CN118131001A - 5G chip test method, device, equipment and storage medium - Google Patents
5G chip test method, device, equipment and storage medium Download PDFInfo
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Abstract
The invention discloses a 5G chip testing method, a device, equipment and a storage medium. The method comprises the following steps: the controller determines a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip, wherein the first target pressure parameter is smaller than the second target pressure parameter; the controller sets the working parameters of the pressure mechanism as first target pressure parameters so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip; when a test instruction is received, the controller sets the working parameters of the pressure mechanism to be second target pressure parameters, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state. The 5G chip testing method reduces the descending impact force when the target 5G chip is subjected to non-testing operation, ensures that the 5G chip to be tested is not damaged when the target 5G chip is subjected to non-testing operation, and avoids quality accidents.
Description
Technical Field
The present invention relates to the field of chip testing technologies, and in particular, to a method, an apparatus, a device, and a storage medium for testing a chip by using a fifth generation mobile communication technology (5 th Generation Mobile Communication Technology, abbreviated as 5G).
Background
With the development of communication technology, 5G radio frequency chips, 5G baseband chips, and other 5G chips are increasingly used. In the production process of 5G chips, the 5G chips need to be tested by a handler (handler) and a tester. The function of the classifier is to place the 5G chip to be tested in the load cell. The testing machine tests the 5G chip to be tested, which is positioned in the pressure measuring area.
Currently, in the process of placing a 5G chip to be tested in a pressure measuring area, the working parameter of a pressure mechanism of the sorter is a set value. The pressure mechanism generates pressure based on the working parameters to drive the test pressure head to place the 5G chip to be tested in the pressure measuring area.
However, in the above process, the working parameters of the pressure mechanism may not be suitable for all 5G chips to be tested. Therefore, the current sorting machine may damage the 5G chip to be tested in the working process, and quality accidents are generated.
Disclosure of Invention
The invention provides a 5G chip testing method, a device, equipment and a storage medium, which are used for solving the technical problem that a 5G chip to be tested is damaged in the process of testing the 5G chip by a sorting machine in the related technology.
According to an aspect of the present invention, there is provided a 5G chip testing method applied to a sorter including a controller, a pressure mechanism, and a test ram, the method comprising:
The controller determines a first target pressure parameter and a second target pressure parameter corresponding to a target 5G chip according to the identification of the target 5G chip; wherein the first target pressure parameter is less than the second target pressure parameter;
The controller sets the working parameters of the pressure mechanism as the first target pressure parameters so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip;
when a test instruction is received, the controller sets the working parameters of the pressure mechanism to the second target pressure parameters, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state.
In the method shown above, the controller determines, according to the identifier of the target 5G chip, a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip, including:
The controller acquires the identification of the target 5G chip;
the controller determines the first target pressure parameter and the second target pressure parameter according to the identification of the target 5G chip and the mapping relation between the preset identification of the chip and the pressure parameter.
In the method shown above, before determining the first target pressure parameter and the second target pressure parameter according to the identifier of the target 5G chip and the mapping relationship between the identifier of the preset chip and the pressure parameter, the method further includes:
the controller determines a first pressure required by non-test operation on each 5G chip to be tested in the test process and a second pressure required by the test state of each 5G chip to be tested;
The controller determines the first pressure parameter according to the first pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head;
the controller determines the second pressure parameter according to the second pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head;
And the controller determines the mapping relation between the identification of the chip and the pressure parameter according to the identification of each 5G chip to be detected, the corresponding first pressure parameter and second pressure parameter.
In the method shown above, the controller determines, according to the identifier of the target 5G chip, a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip, including:
The controller acquires the identification of the target 5G chip;
And the controller inputs the identification of the target 5G chip into a pre-trained pressure parameter output model to obtain the first target pressure parameter and the second target pressure parameter which are output by the pressure parameter output model.
