CN1225658C - 电容测量 - Google Patents

电容测量 Download PDF

Info

Publication number
CN1225658C
CN1225658C CN02104511.9A CN02104511A CN1225658C CN 1225658 C CN1225658 C CN 1225658C CN 02104511 A CN02104511 A CN 02104511A CN 1225658 C CN1225658 C CN 1225658C
Authority
CN
China
Prior art keywords
voltage
capacitor
charge
electric capacity
different
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN02104511.9A
Other languages
English (en)
Chinese (zh)
Other versions
CN1369713A (zh
Inventor
J·M·伦德
小B·恩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of CN1369713A publication Critical patent/CN1369713A/zh
Application granted granted Critical
Publication of CN1225658C publication Critical patent/CN1225658C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
CN02104511.9A 2001-02-07 2002-02-07 电容测量 Expired - Fee Related CN1225658C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/779,137 US6624640B2 (en) 2001-02-07 2001-02-07 Capacitance measurement
US09/779137 2001-02-07
DE10204857A DE10204857B4 (de) 2001-02-07 2002-02-06 Kapazitätsmessung

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CNB2005100090812A Division CN100383538C (zh) 2001-02-07 2002-02-07 用于测量电容器电容的装置

Publications (2)

Publication Number Publication Date
CN1369713A CN1369713A (zh) 2002-09-18
CN1225658C true CN1225658C (zh) 2005-11-02

Family

ID=32773115

Family Applications (1)

Application Number Title Priority Date Filing Date
CN02104511.9A Expired - Fee Related CN1225658C (zh) 2001-02-07 2002-02-07 电容测量

Country Status (6)

Country Link
US (1) US6624640B2 (ja)
JP (1) JP3624184B2 (ja)
CN (1) CN1225658C (ja)
DE (1) DE10204857B4 (ja)
FR (1) FR2820506B1 (ja)
GB (1) GB2374943B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414796B (zh) * 2010-08-26 2013-11-11 Brymen Technology Corp 電容量測裝置及其方法

