CN1447111A - Method for measuring refractive index of thin film and its device - Google Patents
Method for measuring refractive index of thin film and its device Download PDFInfo
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Abstract
A method for measuring refractive index of thin film and its device is to generate multiple extremely bit points with grating via lens, to put a binary fillter and film sample on a frequency spectrum surface to get interference frinages on the conjugate image surface to receive and observe them by output and measurement structure to test their periods and sheared volume of the interference fringe to get the refractive index of the thin film, solving the problem of uncertain refractive index with the measurement accuracy of fringes to lambda/10-lambda/20, accuracy of refractive index to 0.01-0.005.
Description
(1) technical field
The present invention relates to a kind of method of MEASUREMENTS OF THIN refractive index, particularly adopt the grating interference principle to measure the method for film refractive index, also relate to the apparatus of realizing this method simultaneously, belong to the measured thin film technical field, be widely used in fields such as semiconductor and photoelectric device, display device, optical thin film material, photomagneto disk material and organic films.
(2) background technology
Membraneous material is the focus of current scientific and technological research and development, and film refractive index is one of important optical index.The main method of MEASUREMENTS OF THIN refractive index has elliptic polarization method, prism-coupled method and spectrophotometric method etc.The elliptic polarization method has very high measuring accuracy, but when film refractive index and substrate refractive index are close, as measuring glass surface SiO
2During the refractive index of film, can produce bigger error; The prism-coupled method is applicable to the refractometry of thick film (generally greater than 300nm).Metric measurement process and calculating more complicated, and when film thickness less (being generally less than 300nm), measuring accuracy is relatively poor.Traditional interferometric method also can be used for the measurement of film refractive index, but adjusting and measuring process are cumbersome, is difficult to determine the malposition fringes number, makes troubles to refractometry.
(3) Fa Ming content
The objective of the invention is deficiency at the prior art existence, a kind of method and device thereof that utilizes the grating interference principle that film refractive index is accurately measured is provided, it can solve the refractive index uncertain problem, measuring process is simple, install easy to adjust, measure reliable and stablely, and be easy to realize.The precision that this method is measured striped reaches λ/10～λ/20 (λ represents wavelength), measuring refractivity precision is 0.01～0.005, be applicable to the measurement of transparent or weak absorbing membrane refractive index in the transparent or opaque substrate, also be suitable for measuring the refractive index of birefringent film.
The inventive method comprises the steps:
(1) handles through beam treatment mechanism by a monochromic beam of light emitted, form a branch of high-quality plane parallel ripple or spherical wave illumination grating;
(2) plane parallel ripple or spherical wave form the frequency spectrum of grating through optical grating diffraction on the frequency spectrum plane of fourier transform lens, form a grating that is exaggerated and resemble or interference fringe on grating conjugate image face, are finished receiving and measuring by output and measurement structure;
(3) on the frequency spectrum plane of fourier transform lens, place binary filter and film sample to be measured, adjust their position, make light beam through film sample successively produce two interference fringes that are with magnitude of misalignment, read their cycle and magnitude of misalignment by the stripe measurement device;
(4) cycle and the magnitude of misalignment with interference fringe is foundation, calculates the refractive index of film sample to be measured.
In said method, monochromatic light is handled through beam treatment mechanism in the step (1), the process that forms plane parallel ripple or spherical wave is as follows: monochromatic light at first expands bundle through beam expanding lens, through a pinhole filter low-pass filtering, forms the plane parallel ripple through collimating mirror again; Perhaps expand bundle, form spherical wave illumination through a pinhole filter low-pass filtering again through beam expanding lens.
In the step (2), when film sample to be measured is transparent substrates, light beam irradiates film sample to be measured, forming a grating that is exaggerated on its conjugate image face resembles, directly measure by being arranged in the output on the face of elephant and the stripe measurement device of measurement structure, after perhaps handling through output and the fourier transform lens in the measurement structure earlier, again by the stripe measurement measurement device that is positioned on the face of elephant; When film sample to be measured is opaque substrate, behind the light beam irradiates film sample to be measured, the amplification grating of its formation resembles or interference fringe, must be earlier through after the beam splitter beam splitting reflection in output and the measurement structure, could by in output and the measurement structure, the stripe measurement device that is positioned on the conjugate image face measures.
