CN108427127A - The test method and device of baseband chip performance - Google Patents
The test method and device of baseband chip performance Download PDFInfo
- Publication number
- CN108427127A CN108427127A CN201810099066.9A CN201810099066A CN108427127A CN 108427127 A CN108427127 A CN 108427127A CN 201810099066 A CN201810099066 A CN 201810099066A CN 108427127 A CN108427127 A CN 108427127A
- Authority
- CN
- China
- Prior art keywords
- baseband chip
- tested
- operating voltage
- voltage value
- current value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S19/00—Satellite radio beacon positioning systems; Determining position, velocity or attitude using signals transmitted by such systems
- G01S19/01—Satellite radio beacon positioning systems transmitting time-stamped messages, e.g. GPS [Global Positioning System], GLONASS [Global Orbiting Navigation Satellite System] or GALILEO
- G01S19/13—Receivers
- G01S19/23—Testing, monitoring, correcting or calibrating of receiver elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
Landscapes
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Position Fixing By Use Of Radio Waves (AREA)
Abstract
The present invention provides a kind of test method and device of baseband chip performance, and this method includes：When baseband chip to be tested tracks default satellite, the location information of the operating voltage value of baseband chip to be tested and the output of working current value and baseband chip to be tested in preset time period is acquired, location information is location coordinate information of the ship according to the ship of the default course line different moments that baseband chip to be tested exports when driving within a preset period of time；According to the operating voltage value and working current value of baseband chip to be tested, the power consumption of baseband chip to be tested is obtained；According to the location information in location information and default course line, the positioning accuracy of baseband chip to be tested is obtained.Power consumption and positioning performance, selection in practical application baseband chip of the present invention in the normal satellite tracking of acquisition baseband chip provide foundation.
Description
Technical field
The present invention relates to electronic technology field more particularly to a kind of test methods and device of baseband chip performance.
Background technology
Due to the particularity of maritime environment, the navigation equipment of boat-carrying with respect to the navigation equipment under conventional environment, reliability,
Shockproof, moisture-proof, high temperature-proof and anti-light direct beam etc. have higher requirement, and therefore, ship-borne equipment is required for by unified, stringent
Test, using international uniform measurement standard and reach required test result and can install and go on board.
The chief component of shipborne navigational aid is baseband chip, and the size of power consumption affects the use of navigation equipment
Duration, and then the navigation performance of entire ship is influenced, in addition, the positioning accuracy of baseband chip directly affects the operation of ship.
At sea the activity duration is long for ship, with greater need for baseband chip in the case where that can reach certain positioning accuracy, has smaller
Power consumption.Therefore, in baseband chip using preceding needing to carry out the test of power consumption and positioning performance to it.But in the prior art for base
Microarray strip whole plate power consumption and the test method of positioning performance rarely have disclosure.
Invention content
The present invention provides a kind of test method and device of baseband chip performance, is obtaining the normal satellite tracking of baseband chip
When power consumption and positioning performance, the selection for baseband chip in practical application provide foundation.
The first aspect of the present invention provides a kind of test method of baseband chip performance, and baseband chip to be tested is set to survey
On test plate (panel), the test board is set on ship；The method includes：
When the baseband chip to be tested tracks default satellite, the base band core to be tested in preset time period is acquired
The operating voltage value and working current value of piece and the location information of the baseband chip output to be tested, the location information are
The ship is according to the default course line different moments that the baseband chip to be tested exports when driving in the preset time period
The ship location coordinate information；
According to the operating voltage value and working current value of the baseband chip to be tested, the base band to be tested is obtained
The power consumption of chip；
According to the positional information with the location information in the default course line, determining for the baseband chip to be tested is obtained
Position precision.
Optionally, the operating voltage value and operating current for acquiring the baseband chip to be tested in preset time period
Value, including：
Acquire multiple instantaneous operating voltage values of the baseband chip to be tested in the preset time period and each described
The corresponding working current value of instantaneous operating voltage value；
According to the operating voltage value and working current value of the baseband chip to be tested, the base band to be tested is obtained
The power consumption of chip, including：
It is corresponded to according to multiple instantaneous operating voltage values of the baseband chip to be tested and each instantaneous operating voltage value
Working current value, obtain the power consumption of the baseband chip to be tested.
Optionally, multiple instantaneous operating voltage values according to the baseband chip to be tested and each instantaneous work
The corresponding working current value of voltage value obtains the power consumption of the baseband chip to be tested, including：
According to the corresponding working current value of each instantaneous operating voltage value, average operating current value is obtained；
According to each instantaneous operating voltage value and the average operating current value, each instantaneous operating voltage value is obtained
Corresponding instantaneous power consumption；
According to each instantaneous power consumption, the average power consumption of the baseband chip to be tested is obtained.
