CN108427127A - The test method and device of baseband chip performance - Google Patents

Abstract

The present invention provides a kind of test method and device of baseband chip performance, and this method includes：When baseband chip to be tested tracks default satellite, the location information of the operating voltage value of baseband chip to be tested and the output of working current value and baseband chip to be tested in preset time period is acquired, location information is location coordinate information of the ship according to the ship of the default course line different moments that baseband chip to be tested exports when driving within a preset period of time；According to the operating voltage value and working current value of baseband chip to be tested, the power consumption of baseband chip to be tested is obtained；According to the location information in location information and default course line, the positioning accuracy of baseband chip to be tested is obtained.Power consumption and positioning performance, selection in practical application baseband chip of the present invention in the normal satellite tracking of acquisition baseband chip provide foundation.

Description

Method and device for testing performance of baseband chip

technical field

The invention relates to the field of electronic technology, in particular to a method and device for testing the performance of a baseband chip.

Background technique

Due to the particularity of the nautical environment, ship-borne navigation equipment has higher requirements in terms of reliability, shockproof, moisture-proof, high-temperature resistance, and direct-light protection than navigation equipment in ordinary environments. Therefore, ship-borne equipment needs to pass through Unified and strict testing, adopting international unified measurement standards and meeting the required test results can be installed on the ship.

The main component of shipborne navigation equipment is the baseband chip, and its power consumption affects the service life of the navigation equipment, which in turn affects the navigation performance of the entire ship. In addition, the positioning accuracy of the baseband chip directly affects the operation of the ship. Ships operate at sea for a long time, and it is even more necessary for the baseband chip to have lower power consumption when it can achieve a certain positioning accuracy. Therefore, it is necessary to test the power consumption and positioning performance of the baseband chip before it is used. However, there are few disclosures in the prior art about the test methods for the power consumption and positioning performance of the entire baseband chip.

Contents of the invention

The invention provides a method and device for testing the performance of a baseband chip. The power consumption and positioning performance of the baseband chip when it normally tracks satellites is obtained, which provides a basis for the selection of the baseband chip in practical applications.

A first aspect of the present invention provides a method for testing the performance of a baseband chip. The baseband chip to be tested is arranged on a test board, and the test board is arranged on a ship; the method includes:

When the baseband chip to be tested is tracked to a preset satellite, the operating voltage value and the operating current value of the baseband chip to be tested and the position information output by the baseband chip to be tested within a preset time period are collected, the position information The location coordinate information of the ship at different times output by the baseband chip to be tested when the ship travels according to the preset route within the preset time period;

Acquiring the power consumption of the baseband chip to be tested according to the operating voltage value and the operating current value of the baseband chip to be tested;

Acquiring the positioning accuracy of the baseband chip to be tested according to the position information and the position information in the preset route.

Optionally, the collection of the operating voltage value and operating current value of the baseband chip to be tested within the preset time period includes:

Collecting a plurality of instantaneous operating voltage values of the baseband chip to be tested within the preset time period and operating current values corresponding to each of the instantaneous operating voltage values;

According to the operating voltage value and the operating current value of the baseband chip to be tested, the power consumption of the baseband chip to be tested is obtained, including:

Acquire the power consumption of the baseband chip to be tested according to the multiple instantaneous operating voltage values of the baseband chip to be tested and the operating current values corresponding to each of the instantaneous operating voltage values.

Optionally, the acquiring the power consumption of the baseband chip to be tested according to the multiple instantaneous operating voltage values of the baseband chip to be tested and the operating current values corresponding to each of the instantaneous operating voltage values includes:

Obtain an average operating current value according to the operating current value corresponding to each of the instantaneous operating voltage values;

According to each of the instantaneous operating voltage values and the average operating current value, the instantaneous power consumption corresponding to each of the instantaneous operating voltage values is obtained;

According to each of the instantaneous power consumptions, the average power consumption of the baseband chip to be tested is obtained.

Optionally, the preset satellites tracked by the baseband chip to be tested include: Beidou-2 BD-2 satellite and global positioning GPS satellite.

Optionally, the BD-2 satellite includes:

Satellites in geosynchronous orbit GEO, satellites in inclined geosynchronous orbit IGSO and satellites in medium earth orbit MEO;

Wherein, the precision of the baseband chip to be tested for tracking the satellite position is PDOP≤8.

