CN1262443A - Radiation effect detector for satellite - Google Patents

Radiation effect detector for satellite Download PDF

Info

Publication number
CN1262443A
CN1262443A CN 99102022 CN99102022A CN1262443A CN 1262443 A CN1262443 A CN 1262443A CN 99102022 CN99102022 CN 99102022 CN 99102022 A CN99102022 A CN 99102022A CN 1262443 A CN1262443 A CN 1262443A
Authority
CN
China
Prior art keywords
circuit
measurement
voltage
cmos
radiation effect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN 99102022
Other languages
Chinese (zh)
Other versions
CN1125350C (en
Inventor
范隆
任迪远
严荣良
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xinjiang Technical Institute of Physics and Chemistry of CAS
Original Assignee
Xinjiang Technical Institute of Physics and Chemistry of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xinjiang Technical Institute of Physics and Chemistry of CAS filed Critical Xinjiang Technical Institute of Physics and Chemistry of CAS
Priority to CN 99102022 priority Critical patent/CN1125350C/en
Publication of CN1262443A publication Critical patent/CN1262443A/en
Application granted granted Critical
Publication of CN1125350C publication Critical patent/CN1125350C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Measurement Of Radiation (AREA)

Abstract

A radiation effect detector for satellite in order to dectect the influence of particle radiation to CMOS IC is disclosed to detect the threshold voltage value of N-channel transistorsin IC CC4007 which is sensitive to ionizing radiation. It is composed of measuring controller, constant current source, voltage output interface and CMOS4007 to be detected. One of channels in data acquisition system of satellite is used to control the start pulse. The threshold values of 6 N-channel transistors in IC "4007" are sequentially measured. Its advantages are low power, and high reliability.