In the step (3), the method of adjusting film sample to be measured position is as follows: when film and substrate when being transparent, (opening is 0.1～3mm) to be stacked together with film sample with binary filter, place on the frequency spectrum plane of fourier transform lens, only allow two of the grating frequency spectrum to interfere maximal point by (not necessarily consecutive roots is a little bigger), the interference fringe that sinusoidal rule changes occurs pressing at Xiang Mianchu like this, its interval or cycle can be by output and measurement structure measurements.Because film sample is coated with step, and film and substrate be transparent, regulates the position of film sample and binary filter, allows two selected maximal points see through transparent substrates simultaneously, measures the cycle and the position of interference fringe with output and measurement structure; Along perpendicular to optical axis direction translation film sample, make one of them maximal point see through film then, another maximal point still sees through substrate, and at this moment, interference fringe can be subjected to displacement, and measures the magnitude of misalignment of striped again with output and measurement structure.When transparent and its substrate of film is nontransparent, its regulative mode is as follows: (opening is 0.1～3mm) to be stacked together with film sample with binary filter, place on the frequency spectrum plane of fourier transform lens, only allow two of the grating frequency spectrum to interfere maximal point reflection (not necessarily consecutive roots is a little bigger), reflect through beam splitter, in the interference fringe that the appearance of the face that the resembles place of grating changes by sinusoidal rule, its interval or cycle can be by output and measurement structure measurements.Because film sample is coated with step, and substrate is opaque, regulates the position of film sample and binary filter, allows two selected maximal points simultaneously through the substrate reflection, again through the beam splitter reflection, measures the cycle and the position of interference fringe with output and measurement structure; The edge is perpendicular to optical axis direction translation film sample then, make one of them maximal point see through film, reflect by substrate again, another maximal point is directly reflected by substrate, its reflected light reflects through beam splitter again, at this moment, interference fringe can be subjected to displacement, and measures the magnitude of misalignment of striped again with output and measurement structure.
In the step (4),, adopt following formula (3) or (5) to calculate the refractive index of film when the substrate of film sample when being transparent; When the substrate of film sample when being nontransparent, adopt formula (4) or (6) to calculate the refractive index of film.The derivation of formula (3), (5) and formula (4), (6) is as follows:
According to interference of light theory and simple computation, for the transparent substrates surface film, twice measurement introduced light path by film thickness and changed into:
Surface film to opaque substrate also has
(1) and in (2) formula, d and n
fBe respectively the thickness and the refractive index of film, λ is an optical wavelength, and e and c are respectively the cycle and the stripe displacement amount of interference fringe.If record e and c, and λ and d be known quantity, then
(3) and (4) formula is discussed:
1, under many circumstances, film thickness is less, and (3) and (4) formula is suitable for, as λ=0.6 μ, n
f=1.5, for transparent substrates, as d during less than 1.2 μ, (3) formula is set up; For opaque substrate, d is during less than 0.6 μ, and (4) formula is set up.
2, if when film thickness is big, displacement can surpass one-period, and then (3) and (4) formula can be expressed as
(5) and in (6) formula, m is the malposition fringes number, gets 0,1,2 ... integer.Therefore, n
fA plurality of uncertain values are arranged.Can adopt two kinds of methods to solve: the one, search the material data handbook, determine that according to the condition of production run the change of refractive scope accepts or rejects; The 2nd, adopt dual wavelength optical illumination measuring method, definite m value.If | λ
1-λ
2| enough little, so that the striped dislocation number m of two kinds of wavelength generations is identical, and n
fNot with wavelength shift, then get by (5) and (6) formula:
The m that is tried to achieve by (7) formula may not be an integer, gets immediate integer substitution (5) or (6) formula, determined value n
f
3, if consider that light loses mutually from the reflection position that optically thinner medium incides optically denser medium, (2) formula should be changed into
(8) is a reflection position phase loss amount in the formula, is a constant for the film of same type, and available experiment is determined.If thickness is less, i.e. m=0, d and n
fKnown, then
Therefore, during the surface film of measurement for opaque substrate, should consider the influence of .
