the shielding of each coaxial pin and the top board contacts and contacts with the ring wall in hole on the base plate, and wherein the center pin of each coaxial pin reaches on the upper surface of top board and reaches under the lower surface of base plate.
4. jig according to claim 3, wherein the shielding of each coaxial pin does not reach on the upper surface of top board and under the lower surface of base plate.
5. jig according to claim 3 also comprises a plurality of grounding pins, and each grounding pin has the hole of passing on the top board and is used for first end that contacts with test point on the tested circuit board and second end that passes the hole on the base plate.
6. jig according to claim 3 also comprises:
One interface between base plate and the testing apparatus is provided comply with the test interface plate, this is complied with the test interface plate and comprises a plurality of holes, wherein a hole correspondence on each hole and the base plate; And
Each spring complying with in the interface plate hole loads probe, is used for passing that corresponding aperture reaches that center pin under the base plate lower surface applies power so that this coaxial pin reliably contacts with test point on the tested circuit board.
7. jig according to claim 6, also comprise a plurality of grounding pins, each grounding pin has the hole of passing on the top board and is used for first end that contacts with test point on the tested circuit board and passes hole and and second end that spring loading probe contacts on the base plate.
8. jig according to claim 7, wherein arrange and the spring of a center pin contact loads spring that probe contact with adjacent and grounding pin and loads spacing between the probe, pass through the impedance of each described probe and impedance matching coaxial pin with generation.
9. jig according to claim 8 wherein is chosen to the impedance of coaxial pin and the impedance of tested circuit board and the impedance matching of testing apparatus.
10. jig according to claim 6, comprise that also one is complied with the apparatus circuit for testing plate that the lower surface of test interface plate is connected the end of with, this apparatus circuit for testing plate has the impedance with the impedance matching of testing apparatus, and this circuit board has and spring loads the contact of probe contact so as testing apparatus to be provided and probe between electrical path.
11. jig according to claim 1, wherein the impedance of each coaxial pin is about 50 ohm.
12. jig according to claim 1, comprise that also is used for a following circuit board that is connected with testing apparatus, the lower surface of this time circuit board and base plate docks and has the contact point that is used to provide the electrical path of coaxial pin, and wherein each pin of fastening is to apply power to contact point on the following circuit board and the test point on the tested circuit board.
13. jig according to claim 12, wherein coaxial pin is by Euler's fastening.
14. jig according to claim 12 also comprises the pole that is used for supporting with respect to base plate top board, every pole comprises:
First member that is connected with one of plate; And
Second member that is connected with another plate, second member mesh with first member slidably, thereby top board is moved with respect to base plate.
15. jig according to claim 14, wherein plate of these pole restrictions moving to another piece plate.
16. jig according to claim 12, wherein each coaxial pin is made of a center pin that has coaxial shielding, by electrically non-conductive material should shielding and this center pin isolate, wherein this center pin of every end of this center pin exceed this shielding and wherein center pin pass base plate to contact with contact point on the following circuit board.
17. a circuit board testing system comprises:
The first circuit board that comprises a plurality of test points;
Be used for providing with test signal the second circuit board of equipment interconnection, this second circuit board comprises a plurality of signaling points;
A breakout box jig comprises:
The top board that upper surface is connected with this first circuit board, this top board comprises a plurality of holes, a test point on each hole and this first circuit board is communicated with,
The base plate that lower surface is connected with this second circuit board, this base plate be positioned at this top board the below and and this top board at interval, this base plate comprises a plurality of holes, a wherein signaling point connection on each hole and this second circuit board, and
A plurality of coaxial pins, each pin has one and has the roughly center pin of the bell housing of column type coaxially, isolate by electrically non-conductive material bell housing and center pin, wherein each the end center pin at each coaxial pin surpasses bell housing, wherein first end of each center pin second end that passes a hole on the top board and each center pin passes a hole on the base plate, and wherein the external shroud of each coaxial pin contacts with top board and base plate; And
The device that a circuit board is moved relative to another circuit board, thus so that coaxial pin fastening and generation make test point and power that a signaling point on the second circuit board reliably contacts on each center pin termination and the first circuit board that signal path from this signaling point to this test point is provided.
