CN118237281B - Testing system, method, equipment and medium for phased array radar microwave assembly - Google Patents
Testing system, method, equipment and medium for phased array radar microwave assembly Download PDFInfo
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- CN118237281B CN118237281B CN202410666732.8A CN202410666732A CN118237281B CN 118237281 B CN118237281 B CN 118237281B CN 202410666732 A CN202410666732 A CN 202410666732A CN 118237281 B CN118237281 B CN 118237281B
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- 238000012360 testing method Methods 0.000 title claims abstract description 196
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/38—Collecting or arranging articles in groups
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
- G01S7/4004—Means for monitoring or calibrating of parts of a radar system
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C2501/00—Sorting according to a characteristic or feature of the articles or material to be sorted
- B07C2501/0063—Using robots
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- Engineering & Computer Science (AREA)
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- Radar Systems Or Details Thereof (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The application discloses a testing system, a testing method, testing equipment and testing media for a phased array radar microwave assembly, wherein the testing method comprises the following steps: grabbing the assembly through a pre-configured mechanical arm, positioning the assembly through the mechanical arm, and installing the positioned assembly so as to connect the assembly with a test tool; determining a microwave signal corresponding to the component by a tester, and testing the component according to the microwave signal to obtain a test result; the method comprises the steps of obtaining a test result through test software, generating a test report according to the test result, classifying the components according to the test report to obtain a classification result, and enabling the mechanical arm to assemble the components according to the classification result. The application realizes automatic assembly, automatic test, automatic disassembly and assembly and type sorting of the phased array radar microwave assembly, realizes unattended operation, greatly reduces the burden of testers, shortens the test time of products and improves the production capacity.
Description
Technical Field
The application relates to the technical field of computers, in particular to a testing system, a testing method, testing equipment and testing media for a phased array radar microwave assembly.
Background
The automatic testing equipment for the phased array radar microwave assembly is mainly used for automatically testing a receiver, a TR assembly, a T assembly/R assembly, a frequency synthesis module, a power division network and the like. The phased array radar microwave assembly automatic test equipment developed by a plurality of domestic enterprises and research institutions comprises a test tool, an automatic test console, a test instrument, automatic test software and the like. The automatic test software is a control core of the automatic test equipment of the phased array radar microwave assembly, the operation hardware platform is an industrial personal computer, and the industrial personal computer controls equipment such as a test instrument, an automatic test console and the like through a switch to realize the working operation of the whole system.
At present, in the step of testing tool jigs, a mode of simultaneously testing a plurality of identical jigs is mostly adopted so as to meet the requirement of quick workpiece discharging of a production line. The circuit board to be tested is required to be manually placed on the jig, and is taken down after the test is completed and placed in a qualified product placement area or a disqualified product placement area respectively according to the test result. The same I-shaped structure is repeated by a plurality of jigs, which consumes labor and can cause artificial defective products.
Disclosure of Invention
In order to solve the above-mentioned problems, the present application proposes a testing system of a phased array radar microwave assembly, comprising, in one example: the mechanical arm comprises a mechanical arm, a positioner and a camera; the manipulator is used for grabbing the component and placing the component on a preset workbench; the camera is used for shooting and scanning the assembly to determine basic information and placement positions of the assembly; the locator is used for locating the assembly according to the placement position; a test module including a plurality of testers; the tester is used for testing the assembly to obtain a test result; the control module comprises a test instrument gating device, a radio frequency channel gating device and a test tool; the testing tool is used for fixing the assembly and connecting the fixed assembly with a switch matrix of the testing tool so that the assembly is respectively connected with the testing instrument gating device and the radio frequency channel gating device through the switch matrix; the test instrument gating device is used for determining a tester corresponding to the component; the radio frequency channel gate is used for determining a test radio frequency channel of the component.
In one example, the tester includes a microwave power meter, a vector network analyzer, and a microwave signal source; the microwave signal source is used for determining a microwave signal so as to test the component according to the microwave signal to obtain feedback information, and the feedback signal is sent to the microwave power meter and the vector network analyzer to obtain the test result.