Description

Radiation effect detector for satellite
The present invention is mainly used in and detects the influence of particle radiation to the CMOS integrated circuit, is the outer a kind of detector on the number extraction system on the star that is hung on.
Along with the development of spationautics, MOS microelectronic component and circuit are extensive further with the application in the electronic systems such as computing machine, observing and controlling at star.But well-known space radiation environment influence is the major reason that threatens MOS structure electrology characteristic always.Most typically be, the ionising radiation meeting causes the drift of MOS circuit valve voltage, causes leakage current to increase, and circuit power consumption increases, and serious meeting causes circuit logic mistake and afunction.Therefore, MOS circuit radiation hardening Study on Technology for tie surface, carrying out space radiation effect on the spot surveys, for the actual radioresistance effect of the MOS circuit of grasping the manufacturing of homemade reinforcing and non-reinforcement process in the space, relatively the difference between ground simulation and the space radiation environment has crucial function and significance.
The object of the invention is, developed and be used to detect the star CMOS radiation effect detector that 4007 pairs of complementary pairs of CMOS add phase inverter N sewer pipe threshold voltage, this detector is made up of circuit of measurement and control, constant-current source circuit, voltage output interface circuit and tested CMOS 4007; This detector is installed on the satellite and uses, to reach the purpose of examination space radiation environment actual influence.This detector all in strict accordance with the enforcement of regulations of space product, has reached low-power consumption, highly reliable, in light weight, target that function is strong from the selected type of circuit design, components and parts and exterior design.
Star of the present invention is the supporting use of data acquisition system (DAS) on a kind of and the star with the CMOS radiation effect detector, is used to detect the detector of ionising radiation to the influence of CMOS integrated circuit, can finish 6 N sewer pipe threshold voltages in two 4007 are detected; This machine is made up of circuit of measurement and control, constant-current source circuit, voltage output interface circuit and tested CMOS4007; Wherein circuit of measurement and control, constant-current source circuit and voltage output interface circuit all connect with measured device 4007; This machine circuit of measurement and control simulates switch (4), anti-phase buffering driver (5) and relay (6) by two monostable triggers (1), step-by-step counting code translator (2), delay circuit (3), six tunnel and forms; Wherein two monostalbe triggers (1), step-by-step counting/code translator (2), delay circuit (3), six tunnel simulate electronic switch (4) serial connection, connect with measured device 4007; Two monostalbe triggers (1), anti-phase/buffering driver (5), relay (6) serial connection connect with measured device 4007.Finish the switching of shaping to external measurement starting impulse, counting/decoding, time-delay, control electronic switch and miniature sensitive inductive relay to six tested N ditch metal-oxide-semiconductor pin states; This machine adopts the starting voltage of constant current injection method measuring N ditch metal-oxide-semiconductor, and constant current is provided by constant-current source circuit (7), the switching of sensitive microrelay (6) control constant current; Voltage follower circuit (8) is made up of with catching diode totalizer, benchmark 1403; By voltage output interface circuit (8) the starting voltage simulating signal that detects is adjusted into the output area of 0-5V, the actual threshold voltage measurement range be-2.50V extremely+2.50V; This machine circuit of measurement and control adopts the mode of automatically reseting that powers on, and constitutes the power-on reset signal circuit by 1/2 pair of monostable trigger (1), RC circuit, two inverter buffer (5); This machine circuit of measurement and control has adopted eight step-by-step counting decoding schemes, whenever receive that is measured a starting impulse, only finish measurement to a N ditch metal-oxide-semiconductor starting voltage, after receiving the 6th measurement starting impulse, promptly finished detection successively to 6 N ditch metal-oxide-semiconductors, when receiving the 7th, 8 measurement starting impulse, sky is put in corresponding code translator output, and this machine is output as disarmed state (output voltage is 5.00V); This machine circuit has adopted anti-locking design measure; To the equipment three-way power (+12V ,-12V ,+5V) input end all adopted the resistance current limliting; The power of current-limiting protection circuit element and withstand voltage derate are used the components and parts of amount greater than protected circuit; Current limliting intensity :+12V end is 40mA;-12V ,+the 5V end is 10mA; Amplifier on the voltage output is used positive and negative dual power supply, and output level has been carried out clamp; All suspension input port ground connection of circuit or meet 12V; In relay line bag two ends protection in parallel diode and the resistance in series that the CMOS inverter buffer drives, form the holding circuit of anti-reverse pulse.
Referring to accompanying drawing
Fig. 1 is a principle of the invention block diagram
Fig. 2 is a circuit diagram of the present invention
Further describe and provide embodiment below in conjunction with accompanying drawing
Star of the present invention CMOS radiation effect detector, when satellite injection flight, data acquisition system (DAS) is sent the input end of a starting impulse to detector on the star, the amplitude of this starting impulse is 5V, utilize level shifter that its amplitude is upgraded to 12V, then, send into the monostalbe trigger shaping, be modulated to pulsewidth and be 2 seconds control wave, this signal is controlled counting/code translator counting on the one hand, and by grounded-grid (the non-test period of simulant electronic switch with a pipe in six tested N sewer pipes among the CC4007, the grid of N sewer pipe meets 12V, makes it be in conducting state); On the other hand, this signal improves its driving force in order to pilot relay by inverter buffer, makes the source electrode of constant current source and measured tube connect (source ground of common tube), and 10 μ A electric currents inject measured tube.Thereby, make this tested N sewer pipe enter into starting voltage and measure state by irradiation positive bias state, at this moment, the source voltage that links with constant current source is the negative value of tested N sewer pipe starting voltage, this voltage is delivered to the voltage output interface circuit mainly to be made up of totalizer and catching diode that an amplifier constitutes) in the inverting input of amplifier, positive terminal in amplifier adds the 2.50V reference voltage, obtains an output voltage than the high 2.50V of tested starting voltage at the output terminal of amplifier.This is that ADC0816 is to the requirement of voltage acquisition scope in the number extraction systems in order to satisfy on the satellite, and the voltage output interface circuit is limited in output voltage in 0 to the 5.00V scope, thereby the actual measurement range of starting voltage is-and 2.50V~+ 2.50V.After the control signal of 2 seconds pulsewidths finished, relay, electronic switch restPosed, and make tested N sewer pipe return the irradiation bias state by the measurement state, waited for and measured starting impulse next time.
When step-by-step counting/code translator will guarantee satellite transit, within a certain period of time, six all N sewer pipe starting voltages are measured once successively, subsequently, sky is adopted twice (this moment, output voltage was 5.00V) order in order to the difference measurement data.
The star that the present invention developed has two states when working with the CMOS radiation effect detector: flight irradiation behaviour and measurement state; The flight irradiation behaviour is that CC4007 N ditch tube grid keeps 12V, P sewer pipe remain off; The measurement state: CC4007 N ditch tube grid becomes 0V from 12V, and its source electrode is converted to access 10 μ A constant current sources from meeting 0V, and the gate source voltage of this moment is starting voltage V THAdopt the constant current injection method to measure the starting voltage of metal-oxide-semiconductor, sample selects for use the two complementary pairs of two CC4007 to add phase inverter, wherein a slice is the radiation hardened device, another sheet is common seven special devices, measured device is exposed in the star in the radiation environment, and the threshold voltage shift of these two kinds of device N ditch siphunculus of Measurement and analysis can be understood the actual effect of particle actual state and CMOS integrated circuit radiation hardening in the space environment.

