CN108663694A - Baseband chip performance test methods and device - Google Patents
Baseband chip performance test methods and device Download PDFInfo
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- CN108663694A CN108663694A CN201810246379.2A CN201810246379A CN108663694A CN 108663694 A CN108663694 A CN 108663694A CN 201810246379 A CN201810246379 A CN 201810246379A CN 108663694 A CN108663694 A CN 108663694A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S19/00—Satellite radio beacon positioning systems; Determining position, velocity or attitude using signals transmitted by such systems
- G01S19/01—Satellite radio beacon positioning systems transmitting time-stamped messages, e.g. GPS [Global Positioning System], GLONASS [Global Orbiting Navigation Satellite System] or GALILEO
- G01S19/13—Receivers
- G01S19/23—Testing, monitoring, correcting or calibrating of receiver elements
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- Radar, Positioning & Navigation (AREA)
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- Computer Networks & Wireless Communication (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Position Fixing By Use Of Radio Waves (AREA)
Abstract
A kind of baseband chip performance test methods of present invention offer and device, baseband chip to be measured are set on test board, and this method includes：Under the corresponding test condition of performance test and N number of test scene, according to the corresponding test signal output rule of performance test test signal is exported to baseband chip to be measured, receive the positioning result that baseband chip to be measured exports within the testing time, determine that performance test parameter, performance test parameter are cold start-up primary positioning time, thermal starting primary positioning time or reacquisition time according to positioning result.Baseband chip startability under various circumstances can be tested or lock performance again, the selection for baseband chip in practical application provides foundation.
Description
Technical field
The present invention relates to electronic technology field more particularly to a kind of baseband chip performance test methods and device.
Background technology
Due to the particularity of maritime environment, the navigation equipment of boat-carrying with respect to the navigation equipment under conventional environment, reliability,
Shockproof, moisture-proof, high temperature-proof and anti-light direct beam etc. have higher requirement, therefore, shipborne navigational aid be required for by it is unified,
Stringent detection test program, using international uniform measurement standard and reach required test result and can install and go on board.
The chief component of shipborne navigational aid is baseband chip, is changed by external environment, the positioning of baseband chip
Precision also will produce variation.In actual application process, the positioning accuracy of baseband chip under various circumstances is needed to meet one
Provisioning request, maritime environment (temperature, humidity, the electromagnetic interference in the four seasons etc.) variation is big, can be in different rings with greater need for baseband chip
Reach required positioning accuracy under border, and the startability of baseband chip and to lock performance again be to have any different under different positioning accuracies
, therefore, in baseband chip using preceding needing to carry out startability to it and lock performance test again, startability test includes cold
Start primary positioning time test and thermal starting primary positioning time test, again lock performance test attach most importance to capture time test.
However, how to carry out baseband chip performance test, there is presently no an effective solution methods.
Invention content
The present invention provides a kind of baseband chip performance test methods and device, can test baseband chip under various circumstances
Startability locks performance again, and the selection for baseband chip in practical application provides foundation.
The first aspect of the present invention provides a kind of baseband chip performance test methods, and baseband chip to be measured is set to test board
On, this method includes：
It is defeated according to the corresponding test signal of performance test under the corresponding test condition of performance test and N number of test scene
Go out rule and exports test signal to the baseband chip to be measured；
Receive the positioning result that the baseband chip to be measured exports within the testing time；
Performance test parameter is determined according to the positioning result, when the performance test parameter is that cold start-up positions for the first time
Between, thermal starting primary positioning time or reacquisition time.
Optionally, the performance test parameter be cold start-up primary positioning time or thermal starting primary positioning time, it is described
The corresponding test signal of performance test exports rule：
Test signal is exported to the baseband chip to be measured；
It is described that performance test parameter is determined according to the positioning result, including：
It measures the baseband chip to be measured and meets the first of positioning accuracy request to output since receiving test signal
The time interval T of a positioning resulti, and according to corresponding N number of T under N number of test sceneiDetermine cold start-up primary positioning time or
Thermal starting primary positioning time.
Optionally, the performance test parameter is cold start-up primary positioning time, and the test condition includes：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/
s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable to No. two BD-2 satellites of at least 9 Big Dippeves, and the baseband chip to be measured chases after
Precision degree of strength PDOP≤5 of track satellite position, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 global position system GPS satellites, and institute
PDOP≤5 of baseband chip satellite tracking to be measured position are stated, the test signal is the corresponding frequency point signal of BD-2 satellites and GPS
The corresponding frequency point signal of satellite.
Optionally, the performance test parameter is thermal starting primary positioning time, and the test condition includes：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/
s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable to No. two BD-2 satellites of 12 Big Dippeves, and the baseband chip tracking to be measured is defended
PDOP≤5 that championship is set, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 GPS satellites, and the base band core to be measured
PDOP≤5 of piece satellite tracking position, the test signal are the corresponding frequency point signal of BD-2 satellites and the corresponding frequency of GPS satellite
Point signal.
