CN210347790U - Universal automatic microwave component testing system - Google Patents
Universal automatic microwave component testing system Download PDFInfo
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- CN210347790U CN210347790U CN201921255651.XU CN201921255651U CN210347790U CN 210347790 U CN210347790 U CN 210347790U CN 201921255651 U CN201921255651 U CN 201921255651U CN 210347790 U CN210347790 U CN 210347790U
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Abstract
The utility model discloses a general microwave component automatic test system, which comprises a PC, a matrix switch, a test instrument, a signal generator and a test fixture, wherein the test fixture comprises a radio frequency input/output interface for connecting a plurality of microwave components to be tested, the signal control output end of the PC is electrically connected with the control signal input end of the signal generator, the test instrument control output end of the PC is connected with the control end of the test instrument, the switch control output end of the PC is connected with the control end of the matrix switch, the matrix switch comprises an input matrix switch and an output matrix switch, the signal output end of the signal generator is connected with the radio frequency input interface on the test fixture through the input matrix switch, the radio frequency output interface of the test fixture is connected with the radio frequency input end of the test instrument through the output matrix switch, the data output interface of the test instrument is connected with the data acquisition interface of the PC, the test instrument comprises a noise coefficient tester, and can meet the test requirements of more microwave components.
Description
Technical Field
The utility model belongs to the technical field of microwave components and parts capability test device, specifically speaking relates to a general microwave components and parts automatic test system.
Background
With the development of automation in China, automatic test systems are also more and more widely applied. The development of automatic test systems started in the 50 th 20 th century, aiming to replace manual work to complete increasingly complex test work, and more perfect automatic test systems were developed after the 60 th 20 th century combined with electronic computer technology. Automatic test systems also vary greatly depending on the product being tested in the field of application. With the development of electronic technology and communication technology, more and more products are applied to microwave components, and because of the variety of the applied fields, different microwave components have different performance requirements, in order to meet the requirements of products, the microwave components need to be subjected to various performance tests.
The invention discloses an automatic test system and method of microwave devices, which is applied for 201610212597.5, and the system comprises a PC, a switch matrix, a test instrument and a test fixture, wherein a plurality of microwave to-be-tested devices are placed on the test fixture, radio frequency input/output interfaces of the microwave to-be-tested devices are respectively connected with radio frequency input/output interfaces on the test fixture, a test fixture control signal output end of the PC is connected with a control input interface on the test fixture, the radio frequency input/output interfaces on the test fixture are respectively connected with the radio frequency input/output interfaces of the test instrument through controllable switches in the switch matrix, a data output interface of the test instrument is connected with a USB interface of the PC through a USB-to-GPIB (general purpose interface bus) line, and a switch control output end of the PC is connected with a control input end of the switch matrix. By means of the system and the method, data acquisition and processing are carried out in a multithread mode, running tests can be carried out on the microwave to-be-tested pieces, and testing efficiency is greatly improved.
This scheme discloses a test system for microwave devices, but some microwave devices also include tests for noise figure and the like, and therefore the microwave devices that the test system can test are not extensive enough.
SUMMERY OF THE UTILITY MODEL
To foretell not enough among the prior art, the utility model provides a general microwave components and parts automatic test system, signal generator is used for producing the signal that the test needs in this system, and the test instrument includes the noise factor tester, can carry out the noise factor test to microwave components and parts, can satisfy more microwave components and parts's test demand, accomplishes a test system, and multiple microwave components and parts are general.
In order to achieve the above object, the utility model discloses a solution is: the automatic test system for the universal microwave components comprises a PC (personal computer), a matrix switch, a test instrument, a signal generator and a test fixture, wherein the test fixture comprises a radio frequency input/output interface for connecting a plurality of microwave components to be tested, the signal control output end of the PC is electrically connected with the control signal input end of the signal generator, the test instrument control output end of the PC is connected with the control end of the test instrument, the switch control output end of the PC is connected with the control end of the matrix switch, the matrix switch comprises an input matrix switch and an output matrix switch, the signal output end of the signal generator is connected with the radio frequency input interface on the test fixture through the input matrix switch, the radio frequency output interface of the test fixture is connected with the radio frequency input end of the test instrument through the output matrix switch, and the data output interface of the test instrument is connected with the data acquisition interface of the PC, the test instrument comprises a noise coefficient test instrument.
The test instrument further comprises a vector network analyzer, an oscilloscope, a frequency spectrograph and a power meter, wherein the signal output end of the vector network analyzer is connected with the radio frequency input interface on the test fixture through the input matrix switch.
The signal generator is used for generating two paths of signal sources and one path of noise source.
The system also comprises a power supply which supplies power for the test system.
The PC is in communication connection with the test instrument through LAN, GPIB and USB.
The test system further comprises a bar code machine, an image scanner and a temperature and humidity monitor, wherein a control input end of the bar code machine is connected with a bar code control output end of the PC, a scanning control end of the image scanner is connected with a scanning control output end of the PC, and a detection signal output end of the temperature and humidity monitor is connected with a temperature and humidity signal input end of the PC.
The test fixture comprises a plurality of test positions for placing the microwave components to be tested, and each test position is provided with a group of radio frequency input/output interfaces.
The utility model has the advantages that:
(1) the signal generator is used for generating signals required by testing in the system, the testing instrument comprises a noise coefficient tester, the noise coefficient testing can be carried out on microwave components, the testing requirements of more microwave components can be met, the testing system is realized, and multiple microwave components are universal.
Drawings
FIG. 1 is a schematic block diagram of a testing system of the present invention;
FIG. 2 is a schematic block diagram of the testing system for testing the power amplifier of the present invention;
FIG. 3 is the schematic block diagram of the testing system for testing the low noise amplifier
FIG. 4 is a schematic block diagram of the testing system testing mixer of the present invention;
FIG. 5 is a schematic block diagram of the test system for testing the directional coupler of the present invention;
fig. 6 is a schematic block diagram of the testing system testing rf switch of the present invention;
fig. 7 is a schematic block diagram of the test filter of the test system of the present invention;
FIG. 8 shows a schematic block diagram of the test power divider of the test system of the present invention
Fig. 9 is a schematic block diagram of the testing system testing rf divider of the present invention.
Detailed Description
The invention is further described below with reference to the accompanying drawings:
as shown in fig. 1, the automatic testing system for general microwave components comprises a PC, a matrix switch, a testing instrument, a signal generator and a testing fixture, wherein the testing fixture comprises a radio frequency input/output interface for connecting a plurality of microwave components to be tested, a signal control output end of the PC is electrically connected with a control signal input end of the signal generator, a testing instrument control output end of the PC is connected with a control end of the testing instrument, a switch control output end of the PC is connected with a control end of the matrix switch, the matrix switch comprises an input matrix switch and an output matrix switch, a signal output end of the signal generator is connected with the radio frequency input interface on the testing fixture through the input matrix switch, a radio frequency output interface of the testing fixture is connected with the radio frequency input end of the testing instrument through the output matrix switch, and a data output interface of the testing instrument is connected with a data acquisition interface of the PC, the test instrument comprises a noise coefficient test instrument, a vector network analyzer, an oscilloscope, a frequency spectrograph and a power meter, wherein the signal output end of the vector network analyzer is connected with the radio frequency input interface on the test fixture through the input matrix switch. The signal generator is used for generating two paths of signal sources and one path of noise source. The system also comprises a power supply which supplies power for the test system. The PC is in communication connection with the test instrument through LAN, GPIB and USB.
The test system further comprises a bar code machine, an image scanner and a temperature and humidity monitor, wherein a control input end of the bar code machine is connected with a bar code control output end of the PC, a scanning control end of the image scanner is connected with a scanning control output end of the PC, and a detection signal output end of the temperature and humidity monitor is connected with a temperature and humidity signal input end of the PC.
The test fixture comprises a plurality of test positions for placing the microwave components to be tested, and each test position is provided with a group of radio frequency input/output interfaces.
The signal generator is used for generating signals required by testing in the system, the testing instrument comprises a noise coefficient tester, the noise coefficient testing can be carried out on microwave components, the testing requirements of more microwave components can be met, the testing system is realized, and multiple microwave components are universal.
The automatic test system of the present invention will be further described with reference to specific products.
Example one
As shown in fig. 2, the power amplifier is tested by using the testing system of the present invention. The characteristics of the power amplifier include gain, flatness, standing waves, 1dB compression point, OIP3, etc. When the input power of the amplifier is increased to a certain point in a linear working area, the gain of the amplifier is reduced, namely, the gain of the amplifier is compressed. When the input power is further increased, the amplifier becomes saturated and the output power remains constant. The 1dB gain compression point is the input power that reduces the amplifier gain by 1 dB.
The relation between the output power and the input power of the amplifier is measured by using the power scanning function of the vector network analyzer, and the power scanning range is large enough during testing so as to ensure that the tested amplifier can be driven from a linear area to a compression area. It is important to note that when the output power of the amplifier under test exceeds the input compression level of the vector network analyzer receiver, it is also important to attenuate the output of the amplifier sufficiently. This not only prevents damage to the vector network analyzer, but also maintains the power level sufficiently high to not cause gain compression at the receiver. This can be done using attenuators, couplers, or a combination of the two. The effects of the attenuator and coupler frequency responses can be eliminated or minimized with appropriate error correction. When the automatic test system is applied to testing the power amplifier, only one path of signal source is needed, the vector network analyzer is needed for power scanning, and the frequency spectrograph and the power meter are needed for carrying out frequency spectrum and power data acquisition on the radio-frequency signal output by the power amplifier.
Example two
As shown in fig. 3, the testing system of the present invention is applied to test the low noise amplifier. The test indexes of the low noise amplifier mainly include input and output VSWR, forward gain and gain flatness, output port isolation, OIP3, noise figure and the like. The noise figure is an important parameter of the receiver. The addition of noise during reception by the receiver limits the signal-to-noise ratio and sensitivity of the receiver. The noise coefficient of the low-noise amplifier is tested by directly measuring the noise coefficient by using a noise coefficient tester. The noise figure is measured over the frequency range of the piece under test. The noise tester can display both gain and noise figure to aid in the measurement. The noise coefficient tester is a receiver and can be used for testing the input noise power; secondly, the noise tester needs to control the power-on and power-off states of a noise source to test a tested part (DUT).
The noise figure tester generates a 28VDC pulse signal to drive the noise source, which generates noise to drive the DUT. The noise figure of the DUT can be displayed on the PC because the analyzer knows the input noise and signal-to-noise ratio of the noise source. As shown in fig. 3, when testing the low noise amplifier, the signal generator generates a signal source and a noise source, and inputs the signal source and the noise source to the low noise amplifier, and the vector network analyzer, the frequency spectrograph, and the noise coefficient tester measure parameters of the frequency signal processed by the low noise amplifier.
EXAMPLE III
As shown in fig. 4, the testing system of the present invention is applied to test a mixer. The requirements for characterizing mixers and frequency converters are very close to those for amplifiers, including frequency response and phase linearity, output and compression power, noise figure, distortion and harmonics of these frequency converters. Unique to the mixer also includes higher order combining frequency, LO, rf and image rejection.
The vector network analyzer with the frequency offset mode can test the frequency conversion loss of a time fixed local oscillator and a swept intermediate frequency. During testing, a jumper wire of the vector network R channel is removed, and the intermediate frequency output end of the mixer is input to the vector network port after a pseudo filter is arranged. Proper filtering is necessary to filter out useless mixing products and ensure the correct phase locking of the R channel. When the isolation and standing wave test is carried out on the radio frequency or intermediate frequency port, the adopted local oscillation power level is the same as the level of the mixer during the actual working period, and the unused port is connected with a matched load.
As shown in fig. 4, when testing the mixer, the signal generator generates two signals to be input into the mixer, and the vector network analyzer, the frequency spectrograph, and the oscilloscope measure parameters of the frequency signal processed by the mixer.
Example four
The directional coupler is a universal microwave/millimeter wave component and can be used for signal isolation, separation and mixing, such as power monitoring, source output power amplitude stabilization, signal source isolation, transmission and reflection frequency sweep testing and the like. The main parameters characterizing the performance of the directional coupler are working bandwidth, coupling degree, directivity, isolation degree, insertion loss, return loss and the like.
As shown in fig. 5, when testing the directional coupler, the signal generator generates two signals to be input into the directional coupler, and the vector network analyzer, the frequency spectrograph, and the oscilloscope measure parameters of the frequency signal processed by the directional coupler.
EXAMPLE five
The test system is applied to test the radio frequency switch, and the characteristics of the radio frequency switch comprise insertion loss, isolation and standing wave parameters. When testing a switch with high isolation, the dynamic range of the instrument must be increased, and the noise of the instrument must be reduced to obtain a satisfactory measurement result. By reducing the bandwidth in the receiver, the dynamic range of the vector network analyzer can be improved.
As shown in fig. 6, when testing the rf switch, the signal generator generates a path of signal to be input into the rf switch, and the vector network analyzer, the frequency spectrograph, and the oscilloscope measure various parameters of the frequency signal processed by the rf switch.
EXAMPLE six
The filter is a universal passive linear two-port device, and the comprehensive characterization of the filter is usually realized by frequency sweep measurement. The main characteristics of the filter include parameters such as insertion loss, 3dB bandwidth, squareness factor, phase ripple, out-of-band rejection, etc. The 3dB bandwidth can be directly and conveniently read by utilizing the function of marking the degree by the vector network analyzer, and the 40dB bandwidth can also be directly read, and the ratio of the two is a rectangular coefficient. Out-of-band rejection is a property that characterizes the filter's ability to reject all signals out-of-band. The ability of the vector network analyzer to measure out-of-band rejection is directly dependent on the dynamic range index of the system. The phase fluctuation parameter is tested by using an electronic delay function of the vector network analyzer. With the electronic delay function of the vector network analyzer, the electrical length of the device under test can be cancelled out, resulting in a deviation from the linear phase shift, i.e. a phase fluctuation.
As shown in fig. 7, when testing the filter, the signal generator generates a signal and inputs the signal into the filter, and the vector network analyzer, the frequency spectrograph, and the oscilloscope measure parameters of the frequency signal processed by the filter.
EXAMPLE seven
The power divider is a device which divides one path of input signal energy into two paths or multiple paths and outputs equal or unequal energy. Certain isolation degree should be guaranteed between output ports of one power divider. The power divider is generally divided into one to two, one to three, etc. according to the output. The main technical parameters of the power divider include power loss (including insertion loss, distribution loss and reflection loss), voltage standing wave ratio of each port, isolation, amplitude balance, phase balance, power capacity, bandwidth and the like among the power distribution ports.
As shown in fig. 8, when testing the power divider, the signal generator generates a signal and inputs the signal to the filter, and the vector network analyzer and the frequency spectrograph measure parameters of the frequency signal processed by the power divider.
Example eight
The test system is applied to test the radio frequency divider, and the radio frequency divider refers to an electronic circuit which enables the frequency of an output signal to be one integral of the frequency of an input signal. In many electronic devices, such as electronic clocks, frequency synthesizers, etc., signals of different frequencies are required to work cooperatively, a common method is to use a crystal oscillator with high stability as a main oscillation source, and obtain various required frequency components through conversion, and a frequency divider is a main conversion means. The early frequency dividers are mostly sine frequency dividers, with the development of digital integrated circuits, pulse frequency dividers (also called digital frequency dividers) gradually replace the sine frequency dividers, and even when input and output signals are all sine waves, the frequency division is usually realized by adopting an analog-to-digital conversion-digital frequency division-digital-to-analog conversion method. Sinusoidal dividers have been rarely used where the input signal-to-noise ratio is low and the frequency is very high. For any one of the N-th order dividers, the output signal may have N phases spaced 2 pi/N apart with the input signal unchanged. This phenomenon is inherent to the frequency division, independent of the specific circuitry of the divider, and is referred to as divider output phase ambiguity.
As shown in fig. 9, when testing the rf frequency divider, the signal generator generates a signal to be input to the filter, and the spectrometer measures parameters of the frequency signal processed by the rf frequency divider.
The above-mentioned embodiments only express the specific embodiments of the present invention, and the description thereof is specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention.
Claims (7)
1. General microwave components and parts automatic test system which characterized in that: the device comprises a PC, a matrix switch, a test instrument, a signal generator and a test fixture, wherein the test fixture comprises a radio frequency input/output interface for connecting a plurality of microwave element devices to be tested, a signal control output end of the PC is electrically connected with a control signal input end of the signal generator, a test instrument control output end of the PC is connected with a control end of the test instrument, a switch control output end of the PC is connected with a control end of the matrix switch, the matrix switch comprises an input matrix switch and an output matrix switch, a signal output end of the signal generator is connected with the radio frequency input interface on the test fixture through the input matrix switch, the radio frequency output interface of the test fixture is connected with the radio frequency input end of the test instrument through the output matrix switch, and a data output interface of the test instrument is connected with a data acquisition interface of the PC, the test instrument comprises a noise coefficient test instrument.
2. The automatic testing system for the universal microwave components as claimed in claim 1, wherein: the test instrument further comprises a vector network analyzer, an oscilloscope, a frequency spectrograph and a power meter, wherein the signal output end of the vector network analyzer is connected with the radio frequency input interface on the test fixture through the input matrix switch.
3. The automatic testing system for the universal microwave components as claimed in claim 2, characterized in that: the signal generator is used for generating two paths of signal sources and one path of noise source.
4. The automatic testing system for the universal microwave components as claimed in claim 1, wherein: the system also comprises a power supply which supplies power for the test system.
5. The automatic testing system for the universal microwave components as claimed in claim 1, wherein: the PC is in communication connection with the test instrument through LAN, GPIB and USB.
6. The automatic testing system for the universal microwave components as claimed in claim 1, wherein: the test system further comprises a bar code machine, an image scanner and a temperature and humidity monitor, wherein a control input end of the bar code machine is connected with a bar code control output end of the PC, a scanning control end of the image scanner is connected with a scanning control output end of the PC, and a detection signal output end of the temperature and humidity monitor is connected with a temperature and humidity signal input end of the PC.
7. The automatic testing system for the universal microwave components as claimed in claim 1, wherein: the test fixture comprises a plurality of test positions for placing the microwave components to be tested, and each test position is provided with a group of radio frequency input/output interfaces.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112530825A (en) * | 2020-11-26 | 2021-03-19 | 中国科学院上海微系统与信息技术研究所 | On-chip multi-parameter measuring device |
| CN113092859A (en) * | 2021-04-01 | 2021-07-09 | 北京航天计量测试技术研究所 | Switch matrix |
| CN115086205A (en) * | 2022-05-06 | 2022-09-20 | 武汉凡谷电子技术股份有限公司 | Test method, system, device and storage medium for efficiently using network analyzer |
| CN117007913A (en) * | 2023-10-07 | 2023-11-07 | 成都菲斯洛克电子技术有限公司 | Portable radio frequency comprehensive automatic testing device and testing method thereof |
| CN117517848A (en) * | 2024-01-05 | 2024-02-06 | 成都威频通讯技术有限公司 | Automatic testing system for microwave assembly |
-
2019
- 2019-08-05 CN CN201921255651.XU patent/CN210347790U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112530825A (en) * | 2020-11-26 | 2021-03-19 | 中国科学院上海微系统与信息技术研究所 | On-chip multi-parameter measuring device |
| CN113092859A (en) * | 2021-04-01 | 2021-07-09 | 北京航天计量测试技术研究所 | Switch matrix |
| CN115086205A (en) * | 2022-05-06 | 2022-09-20 | 武汉凡谷电子技术股份有限公司 | Test method, system, device and storage medium for efficiently using network analyzer |
| CN117007913A (en) * | 2023-10-07 | 2023-11-07 | 成都菲斯洛克电子技术有限公司 | Portable radio frequency comprehensive automatic testing device and testing method thereof |
| CN117007913B (en) * | 2023-10-07 | 2023-12-22 | 成都菲斯洛克电子技术有限公司 | Portable radio frequency comprehensive automatic testing device and testing method thereof |
| CN117517848A (en) * | 2024-01-05 | 2024-02-06 | 成都威频通讯技术有限公司 | Automatic testing system for microwave assembly |
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