Families Citing this family (91)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7765095B1 (en) 2000-10-26 2010-07-27 Cypress Semiconductor Corporation Conditional branching in an in-circuit emulation system
US8176296B2 (en) 2000-10-26 2012-05-08 Cypress Semiconductor Corporation Programmable microcontroller architecture
US8149048B1 (en) 2000-10-26 2012-04-03 Cypress Semiconductor Corporation Apparatus and method for programmable power management in a programmable analog circuit block
US8103496B1 (en) 2000-10-26 2012-01-24 Cypress Semicondutor Corporation Breakpoint control in an in-circuit emulation system
US8160864B1 (en) 2000-10-26 2012-04-17 Cypress Semiconductor Corporation In-circuit emulator and pod synchronized boot
US6724220B1 (en) 2000-10-26 2004-04-20 Cyress Semiconductor Corporation Programmable microcontroller architecture (mixed analog/digital)
US7406674B1 (en) 2001-10-24 2008-07-29 Cypress Semiconductor Corporation Method and apparatus for generating microcontroller configuration information
US8078970B1 (en) 2001-11-09 2011-12-13 Cypress Semiconductor Corporation Graphical user interface with user-selectable list-box
US8042093B1 (en) 2001-11-15 2011-10-18 Cypress Semiconductor Corporation System providing automatic source code generation for personalization and parameterization of user modules
US7770113B1 (en) 2001-11-19 2010-08-03 Cypress Semiconductor Corporation System and method for dynamically generating a configuration datasheet
US7844437B1 (en) 2001-11-19 2010-11-30 Cypress Semiconductor Corporation System and method for performing next placements and pruning of disallowed placements for programming an integrated circuit
US6971004B1 (en) 2001-11-19 2005-11-29 Cypress Semiconductor Corp. System and method of dynamically reconfiguring a programmable integrated circuit
US8069405B1 (en) 2001-11-19 2011-11-29 Cypress Semiconductor Corporation User interface for efficiently browsing an electronic document using data-driven tabs
US7774190B1 (en) 2001-11-19 2010-08-10 Cypress Semiconductor Corporation Sleep and stall in an in-circuit emulation system
US8103497B1 (en) 2002-03-28 2012-01-24 Cypress Semiconductor Corporation External interface for event architecture
US7308608B1 (en) 2002-05-01 2007-12-11 Cypress Semiconductor Corporation Reconfigurable testing system and method
US7761845B1 (en) 2002-09-09 2010-07-20 Cypress Semiconductor Corporation Method for parameterizing a user module
US7295049B1 (en) 2004-03-25 2007-11-13 Cypress Semiconductor Corporation Method and circuit for rapid alignment of signals
US8286125B2 (en) 2004-08-13 2012-10-09 Cypress Semiconductor Corporation Model for a hardware device-independent method of defining embedded firmware for programmable systems
US8069436B2 (en) 2004-08-13 2011-11-29 Cypress Semiconductor Corporation Providing hardware independence to automate code generation of processing device firmware
US7332976B1 (en) 2005-02-04 2008-02-19 Cypress Semiconductor Corporation Poly-phase frequency synthesis oscillator
US7400183B1 (en) 2005-05-05 2008-07-15 Cypress Semiconductor Corporation Voltage controlled oscillator delay cell and method
US8089461B2 (en) 2005-06-23 2012-01-03 Cypress Semiconductor Corporation Touch wake for electronic devices
US8085067B1 (en) 2005-12-21 2011-12-27 Cypress Semiconductor Corporation Differential-to-single ended signal converter circuit and method
US7312616B2 (en) * 2006-01-20 2007-12-25 Cypress Semiconductor Corporation Successive approximate capacitance measurement circuit
US8067948B2 (en) 2006-03-27 2011-11-29 Cypress Semiconductor Corporation Input/output multiplexer bus
US8144125B2 (en) 2006-03-30 2012-03-27 Cypress Semiconductor Corporation Apparatus and method for reducing average scan rate to detect a conductive object on a sensing device
US7721609B2 (en) 2006-03-31 2010-05-25 Cypress Semiconductor Corporation Method and apparatus for sensing the force with which a button is pressed
US8040142B1 (en) 2006-03-31 2011-10-18 Cypress Semiconductor Corporation Touch detection techniques for capacitive touch sense systems
US8537121B2 (en) 2006-05-26 2013-09-17 Cypress Semiconductor Corporation Multi-function slider in touchpad
US8089472B2 (en) 2006-05-26 2012-01-03 Cypress Semiconductor Corporation Bidirectional slider with delete function
US8040321B2 (en) 2006-07-10 2011-10-18 Cypress Semiconductor Corporation Touch-sensor with shared capacitive sensors
US9507465B2 (en) 2006-07-25 2016-11-29 Cypress Semiconductor Corporation Technique for increasing the sensitivity of capacitive sensor arrays
US9766738B1 (en) 2006-08-23 2017-09-19 Cypress Semiconductor Corporation Position and usage based prioritization for capacitance sense interface
US8547114B2 (en) 2006-11-14 2013-10-01 Cypress Semiconductor Corporation Capacitance to code converter with sigma-delta modulator
US8089288B1 (en) 2006-11-16 2012-01-03 Cypress Semiconductor Corporation Charge accumulation capacitance sensor with linear transfer characteristic
US7460441B2 (en) 2007-01-12 2008-12-02 Microchip Technology Incorporated Measuring a long time period
US8058937B2 (en) 2007-01-30 2011-11-15 Cypress Semiconductor Corporation Setting a discharge rate and a charge rate of a relaxation oscillator circuit
US9564902B2 (en) 2007-04-17 2017-02-07 Cypress Semiconductor Corporation Dynamically configurable and re-configurable data path
US8092083B2 (en) 2007-04-17 2012-01-10 Cypress Semiconductor Corporation Temperature sensor with digital bandgap
US8130025B2 (en) 2007-04-17 2012-03-06 Cypress Semiconductor Corporation Numerical band gap
US8026739B2 (en) 2007-04-17 2011-09-27 Cypress Semiconductor Corporation System level interconnect with programmable switching
US8516025B2 (en) 2007-04-17 2013-08-20 Cypress Semiconductor Corporation Clock driven dynamic datapath chaining
US8040266B2 (en) 2007-04-17 2011-10-18 Cypress Semiconductor Corporation Programmable sigma-delta analog-to-digital converter
US7737724B2 (en) 2007-04-17 2010-06-15 Cypress Semiconductor Corporation Universal digital block interconnection and channel routing
US9720805B1 (en) 2007-04-25 2017-08-01 Cypress Semiconductor Corporation System and method for controlling a target device
US8266575B1 (en) 2007-04-25 2012-09-11 Cypress Semiconductor Corporation Systems and methods for dynamically reconfiguring a programmable system on a chip
US8065653B1 (en) 2007-04-25 2011-11-22 Cypress Semiconductor Corporation Configuration of programmable IC design elements
US8144126B2 (en) 2007-05-07 2012-03-27 Cypress Semiconductor Corporation Reducing sleep current in a capacitance sensing system
US9500686B1 (en) 2007-06-29 2016-11-22 Cypress Semiconductor Corporation Capacitance measurement system and methods
US8570053B1 (en) 2007-07-03 2013-10-29 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
US8089289B1 (en) 2007-07-03 2012-01-03 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
WO2009006556A1 (en) 2007-07-03 2009-01-08 Cypress Semiconductor Corporation Normalizing capacitive sensor array signals
US8169238B1 (en) * 2007-07-03 2012-05-01 Cypress Semiconductor Corporation Capacitance to frequency converter
US8049569B1 (en) 2007-09-05 2011-11-01 Cypress Semiconductor Corporation Circuit and method for improving the accuracy of a crystal-less oscillator having dual-frequency modes
US8525798B2 (en) 2008-01-28 2013-09-03 Cypress Semiconductor Corporation Touch sensing
US8487912B1 (en) 2008-02-01 2013-07-16 Cypress Semiconductor Corporation Capacitive sense touch device with hysteresis threshold
US8358142B2 (en) 2008-02-27 2013-01-22 Cypress Semiconductor Corporation Methods and circuits for measuring mutual and self capacitance
US8319505B1 (en) 2008-10-24 2012-11-27 Cypress Semiconductor Corporation Methods and circuits for measuring mutual and self capacitance
US9104273B1 (en) 2008-02-29 2015-08-11 Cypress Semiconductor Corporation Multi-touch sensing method
US8193822B2 (en) * 2009-02-12 2012-06-05 Silicon Laboratories Inc. System and method for determining capacitance value
CN102164780B (zh) * 2008-09-08 2014-05-14 株式会社自动网络技术研究所 车辆用电源装置
US8321174B1 (en) 2008-09-26 2012-11-27 Cypress Semiconductor Corporation System and method to measure capacitance of capacitive sensor array
US8497690B2 (en) * 2008-10-27 2013-07-30 Microchip Technology Incorporated Automated capacitive touch scan
US8487639B1 (en) 2008-11-21 2013-07-16 Cypress Semiconductor Corporation Receive demodulator for capacitive sensing
CN101477160B (zh) * 2009-01-20 2012-07-04 武汉电联电力电气技术有限公司 浮模差值高压电容器状态监测法及其装置
US8866500B2 (en) 2009-03-26 2014-10-21 Cypress Semiconductor Corporation Multi-functional capacitance sensing circuit with a current conveyor
US9448964B2 (en) 2009-05-04 2016-09-20 Cypress Semiconductor Corporation Autonomous control in a programmable system
US8362784B2 (en) * 2009-06-22 2013-01-29 Mitsubishi Electric Corporation Capacitor capacitance diagnosis device and electric power apparatus equipped with capacitor capacitance diagnosis device
US8854026B2 (en) 2009-06-25 2014-10-07 Telefonaktiebolaget L M Ericsson (Publ) Capacitance determination in a switched mode power supply
US8723827B2 (en) 2009-07-28 2014-05-13 Cypress Semiconductor Corporation Predictive touch surface scanning
KR20110031578A (ko) * 2009-09-21 2011-03-29 삼성전자주식회사 전자기기에서 모드 변경 감지 장치 및 방법
US8384559B2 (en) 2010-04-13 2013-02-26 Silicon Laboratories Inc. Sensor device with flexible interface and updatable information store
US8710853B2 (en) * 2010-08-31 2014-04-29 Infineon Technologies Ag Capacitance sensing
CN102385009B (zh) * 2010-09-01 2014-02-26 錞镱科技股份有限公司 电容量测装置及其方法
US8432172B2 (en) * 2010-10-12 2013-04-30 Brymen Technology Corporation Measuring apparatus and method for capacitor
CN101976306B (zh) * 2010-10-28 2014-06-25 惠州Tcl移动通信有限公司 用于计算电容器放电时间的方法及移动终端
CA2815205C (en) * 2010-11-01 2018-10-16 Capsenze Hb A method of measuring a capacitance and a use
US9268441B2 (en) 2011-04-05 2016-02-23 Parade Technologies, Ltd. Active integrator for a capacitive sense array
US8390384B1 (en) * 2011-11-21 2013-03-05 Microchip Technology Incorporated Precision on-board tuning of embedded microcontroller oscillator using charge time measurement unit
JP5867652B2 (ja) * 2012-05-30 2016-02-24 株式会社村田製作所 モジュールおよび容量検出方法
US8723586B1 (en) * 2012-11-02 2014-05-13 Atmel Corporation Charge measurement
CN106645981B (zh) * 2016-12-30 2019-08-27 上海东软载波微电子有限公司 电容容值测量电路
RU2670724C9 (ru) * 2017-12-11 2018-11-30 федеральное государственное бюджетное образовательное учреждение высшего образования "Ставропольский государственный аграрный университет" Микроконтроллерное устройство для измерения емкости
CN108181602B (zh) * 2018-01-30 2023-12-22 成都开谱电子科技有限公司 一种宽量程标准电容箱
CN108279395B (zh) * 2018-01-30 2024-01-26 成都开谱电子科技有限公司 一种高准确度十进制电容箱
CN108132451B (zh) * 2018-01-30 2024-01-26 成都开谱电子科技有限公司 一种宽量程标准电容箱
KR102407454B1 (ko) * 2018-06-29 2022-06-10 주식회사 엘지에너지솔루션 배터리 관리 시스템에 포함된 회로 기판을 테스트하기 위한 장치 및 방법
US20210041488A1 (en) * 2019-08-11 2021-02-11 Nuvoton Technology Corporation Measuring Input Capacitance with Automatic Test Equipment (ATE)
CN111090010A (zh) * 2019-12-26 2020-05-01 苏州市运泰利自动化设备有限公司 多路电容测试系统及方法
CN112485640B (zh) * 2020-11-18 2023-06-27 苏州华兴源创科技股份有限公司 内置电容器的检测方法、装置、检测设备和存储介质