18. system according to claim 17, wherein each pin bears Euler's fastening.
19. system according to claim 18, wherein this device comprises the vacuum generating device that a circuit board is moved relative to another piece circuit board.
20. system according to claim 18, wherein this device comprises the mechanical hook-up that a circuit board is moved to another piece circuit board.
21. system according to claim 18, wherein this first circuit board is will be by the circuit board of this system testing.
22. system according to claim 18, wherein this first circuit board, this second circuit board and each pin have the impedance that join in the district.
23. system according to claim 22, wherein the impedance of coaxial pin is 50 ohm.
24. a breakout box jig that is used to make circuit board will testing under high frequency to be connected with a measuring and analysing meter that the high-frequency test signal is provided, this jig comprises:
One is used for and the top board of wanting tested circuit board to be connected;
One is used for the base plate that is connected with the measuring and analysing meter equipment that is used to provide the high-frequency test signal source; And
A plurality of test pin, each pin comprises an interior solid section, described pin inside is docked by first predetermined pattern and this top board and is docked so that the test signal path of the test point on providing from this measuring and analysing meter to this circuit board by second predetermined pattern and this base plate, wherein this first predetermined pattern is different with this second predetermined pattern, and wherein has identical impedance in fact to promote the impedance matching of this circuit board of Validity Test under high frequency on each test pin.
25. jig according to claim 24, wherein at least some test pin are coaxial test pin.
26. a circuit board testing system comprises:
Want tested electronic unit for one, it has the first make contact array that forms first pattern;
Signal with second contact point array provides circuit board, and this second contact point array is corresponding with this first make contact array, and this second contact point array forms second pattern different with this first pattern; And
A plurality of coaxial pins, each pin have a solid inner member that extends to a corresponding contact point on this unit from a contact point of this circuit board.
27. system according to claim 26, wherein coaxial pin bears Euler's fastening.
28. system according to claim 26, wherein this circuit board provides high-frequency signal by this second contact point array, and the frequency of these signals is not less than 100 megahertzes.
29. a circuit board testing system comprises:
Want tested high-frequency electronic unit for one, it has and is used for the contact point group that transmitted frequency is not less than the high-frequency signal of 100 megahertzes, wherein the center of first make contact from the distance at the center of second contact point less than 0.07 inch;
A circuit board that is used to provide the high-frequency test signal, this circuit board have the contact point group that is used to transmit these high-frequency signals;
The first contact pin, its first end is connected with this first make contact and second end is connected with a contact point on this circuit board; And
The second contact pin, its first end is connected with this second contact point and second end is connected with a contact point on this circuit board.
30. system according to claim 29, wherein the distance between these electronic unit first and second contact point centers is not more than 0.025 inch.
31. system according to claim 30, wherein these pins are coaxial pins.
32. system according to claim 29, wherein this unit and pin impedance matching.
33. system according to claim 29, wherein the frequency of signal is not less than 1 gigahertz (GHZ).
