CN117370085A

CN117370085A - Test method, test device, computer equipment and storage medium

Info

Publication number: CN117370085A
Application number: CN202311264270.9A
Authority: CN
Inventors: 孟召潮; 秦晓宁; 陈颖; 王添
Original assignee: Nettrix Information Industry Beijing Co Ltd
Current assignee: Nettrix Information Industry Beijing Co Ltd
Priority date: 2023-09-27
Filing date: 2023-09-27
Publication date: 2024-01-09

Abstract

The application relates to a testing method, a device, computer equipment and a storage medium. In the method, the test equipment remotely controls the test of the equipment to be tested on the hard disk backboard in an out-of-band manner, and the equipment to be tested is connected with the hard disk backboard of different types, so that when the test equipment is used for testing the hard disk backboard, the remote and various types of tests can be realized, the test efficiency is greatly improved, and the test cost is saved.

Description

Test method, test device, computer equipment and storage medium

Technical Field

The present disclosure relates to the field of server testing technologies, and in particular, to a testing method, a testing device, a computer device, and a storage medium.

Background

In the field of computers, a server comprises a computing unit, a storage unit and a transmission unit, wherein the storage unit comprises a hard disk backboard, a hard disk and a RIAD card (Redundant Array of Independent Disks, redundant disk array), the hard disk backboard is connected with the RIAD card and the hard disk and used for providing data transmission and power supply support, and before the computer is put into use, the hard disk backboard of the server needs to be tested to ensure that the storage unit works normally.

At present, the testing method for the hard disk backboard mainly comprises the steps of manually connecting a certain type of tested hard disk backboard with a corresponding type of testing jig, manually switching the testing jig to test different types of hard disk backboard, and manually summarizing and analyzing the testing result.

However, the above test method has a problem of low efficiency.

Disclosure of Invention

In view of the foregoing, it is desirable to provide a test method, apparatus, computer device, and storage medium capable of improving test efficiency.

In a first aspect, the present application provides a test method comprising:

responding to a test instruction input by a user on a test interface, executing a first test script, outputting at least one test signal, and sending the at least one test signal to equipment to be tested so as to instruct the equipment to be tested to test a hard disk backboard corresponding to the test signal according to the at least one test signal, thereby obtaining a test result;

And obtaining a test result on the device to be tested, and obtaining a target test result according to the test result and the expected result.

According to the testing method provided by the embodiment of the application, the first testing script is executed by responding to the testing instruction input by the user on the testing interface, at least one testing signal is output, and the at least one testing signal is sent to the equipment to be tested, so that the equipment to be tested is instructed to test the hard disk backboard corresponding to the testing signal according to the at least one testing signal, a testing result is obtained, then the testing result on the equipment to be tested is obtained, and a target testing result is obtained according to the testing result and the expected result. In the method, the test equipment remotely controls the test of the equipment to be tested on the hard disk backboard in an out-of-band manner, and the equipment to be tested is connected with the hard disk backboard of different types, so that when the test equipment is used for testing the hard disk backboard, the remote and various types of tests can be realized. In addition, after the test is finished, the test result is checked only according to the time stamp information, and the test efficiency is improved.

In one embodiment, the first test script comprises a software test function and/or a hardware test function; the software functions include at least one back panel attribute function and the hardware test functions include at least one status light function.

In one embodiment, the method further comprises:

responding to a user triggering generation of a state determining instruction on a test interface, and acquiring a second test script corresponding to the state determining instruction;

executing a first test script, outputting at least one test signal, comprising:

executing the second test script and outputting at least one test signal.

According to the testing method provided by the embodiment of the application, after the testing equipment receives the testing states selected by the user on the testing interface, the device to be tested can be remotely controlled to automatically test the hard disk backboard under different testing states, and the different testing states can be remotely switched in a man-machine interaction mode, so that the testing efficiency is improved.

In one embodiment, the method further comprises:

displaying test function options; the test function options comprise function items corresponding to all functions contained in the first test script;

responding to a selection instruction triggered and generated by a user on a test interface, and generating a third test script according to the selection instruction;

Executing a first test script, outputting at least one test signal, comprising:

executing the third test script and outputting at least one test signal.

According to the testing method provided by the embodiment of the application, after the testing equipment receives the testing function options selected by the user on the testing interface, the equipment to be tested can be remotely controlled to automatically test the different testing function options of the hard disk backboard, the different testing function options can be remotely tested in a man-machine interaction mode, and the testing efficiency is improved.

In one embodiment, the test signal is a test signal output by a status light function in the first test script, and the test signal is sent to the device to be tested, so as to instruct the device to be tested to test the hard disk backboard corresponding to the test signal according to the test signal, so as to obtain a test result, where the method includes:

transmitting the test signal to the equipment to be tested so as to instruct the equipment to be tested to determine a control signal according to the test signal, and controlling the status lamp to perform corresponding operation according to the control signal;

obtaining a test result on the device to be tested, including:

reading a level signal output by a digital-to-analog conversion module connected with the equipment to be tested, and taking the level signal as a test result; the digital-to-analog conversion module is used for storing the state data of the corresponding operation of the state lamp.

In the testing method provided by the embodiment of the application, the testing equipment can test whether the hardware testing function of the hard disk backboard is normal or not by analyzing the level signal of the hard disk backboard obtained from the digital-to-analog conversion module, so that the testing efficiency is improved.

