CN117907682A - Microwave millimeter wave multichannel component phase stability testing tool and method - Google Patents
Microwave millimeter wave multichannel component phase stability testing tool and method Download PDFInfo
- Publication number
- CN117907682A CN117907682A CN202311748309.4A CN202311748309A CN117907682A CN 117907682 A CN117907682 A CN 117907682A CN 202311748309 A CN202311748309 A CN 202311748309A CN 117907682 A CN117907682 A CN 117907682A
- Authority
- CN
- China
- Prior art keywords
- tool
- component
- channel
- tested
- millimeter wave
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 13
- 238000012430 stability testing Methods 0.000 title description 5
- 238000012360 testing method Methods 0.000 claims abstract description 46
- 238000006243 chemical reaction Methods 0.000 claims description 14
- 238000004806 packaging method and process Methods 0.000 claims description 4
- 238000013112 stability test Methods 0.000 abstract description 8
- 230000001360 synchronised effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 3
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000003337 fertilizer Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to a tool and a method for testing the phase stability of a microwave and millimeter wave multichannel component, and belongs to the technical field of microwave and millimeter wave testing. The test tool comprises a signal source, a first tool, a second tool and an oscilloscope; the signal source is connected with the first tool, the first tool divides the signals into multiple paths of signals with the same channel as the tested component, and each path of signals is kept consistent in hardware connection; the multipath signals are sequentially and correspondingly connected with the input of each path of tested component; the second tool is used for inputting the multipath output and path of the tested component to the oscilloscope. Hard connection is adopted in the whole test tool and the radio frequency signal link, so that the test system is ensured to have good stability in the microwave millimeter wave frequency band. The invention can accurately, quickly and efficiently complete the multi-channel phase stability test.
Description
Technical Field
The invention belongs to the technical field of microwave millimeter wave testing, and relates to a tool and a method for testing the phase stability of a microwave millimeter wave multichannel component.
Background
In the design and implementation process of the multi-channel assembly, phase consistency is always focused by researchers, a plurality of factors influencing the phase consistency are provided, phase stability is a key factor influencing the phase consistency, when the influence of the phase stability on the phase consistency is rarely mentioned, a test method of the phase stability is not reported, a common test method of the phase consistency is that a stable phase cable is connected with a test instrument and each test channel, when a frequency band is millimeter waves, bending of the cable in the operation process, tightness degree of fastening a connector and false touch of a tester easily lead to phase fluctuation of the channels, and the stability test cannot be carried out by the phase consistency test system due to instability of the test system. When the multichannel phase stability test is faced, the test cable is high in price and the test system is very inconvenient to build.
Disclosure of Invention
The technical problems to be solved by the invention are as follows:
In order to avoid the defects of the prior art, the invention provides a tool and a method for testing the phase stability of a microwave and millimeter wave multichannel component, which are used for rapidly, efficiently and accurately completing the phase stability test of the broadband microwave and millimeter wave multichannel component.
In order to solve the technical problems, the invention adopts the following technical scheme:
the tool for testing the phase stability of the microwave millimeter wave multichannel component is characterized by comprising a signal source, a first tool and an oscilloscope;
the signal source is connected with the first tool, the first tool divides the signals into multiple paths of signals with the same channel as the tested component, and each path of signals is kept consistent in hardware connection;
the multipath signals are sequentially and correspondingly connected with the input of each path of tested component;
and the output of the tested component is connected with an oscilloscope.
The invention further adopts the technical scheme that: the test device comprises a tested component, an oscilloscope, a first tool and a second tool, wherein the first tool is positioned between the tested component and the oscilloscope, and is used for inputting the multipath output and path input of the tested component to the oscilloscope.
The invention further adopts the technical scheme that: the first tool comprises a first power division network and a first switch network; the first power division network is connected with a signal source to divide the signal source signal into multiple paths of signals with the same channel as the tested component; the multiple signals are input to a first switching network for controlling the on or off of each channel signal.
The invention further adopts the technical scheme that: the first switch network comprises a plurality of switches with the same number of channels as the tested components, and each switch is connected with one output of the first power division network.