In order to realize the inventive method, must adopt custom-designed specialized equipment device to realize reading of fringe period and magnitude of misalignment.Implement device of the present invention is by light source, beam treatment mechanism, grating, fourier transform lens, binary filter, film sample support to be measured, output connects and composes jointly with measurement structure, its mutual alignment and annexation are: the direction of advancing along light beam, coaxial successively (referring to optical axis) arranging light source, beam treatment mechanism, grating, fourier transform lens, binary filter, film sample support to be measured, output and measurement structure, its mutual alignment guarantees to be handled through beam treatment mechanism by a monochromic beam of light emitted, form a branch of high-quality plane parallel ripple or spherical wave illumination grating, plane parallel ripple or spherical wave are through optical grating diffraction, on the frequency spectrum plane of fourier transform lens, form the frequency spectrum of grating, handle through binary filter, shine film sample to be measured, on grating conjugate image face, form a grating that is exaggerated and resemble or interference fringe, finish receiving and measuring by output and measurement structure.In this device, above-mentioned each parts are fixed by corresponding mounting bracket and are installed, and distance between the adjacent component and position can be regulated.
In said apparatus, beam expanding lens and the mutual edge distance mutually of collimating mirror equal their focal length sum; The focal distance f of grating constant b and fourier transform lens must satisfy following relation:
。X is the adjacent distance between greatly in frequency plane F place in the formula.
In said apparatus, beam treatment mechanism comprises beam expanding lens and pinhole filter, perhaps comprises beam expanding lens, pinhole filter and collimating mirror; Binary filter and film sample to be measured are installed on the frequency plane by the mounting bracket that the multidimensional regulatory function is arranged, and make them can be along perpendicular to the optical axis direction fine motion.When film sample to be measured is transparent substrates, output is made of a stripe measurement device or a fourier transform lens and a stripe measurement device with measurement structure, when film sample to be measured was nontransparent substrate, output was made of a beam splitter and a stripe measurement device with measurement structure.
Principle of the present invention is: utilize the grating scioptics to produce a plurality of maximal points, on frequency plane, place binary filter and film sample, on grating conjugate image face, obtain interference fringe, utilize output and measurement structure on the face of resembling, to receive and observe, and measure the cycle and the magnitude of misalignment of interference fringe, thereby try to achieve the refractive index of film.
The present invention has following advantage or effect:
1, experiment shows, adjustment of the inventive method light path and measuring process are convenient, fast, and interference fringe is reliable and stable, and the fringe spacing is convenient to be regulated;
2, the inventive method does not have specific (special) requirements to the relative size of film and base material refractive index;
3, the inventive method solves the uncertain problem of film refractive index preferably, and measurement range is big;
4, the measurement refractivity precision of the inventive method reaches 0.01～0.005;
5, the parts of apparatus of the present invention simplicity of design, employing are common components, and realization and cost are lower easily.
(4) description of drawings
Fig. 1 is the flow chart of the inventive method;
Fig. 2 is the structural representation of first kind of embodiment of apparatus of the present invention;
Fig. 3 is the structural representation of second kind of embodiment of apparatus of the present invention;
Fig. 4 is the structural representation of the third embodiment of apparatus of the present invention;
Fig. 5 is the structural representation of the 4th kind of embodiment of apparatus of the present invention.
(5) concrete embodiment
As seen from Figure 1, the inventive method comprises the steps: that (1) handled through beam treatment mechanism by a monochromic beam of light emitted, forms a branch of high-quality plane parallel ripple or spherical wave illumination grating; (2) plane parallel ripple or spherical wave form the frequency spectrum of grating through optical grating diffraction on the frequency spectrum plane of fourier transform lens, form a grating that is exaggerated and resemble or interference fringe on grating conjugate image face, are finished receiving and measuring by output and measurement structure; (3) on the frequency spectrum plane of fourier transform lens, place binary filter and film sample to be measured, adjust their position, make light beam through film sample successively produce two interference fringes that are with magnitude of misalignment, read their cycle and magnitude of misalignment by output and measurement structure; (4) cycle and the magnitude of misalignment with interference fringe is foundation, calculates the refractive index of film sample to be measured.