Optionally, the default satellite that the baseband chip to be tested tracks, including：No. two BD-2 satellites of the Big Dipper and the whole world
Positioning GPS satellite.
Optionally, the BD-2 satellites, including：
Geo-synchronous orbit satellite GEO, geo-synchronous orbit satellite IGSO and Medium Earth-Orbiting Satellite MEO is tilted；
Wherein, precision degree of strength PDOP≤8 of the baseband chip satellite tracking to be tested position.
Optionally, the location information that the baseband chip to be tested exports in the acquisition preset time period, including：
Under default test condition, the position letter that the baseband chip to be tested exports in the preset time period is acquired
Breath；
Wherein, the default test condition includes：The maximum speed of the ship is no more than 30m/s, and peak acceleration is not
More than 0.5m/s2, the maximum rate of change of acceleration is no more than 0.05m/s3。
Optionally, the default test condition further includes：The baseband chip to be tested exports the corresponding frequency of BD-2 satellites
Point signal and the corresponding frequency point signal of GPS satellite；
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode.
The second aspect of the present invention provides a kind of test device of baseband chip performance, and baseband chip to be tested is set to survey
On test plate (panel), the test board is set on ship；Described device includes：
Acquisition module, for when the baseband chip to be tested tracks default satellite, acquiring institute in preset time period
The operating voltage value and working current value and the location information of the baseband chip to be tested output of baseband chip to be tested are stated,
The location information be the ship according to default course line the baseband chip to be tested when driving in the preset time period
The location coordinate information of the ship of the different moments of output；
First acquisition module is used for the operating voltage value and working current value according to the baseband chip to be tested,
Obtain the power consumption of the baseband chip to be tested；
Second acquisition module, for according to the positional information with the location information in the default course line, described in acquisition
The positioning accuracy of baseband chip to be tested.
The third aspect of the present invention provides a kind of test method and device of baseband chip performance, including：At least one place
Manage device and memory；
The memory stores computer executed instructions；
At least one processor executes the computer executed instructions of the memory storage so that the baseband chip
The test device equipment of performance executes the test method of above-mentioned baseband chip performance.
The fourth aspect of the present invention provides a kind of computer readable storage medium, is deposited on the computer readable storage medium
Computer executed instructions are contained, when the computer executed instructions are executed by processor, realize above-mentioned baseband chip performance
Test method.
The present invention provides a kind of test method and device of baseband chip performance, and this method includes：In base band core to be tested
When piece tracks default satellite, acquire preset time period in baseband chip to be tested operating voltage value and working current value and
The location information of baseband chip output to be tested, location information are that ship waits for when driving within a preset period of time according to default course line
Test the location coordinate information of the ship of the different moments of baseband chip output；According to the operating voltage value of baseband chip to be tested
And working current value, obtain the power consumption of baseband chip to be tested；According to the location information in location information and default course line, obtain
The positioning accuracy of baseband chip to be tested.Power consumption and positioning performance of the present invention in the normal satellite tracking of acquisition baseband chip,
Selection for baseband chip in practical application provides foundation.
Description of the drawings
Fig. 1 is the test method flow diagram of baseband chip performance provided by the invention；
Fig. 2 is the structural schematic diagram one of the test device of baseband chip performance provided by the invention；
Fig. 3 is the structural schematic diagram two of the test device of baseband chip performance provided by the invention.
Specific implementation mode
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with the embodiment of the present invention, to this
Technical solution in inventive embodiments is clearly and completely described, it is clear that described embodiment is that a part of the invention is real
Example is applied, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creation
Property labour under the premise of the every other embodiment that is obtained, shall fall within the protection scope of the present invention.
Fig. 1 is the test method flow diagram of baseband chip performance provided by the invention, and method flow shown in Fig. 1 is held
Row main body can be the test device of baseband chip performance, the test device of the baseband chip performance can by arbitrary software and/
Or hardware realization.As shown in Figure 1, the test method of baseband chip performance provided in this embodiment may include：
S101 acquires baseband chip to be tested in preset time period when baseband chip to be tested tracks default satellite
Operating voltage value and working current value and baseband chip to be tested output location information, location information be ship according to pre-
If the location coordinate information of the ship of the course line different moments that baseband chip to be tested exports when driving within a preset period of time.
In test, baseband chip to be tested needs mating bottom plate, which is set on test board, the bottom plate
It can be fixed on test board, to prevent ship bottom plate during traveling from moving；It is only provided on the bottom plate
Baseband chip to be tested, without other assisting navigation devices or low noise device etc..Test board is set on ship, to be tested
Baseband chip is used to export the location information of ship.