In one example, the control module further includes a temperature sensor, a heddle controller; the temperature sensor is used for detecting the temperature of the component when being tested; the comprehensive control machine is used for acquiring a test result of the tester, acquiring the temperature, comparing the temperature with a preset threshold value, determining a high-temperature signal if the temperature is greater than the threshold value, and determining a power-off command according to the high-temperature signal.
In one example, the control module further includes a standard control power supply; the standard control power supply is used for providing power for the tester, acquiring the power supply cut-off command and powering off the tester according to the power supply cut-off command.
In one example, further comprising: the software module is arranged in a predetermined server and is used for collecting the test result of the component and carrying out data processing on the test result to generate a test report, wherein the test report comprises test data and a component qualification index; the software module is also used for determining an operation instruction according to the test report so as to control the mechanical arm according to the operation instruction.
In one example, further comprising: the transfer box group is arranged on the workbench; the transfer box group comprises a qualified transfer box and an unqualified transfer box; the transfer box group is used for placing the tested components.
In one example, the locator includes an optical locator and a secondary locator; the optical positioner is used for acquiring the image information of the camera and determining position information according to the image information; the secondary positioner is used for determining the difference between the position information and a preset standard position and feeding the difference back to the manipulator so as to position the component through the manipulator.
In another aspect, the present application further provides a method for testing a phased array radar microwave assembly, which is characterized in that the method is applied to a testing system of a phased array radar microwave assembly as described in any of the above examples, and the method includes: grabbing a component through a pre-configured mechanical arm, positioning the component through the mechanical arm, and installing the positioned component so as to connect the component with a tester; determining a microwave signal corresponding to the component through the tester, and testing the component according to the microwave signal to obtain a test result; and acquiring the test result through test software, generating a test report according to the test result, and classifying the assembly according to the test report to obtain a classification result, so that the mechanical arm assembles the assembly according to the classification result.
In another aspect, the present application also provides a testing device for a phased array radar microwave assembly, including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the test apparatus of the phased array radar microwave assembly to perform: grabbing a component through a pre-configured mechanical arm, positioning the component through the mechanical arm, and installing the positioned component so as to connect the component with a tester; determining a microwave signal corresponding to the component through the tester, and testing the component according to the microwave signal to obtain a test result; and acquiring the test result through test software, generating a test report according to the test result, and classifying the assembly according to the test report to obtain a classification result, so that the mechanical arm assembles the assembly according to the classification result.
In another aspect, the present application also provides a non-volatile computer storage medium storing computer-executable instructions configured to: grabbing a component through a pre-configured mechanical arm, positioning the component through the mechanical arm, and installing the positioned component so as to connect the component with a tester; determining a microwave signal corresponding to the component through the tester, and testing the component according to the microwave signal to obtain a test result; and acquiring the test result through test software, generating a test report according to the test result, and classifying the assembly according to the test report to obtain a classification result, so that the mechanical arm assembles the assembly according to the classification result.
The application realizes automatic assembly, automatic test, automatic disassembly and assembly and type sorting of the phased array radar microwave assembly, realizes unattended operation, greatly reduces the burden of testers, shortens the test time of products and improves the production capacity.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute a limitation on the application. In the drawings:
FIG. 1 is a schematic flow chart of a method for testing a phased array radar microwave assembly according to an embodiment of the application;
fig. 2 is a schematic diagram of a testing apparatus for a phased array radar microwave assembly according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be clearly and completely described below with reference to specific embodiments of the present application and corresponding drawings. It will be apparent that the described embodiments are only some, but not all, embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
The following describes in detail the technical solutions provided by the embodiments of the present application with reference to the accompanying drawings.
In order to solve the problems, the embodiment of the application provides a testing system of a phased array radar microwave assembly, which comprises a mechanical arm, a testing module, a control module, a software module and a transfer box group.