Optionally, the performance test parameter is attached most importance to capture time, the corresponding test signal output rule of the performance test
It is then：
To the baseband chip output test signal to be measured survey is continued to output after interrupt output test signal first time
Trial signal；
The positioning result for receiving the baseband chip to be measured and being exported within the testing time, including：
Receive the positioning result that the baseband chip to be measured exports in the testing time after test signal interruption；
It is described that performance test parameter is determined according to the positioning result, including：
It measures and meets to output the baseband chip to be measured receives test signal again after test signal interruption
The time interval T of first positioning result of positioning accuracy requestj, and according to corresponding N number of T under N number of test scenejDetermine weight
Capture time.
Optionally, the test condition includes：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/
s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable at least 9 BD-2 satellites, and the baseband chip satellite tracking to be measured position
PDOP≤5 set, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable to 6 BD-2 satellites and 6 GPS satellites, and the baseband chip to be measured chases after
PDOP≤5 of track satellite position, the test signal are the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point letter of GPS satellite
Number.
Optionally, the positioning accuracy request is：Continuous 10 times of positioning result is less than 60 meters.
The second aspect of the present invention provides a kind of baseband chip performance testing device, and baseband chip to be measured is set to test board
On, which includes：
Signal output module is used under the corresponding test condition of performance test and N number of test scene, according to performance test
Corresponding test signal output rule exports test signal to the baseband chip to be measured；
Receiving module, the positioning result exported within the testing time for receiving the baseband chip to be measured；
Determining module, for determining that performance test parameter, the performance test parameter are cold open according to the positioning result
Dynamic primary positioning time, thermal starting primary positioning time or reacquisition time.
Optionally, the performance test parameter be cold start-up primary positioning time or thermal starting primary positioning time, it is described
The corresponding test signal of performance test exports rule：
Test signal is exported to the baseband chip to be measured；
Since the determining module fixed to output satisfaction receiving test signal for measuring the baseband chip to be measured
The time interval T of first positioning result of position required precisioni, and according to corresponding N number of T under N number of test sceneiDetermine cold open
Dynamic primary positioning time or thermal starting primary positioning time.
Optionally, the performance test parameter is cold start-up primary positioning time, and the test condition includes：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/
s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable to No. two BD-2 satellites of at least 9 Big Dippeves, and the baseband chip to be measured chases after
Precision degree of strength PDOP≤5 of track satellite position, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 global position system GPS satellites, and institute
PDOP≤5 of baseband chip satellite tracking to be measured position are stated, the test signal is the corresponding frequency point signal of BD-2 satellites and GPS
The corresponding frequency point signal of satellite.
Optionally, the performance test parameter is thermal starting primary positioning time, and the test condition includes：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/
s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable to No. two BD-2 satellites of 12 Big Dippeves, and the baseband chip tracking to be measured is defended
PDOP≤5 that championship is set, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 GPS satellites, and the base band core to be measured
PDOP≤5 of piece satellite tracking position, the test signal are the corresponding frequency point signal of BD-2 satellites and the corresponding frequency of GPS satellite
Point signal.
Optionally, the performance test parameter is attached most importance to capture time, the corresponding test signal output rule of the performance test
It is then：
To the baseband chip output test signal to be measured survey is continued to output after interrupt output test signal first time
Trial signal；
The receiving module is used to receive the baseband chip to be measured and is exported in the testing time after test signal interruption
Positioning result；
The determining module receives test letter again for measuring the baseband chip to be measured after test signal interruption
Number start to output meet positioning accuracy request first positioning result time interval Tj, and according under N number of test scene
Corresponding N number of TjDetermine the reacquisition time.
Optionally, the test condition includes：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/
s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable at least 9 BD-2 satellites, and the baseband chip satellite tracking to be measured position
PDOP≤5 set, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable to 6 BD-2 satellites and 6 GPS satellites, and the baseband chip to be measured chases after
PDOP≤5 of track satellite position, the test signal are the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point letter of GPS satellite
Number.
Optionally, positioning accuracy request is：Continuous 10 times of positioning result is less than 60 meters.
The third aspect of the present invention provides a kind of baseband chip performance testing device, including：It at least one processor and deposits
Reservoir；
The memory stores computer executed instructions；
At least one processor executes the computer executed instructions of the memory storage so that the baseband chip
Performance testing device executes above-mentioned baseband chip performance test methods.
The fourth aspect of the present invention provides a kind of computer readable storage medium, is deposited on the computer readable storage medium
Computer executed instructions are contained, when the computer executed instructions are executed by processor, realize that above-mentioned baseband chip performance is surveyed
Method for testing.
A kind of baseband chip performance test methods of present invention offer and device, by the corresponding test condition of performance test
Under N number of test scene, test signal is exported to baseband chip to be measured according to the corresponding test signal output rule of performance test.
