CN118294990B - Test system and test method for navigation chip - Google Patents
Test system and test method for navigation chip Download PDFInfo
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Abstract
The invention discloses a test system and a test method for a navigation chip, wherein the system comprises test equipment, a signal source and at least one test bench group, wherein the test bench group comprises a decoding test bench and a positioning test bench, and is used for installing the navigation chip to be tested; the signal source is respectively connected with each decoding test bench through ports, and simultaneously and continuously transmits different analog satellite signals to the decoding test bench through different ports; the navigation chip to be tested on the decoding test bench receives the corresponding analog satellite signals and decodes the analog satellite signals, obtains decoded data to store and sends the decoded data to the test equipment through the decoding test bench; the test equipment verifies and positions the decoded data to obtain first positioning information; the navigation chip to be tested, which is arranged on the positioning test table, performs positioning calculation according to the stored decoding data, obtains second positioning information and sends the second positioning information to the test equipment through the positioning test table for positioning test verification; the system can effectively improve the testing efficiency of the navigation chip.
Description
Technical Field
The present invention relates to the field of chip testing, and in particular, to a testing system and a testing method for a navigation chip.
Background
The navigation chip is used for receiving satellite signals to decode and calculate the position of the navigation chip, so that the positioning function is realized. The navigation chip needs to be tested when leaving the factory to evaluate the functions and the precision of the navigation chip, and the test of the navigation chip needs a related analog signal source, for example, patent CN117630981a proposes a signal analog source device for satellite navigation chip verification and test, which comprises a carrier generator, a code generator, a noise generator, an interference generator, a signal generating module and a register read-write module; the signal generating module receives output signals of the carrier generator, the code generator, the noise generator and the interference generator, and generates a target intermediate frequency signal by combining register configuration of the register read-write module; the register read-write module is electrically connected with the CPU subsystem through the APB bus. By means of the analog source, the navigation chip can be provided with a relevant test signal.
For decoding and positioning test of the navigation chip, three different analog satellite signals are needed to be provided, the navigation chip receives the three analog satellite signals, the position information and the ranging code of the satellite are obtained through decoding, and the distance between the navigation chip and the analog satellite is obtained through calculation according to the ranging code. And then the longitude and latitude of the navigation chip can be accurately obtained through the calculation of the longitude and latitude (the satellite position is fixed) of the three simulated satellites.
In the prior art, for testing of a lot of navigation chips, a plurality of navigation chips to be tested are respectively installed on a plurality of test stations, a signal source firstly generates a first path of analog satellite signal and sends the first path of analog satellite signal to each navigation chip to be tested, each navigation chip to be tested decodes the first path of analog satellite signal and then stores and sends the first path of analog satellite signal to test equipment, then the signal source generates a second path of analog satellite signal and then stores and sends the second path of analog satellite signal to test equipment, then the signal source generates a third path of analog satellite signal and sends the third path of analog satellite signal to each navigation chip to be tested, each navigation chip to be tested decodes the third path of analog satellite signal and then stores and sends the third path of analog satellite signal to test equipment, each navigation chip to be tested moves to a next test station to conduct positioning solution after decoding the three paths of analog satellite signals, and the test equipment conducts positioning solution after receiving three paths of decoding data. In addition, the test equipment needs to perform positioning calculation at the same time after receiving the three paths of decoding signals in batches, so that the calculated amount is large, the calculation time is increased, and the test efficiency is reduced.
Disclosure of Invention
The invention provides a test system and a test method for a navigation chip, which can effectively improve the test efficiency of the navigation chip.
The test system for the navigation chip comprises test equipment, a signal source and at least one test bench group, wherein the test bench group comprises a decoding test bench and a positioning test bench and is used for installing the navigation chip to be tested; the signal source is respectively connected with each decoding test bench through ports, and simultaneously and continuously transmits different analog satellite signals to the decoding test bench through different ports; the navigation chip to be tested, which is arranged on the decoding test bench, receives the corresponding analog satellite signals and decodes the analog satellite signals, obtains decoded data to store the decoded data and sends the decoded data to the test equipment through the decoding test bench; the test equipment verifies and performs positioning calculation on the decoded data to obtain first positioning information; and the navigation chip to be tested, which is arranged on the positioning test table, performs positioning calculation according to the stored decoding data, obtains second positioning information and sends the second positioning information to the test equipment through the positioning test table for positioning test verification.
