CN216525936U

CN216525936U - IC test socket trades contact pin structure

Info

Publication number: CN216525936U
Application number: CN202122959210.1U
Authority: CN
Inventors: 孙兆虎; 吴伟
Original assignee: Wuxi Tongzhi Microelectronics Co ltd
Current assignee: Wuxi Tongzhi Microelectronics Co ltd
Priority date: 2021-11-29
Filing date: 2021-11-29
Publication date: 2022-05-13
Anticipated expiration: 2031-11-29

Abstract

The utility model discloses an IC test socket pin replacing structure, and particularly relates to the technical field of IC tests. According to the utility model, the plurality of contact pins and the blocking pieces are spliced together, one blocking piece is clamped by two contact pins, the contact pins are prevented from being abutted together to generate short circuit, then the two ends of the contact pins and the blocking pieces are clamped into the clamping grooves, the device can be used by closing the base and the upper base, when the device needs to be disassembled, the screw is firstly screwed out from the second threaded hole, then the upper base is separated from the base, and finally the plurality of blocking pieces and the contact pins are taken out from the first through hole.

Description

IC test socket trades contact pin structure

Technical Field

The utility model relates to the technical field of IC (integrated circuit) testing, in particular to a pin replacing structure of an IC testing socket.

Background

At present, the used IC chip has numerous encapsulation forms such as SOP, DIP among the daily life, a product has multiple encapsulation form in process of production, be used for satisfying different application scenarios, consequently need numerous customization circuit board in IC's the production test, the test seat detects, current general IC chip all fixes and realizes the nondestructive change on the test seat, concrete step does, with the test socket beading that the IC chip corresponds the model on PCB circuit test board, good contact is realized through pressing after the contact of IC chip and test socket contact, make the electrical connection of IC chip and PCB circuit test board, then carry out a series of test operation.

The existing test socket is integrally formed by injection molding, the distance between a plurality of contact pins in the socket is fixed, and the test socket cannot adapt to the layout design requirements of a small number of applied special pin pitches through large-scale mass production, so that the replacement of workers is very troublesome.

SUMMERY OF THE UTILITY MODEL

In order to overcome the above-mentioned drawbacks of the prior art, embodiments of the present invention provide an IC test socket pin-changing structure to solve the above-mentioned problems in the prior art.

In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides a IC test socket trades contact pin structure, includes base and upper base, the upper base is established at the base top, upper base top four corners is all seted up flutedly, upper base top center department has seted up the caulking groove, the caulking groove cross-section sets up to the I-shaped, the round hole has been seted up to caulking groove inner wall surface center department, first dysmorphism hole has been seted up to both sides around the round hole, first through-hole has been seted up to the caulking groove both sides, and the second through-hole has all been seted up to two first through-hole one side outer walls, the draw-in groove has been seted up to first through-hole inner wall surface, be equipped with a plurality of contact pins and a plurality of separation blade in the first through-hole, every separation blade is established between two adjacent contact pins, separation blade and contact pin both sides are all blocked in the draw-in groove.

In a preferred embodiment, a plurality of first threaded holes are formed in the base, the first threaded holes are uniformly distributed on the base, a screw is connected in the first threaded hole in a threaded manner, a second threaded hole is formed in the surface of the inner wall of each groove, one end of the screw is arranged in the second threaded hole and is in threaded connection with the second threaded hole, and the screw is screwed into the first threaded hole and the second threaded hole, so that the connection firmness between the upper base and the base is improved.

In a preferred embodiment, the base is internally provided with a plurality of through holes, the bottoms of the plurality of contact pins penetrate through the through holes and extend to the bottom of the base, one end of each contact pin is inserted into the through holes, and the through holes can be used for guiding the contact pins.

In a preferred embodiment, two second special-shaped holes are formed in the base, and the two second special-shaped holes are respectively formed in the bottoms of the two first special-shaped holes and are communicated with the bottoms of the first special-shaped holes, so that the device is convenient to mount with external equipment.

In a preferred embodiment, a plurality of contact pins and a plurality of stopping pieces are uniformly distributed in the first through hole, so that the contact pins and the stopping pieces can be conveniently checked and replaced by workers.

In a preferred embodiment, the front side and the rear side of the bottom of the upper base are both fixedly provided with an inserted rod, the base is internally provided with a plurality of insertion holes, the inserted rods are arranged in the insertion holes and are inserted into the insertion holes, and when the base is installed, the inserted rods are inserted into the insertion holes in the upper base only by aligning the inserted rods with the insertion holes, so that the guiding effect is achieved.

