CN1271694C - System, equipment and method for automatic testing IC complete device - Google Patents
System, equipment and method for automatic testing IC complete device Download PDFInfo
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- CN1271694C CN1271694C CN 02146346 CN02146346A CN1271694C CN 1271694 C CN1271694 C CN 1271694C CN 02146346 CN02146346 CN 02146346 CN 02146346 A CN02146346 A CN 02146346A CN 1271694 C CN1271694 C CN 1271694C
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Abstract
The present invention discloses a complete machine testing device used for testing integrated circuits. The present invention comprises a testing computer and at least one device for sensing images, the testing computer is used for carrying and testing a tested integrated circuit, wherein the testing computer carries the tested integrated circuit to form a complete machine computer so as to carry out the complete machine testing, the testing computer comprises at least one output device used for outputting testing results of the tested integrated circuit, and the device for sensing images can be used for retrieving images on the output device. After an image of the output device is retrieved by the device for sensing images, the image is transferred to a control unit by the device for sensing images so as to obtain differences between the image and image data originally stored in a database by comparison.
Description
Technical field
The invention relates to a kind of automation integrated circuit system test system, devices and methods therefor, but particularly relevant for the final terminal user state of a kind of emulation, and the automation integrated circuit system test system, the devices and methods therefor that carry out dynamic test.
Background technology
Computer has almost become one of necessity in the life for the mankind now, server (server) no matter, work station (Workstation), desktop computer (desktop computer), notebook computer (notebook computer) or portable computer (portable computer), or personal digital assistant (personal digital assistant) or palmtop computer (palm-top PC) or pouch-type computer (pocket PC), even industrial computer (industrial computer), become the some of most people's daily life.(integration circuit IC) forms, and these integrated circuits all must pass through complicated test, just can guarantee the using character of product and these computers are by many integrated circuits.
Please refer to Fig. 1, it illustrates known PC (personal computer, PC) Organization Chart.Known PC 100 mainly comprise central processing unit 110 (Central ProcessingUnit, CPU), system bus controller 112 (System Bus Controller), input/output bus controller 114 main integrated circuits such as (I/O Bus Controller) constitute.Wherein, memory 116 (Memory), advance rank graphics port 118 (Advanced Graphic Port) and electrically connect system bus controller 112, and monitor 120 (monitor) electrically connects with advancing rank graphics port 118, with output image.And peripheral cell interface 122 (peripheral componentinterface PCI) is connected between system bus controller 112 and the input/output bus controller 114.As for integrated driving electrical interface 130 (integrated drive electronics, IDE), (universal serial bus USB) electrically connects with input/output bus controller 114 for floppy drive 132 (floppy disk), parallel port 134 (parallel port), serial port 136 (serial port) and universal serial bus 138.In addition, can also audio 140 (Audio) and Ethernet 142 (ethernet) be electrically connected with input/output bus controller 114 selectivity.
And above-mentioned these members all are that many integrated circuits (Integrated Circuit is arranged, IC) constitute, such as central processing unit 110, system bus controller 112, input/output bus controller 114, memory 116, perhaps advance graphics accelerator (GraphicAccelerator) in the rank graphics port 118 etc.The perhaps integrated circuit on the extended interface in the peripheral cell interface 122; Also comprise audio chip and Ethernet chip etc. in addition.Said integrated circuit all is the important electronic component of computer, so the usefulness of these integrated circuits and compatibility relation are to the operation of whole computer.
Please refer to Fig. 2, it illustrates known integrated circuit testing flow process.Known integrated circuit 202 such as being that logical integrated circuit (logic IC) is finished through the manufacturing of wafer factory, make a preliminary test, and then through after the encapsulation, then need pass through final test 204 (final test) beginning can shipment 206.Normally earlier integrated circuit is positioned over automatic test equipment (automatic test equipment, ATE) in, utilize a test bench (test socket) to electrically connect the contact of integrated circuit, the copying test action of being scheduled to then judges whether integrated circuit is normal again.Yet known integrated circuit is installed to the test bench of automatic test equipment with tested integrated circuit earlier, and automatic test equipment is controlled under the state of high temperature when carrying out high temperature test and during low-temperature test, carries out the electrical detection of tested integrated circuit.After detection is finished, just this tested integrated circuit is pulled down from test bench, and other tested integrated circuit is installed on the test bench, carry out high temperature test.The tested integrated circuit of finishing high temperature test just can be installed on other the test bench of automatic test equipment again, carries out low-temperature test.When carrying out high temperature test and low-temperature test, all be to carry out functional simulation, and the final state of element judges whether integrated circuit normal after all finishing with test with specific program, at last according to test result with integrated circuit classification (binning), shipment then.As mentioned above, after tested integrated circuit finishes high temperature test, must move tested integrated circuit to other automatic test equipment, carry out low-temperature test again, this kind test mode is not very had an efficiency.
Also need pass through burn-in test 210 (burn-in test) as for memory integrated circuit (memory IC) through behind the final test 208 of phase I, at process second stage final test 212, the beginning can shipment.As for phase I final test 208 and second stage final test 212 all is to carry out with automatic test equipment.Burn-in test 210 then is to utilize manual or semi-automatic mode integrated circuit to be positioned in the connector (Socket) of testing circuit board, put into the heating tester table again, integrated circuit is applied thermal effect (thermal stress), voltage stress (voltage stress) or current stress (current stress), to carry out burn-in test.Yet known integrated circuit testing and actual operating state that can't the emulation terminal user all are to carry out functional test with simulated program, thus after being assembled into computer in the future, still the quality instability might take place, or with the incompatible problem of other integrated circuit.
Please refer to Fig. 3, it illustrates known integrated circuit modules testing process.In order to solve the problem that said integrated circuit test can't the emulation terminal user, knownly can with between shipment, add the integrated circuit modules test at final test.Known integrated circuit modules test provides a module, and such as an interface, perhaps a complete machine computer utilizes then and manually integrated circuit 302 inserted in module or the complete machine computer, shown in 304, but emulation terminal user's operating environment.Test 306 then, just will be by the integrated circuit shipment 308 of test.Yet this part all adopts artificial mode to carry out, and test process also is to decide integrated circuit whether qualified in artificial visually examine's mode.Yet manual testing not only production capacity reduces, and the testing time is elongated, and output reduces, and cost improves, and manually is easy to generate erroneous judgement and causes test accuracy to reduce.
Above-mentioned known test mode is listed below by many shortcomings and not enough place:
1, known integrated circuit testing can't the final user mode of emulation user, even if therefore by test, also may have problems when the user uses, conflicts etc. such as producing with software.
What 2, placed on the testing circuit board during known integrated circuit testing all is with a kind of element, can't detect the compatibility issue between different elements.
3, known method of testing still must be dependent on many manually, makes production capacity and cost all limited, and causes the possibility of human error.
4, known integrated circuit modules method of testing also promptly can not impose the control of operating temperature to element in module stage after the integrated circuit assembling, so can't emulation testing for some state of reality use.
5, known tested integrated circuit is after finishing high temperature test, must move tested integrated circuit to other automatic test equipment, carries out low-temperature test again, and this kind test mode is not very had an efficiency.