In the method as shown above, the controller obtains the identifier of the target 5G chip, including at least one of the following:
the controller receives the identification of the target 5G chip input by the tester;
the controller obtains the picture of the target 5G chip, and obtains the identification of the target 5G chip according to the picture of the target 5G chip;
The controller acquires the spectrum data of the target 5G chip, and acquires the identification of the target 5G chip according to the spectrum data of the target 5G chip.
In the method as shown above, the non-test operation includes at least one of: and (5) a material taking operation and a material discharging operation.
In the method as shown above, the controller sets the operating parameter of the pressure mechanism to the first target pressure parameter, including:
The controller sends the first target pressure parameter to a pressure mechanism to enable the pressure mechanism to operate according to the first target pressure parameter.
According to another aspect of the present invention, there is provided a 5G chip testing apparatus provided in a controller of a handler including: a controller, a pressure mechanism, and a test ram, the apparatus comprising:
the first determining module is used for determining a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip; wherein the first target pressure parameter is less than the second target pressure parameter;
the first setting module is used for setting the working parameters of the pressure mechanism to the first target pressure parameters so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip;
And the second setting module is used for setting the working parameters of the pressure mechanism to the second target pressure parameters when a test instruction is received, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state.
According to another aspect of the present invention, there is provided an electronic apparatus including:
at least one processor; and
A memory communicatively coupled to the at least one processor; wherein,
The memory stores a computer program executable by the at least one processor to enable the at least one processor to perform the 5G chip test method of any one of the embodiments of the present invention.
According to another aspect of the present invention, there is provided a computer readable storage medium storing computer instructions for causing a processor to execute a 5G chip test method according to any one of the embodiments of the present invention.
In the technical scheme provided by the embodiment of the invention, the 5G chip testing method comprises the following steps: the controller determines a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip, wherein the first target pressure parameter is smaller than the second target pressure parameter; the controller sets the working parameters of the pressure mechanism as first target pressure parameters so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip; when a test instruction is received, the controller sets the working parameters of the pressure mechanism to be second target pressure parameters, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state. By setting the first target pressure parameter smaller than the second target pressure parameter, on one hand, the descending impact force when the target 5G chip is subjected to non-test operation is reduced, the 5G chip to be tested is guaranteed not to be damaged when the target 5G chip is subjected to non-test operation, quality accidents are avoided, on the other hand, the reliable contact of the target 5G chip with an interface area in a pressure measuring area can be guaranteed when the target 5G chip is in a test state, and the test accuracy is improved. Meanwhile, the 5G chip testing method can determine the first target pressure parameter and the second target pressure parameter corresponding to the target 5G chip, and testing accuracy is further improved.
It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the invention or to delineate the scope of the invention. Other features of the present invention will become apparent from the description that follows.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic flow chart of a 5G chip test method according to an embodiment of the invention;
FIG. 2 is a schematic circuit diagram of a sorter;
FIG. 3 is a schematic view of a pressure mechanism and test ram of the sorter;
FIG. 4 is a schematic diagram of a working process of a sorter in a 5G chip testing method according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a 5G chip test apparatus according to an embodiment of the present invention;
Fig. 6 is a schematic structural diagram of an electronic device implementing a 5G chip testing method according to an embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the invention described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Fig. 1 is a flow chart of a 5G chip testing method according to an embodiment of the present invention. The embodiment can be suitable for the situation that the sorting machine tests the 5G chip to be tested. The method may be performed by a 5G chip test apparatus, which may be implemented in hardware and/or software. The 5G chip testing device can be configured in a controller of a sorting machine. As shown in fig. 1, the method includes the following steps.
Step 101: and the controller determines a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip.
Wherein the first target pressure parameter is less than the second target pressure parameter.
The target 5G chip in this embodiment refers to a 5G chip to be tested, and may also be referred to as a 5G chip to be tested. The target 5G chip in this embodiment may be a 5G baseband chip, a 5G radio frequency chip, or a chip capable of connecting 5G data or processing 5G data. The chip test in this embodiment may be a final test (FINAL TEST, abbreviated as FT) of the target 5G chip. The identification of the target 5G chip in this embodiment is information that can uniquely characterize the target 5G chip, for example, information such as a serial number, a barcode, etc. of the target 5G chip.