When ship at sea when driving, the location information of ship is constantly changed.Baseband chip energy on ship
Default satellite is enough tracked, and tracks the operation of the default satellite, after baseband chip captures the default satellite-signal of tracking,
Baseband chip can be measured to the pseudo-distance of satellite and the change rate of distance, demodulate the data such as satellite orbit parameter.According to
These data, baseband chip can carry out location Calculation by positioning calculation method, obtain and export the warp of ship geographic location
The information such as latitude, height, time.
When baseband chip to be tested tracks default satellite, the work of baseband chip to be tested in preset time period is acquired
Voltage value and working current value and the location information of baseband chip to be tested output.In the present embodiment, baseband chip to be tested
Default satellite is tracked, can be that baseband chip to be tested tracks preset value satellite, can also be baseband chip to be tested
The satellite for tracking preset kind acquires to be tested in preset time period when baseband chip to be tested tracks default satellite
The operating voltage value and working current value of baseband chip, preset time period can be 30min, the baseband chip to be tested of acquisition
Operating voltage value and the number of working current value are no less than 200, acquire baseband chip output to be tested in preset time period
Location information, wherein the number of the location information of the baseband chip to be tested output of acquisition is no less than 300.The present embodiment pair
Be not limited in the duration of preset time period, if acquisition baseband chip to be tested operating voltage value and working current value with
And the number of the location information of output can meet test request, and according to the difference of test request, acquisition also can be changed
The number of the operating voltage value and working current value of baseband chip to be tested and the location information of output.
S102 obtains baseband chip to be tested according to the operating voltage value and working current value of baseband chip to be tested
Power consumption.
When baseband chip to be tested tracks default satellite, baseband chip to be tested can be exported every the identical time
One location information acquires the operating voltage value and working current value of baseband chip to be tested when output position information, according to
The operating voltage value and working current value of acquisition, obtain the power consumption of baseband chip to be tested, and the acquisition modes of specific power consumption can be by
Shown in following formula formula one：
W=Ug*IgFormula one
Wherein, W indicates the power consumption of baseband chip to be tested；UgIndicate the operating voltage value of baseband chip to be tested；IgIt indicates
The working current value of baseband chip to be tested.
Specifically, when the operating voltage value of baseband chip to be tested can be baseband chip output position information to be tested
Instantaneous operating voltage value can also be the average value of multiple instantaneous operating voltage values in preset time period；Similarly, base to be tested
The working current value of microarray strip can be baseband chip output position information to be tested when instantaneous working current value, can also be
The average value of multiple instantaneous working current values in preset time period.Therefore, the power consumption of baseband chip to be tested can be to be measured
The product for trying the average working voltage value and average operating current value of baseband chip within a preset period of time, can also be multiple winks
When operating voltage value and multiple instantaneous working current values product average value, can also be multiple instantaneous operating voltage values with it is flat
The average value of the product of equal working current value；It can also be the product of multiple instantaneous working current values and average working voltage value
Average value, the present embodiment is not limited the specific acquisition modes of the power consumption of baseband chip to be tested, as long as work(can be obtained
Consumption, and can indicate the power consumption performance of baseband chip to be tested.
S103 obtains the positioning accuracy of baseband chip to be tested according to the location information in location information and default course line.
In the present embodiment, the location information of baseband chip output to be tested may include：The coordinate of longitude, latitude and height
Information.The location information of baseband chip output to be tested can export a location information every the identical time, to be tested
Baseband chip can be exported temporal information is corresponding with location information.Default course line is pre-set, wherein default
Location information in course line can carry out emulation experiment using emulator to ship, obtain the default of different moments corresponding ship
Location information in course line.
By the location information in the default course line of the location information of synchronization baseband chip to be tested output and emulation into
The calculating of row three-dimensional localization error.Specifically, can be that the longitude, latitude, elevation information of both synchronizations are carried out three-dimensional
The calculating of position error, specifically can be as follows shown in formula two：
Wherein, D indicates the three-dimensional localization error of different moments；X1In the location information for representing baseband chip output to be tested
Longitude information, Y1Represent the latitude information in the location information of baseband chip output to be tested, Z1Represent baseband chip to be tested
Elevation information in the location information of output；X2Represent the longitude information in the location information for presetting course line, Y2It represents and presets course line
Location information in latitude information, Z2Represent the elevation information in the location information for presetting course line.
The present embodiment is illustrated for obtaining 300 location informations and corresponding 300 three-dimensional localization errors.
To after 300 three-dimensional localization errors, it is ranked up according to the sequence of three-dimensional localization error amount from small to large, takes 95%*300=
285 results are the positioning accuracy of baseband chip to be tested.