6, the judgement of known test general all with last integrated circuit state as benchmark, also can't detect for some dynamic mistakes, such as with graphics accelerator, the image drift (video shaking), form and aspect variations (discoloring display), ghost (ghost shallow) or the image error phenomenons such as (white block) that produce during actual executive program all can't be detected.Or cause when phenomenons such as machines during the integrated circuit executive software, all can't obtain with traditional test mode detecting.
Summary of the invention
Therefore one of purpose of the present invention is exactly that a kind of automation integrated circuit system test system, devices and methods therefor are being provided, and state that can the emulation terminal user is guaranteed the using character of integrated circuit to test.
Two of purpose of the present invention is exactly to propose a kind of automation integrated circuit system test system, devices and methods therefor, in one tests with computer, a plurality of integrated circuit connectors can be set simultaneously, can test the compatibility between different integrated circuits, the error condition of clearer and more definite testing integrated circuits.
Three of purpose of the present invention is to propose a kind of automation integrated circuit system test system, devices and methods therefor, can full automation, need not be artificial, and improving production capacity and accuracy of test, and reduce the cost of volume production.
Four of purpose of the present invention is a kind of automation integrated circuit system test of proposition system, devices and methods therefor, can control its operating temperature with the integrated circuit in the computer to test, makes that test is more complete, more accurate.
Five of purpose of the present invention is to propose a kind of automation integrated circuit system test system, devices and methods therefor, dynamical state that can the auto monitoring and measurement integrated circuit operation, the usefulness of more accurate detection integrated circuit.
Six of purpose of the present invention is a kind of automation integrated circuit system test of proposition system, devices and methods therefor, can need not move under the situation of tested integrated circuit, carry out high temperature test and low-temperature test, so can significantly reduce the time of test, improve the efficient of test.
Seven of purpose of the present invention is a kind of automation integrated circuit system test of proposition system, devices and methods therefor, can flexibly regulate and control the temperature of tested integrated circuit, to carry out the testing electrical property of tested integrated circuit.
Eight of purpose of the present invention is a kind of automation integrated circuit system test of proposition system, devices and methods therefor, can be under the state of alternating temperature with the temperature adjusting of tested integrated circuit, carry out testing electrical property, so can accurately judge the temperature that the tested integrated circuit of sening as an envoy to breaks down.
Whether nine of purpose of the present invention is a kind of automation integrated circuit system test of proposition systems, can detect tested integrated circuit simultaneously and show normally on the crt display unit and on the LCD.
The above-mentioned purpose according to the present invention proposes a kind of automation integrated circuit system test system, comprising: at least one test is with computer, at least one automatic push-pull structure, at least one image sensering device and at least one control unit.Wherein test with computer and be suitable for carrying and test at least one tested integrated circuit, and test comprises at least one output device with computer, in order to test result output tested integrated circuit.Automatically push-pull structure is suitable for tested integrated circuit is placed in test with removing with computer from test on the computer and with tested integrated circuit.And image sensering device is in order to the image on the acquisition output device.Control unit electrically connects test computer, automatic push-pull structure and image sensering device, control unit is tested the system test of using computer in order to action and the control of controlling automatic push-pull structure, wherein test constitutes a complete machine computer with computer behind the tested integrated circuit of carrying, and after an image of image sensering device acquisition output device, image can be sent in the control unit, with the comparison chart picture and originally be stored in difference between the view data in the database.
According to a preferred embodiment of the present invention, automation integrated circuit system test system also comprises a connector, by connector tested integrated circuit and test is electrically connected with computer.And image sensering device is such as being a charge coupled cell.Automation integrated circuit system test system also comprises an audio sensor, and audio sensor connects controller, with the audio frequency output of monitoring complete machine computer.In addition, push-pull structure comprises a mechanical arm automatically, and tested integrated circuit can be central processing unit, system bus controller, input/output bus controller or graphics accelerator.And control unit can be a computer.
In addition, automation integrated circuit system test system also comprises a temperature control equipment, relies on temperature control equipment that tested integrated circuit is controlled under the state of constant temperature or alternating temperature, carries out the system test to tested integrated circuit.In addition, rely on temperature control equipment can make tested integrated circuit carry out the low temperature system test earlier, and then carry out the high temperature system test; Can also make tested integrated circuit carry out the high temperature system test earlier, and then carry out the low temperature system test,, the temperature of tested integrated circuit is controlled between 65 ℃ to 120 ℃ when when carrying out the high temperature system test; When carrying out the low temperature system test, be that the temperature with tested integrated circuit is controlled between 10 ℃ to-10 ℃.In addition, temperature control equipment is configured on the automatic push-pull structure, when automatic push-pull structure when transporting this tested integrated circuit, rely on temperature control equipment can regulate and control the temperature of tested integrated circuit.And temperature control equipment can also be configured in test with on the computer, when tested integrated circuit is presented to test with computer on the time, rely on temperature control equipment can regulate and control the temperature of tested integrated circuit.
In addition, automation integrated circuit system test system also comprises an integrated circuit feeding mechanism, an integrated circuit sorter and an automatic conveyor.Wherein the integrated circuit feeding mechanism is in order to putting a plurality of tested integrated circuit that does not detect, and integrated circuit sorter system is in order to put a plurality of tested integrated circuit that has detected.Automatic conveyor is in order to transmit tested integrated circuit that does not detect and the tested integrated circuit that has detected, rely on automatic conveyor and the automatic push-pull structure can be from the integrated circuit feeding mechanism with the tested integrated circuit that do not detect, be presented to this test in regular turn with on the computer, carrying out system test, and then rely on automatic conveyor and automatic push-pull structure the tested integrated circuit that has detected can be sent on the integrated circuit sorter.And rely on temperature control equipment also can control to be placed in the temperature of the tested integrated circuit that does not detect on this integrated circuit feeding mechanism.
According to above-mentioned automation integrated circuit system test system, the present invention also proposes a kind of automation integrated circuit whole-machine test method.It relies on automatic conveyor and automatic push-pull structure earlier, with tested integrated circuit automation be presented to test with in the computer and electrically connect with computer with testing, to constitute a complete machine computer, wherein test with computer and comprise a crt display unit and a LCD.Then, drive the complete machine computer and carry out a presumptive test program, tested integrated circuit is carried out system test, and the test result of tested integrated circuit can output on the crt display unit and LCD on.Afterwards, one first image sensering device can capture first image of 1 on the crt display unit, and one second image sensering device can capture second image of 1 on the LCD.Afterwards, first image that comparison is captured by first image sensering device and second image that is captured by second image sensering device, and originally be stored in difference between the view data in the database.At last, rely on automatic conveyor and automatic push-pull structure,, tested integrated circuit removed with computer from test be sent to the integrated circuit sorter according to the testing result of tested integrated circuit.
Because the method for testing of integrated circuit of the present invention is to carry out in a complete machine computer, can carry out general application program or specific program, so but emulation terminal user's state is to test, even can carry out the used software of actual user, such as window system, to detect, can guarantee the using character of integrated circuit.And, can detect tested integrated circuit simultaneously and whether show normally on the crt display unit and on the LCD.
