CN117352414B - Diode testing process - Google Patents
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- CN117352414B CN117352414B CN202311573378.6A CN202311573378A CN117352414B CN 117352414 B CN117352414 B CN 117352414B CN 202311573378 A CN202311573378 A CN 202311573378A CN 117352414 B CN117352414 B CN 117352414B
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- 238000012360 testing method Methods 0.000 title claims abstract description 160
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000005452 bending Methods 0.000 claims abstract description 88
- 238000003825 pressing Methods 0.000 claims abstract description 38
- 238000009954 braiding Methods 0.000 claims description 56
- 238000012546 transfer Methods 0.000 claims description 39
- 238000004020 luminiscence type Methods 0.000 claims description 9
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- 238000004519 manufacturing process Methods 0.000 abstract description 9
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
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- 229910052732 germanium Inorganic materials 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0095—Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
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- Manufacturing & Machinery (AREA)
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention provides a diode test process, which relates to the technical field of semiconductor production and processing and testing and mainly comprises the following steps: s5, compressing pins: the two layers of braid strips stuck on the pins at the bottom of the light-emitting diode in the step S4 are rapidly clamped and rapidly released from the middle through the two side compacting plates; through the reciprocal alternating pressing of two braid clamp plates on testboard surface, utilize the arc bending on braid clamp plate surface to fold the direction and make the braid take in according to S-shaped range upon range of, increase braid take in the performance when reducing braid point area, simultaneously through accomodating braid according to S-shaped range upon range of and reduce braid point area, cooperate the red oil ink of smearing on the emitting diode surface to pass through the emitting diode after bending and upwards demonstrate, can be convenient for later stage personnel adopt the vision to screen out non-luminous emitting diode fast to effectively improve rejection efficiency.
Description
Technical Field
The invention relates to the technical field of semiconductor production and processing and testing, in particular to a diode testing process.
Background
A diode is an electronic device made of semiconductor materials (silicon, selenium, germanium, etc.). The diode has two electrodes, an anode, also called anode; the negative electrode, called the cathode, turns on the diode when a forward voltage is applied between the two poles of the diode, and turns off the diode when a reverse voltage is applied. The on and off of the diode corresponds to the on and off of the switch.
Diodes are currently divided into the market: photodiodes, light emitting diodes, point contact diodes, surface contact diodes, planar diodes, voltage regulators, etc., while light emitting diodes are commonly used light emitting devices, simply referred to as LEDs, which emit light by recombination of electrons and holes, and are widely used in the field of illumination. The light emitting diode can efficiently convert electric energy into light energy, and has wide application in modern society, such as illumination, flat panel display, medical devices and the like.
The light emitting diode is composed of a PN junction as a common diode and also has unidirectional conductivity. When a forward voltage is applied to the light emitting diode, holes injected from the P region to the N region and electrons injected from the N region to the P region recombine with the electrons in the N region and the holes in the P region within several micrometers near the PN junction, respectively, generating spontaneous emission fluorescence. The energy states of electrons and holes in different semiconductor materials are different. The more energy released when the electrons and holes recombine, the shorter the wavelength of the emitted light. Diodes that emit red, green or yellow light are commonly used. The reverse breakdown voltage of the light emitting diode is greater than 5 volts. Its forward volt-ampere characteristic curve is steep and must be used in series with a current limiting resistor to control the current through the diode.
In the production and processing process of the light emitting diode, as most diode elements have smaller volume and two leads or pins, each light emitting diode is arranged in series in a common arrangement mode in the industry, so that the post test and processing are facilitated, as disclosed in patent number 201721284529.6, a diode braid forming device is simple in structure and convenient to operate, a feeding device sends the diode to a strip, a forming press roll rotates and drives two strips to wrap the diode in the strip, a cam rotates, the cam drives a slide bar which is arranged against the cam to reciprocate, and the two slide bars are connected through a connecting rod and a rotating shaft, so that the reciprocation of one slide bar drives the other slide bar to reciprocate, the punching plate is driven by the slide bar to reciprocate the diode braid, the production efficiency is improved, the diode braid is driven by the press roll to move in a storage box, and the device is simple in working mode and high in production efficiency.
However, the diode conveying disclosed in the above patent still has some defects in the practical use process, and the specific defects are that:
At present, some unqualified products which do not emit light can be tested and removed in the production process of the diode, and the existing test of the diode is mainly carried out by adopting tool assistance, and the light emitting diode is manually installed and connected for light emitting test.
Disclosure of Invention
In view of the problems in the prior art, an object of the present invention is to provide a diode testing process, which solves the problems described in the background art: at present, the light emitting diode can have some non-luminous inferior products to test and reject in the production process, and the current test of the light emitting diode is mainly assisted by a tool, and the light emitting diode is manually installed and connected to perform the luminous test, so that the technical problems of low working efficiency, low test speed, low test efficiency, low test precision and high error are solved.