If when testing baseband chip to be tested, baseband chip to be tested outputs N number of location information and correspondence
N number of three-dimensional localization error, this N number of three-dimensional localization error amount is ranked up according to sequence from small to large, takes 95%*N
A result is the positioning accuracy of baseband chip to be tested, and wherein 95%*N indicates the maximum integer no more than 95%*N.
The present embodiment is not limited the sequencing of S102 and S103, and the two can also be performed simultaneously.
In the present embodiment, when baseband chip to be tested tracks default satellite, base to be tested in preset time period is acquired
The operating voltage value and working current value of microarray strip and the location information of baseband chip to be tested output, location information is ship
According to the position coordinates of the ship of the default course line different moments that baseband chip to be tested exports when driving within a preset period of time
Information；According to the operating voltage value and working current value of baseband chip to be tested, the power consumption of baseband chip to be tested is obtained；According to
Location information in location information and default course line obtains the positioning accuracy of baseband chip to be tested.Obtaining baseband chip just
Power consumption when normal satellite tracking and positioning performance, the selection for baseband chip in practical application provide foundation.
The power consumption for obtaining baseband chip to be tested is described in detail with reference to specific embodiment.
When baseband chip to be tested tracks default satellite, baseband chip to be tested within a preset period of time more are acquired
A instantaneous operating voltage value and the corresponding working current value of each instantaneous operating voltage value.
When baseband chip to be tested tracks default satellite, baseband chip to be tested can be exported every the identical time
One location information acquires instantaneous operating voltage value and the wink at moment of baseband chip to be tested when output position information
When the corresponding working current value of operating voltage value, obtain multiple instantaneous operating voltage values at multiple and different moment and corresponding more
A instantaneous working current value.
According to multiple instantaneous operating voltage values of baseband chip to be tested and the corresponding work electricity of each instantaneous operating voltage value
Flow valuve obtains the power consumption of baseband chip to be tested.
Specifically, the mode for obtaining the power consumption of baseband chip to be tested can be with the acquisition modes phase in above-described embodiment
Together, this will not be repeated here.
In order to enable the power consumption of the baseband chip to be tested obtained is more close to actual power loss, according to base band to be tested
The multiple instantaneous operating voltage values and the corresponding working current value of each instantaneous operating voltage value of chip, obtain baseband chip to be tested
Power consumption when, by ectocine, how unstable the acquisition of instantaneous working current value is, in order to improve baseband chip power consumption to be tested
The accuracy rate of performance can be obtained according to the corresponding multiple working current values of each instantaneous operating voltage value in preset time period
Average operating current value, it is respectively U such as to obtain multiple instantaneous operating voltage values1、U2、U3……Un, the wink of wherein n expression acquisitions
When operating voltage value total number, the corresponding working current value of multiple instantaneous operating voltage values is respectively I1、I2、I3……In, obtain
Take the average value of multiple working current valueFurther according to each instantaneous operating voltage value and average working current value, each wink is obtained
When the corresponding instantaneous power consumption of operating voltage value.According to each instantaneous power consumption, the average power consumption of baseband chip to be tested is obtained.
In the present embodiment, by obtaining the corresponding working current value of each instantaneous operating voltage value, average operating current is obtained
Value obtains the corresponding instantaneous power consumption of multiple instantaneous operating voltage values according to each instantaneous operating voltage value and average working current value,
Each instantaneous power consumption of root obtains the average power consumption of baseband chip to be tested again so that the power consumption of acquisition is more close to base band to be tested
The actual power loss of chip, the test accuracy of the baseband chip power consumption performance to be tested of raising.
The test method of the positioning performance of baseband chip to be tested is described in detail with reference to specific embodiment.
The default satellite that baseband chip to be tested provided in this embodiment tracks, including：No. two BD-2 satellites of the Big Dipper and
Global location GPS satellite.BD-2 satellites and GPS satellite are traceable to by baseband chip to be tested in the present embodiment, for surveying
Try the positioning performance of the baseband chip with dual mode capability.Specifically, in the present embodiment, baseband chip to be tested tracks 3
BD-2 satellites and 3 GPS satellites.It may occur to persons skilled in the art that be, thus it is possible to vary baseband chip to be tested tracks
Satellite number and type, the performance test methods of baseband chip provided in this embodiment are equally applicable to have single mode function
Baseband chip.