Optionally, the collecting position information output by the baseband chip to be tested within a preset time period includes:

Under preset test conditions, collecting position information output by the baseband chip to be tested within the preset time period;

Wherein, the preset test conditions include: the maximum speed of the ship does not exceed 30m/s, the maximum acceleration does not exceed 0.5m/s ² , and the maximum rate of change of acceleration does not exceed 0.05m/s ³ .

Optionally, the preset test conditions further include: the baseband chip to be tested outputs a frequency point signal corresponding to a BD-2 satellite and a frequency point signal corresponding to a GPS satellite;

Satellite orbit, satellite clock error, ionospheric delay and tropospheric delay are set to no time-varying error mode.

A second aspect of the present invention provides a test device for baseband chip performance, the baseband chip to be tested is arranged on a test board, and the test board is arranged on a ship; the device includes:

A collection module, configured to collect the operating voltage value and operating current value of the baseband chip to be tested and the position information output by the baseband chip to be tested within a preset time period when the baseband chip to be tested tracks a preset satellite , the position information is the position coordinate information of the ship at different times output by the baseband chip to be tested when the ship travels according to a preset route within the preset time period;

A first acquisition module, configured to acquire the power consumption of the baseband chip to be tested according to the operating voltage value and the operating current value of the baseband chip to be tested;

The second acquiring module is configured to acquire the positioning accuracy of the baseband chip to be tested according to the position information and the position information in the preset route.

A third aspect of the present invention provides a method and device for testing the performance of a baseband chip, including: at least one processor and a memory;

the memory stores computer-executable instructions;

The at least one processor executes the computer-executed instructions stored in the memory, so that the baseband chip performance testing device executes the above-mentioned baseband chip performance testing method.

A fourth aspect of the present invention provides a computer-readable storage medium, where computer-executable instructions are stored on the computer-readable storage medium, and when the computer-executable instructions are executed by a processor, the above method for testing the performance of a baseband chip is implemented.

The invention provides a method and device for testing the performance of a baseband chip. The method includes: when the baseband chip to be tested tracks a preset satellite, collecting the working voltage value and the working current value of the baseband chip to be tested and The position information output by the test baseband chip is the position coordinate information of the ship at different times output by the baseband chip to be tested when the ship travels according to the preset route within the preset time period; The current value is used to obtain the power consumption of the baseband chip to be tested; the positioning accuracy of the baseband chip to be tested is obtained according to the location information and the location information in the preset route. The invention obtains the power consumption and positioning performance of the baseband chip when it normally tracks satellites, and provides a basis for the selection of the baseband chip in practical applications.

Description of drawings

Fig. 1 is the schematic flow chart of the testing method of baseband chip performance provided by the present invention;

Fig. 2 is the structural representation one of the testing device of baseband chip performance provided by the present invention;

FIG. 3 is a schematic structural diagram II of the test device for the performance of the baseband chip provided by the present invention.

Detailed ways

In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are part of the implementation of the present invention. example, not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

Fig. 1 is the schematic flow chart of the test method of the performance of the baseband chip provided by the present invention, the executive subject of the method flow shown in Fig. 1 can be the test device of the performance of the baseband chip, and the test device of the performance of the baseband chip can be realized by arbitrary software and/or hardware . As shown in Figure 1, the method for testing the performance of the baseband chip provided by this embodiment may include:

S101, when the baseband chip to be tested tracks the preset satellite, collect the working voltage value and the working current value of the baseband chip to be tested within the preset time period and the position information output by the baseband chip to be tested, and the position information is for the ship to follow the preset route The position coordinate information of the ship at different times output by the baseband chip to be tested during the preset time period.

During the test, the baseband chip to be tested needs to have a matching bottom plate, and the bottom plate is set on the test board. The bottom plate can be fixed on the test board to prevent the bottom plate from moving when the ship is running; The baseband chip to be tested does not contain other auxiliary navigation devices or low noise amplifiers. The test board is set on the ship, and the baseband chip to be tested is used to output the position information of the ship.

When a ship is sailing at sea, the position information of the ship is constantly changing. The baseband chip on the ship can track the preset satellite and track the operation of the preset satellite. When the baseband chip captures the tracked preset satellite signal, it can measure the pseudo-range and distance change rate from the baseband chip to the satellite. , to demodulate satellite orbit parameters and other data. According to these data, the baseband chip can perform positioning calculation according to the positioning solution method, and obtain and output the longitude, latitude, altitude, time and other information of the geographical location of the ship.

