CN117612461A - Display panel abnormality analysis method and analysis system - Google Patents
Display panel abnormality analysis method and analysis system Download PDFInfo
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- CN117612461A CN117612461A CN202311602056.XA CN202311602056A CN117612461A CN 117612461 A CN117612461 A CN 117612461A CN 202311602056 A CN202311602056 A CN 202311602056A CN 117612461 A CN117612461 A CN 117612461A
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- 238000004458 analytical method Methods 0.000 title claims abstract description 90
- 230000005856 abnormality Effects 0.000 title claims abstract description 53
- 238000012360 testing method Methods 0.000 claims abstract description 101
- 238000000034 method Methods 0.000 claims abstract description 33
- 238000007689 inspection Methods 0.000 claims abstract description 24
- 238000004519 manufacturing process Methods 0.000 claims abstract description 12
- 230000002159 abnormal effect Effects 0.000 claims description 42
- 230000002950 deficient Effects 0.000 claims description 24
- 238000002847 impedance measurement Methods 0.000 claims description 15
- 238000005259 measurement Methods 0.000 claims description 8
- 230000007547 defect Effects 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000013461 design Methods 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
Abstract
The invention discloses a display panel abnormality analysis method and an analysis system. The display panel abnormality analysis method includes: acquiring a bad display panel; performing driving picture inspection on the bad display panel, and judging whether a preset picture is displayed or not; if not, acquiring a first test result of the bad display panel; determining a second test guideline according to the first test result and the analysis logic table; determining a failure reason of the failure display panel according to the second test guidance; the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process, and the correspondence between the classifications and the bad reasons. According to the technical scheme, the bad type of the bad display panel can be rapidly analyzed, the problems of high requirement on experience of an analyst and long analysis time are solved, and the probability of success of bad analysis is improved.
Description
Technical Field
The invention relates to the technical field of display, in particular to a display panel abnormality analysis method and an analysis system.
Background
In the process of manufacturing the display panel, a plurality of manufacturing processes, such as an array process, a module packaging process, etc., may cause a problem of poor display panel due to any process or design of the process.
Different experimental verification is needed before the display panel leaves the factory, abnormal driving frequently occurs during testing, in the prior art, an analyst directly performs physical analysis on the poor display panel, a fixed analysis flow is lacked, different analysis modes are needed for different types of defects, the experience requirements of the analyst are high, the required analysis time is long if the experience of the analyst is insufficient, and the failure rate is high.
Disclosure of Invention
The embodiment of the invention provides a display panel abnormality analysis method and an analysis system, which can rapidly analyze the bad type of a bad display panel, solve the problems of higher requirement on experience of an analyst and longer analysis time, and improve the probability of successful bad analysis.
According to an aspect of the present invention, there is provided a display panel abnormality analysis method including:
acquiring a bad display panel;
performing driving picture inspection on the bad display panel, and judging whether a preset picture is displayed or not;
if not, acquiring a first test result of the bad display panel;
determining a second test guideline according to the first test result and the analysis logic table;
determining a failure reason of the failure display panel according to the second test guidance;
the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process and a corresponding relation between the classifications and bad reasons.
Optionally, obtaining the first test result of the bad display panel includes:
performing half-driving analysis on the bad display panel to determine whether the bad display panel is a half-driving fault;
and if so, carrying out oscilloscope measurement on the fault driving circuit to obtain a corresponding test waveform.
Optionally, after performing half-driving analysis on the defective display panel to determine whether the defective display panel is a half-driving failure, the method further includes:
and if not, carrying out oscilloscope measurement on all the driving circuits to obtain corresponding test waveforms.
Optionally, after performing driving screen inspection on the poor display panel to determine whether to display a preset screen, the method further includes:
if yes, acquiring an abnormal display area corresponding to the preset picture;
determining a corresponding module abnormal part according to the abnormal display area;
impedance measurement is carried out on the abnormal part of the module, and an abnormal TAB area is determined according to the impedance measurement result;
repairing the abnormal TAB area;
acquiring a display picture of the bad display panel after the repair of the TAB area, and judging whether the abnormality disappears;
if yes, the abnormality factor is determined to be TAB abnormality.