Arrangement for testing integrated circuit of the present invention in addition, in one tests with computer, a plurality of integrated circuit connectors are set simultaneously, corresponding connector such as connector such as central processing unit, system bus controller, input/output bus controller, graphics accelerator, can test the compatibility between different integrated circuits, the error condition of clearer and more definite testing integrated circuits.
See through automatic conveyor of the present invention, integrated circuit feeding mechanism, integrated circuit sorter and image sensering device, can full automation, need not be artificial, improving production capacity and accuracy of test, and reduce the cost of volume production.
Automation integrated circuit system test of the present invention system can need not move under the situation of tested integrated circuit, carries out high temperature system test and low temperature system test, so can significantly reduce the time of test, improves the efficient of test.
Temperature control equipment of the present invention can flexibly be regulated and control the temperature of tested integrated circuit, to carry out the system test of tested integrated circuit.
Temperature control equipment of the present invention can carry out system test with the temperature adjusting of tested integrated circuit under the state of alternating temperature, so can accurately judge the temperature that the tested integrated circuit of sening as an envoy to breaks down.
For above and other objects of the present invention, feature and advantage can be become apparent, a preferred embodiment cited below particularly, and conjunction with figs. elaborate.
Description of drawings
Fig. 1 illustrates known PC Organization Chart.
Fig. 2 illustrates known integrated circuit testing flow process.
Fig. 3 illustrates known integrated circuit modules testing process.
Fig. 4 illustrates a kind of test interface module schematic diagram in a preferred embodiment of the present invention.
Fig. 5 illustrates a kind of Test Host plate schematic diagram in a preferred embodiment of the present invention.
Fig. 6 illustrates a kind of automation integrated circuit system test device schematic diagram of preferred embodiment of the present invention.
Fig. 7 illustrates the automation integrated circuit system test system schematic of the volume production of another preferred embodiment of the present invention.
Label declaration:
100: PC 110: central processing unit
112: system bus controller 114: the input/output bus controller
116: memory 118: advance the rank graphics port
120: monitor 122: the peripheral cell interface
130: integrated driving electrical interface 132: floppy drive
134: parallel port 136: serial port
138: universal serial bus 140: audio
142: Ethernet 202: integrated circuit
204: flow process 206: flow process
208: flow process 302: integrated circuit
304: flow process 306: flow process
400: interface module 402: module board
404: integrated circuit connector 406: video memory
408: golden finger 410: the monitor socket
500: motherboard 502: the central processing unit connector
504: the system bus controller connector
506: input/output bus controller connector 508: dynamic random access memory slot
510: advance rank graphics port slot 512: expansion slot
514: integrated driving electrical interface port 516: input/output end port
600: test computer 602: host machine part
604: input/output device 606: output device
606a: crt display unit 606b: LCD
608: integrated circuit connector 610: interface equipment
612: automatic push-pull structure 613: temperature control equipment
614: temperature control equipment 615: temperature control equipment
616a: image sensering device 616b: image sensering device
620: automatic conveyor 622: the integrated circuit feeding mechanism
623: temperature pre-control device 624: integrated circuit sorter
624a: temporary storage location 624b: temporary storage location
624c: temporary storage location 630: tested integrated circuit
640: control unit 690: image data base
Embodiment
Automation integrated circuit system test of the present invention system, devices and methods therefor carry out on computer (known good computer) in a known good test, can be used for detecting test with the arbitrary integrated circuit in the computer.With PC, such as central processing unit, system bus controller, input/output bus controller; Or the integrated circuit in the interface module, such as graphics accelerator etc.Generally speaking, these integrated circuits all are to be configured on the printed circuit board (PCB), normally are disposed on the motherboard such as central processing unit, system bus controller and input/output bus controller.Wherein, central processing unit relies on a connector usually, such as Socket478, Socket 423, Socket 370, Socket 7 etc., electrically connects motherboard.And memory integrated circuit is disposed on the module board, relies on a connector then, such as DIMM, RIMM etc., electrically connects motherboard.As for, system bus controller and input/output bus controller normally utilize the surface soldered technology (surface mount technology SMT) are connected on the motherboard.Graphics accelerator can perhaps be disposed on the module board directly with surface soldered technical configuration (on board) on motherboard, and seeing through into again, the rank graphics port connects motherboard.Integrated circuit in the peripheral cell interface on the extended interface then is to be disposed on the module board, sees through the peripheral element interface slot and electrically connects motherboard.Also comprise audio chip and Ethernet chip in addition, can directly be disposed at motherboard, perhaps see through module board and peripheral element interface slot and electrically connect motherboard.Certain automation integrated circuit system test of the present invention system, devices and methods therefor are not limited to be applied on the PC, all servers as described above, work station, desktop computer, notebook computer, portable computer, personal digital assistant, palmtop computer or pouch-type computer, even the integrated circuit in the industrial computer all can use automation system test of the present invention system to test.
State for the emulation terminal user, all specifications of complete machine computer of the present invention are all identical with the circuit board (motherboard or module board) that reality is used, during just actual in the ordinary course of things the use, some integrated circuit system is fixed on the circuit board in the mode of welding, some then may be to be plugged on the connector of circuit board, yet in the present invention, inserting in the complete machine computer of tested integrated circuit is to be the purpose of testing, so put on the position of tested integrated circuit at these, be equipped with a connector.This connector can be to be in particular test and the connector of design, such as similarly is under the situation of original integrated circuit with welding, a connector must be arranged, so that tested integrated circuit needn't be welded on the circuit board; Or even, also can design a test connector especially originally promptly having under the situation of connector, be beneficial to the carrying out of testing; This connector also can be original connector, if the requirement that this original connector goes for testing.These integrated circuit connectors can be arranged on the motherboard or the circuit board of interface module, also can dispose a plurality of integrated circuit connectors on the same circuit board, to be suitable for carrying out the test of different integrated circuits.For instance, in the complete machine computer, there are two kinds of connectors of A, B that two kinds of different integrated circuits of A, B can be installed respectively; Under first kind of situation, when integrated circuit A is tested integrated circuit, can on connector B, selectivity assign different integrated circuit B1, the B2 or the B3... that are known as, and be the compatibility that is used for testing integrated circuits A and integrated circuit B1, B2 or B3... of test with connector A; Under second kind of situation, when integrated circuit B is tested integrated circuit, an integrated circuit A who is known as can be installed on connector A, and ought come testing integrated circuits B as test connector with connector B.
Please refer to Fig. 4, it illustrates a kind of test interface module schematic diagram in a preferred embodiment of the present invention.To advance rank graphic interface module 400 (AGP module) is example, if desire is tested the graphics accelerator on it, then on its module board 402, place the position of figure speed-up chip, one integrated circuit connector 404 (socket or connector) is set, as for other parts, such as video memory 406 (video RAM), insert the golden finger 408 of rank graphics port slots (AGPslot), or monitor socket 410 is all identical with standard specification.