Fig. 2 is a schematic circuit configuration of the separator. As shown in fig. 2, the separator provided in this embodiment includes: a controller 21 and a pressure mechanism 22. The controller 21 is electrically connected to the pressure mechanism 22. Fig. 3 is a schematic view of the pressure mechanism of the classifier and the test ram. Referring to fig. 2 and3, the separator provided in this embodiment includes: the connection 31, the pressing mechanism 22, the floating mechanism 33, and the test indenter (nest) 34 are sequentially connected. The connection portion 31 is used for connecting the pressure measuring floor. The controller 21 may be in communication with the pressure mechanism 22 to set operating parameters of the pressure mechanism 22 such that the pressure mechanism 22 generates downward pressure. The test ram 34 may aspirate the target 5G chip 35. The floating mechanism 33 provides a floating space for pressure measurement, and floating adaptation ensures pressure measurement accuracy.
Illustratively, the pressure mechanism 22 in the present embodiment may be a cylinder.
In the process of testing the target 5G chip, the sorter needs to execute the following operation procedures: 1. taking the target 5G chip from the feeding area; 2. and (3) carrying out discharging operation on the target 5G chip in the pressure measuring area: placing a 5G chip in a socket area of a pressure measuring area; 3. the target 5G chip is in a test state in the pressure measuring area; 4. after the test is completed, carrying out material taking operation on the target 5G chip in the pressure measuring area; 5. and (5) carrying out discharging operation on the target 5G chip in a discharging area. During all 5 of the above operations, the pressure mechanism 32 is required to generate downward pressure. In the related art, the same pressure is generated during each operation of the testing process by the sorting machine, which may cause damage to the 5G chip to be tested during non-testing operation, for example, during material taking operation and material discharging operation.
In this embodiment, in step 101, a first target pressure parameter and a second target pressure parameter corresponding to a target 5G chip may be determined according to the identifier of the target 5G chip. Wherein the first target pressure parameter refers to an operating parameter of the pressure mechanism during non-testing. The second target pressure parameter refers to an operating parameter of the pressure mechanism after receiving the test command. In addition, the second target pressure parameter in the embodiment is larger than the first target pressure parameter, so that the target 5G chip can be ensured to reliably contact with the interface area in the pressure measuring area when the target 5G chip is in a test state, the test accuracy is improved, the descending impact force when the target 5G chip is subjected to non-test operation is reduced, the target 5G chip is ensured not to be damaged when the target 5G chip is subjected to non-test operation, and quality accidents are avoided.
It should be noted that, the first target pressure parameter in this embodiment may ensure that the connection between the floating mechanism 33 and the test ram 34 does not shake, so as to reliably take and discharge materials.
Step 101 may be implemented in several implementations.
In a first possible implementation, step 101 includes the following steps: the controller acquires the identification of the target 5G chip; the controller determines a first target pressure parameter and a second target pressure parameter according to the identification of the target 5G chip and the mapping relation between the preset identification of the chip and the pressure parameter.
In this implementation, a mapping relationship between the identification of the chip and the pressure parameter needs to be established in advance. One possible setup procedure is as follows: the controller determines a first pressure required by non-test operation on each 5G chip to be tested in the test process and a second pressure required by the test state of each 5G chip to be tested; the controller determines a first pressure parameter according to the first pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head; the controller determines a second pressure parameter according to the second pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head; the controller determines the mapping relation between the identification of the chip and the pressure parameter according to the identification of each 5G chip to be detected, the corresponding first pressure parameter and second pressure parameter.