When the baseband chip to be tested tracks the preset satellite, the operating voltage value and the operating current value of the baseband chip to be tested and the position information output by the baseband chip to be tested are collected within a preset time period. In this embodiment, the baseband chip to be tested tracks to preset satellites, which can be that the baseband chip to be tested tracks to a preset number of satellites, or the baseband chip to be tested tracks to a preset type of satellite, and the baseband chip to be tested tracks When arriving at the preset satellite, collect the operating voltage value and operating current value of the baseband chip to be tested within the preset time period. The preset time period can be 30 minutes, and the collected operating voltage value and operating current value of the baseband chip to be tested Not less than 200 pieces of location information output by the baseband chip to be tested within a preset time period are collected, wherein the number of location information collected by the baseband chip to be tested is not less than 300 pieces. This embodiment does not limit the duration of the preset time period, as long as the collected operating voltage value and operating current value of the baseband chip to be tested and the number of output position information can meet the test requirements, according to different test requirements, The collected operating voltage value and operating current value of the baseband chip to be tested and the number of output position information can also be changed.

S102. Acquire the power consumption of the baseband chip to be tested according to the operating voltage value and the operating current value of the baseband chip to be tested.

When the baseband chip to be tested tracks the preset satellite, the baseband chip to be tested can output a position information at the same time. The working voltage value and working current value are used to obtain the power consumption of the baseband chip to be tested. The specific power consumption method can be shown in the following formula 1:

W＝U _g *I _g formula 1

Wherein, W represents the power consumption of the baseband chip to be tested; _Ug represents the operating voltage value of the baseband chip to be tested; _Ig represents the operating current value of the baseband chip to be tested.

Specifically, the operating voltage value of the baseband chip to be tested may be the instantaneous operating voltage value when the baseband chip to be tested outputs position information, or the average value of multiple instantaneous operating voltage values within a preset time period; The operating current value of the test baseband chip can be the instantaneous operating current value when the baseband chip to be tested outputs position information, or the average value of multiple instantaneous operating current values within a preset time period. Therefore, the power consumption of the baseband chip to be tested can be the product of the average operating voltage value and the average operating current value of the baseband chip to be tested within a preset period of time, or it can be multiple instantaneous operating voltage values and multiple instantaneous operating current values The average value of the product can also be the average value of the product of multiple instantaneous operating voltage values and average operating current values; it can also be the average value of the product of multiple instantaneous operating current values and average operating voltage values. This embodiment is for There is no limitation on the specific way of obtaining the power consumption of the baseband chip to be tested, as long as the power consumption can be obtained and the power consumption performance of the baseband chip to be tested can be represented.

S103. Acquire the positioning accuracy of the baseband chip to be tested according to the position information and the position information in the preset route.

In this embodiment, the position information output by the baseband chip to be tested may include coordinate information of longitude, latitude and altitude. The location information output by the baseband chip to be tested may output a piece of location information at the same time, and the baseband chip to be tested may output the time information corresponding to the location information. The preset route is preset, and the position information in the preset route can be simulated by a simulator to obtain the position information in the preset route of the ship corresponding to different times.

The position information output by the baseband chip to be tested at the same time and the position information in the simulated preset route are used to calculate the three-dimensional positioning error. Specifically, the longitude, latitude, and height information of the two at the same time can be used to calculate the three-dimensional positioning error, which can be specifically shown in the following formula two:

Among them, D represents the three-dimensional positioning error at different times; _X1 represents the longitude information in the position information output by the baseband chip to be tested, _Y1 represents the latitude information in the position information output by the baseband chip to be tested, and _Z1 represents the baseband chip to be tested Altitude information in the output position information; X ₂ represents the longitude information in the position information of the preset route, Y ₂ represents the latitude information in the position information of the preset route, and Z ₂ represents the altitude information in the position information of the preset route .

In this embodiment, 300 pieces of position information and corresponding 300 pieces of three-dimensional positioning errors are obtained as an example for illustration. After obtaining 300 three-dimensional positioning errors, sort them in ascending order of three-dimensional positioning error values, and take the 95th%*300=285th result as the positioning accuracy of the baseband chip to be tested.