The technical problems to be solved by the invention are realized by adopting the following technical scheme: a diode test process mainly comprises the following steps:
S1, sorting the light emitting diodes: placing a plurality of light emitting diodes to be tested in a vibration disc, sorting the light emitting diodes to be tested through the work of the vibration disc to enable the light emitting diodes to be tested to be placed uniformly, and continuously feeding the light emitting diodes to the left end of a linear feeding table;
S2, transferring, picking and intermittent feeding: the left end of the linear feeding table is conveyed to the surface of the test table through the reciprocating light emitting diode picking up of the transfer component, the transfer component picks up a single light emitting diode every time in a reciprocating stroke, the picked single light emitting diode needs to stay intermittently once through the transfer table, continuous transfer is converted into intermittent transfer, and the intermittent movement rule of the intermittent transferred single light emitting diode is consistent with that of the intermittent moving braiding belt;
S3, intermittently conveying two layers of braiding belts: the surfaces of the two layers of braiding belts are pressed and attached through two intermittently rotating power wheels, the power wheels intermittently rotate, and the friction force of the surfaces of the power wheels and the surfaces of the braiding belts is utilized to push the braiding belts to intermittently convey;
S4, inserting a light emitting diode into the braid belt: intermittently conveying the two layers of braiding belts intermittently conveyed and moved on the top surface of the test bench in the step S3 through two groups of feeding pulleys on the right side of c respectively, continuously picking up and horizontally transferring the initial angular positions contacted by the two groups of feeding pulleys placed on the intermediate rotary bench through the intermediate rotary assembly by the light emitting diode intermittently stopped in the step S2, enabling pins at the bottom of the light emitting diode to be embedded in the middle of the two layers of braiding belts, continuously moving leftwards through the two layers of braiding belts, and adhering the pins at the bottom of the light emitting diode by adhering the two layers of braiding belts;
S5, compressing pins: and (3) rapidly clamping and rapidly loosening the two layers of braid belts adhered with the pins at the bottoms of the light emitting diodes in the step (S4) to the middle through the two side compression plates, and firmly inserting the pins at the bottoms of the light emitting diodes in the middle of the two layers of braid belts by bonding the air bags on the surfaces of the compression plates with the surfaces of the braid belts and applying compression force to the middle parts of the two layers of braid belts.
S6, luminescence test: carrying out luminescence test on the light emitting diode compressed in the middle of the two layers of braiding belts in the step S5, moving the light emitting diode inserted in the middle of the two layers of braiding belts to the surface of a test board for pause and intermittence, rapidly moving and pressing the light emitting diode to the surface of the test board through a movable push block at the front side of the test board, contacting a bending conductive push block on the movable push block with pins of the light emitting diode, transmitting a battery on the surface of the bending conductive push block to the light emitting diode through the pins, wherein the light emitting diode normally emits light, and when the light emitting diode does not emit light, the poking top block stretches out backwards and pushes and bends the light emitting diode and the pins, and red oil ink on the surface of the poking top block is smeared on the surface of the unlit light emitting diode;
S7, folding and accommodating the LED braid belts: folding, compressing and storing the light-emitting diode tested in the step S6, and alternately pressing the two braid pressing plates on the surface of the test bench in a reciprocating manner, and folding and guiding the braid by utilizing the arc bending of the surface of the braid pressing plates to store the braid according to S-shaped lamination;
s8, manually removing defective products: the folded and compacted braiding belt in the step S7 is visually eliminated to eliminate the non-bright light emitting diode, red oil ink is smeared on the surface of the light emitting diode in the step S6, so that the non-bright light emitting diode is manually and quickly eliminated by manual vision, and the normally-luminous diode is manually inserted into the original non-bright light emitting diode in the middle of the braiding belt to finish replacement;
As a preferable technical scheme of the invention, the steps S1-S8 also comprise a test bench fixed on the ground and a vibration disk arranged on the right side of the test bench, wherein a side guard plate is fixed on the top end of the test bench near the left side of the test bench, a rear guard plate is fixed on the top end of the test bench near the rear side of the test bench, a control bench is arranged on the rear side of the test bench, a supporting leg is arranged at the bottom of the test bench,
As a preferable technical scheme of the invention, a vibration disc is arranged on the right side of the test table, a linear feeding table is outwards extended from the vibration disc, and a transfer assembly is arranged on the left end of the linear feeding table and the right side of the test table;
As a preferable technical scheme of the invention, the top end of the test bench is provided with two groups of feeding pulleys close to the right side of the test bench, each group of feeding pulleys is provided with a braiding belt, the other end of the braiding belt of each group of feeding pulleys is wound on a respective braiding belt rotating shaft, and each braiding belt rotating shaft is rotationally connected to the top end of the test bench;
As a preferable technical scheme of the invention, two compacting plates are arranged on the left side of the feeding belt wheel, a testing component is arranged on the left side of the two compacting plates, two power wheels which intermittently rotate are arranged on the left side of the testing component, and the braiding belt sequentially passes through the middle of the two compacting plates, the testing component and the middle of the two power wheels.
As a preferable technical scheme of the invention, the linear feeding table comprises a diode feeding groove arranged at the top end of the linear feeding table, two inclined movable baffles are rotatably connected to the left side of the diode feeding groove of the linear feeding table, the movable baffles on each side are rotatably connected to the inner wall of the diode feeding groove of the linear feeding table through hinge supports, and springs are fixed between the middle part of each movable baffle on each side and the inner wall of the diode feeding groove.
As a preferable technical scheme of the invention, the transfer assembly comprises a transfer table arranged at the middle position of the right side of the test table and the left side of the linear feeding table, and the front side wall of the transfer table is provided with a permanent magnet.
As a preferred technical scheme of the invention, the transfer assembly further comprises a guide sliding rail fixed on the right side of the test bench, second guide sliding grooves are formed in the front side and the rear side of the top end of the guide sliding rail, the top end of the guide sliding rail is slidably connected with a second sliding block, the second sliding block is clamped in the second guide sliding groove of the guide sliding rail, the top end of the second sliding block is fixedly provided with two clamping frames, the top end of each clamping frame is provided with a linear sliding hole, the inner wall of each linear sliding hole is slidably connected with two movable nut sleeves, the outer wall of one side of each clamping frame is fixedly provided with a second servo motor, a bidirectional threaded screw rod extends out of the linear sliding hole of each servo motor two-way clamping frame, the surface of each bidirectional threaded screw rod is slidably connected with two movable nut sleeves in reverse threaded connection, and the bottom of each movable nut sleeve is provided with a clamping claw;
the surface of the clamping claw, which is attached to the light-emitting diode, is provided with an arc-shaped profile surface which is attached to the light-emitting diode.
As a preferable technical scheme of the invention, the power wheel comprises a motor fixed at the bottom end of the test bench, the motor extends upwards to form a poking wheel, a grooved wheel is arranged at the bottom of one power wheel, the poking wheel is in intermittent meshing connection with the grooved wheel, a gear is arranged at the bottom of each power wheel, and the bottoms of the two power wheels synchronously rotate through gear meshing.