The invention further adopts the technical scheme that: the second tool comprises a second switch network and a second power division network; the second switch network is connected with the output of the tested component and is used for controlling the on-off of each channel signal; and the second power division network is connected with the second switch network to output the multipath signal to the oscilloscope in a combined way.
The invention further adopts the technical scheme that: and the first tool is connected with the tested component by adopting a hard connector.
The invention further adopts the technical scheme that: the tested component is connected with the second tool through a hard connector, and the second tool is connected with the oscilloscope through a hard connector.
The invention further adopts the technical scheme that: the related components and circuits in the first power distribution network, the first switch network, the second power distribution network and the second switch network are stable structures similar to the structure that packaging components SMT are arranged on a printed board or chips and the printed board are micro-assembled on a structural member.
The invention further adopts the technical scheme that: the component under test includes a down-conversion receiving component that includes an amplifier.
The method for testing the phase stability of the microwave millimeter wave multichannel component is characterized by comprising the following steps of:
The signal source outputs a radio frequency signal;
The first power division network of the first tool divides the radio frequency signal power into multiple paths of signals, and the multiple paths of signals are fed into a radio frequency interface of a channel to be tested of the tested component through the control of the first switch network;
The channels of the tested component are output to the second tool;
And the second power division network of the second tool divides one channel into one channel, one channel is used as a reference channel, one channel and other channels are switched through the second switching network, and the sum channel output is connected to an oscilloscope for phase comparison.
The invention has the beneficial effects that:
The tool and the method for testing the phase stability of the microwave millimeter wave multichannel component can accurately, rapidly and efficiently finish the phase stability test of the multichannel component. Hard connection is adopted in the whole test tool and the radio frequency signal link, so that the test system is ensured to have good stability in the microwave millimeter wave frequency band. When unstable phenomena such as phase jitter occur, channels with unstable phases can be easily located. According to the circuit diagram of fig. 3, the individual channel amplifiers are in a condition steady state at full frequency band; as shown in fig. 5, the frequency band of Ku is unstable, the phase is jumped, and the problem channel is easy to locate through testing.
Drawings
The drawings are only for purposes of illustrating particular embodiments and are not to be construed as limiting the invention, like reference numerals being used to refer to like parts throughout the several views.
Fig. 1 multi-channel down-conversion receiving assembly test fixture setup.
Fig. 2 multi-channel receiving assembly test fixture setup.
The eight-channel down-conversion receiving assembly test fixture of fig. 3 is built.
FIG. 4 is a first tooling micro-assembly diagram.
Fig. 5 phase stability test results.
Fig. 6 illustrates inter-channel phase instability due to amplifier instability.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention. In addition, technical features of the embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
The invention provides a phase stability test tool for a microwave millimeter wave multichannel component, which comprises a signal source, a first tool, a second tool and an oscilloscope; the signal source is connected with the first tool, the first tool divides the signals into multiple paths of signals with the same channel as the tested component, and each path of signals is kept consistent in hardware connection; the multipath signals are sequentially and correspondingly connected with the input of each path of tested component; the second tool is used for inputting the multipath output and path of the tested component to the oscilloscope.
The first tool comprises a first power division network and a first switch network; the first power division network is connected with a signal source to divide the signal source signal into multiple paths of signals with the same channel as the tested component; the multiple signals are input to a first switching network for controlling the on or off of each channel signal.
The second tooling comprises a second switch network and a second power division network; the second switch network is connected with the output of the tested component and is used for controlling the on or off of signals of each channel; the second power division network is connected with the second switch network to output the multipath signal to the oscilloscope in a combining way.
The following three conditions of the down-conversion receiving assembly, the receiving assembly and the eight-channel receiving assembly of the to-be-tested piece are shown in the schematic diagrams of fig. 1, 2 and 3.