Receive the positioning result that baseband chip to be measured exports within the testing time.Performance test parameter, performance are determined according to positioning result
Test parameter is cold start-up primary positioning time, thermal starting primary positioning time or reacquisition time.So as to test base band core
Piece startability under various circumstances locks performance again, and the selection for baseband chip in practical application provides foundation.
Description of the drawings
Fig. 1 is a kind of baseband chip performance test methods flow signal provided by the invention；
Fig. 2 is a kind of baseband chip performance test methods flow diagram provided by the invention；
Fig. 3 is that baseband chip performance testing device couples schematic block diagram with a kind of of equipment under test；
Fig. 4 is a kind of baseband chip performance test methods flow diagram provided by the invention；
Fig. 5 is a kind of structural schematic diagram of baseband chip performance testing device provided by the invention；
Fig. 6 is a kind of structural schematic diagram of baseband chip performance testing device provided by the invention.
Specific implementation mode
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with the embodiment of the present invention, to this
Technical solution in inventive embodiments is clearly and completely described, it is clear that described embodiment is that a part of the invention is real
Example is applied, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creation
Property labour under the premise of the every other embodiment that is obtained, shall fall within the protection scope of the present invention.
Baseband chip performance test methods provided by the invention can be used for the survey of Big Dipper compatible navigation type bimodulus baseband chip
Examination, it can also be used to the test of the single mode baseband chip of No. two Global Satellite Navigation System of Big Dipper No.1 and the Big Dipper.
Fig. 1 is a kind of baseband chip performance test methods flow diagram provided by the invention；Method flow shown in Fig. 1
Executive agent can be baseband chip performance testing device, the baseband chip performance testing device can by arbitrary software and/or
Hardware realization.As shown in Figure 1, baseband chip performance test methods provided in this embodiment may include：
S101, under the corresponding test condition of performance test and N number of test scene, believed according to the corresponding test of performance test
Number output rule to baseband chip to be measured export test signal.
S102, the positioning result that baseband chip to be measured exports within the testing time is received.
S103, determine that performance test parameter, performance test parameter are cold start-up primary positioning time, heat according to positioning result
Start primary positioning time or reacquisition time.
Specifically, the performance test in the present embodiment includes startability test and locks performance test again, performance test ginseng
When number is cold start-up primary positioning time or thermal starting primary positioning time, the corresponding test signal output rule of performance test
For：Test signal is exported to baseband chip to be measured.S103 is specifically as follows at this time：Measure baseband chip to be measured from receive test
Signal starts to output the time interval T for meeting first positioning result of positioning accuracy requesti, and according to N number of test scene
Under corresponding N number of TiDetermine cold start-up primary positioning time or thermal starting primary positioning time.
Performance test parameter attach most importance to capture time when, performance test corresponding test signal output rule is：To base to be measured
Microarray strip output test signal continues to output test signal after interrupt output test signal first time.S102 specifically may be used at this time
Think：Receive the positioning result that baseband chip to be measured exports in the testing time after test signal interruption.S103 is specific at this time
Can be：It measures and meets positioning accurate to output baseband chip to be measured receives test signal again after test signal interruption
Spend the time interval T of first desired positioning resultj, and according to corresponding N number of T under N number of test scenejWhen determining reacquisition
Between.
Optionally, positioning accuracy request is：Continuous 10 times of positioning result is less than 60 meters.
Baseband chip performance test methods provided in this embodiment, by the corresponding test condition of performance test and N number of
Under test scene, test signal is exported to baseband chip to be measured according to the corresponding test signal output rule of performance test.It receives
The positioning result that baseband chip to be measured exports within the testing time.Performance test parameter, performance test are determined according to positioning result
Parameter is cold start-up primary positioning time, thermal starting primary positioning time or reacquisition time.Exist so as to test baseband chip
Startability under varying environment locks performance again, and the selection for baseband chip in practical application provides foundation.
Fig. 2 is a kind of baseband chip performance test methods flow diagram provided by the invention；Method flow shown in Fig. 2
Executive agent can be baseband chip performance testing device, the baseband chip performance testing device can by arbitrary software and/or
Hardware realization.As shown in Fig. 2, baseband chip performance test methods provided in this embodiment may include：
S201, in the case where startability tests corresponding test condition and N number of test scene, export and survey to baseband chip to be measured
Trial signal, and receive the positioning result that baseband chip to be measured exports within the testing time.
Wherein, in test, baseband chip to be measured needs mating bottom plate, which is set on test board, should
Bottom plate can be fixed on test board, and to prevent ship bottom plate during traveling from moving, which can be with
It is OEM plates for circuit board, such as test board, baseband chip to be measured is provided on the bottom plate, without other assisting navigation device
Or low noise device etc..