Be suitable for the measurement of transparent substrates surface film refractive index by embodiment shown in Figure 2.Among the figure, 1 is light source, and 2 is beam expanding lens, and 3 is collimating mirror, and 4 is grating, and 5 is fourier transform lens, and 6 is binary filter, and 7 is film sample to be measured, and 8 is the stripe measurement device, and 9 is pinhole filter.O, F and I are respectively object plane, frequency plane and resemble face.Beam expanding lens 2 and collimating mirror 3 constitute beam treatment mechanism; Output is made of stripe measurement device 8 with measurement structure.
This measurement mechanism light path can be adjusted by following step or method: it is parallel with optical bench or optical table at first to regulate light beam, makes beam expanding lens, collimating mirror and fourier transform lens coaxial; Regulate the mutual alignment of beam expanding lens and collimating mirror, make their distance equal their focal length sum, obtain a branch of directional light, make grating pass through the fourier transform lens imaging again in stripe measurement device place, insert binary filter and film sample at frequency plane at last, measure.
Fig. 3 is the another kind of typical embodiment of the inventive method, is suitable for the measurement of nontransparent substrate surface film refractive index.Light path and element on fourier transform lens 5 left sides are consistent with Fig. 2, and its difference is that output has increased a beam splitter 10 with measurement structure, make light that film sample reflects through the beam splitter back reflection to I place, by 8 receptions of stripe measurement device and measurement.
Embodiment shown in Figure 4 is suitable for the measurement of transparent substrates surface film refractive index.Among the figure, beam treatment mechanism is made of beam expanding lens 2 and pinhole filter 9; Output is made of stripe measurement device 8 with measurement structure.Other is identical with Fig. 2.In this embodiment, fourier transform lens 5 had both played the effect of Fourier transform, and the function of output is also arranged, and made the structure of this device simpler.
Embodiment shown in Figure 5 is suitable for the measurement of transparent substrates surface film refractive index.Among the figure, beam treatment mechanism is made of beam expanding lens 2, pinhole filter 9 and collimating mirror 3; Output is made of fourier transform lens 11 and stripe measurement device 8 with measurement structure.Other is identical with Fig. 2.
The present invention is not limited to above-mentioned scheme; as long as utilize the grating scioptics to produce a plurality of maximal points; on frequency plane, place wave filter and film sample; on grating conjugate image face, obtain interference fringe; utilize output and measurement structure on the face of resembling, to receive and observe; and measure the cycle and the magnitude of misalignment of interference fringe, thus try to achieve the method and the corresponding system of film refractive index, all belong to the protection domain of this patent.
Claims (10)
1, a kind of method of MEASUREMENTS OF THIN refractive index is characterized in that comprising the steps:
(1) handles through beam treatment mechanism by a monochromic beam of light source (1) emission, form a branch of high-quality plane parallel ripple or spherical wave illumination grating (4);
(2) plane parallel ripple or spherical wave are through grating (4) diffraction, on the frequency spectrum plane of fourier transform lens (5), form the frequency spectrum of grating, on grating conjugate image face, form a grating that is exaggerated and resemble or interference fringe, finish receiving and measuring by output and measurement structure;
(3) on the frequency spectrum plane of fourier transform lens (5), place binary filter (6) and film sample to be measured (7), adjust their position, make light beam through film sample successively produce two interference fringes that are with magnitude of misalignment, read their cycle and magnitude of misalignment by the stripe measurement device;
(4) cycle and the magnitude of misalignment with interference fringe is foundation, calculates the refractive index of film sample to be measured.
2, the method for claim 1, it is characterized in that: monochromatic light is handled through beam treatment mechanism in the step (1), the process that forms plane parallel ripple or spherical wave is as follows: monochromatic light at first passes through beam expanding lens (2) and expands bundle, through a pinhole filter (9) low-pass filtering, pass through collimating mirror (3) again and form the plane parallel ripple; Perhaps pass through beam expanding lens (2) and expand bundle, form spherical wave illumination through a pinhole filter (9) low-pass filtering again.
