CN117723939A - Multichannel high-speed low-resistance measurement system - Google Patents
Multichannel high-speed low-resistance measurement system Download PDFInfo
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- CN117723939A CN117723939A CN202311742837.9A CN202311742837A CN117723939A CN 117723939 A CN117723939 A CN 117723939A CN 202311742837 A CN202311742837 A CN 202311742837A CN 117723939 A CN117723939 A CN 117723939A
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- 238000005259 measurement Methods 0.000 title claims abstract description 29
- 238000012360 testing method Methods 0.000 claims abstract description 65
- 238000004891 communication Methods 0.000 claims abstract description 19
- 238000001514 detection method Methods 0.000 claims description 11
- 230000005540 biological transmission Effects 0.000 abstract description 11
- 230000000694 effects Effects 0.000 abstract description 5
- 238000013480 data collection Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
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Abstract
The invention discloses a multichannel high-speed low-resistance measuring system, which belongs to the field of chip measurement and comprises one or more test single machines, wherein the test single machines are connected in parallel and communicated with each other through BUS buses, the test single machines are connected with a main control computer PC through the BUS buses, the main control computer is connected with a test computer PC through TCP/IP protocol communication, a single board host computer Master and a single board sub-machine are arranged in the test single machines, the single board sub-machine is provided with four groups, the single board host computer Master and the four groups of single board sub-machines are connected in a communication way, a measuring chip ADC (analog-digital converter) is connected with a micro control unit MCU in a communication way, and the measuring chip ADC transmits a measured result to the micro control unit MCU. The invention tests a plurality of devices to be tested together at one time, so that the switching speed during testing is increased, the testing time is shortened, the testing effect and efficiency are improved, the data transmission of a plurality of groups of large data is facilitated, the loss of data is avoided, the safety of data transmission is improved, and the testing cost is reduced.
Description
Technical Field
The invention relates to the field of chip measurement, in particular to a multichannel high-speed low-resistance measurement system.
Background
With the rapid development of technology, chips play an indispensable role in modern society. Almost all electronic products are not supported by the chip, whether computers, mobile phones, automobiles or internet of things devices. Along with the wide application of chips, people have also put higher demands on the quality and safety of chips. The chip is used as a core component of the electronic product, and the quality and the safety of the chip are directly related to the performance, the stability and the reliability of the product. Therefore, it is important to perform comprehensive detection on the chip. Chip resistance refers to the resistance device in the chip, and the measurement principle is the same as that of a common resistor. The resistor has a certain relation between the current and the voltage in the direct current circuit, by means of which the resistance measurement can be performed.
The existing chip low-resistance measuring device is generally used for one-to-one measurement through measuring instruments, the measuring process is complex, the measuring speed is low, when the measuring speed needs to be increased, only a new measuring instrument can be added, the chip low-resistance measuring instrument is generally high in cost, the use cost of the instrument can be greatly increased, and the testing efficiency is low.
Disclosure of Invention
In view of the above problems, it is an objective of the present invention to provide a multi-channel high-speed low-resistance measurement system, which solves the above problems.