If when testing the baseband chip to be tested, the baseband chip to be tested outputs N position information and corresponding N three-dimensional positioning errors, sort the N three-dimensional positioning error values in ascending order, and take the 95th percentile *N results are the positioning accuracy of the baseband chip to be tested, where 95%*N represents the largest integer not exceeding 95%*N.

In this embodiment, there is no limitation on the sequence of S102 and S103, and the two may also be executed at the same time.

In this embodiment, when the baseband chip to be tested is tracked to a preset satellite, the operating voltage value and the operating current value of the baseband chip to be tested and the position information output by the baseband chip to be tested within the preset time period are collected. The position coordinate information of the ship at different times output by the baseband chip to be tested when the preset route is driving within the preset time period; according to the operating voltage value and the operating current value of the baseband chip to be tested, the power consumption of the baseband chip to be tested is obtained; The position information and the position information in the preset route are used to obtain the positioning accuracy of the baseband chip to be tested. Obtaining the power consumption and positioning performance of the baseband chip when tracking satellites normally provides a basis for the selection of the baseband chip in practical applications.

The acquisition of the power consumption of the baseband chip to be tested will be described in detail below in conjunction with specific embodiments.

When the baseband chip to be tested tracks the preset satellite, a plurality of instantaneous operating voltage values of the baseband chip to be tested within a preset time period and operating current values corresponding to each instantaneous operating voltage value are collected.

When the baseband chip to be tested tracks the preset satellite, the baseband chip to be tested can output a position information at the same time, when the position information is output, the instantaneous operating voltage value of the baseband chip to be tested and the instantaneous operating voltage value at this moment are collected For the corresponding working current value, multiple instantaneous working voltage values and corresponding multiple instantaneous working current values at multiple different moments are obtained.

The power consumption of the baseband chip to be tested is acquired according to the multiple instantaneous operating voltage values of the baseband chip to be tested and the operating current values corresponding to each instantaneous operating voltage value.

Specifically, the manner of obtaining the power consumption of the baseband chip to be tested may be the same as that in the foregoing embodiment, and details are not repeated here.

In order to make the power consumption of the baseband chip to be tested closer to the actual power consumption, the power consumption of the baseband chip to be tested is obtained according to the multiple instantaneous operating voltage values of the baseband chip to be tested and the corresponding operating current values of each instantaneous operating voltage value. Time-consuming, affected by external influences, the collection of instantaneous working current value is unstable. In order to improve the accuracy of the power consumption performance of the baseband chip to be tested, the preset time period can be obtained according to multiple working current values corresponding to each instantaneous working voltage value. The average operating current value within the range, such as obtaining multiple instantaneous operating voltage values are U ₁ , U ₂ , U ₃ ... U _n , where n represents the total number of instantaneous operating voltage values obtained, and multiple instantaneous operating voltage values The corresponding operating current values are I ₁ , I ₂ , I ₃ ... I _n , and the average value of the multiple operating current values is obtained Then, according to each instantaneous operating voltage value and the average operating current value, the instantaneous power consumption corresponding to each instantaneous operating voltage value is obtained. According to each instantaneous power consumption, the average power consumption of the baseband chip to be tested is obtained.

In this embodiment, the average operating current value is obtained by obtaining the operating current value corresponding to each instantaneous operating voltage value, and the instantaneous power consumption corresponding to multiple instantaneous operating voltage values is obtained according to each instantaneous operating voltage value and the average operating current value, and then The average power consumption of the baseband chip to be tested is obtained according to each instantaneous power consumption, so that the obtained power consumption is closer to the actual power consumption of the baseband chip to be tested, and the test accuracy of the power consumption performance of the baseband chip to be tested is improved.

The method for testing the positioning performance of the baseband chip to be tested will be described in detail below in conjunction with specific embodiments.

The preset satellites tracked by the baseband chip to be tested in this embodiment include: Beidou-2 BD-2 satellite and global positioning GPS satellite. In this embodiment, the BD-2 satellite and the GPS satellite can be traced through the baseband chip to be tested, which is used to test the positioning performance of the baseband chip with dual-mode function. Specifically, in this embodiment, the baseband chip to be tested has tracked 3 BD-2 satellites and 3 GPS satellites. Those skilled in the art can imagine that the number and types of satellites tracked by the baseband chip to be tested can be changed, and the performance test method of the baseband chip provided in this embodiment is also applicable to the baseband chip with single-mode function.

