CN1289934A - Combined tester probe - Google Patents
Combined tester probe Download PDFInfo
- Publication number
- CN1289934A CN1289934A CN 99119636 CN99119636A CN1289934A CN 1289934 A CN1289934 A CN 1289934A CN 99119636 CN99119636 CN 99119636 CN 99119636 A CN99119636 A CN 99119636A CN 1289934 A CN1289934 A CN 1289934A
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- China
- Prior art keywords
- probe
- clamping plate
- spring
- sleeve
- head end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000000523 sample Substances 0.000 title claims abstract description 101
- 238000012360 testing method Methods 0.000 claims description 32
- 229910052802 copper Inorganic materials 0.000 claims description 12
- 239000010949 copper Substances 0.000 claims description 12
- 238000004804 winding Methods 0.000 claims description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 11
- 238000006073 displacement reaction Methods 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 abstract description 15
- 230000009471 action Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 150000001879 copper Chemical class 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
A combined tester probe is disclosed. The needle plate of tester is perforated at the positions relative to the pins of circuit board to be tested. A clamping plate with correspondent holes is arranged on the tester. The probe is inserted in the hole on clamping plate and the probe sleeve is inserted in the hole of needle plate. The probe has the head projected from the upper surface of clamping plate and the tail with a plug for inserting it in the hole of needle plate. Its advantages are easy manufacture and low cost.
Description
The present invention relates to the combined tester (Dedicated Fixture) that testing circuit board is used, the combined tester that especially a kind of improvement that utilizes probe structure reduces the tool manufacturing cost.
Circuit board must can learn that the circuit on it has or not short circuit through test after finishing the some electronic components of welding.And the method for the testing circuit board that is adopted between industry at present sees also Fig. 1, is by a tool 1 upper surface some probes 2 to be set, and these some probes 2 are to cooperate each pin position of circuit board under test 3 bottom surfaces and be provided with.Tool 1 has the base 11 of a shaped as frame, is provided with ox horn joint 12 around this base 11, and this ox horn joint 12 must be connected with probe 2, utilizes ox horn joint 12 conducting that is connected with the winding displacement (not shown) of circuit test machine again.
When desiring testing circuit board, winding displacement with the circuit test machine inserts ox horn joint 12 in advance, circuit board under test 3 correspondences are placed on the probe 2 of tool 1, with after the pin of circuit board under test 3 bottom surfaces contacts, the circuit test machine can show that the circuit on the circuit board under test 3 has or not and open circuit by probe 2 again.
Supplying the tool of testing circuit board as described above, is not the product for a kind of batch, but at a kind of circuit board making one cover tool.The manufacture process of this tool is to be drilled with jack in its needle plate 13 each pin positions of surperficial corresponding circuit board under test 3 circuits earlier, then at each jack sheathed one probe sleeve 21 for plant probe 2, as shown in Figures 2 and 3, certainly this probe sleeve 21 is before being sheathed on jack, the electric wire 22 of its tail end must be wound on the ox horn joint 12, as shown in Figure 4, again 21 li in probe sleeve is gone in probe 2 plants at last.
The tool 1 of one cover testing circuit board need be wound to ox horn joint 12 one by one with artificial electric wire 22 with each probe sleeve 21 tail end, and a cover tool 1 often must twine more than two, 300, so a large amount of winding actions must expend extremely long man-hour, and manufacturing cost is inevitable quite high relatively.Especially if the action of wound wire 22 is careless slightly, with causing the formation short circuit that contacts with adjacent electric wire, also will influence test result.
In addition, the inside configuration of above-mentioned probe 2 has spring and movable flexible, so that the action that circuit board under test 3 presses down should test the time all can contact each probe 2 with the pin of circuit board under test 3 bottom surfaces.This probe 2 itself is extremely tiny, structure technical high of spring is set in inside, cost of manufacture is very expensive, domestic state-of-the art still can't solve the problem of the manufacturing cost of costliness like this, that is continuing to adopt the import mode for a long time, the price of a probe surpasses ten yuan of New Taiwan Currencies.One of reason of the cost of manufacture costliness of this tool 1 is to be probe 2 manufacturing cost costlinesses.Moreover probe sleeve 21 is own to the utmost tiny, probe must be planted into 21 li in probe sleeve, as seen probe 2 itself is more tiny, in so tiny probe 2, spring is set, then the degree that spring is tiny far surpasses probe sleeve 21, and so tiny spring is inevitable not long serviceable life, and will directly influence the test effect once spring damages, so adopt the tool 1 of this kind probe 2 must regularly replace probe 2, correct to guarantee test result.
Because above-mentioned every shortcoming the objective of the invention is to provide a kind of probe that is easy to make, it can reduce makes the technical of probe, and significantly reduces the manufacturing cost of tool.