Further, the system further comprises a carrying device, wherein the carrying device is used for carrying the navigation chips to be tested to the corresponding decoding test tables in sequence according to the test sequence to carry out decoding test, and carrying the navigation chips to be tested which are positioned on the decoding test tables and finish the decoding test to the positioning test tables in sequence.
Further, the test device is connected with the signal source and is used for controlling the signal source to simultaneously and continuously send different analog satellite signals to the decoding test bench through different ports.
Further, each navigation chip to be tested decodes three paths of analog satellite signals respectively, and the test equipment verifies three paths of decoding data corresponding to the same navigation chip to be tested;
and the testing equipment and the navigation chip to be tested respectively obtain first positioning information and second positioning information by performing positioning calculation according to the decoding data of the three paths of analog satellite signals.
Further, the decoding test bench comprises a first decoding test bench, a second decoding test bench and a third decoding test bench, and the signal source comprises a first port, a second port and a third port;
the signal source generates a first analog satellite signal, a second analog satellite signal and a third analog satellite signal at the same time, and the first analog satellite signal, the second analog satellite signal and the third analog satellite signal are respectively sent to the first decoding test bench, the second decoding test bench and the third decoding test bench through the first port, the second port and the third port;
The carrying device carries the navigation chip to be tested to a first decoding test board, the navigation chip to be tested receives the first analog satellite signal to decode, generates first decoding data to store and sends the first decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the first decoding test table to a second decoding test table, the navigation chip to be tested receives the second analog satellite signal for decoding, generates second decoding data for storage and sends the second decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the second decoding test table to a third decoding test table, and the navigation chip to be tested receives the third analog satellite signal for decoding, generates third decoding data for storage and sends the third decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the third decoding test table to the positioning test table, and the navigation chip to be tested calculates and obtains second positioning information according to the stored first decoding data, second decoding data and third decoding data and sends the second positioning information to the test equipment.
Further, after the carrying device carries the first navigation chip to be tested on the first decoding test table to the second decoding test table, the second navigation chip to be tested is carried to the first decoding test table to decode, send and store the first analog satellite signal;
After the first navigation chip to be tested and the second navigation chip to be tested respectively finish decoding, sending and storing the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to a third decoding test table, carries the second navigation chip to be tested to the second decoding test table, and carries the third navigation chip to be tested to the first decoding test table;
after the first navigation chip to be tested, the second navigation chip to be tested and the third navigation chip to be tested respectively finish decoding, transmitting and storing of the third analog satellite signal, the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to the positioning test table, carries the second navigation chip to be tested to the third decoding test table, carries the third navigation chip to be tested to the second decoding test table, and carries the fourth navigation chip to be tested to the first decoding test table.
The test method for the navigation chip is applied to the system, and comprises the following steps:
the signal source simultaneously and continuously transmits different analog satellite signals to the decoding test bench through different ports;
The navigation chip to be tested receives the corresponding analog satellite signals through the decoding test board and decodes the analog satellite signals, obtains decoded data, stores the decoded data and sends the decoded data to the test equipment;
The test equipment verifies and positions the decoded data to obtain first positioning information;
And the navigation chip to be tested performs positioning calculation according to the stored decoding data, obtains second positioning information and sends the second positioning information to the testing equipment through the positioning test table for positioning test verification.
Further, the system further comprises a handling device, the method further comprising:
the carrying device carries the navigation chips to be tested to the corresponding decoding test tables in sequence according to the test sequence to carry out decoding test, and carries the navigation chips to be tested which are positioned on the decoding test tables and finish the decoding test to the positioning test tables in sequence.