Optionally, the BD-2 satellites that baseband chip to be tested is traceable in the present embodiment, including：One Geo-synchronous rail
Road satellite GEO, an an inclination geo-synchronous orbit satellite IGSO and Medium Earth-Orbiting Satellite MEO, wherein base band to be tested
Precision degree of strength PDOP≤8 of chip satellite tracking position.The setting of three BD-2 satellites so that baseband chip to be tested obtains
Location information it is more accurate, improve positioning performance test accuracy.
In the test of the positioning performance of baseband chip to be tested provided in this embodiment, tracked in baseband chip to be tested
When default satellite, under default test condition, the location information of baseband chip output to be tested in preset time period is acquired.
Wherein, default test condition includes：The maximum speed of ship is no more than 30m/s, and peak acceleration is no more than 0.5m/
s2, the maximum rate of change of acceleration is no more than 0.05m/s3.Maximum travelling speed, peak acceleration and the acceleration of ship are set
Maximum rate of change, it is ensured that baseband chip to be tested can accurately export the location information of ship at different times.
If the travel speed of ship is excessive, when ship is moved at a position, the position has not been completed in baseband chip to be tested
The output of information, ship just drive to another position, cause the location information of acquisition very few or inaccurate, influence test
The progress of chip positioning performance test.It may occur to persons skilled in the art that be can according to baseband chip to be tested is set can
The difference of the satellite number and type that track becomes the maximum of the maximum travelling speed of ship, peak acceleration and acceleration
Rate concrete numerical value makes a change.
Optionally, default test condition further includes：The corresponding frequency point signal of baseband chip to be tested output BD-2 satellites and
The corresponding frequency point signal of GPS satellite；Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying and miss
Differential mode formula.In the case where other parameters are constant, the test of positioning performance is carried out to baseband chip to be tested, it is ensured that obtain
The positioning accuracy of baseband chip to be tested do not influenced by other parameters such as satellite orbit, satellite clock correction etc., can be more acurrate
Acquisition baseband chip positioning performance to be tested.
In the present embodiment, baseband chip to be tested is surveyed in the case that setting other parameters are constant in the present embodiment
Examination, can accurately obtain the positioning performance of baseband chip to be tested, and the parameters such as the maximum travelling speed of ship are in addition arranged, wait for
Test baseband chip can effective output position information, further improve the accuracy of test.
Fig. 2 is the structural schematic diagram one of the test device of baseband chip performance provided by the invention, as shown in Fig. 2, the base
The test device 200 of belt carcass piece performance includes：Acquisition module 201, the first acquisition module 202, the second acquisition module 203.
Acquisition module 201, it is to be measured in preset time period for when baseband chip to be tested tracks default satellite, acquiring
The operating voltage value and working current value of examination baseband chip and the location information of baseband chip to be tested output, location information are
Ship is according to the default course line position of the ship of the different moments of baseband chip to be tested output when driving within a preset period of time
Coordinate information；
First acquisition module 202, for the operating voltage value and working current value according to baseband chip to be tested, acquisition waits for
Test the power consumption of baseband chip；
Second acquisition module 203, for according to the location information in location information and default course line, obtaining base band to be tested
The positioning accuracy of chip.
The prediction technique of flight provided in this embodiment into the prediction meanss and above-mentioned flight into departure from port rate of departure from port rate is realized
Principle it is similar with technique effect, this will not be repeated here.
Optionally, acquisition module 201 are specifically used for acquiring baseband chip to be tested within a preset period of time multiple instantaneous
Operating voltage value and the corresponding working current value of each instantaneous operating voltage value.
First acquisition module 202 was specifically used for according to multiple instantaneous operating voltage values of baseband chip to be tested and each wink
When the corresponding working current value of operating voltage value, obtain the power consumption of baseband chip to be tested.
Optionally, the first acquisition module 202 is specifically used for according to the corresponding working current value of each instantaneous operating voltage value,
Obtain average operating current value；According to each instantaneous operating voltage value and average working current value, each instantaneous operating voltage value is obtained
Corresponding instantaneous power consumption；According to each instantaneous power consumption, the average power consumption of baseband chip to be tested is obtained.
Optionally, the default satellite that baseband chip to be tested tracks, including：No. two BD-2 satellites of the Big Dipper and global location
GPS satellite.
Optionally, BD-2 satellites, including：Geo-synchronous orbit satellite GEO, tilt geo-synchronous orbit satellite IGSO and in
Earth-orbiting satellite MEO；
Wherein, precision degree of strength PDOP≤8 of baseband chip satellite tracking to be tested position.
Optionally, acquisition module 201 are specifically used under default test condition, acquire baseband chip to be tested default
The location information exported in period；
Wherein, default test condition includes：The maximum speed of ship is no more than 30m/s, and peak acceleration is no more than 0.5m/
s2, the maximum rate of change of acceleration is no more than 0.05m/s3。
Optionally, default test condition further includes：
Baseband chip to be tested exports the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point signal of GPS satellite；Satellite
Track, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode.