Specifically, baseband chip to be measured is arranged on test board, and test board is arranged in equipment under test, and Fig. 3 is base band core
Piece performance test device couples schematic block diagram, the baseband chip performance testing device and quilt of the present embodiment with a kind of of equipment under test
The connection of measurement equipment is as shown in figure 3, baseband chip performance testing device can optionally lead to equipment under test output test signal
Radio frequency (RF) interface output radiofrequency signal on test board is crossed, baseband chip performance testing device also exports control to equipment under test
Signal, control equipment under test are powered on and off；Equipment under test exports positioning result to baseband chip performance testing device.
Specifically, startability test includes that the test of cold start-up primary positioning time and thermal starting primary positioning time are surveyed
Examination, cold start-up primary positioning time refer to baseband chip to be measured (also referred to as equipment under test) without effective ephemeris, almanac, general location
And under the information conditions such as time, from the time required when powering up to first fit positioning accuracy request.When thermal starting positions for the first time
Between refer to baseband chip to be measured (also referred to as equipment under test) under the information conditions such as effective ephemeris, almanac, general location and time,
Required time when since power-up to first fit positioning accuracy request.
First, during the test, the baseband chip performance testing device in the present embodiment, which first emulates, generates N number of checkout area
Scape, N are preset value, and different test scenes such as temperature, humidity and electromagnetic interference etc. is different.Then the base band core in the present embodiment
Test condition is arranged in piece performance test device, optionally, is tested if startability test is cold start-up primary positioning time, test
Condition includes：1) satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；2) it surveys
The maximum speed of ship where test plate (panel) is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/s2, acceleration is most
Big change rate is less than or equal to 0.05m/s3；3) under single mode (BD) pattern, baseband chip to be measured is traceable at least 9 Big Dippeves
No. two BD-2 satellites, and the precision degree of strength (PDOP)≤5 of baseband chip satellite tracking to be measured position, test signal is defended for BD-2
The corresponding frequency point signal of star, such as B1 frequency point I tributary signals；Alternatively, under bimodulus pattern, such as BD+ global positioning systems (Global
Positioning system, GPS) pattern, baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 GPS satellites,
And PDOP≤5 of baseband chip satellite tracking to be measured position, test signal are the corresponding frequency point signal of BD-2 satellites and GPS satellite
Corresponding frequency point signal, such as B1 frequency point I tributary signals and L1 frequency point I tributary signals.
It is tested if startability test is thermal starting primary positioning time, test condition includes：1) satellite orbit, satellite clock
Difference, ionospheric delay and troposphere time delay are set as no time-varying error mode；2) maximum speed of ship where test board is less than
Or it is equal to 30m/s, peak acceleration is less than or equal to 0.5m/s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；
3) under single BD patterns, baseband chip to be measured is traceable to No. two (BD-2) satellites of 12 Big Dippeves, and baseband chip to be measured is tracked
PDOP≤5 of satellite position, test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively, under bimodulus pattern (BD+GPS),
Baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 GPS satellites, and baseband chip satellite tracking to be measured position
PDOP≤5, test signal are the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point signal of GPS satellite.
Optionally, test signal power may be configured as -130dBm.
After baseband chip performance testing device in the present embodiment is according to the corresponding test condition of startability test setting,
Baseband chip power-up to be measured is controlled, i.e., exports test signal to baseband chip to be measured, it is real after baseband chip receives test signal
When export positioning result, such as 2 minutes testing time, the baseband chip performance testing device in the present embodiment receives base band to be measured
The positioning result that chip exports within the testing time.
Since S202, measurement baseband chip to be measured meet the first of positioning accuracy request receiving test signal to output
The time interval T of a positioning resulti, and according to corresponding N number of T under N number of test sceneiDetermine cold start-up primary positioning time or
Thermal starting primary positioning time.
In the present embodiment, optionally, positioning accuracy request is positioning result continuous 10 times less than 60 meters.Each checkout area
Under scape, since the device measurement baseband chip to be measured in the present embodiment meet positioning accuracy receiving test signal to output wants
The time interval T for first positioning result askedi, after the completion of test under a test scene, power off, the device in the present embodiment
Another test scene is replaced, the information such as ephemeris, almanac, the location and time of baseband chip preservation to be measured is made to be in failure shape
State.It is continuing with corresponding test condition duplicate measurements and obtains corresponding N number of T under N number of test scenei, finally according to N number of TiReally
Determine cold start-up primary positioning time or thermal starting primary positioning time, optionally, first determines N number of TiIn M validity test knot
Fruit, if M is less than preset value, this test invalidation does not pass through, if M is more than preset value, takes M TiAverage value, such as N
It is 10, preset value 9, if effectively result is less than 9, this test invalidation does not pass through, if effectively result is equal to 9, takes
The average value of 9 effective results, as cold start-up primary positioning time or thermal starting primary positioning time.