In a preferred embodiment, a plurality of limiting holes are formed in the upper base, limiting rods are arranged in the limiting holes, the limiting rods are fixedly arranged on the base, and the limiting rods are inserted into the limiting holes in an aligning manner, so that a guiding effect is further achieved.

The utility model has the technical effects and advantages that:

1. according to the utility model, the plurality of contact pins and the blocking pieces are spliced together, one blocking piece is clamped by two contact pins, the contact pins are prevented from being abutted together to generate short circuit, then the two ends of the contact pins and the blocking pieces are clamped into the clamping grooves, the device can be used by closing the base and the upper base, when the device needs to be disassembled, the screw is firstly screwed out from the second threaded hole, then the upper base is separated from the base, and finally the plurality of blocking pieces and the contact pins are taken out from the first through hole.

2. A plurality of limiting holes are formed in the top of the upper base, a limiting rod is installed in each limiting hole, when the upper base and the base are installed, the limiting rods can further play a role in limiting and guiding, installation is simpler and easier, and operation steps of the device are reduced.

Drawings

Fig. 1 is a front view of the overall structure of the present invention.

Fig. 2 is a bottom view of the overall structure of the present invention.

Fig. 3 is a top view of the upper base of the present invention.

Fig. 4 is an elevational view of the pin of the present invention.

Fig. 5 is a front view of the baffle plate of the utility model.

The reference signs are: 1. a base; 2. an upper base; 3. a groove; 4. caulking grooves; 5. a circular hole; 6. a first shaped hole; 7. a first through hole; 8. a second through hole; 9. a card slot; 10. inserting a pin; 11. a baffle plate; 12. a first threaded hole; 13. a screw; 14. a second threaded hole; 15. perforating; 16. a second shaped hole; 17. inserting a rod; 18. a jack; 19. a limiting hole; 20. a limiting rod.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to the attached drawings 1-5 of the specification, the pin replacing structure of the IC test socket of the embodiment comprises a base 1 and an upper base 2, wherein the upper base 2 is arranged at the top of the base 1, four corners of the top of the upper base 2 are provided with grooves 3 for connecting the upper base 2 with an external device, the center of the top of the upper base 2 is provided with an caulking groove 4, the section of the caulking groove 4 is in an i shape for mounting the device on other devices, the center of the inner wall surface of the caulking groove 4 is provided with a round hole 5 for mounting the device, the front side and the rear side of the round hole 5 are provided with first special-shaped holes 6, the two sides of the caulking groove 4 are provided with first through holes 7, the outer walls of one sides of the two first through holes 7 are provided with second through holes 8, the inner wall surface of the first through holes 7 is provided with clamping grooves 9, a plurality of pins 10 and a plurality of retaining pieces 11 are arranged in the first through holes 7, each baffle plate 11 is arranged between two adjacent contact pins 10, the contact pins 10 and the baffle plates 11 are uniformly distributed in the first through holes 7, workers can conveniently check and replace the contact pins 10 and the baffle plates 11, the two sides of each baffle plate 11 and the two sides of each contact pin 10 are clamped in the clamping grooves 9, the baffle plates 11 are arranged between every two contact pins 10, the baffle plates 11 are used for isolating the two contact pins 10, the contact pins 10 are prevented from leaning against each other to cause short circuit, a plurality of first threaded holes 12 are formed in the base 1, the first threaded holes 12 are uniformly distributed on the base 1, screws 13 are connected in the first threaded holes 12 in a threaded mode, second threaded holes 14 are formed in the inner wall surface of each groove 3, one ends of the screws 13 are arranged in the second threaded holes 14 and in threaded connection with the second threaded holes 14, and the screws 13 are screwed into the first threaded holes 12 and the second threaded holes 14, improve the firm in connection nature between upper base 2 and the base 1, base 1 is inside to have seted up a plurality of perforation 15, and perforation 15 and base 1 bottom are all run through to a plurality of contact pins 10 bottom, and the one end of every contact pin 10 is all inserted in perforation 15, utilizes perforation 15 can play the effect of direction to contact pin 10, both sides are all fixed and are equipped with inserted bar 17 around the 2 bottoms of upper base, a plurality of jacks 18 have been seted up in the base 1, inserted bar 17 is established in jack 18 and is pegged graft with jack 18, and when installation base 1, only need with inserted bar 17 align jack 18 in the upper base 2 insert just can, play the effect of direction.