Optionally, after obtaining the display picture of the defective display panel after repairing the TAB area and judging whether the anomaly disappears, the method further includes:
if not, obtaining a first test result of the bad display panel.
Optionally, the preset picture is a line defect picture.
Optionally, before performing driving screen inspection on the poor display panel to determine whether to display a preset screen, the method further includes:
performing appearance inspection on the bad display panel, and judging whether the bad display panel is damaged or not;
if so, judging that the failure cause is the damage of the panel.
Optionally, after performing appearance inspection on the defective display panel and determining whether the defective display panel is damaged, the method further includes:
if not, the panel device is replaced, and the cause of the failure is judged.
Optionally, the poor display panel is a display panel with overload protection causing abnormal driving.
According to another aspect of the present invention, there is provided a display panel abnormality analysis system including:
the reliability detection module is used for acquiring a bad display panel;
the picture driving module is used for carrying out driving picture inspection on the bad display panel;
the testing module is used for judging whether a preset picture is displayed or not, and acquiring a first testing result of the bad display panel when the judging result is negative;
the failure analysis module is used for determining a second test guide according to the first test result and the analysis logic table and determining a failure reason of the failure display panel according to the second test guide;
the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process and a corresponding relation between the classifications and bad reasons.
The display panel abnormality analysis method provided by the embodiment of the invention comprises the steps of firstly obtaining a bad display panel; then, the driving picture inspection is carried out on the bad display panel, and whether a preset picture is displayed or not is judged; if no display screen exists, a first test result of the bad display panel is obtained; determining a second test guideline according to the first test result and an analysis logic table, wherein the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process and the correspondence between the classifications and bad reasons; and finally, determining the bad reason of the bad display panel according to the second test guidance, so that the bad type of the bad display panel can be rapidly analyzed, the problems of higher experience requirement on analysts and longer analysis time are solved, and the probability of successful bad analysis is improved.
It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the invention or to delineate the scope of the invention. Other features of the present invention will become apparent from the description that follows.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flowchart of a method for analyzing anomalies in a display panel according to a first embodiment of the present invention;
FIG. 2 is a schematic diagram of a first test result obtained by partial failure according to an embodiment of the present invention;
FIG. 3 is a flowchart of a method for analyzing anomalies of a display panel according to a second embodiment of the present invention;
FIG. 4 is a flowchart of a method for analyzing anomalies of a display panel according to a third embodiment of the present invention;
FIG. 5 is a flowchart of a method for analyzing anomalies of a display panel according to a fourth embodiment of the present invention;
fig. 6 is a schematic structural diagram of a display panel abnormality analysis system according to a fifth embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the invention described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Fig. 1 is a flowchart of a display panel abnormality analysis method according to a first embodiment of the present invention, and referring to fig. 1, the display panel abnormality analysis method includes:
s1, acquiring a bad display panel.
Alternatively, the defective display panel is a display panel whose overload protection (Burn Detect Protection, BDP) causes driving abnormality.
S2, performing driving picture inspection on the bad display panel, and judging whether a preset picture is displayed or not.
The preset screen may be a screen when testing the display panel, for example, a white screen, a gray screen, etc., and may be selected according to the actual test condition when implementing the method, which is not limited in the embodiment of the present invention.
If not, namely the bad display panel is driven without a picture, executing S3, and acquiring a first test result of the bad display panel.
When the poor display panel cannot display the picture, the oscilloscopes can be used for measuring devices in the display panel to obtain corresponding waveforms, and a first test result and a rough reason are obtained.
S4, determining a second test guide according to the first test result and the analysis logic table.
S5, determining the bad reason of the bad display panel according to the second test guidance.
The analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process, and the correspondence between the classifications and the bad reasons. The second test guideline is the corresponding relation between the classification and the bad reason.