Further, the decoding test bench comprises a first decoding test bench, a second decoding test bench and a third decoding test bench, and the signal source comprises a first port, a second port and a third port;
the signal source generates a first analog satellite signal, a second analog satellite signal and a third analog satellite signal at the same time, and the first analog satellite signal, the second analog satellite signal and the third analog satellite signal are respectively sent to the first decoding test bench, the second decoding test bench and the third decoding test bench through the first port, the second port and the third port;
The handling device carries the navigation chips to be tested to the corresponding decoding test tables in sequence according to the test sequence to carry out decoding test, and carries the navigation chips to be tested which are positioned on the decoding test tables and finish the decoding test to the positioning test tables in sequence, and the handling device comprises:
The carrying device carries the navigation chip to be tested to a first decoding test board, the navigation chip to be tested receives the first analog satellite signal to decode, generates first decoding data to store and sends the first decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the first decoding test table to a second decoding test table, the navigation chip to be tested receives the second analog satellite signal for decoding, generates second decoding data for storage and sends the second decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the second decoding test table to a third decoding test table, and the navigation chip to be tested receives the third analog satellite signal for decoding, generates third decoding data for storage and sends the third decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the third decoding test table to the positioning test table, and the navigation chip to be tested calculates and obtains second positioning information according to the stored first decoding data, second decoding data and third decoding data and sends the second positioning information to the test equipment.
Further, after the carrying device carries the first navigation chip to be tested on the first decoding test table to the second decoding test table, the second navigation chip to be tested is carried to the first decoding test table to decode, send and store the first analog satellite signal;
After the first navigation chip to be tested and the second navigation chip to be tested respectively finish decoding, sending and storing the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to a third decoding test table, carries the second navigation chip to be tested to the second decoding test table, and carries the third navigation chip to be tested to the first decoding test table;
after the first navigation chip to be tested, the second navigation chip to be tested and the third navigation chip to be tested respectively finish decoding, transmitting and storing of the third analog satellite signal, the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to the positioning test table, carries the second navigation chip to be tested to the third decoding test table, carries the third navigation chip to be tested to the second decoding test table, and carries the fourth navigation chip to be tested to the first decoding test table.
The test system and the test method for the navigation chip provided by the invention at least comprise the following beneficial effects:
(1) The method can simultaneously perform decoding and positioning test on batches of navigation chips, a signal source does not need to switch signals, the test time is effectively reduced under the condition that other equipment is not added, the test efficiency is improved, and the production cost is effectively reduced;
(2) The designed signal source introduces Doppler delay information, and provides more accurate analog satellite signals for testing, thereby improving the accuracy of testing.
Drawings
Fig. 1 is a schematic structural diagram of an embodiment of a test system for a navigation chip according to the present invention.
Fig. 2 is a schematic structural diagram of an embodiment of a signal source in a test system for a navigation chip according to the present invention.
Fig. 3 is a schematic structural diagram of another embodiment of a test system for a navigation chip according to the present invention.
Fig. 4 is a flowchart of an embodiment of a testing method for a navigation chip according to the present invention.
Detailed Description
In order to better understand the above technical solutions, the following detailed description will be given with reference to the accompanying drawings and specific embodiments.
Referring to fig. 1, in some embodiments, a test system for a navigation chip is provided, comprising a test device 1, a signal source 2, and at least one test bench set3, the test bench set3 comprising a decoding test bench 31 and a positioning test bench 32 for mounting a navigation chip to be tested; the signal sources are respectively connected with each decoding test bench 31 through ports, and simultaneously and continuously transmit different analog satellite signals to the decoding test bench 31 through different ports; the navigation chip to be tested, which is arranged on the decoding test bench 31, receives the corresponding analog satellite signals and decodes the analog satellite signals, obtains decoded data to store the decoded data and sends the decoded data to the test equipment through the decoding test bench 31; the test equipment 1 verifies and performs positioning calculation on the decoded data to obtain first positioning information; the navigation chip to be tested, which is installed on the positioning test bench 32, performs positioning calculation according to the stored decoding data, obtains second positioning information, and sends the second positioning information to the test equipment 1 through the positioning test bench 32 for positioning test verification.
Specifically, the test apparatus 1 may be an ATE (Automatic Test Equipment, integrated circuit automatic test equipment), and the number of test bench groups 3 may be determined according to the actual requirements and the number of interfaces of the signal source 2 and the test apparatus 1.