In a second aspect, the present application provides a test method comprising:

when at least one test signal sent by test equipment is received, testing a hard disk backboard corresponding to the test signal according to the at least one test signal to obtain a test result;

and returning the test result to the test equipment to instruct the test equipment to obtain a target test result according to the test result and the expected result.

According to the testing method, when at least one testing signal sent by the testing equipment is received, the hard disk backboard corresponding to the testing signal is tested according to the at least one testing signal, so that a testing result is obtained, the testing result is returned to the testing equipment, and the testing equipment is instructed to obtain a target testing result according to the testing result and an expected result. In the method, the test equipment remotely controls the test of the equipment to be tested on the hard disk backboard in an out-of-band manner, and the equipment to be tested is connected with the hard disk backboard of different types, so that when the test equipment is used for testing the hard disk backboard, the remote and various types of tests can be realized. In addition, after the test is finished, the test result is checked only according to the time stamp information, and the test efficiency is improved.

In one embodiment, the testing the hard disk backboard corresponding to the test signal according to at least one test signal to obtain a test result includes:

determining a corresponding hard disk backboard and a testing strategy according to the testing signal; the test strategy comprises a software test strategy and/or a hardware test strategy;

and testing the hard disk backboard corresponding to the test signal according to the test strategy to obtain a test result corresponding to the test signal.

According to the testing method provided by the embodiment of the application, after the device to be tested receives the testing signal sent by the testing device remotely, the hard disk backboard and the testing strategy can be determined, then the corresponding testing is carried out, and the process does not need manual participation.

In a third aspect, the present application also provides a test apparatus, the apparatus comprising:

the sending module is used for responding to a test instruction input by a user on the test interface, executing a first test script, outputting at least one test signal, and sending the at least one test signal to the equipment to be tested so as to instruct the equipment to be tested to test the hard disk backboard corresponding to the test signal according to the at least one test signal, thereby obtaining a test result;

the first acquisition module is used for acquiring a test result on the equipment to be tested and obtaining a target test result according to the test result and the expected result.

In a fourth aspect, the present application also provides a computer device comprising a memory storing a computer program and a processor implementing the steps of the test method of any one of the preceding first and second aspects when the computer program is executed by the processor.

In a fifth aspect, the present application also provides a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the test method of any one of the preceding first and second aspects.

In a sixth aspect, the present application also provides a computer program product comprising a computer program which, when executed by a processor, implements the steps of the test method of any one of the preceding first and second aspects.

According to the method, the device, the computer equipment and the storage medium, the first test script is executed in response to the test instruction input by the user on the test interface, at least one test signal is output, the at least one test signal is sent to the equipment to be tested, the equipment to be tested is instructed to test the hard disk backboard corresponding to the test signal according to the at least one test signal, the test result is obtained, then the test result on the equipment to be tested is obtained, and the target test result is obtained according to the test result and the expected result. In the method, the test equipment remotely controls the test of the equipment to be tested on the hard disk backboard in an out-of-band manner, and the equipment to be tested is connected with the hard disk backboard of different types, so that when the test equipment is used for testing the hard disk backboard, the remote and various types of tests can be realized. In addition, after the test is finished, the test result is checked only according to the time stamp information, and the test efficiency is improved.

Drawings

FIG. 1 is a schematic diagram of a test system architecture according to one embodiment;

FIG. 2 is a flow chart of a test method in one embodiment;

FIG. 3 is a flow chart of a testing method according to another embodiment;

FIG. 4 is a flow chart of a testing method according to another embodiment;

FIG. 5 is a flow chart of a testing method according to another embodiment;

FIG. 6 is a flow chart of a testing method according to another embodiment;

FIG. 7 is a flow chart of a testing method according to another embodiment;

FIG. 8 is a flow chart of a testing method according to another embodiment;

FIG. 9 is a block diagram of a test apparatus in one embodiment;

FIG. 10 is a block diagram of a test apparatus in another embodiment;

FIG. 11 is a block diagram of a test apparatus according to another embodiment;

FIG. 12 is a block diagram of a test apparatus in another embodiment;

FIG. 13 is a block diagram of a test apparatus in another embodiment;

FIG. 14 is a block diagram of a test apparatus in another embodiment;

fig. 15 is an internal structural view of a computer device in one embodiment.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.

In the field of computers, a server comprises a computing unit, a storage unit and a transmission unit, wherein the storage unit comprises a hard disk backboard, a hard disk and a RIAD card (Redundant Array of Independent Disks, redundant disk array), the hard disk backboard is connected with the RIAD card and the hard disk and used for providing data transmission and power supply support, and before the computer is put into use, the hard disk backboard of the server needs to be tested to ensure that the storage unit works normally. At present, the testing method for the hard disk backboard mainly comprises the steps of manually connecting a certain type of tested hard disk backboard with a corresponding type of testing jig, manually switching the testing jig to test different types of hard disk backboard, and manually summarizing and analyzing the testing result. However, the above test method has a problem of low efficiency.

The present application provides a testing method, which aims to solve the above technical problems, and the following examples will specifically describe the testing method described in the present application.