The mechanical arm comprises a mechanical arm, a positioner and a camera; the manipulator is used for grabbing the components and placing the components on a preset workbench; the camera is used for shooting and scanning the component so as to determine the basic information and the placement position of the component; the locator is used for locating the assembly according to the placement position. The positioner comprises an optical positioner and a secondary positioner; the optical positioner is used for acquiring the image information of the camera and determining the position information according to the image information; the secondary positioner is used for determining the difference between the position information and a preset standard position and feeding the difference back to the manipulator so as to position the assembly through the manipulator.
A test module including a plurality of testers; the tester is used for testing the assembly to obtain a test result; the tester comprises a microwave power meter, a vector network analyzer and a microwave signal source; the microwave signal source is used for determining a microwave signal so as to test the component according to the microwave signal to obtain feedback information, and the feedback signal is sent to the microwave power meter and the vector network analyzer to obtain a test result.
The control module comprises a test instrument gate, a radio frequency channel gate, a test fixture, a temperature sensor, a comprehensive control machine and a standard control power supply; the testing tool is used for fixing the component and connecting the fixed component with a switch matrix of the testing tool so that the component is respectively connected with the testing instrument gating device and the radio frequency channel gating device through the switch matrix; the test instrument gating device is used for determining a tester corresponding to the component; the radio frequency channel gate is used to determine a test radio frequency channel for the component. The temperature sensor is used for detecting the temperature of the component when the component is tested; the comprehensive control machine is used for acquiring a test result of the tester, acquiring temperature, comparing the temperature with a preset threshold value, determining a high-temperature signal if the temperature is greater than the threshold value, and determining a power-off command according to the high-temperature signal. The standard control power supply is used for providing power for the tester, and is also used for acquiring a power-off command and powering off the tester according to the power-off command.
The software module is arranged in a predetermined server and is used for collecting the test result of the component and carrying out data processing on the test result to generate a test report, wherein the test report comprises test data and a component qualification index; the software module is also used for determining an operation instruction according to the test report so as to control the mechanical arm according to the operation instruction.
The transfer box group is arranged on the workbench; the transfer box group comprises a qualified transfer box, a disqualified transfer box and a test product box; the transfer box group is used for placing components before and after the test.
In one embodiment, the existing conditions are tested according to the production of the phased array radar microwave assembly, and simultaneously the tester and the control module are integrated and placed on one side of the testing system by combining the conditions of the microwave assembly; test fixture, the locator, 4 transfer boxes are placed on the exclusive workstation of phased array radar microwave subassembly customization, test fixture, the locator, 4 transfer box designs and workstation adopt special locking positioner and locating pin, arm installation fixed base and workstation locating pin and screw fixation simultaneously, ensure to use the coordinate system of arm fixed base center as the origin, accurate positioning test fixture, the locator, the transfer box, thereby realize being surveyed the piece high accuracy location, reduce the arm and pick up, lay the degree of difficulty of being surveyed the piece, simplify the flow of automatic assembly and dismouting.
In one embodiment, the test fixture is used as a fixed mounting platform of the tested piece, and meanwhile, the test fixture comprises a plurality of mechanical switches to form a switch matrix, so that a plurality of components are connected with the test console. Providing a necessary basis for automatic testing of the system. The test fixture realizes the fixed installation of the tested piece through the fixture, and simultaneously realizes the integrated connection of the low-frequency cable and the radio-frequency cable push rod.
In one embodiment, the transfer boxes are divided into a good transfer box and a bad transfer box and a test transfer box. Customizing a special transfer box according to the appearance structure diagram of the tested piece, wherein the transfer box can store a plurality of tested pieces; the measured piece is flatly placed in the transfer box, and an intelligent clamping jaw grabbing assembly mounted on the mechanical arm is facilitated. The transfer box is composed of a base and a top cover, and the base is used for containing a tested piece; the top cover is used for fixing the tested piece. In the transportation process, the base of the transport box and the top cover are fixed through the lock catches, so that the tested piece is prevented from being damaged in the transportation process.