Specifically, referring to fig. 2, the signal source 2 includes a spreading modulation module 201, an observation data conversion module 202, a spreading code digital controlled oscillator 203, a carrier spreading code digital controlled oscillator 204, a spreading code generation module 205, a digital baseband filtering module 206, a doppler modulation module 207, a frequency conversion module 208, a frequency hopping point generation module 209, a frequency hopping output module 210 and a radio frequency output module 211, where the observation data conversion module 201 is configured to receive observation data required for a test generated by a data simulation system, perform parameter conversion, generate a spreading code dynamic observation variable and a carrier dynamic observation variable, send the spreading code dynamic observation variable to the spreading code digital controlled oscillator 203, and control the spreading code digital controlled oscillator 203 to generate a spreading code with a corresponding rate and send the spreading code to the spreading modulation module 201; the carrier dynamic observation variable is sent to the carrier spread spectrum code digital controlled oscillator 204, on the other hand, the carrier spread spectrum code digital controlled oscillator 204 also receives carrier frequency hopping information (including the number of frequency hopping points and the hopping speed) generated by the frequency hopping frequency point generating module 209, and the carrier spread spectrum code digital controlled oscillator 204 generates carrier Doppler information according to the carrier dynamic observation variable and the carrier frequency hopping information and sends the carrier Doppler information to the Doppler modulating module 207; the spread spectrum modulation module 201 receives the ranging message data required by the test generated by the data simulation system and the spread spectrum code generated by the spread spectrum code digital control oscillator 203, the spread spectrum code is utilized to perform direct sequence spread spectrum modulation on the ranging message data, a spread spectrum modulation signal is generated and sent to the digital baseband filtering module 206, the digital baseband filtering module 206 generates a baseband signal based on the spread spectrum modulation signal and performs spurious filtering, and sends the baseband signal to the Doppler modulation module 207, the Doppler modulation module 207 performs Doppler modulation based on the received carrier Doppler information and the baseband signal, a Doppler modulation signal is generated and sent to the frequency conversion module 208, the frequency conversion module 208 performs up-conversion and analog-digital conversion on the received Doppler modulation signal to generate a required intermediate frequency signal, and the required intermediate frequency signal is sent to the radio frequency output module 211; the frequency hopping output module 210 receives the carrier frequency hopping information generated by the frequency hopping point generating module 209, generates a frequency hopping signal and sends the frequency hopping signal to the radio frequency output module 211; the rf output module 211 performs frequency hopping modulation and up-conversion processing according to the frequency hopping signal and the intermediate frequency signal, and generates an rf analog test signal, i.e., an analog satellite signal.
The analog satellite signal received by the navigation chip is added with some time-varying time delay, the expression of the ranging message data is assumed to be C (T), the modulated spreading code is S (T), and the total time delay τ (T) comprises a path time delay T d and a Doppler time delay τ d, namely τ (T) =T d+τd; assuming that the initial phase of the carrier wave is 0, adding time delay tau (t) into the spreading modulation module 201 by the generated ranging message data C (t) and spreading code S (t), generating Doppler information omega c tau (t) by the carrier spreading code numerical control oscillator 204, dividing a baseband signal into two paths to respectively perform Doppler modulation with cos [ omega c tau (t) ] and sin [ omega c tau (t) ] in the Doppler modulation module 207, and sending the Doppler information omega c tau (t) into an intermediate frequency signal generated by the frequency conversion module 208 to be:
；（1）
where D (t) is an intermediate frequency signal generated by the frequency conversion module 208, pt is the power of the intermediate frequency signal, t represents the current time, Ranging message data representing the joining delay,The spreading code, ω c, represents the carrier angular frequency, which represents the added delay.
The frequency hopping signal output by the frequency hopping output module 210 is cos (ω h t), and the radio frequency analog test signal generated by the radio frequency output module 211 is D (t) cos (ω h t).
The distance measurement message data comprise distance measurement codes and navigation messages, and the simulated satellite position information and the satellite-to-ground distance information can be obtained by decoding the distance measurement message data.