Baseband chip performance test methods provided in this embodiment, by startability test corresponding test condition and
Under N number of test scene, test signal is exported to baseband chip to be measured, and receive what baseband chip to be measured exported within the testing time
Since positioning result then measure baseband chip to be measured and meet the first of positioning accuracy request to output receiving test signal
The time interval T of a positioning resulti, and according to corresponding N number of T under N number of test sceneiDetermine cold start-up primary positioning time or
Thermal starting primary positioning time is base band in practical application so as to test the startability of baseband chip under various circumstances
The selection of chip provides foundation.
Fig. 4 is a kind of baseband chip performance test methods flow diagram provided by the invention；Method flow shown in Fig. 4
Executive agent can be baseband chip performance testing device, the baseband chip performance testing device can by arbitrary software and/or
Hardware realization.As shown in figure 4, baseband chip performance test methods provided in this embodiment may include：
S301, under the multiple corresponding test condition of lock performance test and N number of test scene, to baseband chip to be measured export survey
Trial signal continues to output test signal after the second time of interrupt output test signal, and receives baseband chip to be measured and export in real time
Positioning result.
Wherein, identically as embodiment illustrated in fig. 1, in test, baseband chip to be measured needs mating bottom plate, by this
Bottom plate is set on test board, which can be fixed on test board, to prevent ship bottom plate during traveling
It moves, which can be circuit board, such as test board is OEM plates, is provided with baseband chip to be measured on the bottom plate, no
Containing other assisting navigation devices or low noise device etc..
Specifically, baseband chip to be measured is arranged on test board, and test board is arranged in equipment under test, the base of the present embodiment
The connecting relation of microarray strip performance testing device and equipment under test can be as shown in figure 3, details are not described herein again.
Specifically, again lock performance test attach most importance to capture time test, the reacquisition time is during signal occurs in a short time
When disconnected, the time required when meeting positioning accuracy request is restored to from signal.The reacquisition time can characterize the multiple lock of baseband chip
Performance.
First, during the test, the baseband chip performance testing device in the present embodiment, which first emulates, generates N number of checkout area
Scape, N are preset value, and different test scenes such as temperature, humidity and electromagnetic interference etc. is different.Then the base band core in the present embodiment
Test condition is arranged in piece performance test device, and optionally, test condition includes：1) satellite orbit, satellite clock correction, ionospheric delay
It is set as no time-varying error mode with troposphere time delay；2) maximum speed of ship where test board is less than or equal to 30m/s, most
High acceleration is less than or equal to 0.5m/s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；3) under single BD patterns,
Baseband chip to be measured is traceable at least 9 BD-2 satellites, and PDOP≤5 of baseband chip satellite tracking to be measured position, test
Signal is the corresponding frequency point signal of BD-2 satellites；Alternatively, under bimodulus pattern (BD+GPS), baseband chip to be measured is traceable to 6
BD-2 satellites and 6 GPS satellites, and PDOP≤5 of baseband chip satellite tracking to be measured position, test signal are BD-2 satellites
Corresponding frequency point signal and the corresponding frequency point signal of GPS satellite.
Optionally, test signal power may be configured as -130dBm.
After corresponding test condition is arranged according to multiple lock performance test in baseband chip performance testing device in the present embodiment,
Test signal is exported to baseband chip to be measured, such as is exported by 2Hz, and is normally positioned, exports positioning result, then interrupt output
After second time of test signal, the second time was, for example, 30 seconds, continued to output test signal, such as 2 minutes testing time, this reality
Apply the baseband chip performance testing device in example receive baseband chip to be measured test signal interruption after testing time in export
Positioning result.
Since S302, measurement baseband chip to be measured meet the first of positioning accuracy request receiving test signal to output
The time interval T of a positioning resultj, and according to corresponding N number of T under N number of test scenejDetermine the reacquisition time.
Specifically, it measures full to output baseband chip to be measured receives test signal again after test signal interruption
The time interval T of first positioning result of sufficient positioning accuracy requestj, in the present embodiment, optionally, positioning accuracy request is fixed
Continuous 10 times of the result in position is less than 60 meters.Under each test scene, the device in the present embodiment measures Tj, under a test scene
After the completion of test, the device in the present embodiment replaces another test scene, is continuing with corresponding test condition duplicate measurements
Obtain corresponding N number of T under N number of test scenej, finally according to N number of TjIt determines the reacquisition time, optionally, first determines N number of TjIn
M validity test as a result, if M is less than preset value, this test invalidation do not pass through, if M is more than preset value, takes M Tj
Average value, such as N be 10, preset value 9, if effectively result be less than 9, this test invalidation does not pass through, if effectively knot
Fruit is equal to 9, then the average value of 9 effective results is taken, as the reacquisition time.
