CN118829926A - 焦点调整方法、程序、装置 - Google Patents

焦点调整方法、程序、装置 Download PDF

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Publication number
CN118829926A
CN118829926A CN202280092856.9A CN202280092856A CN118829926A CN 118829926 A CN118829926 A CN 118829926A CN 202280092856 A CN202280092856 A CN 202280092856A CN 118829926 A CN118829926 A CN 118829926A
Authority
CN
China
Prior art keywords
images
focus
objective lens
adjustment method
focus adjustment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280092856.9A
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English (en)
Chinese (zh)
Inventor
星野哲朗
田本凉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of CN118829926A publication Critical patent/CN118829926A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • G02B7/38—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals measured at different points on the optical axis, e.g. focussing on two or more planes and comparing image data
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0088—Inverse microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/244—Devices for focusing using image analysis techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Focusing (AREA)
  • Automatic Focus Adjustment (AREA)
  • Studio Devices (AREA)
CN202280092856.9A 2022-03-02 2022-03-02 焦点调整方法、程序、装置 Pending CN118829926A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/008931 WO2023166624A1 (ja) 2022-03-02 2022-03-02 焦点調整方法、プログラム、装置

Publications (1)

Publication Number Publication Date
CN118829926A true CN118829926A (zh) 2024-10-22

Family

ID=87883207

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280092856.9A Pending CN118829926A (zh) 2022-03-02 2022-03-02 焦点调整方法、程序、装置

Country Status (5)

Country Link
US (1) US20250076626A1 (https=)
EP (1) EP4488738A4 (https=)
JP (2) JP7758151B2 (https=)
CN (1) CN118829926A (https=)
WO (1) WO2023166624A1 (https=)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04330411A (ja) * 1991-05-02 1992-11-18 Olympus Optical Co Ltd 自動合焦装置
JP3431300B2 (ja) * 1994-09-02 2003-07-28 オリンパス光学工業株式会社 顕微鏡用自動焦点検出装置
JP3863993B2 (ja) * 1998-03-18 2006-12-27 オリンパス株式会社 顕微鏡
JP2009180991A (ja) * 2008-01-31 2009-08-13 Nikon Corp 焦点調節装置及び顕微鏡装置
JP2020060602A (ja) 2018-10-04 2020-04-16 キヤノン株式会社 焦点調整装置およびその制御方法ならびにプログラム
JP7162842B2 (ja) * 2019-03-12 2022-10-31 株式会社Ｓｃｒｅｅｎホールディングス フォーカス調整方法、画像取得方法、および画像取得装置
EP4336238A4 (en) * 2021-07-19 2025-05-14 Hamamatsu Photonics K.K. Focal position estimation system, focal position estimation method, focal position estimation program, semiconductor inspection system and biological observation system
WO2023002678A1 (ja) * 2021-07-19 2023-01-26 浜松ホトニクス株式会社 特徴量出力モデル生成システム、特徴量出力モデル生成方法、特徴量出力モデル生成プログラム及び特徴量出力モデル

Also Published As

Publication number Publication date
JPWO2023166624A1 (https=) 2023-09-07
EP4488738A4 (en) 2026-01-07
JP7758151B2 (ja) 2025-10-22
JP2026010044A (ja) 2026-01-21
EP4488738A1 (en) 2025-01-08
WO2023166624A1 (ja) 2023-09-07
US20250076626A1 (en) 2025-03-06

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