The controller determines the first pressure parameter according to the first pressure, the type parameter of the pressure mechanism, the type parameter of the test pressure head and a preset conversion algorithm when determining the first pressure parameter. The controller determines the second pressure parameter according to the second pressure, the type parameter of the pressure mechanism, the type parameter of the test pressure head and a preset conversion algorithm when determining the second pressure parameter. It will be appreciated that the correspondence between the pressure parameter and the pressure is related to the type parameter of the pressure mechanism, the type parameter of the test ram. The type parameters of the pressure mechanism in this embodiment include at least one of the following: the pressurizing type of the pressure mechanism, the volume of the pressure mechanism, the contact area of the pressure mechanism and the floating mechanism and other parameters. The type parameters of the test ram include at least one of: and parameters such as the contact area of the test pressure head and the target 5G chip, the volume of the test pressure head and the like.
According to the implementation mode, the first target pressure parameter and the second target pressure parameter can be determined efficiently according to the preset mapping relation.
In a second possible implementation manner, the step 101 includes the following steps: the controller acquires the identification of the target 5G chip; the controller inputs the identification of the target 5G chip into a pre-trained pressure parameter output model to obtain a first target pressure parameter and a second target pressure parameter which are output by the pressure parameter output model.
The pressure parameter output model in the implementation mode is a model which is trained in advance by adopting a machine learning algorithm and training data. In the implementation manner, the identification of the target 5G chip can be input into a pre-trained pressure parameter output model to obtain a first target pressure parameter and a second target pressure parameter which are output by the pressure parameter output model.
The implementation mode can accurately determine the first target pressure parameter and the second target pressure parameter according to a pre-trained pressure parameter output model.
In the two implementations, the controller obtains the identifier of the target 5G chip, including at least one of the following: the controller receives the identification of the target 5G chip input by the tester; the controller obtains a picture of the target 5G chip, and obtains the identification of the target 5G chip according to the picture of the target 5G chip; the controller acquires the spectrum data of the target 5G chip, and acquires the identification of the target 5G chip according to the spectrum data of the target 5G chip.
The controller can identify the picture of the target 5G chip through an image identification algorithm, and the identification of the target 5G chip is obtained. The controller can identify the spectrum data of the target 5G chip through a spectrum identification algorithm, and the identification of the target 5G chip is obtained.
Step 102: the controller sets the working parameters of the pressure mechanism to be first target pressure parameters, so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip.
Optionally, the non-test operation in the present embodiment includes at least one of: and (5) a material taking operation and a material discharging operation.
In step 102, the controller sends a first target pressure parameter to the pressure mechanism to cause the pressure mechanism to operate in accordance with the first target pressure parameter. Specifically, the pressure mechanism generates a downward pressure in accordance with a first target pressure parameter.
And the pressure mechanism drives the test pressure head to carry out material taking operation and material discharging operation on the target 5G chip according to the first target pressure parameter.
Step 103: when a test instruction is received, the controller sets the working parameters of the pressure mechanism to be second target pressure parameters, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state.
The test instruction in this embodiment may be an instruction issued by a tester, or may be an instruction issued by a test ram after detecting that the target 5G chip is located in the interface area. The test instructions in this embodiment are used to indicate that the target 5G chip is to be tested.
In step 103, the controller sends a second target pressure parameter to the pressure mechanism to cause the pressure mechanism to operate in accordance with the second target pressure parameter. Specifically, the pressure mechanism generates a downward pressure in accordance with a second target pressure parameter.
And the pressure mechanism drives the testing pressure head to enable the target 5G chip to be in a testing state according to the second target pressure parameter. The test state in this embodiment means that the target 5G chip is in a state in which it can be tested. Specifically, the test state is a state in which the target 5G chip is reliably in contact with the interface region in the load cell.
After placing the target 5G chip in a test state, the tester may test the 5G chip.