In addition, please refer to Fig. 5, it illustrates a kind of Test Host plate schematic diagram in a preferred embodiment of the present invention.Be example with motherboard 500 (main board) again, all multiple ics are arranged on the motherboard 500, wherein outbalance such as being central processing unit (CPU), system bus controller, input/output bus controller, can test at these important integrated circuits.The former position that is provided with at motherboard 500 corresponding these integrated circuits disposes a connector respectively, as central processing unit connector 502 (CPU socket), system bus controller connector 504 and input/output bus controller connector 506.Part as for other element, such as dynamic random access memory slot 508 (DRAM slot), advance rank graphics port slot 510 (AGPslot), expansion slot 512 (comprises peripheral element interface slot PCI slot, CNR slot etc.), integrated driving electrical interface port 514 (IDE port) or input/output end port 516 (I/Oport comprises parallel port and serial port) is all identical with standard specification.
The encapsulation kenel design of the integrated circuit that above-mentioned connector can detect at desire, such as go for the encapsulation of ball lattice array type (BGA, PBGA, EBGA...), the encapsulation of pin lattice array type (PGA, CPGA, PPGA), small-sized J type pin encapsulation (SOJ) etc.
Please refer to Fig. 6, it illustrates a kind of automation integrated circuit system test device schematic diagram of preferred embodiment of the present invention.Automation integrated circuit system test device of the present invention as previously mentioned is built on the frame 650, known good test computer 600, and wherein test comprises a host machine part 602, one input/output devices 604 and an output device 606 at least with computer 600.Host machine part 602 comprises that at least an integrated circuit connector 608 is in order to ccontaining tested integrated circuit, as previously mentioned, host machine part 602 can only comprise motherboard, and alternative configuration one interface module, and integrated circuit connector 608 can be disposed on the interface module as Fig. 4, perhaps be disposed on the motherboard, and can dispose a plurality of integrated circuit connectors in host machine part as Fig. 5.Comprise disc driver etc. as for input/output device 604, in order to store various softwares, can be used as subsequent drive test and carry out the usefulness of test programs with computer 600, these softwares can be included as test and specially designed specific program also can comprise common or important general application program.Be preferably a monitor (monitor) or other demonstration output device as for output device 606, the demonstration output device that comprises cathode ray tube screen (CRT) or LCD (LCD) etc. can certainly be the demonstration output device such as printer etc.Output device can be a loud speaker also, and when being necessary, also can detect at this audio output device, to test the compatibility of tested integrated circuit.And test can also comprise many interface equipments 610 with computer 600, such as keyboard, mouse, draught machine, scanner, disc driver, CD-ROM drive, digital camera etc., these all are according to the desire test event and the selectivity outfit, can be used for carrying out the detection of integrated circuit and interface equipment compatibility.
Test is used for carrying one or more tested integrated circuits with computer 600, and it is carried out the usefulness of a test, can be any in aforementioned many kind computers, as noted earlier, under the situation an of the best, test is all identical with the hardware environment of terminal user with the assembling mode of integrated circuits all in the computer 600, so a test equals the actual measurement in actual environment for use.And under another preferable situation, the saturating test connector of mounting means palpus of test with the integrated circuit that desire is tested in connector in the computer 600, the mode that is installed on main frame part 602 of other all main integrated circuits is all identical with terminal user, event is emulation terminal user's actual environment for use effectively, and then improve the correctness of test, guarantee the quality of product.Under another preferable situation, partly non-tested integrated circuit is installed on the circuit board and dismantled and assembled replacing with connector, so that identical tested integrated circuit can cooperate test with various non-tested integrated circuit, understanding tested integrated circuit, but only need use with a slice circuit board for the compatibility between various different integrated circuits.Under another preferable situation again, same main frame partly has a plurality of connectors in 602 and can be used for test, says just like preamble, if one of them will be used to test tested integrated circuit, and then other connector can be inserted a year Known good integrated circuit.Because when a tested integrated circuit built-in test is used in the computer, just constituted the computer of a telotism, claim in the present invention that therefore this kind computer is " complete machine computer ".Certainly, if when being necessary, all members in the complete machine computer are all identical with actual user's outfit, comprise the other electron component on the circuit board or test interface equipment with computer connected.Because the complete machine computer is the computer of a telotism, on the complete machine computer, can carry out many predetermined test programs, and state that can the complete simulation terminal user, comprise and carry out general application program, such as window system, animation, recreation etc., perhaps carry out a specific program, computer Numerical Control program (computer numerical control code) when being applied to industrial computer, or the CAD (computer aided design) in the work station/manufacturing software (CAD/CAM) etc., even carry out a fc-specific test FC program, and can connect a computer numerical value control tool machine when being a work station such as the complete machine computer, carry out machining.
Tested integrated circuit can rely on an automatic push-pull structure 612, such as being a mechanical arm, inserts in the integrated circuit connector 608, makes integrated circuit and test electrically connect with computer 600, to constitute a complete machine computer.Can rely on input/output device 604 (drive unit) to drive test during test and carry out a presumptive test program, be stored in program in the input/output device 604 such as execution, such as window system or some stereo-picture broadcasts etc. with computer 600.And output device 606 can be with the executing state output of test with computer 600, wherein output device 606 is such as being crt display unit 606a or LCD 606b etc., yet also can connect crt display unit 606a or LCD 606b simultaneously, so just can monitor a playout software simultaneously in the driving situation on the crt display unit 606a or on the LCD 606b, yet between the electric connection of host machine part 602 and LCD 606b, also must dispose a digital analog converter 605 (Digital Analog Converter, DAC), so see through digital analog converter 605, LCD 606b just can receive the signal of numeral, and with Low Voltage Differential Signal (Low Voltage Differential Signaling, LVDS) mode is carried out the signal transmission.
In addition, the system test system also comprises image sensering device 616a, 616b and an image data base 690, and wherein image data base 690 has pre-stored image data.Rely on the test output image that image sensering device 616a can sensing crt display unit 606a, sense the test output image of crt display unit 606a at image sensering device 616a after, rely on the pre-stored image data that deposited in test output image that control unit 640 can be captured image sensering device 616a and the image data base 690 judgement of comparing, to determine whether tested integrated circuit 630 shows normal on crt display unit 606a, can determine also simultaneously whether tested integrated circuit 630 uses normal operation in the computer 600 in testing, when the test output image that is captured as image sensering device 616a is same as the pre-stored image data that deposited in the image data base 690, represent that then tested integrated circuit 630 shows normally on crt display unit 606a; Yet,, represent tested integrated circuit 630 display abnormality on crt display unit 606a if when the test output image that is captured as image sensering device 616a is different from the pre-stored image data that deposited in the image data base 690.And rely on the test output image that image sensering device 616b can sensing LCD 606b, sense the test output image of LCD 606b at image sensering device 616b after, rely on the pre-stored image data that deposited in test output image that control unit 640 can be captured image sensering device 616b and the image data base 690 judgement of comparing, to determine whether tested integrated circuit 630 shows normal on LCD 606b, can also determine simultaneously whether tested integrated circuit 630 uses normal operation in the computer 600 in testing, when the test output image that is captured as image sensering device 616b is same as the pre-stored image data that deposited in the image data base 690, represent that then tested integrated circuit 630 shows normally on LCD 606b; When yet the test output image that is captured as image sensering device 616b is different from the pre-stored image data that deposited in the image data base 690, represent tested integrated circuit 630 display abnormality on LCD 606b.Image sensering device 616a, 616b are such as being charge coupled cell (chargecoupling device, CCD) or cmos image sensor (CMOS Image Sensor, CIS), can carry out real-time dynamic monitoring with computer 600 to test, judge by this whether tested integrated circuit 630 is normal.As mentioned above, rely on control unit 640 can control the operation of crt display unit 606a, LCD 606b, image sensering device 616a, 616b and image data base 690.