The test method provided by the embodiment of the application can be applied to a test system shown in fig. 1, wherein the test system comprises test equipment 01, equipment to be tested 02 and a digital-to-analog conversion module 03, the test equipment 01 and the equipment to be tested 02 are connected in a wireless manner, the equipment to be tested 02 and the digital-to-analog conversion module 03 are connected in a wired manner, the equipment to be tested 02 and the digital-to-analog conversion module 03 can be independent devices, and optionally, the equipment to be tested 02 and the digital-to-analog conversion module 03 can be integrated into one device. The test device 01 is provided with a test tool for testing the hard disk backboard, for example, an ipmitool tool, the device 02 to be tested is connected with different types of hard disk backboard, and is specifically used for testing software functions of different types of hard disk backboard, and the digital-to-analog conversion module 03 is used for converting analog signals into digital signals, and is specifically used for testing hardware functions of different types of hard disk backboard. In practical application, the test device 01 sends a test signal to the device 02 to be tested, the software function of the hard disk backboard is tested through the device 02 to be tested, and the hardware function of the hard disk backboard is tested through the digital-to-analog conversion module 03, so that a test result is obtained. The test device 01 can be, but not limited to, various personal computers, notebook computers, smartphones, tablet computers, internet of things devices and portable wearable devices, the device 02 to be tested can be, but not limited to, various personal computers, notebook computers, smartphones, tablet computers, internet of things devices and portable wearable devices, and the digital-to-analog conversion module 03 can be a micro control unit (Microcontroller Unit, abbreviated as MCU) or a device capable of digital-to-analog conversion, such as an integrated single chip microcomputer.

Those skilled in the art will appreciate that the structure shown in fig. 1 is merely a block diagram of a portion of the structure associated with the present application and is not limiting of the test system to which the present application is applied, and that a particular test system may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.

In one embodiment, as shown in fig. 2, a test method is provided, and the test apparatus 01 in fig. 1 is taken as an example to illustrate the method, and the method includes the following steps:

s101, responding to a test instruction input by a user on a test interface, executing a first test script, outputting at least one test signal, and sending the at least one test signal to equipment to be tested so as to instruct the equipment to be tested to test a hard disk backboard corresponding to the test signal according to the at least one test signal, thereby obtaining a test result.

The test interface is an application interface of a test tool installed on the test equipment. The first test script is a script preprogrammed to test the hard disk back plate of the server, and the first test script comprises a software test function, or comprises a hardware test function, or comprises a software test function and a hardware test function. The software test function includes at least one back plane attribute function. The software test functions include a test function for testing vendor information functions of a master control chip (CPLD/MCU) on a hard disk back plate, a test function for testing actual hard disk quantity functions of the current hard disk back plate, a test function for testing the state of the acquired hard disk and judging the type of the hard disk, a test function for testing operation functions of a hard disk back plate positioning (location) hard disk controlled by a Baseboard Management Controller (BMC), a test function for testing failure (Fail) and Rebuild (Rebuild) state functions of an NVMe disk indicated by the Baseboard Management Controller (BMC), a test function for testing operation functions of a hard disk controller (SAS) with failure early Warning (Predictive Fail) state lamp function controlled by the Baseboard Management Controller (BMC), a test function for testing operation functions of a hard disk controller (test channel, a fuse function, a fuse controller (SAS) with fuse version information function, a fuse controller (test function) for testing a Host of a Host electronic disk, and a fuse controller (SAS) with a fuse controller (fuse type of a Host, at least one of a test function for testing and acquiring a naming function of the hard disk backboard, a test function for testing a signal connection Port (PCIe Port) distinguishing function of the MCIO interface, a test function for testing whether the performance of the hard disk meets the performance requirement function of a manufacturer, and the like. The hardware test function includes at least one status light function. The hardware test function comprises at least one of a test function for testing whether a pin lighting function of a main control chip (CPLD/MCU) on the hard disk backboard is normal, a test function for testing whether a temperature measuring function of a temperature sensor (Temp sensor) chip is normal, a test function for testing whether a minimum power supply voltage function of a hardware chip (MUX) is normal, a test function for testing whether a basic register unit function of the main control chip (CPLD/MCU) on the hard disk backboard is normal, and the like. The test signal includes at least one of a type identification of the hard disk backplate, a test function option, a test status, and the like. Types of hard disk backplanes include Expander backplanes (EXP), integrated circuit backplanes (Anybay backplanes), and universal hard disk backplanes (Universal Backplane Management UBM). The test function options include a function that the software test function corresponds to a test and/or a function that the hardware test function corresponds to a test. The test states include a device under test on state (state where 3.3V, 5V, and 12V points are simultaneously powered, i.e., mainpower state) and a device under test off state (state where 12V point is not powered, i.e., standby state). The test results are recorded based on a time stamp, which may be in the form of a time-level state. The test results comprise a software test result of the hard disk backboard and a hardware test result of the hard disk backboard.