Optionally, the BD-2 satellites trackable by the baseband chip to be tested in this embodiment include: a geosynchronous orbit satellite GEO, an inclined geosynchronous orbit satellite IGSO, and a medium earth orbit satellite MEO, wherein, The accuracy of the baseband chip to be tested to track the satellite position is PDOP≤8. The setting of three BD-2 satellites makes the position information obtained by the baseband chip to be tested more accurate and improves the accuracy of the positioning performance test.

In the positioning performance test of the baseband chip to be tested provided in this embodiment, when the baseband chip to be tested tracks a preset satellite, the location information output by the baseband chip to be tested within a preset time period is collected under preset test conditions.

Among them, the preset test conditions include: the maximum speed of the ship does not exceed 30m/s, the maximum acceleration does not exceed 0.5m/s ² , and the maximum change rate of acceleration does not exceed 0.05m/s ³ . Setting the maximum speed, maximum acceleration and maximum rate of change of acceleration of the ship can ensure that the baseband chip to be tested can accurately output the position information of the ship at different times. If the speed of the ship is too high, when the ship moves to a position, the baseband chip to be tested has not completed the output of the position information, and the ship travels to another position, resulting in too little or inaccurate collected position information, affecting To the test chip positioning performance test. Those skilled in the art can imagine that the specific values of the maximum speed, maximum acceleration and maximum rate of change of acceleration of the ship can be changed according to the number and type of satellites that can be tracked by the baseband chip to be tested.

Optionally, the preset test conditions also include: the baseband chip to be tested outputs the frequency point signal corresponding to the BD-2 satellite and the frequency point signal corresponding to the GPS satellite; satellite orbit, satellite clock error, ionospheric delay and tropospheric delay setting is a time-varying error model. Under the condition that other parameters remain unchanged, testing the positioning performance of the baseband chip to be tested can ensure that the positioning accuracy of the baseband chip to be tested is not affected by other parameters such as satellite orbit, satellite clock error, etc., and can be obtained more accurately. The positioning performance of the baseband chip to be tested.

In this embodiment, the baseband chip to be tested is tested under the condition that other parameters are set unchanged in this embodiment, the positioning performance of the baseband chip to be tested can be accurately obtained, and parameters such as the maximum driving speed of the ship are set in addition, the baseband chip to be tested The location information can be effectively output, further improving the accuracy of the test.

FIG. 2 is a schematic structural diagram of a baseband chip performance testing device 1 provided by the present invention. As shown in FIG.

The collection module 201 is used to collect the operating voltage value and operating current value of the baseband chip to be tested and the position information output by the baseband chip to be tested within the preset time period when the baseband chip to be tested is tracked to a preset satellite. The position coordinate information of the ship at different times output by the baseband chip to be tested when traveling according to the preset route within the preset time period;

The first acquisition module 202 is used to acquire the power consumption of the baseband chip to be tested according to the operating voltage value and the operating current value of the baseband chip to be tested;

The second acquiring module 203 is configured to acquire the positioning accuracy of the baseband chip to be tested according to the position information and the position information in the preset route.

The device for predicting the flight arrival and departure rate provided in this embodiment is similar in principle and technical effect to the aforementioned method for predicting the flight arrival and departure rate, and will not be repeated here.

Optionally, the acquisition module 201 is specifically configured to acquire a plurality of instantaneous operating voltage values and operating current values corresponding to each instantaneous operating voltage value of the baseband chip to be tested within a preset time period.

The first acquiring module 202 is specifically configured to acquire power consumption of the baseband chip to be tested according to multiple instantaneous operating voltage values of the baseband chip to be tested and operating current values corresponding to each instantaneous operating voltage value.

Optionally, the first obtaining module 202 is specifically configured to obtain the average operating current value according to the operating current value corresponding to each instantaneous operating voltage value; and obtain the corresponding instantaneous operating voltage value according to each instantaneous operating voltage value and the average operating current value. The instantaneous power consumption; according to each instantaneous power consumption, the average power consumption of the baseband chip to be tested is obtained.