Down-conversion receiving component: referring to fig. 1, a first fixture includes a signal source 10 (RF signal generation) that enters hard (rigid) connectors 3 and 5 through a power dividing and switching network 2, a synchronous RF signal is fed into a radio frequency interface of a channel to be measured, a local oscillator signal in the part to be measured is required to be a synchronous signal, an intermediate frequency signal is output by the part to be measured and enters a second fixture, the second fixture includes hard (rigid) connections 4 and 6, a switch and power dividing network 7, the power dividing network divides channel one power, one channel serves as a reference channel 8, one channel performs switching with other channels, and output 9,8 and 9 are also hard (rigid) connectors, and the output is connected to an oscilloscope 11 through the hard (rigid) connectors for phase comparison. In order to ensure stability testing, the invention requires in particular that all 1, 3, 4, 5,6, 8, 9 are hard (rigid) connectors. The components and circuits involved in 2 and 7 should also be stable structures like packaging the device SMT on a printed board or micro-assembly of chips, printed boards on structural members, etc.
A receiving component: referring to fig. 2, a first fixture includes a signal source 10 (RF signal generation) that enters hard (rigid) connectors 3 and 5 through a power dividing and switching network 2, a synchronous RF signal is fed into a radio frequency interface of a channel to be tested, an output RF signal of the piece to be tested enters a second fixture, the second fixture includes hard (rigid) connections 4 and 6, a switching and power dividing network 7, the power dividing network divides the channel into one power, one power is used as a reference channel 8, the other power is switched with the other channels, and the outputs 9,8 and 9 are also hard (rigid) connectors, and the channels are connected to an oscilloscope 11 through the hard (rigid) connectors for phase comparison. In order to ensure stability testing, the present invention requires in particular that all 1, 3, 4, 5, 6, 8, 9 are rigid connectors, and the components and circuits involved in 2 and 7 should also be stable structures like SMT of packaged devices on printed boards or micro-assembly of chips, printed boards on structural members, etc.
Eight-channel receiving component: as shown in fig. 3, the first tool includes a signal source 8 (RF signal generation) that enters hard (rigid) connectors 3 and 5 through a power divider and switch network 2, feeds a synchronous radio frequency signal into a radio frequency interface of a channel to be tested, and the local oscillator signal in the part to be tested is required to be a synchronous signal, and the output intermediate frequency signal of the part to be tested is fed into hard (rigid) connectors 4 and 6, and finally is connected into an oscilloscope 7 for phase comparison. In order to ensure stability testing, the present invention requires that all of 1, 3, 4, 5, 6 be rigid connectors, and the components and circuits involved in 2 should also be of a stable construction similar to the SMT of packaged devices on a printed board or the micro-assembly of chips, printed boards on structural members, etc.
In order that those skilled in the art will better understand the present invention, the following detailed description of the present invention will be provided with reference to specific examples.
The stability test system of the eight-channel down-conversion receiving assembly is built, and the to-be-tested assembly is a radio frequency band 16GHz eight-channel receiving down-conversion assembly, a local oscillation frequency is 16.14GHz, and an intermediate frequency band is 140MHz. The power dividers all select IPD-0618A of the combined fertilizer core valley, the position numbers U1-U7, and the switch selects WKDQ A000200 of Nanjing 55, the position numbers U8-U15. The printed board was selected from rogers 5880. The component type selection and the printed board type selection are only one special example of a stable test tool, 1 is a rigid connector connected with a signal source, and 3 and 5 are rigid connectors connected with an oscilloscope. The hard connector has the function of guaranteeing the stability of system interconnection, and specific models are not appointed, so long as impedance matching, interface type matching, standing wave and insertion loss indexes are met, and the system test requirements are met. The signal flow core of the whole test is stable interconnection and composition.
Taking an eight-channel down-conversion receiving component as an example to describe a method for testing the phase stability of the multi-channel component, as shown in fig. 3, a signal source 8 generates a radio frequency signal, the radio frequency signal is fed into a first tool (one-to-eight power divider) through a1 (hard connector), the one-to-eight power divider is divided into eight paths of radio frequency signals with equal amplitude and same phase, and the eight paths of radio frequency signals are fed into the eight-channel down-conversion receiving component through 3 and 5 (hard connectors). Eight paths of intermediate frequency signals are output through down conversion and fed into an oscilloscope through 4 and 6 (hard connectors).