Further, the system in the above embodiment further includes a handling device 4, configured to sequentially handle the navigation chips to be tested to the corresponding decoding test platform 31 according to the test sequence for decoding test, and sequentially handle the navigation chips to be tested, which are located on the decoding test platform and complete the decoding test, to the positioning test platform 32. After the positioning test is performed by the positioning test bench 32, the handling device 4 removes the navigation chip from the positioning test bench 32.
Further, the testing device 1 is connected with the signal source 2, and is used for controlling the signal source 2 to simultaneously and continuously send different analog satellite signals to the decoding test bench through different ports;
the navigation chip to be tested decodes the received analog satellite signals, and the obtained decoding data comprises satellite position information and satellite-to-ground distance information.
Each navigation chip to be tested decodes three paths of analog satellite signals respectively, and the test equipment 1 verifies the corresponding three paths of decoding data of the same navigation chip to be tested, namely, verifies whether the decoding data are correct;
And the testing equipment 1 and the navigation chip to be tested perform positioning calculation according to the decoding data of the three paths of analog satellite signals to obtain first positioning information and second positioning information.
Specifically, the test device 1 sends a control command to the signal source 2, the signal source 2 generates different multipath analog satellite signals according to the control command, the different multipath analog satellite signals are respectively sent to the decoding test board through different ports, the test device 1 controls the navigation chip on the decoding test board to be in a decoding state, receives decoding data of the navigation chip, verifies and performs positioning calculation on the decoding data to obtain a verification result and first positioning information, controls the navigation chip on the positioning test board to be in a positioning calculation state, the navigation chip on the positioning test board performs positioning calculation according to the decoding data to obtain second positioning information, the test device 1 compares the first positioning information with the second positioning information to determine a test result, and the navigation chip passes the test only when all the decoding data and positioning calculation are correct.
Referring to fig. 3, in some embodiments, the decoding test station 31 includes a first decoding test station 31a, a second decoding test station 31b, and a third decoding test station 31c, and the signal source 2 includes a first port, a second port, and a third port;
The first port, the second port, and the third port are configured to send the first analog satellite signal, the second analog satellite signal, and the third analog satellite signal generated by the signal source to the first decoding test board 31a, the second decoding test board 31b, and the third decoding test board 31c, where the first decoding test board 31a, the second decoding test board 31b, and the third decoding test board 31c are configured to receive a decoding control signal from the test device, and the navigation chip to be tested placed on the first decoding test board 31a, the second decoding test board 31b, and the third decoding test board 31c performs a decoding operation according to the decoding control signal.
The signal source 2 generates a first analog satellite signal, a second analog satellite signal and a third analog satellite signal simultaneously, and sends the signals to the first decoding test bench 31a, the second decoding test bench 31b and the third decoding test bench 31c through the first port, the second port and the third port respectively; in the test process, the first analog satellite signal, the second analog satellite signal and the third analog satellite signal are continuously transmitted to the first decoding test station 31a, the second decoding test station 31b and the third decoding test station 31c through the first port, the second port and the third port.
The carrying device 4 carries the navigation chip to be tested to a first decoding test table 31a, the navigation chip to be tested receives the first analog satellite signal to decode, generates first decoding data to store and send to the test equipment 1, and the test equipment 1 verifies and stores the first decoding data of the navigation chip to be tested;
the handling device 4 carries the navigation chip to be tested on the second decoding test table 31b to the third decoding test table 31c, and the navigation chip to be tested receives the third analog satellite signal for decoding, generates third decoding data for storage and sends the third decoding data to the test equipment 1;
The handling device 4 handles the navigation chip to be tested on the third decoding test table 31c to the positioning test table 32, and the navigation chip to be tested calculates and obtains the second positioning information according to the stored first decoding data, second decoding data and third decoding data and sends the second positioning information to the test equipment 1.