Baseband chip performance test methods provided in this embodiment, by the corresponding test condition of multiple lock performance test and
Under N number of test scene, continued to output after the second time of interrupt output test signal to baseband chip to be measured output test signal
Test signal, and receive the positioning result that baseband chip to be measured exports in real time then measures baseband chip to be measured and surveys from receiving
Trial signal starts to output the time interval T for meeting first positioning result of positioning accuracy requestj, and according to N number of checkout area
Corresponding N number of T under scapejDetermine the reacquisition time.It is practical so as to test the multiple lock performance of baseband chip under various circumstances
The selection of baseband chip provides foundation in.
It should be noted that in Fig. 1 and embodiment shown in Fig. 2, it is N number of that baseband chip performance testing device first emulates generation
After test scene, test condition can be first set, test cold start-up primary positioning time and thermal starting primary positioning time successively, connect
Setting test condition, the reacquisition time is tested, baseband chip is finally obtained and starts and lock again performance, is base band in practical application
The selection of chip provides foundation.
Fig. 5 is a kind of structural schematic diagram of baseband chip performance testing device provided by the invention, if Fig. 5 shows, the base band
Chip performance test device includes：Signal output module 11, receiving module 12 and determining module 13, wherein
Signal output module 11 is used under the corresponding test condition of performance test and N number of test scene, is surveyed according to performance
It tries corresponding test signal output rule and exports test signal to baseband chip to be measured.
Receiving module 12 is for receiving the positioning result that baseband chip to be measured exports within the testing time.
Determining module 13 is used to determine that performance test parameter, performance test parameter are that cold start-up is fixed for the first time according to positioning result
Position time, thermal starting primary positioning time or reacquisition time.
Optionally, performance test parameter is cold start-up primary positioning time or thermal starting primary positioning time, performance test
Corresponding test signal exports rule：Test signal is exported to baseband chip to be measured.Determining module 13 is for measuring base to be measured
Since microarray strip meet the time interval T of first positioning result of positioning accuracy request receiving test signal to outputi,
And according to corresponding N number of T under N number of test sceneiDetermine cold start-up primary positioning time or thermal starting primary positioning time.
In the present embodiment, optionally, positioning accuracy request is：Continuous 10 times of positioning result is less than 60 meters.
Optionally, if performance test parameter is cold start-up primary positioning time, test condition includes：1) satellite orbit, defend
Star clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；2) maximum speed of ship where test board
Less than or equal to 30m/s, peak acceleration is less than or equal to 0.5m/s2, the maximum rate of change of acceleration is less than or equal to
0.05m/s3；3) under single mode (BD) pattern, baseband chip to be measured is traceable to No. two BD-2 satellites of at least 9 Big Dippeves, and waits for
The precision degree of strength (PDOP)≤5 of baseband chip satellite tracking position is surveyed, test signal is the corresponding frequency point signal of BD-2 satellites；
Alternatively, under bimodulus pattern, such as BD+ global positioning systems (Global positioning system, GPS) pattern, base to be measured
Microarray strip is traceable at least 6 BD-2 satellites and 6 GPS satellites, and the PDOP of baseband chip satellite tracking to be measured position≤
5, test signal is the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point signal of GPS satellite.
If performance test parameter is thermal starting primary positioning time, test condition includes：1) satellite orbit, satellite clock correction,
Ionospheric delay and troposphere time delay are set as no time-varying error mode；2) maximum speed of ship where test board is less than or waits
In 30m/s, peak acceleration is less than or equal to 0.5m/s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；3) exist
Under single BD patterns, baseband chip to be measured is traceable to No. two (BD-2) satellites of 12 Big Dippeves, and baseband chip satellite tracking to be measured
PDOP≤5 of position, test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively, under bimodulus pattern (BD+GPS), it is to be measured
Baseband chip is traceable at least 6 BD-2 satellites and 6 GPS satellites, and the PDOP of baseband chip satellite tracking to be measured position
≤ 5, test signal is the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point signal of GPS satellite.
Optionally, test signal power may be configured as -130dBm.
Optionally, performance test parameter is attached most importance to capture time, and the corresponding test signal output rule of performance test is：To waiting for
It surveys baseband chip output test signal and continues to output test signal after interrupt output test signal first time.Receiving module 12
The positioning result exported in the testing time after test signal interruption for receiving baseband chip to be measured.Determining module 13 is used for
It measures and meets positioning accuracy request to output baseband chip to be measured receives test signal again after test signal interruption
First positioning result time interval Tj, and according to corresponding N number of T under N number of test scenejDetermine the reacquisition time.