In addition, automation integrated circuit system test system also comprises an automatic conveyor 620, an integrated circuit feeding mechanism 622 and an integrated circuit sorter 624, wherein automatic conveyor 620, such as being mechanical arm, can be used for transmitting the usefulness of tested integrated circuit 630, and integrated circuit feeding mechanism 622, such as being tray, in order to put a plurality of tested integrated circuit 630 that does not detect, integrated circuit sorter 624 is in order to put a plurality of tested integrated circuit 630 that has detected.Integrated circuit sorter 624 has a plurality of temporary storage location 624a, 624b, can be with a plurality of tested integrated circuit 630 classification that detected, such as temporary storage location 624a is to deposit the tested integrated circuit 630 that system test passes through, and temporary storage location 624b deposits the tested integrated circuit 630 that does not pass through system test.So rely on automatic conveyor 620 and automatic push-pull structure 612 with the tested integrated circuit 630 that do not detect from integrated circuit feeding mechanism 622, to be presented to test in regular turn with on the computer 600, to carry out system test.After system test is finished, according to its test result, the tested integrated circuit 630 that relies on automatic conveyor 620 and automatic push-pull structure 612 to have detected is sent on the integrated circuit sorter 624, if tested integrated circuit 630 then leaves among the temporary storage location 624a by system test; If tested integrated circuit 630 by system test, does not then leave among the temporary storage location 624b.
In addition, automation integrated circuit system test system also comprises an integrated circuit feeding mechanism 622 and an integrated circuit sorter 624, wherein integrated circuit feeding mechanism 622 is in order to put a plurality of tested integrated circuit 630 that does not detect, and integrated circuit sorter 624 is in order to put a plurality of tested integrated circuit 630 that has detected, integrated circuit sorter 624 has a plurality of temporary storage location 624a, 624b, can be with a plurality of tested integrated circuit 630 classification that detected, such as temporary storage location 624a is to deposit the tested integrated circuit 630 that system test passes through, and temporary storage location 624b deposits the tested integrated circuit 630 that does not pass through system test.So rely on automatic conveyor 620 and automatic push-pull structure 612 with the tested integrated circuit 630 that do not detect from integrated circuit feeding mechanism 622, to be presented to test in regular turn with on the computer 600, to carry out system test.After system test is finished, the tested integrated circuit 630 that relies on automatic conveyor 620 and automatic push-pull structure 612 to have detected is sent on the integrated circuit sorter 624 again, if tested integrated circuit 630 then leaves among the temporary storage location 624a by system test; If tested integrated circuit 630 by system test, does not then leave among the temporary storage location 624b.
In addition, automation integrated circuit system test system also comprises temperature control equipment 613,614,615, relies on temperature control equipment 613,614,615 can control the temperature of tested integrated circuit 630.And temperature control equipment 614 can be assemblied on the automatic push-pull structure 612, therefore when automatic push-pull structure 612 grasps tested integrated circuit 630 from integrated circuit feeding mechanism 622 after, the process that temperature control equipment 614 just can heat or cool off tested integrated circuit 630 is placed to tested integrated circuit 630 test with till on the computer 600 up to automatic push-pull structure 612.In addition, temperature control equipment 613 can also be assemblied in test with on the computer 600, when tested integrated circuit 630 is assembled to test with after on the computer 600, just can rely on 613 pairs of tested integrated circuits 630 of temperature control equipment carry out temperature controlling.In addition, temperature control equipment 615 can also be assembled on the temperature pre-control device 623, when utilizing automatic conveyor 620 is transported to tested integrated circuit 630 on the temperature pre-control device 623 from integrated circuit feeding mechanism 622 after, rely on temperature control equipment 615 to carry out the action of preheating or precooling to being seated in the tested integrated circuit 630 on the temperature pre-control device 623.Temperature control equipment 613,614,615 is made of resistance, can make resistance produce heat this moment by means of applying voltage, the heat that it produced just can conduct to test with on the computer 600, on the automatic push-pull structure 612 and on the temperature pre-control device 623, then conduct to again on the tested integrated circuit 630, so can control the temperature of tested integrated circuit 630; In addition, when temperature control equipment 613,614,615 is when being media with the working fluid, can see through pipeline working fluid is flowed to test with on the computer 600, automatically on the push-pull structure 612 and on the temperature pre-control device 623, so rely on the temperature of control working fluid to control to be carried on test with on the computer 600, automatically on the push-pull structure 612 and the temperature of the tested integrated circuit 630 on the temperature pre-control device 623.Wherein, temperature control equipment 613,614,615 can be configured in the automation integrated circuit system test system simultaneously, and temperature control equipment 613,614,615 can also partly be configured in the automation integrated circuit system test system.
Connect test computer 600, image sensering device 616a, 616b, temperature control equipment 613,614,615, automatic push-pull structure 612 and automatic conveyor 620 respectively as for control unit 640.Rely on control unit 640 can control and measuring with the state of computer 600 and image sensering device 616a, 616b, whether normal with running in the computer 600 in order to judge integrated circuit 630 in test, can also determine simultaneously tested integrated circuit 630 whether showing normally on the crt display unit 606a or on the LCD 606b, and control automatic conveyor 620 and automatic push-pull structure 612 carrying out whereby with the control test; In other words, control unit 640 can be to the omnidistance control of whole testing process.In addition, what deserves to be mentioned is, use when automatic conveyor 620 can merge with automatic push-pull structure 612, that is rely on single mechanical arm can reach the function of automatic conveyor 620 and automatic push-pull structure 612 simultaneously.Nature, this mechanical arm can be designed to have temperature control equipment 614 thereon.
Its flow process of automation integrated circuit whole-machine test method of the present invention is to utilize automatic push-pull structure 612 that tested integrated circuit 630 is picked up from integrated circuit feeding mechanism 622 earlier, utilize automatic conveyor 620 with tested integrated circuit 630 then, by being sent to test on the integrated circuit feeding mechanism 622 with on the computer 600.Utilize automatic push-pull structure 612 that tested integrated circuit 630 is inserted in the connector 608 again and electrically connect with it, and make test form a complete machine computer with computer 600; Perhaps can also utilize automatic push-pull structure 612 that tested integrated circuit 630 is picked up from integrated circuit feeding mechanism 622 earlier, utilize automatic conveyor 620 with tested integrated circuit 630 then, by being sent on the integrated circuit feeding mechanism 622 on the temperature pre-control device 623, following automatic push-pull structure 612 just is seated in tested integrated circuit 630 on the temperature pre-control device 623, so just tested integrated circuit 630 can be carried out the action of preheating or precooling earlier, utilize automatic push-pull structure 612 that tested integrated circuit 630 is picked up from temperature pre-control device 623 afterwards again, and then utilize automatic conveyor 620 with tested integrated circuit 630, by being sent to test on the temperature pre-control device 623 with on the computer 600, then, utilize automatic push-pull structure 612 that tested integrated circuit 630 is inserted in the connector 608 again and electrically connect with it, and make test form a complete machine computer with computer 600.