The object of the present invention is achieved like this: a kind of combined tester probe, comprise probe and probe sleeve, cooperate each pin of the corresponding circuit board under test in needle plate surface of tool to be drilled with some jacks, this is stacked with clamping plate above tool, and these clamping plate are drilled with some and the corresponding perforation of needle plate jack; Be nested with the probe sleeve in the jack of this needle plate, plug probe in the perforation of these clamping plate, the probe head end protrudes from the clamping plate upper surface; This probe head end is made as the specification of multiple different-diameter size, and tail end is provided with the Plug Division of single specification, and this Plug Division can be inserted in the jack of needle plate; The electric wire head end connects a spring that can be nested with in the jack of needle plate, and wire terminations is made as the copper rod on the winding displacement that can directly insert the circuit test machine.
This clamping plate end face is provided with a top board, and this top board surface is provided with the diameter of probe head end and bores a hole accordingly; This clamping plate bottom is provided with two layers of density board, and this density board is provided with the Plug Division of probe tail end and bores a hole accordingly, and folder is established one deck soft rubber plate between two layers of density board.
Wherein, this probe head end is the specification that is made as multiple different-diameter size, and tail end then all is made as the Plug Division of single specification, and this Plug Division can be inserted in the probe sleeve; And portion is provided with spring in the probe sleeve, this spring tail end directly is connected conducting with the electric wire head end, and the probe sleeve is fixed its tail end clamping after being placed on the spring cylindrical, and this wire terminations is made as copper rod, and these copper rods can directly be planted on the winding displacement of circuit test machine.
By the special tectonic of the invention described above, the characteristics that are constructed as follows:
(1) probe structure is only had a variation of ladder, and manufacturing technology is comparatively simple, and is cheap for manufacturing cost relatively, the manufacturing cost that can save probe.
(2) in the probe sleeve spring is set, its installation action is simple and easy, and manufacturing cost is cheap equally, and the spring in the inevitable existing probe of its spring diameter is big, and serviceable life is inevitable longer relatively.Can prolong the serviceable life of spring, save the cost of changing the probe sleeve relatively.
(3) the electric wire tail end of probe sleeve is designed to copper rod, on the winding displacement of the circuit test machine of can directly planting, and need not as existing wound wire one by one.So can simplify production process and save make man-hour, can significantly reduce the cost of making tool equally.
For making your juror understand purpose of the present invention, feature and effect, now by following specific embodiment, and conjunction with figs., the present invention is described in detail:
Fig. 1 is the tool outside drawing that existing testing circuit board is used.
Fig. 2 is the decomposition appearance figure of existing probe and probe sleeve.
Fig. 3 be existing probe with the probe sleeve mutually the side of insert group cut open synoptic diagram.
Fig. 4 is the ox head joint of existing tool and the winding synoptic diagram of probe sleeve electric wire.
Fig. 5 is the decomposing schematic representation of probe of the present invention.
Fig. 6 is the tool outside drawing that the present invention cooperates.
Fig. 7 is an enforcement state reference view of the present invention.
Fig. 8 is the connection status reference diagram of probe sleeve of the present invention and winding displacement.
Fig. 9 is the decomposing schematic representation of another probe of the present invention.
Figure 10 is the enforcement state reference view of Fig. 9.
See also Fig. 5, probe of the present invention comprises probe 4 and probe sleeve 5.Wherein, this probe sleeve 5 is to continue to use existing internal diameter specification, and the inside is provided with spring 51; And these spring 51 tail ends directly are connected conducting with electric wire 52 head ends, after probe sleeve 5 is placed on spring 52 cylindricals, its tail end clamping are fixed.Spring 51 tail end wire connecting 52 ends are made as copper rod 53 in addition.This probe 4 is made as club, and its head end can be made as the specification and the shape of multiple different-diameter size, and as shown in Figure 7, tail end then all is made as the Plug Division 41 of single specification, and 5 li in probe sleeve can be inserted in this Plug Division 41.
And the tool of cooperation probe structure of the present invention, as shown in Figure 6, be that each pin in needle plate 13 surperficial corresponding circuit board under test 3 bottom surfaces of tool 1 end face is drilled with some jacks equally, this tool 1 upper surface is stacked with clamping plate 6, and these clamping plate 6 also are drilled with some and the corresponding perforation of needle plate jack.And wherein, the jack of this needle plate 13 is for being nested with probe sleeve 5, and as shown in Figure 7, the perforation of these clamping plate 6 then supplies to plug probe 4, and probe 4 head ends protrude from clamping plate 6 upper surfaces.