Further, after the carrying device 4 carries the first navigation chip to be tested on the first decoding test table 31a to the second decoding test table 31b, the second navigation chip to be tested is carried to the first decoding test table 31a for decoding, transmitting and storing the first analog satellite signal;
After the first to-be-tested navigation chip and the second to-be-tested navigation chip respectively complete decoding, sending and storing of the second analog satellite signal and the first analog satellite signal, the carrying device 4 carries the first to-be-tested navigation chip to the third decoding test table 31c, carries the second to-be-tested navigation chip to the second decoding test table 31b, and carries the third to-be-tested navigation chip to the first decoding test table 31a;
After the first to-be-tested navigation chip, the second to-be-tested navigation chip and the third to-be-tested navigation chip respectively complete decoding, transmitting and storing of the third analog satellite signal, the second analog satellite signal and the first analog satellite signal, the handling device 4 handles the first to-be-tested navigation chip to the positioning test bench 32, the second to-be-tested navigation chip to the third decoding test bench 31c, the third to-be-tested navigation chip to the second decoding test bench 31b, the fourth to-be-tested navigation chip to the first decoding test bench 31a, and so on.
Because the first analog satellite signal, the second analog satellite signal and the third analog satellite signal are continuously transmitted through different ports without switching, no signal establishment time exists, and the test decoding time of each navigation chip is 100ms and the carrying time is 100ms by adopting one test bench group to test 4 navigation chips, and the test time of each navigation chip is 200m. If the prior art is adopted to test 4 navigation chips, the time for establishing a first analog satellite signal is 100ms, the time for testing and decoding is 100ms, the time for establishing a second analog satellite signal is 100ms, the time for testing and decoding is 100ms, the time for establishing a third analog satellite signal is 100ms, the time for testing and decoding is 100ms, the carrying time is 400ms, the positioning test is 100ms, the total test time is 1100ms, namely the test time of a single navigation chip is 275ms, and the test efficiency is improved by 37.5% under the condition of not increasing the investment of other equipment.
Referring to fig. 4, in some embodiments, a test method for a navigation chip is provided, and is applied to the above system, the method includes:
S1, a signal source simultaneously and continuously transmits different analog satellite signals to a decoding test board through different ports;
s2, the navigation chip to be tested receives the corresponding analog satellite signals through the decoding test board and decodes the analog satellite signals, obtains decoded data, stores the decoded data and sends the decoded data to the test equipment;
s3, the test equipment verifies and performs positioning calculation on the decoded data to obtain first positioning information;
and S4, positioning calculation is carried out on the navigation chip to be tested according to the stored decoding data, and second positioning information is obtained and sent to the testing equipment through the positioning test table for positioning test verification.
Wherein the system further comprises a handling device, the method further comprising:
the carrying device carries the navigation chips to be tested to the corresponding decoding test tables in sequence according to the test sequence to carry out decoding test, and carries the navigation chips to be tested which are positioned on the decoding test tables and finish the decoding test to the positioning test tables in sequence.
The decoding test bench comprises a first decoding test bench, a second decoding test bench and a third decoding test bench, and the signal source comprises a first port, a second port and a third port;
the signal source generates a first analog satellite signal, a second analog satellite signal and a third analog satellite signal at the same time, and the first analog satellite signal, the second analog satellite signal and the third analog satellite signal are respectively sent to the first decoding test bench, the second decoding test bench and the third decoding test bench through the first port, the second port and the third port;
The handling device carries the navigation chip to be tested to the corresponding decoding test bench in sequence according to the test sequence to carry out decoding test, and carries the navigation chip to be tested which is positioned on the decoding test bench and completes the decoding test to the positioning test bench in sequence, and the handling device comprises:
The carrying device carries the navigation chip to be tested to a first decoding test board, the navigation chip to be tested receives the first analog satellite signal to decode, generates first decoding data to store and sends the first decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the first decoding test table to a second decoding test table, the navigation chip to be tested receives the second analog satellite signal for decoding, generates second decoding data for storage and sends the second decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the second decoding test table to a third decoding test table, and the navigation chip to be tested receives the third analog satellite signal for decoding, generates third decoding data for storage and sends the third decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the third decoding test table to the positioning test table, and the navigation chip to be tested calculates and obtains second positioning information according to the stored first decoding data, second decoding data and third decoding data and sends the second positioning information to the test equipment.