As a preferable technical scheme of the invention, the test assembly comprises a test board fixed at the top end of a test bench, a bending groove is formed in the front side wall of the test board, a fixed sliding block is fixedly arranged on the front side of the test board, a linear guide sliding groove is formed in the top surface of the fixed sliding block, a movable sliding block is connected with the top end of the fixed sliding block in a sliding manner, a first air cylinder is fixedly arranged on the surface of the first air cylinder, a piston rod extends leftwards from the first air cylinder, the top end of a piston rod of the first air cylinder is fixed on the movable sliding block, two bending conductive pushing blocks are fixed on the rear side of the movable sliding block, each bending conductive pushing block is a metal block, and one surface of the bending conductive pushing block is provided with current.
As a preferable technical scheme of the invention, a movable push block which is vertical to the top surface of the test bench is fixed on the rear side of the movable slide block, a top spring is fixed on the rear side of the movable push block, and a compression block is fixed on the surface of the top spring on the rear side of the movable push block.
As a preferable technical scheme of the invention, a second cylinder support which is vertical to the top end of the movable sliding block is fixed at the top end of the movable sliding block, a second pneumatic cylinder is fixed at the front side of the second cylinder support, a piston rod is arranged at the rear end face of the second pneumatic cylinder, and a poking bending jacking block is fixed at the top end of the piston rod of the second pneumatic cylinder.
As a preferable technical scheme of the invention, the rear side wall of the poking bending jacking block is fixed with a red oil sponge. The oil filling port is formed in the top end of the poking bending jacking block, the rubber plug is arranged for sealing the oil filling port, an oil cavity communicated with the oil filling port is formed in the poking bending jacking block, red oil ink is stored in the oil cavity, an oil discharging small hole communicated with the oil cavity is formed in the rear side wall of the poking bending jacking block, and the red oil sponge is arranged on the rear side wall of the poking bending jacking block and used for blocking and absorbing the red oil ink discharged by the oil discharging small hole.
As a preferable technical scheme of the invention, the left half area of the top surface of the test bench is provided with two linear guide grooves, the two linear guide grooves are respectively arranged at the front side and the rear side close to the top surface of the test bench, each linear guide groove is slidably connected with a braiding pressing plate, and each braiding pressing plate is of a thin plate structure with a middle plane and two arc-shaped sides which are outwards bent;
The bottom of testboard is fixed with fixed otic placode, fixed otic placode's fixed surface is fixed with the extension spring, every the bottom of braid clamp plate passes the straight line guide slot and is provided with the slider in the bottom of testboard, the slider surface is provided with the stay cord hasp, the stay cord hasp bolt of slider has the stay cord, the other end of stay cord winds in the wire reel surface, the wire reel is provided with servo motor one and drives rotatablely, servo motor one is fixed in the testboard bottom.
As a preferable technical scheme of the invention, the compacting plates comprise two linear sliding holes symmetrically arranged on the test bench, the two compacting plates are arranged at the tops of the two linear sliding holes respectively, the bottom of each compacting plate is provided with a movable sliding rod which is in sliding connection with the linear sliding holes, the bottom of each movable sliding rod is provided with a threaded hole, the bottom of the test bench is fixedly provided with a third servo motor, a second bidirectional threaded screw rod extends forwards from the three directions of the servo motor, and the threaded holes formed at the bottom of the two movable sliding rods are in threaded connection with the second bidirectional threaded screw rod.
Compared with the prior art, the invention has the beneficial effects that:
1. The invention inserts the luminescent diode in the middle of two-layer braiding belt and moves to the surface of the test board to pause intermittently, move and press to the surface of the test board fast through the movable push block of the front side of the test board, compress the two-layer braiding belt of the position to be measured first through the compression block on the movable push block, can make the conductive push block of bending stretch out backwards continuously through the compression of the top spring, the conductive push block of bending contacts with pin of the luminescent diode, transmit the battery on the surface of conductive push block of bending to the luminescent diode through the pin, luminescent diode normally shines at this moment, the conductive push block of bending stretch out backwards will push the pin into the bending groove directly, make the pin bend along the inner wall outline of the bending groove, this effect can also finish bending to the pin while bending the conductive push block and pin contact, realize luminescent diode one-time stop finish two steps, the luminescent diode after the pin bending is easier to grasp or position when installing in electronic components in the later stage. And the bending conductive push block is contacted with the pin and performs test luminescence, and meanwhile, the bending of the pin can enlarge the contact area of the pin and the bending conductive push block, so that the contact pressure of the pin and the surface of the bending conductive push block is increased, the test accuracy of the light-emitting diode is improved, and the error or the error of a test structure caused by poor contact is prevented.
2. When the light emitting diode does not emit light, the poking and bending top block is extended backwards and pushes and bends the light emitting diode, a bending structure is generated between the light emitting diode and the pins in the pushing and bending process of the light emitting diode, red oil ink on the surface of the poking and bending top block is smeared on the surface of the non-bright light emitting diode and bends the light emitting diode, and the red oil ink smeared on the surface of the light emitting diode is displayed upwards through the bent light emitting diode, so that the visual screening and removing of later staff are facilitated.
3. According to the invention, two braid pressing plates which alternately slide in a reciprocating manner are arranged on the top surface of the test bench, and each braid pressing plate is of a thin plate structure with a middle plane and two arc-shaped sides which are outwards bent; through the reciprocal alternating pressing of two braid clamp plates on testboard surface, utilize the arc bending on braid clamp plate surface to fold the direction and make the braid take in according to S-shaped range upon range of, increase braid take in the performance when reducing braid point area, simultaneously through accomodating braid according to S-shaped range upon range of and reduce braid point area, cooperate the red oil ink of smearing on the emitting diode surface to pass through the emitting diode after bending and upwards demonstrate, can be convenient for later stage personnel adopt the vision to screen out non-luminous emitting diode fast to effectively improve rejection efficiency.
Drawings
The invention will be further described with reference to the drawings and examples.