After tested integrated circuit 630 is assembled on the test usefulness computer 600, just can rely on input/output device 604 to drive test and carry out a presumptive test program with computer 600, testing, such as being as described high temperature system test of hypomere content and low temperature system test.When test is carried out test program with computer 600, can utilize image sensering device 616a, 616b to crt display unit 606a and the LCD 606b of test with computer 600, monitor in real time, so control unit 640 can judge just whether tested integrated circuit 630 is showing normally on the crt display unit 606a or on the LCD 606b whether in test with running in the computer 600 normally can also judge tested integrated circuit 630 simultaneously.According to test result, utilize the tested integrated circuit 630 after automatic push-pull structure 612 and automatic conveyor 620 will be tested at last, be positioned over temporary storage location (624a or 624b) corresponding in the integrated circuit sorter 624.
In addition, above-mentioned automation integrated circuit whole-machine test method can carry out the high temperature system test and the low temperature system test of tested integrated circuit 630, its temperature that can utilize the tested integrated circuit 630 of aforesaid temperature control equipment 613,614,615 controls is to carry out system test, rely on the temperature control equipment 613,614,615 can be under the state of constant temperature with the temperature adjusting of tested integrated circuit 630, such as being to keep to be fixed on 0 ℃ of a period of time, or keep and be fixed on 85 ℃ of a period of times, carry out system test.Generally speaking, the system test of high temperature is that tested integrated circuit 630 is regulated and control a wherein temperature between 65 ℃ to 120 ℃, and in this temperature maintenance several seconds by several minutes to carry out the system test of tested integrated circuit 630; And the system test of low temperature is that tested integrated circuit 630 is regulated and control a wherein temperature between 10 ℃ to-10 ℃, and in this temperature maintenance several seconds by several minutes to carry out the system test of tested integrated circuit 630.Perhaps, rely on the temperature control equipment 613,614,615 can also be under the state of alternating temperature with the temperature adjusting of tested integrated circuit 630, carry out system test, so can accurately judge the temperature that the tested integrated circuit 630 of sening as an envoy to breaks down, for example, in the process that tested integrated circuit 630 is heating, image sensering device 616a, 616b demonstrate tested integrated circuit 630 abnormal signal that breaks down suddenly and produce, just note down the temperature of tested integrated circuit 630 get off this moment, and the temperature of being noted down is the temperature that tested integrated circuit 630 is broken down.In addition, rely on temperature control equipment 613,614,615 can flexibly regulate and control the temperature of tested integrated circuit 630, to carry out the system test of tested integrated circuit 630.Wherein, with regard to the method for heating graphic chips, can earlier the not tested graphic chips (Graphics Chip) of position in integrated circuit feeding mechanism 622 be sent on the temperature pre-control device 623, see through the action that the temperature control equipment 615 that is assemblied on the temperature pre-control device 623 can carry out preheating earlier, with the default temperature of control graphic chips to, then when the transmission graphic chips is to usefulness computer 600 to be measured, see through the temperature control equipment 614 on the automatic plug-in and pull-off device 612, can provide little heat to graphic chips, to keep graphic chips in default temperature.And with regard to heating central processing unit (CPU), can be when the transmission central processing unit be to usefulness computer 600 to be measured, see through the temperature control equipment 614 on the automatic plug-in and pull-off device 612, directly control the temperature of central processing unit, make central processing unit can be controlled on the temperature conditions of presetting, and in the case, just do not need in integrated circuit feeding mechanism 622, to carry out earlier the action of preheating central processing unit.
In addition, rely on variation that temperature control equipment 613,614,615 can be random with the temperature of tested integrated circuit 630 to meet predetermined temperature curve, such as be assembled on the test usefulness computer 600 when tested integrated circuit 630 after, can earlier tested integrated circuit 630 be regulated and control the wherein temperature between 65 ℃ to 120 ℃, and in this temperature maintenance several seconds by several minutes to carry out the high temperature system test, and then tested integrated circuit 630 regulated and control a wherein temperature between 10 ℃ to-10 ℃, and in this temperature maintenance several seconds by several minutes to carry out the low temperature system test.As mentioned above, after the high temperature system test that finishes, need not move tested integrated circuit 630 and just can directly carry out the low temperature system test, so can significantly reduce the time of test.Yet application of the present invention is not limited to above-mentioned mode, can also be other mode, and is as described below.After tested integrated circuit 630 is assembled on the test usefulness computer 600, can also earlier tested integrated circuit 630 be regulated and control the wherein temperature between 10 ℃ to-10 ℃, and in this temperature maintenance several seconds by several minutes to carry out the low temperature system test, and then tested integrated circuit 630 regulated and control a wherein temperature between 65 ℃ to 120 ℃, and in this temperature maintenance several seconds by several minutes to carry out the high temperature system test.So when tested integrated circuit 630 when the high temperature system test switches to the low temperature system test, or when the low temperature system test switches to the high temperature system test, need not move tested integrated circuit 630, and the time that can significantly reduce test is improved the efficient of test.Wherein, when tested integrated circuit 630 when the high temperature system test switches to the low temperature system test, see through the position on plug-in and pull-off device 612 automatically temperature control equipment 614 or the position to be measured with the temperature control equipment 613 in the computer 600, the temperature linearity of tested integrated circuit 630 is successively decreased, that is its temperature that is descended of each set time is certain, and in the process of cooling, can also carry out system test, if this moment is image sensering device 616a, 616b demonstrates tested integrated circuit 630 abnormal signal that breaks down suddenly and produces, just the temperature of tested integrated circuit 630 is noted down, and can judge the temperature that tested integrated circuit 630 is broken down.In addition, when tested integrated circuit 630 when the low temperature system test switches to the high temperature system test, see through the position on plug-in and pull-off device 612 automatically temperature control equipment 614 or the position to be measured with the temperature control equipment 613 in the computer 600, the temperature linearity of tested integrated circuit 630 is increased progressively, that is its temperature that is increased of each set time is certain, and in the process that heats, can also carry out system test, if this moment is image sensering device 616a, 616b demonstrates tested integrated circuit 630 abnormal signal that breaks down suddenly and produces, just the temperature of tested integrated circuit 630 is noted down, and can judge the temperature that tested integrated circuit 630 is broken down.
Yet, application of the present invention is not limited to the above embodiments, also tested integrated circuit can be controlled under a plurality of state of temperatures, carry out system test, under the state that tested integrated circuit is controlled at 0 ℃, 65 ℃ and 120 ℃ respectively, keep the several seconds by several minutes, to carry out system test.
When carrying out system test, whether showing normally on the crt display unit 606a or on the LCD 606b in order to judge tested integrated circuit 630, can carry out following method of testing.When tested integrated circuit 630 when carrying out system test, can output signal upward reach on the LCD 606b to crt display unit 606a, image sensering device 616a, 616b can grasp crt display unit 606a respectively and go up the picture that reaches on the LCD 606b at this moment, follow just test output image that it captured and the pre-stored image data that originally just are stored in the image data base 690 are compared, whether showing normally on the crt display unit 616a or on the LCD 616b to judge tested integrated circuit 630.Generally speaking, rely on above-mentioned method of testing, can detect following unusual situation, such as being the situations such as the unusual vertical bar of appearance on the picture, unusual horizontal line, unusual white block, image blurring or color be unusual of can detecting, and above-mentioned method of testing can be carried out system test under dos operating system or under the WINDOW operating system.For example, when showing abnormality white block on the LCD 606b, image sensering device 616b can grab the picture that has unusual white block on LCD 606b, and when carrying out the image comparison, control unit 640 just can determine tested integrated circuit 630 display abnormality on LCD 606b.