In one embodiment, the secondary positioning device is mainly used for accurately positioning the measured piece. The mechanical arm picks up the tested piece from the transfer box, and because the position error of the tested piece in the transfer box is relatively large, the tested piece is accurately positioned by using the secondary positioning equipment; the precision of the mechanical arm for picking up the appointed position of the measured piece is improved. The secondary positioning equipment mainly comprises three small inclined planes, a plurality of bearings are placed on the bottom inclined planes to assist the tested piece to slide to a designated position, and meanwhile scratch of the tested piece is avoided; and an anti-collision material is arranged at the bottom of the inclined plane, so that damage caused by the impact of the tested piece is reduced.
In one embodiment, the mechanical arm is fixedly arranged on the base, and a control box is fixed at the lower part of the base. The mechanical arm can pick up the tested piece in the conveying box, place the tested piece in the secondary positioning equipment, pick up again and place and fix in the test fixture. Therefore, the maximum distance between the transfer box and the test fixture and the mechanical arm is 900mm.
As shown in fig. 1, an embodiment of the present application provides a method for testing a phased array radar microwave assembly, where the method includes:
S101, grabbing the component through a pre-configured mechanical arm, positioning the component through the mechanical arm, and installing the positioned component so as to connect the component with a test tool.
S102, determining a microwave signal corresponding to the component through the tester, and testing the component according to the microwave signal to obtain a test result.
S103, obtaining the test result through test software, generating a test report according to the test result, and classifying the components according to the test report to obtain a classification result, so that the mechanical arm assembles the components according to the classification result.
In one embodiment, a tester places a transfer box for conveying the tested piece to a designated position, and opens an upper cover of the transfer box, so that the mechanical arm is ensured to have the condition of grabbing the tested piece. And under the condition of ensuring that the mechanical arm can safely work, the cabinet instrument and equipment and the mechanical arm are powered on sequentially. The automatic test software running on the comprehensive control machine controls the mechanical arm to scan and identify the tested piece, pick up the tested piece, perform secondary positioning, perform optical positioning, fixedly install the tested piece, and push the pull rod to connect the low-frequency cable and the radio-frequency cable. The T/R component port is effectively connected with the radio frequency multichannel gate by the switching tool.
An automatic software console test console provides control signals required by the test of the T/R component; and controlling the programmable power supply to realize power supply of the T/R component, and controlling the microwave signal source to test the T/R component according to the test requirement. The test software realizes the parameter and test state setting of the test system and the test instrument, controls the radio frequency multi-channel gating device to switch different test channels, controls the test instrument gating subsystem to select corresponding instruments to realize different parameter measurement, controls the whole test flow, and completes the test report generation and test data acquisition management. The one-time connection is truly realized, the multi-index test is completed, and the purpose of automatic test is achieved.
After the test is finished, the automatic test software automatically generates a test report, classifies the tested parts according to the test information fed back by the test report, and simultaneously controls the mechanical arm to reversely push the gear lever to disconnect the low-frequency cable and the radio-frequency cable; pushing the special clamp to release the compression of the clamp to the tested piece; the tested pieces are disassembled and classified according to the test results and placed into different transfer boxes, so that the purposes of automatic assembly, automatic test and automatic sorting are achieved, and finally the purposes of improving the test efficiency and saving manpower and material resources are achieved.
In one embodiment, in order to achieve automatic testing and unattended operation of the phased array radar microwave assembly automatic testing equipment, full automation of the assembly and disassembly of the tested parts is required. According to the characteristics of the components, the whole assembly process is designed by combining the actual conditions of an automatic test system, and the assembly and disassembly of the components are divided into an assembly part and a disassembly part.