In order to achieve the above purpose, the present invention provides the following technical solutions:
the multi-channel high-speed low-resistance measuring system comprises one or more test units, wherein the test units are connected in parallel and communicated through BUS buses, and one test unit is provided with 64 test channels;
the test unit is connected with the main control computer through the BUS BUS, the main control computer is connected with the test computer through TCP/IP protocol communication, test data of the test unit are transmitted and summarized to the main control computer, and the main control computer transmits test results to the test computer;
the single board machine is internally provided with a single board host Master and single board sub-machines, each single board sub-machine is provided with four groups, one single board sub-machine is provided with 16 test channels, the single board host Master is in communication connection with the four groups of single board sub-machines, and one single board sub-machine tests 16 devices to be tested at a time;
the single-board host Master comprises a micro control unit MCU, the single-board host Master comprises a first MUX logic gate circuit and a second MUX logic gate circuit, and the output end of the micro control unit MCU is in communication connection with the first MUX logic gate circuit and the second MUX logic gate circuit;
the single board host Master is internally provided with two groups of connectors, the single board sub-machine measurement channel data are in communication connection with the connectors in the single board host Master, the two groups of connectors are connected with a first MUX logic gate circuit through a voltage detection line, the two groups of connectors are connected with a second MUX logic gate circuit through a current detection line, the output ends of the first MUX logic gate circuit and the second MUX logic gate circuit are connected with a measurement chip ADC, and the measurement chip ADC is used for carrying out test analysis on the data of a device to be tested;
the measuring chip ADC is in communication connection with the micro control unit MCU, and the measuring chip ADC transmits a measured result to the micro control unit MCU;
the micro control unit MCU is connected with the BUS BUS, and the BUS BUS is connected with the master control machine.
As a further scheme of the invention: the number of the test single machines is 1-4, and 2-4 test single machines are mutually connected in parallel and communicated through BUS buses.
As a further scheme of the invention: and a constant voltage power supply is arranged in the single board host Master, and is electrically connected with the first MUX logic gate circuit, the second MUX logic gate circuit, the measuring chip ADC and the micro control unit MCU.
As a further scheme of the invention: and a group of connectors in the single board host Master are connected with 8 measurement channel data of the single board submachine.
As a further scheme of the invention: and a group of connectors in the single board host Master are connected with 8 voltage detection lines and 8 current detection lines.
As a further scheme of the invention: the measuring chip ADC is a 25bit resolution measuring chip.
As a further scheme of the invention: the MCU is a 32bit microprocessor.
As still further aspects of the invention: the model of the measuring chip ADC is ADS1251.
Compared with the prior art, the invention has the beneficial effects that:
the invention has 64 test channels, which can be used to test multiple devices at one time, to improve the switching speed, shorten test time, improve test effect and efficiency, to avoid data loss, improve data transmission safety, reduce cost, and improve safety.
Drawings
FIG. 1 is a schematic block diagram of a multi-channel high-speed low-resistance measurement system.
FIG. 2 is a schematic block diagram of a single motherboard in a multi-channel high-speed low-resistance measurement system.
Detailed Description
The drawings in the embodiments of the present invention will be combined; the technical scheme in the embodiment of the invention is clearly and completely described; obviously; the described embodiments are only a few embodiments of the present invention; but not all embodiments. Based on the embodiments in the present invention; all other embodiments obtained by those skilled in the art without undue burden; all falling within the scope of the present invention.
In the description of the present invention, it should be noted that, unless explicitly stated and limited otherwise, the terms "mounted," "provided," "connected," and "connected" are to be construed broadly; for example, the connection may be fixed connection, detachable connection, or integral connection, mechanical connection, electrical connection, direct connection, indirect connection via an intermediate medium, or communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
Referring to fig. 1-2, a multi-channel high-speed low-resistance measuring system includes test units, the number of the test units is 1-4, 2-4 test units are connected in parallel with each other through BUS, one test unit is provided with 64 test channels, and the work is that a plurality of devices to be tested can be conveniently tested together at one time according to selecting a proper number of test units to be connected in parallel.
The test unit is connected with the master control computer through the BUS BUS, the master control computer is connected with the test computer PC through the TCP/IP protocol communication, the work is that the test data of a plurality of test units are conveniently transmitted and summarized to the master control computer, and the test result is simultaneously transmitted to the test computer PC through the master control computer, so that people can check at any time conveniently. The invention is convenient for the data transmission of a plurality of groups of big data, avoids the loss of data, increases the safety of data transmission, is convenient for the use of the device and ensures the safety.
The single board host Master and the single board sub-machines are arranged in the single test machine, four groups of single board sub-machines are arranged, 16 test channels are arranged on one single board sub-machine, the single board host Master and the four groups of single board sub-machines are in communication connection, each single test machine can test 64 devices to be tested at one time, the low resistance of a plurality of devices to be tested can be conveniently measured, the switching speed during testing can be increased, the testing time is shortened, and the testing effect and efficiency are improved.