Fig. 4 is a schematic diagram of a working process of a sorter in a 5G chip testing method according to an embodiment of the present invention. As shown in fig. 4, the operation of the classifier is divided into the following 5 operations. Operation 41 represents a take-out operation of the target 5G chip 35 from the feed zone, where the controller sets the operating parameters of the pressure mechanism to the first target pressure parameters. Operation 42 represents a blanking operation of the target 5G chip 35 in the load cell, while the controller still sets the operating parameters of the pressure mechanism to the first target pressure parameters. Operation 43 represents placing the target 5G chip in a test state at the load cell, where the controller sets the operating parameters of the pressure mechanism to the second target pressure parameters. Operation 44 indicates that after the test is completed, a material taking operation is performed on the target 5G chip 35 in the load cell, and the controller sets the operating parameter of the pressure mechanism to the first target pressure parameter. Operation 45 represents a discharging operation of the target 5G chip in the discharging area, where the controller still sets the operating parameter of the pressure mechanism to the first target pressure parameter.
The 5G chip testing method provided by the embodiment comprises the following steps: the controller determines a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip, wherein the first target pressure parameter is smaller than the second target pressure parameter; the controller sets the working parameters of the pressure mechanism as first target pressure parameters so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip; when a test instruction is received, the controller sets the working parameters of the pressure mechanism to be second target pressure parameters, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state. By setting the first target pressure parameter smaller than the second target pressure parameter, on one hand, the descending impact force when the target 5G chip is subjected to non-test operation is reduced, the 5G chip to be tested is guaranteed not to be damaged when the target 5G chip is subjected to non-test operation, quality accidents are avoided, on the other hand, the reliable contact of the target 5G chip with an interface area in a pressure measuring area can be guaranteed when the target 5G chip is in a test state, and the test accuracy is improved. Meanwhile, the 5G chip testing method can determine the first target pressure parameter and the second target pressure parameter corresponding to the target 5G chip, and testing accuracy is further improved.
Fig. 5 is a schematic structural diagram of a 5G chip testing apparatus according to an embodiment of the present invention. The device is arranged in a controller of the sorting machine. The sorter includes a controller, a pressure mechanism, and a test ram. As shown in fig. 5, the apparatus includes: a first determination module 51, a first setting module 52 and a second setting module 53.
The first determining module 51 is configured to determine a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip according to the identifier of the target 5G chip.
Wherein the first target pressure parameter is less than the second target pressure parameter.
The first setting module 52 is configured to set a working parameter of the pressure mechanism to the first target pressure parameter, so that the pressure mechanism drives the test pressure head to perform a non-test operation on the target 5G chip.
And the second setting module 53 is configured to set, when a test instruction is received, an operating parameter of the pressure mechanism to the second target pressure parameter, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state.
In one embodiment, the first determining module 51 is configured to: acquiring the identification of the target 5G chip; and determining the first target pressure parameter and the second target pressure parameter according to the identification of the target 5G chip and the mapping relation between the preset identification of the chip and the pressure parameter.
The apparatus further comprises: the system comprises a second determining module, a third determining module, a fourth determining module and a fifth determining module.
The second determining module is used for determining a first pressure required by non-test operation on each 5G chip to be tested in the test process and a second pressure required by the test state of each 5G chip to be tested. And the third determining module is used for determining the first pressure parameter according to the first pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head. And the fourth determining module is used for determining the second pressure parameter according to the second pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head. And the fifth determining module is used for determining the mapping relation between the identifiers of the chips and the pressure parameters according to the identifiers of the 5G chips to be tested and the corresponding first pressure parameters and second pressure parameters.
In one embodiment, the first determining module 51 is configured to: acquiring the identification of the target 5G chip; and inputting the identification of the target 5G chip into a pre-trained pressure parameter output model to obtain the first target pressure parameter and the second target pressure parameter which are output by the pressure parameter output model.
In one embodiment, in acquiring the identifier of the target 5G chip, the first determining module 51 is configured to perform at least one of the following: receiving the identification of the target 5G chip input by a tester; acquiring a picture of the target 5G chip, and acquiring an identifier of the target 5G chip according to the picture of the target 5G chip; and acquiring the spectrum data of the target 5G chip, and acquiring the identification of the target 5G chip according to the spectrum data of the target 5G chip.
In one embodiment, the non-test operation includes at least one of: and (5) a material taking operation and a material discharging operation.