FIG. 1 is a flow chart of the steps of the diode testing process of the present invention;
FIG. 2 is a schematic top view of a light emitting diode production test device according to the present invention;
FIG. 3 is a schematic diagram of a front view of a light emitting diode production test device according to the present invention;
FIG. 4 is a schematic illustration of the intermittent engagement of the thumb wheel with the sheave of the present invention;
FIG. 5 is an enlarged view of a portion of the invention at A of FIG. 3;
FIG. 6 is an enlarged view of a portion of the invention at B of FIG. 2;
FIG. 7 is a schematic diagram of a left-hand junction of a transfer assembly holding LEDs according to the present invention;
FIG. 8 is a schematic diagram of a left-hand configuration of a test plate according to the present invention;
In the figure: a vibration disk 1, a linear feed table 2, a diode feed tank 201, a movable shutter 202, a spring 203, a hinge support 204, a transfer assembly 3, a clamping frame 301, a clamping claw 302, a movable nut sleeve 303, a bidirectional screw rod 304, a second servo motor 305, a second slide 306, a guide slide rail 307, a second guide slide groove 308, a linear slide hole 309, a transfer table 310, a tension pulley 4, a test table 5, a side guard 6, a rear guard 7, a control table 8, a linear guide groove 9, a braid press plate 10, a fixed ear plate 1001, a tension spring 1002, a support leg 1003, a slide 1004, a pull rope 1005, a first servo motor 1006, a spool 1007, a braid 11, a power wheel 12, a motor 1201, a dial wheel 1202, a sheave 1203, a test plate 13, a bending groove 1301, a fixed slide 1302, a movable slide 1303, a linear guide slide groove 1034, a first pneumatic cylinder 1305, a first cylinder bracket 1306, a bending conductive push block 1307, a second cylinder bracket bearing 1405, a second pneumatic cylinder 1309, a dial top block 1310, a red oil sponge 1311, a movable push block 1312, a top 3, a press block 1314, a press plate 1308, a linear guide pin joint 1308, a linear feed screw rod 1403, a bidirectional screw rod joint 1308, a three-shaped servo screw rod 13116, a rotating shaft, a three-way screw rod joint 1404, a screw rod joint 1404.
Detailed Description
In order to make the technical means, the creation features, the achievement of the purpose and the effect of the present application easy to understand, the present application will be further described with reference to the specific drawings, and it should be noted that the embodiments of the present application and the features of the embodiments may be combined without conflict.
Example 1
Please refer to fig. 1, which is a schematic diagram of an overall structure of a diode testing process;
A diode test process mainly comprises the following steps:
s1, sorting the light emitting diodes: placing a plurality of light emitting diodes to be tested in a vibration disc, sorting the light emitting diodes to be tested through the work of the vibration disc to enable the light emitting diodes to be tested to be placed uniformly, and continuously feeding the light emitting diodes to the left end of the linear feeding table 2;
S2, transferring, picking and intermittent feeding: the left end of the linear feeding table 2 is used for reciprocally picking up the light emitting diode through the transfer component 3 and conveying the light emitting diode to the surface of the test table 5, the transfer component 3 picks up a single light emitting diode every reciprocal stroke, the picked single light emitting diode needs to be intermittently stopped once through the transfer table 310, continuous transfer is converted into intermittent transfer, and the intermittent transfer single light emitting diode is consistent with the intermittent movement rule of the intermittent moving braiding belt 11;
S3, intermittently conveying two layers of braiding belts 11: the surfaces of the two layers of knitting belts 11 are pressed and adhered by two intermittently rotating power wheels 12, and the surfaces of the power wheels 12 are intermittently rotated to push the knitting belts 11 to intermittently convey by using the friction force of the surfaces of the power wheels 12 and the surfaces of the knitting belts 11;
s4, inserting a light emitting diode into the braid 11: intermittently conveying the two layers of woven belts 11 intermittently moving on the top surface of the test bench 5 in the step S3, respectively carrying out intermittent straightening conveying through two groups of feeding pulleys 1601 on the right side of c, continuously picking up and horizontally transferring the initial angular positions contacted by the two groups of feeding pulleys 1601 placed on the light emitting diodes in the step S2 through the transfer assembly 3 by the light emitting diodes intermittently staying in the transfer bench 310, embedding the pins at the bottoms of the light emitting diodes in the middle of the two layers of woven belts 11, continuously moving leftwards through the two layers of woven belts 11, and pasting the pins at the bottoms of the light emitting diodes by pasting the two layers of woven belts 11;
S5, compressing pins: the two layers of braiding bands 11 adhered with the pins at the bottom of the light emitting diode in the step S4 are rapidly clamped and rapidly released from the middle through the two side pressing plates 14, and the air bags 1406 on the surfaces of the pressing plates 14 are adhered to the surfaces of the braiding bands 11 and apply pressing force to the middle parts of the two layers of braiding bands 11, so that the pins at the bottom of the light emitting diode are firmly inserted into the middle of the two layers of braiding bands 11.