The single-board host Master comprises a micro control unit MCU, the single-board host Master comprises a first MUX logic gate circuit and a second MUX logic gate circuit, and the output end of the micro control unit MCU is in communication connection with the first MUX logic gate circuit and the second MUX logic gate circuit;
the single board host computer Master is internally provided with two groups of connectors, the single board sub-machine measuring channel data are in communication connection with the connectors in the single board host computer Master, the two groups of connectors are connected with the first MUX logic gate circuit through the voltage detection line, the two groups of connectors are connected with the second MUX logic gate circuit through the current detection line, the output end of the first MUX logic gate circuit and the output end of the second MUX logic gate circuit are connected with the measuring chip ADC, the measuring chip ADC is used for conveniently analyzing the data of the device to be measured, the device to be measured is conveniently tested together, the effect and the efficiency of the low-resistance measurement of the device to be measured are improved, the safety is increased, the use cost is reduced, the safety is ensured, and the device is convenient to use.
The measuring chip ADC is in communication connection with the MCU, the measuring chip ADC is convenient to transmit the measured result to the MCU, the subsequent summarized transmission is convenient, the measurement and transmission of a plurality of devices to be measured are facilitated, the safety is ensured, and the device is convenient to use.
The MCU is connected with the BUS BUS, the BUS BUS is convenient to collect data of a plurality of devices to be tested, the follow-up transmission is convenient to carry out on the main control computer, the follow-up transmission is facilitated, the card playing measurement of the PC is facilitated, the follow-up timely checking of people is facilitated, the safety is guaranteed, the loss of data is avoided, and the device is convenient to use.
The single-board host Master is internally provided with a constant voltage power supply, and the constant voltage power supply is electrically connected with the first MUX logic gate circuit, the second MUX logic gate circuit, the measuring chip ADC and the micro control unit MCU, so that power is conveniently supplied to each electronic element, the safety is ensured, and the device is convenient to use.
The model of the measuring chip ADC is ADS1251, and the ADS1251 is a deltasigma analog-to-digital converter with high precision and wide dynamic range, 24-bit resolution and single power supply of +5V power supply. The delta-sigma architecture has a wide dynamic range and 24-bit, non-missing code performance. Effective resolution 19 bits (1.5 ppm root mean square noise) is at conversion rates up to 20kHz. ADS1251 is a single channel converter, packaged with SO-8.
A group of connectors in the Master of the single board host computer are in data connection with 8 measuring channels of the single board sub-computer, so that the data transmission is facilitated, the measuring effect and efficiency are improved, the safety is ensured, and the device is convenient to use.
The measuring chip (ADC) of the invention has 25bit resolution. The MCU of the invention is a 32bit microprocessor.
The present invention is a multi-channel (256 ch), high speed (64 ch/sec.) low resistance measurement system. Each single machine can complete the measurement of 64ch in 1 second, and at most four machines can be synchronously operated in parallel to achieve the measurement speed of 256 ch/sec.
The data collection is completed in each single machine through the high-speed parallel bus developed by the company, and all the data of the four machines are returned to the PC through one host machine through the network line. Each stand-alone motherboard is responsible for data collection and transmission.
The low resistance measurement range of the invention is 10uΩ -1 MΩ. The constant current range is 0.2 mA-2.6A, the invention measures and divides into a plurality of measuring ranges and automatically finds the most suitable measuring range, and the invention is matched with automatic gain adjustment so as to ensure that the data can reach the best analysis precision.