Claims (7)

1, the supporting use of data acquisition system (DAS) on a kind of and star, be used to detect the star CMOS radiation effect detector of ionising radiation to the influence of CMOS integrated circuit, can finish 6 N sewer pipe starting voltages in two 4007 are detected, it is characterized in that, this machine is made up of circuit of measurement and control, constant-current source circuit, voltage output interface circuit and tested CMOS 4007, and wherein circuit of measurement and control, constant-current source circuit and voltage output interface circuit connect with measured device 4007 respectively.
2, star according to claim 1 CMOS radiation effect detector, it is characterized in that this machine circuit of measurement and control is made up of two monostable triggers (1), step-by-step counting code translator (2), delay circuit (3), six path analoging switch (4), anti-phase buffering driver (5) and relay (6); Wherein two monostable triggers (1), step-by-step counting/code translator (2), delay circuit (3), six tunnel simulate electronic switch (4) serial connection and connect with measured device 4007; Two monostable triggers (1), anti-phase/buffering driver (5), relay (6) serial connection connect with measured device 4007; To finish the switching of shaping to external measurement starting impulse, counting/decoding, time-delay, control electronic switch and miniature sensitive inductive relay to six tested NMOS pin status.
3, star according to claim 1 CMOS radiation effect detector is characterized in that, this machine adopts the starting voltage of constant current injection method measuring N ditch metal-oxide-semiconductor, and constant current is provided by constant-current source circuit (7), the switching of sensitive microrelay (6) control constant current.
4, star according to claim 1 CMOS radiation effect detector is characterized in that, voltage follower circuit (8) is made up of with catching diode totalizer, benchmark 1403; By voltage output interface circuit (8) the starting voltage simulating signal that detects is adjusted into the output area of 0-5V, the actual threshold voltage measurement range be-2.50V extremely+2.50V;
5, star according to claim 2 CMOS radiation effect detector, it is characterized in that, this machine circuit of measurement and control adopts the mode of automatically reseting that powers on, and constitutes the power-on reset signal circuit by 1/2 pair of monostable trigger (1), RC circuit, two inverter buffer (5).
6, star according to claim 2 CMOS radiation effect detector, it is characterized in that, this machine circuit of measurement and control has adopted eight step-by-step counting decoding schemes, whenever receive that is measured a starting impulse, only finish measurement, after receiving the 6th measurement starting impulse a N ditch metal-oxide-semiconductor starting voltage, promptly finished detection successively to 6 NMOS pipes, when receiving the 7th, 8 measurement starting impulse, sky is put in corresponding code translator output, and this machine is output as disarmed state (output voltage is 5.00V).
7, star according to claim 1 is visited device with the CMOS radiation effect, it is characterized in that this machine circuit has adopted anti-locking design measure, to the equipment three-way power (+12V ,-12V ,+5V) input end all adopted the resistance current limliting; The power of current-limiting protection circuit element and withstand voltage derate are used the components and parts of amount greater than protected circuit; Current limliting intensity; + 12V end is 40mA;-12V ,+the 5V end is 10mA; Amplifier on the voltage output is used positive and negative dual power supply, and output level has been carried out clamp; All suspension input port ground connection of circuit or meet 12V; In relay line bag two ends protection in parallel diode and the resistance in series that the CMOS inverter buffer drives, form the holding circuit of anti-reverse pulse.
CN 99102022 1999-02-02 1999-02-02 Radiation effect detector for satellite Expired - Fee Related CN1125350C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 99102022 CN1125350C (en) 1999-02-02 1999-02-02 Radiation effect detector for satellite