S6, luminescence test: carrying out luminescence test on the light emitting diode compressed in the middle of the two layers of braiding belts 11 in the step S5, moving the light emitting diode inserted in the middle of the two layers of braiding belts 11 to the surface of the test board 13 for pause, rapidly moving and pressing the light emitting diode to the surface of the test board 13 through the movable push block 1322 at the front side of the test board 13, contacting the pin of the light emitting diode through the bending conductive push block 1307 on the movable push block 1322, transmitting the battery on the surface of the bending conductive push block 1307 to the light emitting diode through the pin, wherein the light emitting diode normally emits light, when the light emitting diode does not emit light, extending the bending top block 1310 backwards, pushing the light emitting diode and the pin, and smearing red oil ink on the surface of the bending top block 1310 on the surface of the non-bright light emitting diode;
S7, folding and accommodating the LED braid 11: folding, compressing and storing the light emitting diode tested in the step S6, and alternately pressing the two braid pressing plates 10 on the surface of the test bench 5 in a reciprocating manner, and folding and guiding the braid 11 according to S-shaped lamination by utilizing the arc bending of the surface of the braid pressing plates 10;
S8, manually removing defective products: the folded and compacted braiding belt 11 in the step S7 is visually removed from the unlit light-emitting diode, red oil ink is smeared on the surface of the light-emitting diode in the step S6, so that the unlit light-emitting diode is manually removed from the artificial vision, and the normally-lighted diode is manually inserted into the original unlit light-emitting diode in the middle of the braiding belt 11 to finish replacement;
according to the invention, the light emitting diode inserted in the middle of the two layers of woven belts 11 moves to the surface of the test board 13 for pause, the movable push block 1322 at the front side of the test board 13 moves and presses the surface of the test board 13, the two layers of woven belts 11 at the position to be tested are firstly pressed by the pressing block 1314 on the movable push block 1322, the bending conductive push block 1307 continues to stretch backwards through the compression of the top spring 1313, the bending conductive push block 1307 is contacted with the pins of the light emitting diode, the battery at the surface of the bending conductive push block 1307 is transmitted to the light emitting diode through the pins, the light emitting diode emits light normally at the moment, the pins are pushed into the bending groove 1301 directly by the bending conductive push block 1307 stretching backwards, and the pins are bent along the outline of the inner wall of the bending groove 1301. And the bending conductive push block 1307 is contacted with the pin and performs test luminescence, and meanwhile, the bending of the pin can enlarge the contact area of the pin and the bending conductive push block 1307, so that the contact pressure of the pin and the surface of the bending conductive push block 1307 is increased, the test accuracy of the light-emitting diode is improved, and errors or errors of a test structure caused by poor contact are prevented.
When the light emitting diode does not emit light, the poking and bending top block 1310 is extended backwards and pushes and bends the light emitting diode, a bending structure is generated between the light emitting diode and the pins in the pushing and bending process of the light emitting diode, red oil ink on the surface of the poking and bending top block 1310 is smeared on the surface of the non-bright light emitting diode and bends the light emitting diode, and the red oil ink smeared on the surface of the light emitting diode is displayed upwards through the bent light emitting diode, so that the visual screening and the rejection of later staff are facilitated.
The invention is characterized in that the top surface of the test bench 5 is provided with two braid pressing plates 10 which alternately slide back and forth, and each braid pressing plate 10 is of a thin plate structure with a middle plane and two arc-shaped sides which are outwards bent; through the reciprocal alternating pressing of two braid clamp plates 10 on test bench 5 surface, utilize the arc bending on braid clamp plate 10 surface to fold the direction and make braid 11 accomodate according to S-shaped range upon range of, increase braid 11 and accomodate the performance when reducing braid 11 point area, simultaneously through accomodating braid 11 according to S-shaped range upon range of and reduce braid 11 point area, the red oil ink of cooperation coating on the emitting diode surface upwards demonstrates through the emitting diode after bending, can be convenient for later stage personnel adopt the visual quick screening to find the emitting diode that does not give out light, thereby effectively improve rejection efficiency.
Example 2
Referring to fig. 2 to 8, this embodiment has the same points as the above-described embodiment 1, and the same points are not explained in this embodiment, but the specific differences are that:
The steps S1-S8 also comprise a test bench 5 fixed on the ground and a vibration disk 1 arranged on the right side of the test bench 5, wherein a side guard 6 is fixed on the top end of the test bench 5 near the left side of the test bench 5, a rear guard 7 is fixed on the top end of the test bench 5 near the rear side of the test bench 5, a control bench 8 is arranged on the rear side of the test bench 5, supporting legs 1003 are arranged at the bottom of the test bench 5,
The right side of the test table 5 is provided with a vibration disc 1, the vibration disc 1 extends out to form a linear feeding table 2, and the left end of the linear feeding table 2 and the right side of the test table 5 are provided with a transfer assembly 3;
A feeding belt wheel 1601 is arranged at the top end of the test board 5 near the right side of the test board 5, two groups of feeding belt wheels 1601 are arranged in total, a braiding belt 11 is conveyed on each group of feeding belt wheels 1601, the other end of the braiding belt 11 of each group of feeding belt wheels 1601 is wound on a respective braiding belt rotating shaft 16, and each braiding belt rotating shaft 16 is rotationally connected to the top end of the test board 5;
The left side of feed pulley 1601 is provided with two pressure plates 14, and two pressure plates 14 left side is provided with test assembly, and the test assembly left side is provided with two power wheels 12 of intermittent type rotation, and braid 11 passes in proper order from the centre of two pressure plates 14, test assembly and two power wheels 12 centre.
The linear feeding table 2 comprises a diode feeding groove 201 arranged at the top end of the linear feeding table 2, two inclined movable baffles 202 are rotatably connected to the left side of the diode feeding groove 201 of the linear feeding table 2, each movable baffle 202 on each side is rotatably connected to the inner wall of the diode feeding groove 201 of the linear feeding table 2 through a hinged support 204, a spring 203 is fixed between the middle part of each movable baffle 202 on each side and the inner wall of the diode feeding groove 201, and through the blocking of the movable baffles 202, the transfer assembly 3 can block the light emitting diode in the diode feeding groove 201 when the light emitting diode is not picked up, so that the light emitting diode is prevented from falling, and meanwhile, the diode feeding groove 201 of the linear feeding table 2 can be automatically opened when the transfer assembly 3 picks up the light emitting diode and can be automatically turned off when the light emitting diode moves out of the diode feeding groove 201 horizontally.
The transfer assembly 3 comprises a transfer table 310 arranged at the right side of the test table 5 and the middle position of the left side of the linear feeding table 2, wherein the front side wall of the transfer table 310 is provided with a permanent magnet, and pins of the light emitting diode can be adsorbed through the permanent magnet in the transfer process, so that the light emitting diode is firmly placed on the surface of the transfer table 310, and the light emitting diode can be conveniently and quickly released through the permanent magnet.