Fig. 3 is the structural schematic diagram two of the test device of baseband chip performance provided by the invention, a kind of baseband chip
The test device of performance for example can be terminal device, such as smart mobile phone, tablet computer, computer etc..As shown in figure 3, should
The test device 300 of baseband chip performance includes：Memory 301 and at least one processor 302.
Memory 301, for storing program instruction.
Processor 302, the test side for being performed the baseband chip performance in realizing the present embodiment in program instruction
Method, specific implementation principle can be found in above-described embodiment, and details are not described herein again for the present embodiment.
The test device of the baseband chip performance can also include and input/output interface 303.
Input/output interface 303 may include independent output interface and input interface, or integrated input and defeated
The integrated interface gone out.Wherein, output interface is used for output data, and input interface is used to obtain the data of input, above-mentioned output
Data are the general designation exported in above method embodiment, and the data of input are the general designation inputted in above method embodiment.
The present invention also provides a kind of readable storage medium storing program for executing, it is stored with and executes instruction in readable storage medium storing program for executing, work as baseband chip
When at least one processor of the test device of performance executes this and executes instruction, when computer executed instructions are executed by processor
When, realize the test method of the baseband chip performance in above-described embodiment.
The present invention also provides a kind of program product, the program product include execute instruction, this execute instruction be stored in it is readable
In storage medium.At least one processor of the test device of baseband chip performance can read the execution from readable storage medium storing program for executing
Instruction, at least one processor execute this and execute instruction so that the test device of baseband chip performance implements above-mentioned various implementations
The test method for the baseband chip performance that mode provides.
In several embodiments provided by the present invention, it should be understood that disclosed device and method can pass through it
Its mode is realized.For example, the apparatus embodiments described above are merely exemplary, for example, the division of the unit, only
Only a kind of division of logic function, formula that in actual implementation, there may be another division manner, such as multiple units or component can be tied
Another system is closed or is desirably integrated into, or some features can be ignored or not executed.Another point, it is shown or discussed
Mutual coupling, direct-coupling or communication connection can be the INDIRECT COUPLING or logical by some interfaces, device or unit
Letter connection can be electrical, machinery or other forms.
The unit illustrated as separating component may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, you can be located at a place, or may be distributed over multiple
In network element.Some or all of unit therein can be selected according to the actual needs to realize the mesh of this embodiment scheme
's.
In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, it can also
It is that each unit physically exists alone, it can also be during two or more units be integrated in one unit.Above-mentioned integrated list
The form that hardware had both may be used in member is realized, can also be realized in the form of hardware adds SFU software functional unit.
The above-mentioned integrated unit being realized in the form of SFU software functional unit can be stored in one and computer-readable deposit
In storage media.Above-mentioned SFU software functional unit is stored in a storage medium, including some instructions are used so that a computer
Equipment (can be personal computer, server or the network equipment etc.) or processor (English：Processor this hair) is executed
The part steps of bright each embodiment the method.And storage medium above-mentioned includes：USB flash disk, mobile hard disk, read-only memory
(English：Read-Only Memory, referred to as：ROM), random access memory (English：Random Access Memory, letter
Claim：RAM), the various media that can store program code such as magnetic disc or CD.
In the embodiment of the above-mentioned network equipment or terminal device, it should be appreciated that processor can be central processing unit
(English：Central Processing Unit, referred to as：CPU), it can also be other general processors, digital signal processor
(English：Digital Signal Processor, referred to as：DSP), application-specific integrated circuit (English：Application
Specific Integrated Circuit, referred to as：ASIC) etc..General processor can be microprocessor or the processor
It can also be any conventional processor etc..Hardware handles can be embodied directly in conjunction with the step of method disclosed in the present application
Device executes completion, or in processor hardware and software module combination execute completion.
One of ordinary skill in the art will appreciate that：Realize that all or part of step of above-mentioned each method embodiment can lead to
The relevant hardware of program instruction is crossed to complete.Program above-mentioned can be stored in a computer read/write memory medium.The journey
When being executed, execution includes the steps that above-mentioned each method embodiment to sequence；And storage medium above-mentioned includes：ROM, RAM, magnetic disc or
The various media that can store program code such as person's CD.
Finally it should be noted that：The above embodiments are only used to illustrate the technical solution of the present invention., rather than its limitations；To the greatest extent
Present invention has been described in detail with reference to the aforementioned embodiments for pipe, it will be understood by those of ordinary skill in the art that：Its according to
So can with technical scheme described in the above embodiments is modified, either to which part or all technical features into
Row equivalent replacement；And these modifications or replacements, various embodiments of the present invention technology that it does not separate the essence of the corresponding technical solution
The range of scheme.