Fig. 2 is a schematic diagram of a first test result obtained by a partial fault provided in an embodiment of the present invention, and table 1 is a logic analysis table corresponding to the partial fault provided in the embodiment of the present invention, and fig. 2 is an exemplary waveform showing a comparison circuit fault (Comparator BDP) and a Shutdown fault (Shutdown BDP). It can be understood that, according to the measured waveforms, if it is determined that the classification is a comparison circuit fault, it is known from table 1 that the preliminary cause is that the power on or off is an in-panel low voltage (EVSS) abnormality, that according to the second test guideline (bad cause corresponding to different classification) in the logic analysis table, the further detailed cause is that the in-panel EVSS is short-circuited with the internal high voltage (EVDD), and then that according to the logic analysis table, whether the cause causing the fault is the panel breakage or the EVSS contact resistance fault is further confirmed; if it is determined that the failure is classified as a turn-off failure, it is known from table 1 that the preliminary cause is an output short circuit of the power management chip, and the further detailed cause may be an internal short circuit of the power management chip or an output pin short circuit of the power management chip of the circuit board, if the internal short circuit of the power management chip is caused, the failure may be a broken panel or a foreign matter, and if the output pin short circuit of the power management chip of the circuit board is caused, the failure may be a foreign matter in the circuit board. And (5) carrying out manual test analysis and confirmation according to the logic analysis table, so as to determine the final bad reason.
Table 1 logic analysis table
It should be noted that the foregoing is merely illustrative of the principles of the anomaly analysis method according to the embodiments of the present invention, and the number of specific first test results and the classification logic table may be obtained according to the actual production test process.
The display panel abnormality analysis method provided by the embodiment of the invention comprises the steps of firstly obtaining a bad display panel; then, the driving picture inspection is carried out on the bad display panel, and whether a preset picture is displayed or not is judged; if no display screen exists, a first test result of the bad display panel is obtained; determining a second test guideline according to the first test result and an analysis logic table, wherein the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process and the correspondence between the classifications and bad reasons; and finally, determining the bad reason of the bad display panel according to the second test guidance, so that the bad type of the bad display panel can be rapidly analyzed, the problems of higher experience requirement on analysts and longer analysis time are solved, and the probability of successful bad analysis is improved.
Fig. 3 is a flowchart of a display panel abnormality analysis method according to a second embodiment of the present invention, and referring to fig. 3, the display panel abnormality analysis method includes:
s1, acquiring a bad display panel.
S2, performing driving picture inspection on the bad display panel, and judging whether a preset picture is displayed or not.
If not, that is, if the defective display panel is driven without a screen, S31 is executed to perform half-driving analysis on the defective display panel, and to confirm whether the defective display panel is a half-driving failure.
If yes, executing S32, and carrying out oscilloscope measurement on the fault driving circuit to obtain a corresponding test waveform. Wherein the corresponding test waveform is the first test result.
If not, executing S33, and carrying out oscilloscope measurement on all the driving circuits to obtain corresponding test waveforms. Wherein the corresponding test waveform is the first test result.
S4, determining a second test guide according to the first test result and the analysis logic table.
S5, determining the bad reason of the bad display panel according to the second test guidance.
In this embodiment, whether the failure is a half driving failure is first confirmed, which is favorable for rapidly locating the failure position and improving the efficiency of anomaly analysis.
Fig. 4 is a flowchart of a display panel abnormality analysis method according to a third embodiment of the present invention, and referring to fig. 4, the display panel abnormality analysis method includes:
s1, acquiring a bad display panel.
S2, performing driving picture inspection on the bad display panel, and judging whether a preset picture is displayed or not.
Optionally, the preset frame is a line defect frame.
If yes, S61, obtaining an abnormal display area corresponding to the preset picture.
S62, determining a corresponding module abnormal part according to the abnormal display area.
In this embodiment, the abnormal module portion is a source driving circuit component corresponding to the abnormal display area, and the abnormal module portion includes but is not limited to: a level shifter and a TAB area. Wherein the TAB area is Tape Automated Bonding and the tape automated bonding area.
S63, impedance measurement is carried out on the abnormal part of the module, and an abnormal TAB area is determined according to the impedance measurement result.
In this embodiment, determining the abnormal TAB area based on the abnormal portion impedance measurement result includes: firstly, carrying out impedance measurement on an abnormal part of a module, and determining an abnormal component according to an impedance measurement result of the abnormal part; then, impedance measurement is performed on a level shift part (level shift) of the abnormal component, and an abnormal section is determined according to the impedance measurement result of the level shift part; and finally, carrying out impedance measurement on the TAB area of the abnormal section, and determining the abnormal TAB area according to the impedance measurement result of the TAB area.