Then, just according to the result of control unit 640 detected tested integrated circuits 630, see through automatic push-pull structure 612 and automatic conveyor 620, tested integrated circuit 630 transmission are placed in the integrated circuit sorter 624, and integrated circuit sorter 624 can be a plurality of temporary storage location, be not limited to two, such as being four, wherein first temporary storage location can be deposited complete normal tested integrated circuit 630 behind system test, and second temporary storage location can be deposited through showing normal behind the system test the tested integrated circuit 630 of display abnormality on LCD 606b on crt display unit 606a, the 3rd temporary storage location can deposit through behind the system test showing normal on the LCD 606b tested integrated circuit 630, the four temporary storage location of display abnormality on the crt display unit 606a can deposit through behind the system test at equal tested integrated circuit 630 of display abnormality on the LCD 606b and on the crt display unit 606a.In addition, the kind that can also break down according to tested integrated circuit 630 is again distinguished, and when situations such as unusual vertical bar, unusual horizontal line, unusual white block, image blurring or color be unusual are taken place, be placed into different temporary storage location more respectively.In addition, perhaps can also be placed to different temporary storage location respectively according to different test results according to tested integrated circuit 630 under the dos operating system, under the WINDOW operating system or under the software running at other.
Please refer to Fig. 7, it illustrates the automation integrated circuit system test system schematic of the volume production of another preferred embodiment of the present invention.Arrangement for testing integrated circuit of the present invention and method can also be applied to volume production, in order to improve production capacity, can set up many group tests with computer 600, simultaneously a plurality of tested integrated circuits 630 are tested.Each test is very similar with framework and the foregoing description of computer 600, does not repeat them here.At first, utilize a plurality of automatic push-pull structures 612, tested integrated circuit 630 is picked up from integrated circuit feeding mechanism 622 respectively, wherein respectively other is tested with computer 600 corresponding to each in each automatic push-pull structure 612 start, and automatic conveyor 620 can be sent to each test computer 600 by integrated circuit feeding mechanism 622 with tested integrated circuit 630 then.Rely on again and tested integrated circuit 630 can be inserted respectively in the corresponding connector 608 with the automatic push-pull structure 612 of computer 600, make it to electrically connect, and make each test form a complete machine computer respectively with computer 600 corresponding to each test; Perhaps, also can utilize each automatic push-pull structure 612 that tested integrated circuit 630 is picked up from integrated circuit feeding mechanism 622 earlier, wherein each automatic push-pull structure 612 start is corresponding to each other test computer 600, utilize automatic conveyor 620 with tested integrated circuit 630 then, by being sent to respectively on the integrated circuit feeding mechanism 622 on the temperature pre-control device 623, following automatic push-pull structure 612 just is seated in tested integrated circuit 630 on the temperature pre-control device 623, so just tested integrated circuit 630 can be carried out the action of preheating or precooling earlier, utilize automatic push-pull structure 612 respectively tested integrated circuit 630 to be picked up from temperature pre-control device 623 afterwards again, and then utilize automatic conveyor 620 with tested integrated circuit 630, by being sent to corresponding test on the temperature pre-control device 623 with on the computer 600, then, utilize automatic push-pull structure 612 that tested integrated circuit 630 is inserted respectively in the corresponding connector 608 again and electrically connect with it, and make each test form a complete machine computer respectively with computer 600.
After tested integrated circuit 630 is assembled on the test usefulness computer 600, just can rely on input/output device 640 to drive test respectively then and carry out a presumptive test program with computer 600, to test, comprise aforesaid high temperature system test and low temperature system test.When the multi-section test is carried out test program with computer 600, can rely on respectively corresponding to each test uses image sensering device 616a, its crt display unit of 616b sensing 606a of computer 600 to go up the image that reaches on the LCD 606b, with judge each tested integrated circuit 630 whether show on the crt display unit 606a of correspondence and on the LCD 606b normal, also can determine simultaneously each tested integrated circuit 630 whether in the test of correspondence with normal operation in the computer 600.At last according to test result, with automatic conveyor 620 each is tested with the tested integrated circuit 630 after the test in the computer 600, be positioned over temporary storage location 624a, 624b, 624c corresponding in the integrated circuit sorter 624, wherein place and detect the tested integrated circuit 630 that passes through such as temporary storage location 624a, temporary storage location 624b places the not tested integrated circuit 630 by detecting of some specific function, temporary storage location 624c places other not tested integrated circuit 630 by detecting, be example with three temporary storage location in the present embodiment, yet be not limited to three.And control unit 640 electrically connects each test computer 600, image sensering device 616a, 616b, automatic conveyor 620 and automatic push-pull structure 612 respectively, and control unit 640 can be monitored the state of each test with computer 600 and image sensering device 616a, 616b, in order to judge whether tested integrated circuit 630 operates normal in the test usefulness computer 600 of correspondence, and control the action of automatic conveyor 620 whereby, and control carry out of automatic push-pull structure 612 with the control test.
In addition, what deserves to be mentioned is that host machine part can dispose a plurality of connectors as previously mentioned, therefore method of testing of the present invention and device can be tested a plurality of integrated circuits simultaneously, detect its compatibility to each other.For instance, with regard to structure shown in Figure 7, such as desiring the compatibility of test macro bus control unit to each label memory, can be at the memory of first group of test with computer configuration A label, the memory of B label is disposed in second group of test with computer, the rest may be inferred, promptly can carry out the compatibility test between integrated circuit.Can also carry out the image sensing monitoring at a certain output device or interface equipment as for image sensering device, if such as for the printer monitoring, the image that then can sensing prints file is compared; If for industrial computer, can be to board action the carrying out sensing of its connection.
In sum, automatic testing IC complete device of the present invention system, devices and methods therefor have following feature and advantage:
1, because automatic testing IC complete device of the present invention system is in a complete survey Carry out (comprising host machine part and main relevant interface equipment) in the computer on probation, with tested integrated electric Namely consist of a complete machine computer after the road connects, so but emulation terminal user's state to carry out Test, even can carry out the used software of actual user, such as window system or stereogram Picture projections etc. to detect, can be guaranteed the actual using character of integrated circuit.
2, automatic testing IC complete device device of the present invention can be at a test computer In a plurality of integrated circuit connectors are set simultaneously, such as central processing unit, system bus controller, So the connectors of input/output bus controller, graphics accelerator etc. are single testing arrangement Just go for the test of multiple integrated circuit, and can test holding concurrently between different integrated circuits Capacitive, the good and bad state that clearer and more definite testing integrated circuits uses.
3, see through automatic conveyor of the present invention, integrated circuit feeding mechanism, integrated circuit Sorter and image sensering device can be so that test macro flow process full automations, need not Manually, with the degree of accuracy of raising production capacity and test, and the cost of reduction volume production.