Optionally, the preset satellites tracked by the baseband chip to be tested include: Beidou-2 BD-2 satellite and global positioning GPS satellite.

Optionally, BD-2 satellites, including: geosynchronous orbit satellite GEO, inclined geosynchronous orbit satellite IGSO and medium earth orbit satellite MEO;

Among them, the precision of the baseband chip to be tested to track the satellite position is PDOP≤8.

Optionally, the collection module 201 is specifically used to collect the position information output by the baseband chip to be tested within a preset time period under preset test conditions;

Among them, the preset test conditions include: the maximum speed of the ship does not exceed 30m/s, the maximum acceleration does not exceed 0.5m/s ² , and the maximum change rate of acceleration does not exceed 0.05m/s ³ .

Optionally, the preset test conditions also include:

The baseband chip to be tested outputs the frequency point signal corresponding to the BD-2 satellite and the frequency point signal corresponding to the GPS satellite; the satellite orbit, satellite clock error, ionospheric delay and tropospheric delay are set to the no time-varying error mode.

FIG. 3 is a schematic structural diagram II of a baseband chip performance testing device provided by the present invention. The baseband chip performance testing device may be, for example, a terminal device, such as a smart phone, a tablet computer, or a computer. As shown in FIG. 3 , the baseband chip performance testing device 300 includes: a memory 301 and at least one processor 302 .

The memory 301 is used for storing program instructions.

The processor 302 is configured to implement the performance test method of the baseband chip in this embodiment when the program instructions are executed. For specific implementation principles, please refer to the above-mentioned embodiments, and details will not be repeated here in this embodiment.

The device for testing the performance of the baseband chip may also include an input/output interface 303 .

The input/output interface 303 may include an independent output interface and an input interface, or may be an integrated interface integrating input and output. Wherein, the output interface is used to output data, and the input interface is used to obtain input data, the above-mentioned output data is a general term for output in the above method embodiments, and the input data is a general term for input in the above method embodiments.

The present invention also provides a readable storage medium, wherein execution instructions are stored in the readable storage medium, and when at least one processor of the baseband chip performance testing device executes the execution instructions, when the computer execution instructions are executed by the processor, the The method for testing the performance of the baseband chip in the above embodiment.

The present invention also provides a program product, which includes execution instructions, and the execution instructions are stored in a readable storage medium. At least one processor of the test device for the performance of the baseband chip can read the execution instruction from the readable storage medium, and at least one processor executes the execution instruction so that the test device for the performance of the baseband chip implements the performance of the baseband chip provided by the above-mentioned various embodiments. test method.

In the several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or May be integrated into another system, or some features may be ignored, or not implemented. In another point, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, and the indirect coupling or communication connection of devices or units may be in electrical, mechanical or other forms.

The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place, or may be distributed to multiple network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, each unit may exist separately physically, or two or more units may be integrated into one unit. The above-mentioned integrated units can be implemented in the form of hardware, or in the form of hardware plus software functional units.

The above-mentioned integrated units implemented in the form of software functional units may be stored in a computer-readable storage medium. The above-mentioned software functional units are stored in a storage medium, and include several instructions to enable a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor (English: processor) to execute the program described in each embodiment of the present invention. part of the method. The aforementioned storage media include: U disk, mobile hard disk, read-only memory (English: Read-Only Memory, abbreviated: ROM), random access memory (English: Random Access Memory, abbreviated: RAM), magnetic disk or optical disc, etc. Various media that can store program code.

In the embodiments of the above-mentioned network device or terminal device, it should be understood that the processor may be a central processing unit (English: Central Processing Unit, CPU for short), and may also be other general-purpose processors, digital signal processors (English: Digital Signal Processor, referred to as: DSP), application specific integrated circuit (English: Application Specific Integrated Circuit, referred to as: ASIC), etc. A general-purpose processor may be a microprocessor, or the processor may be any conventional processor, or the like. The steps of the methods disclosed in this application can be directly implemented by a hardware processor, or implemented by a combination of hardware and software modules in the processor.

Those of ordinary skill in the art can understand that all or part of the steps for implementing the above method embodiments can be completed by program instructions and related hardware. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it executes the steps including the above-mentioned method embodiments; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk and other various media that can store program codes.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present invention, rather than limiting them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: It is still possible to modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the technical solutions of the various embodiments of the present invention. scope.