In one embodiment, the first setting module 52 is configured to send the first target pressure parameter to the pressure mechanism, so that the pressure mechanism operates according to the first target pressure parameter.
The 5G chip testing device provided by the embodiment of the invention can execute the 5G chip testing method provided by any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the executing method.
Fig. 6 is a schematic structural diagram of an electronic device implementing a 5G chip testing method according to an embodiment of the present invention. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent a sorter in the field of chip testing. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the inventions described and/or claimed herein.
As shown in fig. 6, the electronic device 10 includes at least one processor 11, and a memory, such as a Read Only Memory (ROM) 12, a Random Access Memory (RAM) 13, etc., communicatively connected to the at least one processor 11, in which the memory stores a computer program executable by the at least one processor, and the processor 11 may perform various appropriate actions and processes according to the computer program stored in the Read Only Memory (ROM) 12 or the computer program loaded from the storage unit 18 into the Random Access Memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 may also be stored. The processor 11, the ROM 12 and the RAM 13 are connected to each other via a bus 14. An input/output (I/O) interface 15 is also connected to bus 14.
Various components in the electronic device 10 are connected to the I/O interface 15, including: an input unit 16 such as a keyboard, a mouse, etc.; an output unit 17 such as a display, a speaker, or the like of various types of parameters; a storage unit 18 such as a magnetic disk, an optical disk, or the like; and a communication unit 19 such as a network card, modem, wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information/data with other devices via a computer network, such as the internet, and/or various telecommunication networks.
The processor 11 may be a variety of general and/or special purpose processing components having processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various processors running machine learning model algorithms, digital Signal Processors (DSPs), and any suitable processor, controller, microcontroller, etc. The processor 11 performs the various methods and processes described above, such as the 5G chip test method.
In some embodiments, the 5G chip test method may be implemented as a computer program tangibly embodied on a computer-readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program may be loaded and/or installed onto the electronic device 10 via the ROM 12 and/or the communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the 5G chip test method described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the 5G chip test method by any other suitable means (e.g., by means of firmware).
Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuit systems, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application Specific Standard Products (ASSPs), systems On Chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs, the one or more computer programs may be executed and/or interpreted on a programmable system including at least one programmable processor, which may be a special purpose or general-purpose programmable processor, that may receive data and instructions from, and transmit data and instructions to, a storage system, at least one input device, and at least one output device.
A computer program for carrying out methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer programs, when executed by the processor, cause the functions/acts specified in the flowchart and/or block diagram block or blocks to be implemented. The computer program may execute entirely on the machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of the present invention, a computer-readable storage medium may be a tangible medium that can contain, or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. The computer readable storage medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, the computer readable storage medium may be a machine readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) through which a user can provide input to the electronic device. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic input, speech input, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a background component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such background, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), wide Area Networks (WANs), blockchain networks, and the internet.
The computing system may include clients and servers. The client and server are typically remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also called a cloud computing server or a cloud host, and is a host product in a cloud computing service system, so that the defects of high management difficulty and weak service expansibility in the traditional physical hosts and VPS service are overcome.
It should be appreciated that various forms of the flows shown above may be used to reorder, add, or delete steps. For example, the steps described in the present invention may be performed in parallel, sequentially, or in a different order, so long as the desired results of the technical solution of the present invention are achieved, and the present invention is not limited herein.
The above embodiments do not limit the scope of the present invention. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of the present invention.
Claims (10)
1. A fifth generation mobile communication technology 5G chip testing method, which is characterized by being applied to a sorting machine, wherein the sorting machine comprises a controller, a pressure mechanism and a testing pressure head, and the method comprises the following steps:
The controller determines a first target pressure parameter and a second target pressure parameter corresponding to a target 5G chip according to the identification of the target 5G chip; wherein the first target pressure parameter is less than the second target pressure parameter;
The controller sets the working parameters of the pressure mechanism as the first target pressure parameters so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip;
when a test instruction is received, the controller sets the working parameters of the pressure mechanism to the second target pressure parameters, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state.