The transfer assembly 3 further comprises a guide slide rail 307 fixed on the right side of the test bench 5, second guide sliding grooves 308 are formed in the front side and the rear side of the top end of the guide slide rail 307, the top end of the guide slide rail 307 is slidably connected with a second sliding block 306, the second sliding block 306 is clamped in the second guide sliding groove 308 of the guide slide rail 307, two clamping racks 301 are fixed at the top end of the second sliding block 306, a linear sliding hole 1402 is formed in the top end of each clamping rack 301, two movable nut sleeves 303 are slidably connected to the inner wall of the linear sliding hole 1402, a second servo motor 305 is fixed on the outer wall of one side of the clamping rack 301, a two-way threaded screw rod 304 extends out of the linear sliding hole 1402 of the clamping rack 301 from the second servo motor 305, two movable nut sleeves 303 in reverse threaded connection are slidably connected to the surface of the two movable nut sleeves 303, and clamping claws 302 are arranged at the bottom of each movable nut sleeve 303;
The clamping claw 302 is provided with an arc outline surface which is attached to the light emitting diode on the surface attached to the light emitting diode, so that the clamping is automatic, the clamping firmness is improved, and the surface of the light emitting diode is not damaged in the clamping process.
The second slide block 306 is slidably connected to the guide slide rail 307 to realize reciprocating horizontal sliding, the second slide block 306 is slidably connected to the guide slide rail 307 by an independent pneumatic cylinder or a threaded screw rod matched with the driving of a servo motor, the two clamping racks 301 arranged on the guide slide rail 307 respectively and synchronously pick up and synchronously transfer the light emitting diode in the diode feed tank 201 of the linear feed table 2 and the light emitting diode placed on the transfer table 310, the light emitting diode picked up from the diode feed tank 201 of the linear feed table 2 moves to the transfer table 310, and simultaneously transfers the light emitting diode from the transfer table 310
The led picked up above will move to the initial angular position where the two sets of feeding pulleys 1601 contact on the top surface of the test bench 5, so that the pins at the bottom of the led are embedded in the middle of the two layers of braid 11, and the led is inserted in the middle of the two layers of braid 11 by the two layers of braid 11 moving leftwards, wherein the bonding of the two layers of braid 11 is that glue is smeared on the bonding surface of each layer of braid 11, the glue is already wound on the surface of the braid 11 before the braid 11 comes out, and the braid 11 is similar to a sticky tape.
The power wheels 12 comprise motors 1201 fixed at the bottom ends of the test tables 5, the motors 1201 extend upwards to form poking wheels 1202, grooved wheels 1203 are arranged at the bottoms of one power wheel 12, the poking wheels 1202 are in intermittent meshing connection with the grooved wheels 1203, a gear is arranged at the bottoms of the two power wheels 12 respectively, and the bottoms of the two power wheels 12 synchronously rotate through gear meshing.
The test assembly comprises a test board 13 fixed at the top end of a test board 5, a bending groove 1301 is formed in the front side wall of the test board 13, a fixed slider 1302 is fixedly arranged on the front side of the test board 13, a linear guide chute 1034 is formed in the top surface of the fixed slider 1302, a movable slider 1303 is slidably connected to the top end of the fixed slider 1302, a first cylinder bracket 1306 is fixedly arranged at the top end of the fixed slider 1302, a piston rod extends out of the first cylinder bracket 1305 leftwards, the top end of the piston rod of the first cylinder 1305 is fixed on the movable slider 1303, two bending conductive push blocks 1307 are fixed on the rear side of the movable slider 1303, each bending conductive push block 1307 is a metal block, and one bending conductive push block 1307 has current on the surface.
According to the invention, the light emitting diode inserted in the middle of the two layers of woven belts 11 moves to the surface of the test board 13 for pause, the movable push block 1322 at the front side of the test board 13 moves and presses the surface of the test board 13, the two layers of woven belts 11 at the position to be tested are firstly pressed by the pressing block 1314 on the movable push block 1322, the bending conductive push block 1307 continues to stretch backwards through the compression of the top spring 1313, the bending conductive push block 1307 is contacted with the pins of the light emitting diode, the battery at the surface of the bending conductive push block 1307 is transmitted to the light emitting diode through the pins, the light emitting diode emits light normally at the moment, the pins are pushed into the bending groove 1301 directly by the bending conductive push block 1307 stretching backwards, and the pins are bent along the outline of the inner wall of the bending groove 1301. And the bending conductive push block 1307 is contacted with the pin and performs test luminescence, and meanwhile, the bending of the pin can enlarge the contact area of the pin and the bending conductive push block 1307, so that the contact pressure of the pin and the surface of the bending conductive push block 1307 is increased, the test accuracy of the light-emitting diode is improved, and errors or errors of a test structure caused by poor contact are prevented.
The rear side of the movable sliding block 1303 is fixed with a movable push block 1322 standing on the top surface of the test bench 5, the rear side of the movable push block 1322 is fixed with a top spring 1313, and the surface of the top spring 1313 at the rear side of the movable push block 1322 is fixed with a compression block 1314.
The top of the movable sliding block 1303 is fixed with a second supporting cylinder bracket 1308 which is erected on the top of the movable sliding block 1303, the front side of the second supporting cylinder bracket 1308 is fixed with a second pneumatic cylinder 1309, the rear end face of the second pneumatic cylinder 1309 is provided with a piston rod, and the top end of the piston rod of the second pneumatic cylinder 1309 is fixed with a poking bending top block 1310.
When the light emitting diode does not emit light, the poking and bending top block 1310 is extended backwards and pushes and bends the light emitting diode, a bending structure is generated between the light emitting diode and the pins in the pushing and bending process of the light emitting diode, red oil ink on the surface of the poking and bending top block 1310 is smeared on the surface of the non-bright light emitting diode and bends the light emitting diode, and the red oil ink smeared on the surface of the light emitting diode is displayed upwards through the bent light emitting diode, so that the visual screening and the rejection of later staff are facilitated.
The invention is characterized in that the top surface of the test bench 5 is provided with two braid pressing plates 10 which alternately slide back and forth, and each braid pressing plate 10 is of a thin plate structure with a middle plane and two arc-shaped sides which are outwards bent; through the reciprocal alternating pressing of two braid clamp plates 10 on test bench 5 surface, utilize the arc bending on braid clamp plate 10 surface to fold the direction and make braid 11 accomodate according to S-shaped range upon range of, increase braid 11 and accomodate the performance when reducing braid 11 point area, simultaneously through accomodating braid 11 according to S-shaped range upon range of and reduce braid 11 point area, the red oil ink of cooperation coating on the emitting diode surface upwards demonstrates through the emitting diode after bending, can be convenient for later stage personnel adopt the visual quick screening to find the emitting diode that does not give out light, thereby effectively improve rejection efficiency.
A red oil sponge 1311 is fixed to the rear sidewall of the toggle top block 1310. An oil filling port is arranged at the top end of the bending top block 1310, a rubber plug is arranged for sealing, an oil cavity communicated with the oil filling port is arranged in the bending top block 1310, red oil ink is stored in the oil cavity, an oil discharging small hole communicated with the oil cavity is arranged on the rear side wall of the bending top block 1310, a red oil sponge 1311 is arranged on the rear side wall of the bending top block 1310 and used for blocking and absorbing the red oil ink discharged by the oil discharging small hole, the red oil sponge 1311 can be used for uniformly smearing the red oil ink and the rear side wall of the bending top block 1310 can be always adsorbed by the red oil sponge 1311 so as to facilitate quick smearing,
According to the invention, the light emitting diode inserted in the middle of the two layers of woven belts 11 moves to the surface of the test board 13 for pause, the movable push block 1322 at the front side of the test board 13 moves rapidly to press the surface of the test board 13, the two layers of woven belts 11 at the position to be tested are firstly pressed by the pressing block 1314 on the movable push block 1322, the bent conductive push block 1307 continues to stretch backwards through the compression of the top spring 1313, the bent conductive push block 1307 is contacted with the pins of the light emitting diode, the battery on the surface of the bent conductive push block 1307 is transmitted to the light emitting diode through the pins, the light emitting diode emits light normally at the moment, and current passes between the two bent conductive push blocks 1307 according to common knowledge in the prior art, so that the test result can be determined, when no current passes between the two bent conductive push blocks 1307, the surface light emitting diode is damaged, and the second pneumatic cylinder 1309 works at the moment.
Two linear guide grooves 9 are formed in the left half area of the top surface of the test bench 5, the two linear guide grooves 9 are respectively arranged on the front side and the rear side close to the top surface of the test bench 5, each linear guide groove 9 is connected with a braiding pressing plate 10 in a sliding mode, and each braiding pressing plate 10 is of a thin plate structure with a middle plane and two arc-shaped sides bent outwards;
The bottom of test bench 5 is fixed with fixed otic placode 1001, and fixed otic placode 1001's fixed surface is fixed with extension spring 1002, and the bottom of every braid clamp plate 10 passes straight line guide slot 9 and is provided with slider 1004 in the bottom of test bench 5, and slider 1004 surface is provided with stay cord 1005 hasp, and the stay cord 1005 hasp bolt of slider 1004 has stay cord 1005, and the other end of stay cord 1005 winds in the wire reel 1007 surface, and wire reel 1007 is provided with servo motor one 1006 drive rotation, and servo motor one 1006 is fixed in test bench 5 bottom.
The invention is characterized in that the top surface of the test bench 5 is provided with two braid pressing plates 10 which alternately slide back and forth, and each braid pressing plate 10 is of a thin plate structure with a middle plane and two arc-shaped sides which are outwards bent; through the reciprocal alternating pressing of two braid clamp plates 10 on test bench 5 surface, utilize the arc bending on braid clamp plate 10 surface to fold the direction and make braid 11 accomodate according to S-shaped range upon range of, increase braid 11 and accomodate the performance when reducing braid 11 point area, simultaneously through accomodating braid 11 according to S-shaped range upon range of and reduce braid 11 point area, the red oil ink of cooperation coating on the emitting diode surface upwards demonstrates through the emitting diode after bending, can be convenient for later stage personnel adopt the visual quick screening to find the emitting diode that does not give out light, thereby effectively improve rejection efficiency.
The compressing plate 14 comprises two linear slide holes 1402 symmetrically arranged on the test bench 5, the compressing plate 14 is provided with two movable slide bars 1403 in the linear slide holes 1402, the surface of each movable slide bar 1403 is provided with an air bag 1406, the top end of each compressing plate 14 is provided with a connecting air nozzle 1401, the connecting air nozzle 1401 is communicated with an external air source to form the air bag 1406 and control the air pressure in the air bag 1406, or the connecting air nozzle 1401 is sealed to keep the air pressure in the air bag 1406 in a stable state. The servo motor III 1404 drives the two-way threaded screw rod II 1405 to rotate, drives the two pressing plates 14 in the two linear sliding holes 1402 to slide reciprocally and rapidly and clamp the middle, the woven belt 11 with pins is clamped and contacted by the air bags 1406 on the surfaces of the pressing plates 14, and the pins in the woven belt 11 are clamped firmly by the flexible contact of the air bags 1406, so that the frequency of the reciprocal and rapid sliding of the two pressing plates 14 is matched with the frequency of the intermittent movement of the woven belt 11.