Claims (10)

1. a method for testing of baseband chip performance, is characterized in that, baseband chip to be tested is arranged on test board, and described test board is arranged on ship; Described method comprises: When the baseband chip to be tested is tracked to a preset satellite, the operating voltage value and the operating current value of the baseband chip to be tested and the position information output by the baseband chip to be tested within a preset time period are collected, the position information The location coordinate information of the ship at different times output by the baseband chip to be tested when the ship travels according to the preset route within the preset time period; Acquiring the power consumption of the baseband chip to be tested according to the operating voltage value and the operating current value of the baseband chip to be tested; Acquiring the positioning accuracy of the baseband chip to be tested according to the position information and the position information in the preset route. 2. The test method according to claim 1, wherein the operating voltage value and the operating current value of the baseband chip to be tested in the collection preset time period include: Collecting a plurality of instantaneous operating voltage values of the baseband chip to be tested within the preset time period and operating current values corresponding to each of the instantaneous operating voltage values; According to the operating voltage value and the operating current value of the baseband chip to be tested, the power consumption of the baseband chip to be tested is obtained, including: Acquire the power consumption of the baseband chip to be tested according to the multiple instantaneous operating voltage values of the baseband chip to be tested and the operating current values corresponding to each of the instantaneous operating voltage values. 3. The test method according to claim 2, characterized in that, said baseband chip to be tested according to a plurality of instantaneous operating voltage values and the operating current value corresponding to each said instantaneous operating voltage value, to obtain said to-be-tested Test the power consumption of the baseband chip, including: Obtain an average operating current value according to the operating current value corresponding to each of the instantaneous operating voltage values; According to each of the instantaneous operating voltage values and the average operating current value, the instantaneous power consumption corresponding to each of the instantaneous operating voltage values is obtained; According to each of the instantaneous power consumptions, the average power consumption of the baseband chip to be tested is acquired. 4. The testing method according to claim 1, wherein the preset satellites tracked by the baseband chip to be tested include: Beidou-2 BD-2 satellite and GPS satellite. 5. testing method according to claim 4, is characterized in that, described BD-2 satellite comprises: Satellites in geosynchronous orbit GEO, satellites in inclined geosynchronous orbit IGSO and satellites in medium earth orbit MEO; Wherein, the precision of the baseband chip to be tested for tracking the satellite position is PDOP≤8. 6. The testing method according to claim 5, wherein the location information output by the baseband chip to be tested in the collection preset time period includes: Under preset test conditions, collecting position information output by the baseband chip to be tested within the preset time period; Wherein, the preset test conditions include: the maximum speed of the ship does not exceed 30m/s, the maximum acceleration does not exceed 0.5m/s ² , and the maximum rate of change of acceleration does not exceed 0.05m/s ³ . 7. testing method according to claim 6, is characterized in that, described preset test condition also comprises: The baseband chip to be tested outputs the frequency point signal corresponding to the BD-2 satellite and the frequency point signal corresponding to the GPS satellite; Satellite orbit, satellite clock error, ionospheric delay and tropospheric delay are set to no time-varying error mode. 8. A test device for baseband chip performance, characterized in that the baseband chip to be tested is arranged on a test board, and the test board is arranged on a ship; the device includes: A collection module, configured to collect the operating voltage value and operating current value of the baseband chip to be tested and the position information output by the baseband chip to be tested within a preset time period when the baseband chip to be tested tracks a preset satellite , the position information is the position coordinate information of the ship at different times output by the baseband chip to be tested when the ship travels according to a preset route within the preset time period; A first acquisition module, configured to acquire the power consumption of the baseband chip to be tested according to the operating voltage value and the operating current value of the baseband chip to be tested; The second acquiring module is configured to acquire the positioning accuracy of the baseband chip to be tested according to the position information and the position information in the preset route. 9. A test device for baseband chip performance, comprising: at least one processor and memory; the memory stores computer-executable instructions; The at least one processor executes the computer-executed instructions stored in the memory, so that a device for testing the performance of a baseband chip executes the testing method described in any one of claims 1-7. 10. A computer-readable storage medium, characterized in that computer-executable instructions are stored on the computer-readable storage medium, and when the computer-executable instructions are executed by a processor, the computer-readable storage medium according to any one of claims 1-7 is implemented. described test method.