2. The method of claim 1, wherein the controller determining the first target pressure parameter and the second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip comprises:
The controller acquires the identification of the target 5G chip;
the controller determines the first target pressure parameter and the second target pressure parameter according to the identification of the target 5G chip and the mapping relation between the preset identification of the chip and the pressure parameter.
3. The method according to claim 2, wherein before determining the first target pressure parameter and the second target pressure parameter according to the identifier of the target 5G chip and the mapping relationship between the identifier of the preset chip and the pressure parameter, the method further comprises:
the controller determines a first pressure required by non-test operation on each 5G chip to be tested in the test process and a second pressure required by the test state of each 5G chip to be tested;
The controller determines the first pressure parameter according to the first pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head;
the controller determines the second pressure parameter according to the second pressure, the type parameter of the pressure mechanism and the type parameter of the test pressure head;
And the controller determines the mapping relation between the identification of the chip and the pressure parameter according to the identification of each 5G chip to be detected, the corresponding first pressure parameter and second pressure parameter.
4. The method of claim 1, wherein the controller determining the first target pressure parameter and the second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip comprises:
The controller acquires the identification of the target 5G chip;
And the controller inputs the identification of the target 5G chip into a pre-trained pressure parameter output model to obtain the first target pressure parameter and the second target pressure parameter which are output by the pressure parameter output model.
5. The method according to any of claims 2 to 4, wherein the controller obtains an identification of the target 5G chip, comprising at least one of:
the controller receives the identification of the target 5G chip input by the tester;
the controller obtains the picture of the target 5G chip, and obtains the identification of the target 5G chip according to the picture of the target 5G chip;
The controller acquires the spectrum data of the target 5G chip, and acquires the identification of the target 5G chip according to the spectrum data of the target 5G chip.
6. The method of claim 1, wherein the non-test operation comprises at least one of: and (5) a material taking operation and a material discharging operation.
7. The method of claim 1, wherein the controller setting an operating parameter of a pressure mechanism to the first target pressure parameter comprises:
The controller sends the first target pressure parameter to a pressure mechanism to enable the pressure mechanism to operate according to the first target pressure parameter.
8. A fifth generation mobile communication technology 5G chip testing apparatus, characterized in that it is disposed in a controller of a sorting machine, the sorting machine comprising: a controller, a pressure mechanism, and a test ram, the apparatus comprising:
the first determining module is used for determining a first target pressure parameter and a second target pressure parameter corresponding to the target 5G chip according to the identification of the target 5G chip; wherein the first target pressure parameter is less than the second target pressure parameter;
the first setting module is used for setting the working parameters of the pressure mechanism to the first target pressure parameters so that the pressure mechanism drives the test pressure head to perform non-test operation on the target 5G chip;
And the second setting module is used for setting the working parameters of the pressure mechanism to the second target pressure parameters when a test instruction is received, so that the pressure mechanism drives the test pressure head to enable the target 5G chip to be in a test state.
9. An electronic device, the electronic device comprising:
at least one processor; and
A memory communicatively coupled to the at least one processor; wherein,
The memory stores a computer program executable by the at least one processor to enable the at least one processor to perform the 5G chip test method of any one of claims 1-7.
10. A computer readable storage medium storing computer instructions for causing a processor to perform the 5G chip test method of any one of claims 1-7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311751402.0A CN118131001A (en) | 2023-12-19 | 2023-12-19 | 5G chip test method, device, equipment and storage medium |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311751402.0A CN118131001A (en) | 2023-12-19 | 2023-12-19 | 5G chip test method, device, equipment and storage medium |
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| CN118131001A true CN118131001A (en) | 2024-06-04 |
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| CN202311751402.0A Pending CN118131001A (en) | 2023-12-19 | 2023-12-19 | 5G chip test method, device, equipment and storage medium |
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| CN (1) | CN118131001A (en) |
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2023
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