Claims (10)
1. a kind of test method of baseband chip performance, which is characterized in that baseband chip to be tested is set on test board, described
Test board is set on ship；The method includes：
When the baseband chip to be tested tracks default satellite, the baseband chip to be tested in preset time period is acquired
Operating voltage value and working current value and the location information of the baseband chip output to be tested, the location information is described
Ship institute of the different moments of the baseband chip to be tested output when driving in the preset time period according to default course line
State the location coordinate information of ship；
According to the operating voltage value and working current value of the baseband chip to be tested, the baseband chip to be tested is obtained
Power consumption；
According to the positional information with the location information in the default course line, the positioning accurate of the baseband chip to be tested is obtained
Degree.
2. test method according to claim 1, which is characterized in that the base to be tested in the acquisition preset time period
The operating voltage value and working current value of microarray strip, including：
Acquire multiple instantaneous operating voltage values of the baseband chip to be tested in the preset time period and each described instantaneous
The corresponding working current value of operating voltage value；
According to the operating voltage value and working current value of the baseband chip to be tested, the baseband chip to be tested is obtained
Power consumption, including：
According to multiple instantaneous operating voltage values of the baseband chip to be tested and the corresponding work of each instantaneous operating voltage value
Make current value, obtains the power consumption of the baseband chip to be tested.
3. test method according to claim 2, which is characterized in that described according to the multiple of the baseband chip to be tested
Instantaneous operating voltage value and the corresponding working current value of each instantaneous operating voltage value, obtain the baseband chip to be tested
Power consumption, including：
According to the corresponding working current value of each instantaneous operating voltage value, average operating current value is obtained；
According to each instantaneous operating voltage value and the average operating current value, obtains each instantaneous operating voltage value and correspond to
Instantaneous power consumption；
According to each instantaneous power consumption, the average power consumption of the baseband chip to be tested is obtained.
4. test method according to claim 1, which is characterized in that the baseband chip to be tested tracked default defends
Star, including：No. two BD-2 satellites of the Big Dipper and global location GPS satellite.
5. test method according to claim 4, which is characterized in that the BD-2 satellites, including：
Geo-synchronous orbit satellite GEO, geo-synchronous orbit satellite IGSO and Medium Earth-Orbiting Satellite MEO is tilted；
Wherein, precision degree of strength PDOP≤8 of the baseband chip satellite tracking to be tested position.
6. test method according to claim 5, which is characterized in that the base to be tested in the acquisition preset time period
The location information of microarray strip output, including：
Under default test condition, the location information that the baseband chip to be tested exports in the preset time period is acquired；
Wherein, the default test condition includes：The maximum speed of the ship is no more than 30m/s, and peak acceleration is no more than
0.5m/s2, the maximum rate of change of acceleration is no more than 0.05m/s3。
7. test method according to claim 6, which is characterized in that the default test condition further includes：
The baseband chip to be tested exports the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point signal of GPS satellite；
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode.
8. a kind of test device of baseband chip performance, which is characterized in that baseband chip to be tested is set on test board, described
Test board is set on ship；Described device includes：
Acquisition module, for when the baseband chip to be tested tracks default satellite, acquiring described in preset time period wait for
The operating voltage value and working current value of test baseband chip and the location information of the baseband chip output to be tested, it is described
Location information is that according to default course line, the baseband chip to be tested exports the ship when driving in the preset time period
Different moments the ship location coordinate information；
First acquisition module is obtained for the operating voltage value and working current value according to the baseband chip to be tested
The power consumption of the baseband chip to be tested；
Second acquisition module, for the location information in the default course line, obtaining described to be measured according to the positional information
Try the positioning accuracy of baseband chip.
9. a kind of test device of baseband chip performance, which is characterized in that including：At least one processor and memory；
The memory stores computer executed instructions；
At least one processor executes the computer executed instructions of the memory storage so that a kind of baseband chip performance
Test device perform claim require 1-7 any one of them test methods.