S64, repairing the abnormal TAB area.
S65, acquiring a display picture of the defective display panel after the TAB area is repaired, and judging whether the abnormality disappears.
If yes, S66, judge the abnormality cause is TAB abnormality.
If not, S3, obtaining a first test result of the bad display panel.
If the TAB area is repaired and the display picture has no display failure, judging that the cause of the abnormality is the abnormality of the TAB area, and analyzing the abnormality cause of the TAB area; if the TAB area is repaired and the display image still has the display defect, it is determined that the cause of the display defect is not abnormal in the TAB area, and the subsequent step S3 is executed.
S4, determining a second test guide according to the first test result and the analysis logic table.
S5, determining the bad reason of the bad display panel according to the second test guidance.
In this embodiment, after the abnormal cause of the TAB area is analyzed, if it is determined that the TAB area is abnormal due to the TAB preparation process, the corresponding TAB preparation process is improved, which is favorable for fundamentally solving the problem of poor panel display caused by the TAB abnormality and improving the product yield.
Fig. 5 is a flowchart of a display panel abnormality analysis method according to a fourth embodiment of the present invention, and referring to fig. 5, the display panel abnormality analysis method includes:
s1, acquiring a bad display panel.
And S71, performing appearance inspection on the defective display panel to judge whether the defective display panel is damaged.
If so, S72 is executed to judge that the failure cause is the panel breakage. And then repairing or replacing the damaged device, and then performing driving picture inspection on the panel after repairing or replacing, and determining the cause of the failure if the failure occurs by using the analysis method provided by the embodiment.
If not, the process proceeds to S73, and the panel device is replaced, thereby judging the cause of the failure.
The panel devices can be flexible circuit boards of the same type, and if the panel devices are abnormally disappeared after replacement, the abnormal reasons are that the flexible circuit boards are damaged; or the panel device can be the same type of main control chip circuit board, and if the abnormality disappears after replacement, the abnormality causes the damage of the main control chip circuit board.
Fig. 6 is a schematic structural diagram of a display panel abnormality analysis system according to a fifth embodiment of the present invention, and referring to fig. 6, the display panel abnormality analysis system includes: the device comprises a reliability detection module 10, a picture driving module 20, a test module 30 and a bad analysis module 40.
The reliability detection module 10 is used for acquiring a bad display panel; a screen driving module 20 for performing driving screen inspection on the defective display panel; the testing module 30 is configured to determine whether to display a preset screen, and obtain a first testing result of the bad display panel when the determination result is negative; the failure analysis module 40 is configured to determine a second test guideline according to the first test result and the analysis logic table, and determine a failure cause of the failure display panel according to the second test guideline; the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process, and the correspondence between the classifications and the bad reasons.
According to the display panel abnormality analysis system provided by the embodiment of the invention, a bad display panel is obtained through the reliability detection module; the driving picture inspection is carried out on the bad display panel through the picture driving module, and whether a preset picture is displayed or not is judged through the testing module; if the judging result is negative, a first test result of the bad display panel is obtained; and determining a second test guide by the failure analysis module according to the first test result and the analysis logic table, and determining the failure reason of the failure display panel according to the second test guide. Therefore, the method can rapidly analyze the bad type of the bad display panel, solve the problems of high requirement on experience of analysts and long analysis time, and improve the probability of successful bad analysis.
Alternatively, the defective display panel is a display panel whose overload protection (Burn Detect Protection, BDP) causes driving abnormality.
Optionally, the test module 30 obtains a first test result of the bad display panel, including:
performing half driving analysis on the bad display panel to confirm whether the bad display panel is half driving failure;
and if so, carrying out oscilloscope measurement on the fault driving circuit to obtain a corresponding test waveform.
And if not, carrying out oscilloscope measurement on all the driving circuits to obtain corresponding test waveforms.
Optionally, the test module 30 is further configured to obtain an abnormal display area corresponding to the preset picture when the determination result is yes;
determining a corresponding module abnormal part according to the abnormal display area;
impedance measurement is carried out on the abnormal part of the module, and an abnormal TAB area is determined according to the impedance measurement result;
repairing the abnormal TAB area;
acquiring a display picture of the defective display panel after the repair of the TAB area, and judging whether the abnormality disappears;
if yes, the abnormality factor is determined to be TAB abnormality.
If not, a first test result of the bad display panel is obtained.
Optionally, the preset frame is a line defect frame.
Optionally, before the picture driving module 20 performs the driving picture inspection on the defective display panel to determine whether to display the preset picture, the method further includes:
performing appearance inspection on the bad display panel, and judging whether the bad display panel is damaged or not;
if so, judging that the failure cause is the damage of the panel.
If not, the panel device is replaced, and the cause of the failure is judged.
The above embodiments do not limit the scope of the present invention. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of the present invention.
Claims (10)
1. A display panel abnormality analysis method, characterized by comprising:
acquiring a bad display panel;
performing driving picture inspection on the bad display panel, and judging whether a preset picture is displayed or not;
if not, acquiring a first test result of the bad display panel;
determining a second test guideline according to the first test result and the analysis logic table;
determining a failure reason of the failure display panel according to the second test guidance;
the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process and a corresponding relation between the classifications and bad reasons.
2. The display panel abnormality analysis method according to claim 1, wherein acquiring the first test result of the defective display panel includes:
performing half-driving analysis on the bad display panel to determine whether the bad display panel is a half-driving fault;
and if so, carrying out oscilloscope measurement on the fault driving circuit to obtain a corresponding test waveform.
3. The display panel abnormality analysis method according to claim 2, characterized by further comprising, after performing half-drive analysis on the defective display panel to confirm whether it is a half-drive failure:
and if not, carrying out oscilloscope measurement on all the driving circuits to obtain corresponding test waveforms.
4. The display panel abnormality analysis method according to claim 1, characterized by further comprising, after performing a driving screen inspection of the defective display panel to determine whether to display a preset screen:
if yes, acquiring an abnormal display area corresponding to the preset picture;
determining a corresponding module abnormal part according to the abnormal display area;
impedance measurement is carried out on the abnormal part of the module, and an abnormal TAB area is determined according to the impedance measurement result;
repairing the abnormal TAB area;
acquiring a display picture of the bad display panel after the repair of the TAB area, and judging whether the abnormality disappears;
if yes, the abnormality factor is determined to be TAB abnormality.
5. The method according to claim 4, wherein after acquiring the display screen of the defective display panel after repair of the TAB area, determining whether the abnormality has disappeared, further comprising:
if not, obtaining a first test result of the bad display panel.
6. The method according to claim 4, wherein the predetermined frame is a line defect frame.
7. The display panel abnormality analysis method according to claim 1, characterized by further comprising, before performing a driving screen inspection of the defective display panel to determine whether to display a preset screen:
performing appearance inspection on the bad display panel, and judging whether the bad display panel is damaged or not;
if so, judging that the failure cause is the damage of the panel.
8. The display panel abnormality analysis method according to claim 7, characterized by further comprising, after performing an appearance inspection of the defective display panel to determine whether the defective display panel is broken, the steps of:
if not, the panel device is replaced, and the cause of the failure is judged.
9. The display panel abnormality analysis method according to any one of claims 1 to 8, characterized in that the defective display panel is a display panel in which overload protection causes driving abnormality.
10. A display panel abnormality analysis system, comprising:
the reliability detection module is used for acquiring a bad display panel;
the picture driving module is used for carrying out driving picture inspection on the bad display panel;
the testing module is used for judging whether a preset picture is displayed or not, and acquiring a first testing result of the bad display panel when the judging result is negative;
the failure analysis module is used for determining a second test guide according to the first test result and the analysis logic table and determining a failure reason of the failure display panel according to the second test guide;
the analysis logic table comprises a plurality of classifications corresponding to the first test result in the production test process and a corresponding relation between the classifications and bad reasons.
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| CN202311602056.XA CN117612461A (en) | 2023-11-27 | 2023-11-27 | Display panel abnormality analysis method and analysis system |
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| CN202311602056.XA CN117612461A (en) | 2023-11-27 | 2023-11-27 | Display panel abnormality analysis method and analysis system |
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