During assembly, the cabinet instrument and equipment and the mechanical arm are powered on in sequence under the condition that the mechanical arm can safely work. And double-click running automatic test software in the integrated control machine system interface. And controlling the mechanical arm to move to the tested piece, and utilizing the camera to scan and identify the tested piece to acquire the information of the tested piece. The mechanical arm grabs the measured piece, and is placed on the secondary positioner, and the measured piece slides into the bottom of the positioner in a proper position. And a camera is arranged at the top of the mechanical arm to carry out optical positioning, and the success of the secondary positioning is confirmed. The mechanical arm picks up the measured piece and places the measured piece on the test tool, and the measured piece is stably placed by utilizing the camera to carry out optical positioning. The mechanical arm pushes the special clamp to press the diagonal angle of the measured piece. The mechanical arm pushes the special clamp, and sequentially pushes the special clamp to connect the radio frequency cables. The mechanical arm pushes the special clamp to push the special clamp to connect the low-frequency connector;
And when the phased array radar microwave assembly is disassembled, waiting for the tester of the phased array radar microwave assembly to finish various tests. And the program control power supply powers down the tested piece. And controlling the mechanical arm to move to the tested piece, and utilizing the intelligent camera to scan and identify the tested piece to acquire the information of the tested piece. The mechanical arm reversely pushes the special fixture to disconnect the tested piece from the low-frequency connector of the test tool. The mechanical arm reversely pushes the special clamp to disconnect the tested piece from the test tool radio frequency cable. The mechanical arm reversely pushes the special clamp to ensure that the measured piece has a picking state. The mechanical arm grabs the tested piece according to the test result, and the tested piece is stored in the specified position of the movable qualified product transfer box or the unqualified product transfer box, so that automatic sorting is realized.
As shown in fig. 2, the embodiment of the present application further provides a testing device for a phased array radar microwave assembly, including:
At least one processor; and
A memory communicatively coupled to the at least one processor; wherein,
The memory stores instructions executable by the at least one processor to enable a testing device of a phased array radar microwave assembly to perform:
Grabbing a component through a pre-configured mechanical arm, positioning the component through the mechanical arm, and installing the positioned component so as to connect the component with a test tool;
Determining a microwave signal corresponding to the component through the tester, and testing the component according to the microwave signal to obtain a test result;
And acquiring the test result through test software, generating a test report according to the test result, and classifying the assembly according to the test report to obtain a classification result, so that the mechanical arm assembles the assembly according to the classification result.
The embodiment of the application also provides a nonvolatile computer storage medium, which stores computer executable instructions, wherein the computer executable instructions are configured to:
Grabbing a component through a pre-configured mechanical arm, positioning the component through the mechanical arm, and installing the positioned component so as to connect the component with a test tool;
Determining a microwave signal corresponding to the component through the tester, and testing the component according to the microwave signal to obtain a test result;
And acquiring the test result through test software, generating a test report according to the test result, and classifying the assembly according to the test report to obtain a classification result, so that the mechanical arm assembles the assembly according to the classification result.
In the 90 s of the 20 th century, improvements to one technology could clearly be distinguished as improvements in hardware (e.g., improvements to circuit structures such as diodes, transistors, switches, etc.) or software (improvements to the process flow). However, with the development of technology, many improvements of the current method flows can be regarded as direct improvements of hardware circuit structures. Designers almost always obtain corresponding hardware circuit structures by programming improved method flows into hardware circuits. Therefore, an improvement of a method flow cannot be said to be realized by a hardware entity module. For example, a programmable logic device (Programmable Logic Device, PLD) (e.g., field programmable gate array (Field Programmable GATE ARRAY, FPGA)) is an integrated circuit whose logic functions are determined by user programming of the device. A designer programs to "integrate" a digital system onto a PLD without requiring the chip manufacturer to design and fabricate application-specific integrated circuit chips. Moreover, nowadays, instead of manually manufacturing integrated circuit chips, such programming is mostly implemented with "logic compiler (logic compiler)" software, which is similar to the software compiler used in program development and writing, and the original code before being compiled is also written in a specific programming language, which is called hardware description language (Hardware Description Language, HDL), but HDL is not just one, but a plurality of kinds, such as ABEL（Advanced Boolean Expression Language）、AHDL（Altera Hardware Description Language）、Confluence、CUPL（Cornell University Programming Language）、HDCal、JHDL（Java Hardware Description Language）、Lava、Lola、MyHDL、PALASM、RHDL（Ruby Hardware Description Language）, and VHDL (Very-High-SPEED INTEGRATED Circuit Hardware Description Language) and Verilog are currently most commonly used. It will also be apparent to those skilled in the art that a hardware circuit implementing the logic method flow can be readily obtained by merely slightly programming the method flow into an integrated circuit using several of the hardware description languages described above.