4, automatic testing IC complete device of the present invention system can be subjected to need not moving Survey in the situation of integrated circuit, carry out high temperature system test and low temperature system test, so can Significantly reduce the time of test, improve the efficient of test.
5, automatic testing IC complete device of the present invention system relies on temperature control equipment Can flexibly regulate and control the temperature of tested integrated circuit, survey with the complete machine that carries out tested integrated circuit Examination.
6, automatic testing IC complete device of the present invention system can be with tested integrated electric The temperature adjusting on road carries out system test under the state of alternating temperature, so can accurately judge The temperature that the tested integrated circuit of sening as an envoy to breaks down.
What 7, the image sensering device that adopts of the present invention can the Full-automatic monitoring integrated circuit operation Dynamical state for the dynamic error phenomenon of test with computer, becomes such as image drift, form and aspect Different, ghost or image error, even the misoperation of industrial computer board etc., all can carry out Monitoring is so the usefulness of more accurate detection integrated circuit.
8, automatic testing IC complete device of the present invention system can detect tested simultaneously Whether integrated circuit shows normal at crt display unit and liquid crystal display.
Claims (10)
1, a kind of automation integrated circuit system test system is characterized in that: comprising:
At least one test computer is suitable for carrying and tests at least one tested integrated circuit, and this test comprises at least one output device with computer, with the test result output of this tested integrated circuit;
At least one automatic push-pull structure is suitable for this tested integrated circuit is placed in this test with on the computer and should remove with computer from this test by tested integrated circuit;
At least one image sensering device captures the image on this output device; And
At least one control unit electrically connects this test with computer, this automatic push-pull structure and this image sensering device, and this control unit is in order to the action of controlling this automatic push-pull structure and the system test of controlling this test usefulness computer,
Wherein, this test constitutes a complete machine computer with computer behind this tested integrated circuit of carrying, and after this image sensering device captures an image of this output device, this image can be sent in this control unit, to compare this image and originally to be stored in difference between the view data in the database.
2, automation integrated circuit system test as claimed in claim 1 system is characterized in that: also comprise a connector, rely on this connector that this tested integrated circuit and this test are electrically connected with computer.
3, automation integrated circuit system test as claimed in claim 1 system, it is characterized in that: also comprise an audio sensor, this audio sensor connects this controller, to monitor the audio frequency output of this complete machine computer.
4, as the described automation integrated circuit system test of claim 1 system, it is characterized in that: also comprise:
One integrated circuit feeding mechanism is put a plurality of tested integrated circuit that does not detect;
One integrated circuit sorter is put a plurality of tested integrated circuit that has detected; And
One automatic conveyor, transmit these tested integrated circuits that do not detect and these tested integrated circuits that detected, rely on this automatic conveyor and this automatic push-pull structure can be from this integrated circuit feeding mechanism with these tested integrated circuits of not detecting, be presented to this test in regular turn with on the computer, carrying out system test, and then rely on this automatic conveyor and this automatic push-pull structure these tested integrated circuits that detected can be sent on this integrated circuit sorter.
5, as the described automation integrated circuit system test of claim 1 system, it is characterized in that: also comprise a temperature pre-control device, rely on this temperature pre-control device can make this tested integrated circuit be assembled to this test with computer on before, the action of advanced trip temperature control, wherein this automation integrated circuit system test system also comprises a temperature control equipment, is placed in the temperature of these the tested integrated circuits that do not detect on this temperature pre-control device in order to control.
6, a kind of automation integrated circuit whole-machine test method is characterized in that: comprising:
Step 1: with a tested integrated circuit automation be presented to a test with in the computer and with this test with the computer electric connection, constituting a complete machine computer, and this test comprises at least one output device with computer;
Step 2: drive this complete machine computer and carry out a presumptive test program, this tested integrated circuit is carried out system test, and the test result of this tested integrated circuit can output on this output device;
Step 3: at least one image sensering device captures the image on this output device; And
Step 4: comparison is by this image that this image sensering device captured and originally be stored in difference between the view data in the database.
7, as claim 6 a described automation integrated circuit whole-machine test method, it is characterized in that: this output device comprises a crt display unit and a LCD.
8, a kind of arrangement for testing integrated circuit image sensing system is characterized in that: comprising:
One image output device, the image data that foundation one tested integrated circuit is exported, and a test pictures that shows; And
One image sensering device is from this test pictures of image output device sensing.
9, as claim 8 a described arrangement for testing integrated circuit image sensing system, it is characterized in that: comprise that also an image data base has pre-stored image data, the usefulness of comparing with this test pictures of this image sensering device institute sensing.
10, as claim 9 a described arrangement for testing integrated circuit image sensing system, it is characterized in that: also comprise a control unit, control the operation of this image output device, this image sensering device and this image data base.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02146346 CN1271694C (en) | 2002-10-24 | 2002-10-24 | System, equipment and method for automatic testing IC complete device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN 02146346 CN1271694C (en) | 2002-10-24 | 2002-10-24 | System, equipment and method for automatic testing IC complete device |
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| CN1416163A CN1416163A (en) | 2003-05-07 |
| CN1271694C true CN1271694C (en) | 2006-08-23 |
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| CN 02146346 Expired - Lifetime CN1271694C (en) | 2002-10-24 | 2002-10-24 | System, equipment and method for automatic testing IC complete device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102608479A (en) * | 2012-04-10 | 2012-07-25 | 李春光 | Automatic multi-machine testing system |
| CN106338525A (en) * | 2016-09-25 | 2017-01-18 | 东莞市联洲知识产权运营管理有限公司 | Intelligent comparison device for integrated circuit boards |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1900731B (en) * | 2006-07-27 | 2011-08-10 | 华为技术有限公司 | Logic module detecting system and method |
| CN102945359A (en) * | 2012-10-25 | 2013-02-27 | 苏州佳世达电通有限公司 | Testing device and testing method for display panel |
| CN104181453A (en) * | 2013-05-24 | 2014-12-03 | 标准科技股份有限公司 | Chip testing machine |
| US11961220B2 (en) * | 2018-01-23 | 2024-04-16 | Texas Instruments Incorporated | Handling integrated circuits in automated testing |
| CN109298314B (en) * | 2018-09-21 | 2020-08-28 | 福建工程学院 | Circuit board port plugging life test system and method based on image processing |
| CN110164503A (en) * | 2019-05-31 | 2019-08-23 | 济南德欧雅安全技术有限公司 | A kind of semiconductor component test fixture, test macro and test method |
-
2002
- 2002-10-24 CN CN 02146346 patent/CN1271694C/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102608479A (en) * | 2012-04-10 | 2012-07-25 | 李春光 | Automatic multi-machine testing system |
| CN106338525A (en) * | 2016-09-25 | 2017-01-18 | 东莞市联洲知识产权运营管理有限公司 | Intelligent comparison device for integrated circuit boards |
| CN106338525B (en) * | 2016-09-25 | 2019-05-10 | 鹤山市世安电子科技有限公司 | A kind of integrated circuit board intelligence comparison device |
Also Published As
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| CN1416163A (en) | 2003-05-07 |
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