After the carrying device carries the first navigation chip to be tested on the first decoding test table to the second decoding test table, the second navigation chip to be tested is carried to the first decoding test table to decode, send and store the first analog satellite signal;
After the first navigation chip to be tested and the second navigation chip to be tested respectively finish decoding, sending and storing the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to a third decoding test table, carries the second navigation chip to be tested to the second decoding test table, and carries the third navigation chip to be tested to the first decoding test table;
After the first to-be-tested navigation chip, the second to-be-tested navigation chip and the third to-be-tested navigation chip respectively finish decoding, transmitting and storing of the third analog satellite signal, the second analog satellite signal and the first analog satellite signal, the carrying device carries the first to-be-tested navigation chip to the positioning test table, carries the second to-be-tested navigation chip to the third decoding test table, carries the first to-be-tested navigation chip to the second decoding test table, and carries the fourth to-be-tested navigation chip to the first decoding test table.
The specific working principle is referred to the system embodiment and will not be described herein.
The test system and method for the navigation chip provided by the embodiment at least comprise the following beneficial effects:
(1) The method can simultaneously perform decoding and positioning test on batches of navigation chips, a signal source does not need to switch signals, the test time is effectively reduced under the condition that other equipment is not added, the test efficiency is improved, and the production cost is effectively reduced;
(2) The designed signal source introduces Doppler delay information, and provides more accurate analog satellite signals for testing, thereby improving the accuracy of testing.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the invention. It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (6)
1. The test system for the navigation chip is characterized by comprising test equipment, a signal source and at least one test bench group, wherein the test bench group comprises a decoding test bench and a positioning test bench and is used for installing the navigation chip to be tested; the signal source is respectively connected with each decoding test bench through ports, and simultaneously and continuously transmits different analog satellite signals to the decoding test bench through different ports; the navigation chip to be tested, which is arranged on the decoding test bench, receives the corresponding analog satellite signals and decodes the analog satellite signals, obtains decoded data to store the decoded data and sends the decoded data to the test equipment through the decoding test bench; the test equipment verifies and performs positioning calculation on the decoded data to obtain first positioning information; the navigation chip to be tested, which is arranged on the positioning test table, performs positioning calculation according to the stored decoding data, obtains second positioning information and sends the second positioning information to the test equipment through the positioning test table for positioning test verification;
the system also comprises a carrying device, a positioning test table and a positioning test table, wherein the carrying device is used for carrying the navigation chips to be tested to the corresponding decoding test tables in sequence according to the test sequence to carry out decoding test, and carrying the navigation chips to be tested which are positioned on the decoding test tables and finish the decoding test to the positioning test tables in sequence;
the decoding test bench comprises a first decoding test bench, a second decoding test bench and a third decoding test bench, and the signal source comprises a first port, a second port and a third port;
the signal source generates a first analog satellite signal, a second analog satellite signal and a third analog satellite signal at the same time, and the first analog satellite signal, the second analog satellite signal and the third analog satellite signal are respectively sent to the first decoding test bench, the second decoding test bench and the third decoding test bench through the first port, the second port and the third port;
The carrying device carries the navigation chip to be tested to a first decoding test board, the navigation chip to be tested receives the first analog satellite signal to decode, generates first decoding data to store and sends the first decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the first decoding test table to a second decoding test table, the navigation chip to be tested receives the second analog satellite signal for decoding, generates second decoding data for storage and sends the second decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the second decoding test table to a third decoding test table, and the navigation chip to be tested receives the third analog satellite signal for decoding, generates third decoding data for storage and sends the third decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the third decoding test table to the positioning test table, and the navigation chip to be tested calculates and obtains second positioning information according to the stored first decoding data, second decoding data and third decoding data and sends the second positioning information to the test equipment.
2. The system of claim 1, wherein the test equipment is coupled to the signal source for controlling the signal source to simultaneously and continuously transmit different analog satellite signals to the decoding test station through different ports.
3. The system of claim 2, wherein each of the navigation chips to be tested decodes three-way analog satellite signals, and the test device performs verification of corresponding three-way decoded data for the same navigation chip to be tested;
and the testing equipment and the navigation chip to be tested respectively obtain first positioning information and second positioning information by performing positioning calculation according to the decoding data of the three paths of analog satellite signals.