3, the method for claim 1, it is characterized in that: in the step (2), when film sample to be measured is transparent substrates, light beam irradiates film sample to be measured (7), forming a grating that is exaggerated on its conjugate image face resembles, directly measure by being arranged in the output on the face of elephant and the stripe measurement device (8) of measurement structure, after perhaps handling through output and the fourier transform lens (5) in the measurement structure earlier, measure by the stripe measurement device (8) that is positioned on the face of elephant again; When film sample to be measured is opaque substrate, behind the light beam irradiates film sample to be measured (7), the amplification grating of its formation resembles or interference fringe, earlier through after beam splitter (10) the beam splitting reflection in output and the measurement structure, again by in output and the measurement structure, the stripe measurement device (8) that is positioned on the conjugate image face measures.
4, as claim 1 or 2 or 3 described methods, it is characterized in that: in the step (3), the method of adjusting film sample to be measured (7) position is as follows: when film and substrate when being transparent, binary filter (6) and film sample (7) are stacked together, place on the frequency spectrum plane of fourier transform lens (5), only allow two of the grating frequency spectrum to interfere maximal point to pass through, the interference fringe that sinusoidal rule changes appears pressing at Xiang Mianchu, its interval or cycle are measured by output and measurement structure, regulate the position of film sample (7) and binary filter (6), allow two selected maximal points see through transparent substrates simultaneously, measure the cycle and the position of interference fringe with output and measurement structure, the edge is perpendicular to optical axis direction translation film sample (7) then, make one of them maximal point see through film, another maximal point still sees through substrate, and interference fringe is subjected to displacement, and measures the magnitude of misalignment of striped again with output and measurement structure; When transparent and its substrate of film is nontransparent, its regulative mode is as follows: binary filter (6) and film sample (7) are stacked together, place on the frequency spectrum plane of fourier transform lens (5), only allow two of the grating frequency spectrum to interfere the maximal point reflection, reflect through beam splitter (10), in the interference fringe of the face that the resembles place of grating appearance by sinusoidal rule variation, its interval or cycle are measured by output and measurement structure, regulate the position of film sample (7) and binary filter (6), allow two selected maximal points reflect through substrate simultaneously, reflect through beam splitter (10) again, measure the cycle and the position of interference fringe with output and measurement structure, along perpendicular to optical axis direction translation film sample (7), make one of them maximal point see through film then, reflect by substrate again, another maximal point is directly reflected by substrate, through beam splitter (10) reflection, interference fringe is subjected to displacement its reflected light again, measures the magnitude of misalignment of striped again with output and measurement structure.
5, a kind of device of MEASUREMENTS OF THIN refractive index, it is characterized in that: it is by light source (1), beam treatment mechanism, grating (4), fourier transform lens (5), binary filter (6), film sample support to be measured, output connects and composes jointly with measurement structure, its mutual alignment and annexation are: the direction of advancing along light beam, co-axial alignment light source (1) successively, beam treatment mechanism, grating (4), fourier transform lens (5), binary filter (6), film sample support to be measured, output and measurement structure, its mutual alignment guarantees to be handled through beam treatment mechanism by a monochromic beam of light source (1) emission, form a branch of high-quality plane parallel ripple or spherical wave illumination grating (4), plane parallel ripple or spherical wave are through grating (4) diffraction, on the frequency spectrum plane of fourier transform lens (5), form the frequency spectrum of grating (4), handle through binary filter (6), shine film sample to be measured (7), on grating conjugate image face, form a grating that is exaggerated and resemble or interference fringe, finish receiving and measuring by output and measurement structure.
6, device as claimed in claim 5 is characterized in that: described beam expanding lens (2) and the mutual edge distance mutually of collimating mirror (3) equal their focal length sum; The focal distance f of grating constant b and fourier transform lens (5) satisfies following relation:
。
7, device as claimed in claim 5 is characterized in that: described beam treatment mechanism comprises beam expanding lens (2) and pinhole filter (9), perhaps comprises beam expanding lens (2), pinhole filter (9) and collimating mirror (3);
8, device as claimed in claim 5 is characterized in that: described binary filter (6) and film sample support to be measured can be along perpendicular to the optical axis direction fine motions.
9, device as claimed in claim 5, it is characterized in that: when film sample to be measured is transparent substrates, output and measurement structure are by a stripe measurement device (8) or a fourier transform lens (5) and a stripe measurement device (8) formation, when film sample to be measured was nontransparent substrate, output was made of a beam splitter (10) and a stripe measurement device (8) with measurement structure.