In the full temperature range (-40 ℃ -50 ℃) of the full temperature test, the phase consistency of the full frequency band of 8 channels is observed from an oscilloscope, and the stability of the channels is considered to meet the requirement when the phase consistency is less than or equal to 4 DEG (the requirement is changed according to the system requirement). Otherwise, it is not satisfied.
Full dynamic test, input-90 dBm-40 dBm (change according to system requirement), observe 8 channel full frequency band phase consistency from oscilloscope, the channel stability is considered to meet the requirement if it is less than or equal to 4 degree (change according to system requirement). Otherwise, it is not satisfied.
Testing at any time at normal temperature, and performing spot check and examination at any time for 48 hours. Observing the phase consistency of the 8-channel full frequency band from an oscilloscope, and considering that the channel stability meets the requirement if the phase consistency is less than or equal to 4 degrees (the requirement is changed according to the system requirement). Otherwise, it is not satisfied.
The above experiments are merely to meet the needs of the exemplary system, and may be actually changed according to the needs.
From the actual measurement results, the phase fluctuation range of the channel with the stability problem is obviously beyond that of the normal channel. Because the test system designed by the patent has stability, the phase instability is easily obtained due to the to-be-tested piece, and the reason is that the amplifier used by the to-be-tested channel is in a stable state at the Ku wave band but in an unstable state at 70GHz, as shown in fig. 6, so that the amplifier is in a condition stable state at the full frequency band and is easily influenced by biasing and assembly processes. The problem channel can be screened out by using the test scheme in the early stage, and the unstable risk is eliminated in time.
Those of ordinary skill in the art will recognize that the embodiments described herein are for the purpose of aiding the reader in understanding the principles of the present invention and should be understood that the scope of the invention is not limited to such specific statements and embodiments. Those skilled in the art can devise various other modifications and combinations of the techniques disclosed herein without departing from the spirit of the invention, which are still within the scope of the invention. The millimeter wave feed circuit described in the patent can be expanded to a 3mm frequency band or even a higher frequency band, the dielectric substrate is not limited to a Rogowski board, quartz, silicon and other materials are used as the substrate, the effect of the hard connector is to ensure the stability of system interconnection, specific models are not appointed, and only impedance matching, interface type matching, standing wave and insertion loss indexes are met, so that the system test requirement is met. In addition, the invention exemplifies the down-conversion cases, the up-conversion is still applicable in fact, and the simple transceiving is also applicable, and the core is to ensure the stability of the test system.
Claims (10)
1. The tool for testing the phase stability of the microwave millimeter wave multichannel component is characterized by comprising a signal source, a first tool and an oscilloscope;
the signal source is connected with the first tool, the first tool divides the signals into multiple paths of signals with the same channel as the tested component, and each path of signals is kept consistent in hardware connection;
the multipath signals are sequentially and correspondingly connected with the input of each path of tested component;
and the output of the tested component is connected with an oscilloscope.
2. The tool for testing the phase stability of the microwave and millimeter wave multichannel component according to claim 1, further comprising a second tool, wherein the second tool is located between the tested component and the oscilloscope, and the second tool is used for inputting the multipath output and path of the tested component to the oscilloscope.
3. The tool for testing the phase stability of the microwave and millimeter wave multichannel component according to claim 2, wherein the first tool comprises a first power division network and a first switch network; the first power division network is connected with a signal source to divide the signal source signal into multiple paths of signals with the same channel as the tested component; the multiple signals are input to a first switching network for controlling the on or off of each channel signal.
4. The tool for testing the phase stability of the microwave and millimeter wave multichannel component according to claim 3, wherein the first switching network comprises a plurality of switches with the same number of channels as the component to be tested, and each switch is connected with one output of the first power division network.
5. The tool for testing the phase stability of the microwave and millimeter wave multichannel component according to claim 3, wherein the second tool comprises a second switch network and a second power division network; the second switch network is connected with the output of the tested component and is used for controlling the on-off of each channel signal; and the second power division network is connected with the second switch network to output the multipath signal to the oscilloscope in a combined way.
6. The tool for testing the phase stability of the microwave and millimeter wave multichannel component of claim 1, wherein the first tool is connected with the component to be tested by a hard connector.
7. The tool for testing the phase stability of the microwave and millimeter wave multichannel component according to claim 2, wherein the tested component is connected with the second tool by a hard connector, and the second tool is connected with the oscilloscope by the hard connector.
8. The tool for testing the phase stability of the microwave and millimeter wave multichannel component according to claim 5, wherein the components and circuits in the first power distribution network, the first switch network, the second power distribution network and the second switch network are of a stable structure similar to that of packaging the SMT components on a printed board or that of packaging the SMT components on a chip and the printed board are assembled on a structural member in a micro-assembly mode.
9. The tool for testing the phase stability of the microwave and millimeter wave multichannel component of claim 1, wherein the component to be tested comprises a down-conversion receiving component, and the down-conversion receiving component comprises an amplifier.
10. The method for testing the phase stability of the microwave millimeter wave multichannel component is characterized by comprising the following steps of:
The signal source outputs a radio frequency signal;
The first power division network of the first tool divides the radio frequency signal power into multiple paths of signals, and the multiple paths of signals are fed into a radio frequency interface of a channel to be tested of the tested component through the control of the first switch network;
The channels of the tested component are output to the second tool;
And the second power division network of the second tool divides one channel into one channel, one channel is used as a reference channel, one channel and other channels are switched through the second switching network, and the sum channel output is connected to an oscilloscope for phase comparison.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311748309.4A CN117907682A (en) | 2023-12-19 | 2023-12-19 | Microwave millimeter wave multichannel component phase stability testing tool and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311748309.4A CN117907682A (en) | 2023-12-19 | 2023-12-19 | Microwave millimeter wave multichannel component phase stability testing tool and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117907682A true CN117907682A (en) | 2024-04-19 |
Family
ID=90693064
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311748309.4A Pending CN117907682A (en) | 2023-12-19 | 2023-12-19 | Microwave millimeter wave multichannel component phase stability testing tool and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117907682A (en) |
-
2023
- 2023-12-19 CN CN202311748309.4A patent/CN117907682A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111426940B (en) | Test system of radar chip | |
| KR100421277B1 (en) | Architecture for rf signal automatic test equipment | |
| JP3984282B2 (en) | Test equipment | |
| CN107817368B (en) | Multi-channel S parameter measuring device and measuring method | |
| CN113358946B (en) | Spread spectrum module, on-chip test system and S parameter and noise coefficient test method thereof | |
| CN112636843B (en) | Spread spectrum module and on-chip test system | |
| CN210347790U (en) | Universal automatic microwave component testing system | |
| CN114325340B (en) | Test system and test method of radio frequency chip | |
| CN110596661A (en) | Phased array radar with self-checking circuit and self-checking method thereof | |
| Chung et al. | A Packaged 0.01–26-GHz single-chip SiGe reflectometer for two-port vector network analyzers | |
| CN117907682A (en) | Microwave millimeter wave multichannel component phase stability testing tool and method | |
| JP7513994B2 (en) | Apparatus and method for simultaneously measuring a plurality of RF chip modules | |
| CN218068204U (en) | Scattering parameter measuring circuit and radio frequency testing machine | |
| Timoshenkov et al. | Multi-channel receiving module of multi beam C-band active phased array antenna | |
| CN109412621B (en) | Four-channel independent amplitude-stabilized local oscillator power dividing device and method | |
| Lemes et al. | A low-cost modular transmit front-end with analog beamforming capability | |
| CN216671887U (en) | Power synthesizer | |
| US10949005B2 (en) | Absolute phase measurement testing device and technique | |
| Woods et al. | Integrated design of an automatic six-port network analyser | |
| CN115113025A (en) | Radio frequency chip RF-HTOL aging experiment system | |
| US20240080118A1 (en) | Measurement device and method for operating a measurement device | |
| CN215813054U (en) | Millimeter wave active probe device suitable for OTA test | |
| Park et al. | Mixer-Free Phase and Amplitude Comparison Method for Built-in Self-Test of Multiple Channel Beamforming IC | |
| KR102664542B1 (en) | Slot-expandable PIM measurement apparatus and automatic PIM measurement method using the same | |
| Chen et al. | Effective Usage of Attenuators on Production Test |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |