CN117470158A - Edge inspection method and system for carving machine - Google Patents
Edge inspection method and system for carving machine Download PDFInfo
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- CN117470158A CN117470158A CN202311812715.2A CN202311812715A CN117470158A CN 117470158 A CN117470158 A CN 117470158A CN 202311812715 A CN202311812715 A CN 202311812715A CN 117470158 A CN117470158 A CN 117470158A
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- 238000000034 method Methods 0.000 title claims abstract description 51
- 238000007689 inspection Methods 0.000 title claims abstract description 22
- 239000000463 material Substances 0.000 claims abstract description 81
- 239000012528 membrane Substances 0.000 claims abstract description 15
- 238000004590 computer program Methods 0.000 claims description 6
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- 238000001514 detection method Methods 0.000 description 27
- 230000008569 process Effects 0.000 description 9
- 238000004364 calculation method Methods 0.000 description 6
- 239000003550 marker Substances 0.000 description 6
- 238000012360 testing method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
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- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
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- 238000004891 communication Methods 0.000 description 1
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- 230000003993 interaction Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000011669 selenium Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Abstract
The invention relates to the technical field of carving machines, in particular to a method and a system for detecting the edge inspection of a carving machine, wherein the method comprises the following steps: a sensor capable of automatically moving according to a preset path is used for scanning a film material with a positioning mark placed on a platform of a carving machine in a stepping mode, and coordinate values of the sensor and the relative position of the sensor on the platform are read; when the sensor scans a first mark point on the film material, acquiring the position coordinate of the first mark point and the relative position of the first mark point and the origin of the platform, and calculating the offset value of the film material; the offset value includes a positional offset value; and determining the first position of the membrane material according to the position offset value of the membrane material. The invention can accurately determine the offset position of the film material, and achieves the effect that the lettering and the printed patterns are identical.
Description
Technical Field
The invention relates to the technical field of carving machines, in particular to a method and a system for detecting the edge of a carving machine.
Background
A letter carving machine is a machine that cuts or imprints a film material by a carving knife to obtain a desired pattern. The engraving machine needs to judge the position of the film material before cutting or engraving.
In the prior art, a sensor with a fixed position is generally adopted to collect the position of the film material, the numerical value read by the sensor is processed, and a fixed position numerical value interval is adopted to judge whether the film material exists. However, due to the problems of sensor installation, aging degree, quality control and sensor model, and the subtle differences of different models and brands, even printed matters printed by the same printer by using different selenium drums, part of printers are scaled to 98% even by default. The difficulty of detection and calculation is increased. Therefore, a large number of failures may occur in the fixed position numerical range, and it is difficult to find a specific link, and thus it is difficult to improve the accuracy of the lettering position.
Therefore, the boundary of the film material cannot be accurately determined in the prior art, so that the accurate lettering position cannot be ensured.
Disclosure of Invention
First, the technical problem to be solved
In view of the above-mentioned drawbacks and shortcomings of the prior art, the present invention provides an edge inspection method and system for a carving machine, which solve the technical problem that the boundary of a film cannot be accurately determined in the prior art, so that the accurate position of carving cannot be ensured.
(II) technical scheme
In order to achieve the above purpose, the main technical scheme adopted by the invention comprises the following steps:
in a first aspect, an embodiment of the present invention provides an edge inspection method for a carving machine, including the following steps:
a sensor capable of automatically moving according to a preset path is used for scanning a film material with a positioning mark placed on a platform of a carving machine in a stepping mode, and coordinate values of the sensor and the relative position of the sensor on the platform are read;
when the sensor scans a first mark point on the film material, acquiring the position coordinate of the first mark point and the relative position of the first mark point and the origin of the platform, and calculating the offset value of the film material; the offset value includes a positional offset value;
and determining the first position of the membrane material according to the position offset value of the membrane material.
According to the edge inspection method for the carving machine, provided by the embodiment of the invention, the position deviation value is determined by detecting the position of the first mark point, so that the position deviation degree of the film relative to the standard position of the film can be basically determined, the real relative relation between the pattern and the film can be found, and the carving can be basically kept to be matched with the pattern.
Optionally, the offset value further includes a scaling in the first direction;
the method further comprises the steps of:
calculating the ideal position coordinate of the second mark point according to the position coordinate of the first mark point and combining the preset ideal width and offset value of the film material;
scanning the ideal position of the second mark point by using a movable sensor to acquire the actual position coordinate of the second mark point;
calculating the actual width from the first mark point to the second mark point according to the position coordinates of the first mark point and the actual position coordinates of the second mark point;
the ratio of the actual width to the ideal width is used as the scaling ratio of the first direction of the film material.
Optionally, the offset value further comprises a first angle offset value;
the method further comprises the steps of: and calculating a first angle offset value according to the position coordinates of the first mark point, the ideal position coordinates of the second mark point and the actual position coordinates of the second mark point through the connecting line positions of the three points.
Optionally, the offset value further comprises a scaling in the second direction;
the method further comprises the steps of:
according to the actual position coordinates of the second mark points, calculating the ideal position coordinates of the third mark points by combining the preset ideal length and offset value of the film material;
scanning the ideal position of the third mark point by using a movable sensor to acquire the actual position coordinate of the third mark point;
calculating the actual length from the second mark point to the third mark point according to the actual position coordinates of the second mark point and the actual position coordinates of the third mark point;
the ratio of the actual length to the ideal length is used as the scaling ratio of the second direction of the membrane material.
Optionally, the offset value further comprises a scaling in the second direction;
the method further comprises the steps of:
according to the actual position coordinates of the first mark points, calculating the ideal position coordinates of the fourth mark points by combining the preset ideal length and offset value of the film material;
scanning the ideal position of the fourth mark point by using a movable sensor to obtain the actual position coordinate of the fourth mark point;
calculating the actual length from the first mark point to the fourth mark point according to the actual position coordinates of the first mark point and the actual position coordinates of the fourth mark point;
the ratio of the actual length to the ideal length is used as the scaling ratio of the second direction of the membrane material.
Optionally, the offset value further includes a second angular offset value;
the method further comprises the steps of: and calculating a second angle offset value according to the actual position coordinates of the second mark point, the ideal position coordinates of the third mark point and the actual position coordinates of the third mark point through the connecting line positions of the three points.
Optionally, the offset value further includes a second angular offset value;
the method further comprises the steps of: and calculating a second angle offset value according to the position coordinates of the first mark point, the ideal position coordinates of the fourth mark point and the actual position coordinates of the fourth mark point through the connecting line positions of the three points.
Optionally, the first mark point, the second mark point, the third mark point and the fourth mark point are rectangular mark points, and the coordinate positions of the first mark point, the second mark point, the third mark point and the fourth mark point are the vertex coordinate positions of each rectangular; the number of the movable sensors is two, and the two sensors are respectively used for step scanning along the length direction and the width direction.
Optionally, in the step-by-step scanning, the sensor scans once every time a minimum number of steps is passed, an array is obtained after a preset number of times of scanning, the maximum value in the array is used as a starting point, searching is performed leftwards and rightwards, and the number with both ends larger than the average number is calculatedMeasuring amountAverage number of numbers in range ∈ ->And the average of the numbers of the front and rear ends of the removed peaksAnd->；
Will be，/>And->Comparing two by two when->And->，/>Is greater than the set minimum value, +.>，/>And when the difference between the two is not greater than the set maximum value, judging as a mark line.
In a second aspect, an embodiment of the present invention provides an edge inspection system for a carving machine, including a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing steps of any of the methods described above when executing the computer program.
(III) beneficial effects
The beneficial effects of the invention are as follows: according to the edge inspection method and system for the carving machine, in the process of using the machine, a user uses the printer to print a desired pattern on the printable film material through software, the printed film material is provided with the mark points, and then the film material is placed on a platform to be identified through scanning of the sensor, so that the desired pattern can be accurately carved. Because the offset value of the film material is determined according to the positions of the marking points, compared with the prior art, the offset value of the film material can be accurately determined, and the effect that the lettering is matched with the printed pattern is achieved.
Drawings
FIG. 1 is a schematic view of a film material and marking points according to a preferred embodiment of the present invention;
FIG. 2 is a flow chart of an edge inspection method for a carving machine according to a preferred embodiment of the invention;
FIG. 3 is a flow chart of detection for three mark point scenes for the inspection method for a marking machine according to the preferred embodiment of the present invention;
FIG. 4 is a flowchart of a process for detecting a marker point according to a preferred embodiment of the present invention;
FIG. 5 is a flowchart of the judgment of the mark points according to the preferred embodiment of the present invention;
FIG. 6 is a step-by-step scanning process diagram of a preferred embodiment of the present invention;
fig. 7 is a schematic diagram of an array of the waveform detection of the mark points according to the preferred embodiment of the present invention.
Detailed Description
The invention will be better explained by the following detailed description of the embodiments with reference to the drawings.
The edge inspection method and the system for the carving machine provided by the embodiment of the invention use the movable sensor to scan the film material with the positioning mark placed on the platform, and read the coordinate value of the sensor and the relative position of the sensor on the platform; when the sensor scans a first mark point on the film material, acquiring the position coordinate of the first mark point and the relative position of the first mark point and the origin of the platform, and calculating the offset value of the film material; the offset value includes a positional offset value; and determining the first position of the membrane material according to the position offset value of the membrane material. Because the offset value of the film material is determined according to the positions of the marking points, compared with the prior art, the offset value of the film material can be accurately determined, and the effect that the lettering is matched with the printed pattern is achieved.
In order that the above-described aspects may be better understood, exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
In the process of using the carving machine, a user prints a desired pattern on a printable film material by using a printer through software, the printed film material is provided with marking points, the film material is placed on a platform, the boundary of the film material is determined through recognition of a sensor, and the boundary of the film material can be determined according to the position relation between the original printed pattern in the computer and the film material, so that the desired pattern is accurately carved.
Referring to fig. 1, in this embodiment, a film material with a size of A4 is used as an example, at least one mark point may be set on the film material, or two, three or four mark points may be set on the film material, which are respectively referred to as a first mark point (a point), a second mark point (B point), a third mark point (C point) and a fourth mark point (D point), where when only one mark point is set, the first mark point (a point) is generally set in the upper left corner of the film material, such as the a point in fig. 1; when two mark points are set, a combination of the point a and any other point may be set, and the present embodiment is described taking the point a+b as an example. When three mark points are set, a combination of a point+b point and any other point may be set, and the present embodiment is described taking a point+b point+c point as an example. When four marker points are set, the present embodiment will be described taking the point a+b+c+d as an example. In practical application, the shape of the film material and the number of the marking points can be flexibly set, and the method is not limited by the example of the embodiment, and can be realized as long as the first marking point can be scanned or other marking points can be scanned by taking the first marking point as a reference.
In this embodiment, the first direction is preferably a width direction, and the second direction is preferably a length direction. The film material with the positioning mark in the embodiment can be a transparent or opaque film material, and can be a uniform sheet-shaped or page-shaped film material with a single color.
Referring to fig. 2, an edge inspection method for a carving machine according to the present embodiment includes the following steps:
s1: a sensor capable of automatically moving according to a preset path is used for scanning a film material with a positioning mark placed on a platform of a carving machine in a stepping mode, and coordinate values of the sensor and the relative position of the sensor on the platform are read; each step of the step-by-step scanning is a coordinate unit; in this embodiment, each step is usually 0.01mm, and the scanning accuracy can be adjusted by adjusting the distance of each step in practical use.
S2: when the sensor scans a first mark point (A point) on the film material, acquiring the position coordinate of the first mark point and the relative position of the first mark point and the origin of the platform, and calculating the offset value of the film material; the offset value includes a positional offset value;
s3: and determining the first position of the membrane material according to the position offset value of the membrane material. The default sheet has no angular offset and scaling in the x, y directions (axes) if only point a can be detected.
The position offset value is determined, so that the position offset degree of the film relative to the standard position can be basically determined, the real relative relation between the pattern and the film can be found, and the lettering can be basically kept to be matched with the pattern.
When the method is implemented, the calculating mode of the offset can be flexibly changed through the number of the detected detection points, but the point A is necessary, otherwise, the method fails.
In practice, the greater the number of detected marker points, the more accurate the calculation and the lower the probability of error.
Accordingly, in practice, when the number of marker points is two (a+b), referring to fig. 3, the following steps may be further performed:
s4: calculating the ideal position coordinate of the second mark point according to the position coordinate of the first mark point and combining the preset ideal width and offset value of the film material;
s5: scanning the ideal position of the second mark point by using a movable sensor to acquire the actual position coordinate of the second mark point;
s6: calculating the actual width from the first mark point to the second mark point according to the position coordinates of the first mark point and the actual position coordinates of the second mark point;
s7: the ratio of the actual width to the ideal width is used as the scaling ratio of the first direction of the film material.
For example, the following method is adopted:
through point AAnd B->And calculating the actual distance (actual width) of (a) to obtain the ideal position coordinate B n The ratio of the ideal width (known) of the point to the point a gives the scaling Mx.
;
As can be seen from the above steps, the content of the offset value in the present embodiment may further include a scaling in the first direction when two mark points are provided. In this embodiment, i.e., the offset value in the width direction (x direction). In addition, if the following steps are performed:
s8: and calculating a first angle offset value according to the position coordinates of the first mark point, the ideal position coordinates of the second mark point and the actual position coordinates of the second mark point through the connecting line positions of the three points. The offset value may also include a first angular offset value.
Bit passing point aCoordinates settingAfter calculating the offset value, the ideal position coordinate of the point B is obtainedAnd the actual position coordinates of point B +.>. Calculation of +.>Is of a size of (a) and (b).
Setting:，/>，/>，/>then:
；
if it isLess than 0; />；
Here, theI.e. the first angle offset value.
When the number of mark points is greater than two, for example, three mark points of a+b+c are set. Referring to fig. 3, the following steps may also be performed:
s9: according to the actual position coordinates of the second mark points, calculating the ideal position coordinates of the third mark points by combining the preset ideal length and offset value of the film material;
s10: scanning the ideal position of the third mark point by using a movable sensor to acquire the actual position coordinate of the third mark point;
s11: calculating the actual length from the second mark point to the third mark point according to the actual position coordinates of the second mark point and the actual position coordinates of the third mark point;
s12: the ratio of the actual length to the ideal length (known) is taken as the scaling of the film in the second direction. At this time, the offset value may further include a scaling in the second direction, that is, a scaling My in the length direction (y direction).
。
In practice, an angular offset value may also be obtained.
S13: and calculating a second angle offset value according to the actual position coordinates of the second mark point, the ideal position coordinates of the third mark point and the actual position coordinates of the third mark point through the connecting line positions of the three points. At this time, the offset value may further include a second angular offset value.
After the positions of the three mark points are obtained, the position offset value, the scaling in the x-axis direction and the sum are calculatedBesides the angle of (a), it is also possible to calculate +.>Is a function of the angle of (a).
；
Wherein,is the second angular offset value.
On the other hand, before step S9 is executed, the position of point C may be scanned after returning from point B to point a and moving from point a in the longitudinal direction. At this time, the scaling in the second direction may also be determined by the following steps:
S9A: according to the actual position coordinates of the first mark points, calculating the ideal position coordinates of the fourth mark points by combining the preset ideal length and offset value of the film material;
S10A: scanning the ideal position of the fourth mark point by using a movable sensor to obtain the actual position coordinate of the fourth mark point;
S11A: calculating the actual length from the first mark point to the fourth mark point according to the actual position coordinates of the first mark point and the actual position coordinates of the fourth mark point;
S12A: the ratio of the actual length to the ideal length is used as the scaling ratio of the second direction of the membrane material.
In practice, an angular offset value may also be obtained.
S13A: and calculating a second angle offset value according to the position coordinates of the first mark point, the ideal position coordinates of the fourth mark point and the actual position coordinates of the fourth mark point through the connecting line positions of the three points. At this time, the offset value may further include a second angular offset value.
In the embodiment, the first mark point, the second mark point, the third mark point and the fourth mark point are preferably rectangular mark points, the coordinate positions of which are the vertex coordinate positions of each rectangular, and the four mark points are respectively arranged at the positions near the edges (the vertices face the four corners of the film material) on the four corners of the film material. In this embodiment, the number of the movable sensors is two, and the two sensors are respectively used for performing step-wise scanning along the length direction and the width direction (in implementation, the minimum step number of the step-wise scanning is set according to the distance from the first mark point to the edge of the film material, and the actual measurement needs to be performed in combination with the size of the actual film material and the model of the printer). The rectangular mark points are scanned from two mutually perpendicular directions, so that the position coordinates of the mark points can be more accurately determined.
Referring to fig. 4 and 5, the following illustrates the scanning execution process of the present embodiment, including a marker detection process and a marker determination process.
(1) The mark point detection flow (see fig. 4, 6).
a. The preset distance is the detection range defined by sticking the printable paper on the upper left corner of the backing plate in the detection process. If the paper is not stuck in the upper left corner, the mark point cannot be detected for a preset distance. In the first step, if the detection fails, no failure is returned, the y-value of the detector position is moved down 5 units (stepwise, e.g. from position 1 to position 2 in fig. 6; or the x-value is moved 5 units to the right, e.g. from position 3 to position 4 in fig. 6), and an attempt is made again. If not, a failure is returned.
b. A minimum number of steps (step number range) is defined according to the distance from the mark line (in right angle mark, the edge is the mark line, the vertex is the mark point, i.e. the intersection point of two perpendicular mark lines is the mark point) to the edge. The threshold is valid when the number of steps the machine has traveled is greater than. In order to prevent the machine from erroneously detecting lines or foreign matter in the mat.
When the first step detectsWhen the point is confirmed, the ideal position of the second point isThe detection is set to->。
The x-axis detection line of the third point isThe detection range is a preset value, if the detection range of the fourth point of the third point is successfully detected>The method comprises the steps of carrying out a first treatment on the surface of the After detecting four auxiliary points, calculating the position coordinates of the A point>Calculating ideal position coordinates of the point B +.>The first detection point of point B has a detection coordinate range of +.>. The second detection point is calculated according to the actual position of the first detection point. And so on.
(2) The mark point judgment flow (see fig. 5, fig. 7, using waveform detection).
Each time the sensor scans a minimum number of steps, an array is obtained after a predetermined number of scans, for example: scanning 50 times to obtain an array composed of 50 values. When the maximum value of the array consisting of 50 values is 25 th, the next calculation is performed.
a. Searching left and right by taking the twenty-fifth number of the array as a starting point, and calculating the number of numbers with both ends larger than the average. And calculating the average number of numbers within this range +.>. (in order to adapt to various types of sensors, the numerical value of the sensor is not absolutely defined, and only the waveform is judged);
b. calculating the average value of the numbers at the front and rear ends of the removed wave peak，/>. (peak Length->Is greater than the minimum length of the detection line>). In order to avoid that the detection fails due to the miscellaneous points on the backing plate or the paper.
，/>And->Comparing two by two, and performing%>And->，/>The difference of (2) is greater than the set minimum value +.>，/>，/>The difference between them cannot be greater than the set maximum value +.>(the maximum and minimum values are obtained through practical scene test. The values obtained by various possible cases are integrated). If the above condition is satisfied, the detected mark line is recognized. The modes are shown in fig. 7 below. In fig. 7, the abscissa is the number of bits of the detection array, the mark line used at the present stage is 1mm, and 50 data can completely contain the detection line and leave out the data of the calculated wave pattern in cooperation with the moving speed of the sensor and the frequency of the collected information. The detection mode of the wave type detection can be suitable for sensors of various types and different mechanical structures, and the sensors of different types and different use times have different sensitivity to the color, so long as the threshold value is flexibly adjusted through the test, the diversified requirements can be met.
In a second aspect, an embodiment of the present invention provides an edge inspection system for a carving machine, including a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing steps of any of the methods described above when executing the computer program.
According to the edge inspection method and system for the carving machine, in the process of using the machine, a user uses the printer to print a desired pattern on the printable film material through software, the printed film material is provided with the mark points, and then the film material is placed on a platform to be identified through scanning of the sensor, so that the desired pattern can be accurately carved. Because the offset value of the film material is determined according to the positions of the marking points, compared with the prior art, the offset value of the film material can be accurately determined, and the effect that the lettering is matched with the printed pattern is achieved. The calculation mode of the offset is flexibly changed according to the number of the detection points which can be detected. The greater the number of points detected, the more accurate the calculation and the lower the probability of error. And moreover, the detection mode of adopting the wave pattern to detect can adapt to the sensor of multiple model and different mechanical structures, the sensor of different model and live time are different to the sensitivity of colour, only need through the nimble adjustment threshold value of test can satisfy diversified demand. The invention deduces the positions of other mark points through the position of the first detection point, and can flexibly cope with printed matters with different scaling ratios. A print with a scaling of 92% can be detected at maximum.
In the description of the present invention, it should be understood that the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present invention, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium; may be a communication between two elements or an interaction between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In the present invention, unless expressly stated or limited otherwise, a first feature is "on" or "under" a second feature, which may be in direct contact with the first and second features, or in indirect contact with the first and second features via an intervening medium. Moreover, a first feature "above," "over" and "on" a second feature may be a first feature directly above or obliquely above the second feature, or simply indicate that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is level lower than the second feature.
In the description of the present specification, the terms "one embodiment," "some embodiments," "examples," "particular examples," or "some examples," etc., refer to particular features, structures, materials, or characteristics described in connection with the embodiment or example as being included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
While embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the invention, and that alterations, modifications, substitutions and variations may be made in the above embodiments by those skilled in the art within the scope of the invention.
Claims (9)
1. The edge inspection method for the engraving machine is characterized by comprising the following steps of:
a sensor capable of automatically moving according to a preset path is used for scanning a film material with a positioning mark placed on a platform of a carving machine in a stepping mode, and coordinate values of the sensor and the relative position of the sensor on the platform are read;
when a sensor scans a first mark point on a film material, acquiring a position coordinate of the first mark point and a relative position of the first mark point and a platform origin, and calculating an offset value of the film material; the offset value includes a positional offset value;
determining a first position of the membrane material according to the position offset value of the membrane material;
the first mark point is a rectangular mark formed by intersecting two mark lines, and the coordinate position of the first mark point is the rectangular vertex coordinate position;
in the step scanning, the sensor scans once through a minimum step number, an array is obtained after scanning for preset times, the maximum value in the array is used as a starting point, the search is carried out leftwards and rightwards, and the number of numbers with both ends larger than the average number is calculatedAverage number of numbers in range ∈ ->And the average value of the numbers of the front and rear ends of the removed peaks +.>And；
will be,/>And->Comparing two by two when->And->,/>Is greater than the set minimum value, +.>,/>And when the difference between the two is not greater than the set maximum value, judging as a mark line.
2. The method for edge inspection of a lettering machine according to claim 1, wherein said offset value further comprises a scaling in a first direction;
the method further comprises the steps of:
calculating the ideal position coordinate of a second mark point according to the position coordinate of the first mark point and combining the preset ideal width and offset value of the film material;
scanning the ideal position of the second mark point by using a movable sensor to acquire the actual position coordinate of the second mark point;
calculating the actual width from the first mark point to the second mark point according to the position coordinates of the first mark point and the actual position coordinates of the second mark point;
the ratio of the actual width to the ideal width is used as the scaling ratio of the first direction of the film material.
3. The method for edge inspection of a lettering machine according to claim 2, wherein said offset value further comprises a first angular offset value;
the method further comprises the steps of: and calculating a first angle offset value according to the position coordinates of the first mark point, the ideal position coordinates of the second mark point and the actual position coordinates of the second mark point through the connecting line positions of the three points.
4. The method for edge inspection of a lettering machine according to claim 3, wherein said offset value further comprises a scaling in a second direction;
the method further comprises the steps of:
calculating the ideal position coordinate of the third mark point according to the actual position coordinate of the second mark point and combining the preset ideal length and offset value of the film material;
scanning the ideal position of the third mark point by using a movable sensor to acquire the actual position coordinate of the third mark point;
calculating the actual length from the second mark point to the third mark point according to the actual position coordinates of the second mark point and the actual position coordinates of the third mark point;
the ratio of the actual length to the ideal length is used as the scaling ratio of the second direction of the membrane material.
5. The method for edge inspection of a lettering machine according to claim 3, wherein said offset value further comprises a scaling in a second direction;
the method further comprises the steps of:
calculating an ideal position coordinate of a fourth mark point according to the actual position coordinate of the first mark point and by combining a preset ideal length and an offset value of the film material;
scanning the ideal position of the fourth mark point by using a movable sensor to obtain the actual position coordinate of the fourth mark point;
calculating the actual length from the first mark point to the fourth mark point according to the actual position coordinates of the first mark point and the actual position coordinates of the fourth mark point;
the ratio of the actual length to the ideal length is used as the scaling ratio of the second direction of the membrane material.
6. The method for edge inspection of a lettering machine according to claim 4, wherein said offset value further comprises a second angular offset value;
the method further comprises the steps of: and calculating a second angle offset value according to the actual position coordinates of the second mark point, the ideal position coordinates of the third mark point and the actual position coordinates of the third mark point through the connecting line positions of the three points.
7. The method for edge inspection of a lettering machine according to claim 5, wherein said offset value further comprises a second angular offset value;
the method further comprises the steps of: and calculating a second angle offset value according to the position coordinates of the first mark point, the ideal position coordinates of the fourth mark point and the actual position coordinates of the fourth mark point through the connecting line positions of the three points.
8. The method for detecting the edge of a character carving machine according to any one of claims 4 to 7 wherein the second mark point, the third mark point and the fourth mark point are rectangular mark points, and the coordinate positions of the second mark point, the third mark point and the fourth mark point are the vertex coordinate positions of each rectangular angle; the number of the movable sensors is two, and the two sensors are respectively used for step scanning along the length direction and the width direction.
9. An edge inspection system for a lettering machine comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the steps of the method according to any one of the preceding claims 1 to 8 when executing the computer program.
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| CN202311812715.2A CN117470158B (en) | 2023-12-27 | Edge inspection method and system for carving machine |
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| CN202311812715.2A CN117470158B (en) | 2023-12-27 | Edge inspection method and system for carving machine |
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