These clamping plate 6 end faces are made as a top board 61, and shown in Fig. 6,7, the perforation on these top board 61 surfaces is to establish according to the diameter of corresponding probe 4 head ends.These clamping plate 6 bottoms then are made as two layers of density board 62, and the perforation of this density board 62 is to establish according to the specification of the Plug Division 41 of probe 4 tail ends, and two layers of 62 of density board are that folder is established the soft rubber plate 63 that one deck is not holed.The setting of this soft rubber plate 63 can provide the effect of slightly clamping probe 4 tail end Plug Divisions 41, and does not influence the pressurized slip when testing, and so can avoid plugging the possibility that drops between probe 4 actions.
Utilize aforementioned particular design of the present invention, when making tool, will need not again wound wire one by one, also the ox horn joint need not be installed.See also shown in Figure 8ly,, can directly insert on the winding displacement 7 of circuit test machine, so can significantly save the man-hour of making tool, reduce the manufacturing cost of tool because electric wire 52 tail ends of this probe sleeve 5 are made as copper rod 53.
Though the present invention discloses as above with a preferred embodiment, be not in order to limit scope of the invention process, promptly without departing from the spirit and scope of the present invention, to change and retouching when doing some.See also Fig. 9, probe structure of the present invention is not to comprise probe 4 and probe sleeve 5.Represent among the figure, remove original probe sleeve 5, only directly be connected conducting with electric wire 52 head ends by spring 51 tail ends, spring 51 tail end wire connecting 52 ends are made as copper rod 53.This probe 4 is the then identical club that is made as partly, and its head end can be made as the specification and the shape of multiple different-diameter size, and as Figure 10, tail end then all is made as the Plug Division 41 of single specification.In brief, in the probe structure of present embodiment, be to comprise probe 4 and electric wire 52, these electric wire 52 1 ends connect spring 51, the other end is made as copper rod, and this copper rod can directly insert on the winding displacement of circuit test machine.
See also Figure 10, aforesaid probe structure is engaged on the tool, is for the spring 51 that is nested with electric wire 52 head ends at the jack of needle plate 13, and the perforation of these clamping plate 6 is then for plugging probe 4, and probe 4 head ends are to protrude from clamping plate 6 upper surfaces.
Claims (3)
1, a kind of combined tester probe comprises probe and probe sleeve, cooperates each pin of the corresponding circuit board under test in needle plate surface of tool to be drilled with some jacks, and this is stacked with clamping plate above tool, and these clamping plate are drilled with some and the corresponding perforation of needle plate jack; Be nested with the probe sleeve in the jack of this needle plate, plug probe in the perforation of these clamping plate, the probe head end protrudes from the clamping plate upper surface; It is characterized in that: this probe head end is made as the specification of multiple different-diameter size, and tail end is provided with the Plug Division of single specification, and this Plug Division can be inserted in the jack of needle plate; The electric wire head end connects a spring that can be nested with in the jack of needle plate, and wire terminations is made as the copper rod on the winding displacement that can directly insert the circuit test machine.
2, combined tester probe as claimed in claim 1 is characterized in that: this clamping plate end face is provided with a top board, and this top board surface is provided with the diameter of probe head end and bores a hole accordingly; This clamping plate bottom is provided with two layers of density board, and this density board is provided with the Plug Division of probe tail end and bores a hole accordingly, and folder is established one deck soft rubber plate between two layers of density board.
3, combined tester probe as claimed in claim 1 is characterized in that: wherein, this probe head end is the specification that is made as multiple different-diameter size, and tail end then all is made as the Plug Division of single specification, and this Plug Division can be inserted in the probe sleeve; And portion is provided with spring in the probe sleeve, this spring tail end directly is connected conducting with the electric wire head end, and the probe sleeve is fixed its tail end clamping after being placed on the spring cylindrical, and this wire terminations is made as copper rod, and these copper rods can directly be planted on the winding displacement of circuit test machine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99119636 CN1110706C (en) | 1999-09-23 | 1999-09-23 | Combined tester probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99119636 CN1110706C (en) | 1999-09-23 | 1999-09-23 | Combined tester probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1289934A true CN1289934A (en) | 2001-04-04 |