The controller may be implemented in any suitable manner, for example, the controller may take the form of, for example, a microprocessor or processor and a computer readable medium storing computer readable program code (e.g., software or firmware) executable by the (micro) processor, logic gates, switches, application SPECIFIC INTEGRATED Circuits (ASICs), programmable logic controllers, and embedded microcontrollers, examples of controllers include, but are not limited to, the following microcontrollers: ARC 625D, atmel AT91SAM, microchip PIC18F26K20, and Silicone Labs C8051F320, the memory controller may also be implemented as part of the control logic of the memory. Those skilled in the art will also appreciate that, in addition to implementing the controller in a pure computer readable program code, it is well possible to implement the same functionality by logically programming the method steps such that the controller is in the form of logic gates, switches, application specific integrated circuits, programmable logic controllers, embedded microcontrollers, etc. Such a controller may thus be regarded as a kind of hardware component, and means for performing various functions included therein may also be regarded as structures within the hardware component. Or even means for achieving the various functions may be regarded as either software modules implementing the methods or structures within hardware components.
The system, apparatus, module or unit set forth in the above embodiments may be implemented in particular by a computer chip or entity, or by a product having a certain function. One typical implementation is a computer. In particular, the computer may be, for example, a personal computer, a laptop computer, a cellular telephone, a camera phone, a smart phone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.
For convenience of description, the above devices are described as being functionally divided into various units, respectively. Of course, the functions of each element may be implemented in one or more software and/or hardware elements when implemented in the present specification.
The embodiments of the present application are described in a progressive manner, and the same and similar parts of the embodiments are all referred to each other, and each embodiment is mainly described in the differences from the other embodiments. In particular, for the apparatus and medium embodiments, the description is relatively simple, as it is substantially similar to the method embodiments, with reference to the section of the method embodiments being relevant.
The devices and media provided in the embodiments of the present application are in one-to-one correspondence with the methods, so that the devices and media also have similar beneficial technical effects as the corresponding methods, and since the beneficial technical effects of the methods have been described in detail above, the beneficial technical effects of the devices and media are not repeated here.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In one typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include volatile memory in a computer-readable medium, random Access Memory (RAM) and/or nonvolatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of computer-readable media.
Computer readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of storage media for a computer include, but are not limited to, phase change memory (PRAM), static Random Access Memory (SRAM), dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), read Only Memory (ROM), electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by a computing device. Computer-readable media, as defined herein, does not include transitory computer-readable media (transmission media), such as modulated data signals and carrier waves.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises an element.
The foregoing is merely exemplary of the present application and is not intended to limit the present application. Various modifications and variations of the present application will be apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the application are to be included in the scope of the claims of the present application.
Claims (3)
1. A phased array radar microwave assembly testing system comprising:
The mechanical arm comprises a mechanical arm, a positioner and a camera; the manipulator is used for grabbing the component and placing the component on a preset workbench; the camera is used for shooting and scanning the assembly to determine basic information and placement positions of the assembly; the locator is used for locating the assembly according to the placement position;
A test module including a plurality of testers; the tester is used for testing the assembly to obtain a test result;
The control module comprises a test instrument gating device, a radio frequency channel gating device and a test tool; the testing tool is used for fixing the assembly and connecting the fixed assembly with a switch matrix of the testing tool so that the assembly is respectively connected with the testing instrument gating device and the radio frequency channel gating device through the switch matrix; the test instrument gating device is used for determining a tester corresponding to the component; the radio frequency channel gating device is used for determining a test radio frequency channel of the component;
The tester comprises a microwave power meter, a vector network analyzer and a microwave signal source;
the microwave signal source is used for determining a microwave signal so as to test the component according to the microwave signal to obtain feedback information, and the feedback information is sent to the microwave power meter and the vector network analyzer to obtain the test result;
the control module also comprises a temperature sensor and a comprehensive control machine;
The temperature sensor is used for detecting the temperature of the component when being tested;
The comprehensive control machine is used for acquiring a test result of the tester, acquiring the temperature, comparing the temperature with a preset threshold value, determining a high-temperature signal if the temperature is greater than the threshold value, and determining a power-off command according to the high-temperature signal;
the control module further comprises a standard control power supply;
The standard control power supply is used for providing power for the tester, acquiring the power supply cut-off command and powering off the tester according to the power supply cut-off command;
Further comprises:
The software module is arranged in a predetermined server and is used for collecting the test result of the component and carrying out data processing on the test result to generate a test report, wherein the test report comprises test data and a component qualification index; the software module is also used for determining an operation instruction according to the test report so as to control the mechanical arm according to the operation instruction;
Further comprises:
The transfer box group is arranged on the workbench; the transfer box group comprises a qualified transfer box and an unqualified transfer box; the transfer box group is used for placing the tested components.
2. The system of claim 1, wherein the locator comprises an optical locator and a secondary locator;
the optical positioner is used for acquiring the image information of the camera and determining position information according to the image information;
The secondary positioner is used for determining the difference between the position information and a preset standard position and feeding the difference back to the manipulator so as to position the component through the manipulator.
3. A method for testing a phased array radar microwave assembly, applied to a testing system for a phased array radar microwave assembly according to any one of claims 1-2, the method comprising:
Grabbing a component through a pre-configured mechanical arm, positioning the component through the mechanical arm, and installing the positioned component so as to connect the component with a test tool;
Determining a microwave signal corresponding to the component through the tester, and testing the component according to the microwave signal to obtain a test result;
And acquiring the test result through test software, generating a test report according to the test result, and classifying the assembly according to the test report to obtain a classification result, so that the mechanical arm assembles the assembly according to the classification result.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205905024U (en) * | 2016-05-05 | 2017-01-25 | 四川省桑瑞光辉标识系统股份有限公司 | Ageing automatic system of placing of flowing water line light pipe based on vision positioning |
| CN111965438A (en) * | 2020-08-14 | 2020-11-20 | 中国电子科技集团公司第十四研究所 | Multi-task antenna testing system, method and device based on mechanical arm |
| CN212905423U (en) * | 2020-07-10 | 2021-04-06 | 四川天中星航空科技有限公司 | Navigation radar integrated test equipment |
| CN114355162A (en) * | 2021-12-31 | 2022-04-15 | 中国电子科技集团公司第十四研究所 | Automatic test equipment suitable for high power radio frequency module |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ES2577403B2 (en) * | 2016-01-21 | 2016-11-02 | Universidad De Oviedo | Airborne system and methods for the detection, location and imaging of buried objects and the characterization of the subsoil composition |
| CN217728779U (en) * | 2022-07-18 | 2022-11-04 | 广东爱吉尔机器人科技有限公司 | But quick adjustment secondary positioner |
| CN116372305A (en) * | 2023-03-02 | 2023-07-04 | 浙江娃哈哈智能机器人有限公司 | Extensible automatic solder coating system and method |
| CN220297097U (en) * | 2023-07-19 | 2024-01-05 | 敬科(山东)智能科技有限公司 | Dull and stereotyped class feed composite robot device |
| CN117111079A (en) * | 2023-07-19 | 2023-11-24 | 上海师范大学 | Laser radar system capable of detecting object components and control method thereof |
-
2024
- 2024-05-28 CN CN202410666732.8A patent/CN118237281B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205905024U (en) * | 2016-05-05 | 2017-01-25 | 四川省桑瑞光辉标识系统股份有限公司 | Ageing automatic system of placing of flowing water line light pipe based on vision positioning |
| CN212905423U (en) * | 2020-07-10 | 2021-04-06 | 四川天中星航空科技有限公司 | Navigation radar integrated test equipment |
| CN111965438A (en) * | 2020-08-14 | 2020-11-20 | 中国电子科技集团公司第十四研究所 | Multi-task antenna testing system, method and device based on mechanical arm |
| CN114355162A (en) * | 2021-12-31 | 2022-04-15 | 中国电子科技集团公司第十四研究所 | Automatic test equipment suitable for high power radio frequency module |
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