The implementation scenario is specifically as follows: when the device is used, a worker firstly splices a plurality of pins 10 and the blocking pieces 11 together, uses two pins 10 to clamp one blocking piece 11, then puts the pins 10 and the blocking pieces 11 into the first through hole 7 together, utilizes the clamping groove 9 in the first through hole 7 to limit the pins 10 and the blocking pieces 11, after the whole splicing is finished, the jack 18 on the base 1 is inserted into the inserted rod 17 on the upper base 2 in an aligning way, the base 1 and the upper base 2 are combined together, the screws 13 are screwed into the first threaded hole 12 and the second threaded hole 14, so that the connection between the base 1 and the upper base 2 is firmer, then the device can be used, after long-time use, when the device is damaged or fails, the worker can firstly screw 13 is screwed out from the second threaded hole 14, then separates the upper base 2 from the base 1, and finally takes out the blocking pieces 11 and the pins 10 from the first through hole 7, the structure is simple, the insertion pin 10 and the baffle plate 11 can be conveniently checked and replaced, and the use is very convenient.

Referring to fig. 1-3 of the specification, in the pin replacing structure of the IC test socket of this embodiment, a plurality of limiting holes 19 are formed inside the upper base 2, limiting rods 20 are disposed in the limiting holes 19, the limiting rods 20 are fixedly disposed on the base 1, the limiting rods 20 are inserted into the limiting holes 19 in alignment, so as to further play a role of guiding, two second special-shaped holes 16 are formed inside the base 1, and the two second special-shaped holes 16 are respectively disposed at the bottoms of the two first special-shaped holes 6 and communicated with the bottoms of the first special-shaped holes 6, so that the device can be conveniently mounted with external equipment.

The implementation scenario is specifically as follows: a plurality of spacing holes 19 are formed in the top of the upper base 2, a spacing rod 20 is installed in each spacing hole 19, and when the upper base 2 and the base 1 are installed, the spacing rods 20 can further play a role in spacing and guiding, so that the installation is simpler and easier, and the operation steps of the device are reduced.

And finally: the above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the utility model, and any modifications, equivalents, improvements and the like that are within the spirit and principle of the present invention are intended to be included in the scope of the present invention.

Claims

1. The utility model provides a IC test socket trades contact pin structure, includes base (1) and upper base (2), establish at base (1) top upper base (2), its characterized in that: go up base (2) top four corners and all set up fluted (3), upper base (2) top center department has seted up caulking groove (4), caulking groove (4) cross-section sets up to the I-shaped, round hole (5) have been seted up to caulking groove (4) inner wall surface center department, first dysmorphism hole (6) have been seted up to both sides around round hole (5), first through-hole (7) have been seted up to caulking groove (4) both sides, and second through-hole (8) have all been seted up to two first through-hole (7) one side outer walls, draw-in groove (9) have been seted up to first through-hole (7) inner wall surface, be equipped with a plurality of contact pin (10) and a plurality of separation blade (11) in first through-hole (7), establish between two adjacent contact pin (10) every separation blade (11), separation blade (11) and contact pin (10) both sides are all blocked in draw-in groove (9).

2. The IC test socket pin changing structure of claim 1, wherein: the novel multifunctional base is characterized in that a plurality of first threaded holes (12) are formed in the base (1), the first threaded holes (12) are evenly distributed in the base (1), the first threaded holes (12) are internally connected with screws (13), a second threaded hole (14) is formed in the inner wall surface of each groove (3), and one end of each screw (13) is arranged in each second threaded hole (14) and is in threaded connection with the corresponding second threaded hole (14).

3. The IC test socket pin changing structure of claim 1, wherein: a plurality of through holes (15) are formed in the base (1), and the bottoms of the contact pins (10) penetrate through the through holes (15) and extend to the bottom of the base (1).

4. The IC test socket pin changing structure of claim 1, wherein: two second special-shaped holes (16) are formed in the base (1), and the two second special-shaped holes (16) are respectively formed in the bottoms of the two first special-shaped holes (6) and communicated with the bottoms of the first special-shaped holes (6).

5. The IC test socket pin changing structure of claim 1, wherein: the pins (10) and the stop pieces (11) are uniformly distributed in the first through hole (7).

6. The IC test socket pin changing structure of claim 1, wherein: the improved structure is characterized in that insertion rods (17) are fixedly arranged on the front side and the rear side of the bottom of the upper base (2), a plurality of insertion holes (18) are formed in the base (1), and the insertion rods (17) are arranged in the insertion holes (18) and are inserted into the insertion holes (18).

7. The IC test socket pin changing structure of claim 1, wherein: a plurality of limiting holes (19) are formed in the upper base (2), limiting rods (20) are arranged in the limiting holes (19), and the limiting rods (20) are fixedly arranged on the base (1).