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 99102022 CN1125350C (en) 1999-02-02 1999-02-02 Radiation effect detector for satellite

Publications (2)

Publication Number Publication Date
CN1262443A true CN1262443A (en) 2000-08-09
CN1125350C CN1125350C (en) 2003-10-22

Family

ID=5270735

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 99102022 Expired - Fee Related CN1125350C (en) 1999-02-02 1999-02-02 Radiation effect detector for satellite

Country Status (1)

Country Link
CN (1) CN1125350C (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105866557A (en) * 2016-03-22 2016-08-17 成都理工大学 Time and energy double-spectrum synchronization measurement system for achieving GHZ pulse passing rate
CN108957283A (en) * 2017-05-19 2018-12-07 龙芯中科技术有限公司 Irradiation experiment plate, monitor terminal, asic chip irradiation experiment system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105866557A (en) * 2016-03-22 2016-08-17 成都理工大学 Time and energy double-spectrum synchronization measurement system for achieving GHZ pulse passing rate
CN105866557B (en) * 2016-03-22 2018-08-10 成都理工大学 A kind of realization GHZThe time of pulse percent of pass, energy bispectrum synchronized measurement system
CN108957283A (en) * 2017-05-19 2018-12-07 龙芯中科技术有限公司 Irradiation experiment plate, monitor terminal, asic chip irradiation experiment system

Also Published As

Publication number Publication date
CN1125350C (en) 2003-10-22

Similar Documents

Publication Publication Date Title
CN101477152B (en) Capacitance detection apparatus and method
WO2001086314A3 (en) Method and circuit for testing dc parameters of circuit input and output nodes
CN105022285B (en) A kind of IGBT switching transients real-time emulation system based on characteristic curve insertion
CN106681302B (en) The solid-state relay automatic holding device of distribution and its test control method on bullet
CN110398625A (en) Voltage detecting circuit
CN101680921A (en) Capacitance measurement with quick restoring current loop
CN103503129A (en) Calibrating device performance within an integrated circuit
KR20150024798A (en) Negative bias thermal instability stress testing of transistors
CN1125350C (en) Radiation effect detector for satellite
CN104459338A (en) Capacitor capacitance value measuring device and measuring method
CN102809725B (en) Sensitive element device for bypass signal of sensing circuit and detection method of sensitive element device
CN103557753A (en) Laser echo simulation device and method
CN103310853B (en) A kind of power switch circuit with built-in self-test
CN205562658U (en) Pulse spike amplitude measuring device and measuring circuit thereof
CN108674699B (en) Satellite equivalent system of time-division multiplexing bipolar gating
CN103117036B (en) The measuring circuit of threshold voltage shift amount of a kind of TFT, method and apparatus
CN109085412B (en) Reverse current detection circuit
CN105680679B (en) Driver output overcurrent protects circuit and its guard method
US6566919B2 (en) Power on circuit for generating reset signal
CN101825652A (en) Automatic range selector of measuring equipment
CN208445568U (en) A kind of network interface card with Remote Wake Up function
CN201787182U (en) Counter circuit for electromagnetic valve work based on launch rocket system
CN106919839B (en) Hardware Trojan horse detection method and system based on static power consumption analysis and circuit thereof
CN105182214A (en) 1-wire-communciation-based detection circuit and method of in-place state of electronic tag
CN206060522U (en) A kind of anti-back flow circuit

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20031022

Termination date: 20100202