Optionally, test condition includes：1) satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as
Without time-varying error mode；2) maximum speed of ship where test board is less than or equal to 30m/s, and peak acceleration is less than or equal to
0.5m/s2, the maximum rate of change of acceleration is less than or equal to 0.05m/s3；3) under single BD patterns, baseband chip to be measured is traceable
To at least 9 BD-2 satellites, and PDOP≤5 of baseband chip satellite tracking to be measured position, test signal correspond to for BD-2 satellites
Frequency point signal；Alternatively, under bimodulus pattern (BD+GPS), baseband chip to be measured is traceable to 6 BD-2 satellites and 6 GPS
Satellite, and PDOP≤5 of baseband chip satellite tracking to be measured position, test signal be the corresponding frequency point signal of BD-2 satellites and
The corresponding frequency point signal of GPS satellite.
Optionally, test signal power may be configured as -130dBm.
The original that baseband chip performance testing device provided in this embodiment is realized with above-mentioned baseband chip performance test methods
Reason is similar with technique effect, and details are not described herein again.
Fig. 6 is a kind of structural schematic diagram of baseband chip performance testing device provided by the invention, the baseband chip performance
Test device for example can be terminal device, such as smart mobile phone, tablet computer, computer etc..As shown in fig. 6, the base band core
Piece performance test device 400 includes：Memory 401 and at least one processor 402.
Memory 401, for storing program instruction.
Processor 402, the baseband chip performance test methods for being performed in program instruction in realizing the present embodiment,
Specific implementation principle can be found in above-described embodiment, and details are not described herein again.
The baseband chip performance testing device can also include input/output interface 403.Input/output interface 403 can be with
Including independent output interface and input interface, or the integrated integrated interface output and input.Wherein, output interface is used
In output data, input interface is used to obtain the data of input, and the data of above-mentioned output are to be exported in above method embodiment
It is referred to as, the data of input are the general designation inputted in above method embodiment.
The present invention also provides a kind of readable storage medium storing program for executing, it is stored with and executes instruction in readable storage medium storing program for executing, work as baseband chip
When at least one processor of performance testing device executes this and executes instruction, when computer executed instructions are executed by processor,
Realize the baseband chip performance test methods in above-described embodiment.
The present invention also provides a kind of program product, the program product include execute instruction, this execute instruction be stored in it is readable
In storage medium.At least one processor of baseband chip performance testing device can read the execution from readable storage medium storing program for executing and refer to
It enables, at least one processor executes this and executes instruction so that baseband chip performance testing device implements above-mentioned various embodiments
The baseband chip performance test methods of offer.
In several embodiments provided by the present invention, it should be understood that disclosed device and method can pass through it
Its mode is realized.For example, the apparatus embodiments described above are merely exemplary, for example, the division of unit, only
A kind of division of logic function, formula that in actual implementation, there may be another division manner, such as multiple units or component can combine or
Person is desirably integrated into another system, or some features can be ignored or not executed.Another point, shown or discussed is mutual
Between coupling, direct-coupling or communication connection can be INDIRECT COUPLING or communication link by some interfaces, device or unit
It connects, can be electrical, machinery or other forms.
The unit illustrated as separating component may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, you can be located at a place, or may be distributed over multiple
In network element.Some or all of unit therein can be selected according to the actual needs to realize the mesh of this embodiment scheme
's.
In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, it can also
It is that each unit physically exists alone, it can also be during two or more units be integrated in one unit.Above-mentioned integrated list
The form that hardware had both may be used in member is realized, can also be realized in the form of hardware adds SFU software functional unit.
The above-mentioned integrated unit being realized in the form of SFU software functional unit can be stored in one and computer-readable deposit
In storage media.Above-mentioned SFU software functional unit is stored in a storage medium, including some instructions are used so that a computer
Equipment (can be personal computer, server or the network equipment etc.) or processor (English：Processor this hair) is executed
The part steps of bright each embodiment the method.And storage medium above-mentioned includes：USB flash disk, mobile hard disk, read-only memory
(English：Read-Only Memory, referred to as：ROM), random access memory (English：Random Access Memory, letter
Claim：RAM), the various media that can store program code such as magnetic disc or CD.
In the embodiment of the above-mentioned network equipment or terminal device, it should be appreciated that processor can be central processing unit
(English：Central Processing Unit, referred to as：CPU), it can also be other general processors, digital signal processor
(English：Digital Signal Processor, referred to as：DSP), application-specific integrated circuit (English：Application
Specific Integrated Circuit, referred to as：ASIC) etc..General processor can be microprocessor or the processor
It can also be any conventional processor etc..Hardware handles can be embodied directly in conjunction with the step of method disclosed in the present application
Device executes completion, or in processor hardware and software module combination execute completion.
Finally it should be noted that：The above embodiments are only used to illustrate the technical solution of the present invention., rather than its limitations；To the greatest extent
Present invention has been described in detail with reference to the aforementioned embodiments for pipe, it will be understood by those of ordinary skill in the art that：Its according to
So can with technical scheme described in the above embodiments is modified, either to which part or all technical features into
Row equivalent replacement；And these modifications or replacements, various embodiments of the present invention technology that it does not separate the essence of the corresponding technical solution
The range of scheme.