As would be apparent to one skilled in the art; it is obvious that the invention is not limited to the details of the above-described exemplary embodiments; and without departing from the spirit or essential characteristics of the invention; the invention can be embodied in other specific forms. Thus, the method comprises the steps of; from either point of view; the embodiments should be considered as exemplary; and is non-limiting; the scope of the invention is indicated by the appended claims rather than by the foregoing description; it is therefore intended to include within the invention all changes that fall within the meaning and range of equivalency of the claims. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it is provided that; it should be understood that; although the present description describes embodiments; but not every embodiment contains only one independent technical solution; this manner of description is for clarity only; the skilled artisan should recognize the specification as a whole; the technical solutions in the embodiments may also be combined appropriately; forming other embodiments as will be appreciated by those skilled in the art.
Claims (8)
1. The multi-channel high-speed low-resistance measuring system is characterized by comprising one or more test units, wherein the test units are connected in parallel and communicated through BUS buses, and one test unit is provided with 64 test channels;
the test unit is connected with the main control computer through a BUS BUS, the main control computer is connected with the test computer PC through TCP/IP protocol communication, test data of the test unit are transmitted and summarized to the main control computer, and the main control computer transmits a test result to the test computer PC;
the single board machine is internally provided with a single board host Master and single board sub-machines, each single board sub-machine is provided with four groups, one single board sub-machine is provided with 16 test channels, the single board host Master is in communication connection with the four groups of single board sub-machines, and one single board sub-machine tests 16 devices to be tested at a time;
the single-board host Master comprises a micro control unit MCU, the single-board host Master comprises a first MUX logic gate circuit and a second MUX logic gate circuit, and the output end of the micro control unit MCU is in communication connection with the first MUX logic gate circuit and the second MUX logic gate circuit;
the single board host Master is internally provided with two groups of connectors, the single board sub-machine measurement channel data are in communication connection with the connectors in the single board host Master, the two groups of connectors are connected with a first MUX logic gate circuit through a voltage detection line, the two groups of connectors are connected with a second MUX logic gate circuit through a current detection line, the output ends of the first MUX logic gate circuit and the second MUX logic gate circuit are connected with a measurement chip ADC, and the measurement chip ADC is used for carrying out test analysis on the data of a device to be tested;
the measuring chip ADC is in communication connection with the micro control unit MCU, and the measuring chip ADC transmits a measured result to the micro control unit MCU;
the micro control unit MCU is connected with the BUS BUS, and the BUS BUS is connected with the master control machine.
2. The multi-channel high-speed low-resistance measuring system according to claim 1, wherein the number of the test units is 1-4, and when the number of the test units is 2-4, the test units are connected in parallel with each other through the BUS.
3. The multi-channel high-speed low-resistance measuring system according to claim 2, wherein a constant voltage power supply is arranged in the single board host Master, and the constant voltage power supply is electrically connected with the first MUX logic gate circuit, the second MUX logic gate circuit, the measuring chip ADC and the micro control unit MCU.
4. A multi-channel high-speed low-resistance measurement system according to claim 3, wherein a set of connectors in the Master of the single board host is in data connection with 8 measurement channels of the single board sub-unit.
5. The multi-channel high-speed low-resistance measurement system according to claim 4, wherein a set of connectors in the single board host Master are connected with 8 voltage detection lines and 8 current detection lines.
6. The system of claim 5, wherein the ADC is a 25bit resolution measurement chip.
7. The system of claim 6, wherein the MCU is a 32bit microprocessor.
8. The system of claim 7, wherein the ADC is model ADS1251.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311742837.9A CN117723939A (en) | 2023-12-18 | 2023-12-18 | Multichannel high-speed low-resistance measurement system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311742837.9A CN117723939A (en) | 2023-12-18 | 2023-12-18 | Multichannel high-speed low-resistance measurement system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117723939A true CN117723939A (en) | 2024-03-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311742837.9A Pending CN117723939A (en) | 2023-12-18 | 2023-12-18 | Multichannel high-speed low-resistance measurement system |
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| Country | Link |
|---|---|
| CN (1) | CN117723939A (en) |
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- 2023-12-18 CN CN202311742837.9A patent/CN117723939A/en active Pending
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