The foregoing has shown and described the basic principles, principal features and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the foregoing embodiments, and that the foregoing embodiments and description are merely illustrative of the principles of this invention, and various changes and modifications may be made without departing from the spirit and scope of the invention, and these changes and modifications fall within the scope of the invention as hereinafter claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (6)
1. The diode test process is characterized by comprising the following steps of:
S1, sorting the light emitting diodes: placing a plurality of light emitting diodes to be tested in a vibration disc, sorting the light emitting diodes to be tested through the work of the vibration disc to enable the light emitting diodes to be tested to be placed uniformly, and continuously feeding the light emitting diodes to the left end of a linear feeding table;
S2, transferring, picking and intermittent feeding: the left end of the linear feeding table is used for reciprocally picking up the light-emitting diode through the transfer component and conveying the light-emitting diode to the surface of the test table, and the transfer component picks up a single light-emitting diode every time in a reciprocal stroke, so that the picked single light-emitting diode needs to intermittently stay once through the transfer table;
S3, intermittently conveying two layers of braiding belts: the surfaces of the two layers of braiding belts are pressed and attached through two intermittently rotating power wheels, the power wheels intermittently rotate, and the friction force of the surfaces of the power wheels and the surfaces of the braiding belts is utilized to push the braiding belts to intermittently convey;
S4, inserting a light emitting diode into the braid belt: intermittently conveying the two layers of braiding belts intermittently conveyed and moved on the top surface of the test bench in the step S3 through two groups of feeding pulleys on the right side of c respectively, continuously picking up and horizontally transferring the initial angular positions contacted by the two groups of feeding pulleys placed on the intermediate rotary bench through the intermediate rotary assembly by the light emitting diode intermittently stopped in the step S2, enabling pins at the bottom of the light emitting diode to be embedded in the middle of the two layers of braiding belts, continuously moving leftwards through the two layers of braiding belts, and adhering the pins at the bottom of the light emitting diode by adhering the two layers of braiding belts;
S5, compressing pins: the two layers of braiding belts adhered with the pins at the bottom of the light-emitting diode in the step S4 are rapidly clamped and rapidly released from the middle through the two side compacting plates, and the air bags on the surfaces of the compacting plates are adhered to the surfaces of the braiding belts and apply compacting force to the middle parts of the two layers of braiding belts, so that the pins at the bottom of the light-emitting diode are firmly inserted in the middle of the two layers of braiding belts;
S6, luminescence test: carrying out luminescence test on the light emitting diode compressed in the middle of the two layers of braiding belts in the step S5, moving the light emitting diode inserted in the middle of the two layers of braiding belts to the surface of a test board for pause and intermittence, rapidly moving and pressing the light emitting diode to the surface of the test board through a movable push block at the front side of the test board, contacting a bending conductive push block on the movable push block with pins of the light emitting diode, transmitting a battery on the surface of the bending conductive push block to the light emitting diode through the pins, wherein the light emitting diode normally emits light, and when the light emitting diode does not emit light, the poking top block stretches out backwards and pushes and bends the light emitting diode and the pins, and red oil ink on the surface of the poking top block is smeared on the surface of the unlit light emitting diode;
The diode test process further includes: s7, folding and accommodating the LED braid belts: folding, compressing and storing the light-emitting diode tested in the step S6, and alternately pressing the two braid pressing plates on the surface of the test bench in a reciprocating manner, and folding and guiding the braid by utilizing the arc bending of the surface of the braid pressing plates to store the braid according to S-shaped lamination;
S8, manually removing defective products: and (3) visually eliminating the unlit light-emitting diode from the folded and compacted braid in the step S7, manually visually eliminating the unlit light-emitting diode by smearing red oil ink on the surface of the light-emitting diode in the step S6, and manually inserting the normally-luminous diode in the original unlit light-emitting diode position in the middle of the braid to finish replacement.
2. A diode testing process according to claim 1, wherein: the test bench is characterized by further comprising a test bench fixed on the ground and a vibration disk arranged on the right side of the test bench, wherein a side guard plate is fixed on the top end of the test bench close to the left side of the test bench, a rear guard plate is fixed on the top end of the test bench close to the rear side of the test bench, and a control console is arranged on the rear side of the test bench.
3. A diode testing process according to claim 1, wherein: the right side of testboard is provided with the vibrations dish, the vibrations dish outwards stretches out there is sharp feed platform, sharp feed platform left end and testboard right side are provided with the transfer subassembly.
4. A diode testing process according to claim 1, wherein: the feeding belt wheels are arranged at the top end of the test board near the right side of the test board, two groups of feeding belt wheels are arranged in total, braiding belts are conveyed on the feeding belt wheels in each group, the other ends of the braiding belts of the feeding belt wheels are wound on respective braiding belt rotating shafts, and each braiding belt rotating shaft is rotationally connected to the top end of the test board.
5. A diode testing process according to claim 4, wherein: the left side of feed band pulley is provided with two pressure plates, two the pressure plate left side is provided with test assembly, the test assembly left side is provided with two power wheels of intermittent type pivoted, and the braid is followed two in proper order the centre of pressure plate, test assembly and two the power wheel is middle to pass.
6. A diode testing process according to claim 5, wherein: the linear feeding table comprises a diode feeding groove arranged at the top end of the linear feeding table, two inclined movable baffles are rotatably connected to the left side of the diode feeding groove of the linear feeding table, each movable baffle is rotatably connected to the inner wall of the diode feeding groove of the linear feeding table through a hinged support, and a spring is fixed between the middle of each movable baffle and the inner wall of the diode feeding groove.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1821729A (en) * | 2005-02-17 | 2006-08-23 | 韩金龙 | Automation device for LED test table |
| CN111129045A (en) * | 2018-10-31 | 2020-05-08 | 乐金显示有限公司 | Digital X-ray detector and thin film transistor array substrate therefor |
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| KR101831610B1 (en) * | 2016-02-22 | 2018-04-04 | 한밭대학교 산학협력단 | Lifetime measurement system for flexible organic light emitting diodes |
| KR101801385B1 (en) * | 2017-04-13 | 2017-11-24 | 한국생산기술연구원 | Reliability measuring apparatus for light emitting diode using thermic reaction material and reliability measuring method for light emitting diode |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1821729A (en) * | 2005-02-17 | 2006-08-23 | 韩金龙 | Automation device for LED test table |
| CN111129045A (en) * | 2018-10-31 | 2020-05-08 | 乐金显示有限公司 | Digital X-ray detector and thin film transistor array substrate therefor |
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