10. a kind of computer readable storage medium, which is characterized in that be stored with computer on the computer readable storage medium
It executes instruction, when the computer executed instructions are executed by processor, realizes claim 1-7 any one of them test side
Method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810099066.9A CN108427127A (en) | 2018-01-31 | 2018-01-31 | The test method and device of baseband chip performance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810099066.9A CN108427127A (en) | 2018-01-31 | 2018-01-31 | The test method and device of baseband chip performance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108427127A true CN108427127A (en) | 2018-08-21 |
Family
ID=63156296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810099066.9A Pending CN108427127A (en) | 2018-01-31 | 2018-01-31 | The test method and device of baseband chip performance |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108427127A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110297171A (en) * | 2019-06-14 | 2019-10-01 | 合肥格易集成电路有限公司 | A kind of the power consumption test system and equipment of chip |
| CN118294990A (en) * | 2024-06-05 | 2024-07-05 | 杭州芯云半导体技术有限公司 | Test system and test method for navigation chip |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102621478A (en) * | 2012-03-29 | 2012-08-01 | 广州市广晟微电子有限公司 | Dynamic test device and system of radio-frequency front-end chip |
| US20150339205A1 (en) * | 2014-05-21 | 2015-11-26 | The Boeing Company | Built-in test for satellite digital payload verification |
| CN106842246A (en) * | 2017-03-24 | 2017-06-13 | 北京北斗云鑫科技有限公司 | Big Dipper chip on-line authentication method and device |
-
2018
- 2018-01-31 CN CN201810099066.9A patent/CN108427127A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102621478A (en) * | 2012-03-29 | 2012-08-01 | 广州市广晟微电子有限公司 | Dynamic test device and system of radio-frequency front-end chip |
| US20150339205A1 (en) * | 2014-05-21 | 2015-11-26 | The Boeing Company | Built-in test for satellite digital payload verification |
| CN106842246A (en) * | 2017-03-24 | 2017-06-13 | 北京北斗云鑫科技有限公司 | Big Dipper chip on-line authentication method and device |
Non-Patent Citations (1)
| Title |
|---|
| 北京东方计量测试研究所 等: ""北斗/全球卫星导航系统（GNSS）导航单元性能要求及测试方法 BD 420005—2015"", 《中国第二代卫星导航系统重大专项标准》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110297171A (en) * | 2019-06-14 | 2019-10-01 | 合肥格易集成电路有限公司 | A kind of the power consumption test system and equipment of chip |
| CN110297171B (en) * | 2019-06-14 | 2021-10-01 | 苏州福瑞思信息科技有限公司 | Power consumption test system and equipment of chip |
| CN118294990A (en) * | 2024-06-05 | 2024-07-05 | 杭州芯云半导体技术有限公司 | Test system and test method for navigation chip |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109974717B (en) | Method, device and terminal for repositioning target point on map | |
| CN105091911B (en) | A kind of POS system dynamic locating accuracy detecting system and method | |
| CN102928858B (en) | GNSS (Global Navigation Satellite System) single-point dynamic positioning method based on improved expanded Kalman filtering | |
| RU2696856C1 (en) | Post-processing position data of global satellite navigation system (gnss) using mirror gnss data | |
| CN102819029B (en) | Supercompact combination satellite navigation receiver | |
| CN104297764A (en) | Method for improving PPS accuracy of navigation system time and receiver | |
| CN105849589A (en) | Satellite positioning system, positioning terminal, positioning method, and recording medium | |
| CN109489687A (en) | A kind of emulation verification method and simulation and verification platform for navigation algorithm | |
| CN112902989B (en) | Data error calibration method and device, electronic equipment and storage medium | |
| CN105891861A (en) | Positioning method and device | |
| CN111736185B (en) | Terminal positioning method and device, computer readable storage medium and terminal equipment | |
| CN110988851A (en) | Different-orbit single-satellite time-sharing frequency measurement positioning method based on star position optimization | |
| CN103033822B (en) | Mobile information confirmation device and mobile information confirmation method and receiving set | |
| CN105652297A (en) | Method and system for realizing real-time orbit determination for single satellite navigation positioning system | |
| CN103364799A (en) | Apparatus and method for determining navigation bit boundary, receiving machine, mobile equipment and method for satellite navigation and positioning | |
| CN108427127A (en) | The test method and device of baseband chip performance | |
| CN107806860A (en) | A kind of aerial survey of unmanned aerial vehicle is taken pictures the methods of accurate spatial locations | |
| CN108427126A (en) | The test method and device of baseband chip property at high and low temperature | |
| Yang et al. | Resilient smartphone positioning using native sensors and PPP augmentation | |
| Kumar et al. | The global positioning system: Popular accuracy measures | |
| JP2012088902A (en) | Positional relation determination device, positional relation determination method and positional relation determination program | |
| WO2024152673A1 (en) | Mobile terminal positioning method and apparatus, and device and storage medium | |
| CN103617332B (en) | A kind of emulation platform measuring satellite navigation algorithm performance and method | |
| CN112731268A (en) | Processing method of difference data and positioning and tracking system | |
| CN111736183A (en) | Precise single-point positioning method and device combining BDS2/BDS3 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |