CN117781960A - Lens or glass surface finish inspection device and inspection method - Google Patents

Abstract

The invention discloses a device and a method for detecting the surface finish of a lens or glass, and relates to the field of optical lens or glass detection; the device structurally comprises a first light source, a light filter, a PBS spectroscope, a 1/4 wave plate, a first imaging lens component, a bearing component, a second light source, a second imaging lens component and a shooting component; the optical filter is positioned between the first light source and the incident surface of the PBS spectroscope; the first imaging lens component and the 1/4 wave plate are positioned between the bearing component and the reflecting surface of the PBS spectroscope, and the first imaging lens component is close to the bearing component; the bearing assembly is provided with a first light through hole, and the second light source is positioned at one side of the bearing assembly and faces the first light through hole; the second imaging lens assembly is positioned between the photographing assembly and the transmission surface of the PBS spectroscope. The device provided by the invention can rapidly and accurately detect the surface finish of the lens or glass, eliminates human errors and has good consistency; simple structure, convenient equipment is got and is put.

Description

Lens or glass surface finish inspection device and inspection method

Technical Field

The invention relates to the field of optical lens or glass detection, in particular to a lens or glass surface finish inspection technology.

Background

The surface finish is a quality inspection indicator for optical lenses or glass. Strictly speaking, the surface finish is distinguished from the surface roughness. Surface finish is a concept based on human vision; the surface roughness is formed into microscopic geometric shapes on the surface of the optical element during the processing of the optical element due to friction or high-frequency vibration of the cutter and the surface of the element. Since the detection and calculation of the surface roughness are complicated, the optical quality of the optical lens or glass surface can be more intuitively detected by visually observing the finish of the optical element with the aid of the light source.

With the continuous development of precision laser technology, the requirements on surface cleanliness are higher and higher. Especially in high power laser systems, the surface quality of the optical element is one of the important factors limiting its further development. The quality of the surface of the optical element directly affects the performance of the whole optical system, so that the optical instrument and equipment can work more efficiently, and the quality of the surface of the optical element is required to be paid attention to during processing, and the detection work of the finished product element is required to be performed. How to better detect the surface finish of an optical lens is becoming one of the important detection indexes.

Disclosure of Invention

In order to overcome the defects in the prior art, the invention provides a device for inspecting the surface finish of a lens or glass and a corresponding detection method, which are realized by the following technology.

The lens or glass surface finish inspection device comprises a first light source, an optical filter, a PBS spectroscope, a 1/4 wave plate, a first imaging lens component, a bearing component, a second light source, a second imaging lens component and a shooting component; the first light source is used for emitting light of at least two colors at the same time, and the optical filter is positioned between the first light source and the first window of the PBS spectroscope; the first imaging lens component and the 1/4 wave plate are positioned between the bearing component and the second window of the PBS spectroscope, and the first imaging lens component is close to the bearing component; the bearing assembly is provided with a first light through hole, the second light source is positioned on one side of the bearing assembly opposite to the first imaging lens assembly, and the second light source is arranged towards the first light through hole; the second imaging mirror assembly is positioned between the photographing assembly and a third window of the PBS beam splitter.

When the inspection device provided by the invention is used, the light path principle is as follows: light emitted by the first light source passes through the optical filter, enters the PBS spectroscope from the first window, is reflected by S light, is emitted from the second window, passes through the 1/4 wave plate, and then passes through the proper refraction treatment of the first imaging lens assembly, and irradiates on the surface of a lens or glass to be tested to form a phase surface with a certain area size; the light reflected by the phase surface passes through the first imaging lens component and the 1/4 wave plate again, the polarization direction of the light is rotated by 90 degrees to become P light under the action of the 1/4 wave plate, the P light is transmitted through the PBS spectroscope again and is emitted from the third window, and the P light is properly refracted through the second imaging lens component and is finally received by the shooting component, so that an image capable of reflecting microscopic conditions of the lens or glass surface is obtained.

In the above process, the second light source mainly plays a role of illumination, that is, enhancing the brightness of the lens or glass surface image. The intensity of the light emitted from the second light source is also limited appropriately. Too high a light intensity can cause overexposure of the lens or glass surface image background, but rather poor visualization of surface defects; too low a light intensity does not provide a brightness enhancement effect.

Typically, the devices are provided in sealed housings or containers in order to prevent external interference. The first light source and the second light source can be common bulbs, and other light-emitting devices can also be selected. The first light source is responsible for emitting white light or multi-color light containing multiple colors, but the first light source is not generally selected from light sources which can emit only monochromatic light or quasi-monochromatic light. Since different defects (scratches, spots, pits, etc.) on the surface of the lens or glass to be measured have different imaging effects when light of different colors is detected, a suitable background color is required to be selected in order to obtain an image of the surface of the lens or glass as clear as possible. The filter has the function of creating a proper background color, filtering light with other colors emitted by the first light source, enabling monochromatic light or quasi-monochromatic light to be emitted into the PBS spectroscope, further changing the colors of the surface and the background of an observed object, and enabling a detector to conveniently and clearly observe the defects of the lens or glass to be detected. The optical filter is generally detachable and replaceable, and different colors can be filtered and changed by inserting different types of optical filters, so that different background colors are created, and the defects of observing the surface of the lens in different colors can be conveniently switched. The second light source is mainly responsible for observing the transmitted light, and the main function is to provide illumination and adjust brightness, so that the definition of the measured object can be observed more easily.

The light emitted by the first light source is divided into P light and S light according to the vibration direction, the vibration direction of the P light is perpendicular to the incidence plane, and the vibration direction of the S light is parallel to the incidence plane. In the above device, the PBS beamsplitter can transmit P-polarized light (i.e., P-light) and reflect S-polarized light (i.e., S-light).

In the device, the 1/4 wave plate can rotate 90 degrees in the polarization direction of the reflected light, so that the reflected light passing through the PBS spectroscope is received by the shooting component.

In the above device, the first imaging lens assembly is used for refracting and amplifying light emitted by the first light source appropriately, refracting and shrinking appropriately, and converging the light on the surface of the lens or glass. The spot size of the light emitted from the first imaging mirror assembly is the focal plane size of the first imaging mirror assembly, i.e., the phase surface size that impinges on the lens or glass surface. The focal plane parameters of the first imaging lens assembly can be selected according to practical requirements, for example, the first imaging lens assembly with the focal plane diameter of 100mm can be selected.

In the device, the main function of the second imaging lens component is to refract the light emitted by the third window, so as to reduce the phase difference and spherical aberration of the lens or glass to be detected, prevent the phase of the lens or glass to be detected from being distorted, improve the definition of the surface of the lens or glass photographed by the photographing component, and make the lens or glass more suitable for imaging on the photographing component.

Generally, the first imaging lens assembly and the second imaging lens assembly have functions of focusing, zooming in and zooming out, etc., so as to improve the definition of the lens or glass surface to be detected by the shooting assembly. In order to adapt to the surface of the lens or glass to be measured, the first imaging lens assembly requires a large size of the phase surface of the convergence point.

The PBS spectroscope, the first imaging lens component and the second imaging lens component are all commonly used optical components in the industry, and can be selected according to actual needs.

In the device, the bearing component is used for placing the tested product (glass or lens), and the first light through hole on the bearing component is used for facilitating the light emitted by the second light source to pass through.

In the above device, the photographing assembly is used for receiving the light transmitted from the second imaging mirror assembly and forming an image. Generally, a CCD camera commonly used in industry can be used as the photographing component. And then analyzing the photographing result of the photographing component by using analysis software to finally obtain the finish detection result of the surface of the tested product.

Further, the bearing assembly comprises an objective table, and the first light transmission hole is formed in the middle of the objective table. The objective table is used for placing the tested product.

Furthermore, a clamping piece can be arranged on the object stage to fix the tested product if necessary.

Further, the bearing assembly further comprises an adjusting assembly, and the adjusting assembly controls the objective table to move in the x, y and z axis 3 directions.

The adjusting component can realize the movement of the objective table in the vertical direction and the horizontal direction, so that the position of a tested product is adjusted, the smoothness of a light path is ensured, and the detection precision is improved.

Generally, based on the function of the adjusting component, the industry can select a displacement table as the adjusting component of the invention, and can select a gear rack, a linear sliding rail, a ball screw with a motor or other various adjusting modes to realize the movement in the x, y and z axes.

Further, the second light source is provided with a light intensity adjusting component. The light intensity adjustment assembly may be used to adjust the light intensity of the second light source.

Generally, the light intensity adjusting knob can be realized by using devices such as a variable resistor, a controllable silicon or an autotransformer.

Further, a diaphragm is arranged between the second light source and the bearing component. The diaphragm is used for adjusting the size of a light spot irradiated by the second light source to the lens or glass to be measured, and is a common optical component.

Further, a light transmission adjusting component is arranged on the bearing component. The light transmission adjusting component has the same function as the diaphragm.

Still further, the light-passing adjusting component comprises a light-passing adjusting piece, a plurality of second light-passing holes with different diameters are formed in the light-passing adjusting piece, and the light-passing adjusting piece is operated to enable 1 of the second light-passing holes to correspond to the first light-passing holes.

Further, a third light source is further arranged, the third light source is located on the same side of the bearing assembly as the first imaging lens assembly, and the third light source faces the first light through hole.

The invention also provides a method for inspecting the surface finish of the lens or the glass, which is used for inspecting the surface finish of the lens or the glass by using the device for inspecting the surface finish of the lens or the glass;

placing a lens or glass to be tested on the bearing component, enabling the surface of the lens or glass to be tested to correspond to the first light through hole, and opening the first light source, the second light source and the shooting component;

adjusting the positions of the first imaging lens assembly, the second imaging lens assembly and the bearing assembly so that light rays transmitted through the first imaging lens assembly form a phase surface on the surface of the lens or the glass to be detected, and the area of the phase surface is not larger than the surface area of the lens or the glass to be detected; the light transmitted through the second imaging lens assembly is received by the shooting assembly, and a surface image of the lens or glass to be detected is obtained;

and calculating and analyzing the surface image of the lens or glass to be detected, which is shot by the shooting component, so as to obtain a detection result.

Compared with the prior art, the invention has the following advantages:

1. the invention provides a device for rapidly detecting the surface finish of a lens or glass, which can rapidly and accurately detect the surface finish of the lens or glass, eliminates human errors and has good consistency.

2. The device has simple structure and good universality, and is convenient to assemble and take and place.

Drawings

FIG. 1 is a block diagram of a lens or glass surface finish inspection device;

FIG. 2 is a standard schematic diagram of a first light-passing aperture region division;

FIG. 3 is a standard schematic of pocking marks;

FIG. 4 is a method of calculating the diameter of an irregular pit;

fig. 5 and 6 are example photographs of poor and good finishes, respectively, according to the army's standard.

In the figure: 1. a first light source; 2. a light filter; 3. PBS spectroscope; 4. a 1/4 wave plate; 5. a first imaging mirror assembly; 6. a carrier assembly; 7. a second light source; 8. a second imaging mirror assembly; 9. a shooting assembly; 10. a first light-passing hole; 11. an objective table; 12. an adjustment assembly; 13. a light intensity adjusting component; 14. a diaphragm.

Detailed Description

The following description of the present invention will be made clearly and fully, and it is apparent that the embodiments described are only some, but not all, of the embodiments of the present invention. All other embodiments, which can be made by one of ordinary skill in the art without undue burden on the person of ordinary skill in the art based on embodiments of the present invention, are within the scope of the present invention.

As shown in FIG. 1, the lens or glass surface finish inspection device provided by the invention comprises a first light source 1, a light filter 2, a PBS spectroscope 3, a 1/4 wave plate 4, a first imaging lens assembly 5, a bearing assembly 6, a second light source 7, a second imaging lens assembly 8 and a shooting assembly 9; the first light source is used for emitting light of at least two colors at the same time, and the optical filter 2 is positioned between the first light source 1 and the first window of the PBS spectroscope 3; the first imaging lens assembly 5 and the 1/4 wave plate 4 are positioned between the bearing assembly 6 and the second window of the PBS spectroscope 3, and the first imaging lens assembly 5 is arranged close to the bearing assembly 6; the bearing component 6 is provided with a first light through hole 10, the second light source 7 is positioned on one side of the bearing component 6 opposite to the first imaging lens component 5, and the second light source 7 is arranged towards the first light through hole 10; the second imaging mirror assembly 8 is located between the photographing assembly 9 and the third window of the PBS beamsplitter 3.

In the device, the first light source and the second light source are halogen lamps (the brightness of the halogen lamps is stronger than that of incandescent lamps, the spectrum is close to that of sunlight, the color temperature is little changed along with time, the volume is small, the heating is little, the luminous brightness of a unit area is large, and the device is also called a cold light source, and is suitable for microscopic photography and projection, and the common use is 6V/12W,12V/50W and 12V/110W); the filter is a green filter (or other colors); the PBS spectroscope adopts TP/TS=50%/50%, or other proportions; the first imaging lens component and the second imaging lens component are selected for use; the shooting component adopts a CCD camera.

In general, the surface finish detection result can be automatically determined according to different standards by inputting the image of the lens or glass surface to be detected, which is captured by the capturing component, into the computer program. The computer program is a program commonly used in the industry at present, and software of a metallographic microscope manufacturer in the market can be directly used, for example, software of a company such as Shenzhen Runxing optical instruments Limited, bang Yi precision measuring instruments (Shanghai) Limited (Bisanmu Ao4 XC), cossim three-mesh inverted metallographic microscope CMY-40, beijing century department science instruments Limited, olympic Bas BX53M forward metallographic microscope, ledi instruments (Ningbo) Limited and the like. These programs can be directly downloaded and installed for later use. The following embodiment selects the existing program of Shenzhen Runxing optical instruments Inc. for detection.

In some embodiments, as shown in fig. 1, the carrier assembly 6 includes a stage 11, and the first light-transmitting hole 10 is disposed in a middle portion of the stage 11.

In some embodiments, as shown in fig. 1, the carrier assembly 6 further includes an adjustment assembly 12, and the adjustment assembly 12 controls movement of the stage in 3 directions of x, y, and z axes.

In some embodiments, as shown in fig. 1, the second light source 7 is provided with a light intensity adjusting component 13 (a light intensity adjusting knob).

In some embodiments, as shown in fig. 1, a diaphragm 14 is disposed between the second light source and the carrier assembly;

in some embodiments, the carrier assembly is provided with a light transmission adjusting assembly.

Further, in some embodiments, the light-passing adjusting component includes a light-passing adjusting member, and a plurality of second light-passing holes with different diameters are provided on the light-passing adjusting member, and the light-passing adjusting member is operated to make 1 of the second light-passing holes correspond to the first light-passing hole.

In some embodiments, a third light source is further provided, where the third light source is located on the same side of the carrier assembly as the first imaging lens assembly, and the third light source faces the first light hole.

The method for detecting the surface finish of the tested product by using the device comprises the following steps:

(1) Placing a lens or glass to be tested on the bearing component, enabling the surface of the lens or glass to be tested to correspond to the first light through hole, and opening the first light source, the second light source and the shooting component;

(2) Adjusting the positions of the first imaging lens assembly, the second imaging lens assembly and the bearing assembly so that light rays transmitted through the first imaging lens assembly form a phase surface on the surface of the lens or the glass to be detected, and the area of the phase surface is not larger than the surface area of the lens or the glass to be detected; the light transmitted through the second imaging lens assembly is received by the shooting assembly, and a surface image of the lens or glass to be detected is obtained;

(3) And calculating and analyzing the surface image of the lens or glass to be detected, which is shot by the shooting component, so as to obtain a detection result.

When the device is used for detecting the surface finish of a detected product, the light path principle in the device is as follows: light emitted by the first light source passes through the optical filter, enters the PBS spectroscope from the first window, is reflected by S light, is emitted from the second window, passes through the 1/4 wave plate, and then passes through the proper refraction treatment of the first imaging lens assembly, and irradiates on the surface of a lens or glass to be tested to form a phase surface with a certain area size; the light reflected by the phase surface passes through the first imaging lens component and the 1/4 wave plate again, the polarization direction of the light is rotated by 90 degrees to become P light under the action of the 1/4 wave plate, the P light is transmitted through the PBS spectroscope again and is emitted from the third window, and the P light is properly refracted through the second imaging lens component and is finally received by the shooting component, so that an image capable of reflecting microscopic conditions of the lens or glass surface is obtained.

Experimental example: verification of the above-described inspection device and surface finish detection method

1. Correlation detection criteria

In general, the standard numbers for the Chinese, russian and United states army differ in the existing surface finish inspection methods.

(1) National standard provision

The test should be carried out by using black screen as background, and using common incandescent bulb with 36V and 60W-108W light source, and observing with 4-10 times magnifying glass under transmitted light or reflected light.

(2) Russian standard provision

The light source is a common incandescent bulb with the light source of 60-100W in inspection, and the bulb is observed under transmitted light or reflected light. The optical surface near the image plane should be inspected by a magnifying glass not less than 6 times, the optical surface of class I-III should be inspected by a magnifying glass not more than 6 times, and the optical surface below class IV should be inspected without a magnifying glass.

(3) Army standard provision

Distance: the distance between the human eyes and the surface of the measured object is 200-300mm;

time: each inspection time is not more than 10s (defects which cannot be detected in 10s can be ignored);

position: the viewing surface forms 45 degrees with the mirror surface, and rotates 15 degrees up and down and left and right;

illumination: a 9W cold white light lamp, wherein the light source is 150-200mm (the illuminance reaches 800-1200 Lux) from the surface of the measured object;

inspection background: placing the lens on a white background when checking the black spot; the lenses were placed on a black background when checking for white spots.

Meanwhile, the detection method also provides that the road, the bright road, the scratch and the scratch are all called as scratches. Spots, pits, and pits are all called pits. The ratio of specified length to width is greater than 4:1 is a scratch; the ratio of length to width is less than 4:1 is pits.

After the imaging photo is obtained by adopting the device and the detection method, the requirements of various detection indexes are input into an analysis software program, and the surface finish of the tested product can be automatically calculated according to the imaging photo.

2. Noun definition

Taking the army mark as an example, parameters are preset, and the definition of the related parameters is as follows:

(1) Surface dotted line defect: also known as poor finish; MIL-O-13830B, according to the U.S. military standard, represents surface defect size in two sets of numbers. 40/20 (or 40-20) of the former limit the line defect size and the latter limit the point defect size.

(2) Line defect: also known as scratches; refers to the surface defect length: the defects with the width of more than 4:1 are as follows: defects such as road, bright road, scratch and the like.

(3) Point defect: also known as pits; refers to the surface defect length: the defects with the width less than or equal to 4:1 are as follows: bright spots, bubbles, impurities, short flaws, film plating spots, film marks, stabs, pits, film weak blocks, mold spots, clouds, mist, sand meshes, foam, water marks, and the like.

(4) Effective aperture: the surface quality in a specific area centered on the optical axis is suitable for the specification of the flaw/bright spot, and is generally divided into an area A and an area B during inspection, wherein the area A is 90% of the area, also called an effective first light-passing hole area, and is inspected according to the standard of dividing the first light-passing hole area if the drawing is not required as shown in the following figure. As shown in fig. 2.

(5) Edge breakage: the defect of the edge of the lens is that part of glass is peeled off and peeled off from the surface of the edge of the lens.

(6) Protective chamfering: the edge of the lens is prevented from being broken, and no special requirement is required for edge chamfering.

(7) Crack: the defect of the lens edge is that the surface of the lens edge is cracked, but the glass is not dropped.

(8) Scratch: refers to a short flaw on the lens.

(9) Dirt/mildew stain: the color-changing areas on the surface of the lens such as water marks, foam, mist, cloud, puncture and the like can not be wiped off.

(10) Air bubble: spherical air pockets inside the element.

(11) Gray specks: refers to an incompletely polished gray article on the surface of an element, which originates from a sanding residue.

(12) Equivalent diameter (actual external dimensions of the product): the calculated diameter of the non-circular part should take the diameter of an equal area circle.

A. The ratio of length to width of the rectangle is less than 5:1, equivalent diameter= (length+width)/2;

B. the ratio of length to width of the rectangle is greater than 5: in the case of 1, the number of the times of the process is reduced,

C. RAP square equivalent diameter= (square side length + side width)/2;

D. RAP ramp equivalent diameter= (right angle side length x 1.414+ side width)/2;

E. RBP large surface equivalent diameter= (large surface long side length+side width)/2;

F. RBP facet equivalent diameter= (large face height×1.414+ side width)/2;

G. DVP bottom equivalent diameter= (bottom side long + side wide)/2;

H. DVP flank equivalent diameter= (height 1.414+ side width)/2;

I、

(13) Inter-defect distance: the minimum distance between two defects.

3. Grade classification standard of finish

The finish grade criteria are shown in table 1 below.

TABLE 1 finish grade separation criteria

4. Determination method

(1) When the number of scratch levels of the component exceeds the number of scratch levels required for surface quality, the component is rejected. For example: the surface quality of the element is required to be 60/40, the scratch of the element is required to be less than or equal to 60#, the pit is less than or equal to 40#, and if the scratch is more than 60# or the pit is more than 40#, the element is not qualified.

(2) The finish must be written in a two-bit data format, if the product point is judged to be 0# but the scratch is judged to be 40# then the product finish is 40/20 instead of 40/0. If the product point is judged to be 20# and the scratch is judged to be 0#, the product finish is 40/20 instead of 0/20.

(3) When the width of the scratch is less than 0.002mm, the scratch is negligible, and when the pit diameter is less than 0.0025mm, the scratch is negligible

(4) When the interval between two or more scratches is less than 0.1mm, the scratches are combined into one calculation, and the cross scratches are also combined into one calculation. The length of the combined scratches is from the beginning to the end of the scratches, and the width is taken from the outer edges of the scratches.

(5) The distance between any two pits must be greater than 1mm, otherwise, the pit is considered as a pit, and the boundary of the pit is the most edge of two small pits. When the pits are densely gathered, the peripheral ring diameter of the pits is taken as the pit size. As shown in left figure 3.

(6) If the pit shape is irregular. The average of the maximum length and the maximum width should be taken as the diameter as shown in fig. 4.

(7) All the central areas of the product (25% of the equivalent diameter of the product) are not allowed to have defects such as scratches, bubbles, pits and the like.

5. Identification method for scratch and pock grades

The method of identifying scratch and mar grades is shown in table 2 below.

TABLE 2 identification method for scratch and pock grades

With the above apparatus and method, an example photograph of poor finish is shown in fig. 5 and an example photograph of good finish is shown in fig. 6, according to the army's standard.

The above detailed description describes in detail the practice of the invention, but the invention is not limited to the specific details of the above embodiments. Many simple modifications and variations of the technical solution of the present invention are possible within the scope of the claims and technical idea of the present invention, which simple modifications are all within the scope of the present invention.

Claims (9)

1. The lens or glass surface finish inspection device is characterized by comprising a first light source, a light filter, a PBS spectroscope, a 1/4 wave plate, a first imaging lens component, a bearing component, a second light source, a second imaging lens component and a shooting component; the first light source is used for emitting light of at least two colors at the same time, and the optical filter is positioned between the first light source and the first window of the PBS spectroscope; the first imaging lens component and the 1/4 wave plate are positioned between the bearing component and the second window of the PBS spectroscope, and the first imaging lens component is close to the bearing component; the bearing assembly is provided with a first light through hole, the second light source is positioned on one side of the bearing assembly opposite to the first imaging lens assembly, and the second light source is arranged towards the first light through hole; the second imaging mirror assembly is positioned between the photographing assembly and a third window of the PBS beam splitter.

2. The lens or glass surface finish inspection device according to claim 1, wherein the carrier assembly comprises a stage, the first light passing aperture being provided in a middle portion of the stage.

3. The lens or glass surface finish inspection device according to claim 1, wherein the carrier assembly further comprises an adjustment assembly that controls movement of the stage in 3 directions of the x, y, z axes.

4. The lens or glass surface finish inspection device according to claim 1, wherein the second light source is provided with a light intensity adjustment assembly.

5. The lens or glass surface finish inspection device of claim 1, wherein a diaphragm is disposed between the second light source and the carrier assembly.

6. The lens or glass surface finish inspection device according to claim 1, wherein the carrier assembly is provided with a light transmission adjustment assembly.

7. The device of claim 6, wherein the light-passing adjustment assembly comprises a light-passing adjustment member having a plurality of second light-passing holes with different diameters, wherein 1 of the second light-passing holes corresponds to the first light-passing hole.

8. The lens or glass surface finish inspection device according to claim 1, further comprising a third light source located on the same side of the carrier assembly as the first imaging lens assembly, the third light source facing the first light passing aperture.

9. A method of inspecting a surface finish of a lens or glass, characterized in that the inspection is performed using the lens or glass surface finish inspection device of any one of claims 1-8;

placing a lens or glass to be tested on the bearing component, enabling the surface of the lens or glass to be tested to correspond to the first light through hole, and opening the first light source, the second light source and the shooting component;

adjusting the positions of the first imaging lens assembly, the second imaging lens assembly and the bearing assembly so that light rays transmitted through the first imaging lens assembly form a phase surface on the surface of the lens or the glass to be detected, and the area of the phase surface is not larger than the surface area of the lens or the glass to be detected; the light transmitted through the second imaging lens assembly is received by the shooting assembly, and a surface image of the lens or glass to be detected is obtained;

and calculating and analyzing the surface image of the lens or glass to be detected, which is shot by the shooting component, so as to obtain a detection result.