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3761805A (en) * 1971-06-24 1973-09-25 Western Electric Co Methods of and systems for measuring capacitance using a constant current charging technique
US4243933A (en) * 1978-09-20 1981-01-06 Analogic Corporation Capacitance measurement apparatus
JPS55110961A (en) * 1979-02-19 1980-08-27 Matsushita Electric Ind Co Ltd Capacity measuring apparatus
US4825147A (en) 1988-09-14 1989-04-25 Sencore, Inc. Capacitance measuring method and apparatus
US5136251A (en) * 1988-09-23 1992-08-04 John Fluke Mfg. Co., Inc. Capacitance measurement
US5073757A (en) * 1988-09-23 1991-12-17 John Fluke Mfg. Co., Inc. Apparatus for and method of measuring capacitance of a capacitive element
US5469364A (en) * 1993-03-15 1995-11-21 Hughey; Bradley W. Apparatus and methods for measuring and detecting variations in the value of a capacitor
US5576628A (en) * 1994-09-30 1996-11-19 Telcom Semiconductor, Inc. Method and apparatus to measure capacitance
US6275047B1 (en) * 1999-03-12 2001-08-14 Fluke Corporation Capacitance measurement
US6191723B1 (en) * 1999-07-22 2001-02-20 Fluke Corporation Fast capacitance measurement