4. The system of claim 1, wherein the handling device is configured to handle the second navigation chip to be tested to the first decoding test station for decoding, transmitting and storing the first analog satellite signal after handling the first navigation chip to be tested on the first decoding test station to the second decoding test station;
After the first navigation chip to be tested and the second navigation chip to be tested respectively finish decoding, sending and storing the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to a third decoding test table, carries the second navigation chip to be tested to the second decoding test table, and carries the third navigation chip to be tested to the first decoding test table;
after the first navigation chip to be tested, the second navigation chip to be tested and the third navigation chip to be tested respectively finish decoding, transmitting and storing of the third analog satellite signal, the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to the positioning test table, carries the second navigation chip to be tested to the third decoding test table, carries the third navigation chip to be tested to the second decoding test table, and carries the fourth navigation chip to be tested to the first decoding test table.
5. A test method for a navigation chip, applied to the system of any one of claims 1-4, the method comprising:
the signal source simultaneously and continuously transmits different analog satellite signals to the decoding test bench through different ports;
The navigation chip to be tested receives the corresponding analog satellite signals through the decoding test board and decodes the analog satellite signals, obtains decoded data, stores the decoded data and sends the decoded data to the test equipment;
The test equipment verifies and positions the decoded data to obtain first positioning information;
The navigation chip to be tested performs positioning calculation according to the stored decoding data, obtains second positioning information and sends the second positioning information to the testing equipment through a positioning test table for positioning test verification; the system further comprises a handling device, the method further comprising:
The carrying device carries the navigation chips to be tested to the corresponding decoding test tables in sequence according to the test sequence to carry out decoding test, and carries the navigation chips to be tested which are positioned on the decoding test tables and finish the decoding test to the positioning test tables in sequence;
the decoding test bench comprises a first decoding test bench, a second decoding test bench and a third decoding test bench, and the signal source comprises a first port, a second port and a third port;
the signal source generates a first analog satellite signal, a second analog satellite signal and a third analog satellite signal at the same time, and the first analog satellite signal, the second analog satellite signal and the third analog satellite signal are respectively sent to the first decoding test bench, the second decoding test bench and the third decoding test bench through the first port, the second port and the third port;
The handling device carries the navigation chips to be tested to the corresponding decoding test tables in sequence according to the test sequence to carry out decoding test, and carries the navigation chips to be tested which are positioned on the decoding test tables and finish the decoding test to the positioning test tables in sequence, and the handling device comprises:
The carrying device carries the navigation chip to be tested to a first decoding test board, the navigation chip to be tested receives the first analog satellite signal to decode, generates first decoding data to store and sends the first decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the first decoding test table to a second decoding test table, the navigation chip to be tested receives the second analog satellite signal for decoding, generates second decoding data for storage and sends the second decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the second decoding test table to a third decoding test table, and the navigation chip to be tested receives the third analog satellite signal for decoding, generates third decoding data for storage and sends the third decoding data to the test equipment;
The carrying device carries the navigation chip to be tested on the third decoding test table to the positioning test table, and the navigation chip to be tested calculates and obtains second positioning information according to the stored first decoding data, second decoding data and third decoding data and sends the second positioning information to the test equipment.
6. The method of claim 5, wherein the handling device handles the first navigation chip to be tested on the first decoding test station to the second decoding test station, and then handles the second navigation chip to be tested to the first decoding test station for decoding, transmitting and storing the first analog satellite signal;
After the first navigation chip to be tested and the second navigation chip to be tested respectively finish decoding, sending and storing the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to a third decoding test table, carries the second navigation chip to be tested to the second decoding test table, and carries the third navigation chip to be tested to the first decoding test table;
after the first navigation chip to be tested, the second navigation chip to be tested and the third navigation chip to be tested respectively finish decoding, transmitting and storing of the third analog satellite signal, the second analog satellite signal and the first analog satellite signal, the carrying device carries the first navigation chip to be tested to the positioning test table, carries the second navigation chip to be tested to the third decoding test table, carries the third navigation chip to be tested to the second decoding test table, and carries the fourth navigation chip to be tested to the first decoding test table.
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