34. system according to claim 29 wherein contacts pin and bears Euler's fastening.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2001/031500 WO2003031995A1 (en) | 2001-10-10 | 2001-10-10 | Coaxial tilt pin fixture for testing high frequency circuit boards |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1559008A true CN1559008A (en) | 2004-12-29 |
Family
ID=21742898
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA018237835A Pending CN1559008A (en) | 2001-10-10 | 2001-10-10 | Coaxial tilt pin fixture for testing high frequency circuit board |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP1438591A1 (en) |
| JP (1) | JP2005504991A (en) |
| CN (1) | CN1559008A (en) |
| WO (1) | WO2003031995A1 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101387656A (en) * | 2007-09-13 | 2009-03-18 | 加比尔电路公司 | Flexible test fixture |
| CN104297535A (en) * | 2013-07-16 | 2015-01-21 | 日置电机株式会社 | Probe unit and substrate inspection device |
| CN112020654A (en) * | 2018-05-25 | 2020-12-01 | 李诺工业股份有限公司 | Testing device |
| CN112858873A (en) * | 2020-12-31 | 2021-05-28 | 杭州广立微电子股份有限公司 | Pin resource allocation method and system based on two-end test |
| CN115932550A (en) * | 2022-12-29 | 2023-04-07 | 佛山市蓝箭电子股份有限公司 | Semiconductor testing device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109088676A (en) * | 2018-07-02 | 2018-12-25 | 四川斐讯信息技术有限公司 | A kind of radio frequency testing head and radio frequency testing instrument |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2034416A1 (en) * | 1970-07-10 | 1972-01-20 | Siemens Ag | Shielded measuring probe |
| US5532613A (en) * | 1993-04-16 | 1996-07-02 | Tokyo Electron Kabushiki Kaisha | Probe needle |
| US6452406B1 (en) * | 1996-09-13 | 2002-09-17 | International Business Machines Corporation | Probe structure having a plurality of discrete insulated probe tips |
| US5818248A (en) * | 1996-07-29 | 1998-10-06 | Delaware Capital Formation, Inc | Loaded board test fixture with integral translator fixture for testing closely spaced test sites |
| EP0915344B1 (en) * | 1997-11-05 | 2004-02-25 | Feinmetall GmbH | Test head for microstructures with interface |
| US6037787A (en) * | 1998-03-24 | 2000-03-14 | Teradyne, Inc. | High performance probe interface for automatic test equipment |
| JP2000121666A (en) * | 1998-10-15 | 2000-04-28 | Micronics Japan Co Ltd | Probe and probe card |
| SE515298C2 (en) * | 1999-11-19 | 2001-07-09 | Ericsson Telefon Ab L M | Test Fixture |
-
2001
- 2001-10-10 WO PCT/US2001/031500 patent/WO2003031995A1/en active Application Filing
- 2001-10-10 EP EP01977631A patent/EP1438591A1/en not_active Withdrawn
- 2001-10-10 JP JP2003534925A patent/JP2005504991A/en active Pending
- 2001-10-10 CN CNA018237835A patent/CN1559008A/en active Pending
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101387656A (en) * | 2007-09-13 | 2009-03-18 | 加比尔电路公司 | Flexible test fixture |
| CN101387656B (en) * | 2007-09-13 | 2013-12-25 | 捷普电路公司 | Flexible test fixture |
| CN104297535A (en) * | 2013-07-16 | 2015-01-21 | 日置电机株式会社 | Probe unit and substrate inspection device |
| CN112020654A (en) * | 2018-05-25 | 2020-12-01 | 李诺工业股份有限公司 | Testing device |
| CN112020654B (en) * | 2018-05-25 | 2023-09-05 | 李诺工业股份有限公司 | test device |
| CN112858873A (en) * | 2020-12-31 | 2021-05-28 | 杭州广立微电子股份有限公司 | Pin resource allocation method and system based on two-end test |
| CN112858873B (en) * | 2020-12-31 | 2024-05-17 | 杭州广立微电子股份有限公司 | Pin resource allocation method and system based on two-end test |
| CN115932550A (en) * | 2022-12-29 | 2023-04-07 | 佛山市蓝箭电子股份有限公司 | Semiconductor testing device |
| CN115932550B (en) * | 2022-12-29 | 2023-08-29 | 佛山市蓝箭电子股份有限公司 | Semiconductor testing device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005504991A (en) | 2005-02-17 |
| EP1438591A1 (en) | 2004-07-21 |
| WO2003031995A1 (en) | 2003-04-17 |
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