10, as claim 5 or 6 or 7 or 8 or 9 described devices, it is characterized in that: described light source (1) is a monochromatic source, can adopt He-Ne laser instrument or semiconductor laser, also can be that incandescent lamp, xenon lamp or mercury lamp are through color filter or monochromator splitting acquisition or optical fiber introducing; Described grating (4) adopts amplitude, position phase or Ronchi grating; Fourier transform lens (5) adopts the disappearing image aplanat; Have 0.1～3mm rectangle aperture on the binary filter (6); Described stripe measurement device (8) is made of a measuring microscope, perhaps is made up of one dimensional linear array or two-dimensional array photodetector or camera and data processing equipment thereof.
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1320352C (en) * | 2004-11-18 | 2007-06-06 | 上海交通大学 | Method for simultaneously measuring refractive index and thickness of polymer film using precision reflectometer |
| CN100385224C (en) * | 2005-12-16 | 2008-04-30 | 华南师范大学 | Bipoint-source interference detection method and device of spherical reflection mirror |
| CN100451607C (en) * | 2005-04-21 | 2009-01-14 | 华南师范大学 | Phase object scan imaging method and its treating device |
| CN1811383B (en) * | 2004-12-29 | 2010-10-27 | 霍尼韦尔国际公司 | Method and system for analyzing one or more characteristics of film |
| CN103196865A (en) * | 2013-03-13 | 2013-07-10 | 清华大学 | Method for simultaneously measuring thickness and refractive index of birefringent element |
| CN103926055A (en) * | 2013-01-15 | 2014-07-16 | 上海彦科仪器有限公司 | Lossless measuring method for refraction index of optical lens |
| CN106198454A (en) * | 2016-06-22 | 2016-12-07 | 宁波大学 | A kind of film refractive index and the acquisition methods of abbe number |
| CN107219191A (en) * | 2017-04-14 | 2017-09-29 | 复旦大学 | A kind of oblique incident ray difference in reflection device based on Fourier transformation |
| CN107870160A (en) * | 2017-11-13 | 2018-04-03 | 西安工业大学 | A kind of measuring method of optical material face refractive index |
| CN110763686A (en) * | 2019-10-29 | 2020-02-07 | 上海御微半导体技术有限公司 | Defect detection device and method for transparent sample |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1320352C (en) * | 2004-11-18 | 2007-06-06 | 上海交通大学 | Method for simultaneously measuring refractive index and thickness of polymer film using precision reflectometer |
| CN1811383B (en) * | 2004-12-29 | 2010-10-27 | 霍尼韦尔国际公司 | Method and system for analyzing one or more characteristics of film |
| CN100451607C (en) * | 2005-04-21 | 2009-01-14 | 华南师范大学 | Phase object scan imaging method and its treating device |
| CN100385224C (en) * | 2005-12-16 | 2008-04-30 | 华南师范大学 | Bipoint-source interference detection method and device of spherical reflection mirror |
| CN103926055A (en) * | 2013-01-15 | 2014-07-16 | 上海彦科仪器有限公司 | Lossless measuring method for refraction index of optical lens |
| CN103196865A (en) * | 2013-03-13 | 2013-07-10 | 清华大学 | Method for simultaneously measuring thickness and refractive index of birefringent element |
| CN103196865B (en) * | 2013-03-13 | 2015-10-21 | 清华大学 | Measure the measuring method of birefringence element thickness and refractive index simultaneously |
| CN106198454A (en) * | 2016-06-22 | 2016-12-07 | 宁波大学 | A kind of film refractive index and the acquisition methods of abbe number |
| CN107219191A (en) * | 2017-04-14 | 2017-09-29 | 复旦大学 | A kind of oblique incident ray difference in reflection device based on Fourier transformation |
| CN107219191B (en) * | 2017-04-14 | 2020-05-12 | 复旦大学 | Oblique incidence light reflection difference device based on Fourier transform |
| CN107870160A (en) * | 2017-11-13 | 2018-04-03 | 西安工业大学 | A kind of measuring method of optical material face refractive index |
| CN110763686A (en) * | 2019-10-29 | 2020-02-07 | 上海御微半导体技术有限公司 | Defect detection device and method for transparent sample |
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