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414796B (zh) * 2010-08-26 2013-11-11 Brymen Technology Corp 電容量測裝置及其方法

Also Published As

Publication number Publication date
US6624640B2 (en) 2003-09-23
GB0202754D0 (en) 2002-03-27
GB2374943A (en) 2002-10-30
JP3624184B2 (ja) 2005-03-02
DE10204857A1 (de) 2003-08-14
GB2374943B (en) 2004-10-13
CN1369713A (zh) 2002-09-18
FR2820506B1 (fr) 2005-09-30
US20020140438A1 (en) 2002-10-03
FR2820506A1 (fr) 2002-08-09
DE10204857B4 (de) 2005-01-13
JP2002277495A (ja) 2002-09-25

Similar Documents

Publication Publication Date Title
CN1225658C (zh) 电容测量
US4825147A (en) Capacitance measuring method and apparatus
US7812619B2 (en) Capacitance measuring apparatus and capacitance measuring method
US6191723B1 (en) Fast capacitance measurement
US7148697B2 (en) System and method for measuring electrical characteristics of a capacitor
KR20140082752A (ko) 배터리의 충전 상태를 결정하는 시스템 및 방법
WO1997017829B1 (en) Variable voltage component tester
GB2237115A (en) Battery voltage detecting device
JPH025272B2 (ja)
CN111052611B (zh) 使用时基和电流源的模数转换器自测
US6356086B1 (en) Method and apparatus for the in-circuit testing of a capacitor
CN1651924A (zh) 用于测量电容器电容的装置
Yang A comparative study of supercapacitor capacitance characterization methods
US6469516B2 (en) Method for inspecting capacitors
US20240133939A1 (en) Methods for accelerating the insulation resistance measurement in an ungrounded power supply system
JP3583540B2 (ja) 容量性素子の等価直列抵抗測定方法および等価直列抵抗測定装置
CN115902372B (zh) 一种直流电压的测量方法、装置、电子设备及存储介质
Carminati et al. A contribution in partial discharge detection
CN114666962A (zh) 一种等离子体浓度确定方法、装置、电子设备及消毒装置
JP3293541B2 (ja) コンデンサの絶縁抵抗測定方法
US20100241398A1 (en) Time Interpolation with Time-Varying Waveforms
SU1698841A1 (ru) Способ неразрушающего контрол качества изол ции электротехнических изделий
US6504380B2 (en) Device and method for checking integrated capacitors
KR20160071564A (ko) Ups용 직렬 축전지 상태 진단 및 그 방법
CN105308866A (zh) 电容式感测系统和方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20051102

Termination date: 20200207