Claims (10)
1. a kind of baseband chip performance test methods, which is characterized in that baseband chip to be measured is set on test board, the method
Including：
Under the corresponding test condition of performance test and N number of test scene, according to the corresponding test signal output rule of performance test
Then test signal is exported to the baseband chip to be measured；
Receive the positioning result that the baseband chip to be measured exports within the testing time；
Determine that performance test parameter, the performance test parameter are cold start-up primary positioning time, heat according to the positioning result
Start primary positioning time or reacquisition time.
2. test method according to claim 1, which is characterized in that the performance test parameter is that cold start-up positions for the first time
Time or thermal starting primary positioning time, the corresponding test signal output rule of the performance test are：
Test signal is exported to the baseband chip to be measured；
It is described that performance test parameter is determined according to the positioning result, including：
The baseband chip to be measured is measured since receiving test signal to determine to first that output meets positioning accuracy request
The time interval T of position resulti, and according to corresponding N number of T under N number of test sceneiDetermine that cold start-up primary positioning time or heat open
Dynamic primary positioning time.
3. test method according to claim 2, which is characterized in that the performance test parameter is that cold start-up positions for the first time
Time, the test condition include：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/s2, add
The maximum rate of change of speed is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable to No. two BD-2 satellites of at least 9 Big Dippeves, and the baseband chip tracking to be measured is defended
Precision degree of strength PDOP≤5 that championship is set, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 global position system GPS satellites, and described waits for
PDOP≤5 of baseband chip satellite tracking position are surveyed, the test signal is the corresponding frequency point signal of BD-2 satellites and GPS satellite
Corresponding frequency point signal.
4. test method according to claim 2, which is characterized in that the performance test parameter is that thermal starting positions for the first time
Time, the test condition include：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/s2, add
The maximum rate of change of speed is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable to No. two BD-2 satellites of 12 Big Dippeves, and the baseband chip satellite tracking to be measured position
PDOP≤5 set, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable at least 6 BD-2 satellites and 6 GPS satellites, and the baseband chip to be measured chases after
PDOP≤5 of track satellite position, the test signal are the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point letter of GPS satellite
Number.
5. test method according to claim 1, which is characterized in that the performance test parameter is attached most importance to capture time, institute
Stating the corresponding test signal output rule of performance test is：
Test signal is exported to the baseband chip to be measured, after interrupt output test signal first time, continues to output test letter
Number；
The positioning result for receiving the baseband chip to be measured and being exported within the testing time, including：
Receive the positioning result that the baseband chip to be measured exports in the testing time after test signal interruption；
It is described that performance test parameter is determined according to the positioning result, including：
It measures and meets positioning to output the baseband chip to be measured receives test signal again after test signal interruption
The time interval T of first positioning result of required precisionj, and according to corresponding N number of T under N number of test scenejDetermine reacquisition
Time.
6. test method according to claim 5, which is characterized in that the test condition includes：
Satellite orbit, satellite clock correction, ionospheric delay and troposphere time delay are set as no time-varying error mode；
The maximum speed of ship where the test board is less than or equal to 30m/s, and peak acceleration is less than or equal to 0.5m/s2, add
The maximum rate of change of speed is less than or equal to 0.05m/s3；
The baseband chip to be measured is traceable at least 9 BD-2 satellites, and the baseband chip satellite tracking to be measured position
PDOP≤5, the test signal are the corresponding frequency point signal of BD-2 satellites；Alternatively,
The baseband chip to be measured is traceable to 6 BD-2 satellites and 6 GPS satellites, and the baseband chip tracking to be measured is defended
PDOP≤5 that championship is set, the test signal are the corresponding frequency point signal of BD-2 satellites and the corresponding frequency point signal of GPS satellite.
7. the test method according to claim 2 or 5, which is characterized in that the positioning accuracy request is：Positioning result connects
Continuous 10 times less than 60 meters.
8. a kind of baseband chip performance testing device, which is characterized in that baseband chip to be measured is set on test board, described device
Including：
Signal output module, under the corresponding test condition of performance test and N number of test scene, being corresponded to according to performance test
Test signal output rule export test signal to the baseband chip to be measured；
Receiving module, the positioning result exported within the testing time for receiving the baseband chip to be measured；
Determining module, for determining that performance test parameter, the performance test parameter are that cold start-up is first according to the positioning result
Secondary positioning time, thermal starting primary positioning time or reacquisition time.
9. a kind of baseband chip performance testing device, which is characterized in that including：At least one processor and memory；
The memory stores computer executed instructions；
At least one processor executes the computer executed instructions of the memory storage so that a kind of baseband chip performance
Test device perform claim requires 1-7 any one of them methods.
10. a kind of computer readable storage medium, which is characterized in that be stored with computer on the computer readable storage medium
It executes instruction, when the computer executed instructions are executed by processor, realizes claim 1-7 any one of them methods.
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