In this embodiment of the present application, the test device installs in advance a test tool for testing the hard disk back plate, and imports a first test script that is programmed in advance, for example, installs an ipmitool tool. The first test script may define a main function and a plurality of function sub-functions, and when the first test script is executed, the execution logic may be set to execute sequentially, or may be set to execute sequentially according to a user selection, and when the first test script is executed, the test result is output to the corresponding test result storage file by adopting a mode that the main function calls the sub-functions. When the testing equipment needs to test the hard disk backboard, the testing equipment can be in wireless connection with the equipment to be tested, the equipment to be tested can be in wired connection with the digital-to-analog conversion module, after the connection is successful, whether a hardware circuit of the hard disk backboard is successfully connected or not can be further detected, for example, whether a power supply line, an I2c_BMC cable, a data line and an I2c_HP cable are successfully connected or not is detected, whether a pin of the digital-to-analog conversion module is connected to a chip output pin position of the hard disk backboard or not is detected, whether hardware of the testing equipment and the equipment to be tested is complete or not is detected, whether software versions are matched or not is detected, whether a network of the testing equipment and the equipment to be tested is smooth or not is enabled, and whether ping is enabled or not is enabled is detected. After the hardware circuit of the hard disk backboard is successfully connected, a test tool on the test equipment can be started, a test interface is displayed on a current display screen of the test equipment, a user can input a test instruction on the test interface, after the test equipment receives the test instruction triggered by the user, the test equipment can execute a first test script corresponding to the test instruction and output at least one test signal to the equipment to be tested, the equipment to be tested can determine the type of the hard disk backboard according to the test signal when receiving the test signal sent by the test equipment and test the hard disk backboard, after the test is completed, the equipment to be tested can store a software test result in a software result storage file, for example, the software test result is stored in a software log, and the digital-to-analog conversion module can store the hardware test result in the hardware result storage file, for example, the software test result is stored in an Hw.log, and then the equipment to be tested can summarize the hardware test result of the digital-to-analog conversion module and the software test result of the equipment to be tested to obtain the test result. It should be noted that, if the device to be tested and the digital-to-analog conversion module are integrated into one device, the device to be tested can obtain the test result corresponding to the software test and/or the hardware test after testing the hard disk backboard.

S102, obtaining a test result on the device to be tested, and obtaining a target test result according to the test result and the expected result.

Wherein the desired result is a standard result. The target test result includes an indication of test pass or test fail.

In this embodiment of the present application, after a test result is obtained by a device to be tested, the test result may be obtained by the test device from the device to be tested, and optionally, the test result may be returned by the device to be tested to the test device. After the test device obtains the test result on the device to be tested, the test result and the expected result can be compared to obtain a target test result, if the test result is consistent with the expected result, the target test result indicates that the test is passed, and if the test result is inconsistent with the expected result, the target test result indicates that the test is not passed. Optionally, in the case that the test fails, the reason of the failed test may be displayed on the test interface for the user to view.

In one embodiment, there is further provided a specific implementation manner for testing different states of the hard disk back plate, as shown in fig. 3, where the method in the embodiment of fig. 2 further includes:

s103, responding to the trigger generation of the user to the state determining instruction on the test interface, and acquiring a second test script corresponding to the state determining instruction.

The state determining instruction is used for representing a test state selected by a user. The test states include a device under test on state (state where 3.3V, 5V, and 12V points are simultaneously powered, i.e., mainpower state) and a device under test off state (state where 12V point is not powered, i.e., standby state). The second test script may be the same as the first test script or may be different from the first test script.

In the embodiment of the application, after the test equipment starts the test tool, the test interface is displayed on the current display screen of the test equipment, the test interface comprises a test state selection area with various test states, a user can select the test state in the test state selection area and start the test, the test equipment can receive a state determination instruction triggered and generated by the user on the test interface, the state determination instruction is analyzed to obtain the test state, and then a second test script corresponding to the test state is called. Optionally, after the test device displays the test interface, the user may select multiple test states on the test interface, and start the test, and the test device may call the script corresponding to each test state, and generate the second test script.

Correspondingly, when the test device executes the "execute first test script and outputs at least one test signal" in step S101, the specific execution steps are as follows: executing the second test script and outputting at least one test signal.

In this embodiment of the present invention, after obtaining a second test script, the test device may execute the second test script, output at least one test signal to the device to be tested, when the device to be tested receives the test signal sent by the test device, may determine the type of the hard disk back plate according to the test signal, and test the hard disk back plate, after the test is completed, the device to be tested may store the software test result in a software result storage file, for example, the software test result is stored in a software. Log, and the digital-to-analog conversion module may store the hardware test result in a hardware result storage file, for example, the software test result is stored in an hw. Log, and then the device to be tested may aggregate the hardware test result of the digital-to-analog conversion module with the software test result of the device to be tested itself, to obtain the test result. It should be noted that, if the device to be tested and the digital-to-analog conversion module are integrated into one device, the device to be tested can obtain the test result corresponding to the software test and/or the hardware test after testing the hard disk backboard.

In one embodiment, there is further provided a specific implementation manner of testing the test function options of the hard disk back plate according to the selection of the user, as shown in fig. 4, the method in the embodiment of fig. 2 further includes:

s104, displaying test function options;

the test function options comprise function items corresponding to all functions contained in the first test script, wherein the function items comprise a function corresponding to a test of a software test function and a function corresponding to a test of a hardware test function, namely the test function options comprise the software test function and the hardware test function. The software test function includes a vendor information function of acquiring a master control chip (CPLD/MCU) on a hard disk backboard, a function of acquiring the actual number of hard disks of the current hard disk backboard, a function of acquiring the state of the hard disk and judging the type of the hard disk, a function of acquiring the state of a hard disk, a function of controlling the operation of a hard disk by a Baseboard Management Controller (BMC) to indicate the failure (Fail) and Rebuild (Rebuild) states of an NVMe disk, a function of controlling a failure early (Predictive Fail) state lamp by the Baseboard Management Controller (BMC), a function of controlling a Warning (Warning) state lamp by the Baseboard Management Controller (BMC), a function of acquiring the Firmware (FW) version information of a board master control chip, a function of acquiring the configuration information of the backboard model, a function of whether the hard disk backboard supports online upgrading (Update Flag), a function of acquiring the operation number of an external electronic fuse (eff) of a specified hard disk slot on the backboard, a function of controlling the operation of the external electronic fuse (eff) of the specified hard disk slot on the Baseboard Management Controller (BMC), a function of acquiring the information identification of a hard disk Expander (SAS, a function of a Host interface, and a function of distinguishing whether the hard disk is in accordance with the requirements of a specific hardware interface of the vendor, or not. The hardware test function comprises at least one of whether a pin lighting function of a main control chip (CPLD/MCU) on the hard disk backboard is normal, whether a temperature measuring function of a temperature sensor (Temp sensor) chip is normal, whether a minimum power supply voltage function of a hardware chip (MUX) is normal, whether a basic register unit function of the main control chip (CPLD/MCU) on the hard disk backboard is normal, and the like.

In this embodiment of the present application, after the hardware circuit of the hard disk backboard is successfully connected, the test tool on the test device may be started, the test interface is displayed on the current display screen of the test device, and all the test function options are displayed on the current test interface.

S105, responding to a selection instruction generated by triggering the user on the test interface, and generating a third test script according to the selection instruction.

Wherein the selection instruction is used to indicate that a certain test function option is selected. The third test script is determined by the test function option indicated by the selection instruction. The third test script, the first test script, and the second test script may be the same as each other, or may be different from each other.

In this embodiment of the present application, after the test device starts the test tool, a test interface is displayed on a current display screen of the test device, where the test interface includes a test function option selection area of multiple test function options, a user may select a test function option to be tested in the test function option selection area, and start the test, and the test device may receive a selection instruction triggered and generated by the user on the test interface, and analyze the selection instruction to obtain the test function option, and then call a third test script corresponding to the test function option. Optionally, after the test device displays the test interface, the user may fully select all the test function options on the test interface, and start the test, and the test device may call the scripts corresponding to the test function options, and generate a third test script.

Correspondingly, when the test device executes the "execute first test script and outputs at least one test signal" in step S101, the specific execution steps are as follows: executing the third test script and outputting at least one test signal.

In this embodiment of the present invention, after obtaining a third test script, the test device may execute the third test script, output at least one test signal to the device to be tested, when the device to be tested receives the test signal sent by the test device, may determine the type of the hard disk back plate according to the test signal, and test the hard disk back plate, after the test is completed, the device to be tested may store the software test result in a software result storage file, for example, the software test result is stored in a software. Log, and the digital-to-analog conversion module may store the hardware test result in a hardware result storage file, for example, the software test result is stored in an hw. Log, and then the device to be tested may aggregate the hardware test result of the digital-to-analog conversion module with the software test result of the device to be tested itself, to obtain the test result. It should be noted that, if the device to be tested and the digital-to-analog conversion module are integrated into one device, the device to be tested can obtain the test result corresponding to the software test and/or the hardware test after testing the hard disk backboard.

In an embodiment, when the test signal is a test signal output by a status light function in the first test script, a specific implementation manner of obtaining a test result of a hard disk back plate for performing a hardware test is further provided, as shown in fig. 5, the "sending the test signal to a device to be tested" in the step S101, to instruct the device to be tested to test the hard disk back plate corresponding to the test signal according to the test signal, to obtain the test result "includes:

s201, sending the test signal to the equipment to be tested so as to instruct the equipment to be tested to determine a control signal according to the test signal, and controlling the status lamp to perform corresponding operation according to the control signal.

The status lamp function is a hardware test function, and comprises at least one of a test function for testing whether a pin lighting function of a main control chip (CPLD/MCU) on the hard disk backboard is normal, a test function for testing whether a temperature measuring function of a temperature sensor (Temp sensor) chip is normal, a test function for testing whether a minimum power supply voltage function of a hardware chip (MUX) is normal, a test function for testing whether a basic register unit function of the main control chip (CPLD/MCU) on the hard disk backboard is normal, and the like.

In this embodiment of the present application, after receiving a test instruction triggered by a user, the test device may execute a first test script corresponding to the test instruction, and output at least one test signal to the device to be tested, where after receiving the test signal sent by the test device, the device to be tested may determine a control signal according to the test signal, and then control the status light to be turned on or off, for example, control the status light to be turned on or off, according to the control signal.

Correspondingly, when the test device executes the "obtain test result on the device under test" in step S101, step S202 is specifically executed: and reading a level signal output by a digital-to-analog conversion module connected with the device to be tested, and taking the level signal as a test result.

The analog conversion module is used for storing state data of corresponding operation of the state lamp, namely storing high-level or low-level data corresponding to the on or off state of the state lamp.

In the embodiment of the application, the digital-to-analog conversion module is connected with the pins of the chip on the hard disk backboard, after the equipment to be tested controls the status lamp to be turned on or turned off, the digital-to-analog conversion module can obtain the result of the status lamp on or the result of the status lamp off through the pins, and the corresponding level change signal is used as a test result. For example, if the state of the hard disk backboard status light is from the on state to the off state, the test result of the digital-to-analog conversion module is high level to low level, and if the state of the hard disk backboard status light is from the off state to the on state, the test result of the digital-to-analog conversion module is low level to high level.

In one embodiment, as shown in fig. 6, a test method is provided, and the method is applied to the device under test 02 in fig. 1, and is illustrated by way of example, and includes the following steps:

s301, when at least one test signal sent by the test equipment is received, testing is conducted on the hard disk backboard corresponding to the test signal according to the at least one test signal, and a test result is obtained.

The test signal comprises at least one of a type identifier of the hard disk backboard, a test function option, a test state and the like. Types of hard disk backplanes include Expander backplanes (EXP), integrated circuit backplanes (Anybay backplanes), and universal hard disk backplanes (Universal Backplane Management UBM). The test function options include a function that the software test function corresponds to a test and/or a function that the hardware test function corresponds to a test. The test states include a device under test on state (state where 3.3V, 5V, and 12V points are simultaneously powered, i.e., mainpower state) and a device under test off state (state where 12V point is not powered, i.e., standby state). The test results are recorded based on a time stamp, which may be in the form of a time-level state. The test results comprise a software test result of the hard disk backboard and a hardware test result of the hard disk backboard.

In this embodiment of the present application, after the hardware circuit of the hard disk backboard is successfully connected, a test tool on the test device may be started, a test interface is displayed on a current display screen of the test device, a user may input a test instruction on the test interface, after receiving the test instruction triggered by the user, the test device may execute a test script corresponding to the test instruction, and output at least one test signal to the device to be tested.

When the device to be tested receives the test signal sent by the test device, the type of the hard disk backboard can be determined according to the test signal, the hard disk backboard is tested, after the test is completed, the device to be tested can store the software test result in a software result storage file, for example, the software test result is stored in a software log, and the digital-to-analog conversion module can store the hardware test result in a hardware result storage file, for example, the software test result is stored in an Hw log. The device to be tested can summarize the hardware test result of the digital-to-analog conversion module and the software test result of the device to be tested, so as to obtain the test result. It should be noted that, if the device to be tested and the digital-to-analog conversion module are integrated into one device, the device to be tested can obtain the test result corresponding to the software test and/or the hardware test after testing the hard disk backboard.

S302, returning the test result to the test equipment to instruct the test equipment to obtain a target test result according to the test result and the expected result.

In an embodiment, as shown in fig. 7, in the step S301, the method for testing the hard disk back plate corresponding to the test signal according to the at least one test signal to obtain the test result includes:

s401, determining a corresponding hard disk backboard and a corresponding testing strategy according to the testing signals.

The test strategy is a strategy determined according to the test script, and the test strategy comprises a software test strategy and/or a hardware test strategy.

In this embodiment of the present application, when a device to be tested receives a test signal sent by a test device, the type and the test policy of the hard disk backboard may be determined according to the test signal, for example, the test signal needs to test a function of the EXP hard disk backboard corresponding to a software test function, and then the type of the hard disk backboard is the EXP hard disk backboard, and the test policy is whether the pin lighting function of a main control chip (CPLD/MCU) on the test hard disk backboard is normal.

S402, testing the hard disk backboard corresponding to the test signal according to the test strategy to obtain a test result corresponding to the test signal.

In the embodiment of the application, after determining the test strategy, the device to be tested can test the hard disk backboard corresponding to the test signal according to the test strategy to obtain the test result corresponding to the test signal. For example, after determining that the type of the hard disk backboard is EXP hard disk backboard and the testing strategy is to test whether the lighting function of the pins of the main control chip (CPLD/MCU) on the hard disk backboard is normal, the device to be tested can test the lighting function of the pins of the main control chip (CPLD/MCU) on the EXP hard disk backboard and determine whether the lighting function is normal. After the test is completed, the device under test may store the software test result in a software result storage file, for example, the software test result is stored in a software log, and the digital-to-analog conversion module may store the hardware test result in a hardware result storage file, for example, the software test result is stored in an hw log. The device to be tested can summarize the hardware test result of the digital-to-analog conversion module and the software test result of the device to be tested, so as to obtain the test result. It should be noted that, if the device to be tested and the digital-to-analog conversion module are integrated into one device, the device to be tested can obtain the test result corresponding to the software test and/or the hardware test after testing the hard disk backboard.

In all the above embodiments, there is also provided a testing method, as shown in fig. 8, including:

s501, the test equipment responds to a test instruction input by a user on a test interface, executes a first test script and outputs at least one test signal.

S502, the test equipment responds to a test instruction input by a user on the test interface by triggering and generating a state determination instruction, and responds to the test instruction input by the user on the test interface, and a second test script corresponding to the state determination instruction is obtained.

S503, the test equipment executes the second test script and outputs at least one test signal.

S504, the test equipment displays test function options. The test function options comprise function items corresponding to all functions contained in the first test script.

S505, the test equipment responds to the selection instruction generated by the user triggering on the test interface, responds to the test instruction input by the user on the test interface, and generates a third test script according to the selection instruction.

S506, the test equipment executes the third test script and outputs at least one test signal.

S507, the test equipment sends the test signal to the equipment to be tested. The first test script comprises a software test function comprising at least one back panel attribute function and/or a hardware test function comprising at least one status light function.

S508, when the device to be tested receives at least one test signal sent by the test device, determining a corresponding hard disk backboard and test strategy according to the test signal. The test policies include software test policies and/or hardware test policies.

S509, the device to be tested tests the hard disk backboard corresponding to the test signal according to the test strategy to obtain a test result corresponding to the test signal.

S510, the device to be tested returns the test result to the test device.

S511, the test device reads the level signal output by the digital-to-analog conversion module connected with the device to be tested, and takes the level signal as a test result. The digital-to-analog conversion module is used for storing state data of corresponding operation of the state lamp

S512, the test equipment obtains a target test result according to the test result and the expected result.

The method of each step is described in the foregoing embodiments, and the detailed description is referred to the foregoing description and is not repeated here.

According to the testing method provided by the embodiment of the application, software and hardware can be tested on the hard disk backboard by utilizing the software testing script and the digital-to-analog conversion module, the testing content not only comprises traditional software functions such as a register set value and software execution logic, but also can be used for testing the pin basic input and output functions of the hard disk backboard hardware by combining the digital-to-analog conversion module. The function of the hard disk backboard can be detected, the performance of the hard disk matched with the disk array and the performance of the hard disk not matched with the disk array can be detected, and the compatibility test is more comprehensive. The method can acquire the basic information of the hard disk backboard software and hardware, compare with the expected result in the hardware instruction, and check the defects of the hardware and the problems different from the theoretical design value. The multi-state test can be carried out on the hard disk backboard, and the multi-state test can be carried out on the hard disk backboard of various types in an out-of-band mode by connecting the various hard disk backboard with the equipment to be tested, so that the influence of the tested hard disk backboard on the output of a test tool during in-band test is avoided, and the result is disturbed. The method has the advantages of low software design cost, capability of packaging running software scripts and digital-to-analog conversion modules, capability of performing adaptation on multiple machines, capability of performing batch copying, portability and simplicity, strong portability, capability of performing batch equal transplantation by developing a set of tools, and capability of adapting to various types of back plates. The output result is stored in a log form, and is compared and checked in a time stamp form, so that the method is simple and convenient, the fault position can be accurately positioned when a problem occurs, and the testing and repairing efficiency can be provided.

It should be understood that, although the steps in the flowcharts related to the embodiments described above are sequentially shown as indicated by arrows, these steps are not necessarily sequentially performed in the order indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the flowcharts described in the above embodiments may include a plurality of steps or a plurality of stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of the steps or stages is not necessarily performed sequentially, but may be performed alternately or alternately with at least some of the other steps or stages.

Based on the same inventive concept, the embodiment of the application also provides a testing device for realizing the testing method. The implementation of the solution provided by the device is similar to that described in the above method, so the specific limitations of one or more embodiments of the testing device provided below may be referred to above for limitations of the testing method, and will not be repeated here.

In one embodiment, as shown in fig. 9, there is provided a test apparatus comprising:

the sending module 10 is configured to respond to a test instruction input by a user on the test interface, execute a first test script, output at least one test signal, and send the at least one test signal to the device under test, so as to instruct the device under test to test the hard disk backboard corresponding to the test signal according to the at least one test signal, thereby obtaining a test result. The first test script comprises a software test function and/or a hardware test function; the software functions include at least one back panel attribute function and the hardware test functions include at least one status light function.

The first obtaining module 11 is configured to obtain a test result on the device under test, and obtain a target test result according to the test result and the expected result.

In one embodiment, as shown in fig. 10, the test apparatus further includes:

and the second obtaining module 12 is configured to obtain a second test script corresponding to the state determining instruction in response to the user triggering the generation of the state determining instruction on the test interface.

Correspondingly, the sending module 10 is specifically configured to execute the second test script, and output at least one test signal.

In one embodiment, as shown in fig. 11, the test apparatus includes:

a display module 13 for displaying test function options; the test function options comprise function items corresponding to all functions contained in the first test script.

The generating module 14 is configured to respond to a selection instruction generated by triggering the user on the test interface, and generate a third test script according to the selection instruction.

Correspondingly, the sending module 10 is specifically configured to execute a third test script, and output at least one test signal.

In one embodiment, as shown in fig. 12, the transmitting module 10 includes:

and the sending unit 100 is used for sending the test signal to the device to be tested so as to instruct the device to be tested to determine the control signal according to the test signal and control the status lamp to perform corresponding operation according to the control signal.

An obtaining unit 101, configured to read a level signal output by a digital-to-analog conversion module connected to a device to be tested, and use the level signal as a test result; the digital-to-analog conversion module is used for storing the state data of the corresponding operation of the state lamp.

In one embodiment, as shown in fig. 13, there is also provided a test apparatus, including:

and the receiving module 15 is configured to, when receiving at least one test signal sent by the test device, test a hard disk backboard corresponding to the test signal according to the at least one test signal, so as to obtain a test result.

And a return module 16, configured to return the test result to the test device, so as to instruct the test device to obtain a target test result according to the test result and the expected result.

In one embodiment, as shown in fig. 14, the receiving module 15 includes:

a determining unit 150, configured to determine a corresponding hard disk backboard and test strategy according to the test signal; the test policies include software test policies and/or hardware test policies.

And the testing unit 151 is configured to test the hard disk backboard corresponding to the test signal according to the test strategy, so as to obtain a test result corresponding to the test signal.

The various modules in the test apparatus described above may be implemented in whole or in part by software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.

In one embodiment, a computer device is provided, which may be a terminal, and an internal structure diagram thereof may be as shown in fig. 15. The computer device includes a processor, a memory, an input/output interface, a communication interface, a display unit, and an input means. The processor, the memory and the input/output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input/output interface. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The input/output interface of the computer device is used to exchange information between the processor and the external device. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless mode can be realized through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a test method. The display unit of the computer device is used for forming a visual picture, and can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, can also be a key, a track ball or a touch pad arranged on the shell of the computer equipment, and can also be an external keyboard, a touch pad or a mouse and the like.

It will be appreciated by those skilled in the art that the structure shown in fig. 15 is merely a block diagram of a portion of the structure associated with the present application and is not limiting of the computer device to which the present application is applied, and that a particular computer device may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.

In one embodiment, a computer device is provided comprising a memory and a processor, the memory having stored therein a computer program, the processor when executing the computer program performing the steps of:

responding to a test instruction input by a user on a test interface, executing a first test script, outputting at least one test signal, and sending the at least one test signal to equipment to be tested so as to instruct the equipment to be tested to test a hard disk backboard corresponding to the test signal according to the at least one test signal, thereby obtaining a test result; the first test script comprises a software test function and/or a hardware test function; the software functions include at least one back panel attribute function, and the hardware test functions include at least one status light function;

In one embodiment, the processor when executing the computer program further performs the steps of:

executing the second test script and outputting at least one test signal.

executing the third test script and outputting at least one test signal.

In one embodiment, there is also provided a computer device comprising a memory and a processor, the memory storing a computer program, the processor implementing the following steps when executing the computer program:

The computer device provided in the foregoing embodiments has similar implementation principles and technical effects to those of the foregoing method embodiments, and will not be described herein in detail.

In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which when executed by a processor, performs the steps of:

In one embodiment, the computer program when executed by the processor further performs the steps of:

executing the second test script and outputting at least one test signal.

executing the third test script and outputting at least one test signal.

In one embodiment, there is also provided a computer readable storage medium having stored thereon a computer program which when executed by a processor performs the steps of:

The foregoing embodiment provides a computer readable storage medium, which has similar principles and technical effects to those of the foregoing method embodiment, and will not be described herein.

In one embodiment, a computer program product is provided comprising a computer program which, when executed by a processor, performs the steps of:

executing the second test script and outputting at least one test signal.

executing the third test script and outputting at least one test signal.

In one embodiment, there is also provided a computer program product comprising a computer program which, when executed by a processor, performs the steps of:

The foregoing embodiment provides a computer program product, which has similar principles and technical effects to those of the foregoing method embodiment, and will not be described herein.

Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the various embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high density embedded nonvolatile Memory, resistive random access Memory (ReRAM), magnetic random access Memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric Memory (Ferroelectric Random Access Memory, FRAM), phase change Memory (Phase Change Memory, PCM), graphene Memory, and the like. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, and the like. By way of illustration, and not limitation, RAM can be in the form of a variety of forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), and the like. The databases referred to in the various embodiments provided herein may include at least one of relational databases and non-relational databases. The non-relational database may include, but is not limited to, a blockchain-based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic units, quantum computing-based data processing logic units, etc., without being limited thereto.

The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the present application. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application shall be subject to the appended claims.

Claims

1. A method of testing, for use with a test apparatus, the method comprising:

And obtaining a test result on the equipment to be tested, and obtaining a target test result according to the test result and the expected result.

2. The method according to claim 1, wherein the first test script comprises a software test function and/or a hardware test function; the software functions include at least one back panel attribute function and the hardware test functions include at least one status light function.

3. The method according to claim 1 or 2, characterized in that the method further comprises:

responding to the user to trigger generation of a state determining instruction on the test interface, and acquiring a second test script corresponding to the state determining instruction;

the executing the first test script, outputting at least one test signal, includes:

and executing the second test script and outputting at least one test signal.

4. The method according to claim 1 or 2, characterized in that the method further comprises:

responding to a selection instruction triggered and generated by the user on the test interface, and generating a third test script according to the selection instruction;

and executing the third test script and outputting at least one test signal.

5. The method of claim 1, wherein the test signal is a test signal output by a status light function in the first test script, the test signal is sent to a device under test, so as to instruct the device under test to test a hard disk backboard corresponding to the test signal according to the test signal, and a test result is obtained, and the method comprises:

the test signal is sent to equipment to be tested, so that the equipment to be tested is instructed to determine a control signal according to the test signal, and the status lamp is controlled to perform corresponding operation according to the control signal;

the obtaining the test result on the device to be tested includes:

reading a level signal output by a digital-to-analog conversion module connected with the equipment to be tested, and taking the level signal as the test result; the digital-to-analog conversion module is used for storing state data of corresponding operation of the state lamp.

6. A method of testing, the method comprising:

7. The method of claim 6, wherein the testing the hard disk back plate corresponding to the test signal according to the at least one test signal to obtain a test result comprises:

determining a corresponding hard disk backboard and a corresponding testing strategy according to the testing signal; the test strategy comprises a software test strategy and/or a hardware test strategy;

8. A test apparatus, the apparatus comprising:

9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor implements the steps of the method of any of claims 1 to 7 when the computer program is executed.

10. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 7.