| CN1110706C CN1110706C (en) | 2003-06-04 |
Family
ID=5281002
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 99119636 Expired - Fee Related CN1110706C (en) | 1999-09-23 | 1999-09-23 | Combined tester probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1110706C (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100430734C (en) * | 2006-01-25 | 2008-11-05 | 段超毅 | Combined probe for integrated circuit test |
| CN101387656A (en) * | 2007-09-13 | 2009-03-18 | 加比尔电路公司 | Flexible test fixture |
| CN102043071A (en) * | 2009-10-20 | 2011-05-04 | 日本电产理德株式会社 | Inspection fixture and contact |
| CN102707182A (en) * | 2011-04-22 | 2012-10-03 | 苏州市科林源电子有限公司 | Printed circuit board (PCB) test jig |
| CN102768293A (en) * | 2012-07-24 | 2012-11-07 | 上海交通大学 | Measuring clamp for organic electroluminescent devices |
| CN106645830A (en) * | 2016-11-30 | 2017-05-10 | 青岛元启智能机器人科技有限公司 | Eccentric head positioning probe pin plate device |
| CN106841848A (en) * | 2016-12-22 | 2017-06-13 | 深圳市广和通无线股份有限公司 | Wireless module test fixture and wireless module test system |
| CN111060799A (en) * | 2020-01-03 | 2020-04-24 | 淮安芯测半导体有限公司 | Vacuum high-low temperature semiconductor device test probe station |
-
1999
- 1999-09-23 CN CN 99119636 patent/CN1110706C/en not_active Expired - Fee Related
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100430734C (en) * | 2006-01-25 | 2008-11-05 | 段超毅 | Combined probe for integrated circuit test |
| CN101387656A (en) * | 2007-09-13 | 2009-03-18 | 加比尔电路公司 | Flexible test fixture |
| CN101387656B (en) * | 2007-09-13 | 2013-12-25 | 捷普电路公司 | Flexible test fixture |
| CN102043071A (en) * | 2009-10-20 | 2011-05-04 | 日本电产理德株式会社 | Inspection fixture and contact |
| CN102707182A (en) * | 2011-04-22 | 2012-10-03 | 苏州市科林源电子有限公司 | Printed circuit board (PCB) test jig |
| CN102768293A (en) * | 2012-07-24 | 2012-11-07 | 上海交通大学 | Measuring clamp for organic electroluminescent devices |
| CN102768293B (en) * | 2012-07-24 | 2015-03-25 | 上海交通大学 | Measuring clamp for organic electroluminescent devices |
| CN106645830A (en) * | 2016-11-30 | 2017-05-10 | 青岛元启智能机器人科技有限公司 | Eccentric head positioning probe pin plate device |
| CN106645830B (en) * | 2016-11-30 | 2023-07-14 | 元启工业技术有限公司 | Eccentric head positioning probe needle plate device |
| CN106841848A (en) * | 2016-12-22 | 2017-06-13 | 深圳市广和通无线股份有限公司 | Wireless module test fixture and wireless module test system |
| CN111060799A (en) * | 2020-01-03 | 2020-04-24 | 淮安芯测半导体有限公司 | Vacuum high-low temperature semiconductor device test probe station |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1110706C (en) | 2003-06-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C06 | Publication | ||
| PB01 | Publication | ||
| ASS | Succession or assignment of patent right |
Owner name: CHEN DONGHAN Free format text: FORMER OWNER: CHEN SHUNV Effective date: 20021114 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20021114 Address after: Taoyuan County of Taiwan Province Applicant after: Chen Donghan Address before: Taoyuan County of Taiwan Province Applicant before: Chen Shunv |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: GAI YUKUN Free format text: FORMER OWNER: CHEN DONGHAN Effective date: 20070202 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20070202 Address after: Taipei City, Taiwan, China Patentee after: Gai Yukun Address before: Taoyuan County of Taiwan Province Patentee before: Chen Donghan |
|
| ASS | Succession or assignment of patent right |
Owner name: YA SCIENCE & TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: GAI YUKUN Effective date: 20080222 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20080222 Address after: Chinese Taoyuan County in Taiwan Zhongli City Road 6 No. 1 two Hejiang Patentee after: Bud city Polytron Technologies Inc Address before: Taipei City, Taiwan Province, China Patentee before: Gai Yukun |
|
| ASS | Succession or assignment of patent right |
Owner name: SHENZHEN YAZHUANG ELECTRON CO., LTD. Free format text: FORMER OWNER: YAZHUANG TECHNOLOGY CO., LTD. Effective date: 20101229 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: NO.6-1, HEJIANG ROAD 2, ZHONGLI CITY, TAOYUAN COUNTY, TAIWAN PROVINCE, CHINA TO: 518081 1-2/F, BUILDING 4, WEST INDUSTRIAL ZONE, SHAYI VILLAGE, SHAJING TOWN, BAO'AN DISTRICT, SHENZHEN CITY, CHINA |
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| TR01 | Transfer of patent right |
Effective date of registration: 20101229 Address after: 518081, Shenzhen, Baoan District, China sand town, Sha Village, West Industrial Zone, fourth building, 1-2 floor Patentee after: SHENZHEN YA ZHUANG ELECTRON CO., LTD. Address before: China Taiwan Taoyuan County, Zhongli Hejiang two Road No. 6-1 Patentee before: Bud city Polytron Technologies Inc |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20030604 Termination date: 20180923 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |