CN117263081B - Lifting loading and unloading device for semiconductor device testing device - Google Patents
Lifting loading and unloading device for semiconductor device testing device Download PDFInfo
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- CN117263081B CN117263081B CN202311293390.1A CN202311293390A CN117263081B CN 117263081 B CN117263081 B CN 117263081B CN 202311293390 A CN202311293390 A CN 202311293390A CN 117263081 B CN117263081 B CN 117263081B
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- 238000012360 testing method Methods 0.000 title claims abstract description 109
- 239000004065 semiconductor Substances 0.000 title claims abstract description 61
- 230000003014 reinforcing effect Effects 0.000 claims description 16
- 238000007599 discharging Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 19
- 230000008569 process Effects 0.000 description 17
- 230000008901 benefit Effects 0.000 description 14
- 238000013461 design Methods 0.000 description 13
- 238000012423 maintenance Methods 0.000 description 11
- 230000006872 improvement Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 238000005299 abrasion Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000002708 enhancing effect Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000008520 organization Effects 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 239000002783 friction material Substances 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 230000001050 lubricating effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
Abstract
The invention discloses a lifting loading and unloading device for a semiconductor device testing device, which relates to the technical field of auxiliary equipment for testing semiconductor devices. The automatic feeding and discharging device has the function of automatic feeding and discharging, so that the overall efficiency is improved.
Description
Technical Field
The invention relates to the technical field of auxiliary equipment for testing semiconductor devices, in particular to a lifting loading and unloading device for a semiconductor device testing device.
Background
The semiconductor device testing device is used for testing the semiconductor device after the chip packaging is completed, the semiconductor device is loaded on a corresponding testing seat of the testing circuit board in the testing process, the testing circuit board is electrically connected with the testing system, and the testing system is used for testing the semiconductor device.
When the testing device is used for testing the semiconductor device, the semiconductor device in the testing seat is generally placed into the testing device manually, and then taken out manually after the testing is finished, so that the manual taking-up and taking-down are laborious, the overall efficiency is low, and the lifting feeding and discharging device for the semiconductor device testing device is provided, so that the technical problem is solved.
Disclosure of Invention
The lifting loading and unloading device for the semiconductor device testing device has the function of automatic loading and unloading, so that the overall efficiency is improved.
The application provides a lifting loading and unloading device for a semiconductor device testing device, which adopts the following technical scheme:
The lifting loading and unloading device for the semiconductor device testing device comprises a mounting frame arranged on the testing device, wherein a plurality of sections of cylinders are arranged on the mounting frame, a plurality of output shafts are arranged in the plurality of sections of cylinders, a mounting plate is arranged on the output shafts, a placing plate for placing the semiconductor device is arranged on the mounting plate, and the placing plate is lifted and arranged at an inlet of the testing device.
By adopting the technical scheme, the lifting loading and unloading device can realize automatic loading and unloading of the semiconductor devices, reduces manual operation, improves production efficiency, can simultaneously load and unload a plurality of semiconductor devices through the design of the multi-section cylinder and the output shaft, improves test efficiency, adopts the shelving plate to place and lift the devices, can protect the devices from damage or pollution, and can be arranged on the mounting frame, occupies smaller space and is suitable for being used in limited working environments; in a word, the lifting loading and unloading device has the function of automatic loading and unloading, so that the overall efficiency is improved.
Preferably, the mounting frame comprises a plurality of lateral upright posts, the lateral upright posts are arranged on the outer wall of the testing device and positioned on two sides of the inlet of the testing device, the top of each lateral upright post is provided with a fixed cross beam, and the fixed cross beams are fixedly connected with the multi-section air cylinders.
Through adopting above-mentioned technical scheme, through setting up side direction stand and fixed cross beam on the mounting bracket, can provide structural stability, support multisection cylinder, the benefit such as convenient maintenance and adjustment and improvement security.
Preferably, the lateral upright post is provided with a guide sliding rail, a pulley is arranged between the guide sliding rail and the mounting plate, the pulley is arranged on the mounting plate, and the mounting plate is movably arranged in the guide sliding rail through the pulley.
By adopting the technical scheme, the stability of the device can be improved, the friction force is reduced, the loading and unloading are convenient, the space is saved, and the maintenance and adjustment are convenient by arranging the guide sliding rail and the pulley on the lateral upright post; these benefits help to improve the efficiency and ease of operation of the test device.
Preferably, the mounting plate is provided with a plurality of sleeve shafts which are sleeved with each other, each sleeve shaft stretches out and draws back relative to the adjacent sleeve shaft, the sleeve shafts and the mounting plate are arranged in a one-to-one correspondence manner, the sleeve shafts penetrate through and are fixed in the mounting plate, and the mounting plate is close to the end part position of the sleeve shaft.
By adopting the technical scheme, the fixing and penetrating arrangement of the sleeve shaft can ensure that the mounting plate can realize accurate positioning on the sleeve shaft; this helps to maintain stability and accuracy of the test object, avoiding test errors caused by positional shifts or sloshing.
Preferably, the placing plate is provided with a plurality of positioning strips, adjacent positioning strips are parallel to each other, and a placing area for placing the semiconductor device is formed between the adjacent positioning strips and the placing plate.
By adopting the technical scheme, the placing plate is provided with the positioning strips and forms the placing area, so that the advantages of positioning and aligning, preventing the sliding of the semiconductor device, improving the working efficiency, facilitating management and organization, protecting the semiconductor device and the like can be realized; these advantages help to improve the efficiency, reliability and ease of operation of the test device.
Preferably, a slide plate is arranged in the placement area on the placement plate, a test seat for stacking the semiconductor devices is arranged on the slide plate, and a first driving assembly for driving the slide plate is arranged on the placement plate.
Through adopting above-mentioned technical scheme, be equipped with slide and test seat on the shelving board to realize the drive of slide through first drive assembly, can realize automatic and efficient unloading process, improve testing arrangement's efficiency, reliability and operational environment's security.
Preferably, the first driving assembly comprises a first driving motor arranged on the shelving plate and a fixed block arranged at the bottom of the sliding plate, a sliding rod and a screw rod are arranged in the fixed block, and the output end of the first driving motor is connected with the screw rod.
Through adopting above-mentioned technical scheme, first drive assembly includes first driving motor, fixed block, slide bar and lead screw part, and these advantages help improving testing arrangement's efficiency, reliability and maintenance's convenience.
Preferably, a plurality of through holes are formed in the shelving board.
By adopting the technical scheme, the heat dissipation performance can be improved, the weight can be reduced, the wiring and layout can be optimized, the structural stability can be enhanced, and the installation and the maintenance can be facilitated by arranging the plurality of through holes in the shelving plate; these advantages help to improve the performance, reliability and operability of the device.
Preferably, the positioning strip is provided with a guide rail, a sliding piece is arranged between the guide rail and the sliding plate, and the sliding plate is arranged on the guide rail in a sliding way through the sliding piece.
By adopting the technical scheme, the guide rail is arranged on the positioning strip, and the sliding piece is arranged between the guide rail and the sliding plate, so that accurate positioning, friction reduction, stability improvement and durability improvement can be realized; these advantages help to improve the accuracy, reliability and maintainability of the skateboard, enhancing the performance and use experience of the device.
Preferably, the test seat is provided with a reinforcing cross rod, one side of the shelving plate is provided with a fixing plate, the fixing plate is provided with a mounting cross beam, and the mounting cross beam is provided with a locking piece for locking the reinforcing cross rod on the test seat.
Through adopting above-mentioned technical scheme, through the locking piece that sets up, the reinforcement horizontal pole on the locking test seat to be convenient for lock the test seat on shelving the board, be used for guaranteeing the stability of test seat in the lift in-process.
In summary, the application has the following beneficial effects:
1. The lifting loading and unloading device can realize automatic loading and unloading of the semiconductor devices, reduces manual operation, improves production efficiency, can simultaneously load and unload a plurality of semiconductor devices through the design of the multi-section cylinder and the output shaft, improves test efficiency, adopts a shelving plate to place and lift the devices, can protect the devices from damage or pollution, and can be arranged on a mounting frame to occupy smaller space, thereby being suitable for being used in limited working environments; in a word, the lifting loading and unloading device has the function of automatic loading and unloading, so that the overall efficiency is improved.
Drawings
Fig. 1 is a schematic diagram of the overall structure of a lifting loading and unloading device in this embodiment;
Fig. 2 is a schematic view of the overall structure of the present embodiment in a state in which the rest plate is raised;
FIG. 3 is a schematic view of the overall structure of the rest plate in this embodiment;
FIG. 4 is an exploded view of the structure between the rest plate and the test seat in this embodiment;
Reference numerals illustrate: 1. a testing device; 2. a mounting frame; 201. a lateral upright; 202. fixing the cross beam; 3. a multi-section cylinder; 4. an output shaft; 5. a mounting plate; 6. a rest plate; 7. a guide rail; 8. a pulley; 9. a sleeve shaft; 10. a positioning strip; 11. a slide plate; 12. a test seat; 13. a first drive assembly; 1301. a first driving motor; 1302. a fixed block; 1303. a slide bar; 1304. a screw rod; 14. a through hole; 15. reinforcing the cross bar; 16. a fixing plate; 17. mounting a cross beam; 18. a locking member;
Detailed Description
The present application will be described in further detail with reference to the accompanying drawings, wherein it is to be understood that the following detailed description is for the purpose of further illustrating the application only and is not to be construed as limiting the scope of the application, as various insubstantial modifications and adaptations of the application to those skilled in the art can be made in light of the foregoing disclosure.
The invention discloses a lifting loading and unloading device for a semiconductor device testing device 1, which is shown in fig. 1, and comprises a mounting frame 2 arranged on the testing device 1, wherein a plurality of sections of air cylinders 3 are arranged on the mounting frame 2, a plurality of output shafts 4 are arranged in the plurality of sections of air cylinders 3, a mounting plate 5 is arranged on the output shafts 4, a rest plate 6 for placing semiconductor devices is arranged on the mounting plate 5, and the rest plate 6 is lifted and arranged at an inlet of the testing device 1; the lifting loading and unloading device can realize automatic loading and unloading of semiconductor devices, reduces manual operation, improves production efficiency, can simultaneously load and unload a plurality of semiconductor devices through the design of the multi-section cylinder 3 and the output shaft 4, improves test efficiency, adopts the shelving plate 6 to place and lift the devices, can protect the devices from damage or pollution, and can be arranged on the mounting frame 2, occupies a small space and is suitable for being used in a limited working environment; in a word, the lifting loading and unloading device can improve the testing efficiency, reduce the risk of manual misoperation, protect devices and save space, and is an effective automatic device in the semiconductor device testing device 1.
As shown in fig. 2, the mounting frame 2 comprises a plurality of lateral upright posts 201, the lateral upright posts 201 are arranged on the outer wall of the testing device 1 and positioned at two sides of the inlet of the testing device 1, the top of each lateral upright post 201 is provided with a fixed cross beam 202, and the fixed cross beams 202 are fixedly connected with the multi-section cylinder 3; by arranging the lateral upright posts 201 and the fixed cross beams 202 on the outer wall of the testing device 1, the structural stability of the whole device can be increased, and shaking or deformation in the running process is avoided, so that the accuracy and stability of the test are ensured; the fixed cross beam 202 is fixedly connected with the multi-section cylinder 3, so that the multi-section cylinder 3 can be supported and stabilized, the normal operation of the multi-section cylinder 3 is ensured, and the test error caused by vibration or instability is reduced; The lateral upright posts 201 and the fixed cross beams 202 on the mounting frame 2 can provide a fixed supporting platform for the testing device 1, so that maintenance personnel can conveniently maintain and adjust the testing device 1; in addition, by arranging the lateral upright posts 201 and the fixed cross beams 202 on the two sides of the inlet of the testing device 1, the stability of the testing device 1 can be increased, accidents caused by instability can be reduced, and the safety of a workplace can be improved; in summary, by providing the lateral upright 201 and the fixed cross beam 202 on the mounting frame 2, the advantages of structural stability, supporting the multi-section cylinder 3, convenient maintenance and adjustment, and improving safety can be provided; The lateral upright 201 is provided with a guide slide rail 7, a pulley 8 is arranged between the guide slide rail 7 and the mounting plate 5, the pulley 8 is arranged on the mounting plate 5, and the mounting plate 5 is movably arranged in the guide slide rail 7 through the pulley 8; through the design of the guide slide rail 7 and the pulley 8, the mounting plate 5 can be ensured to be stable and stable in the moving process; this can avoid a test error caused by the shaking or instability of the mounting plate 5 during the test; the pulley 8 can reduce the friction force between the mounting plate 5 and the guide slide rail 7, so that the movement of the mounting plate 5 is smoother and lighter; this helps to improve the working efficiency of the test device 1; and the semiconductor device can be conveniently placed on the mounting plate 5 or unloaded from the mounting plate 5 through the movable design of the pulley 8; In addition, the guide slide rail 7 is arranged on the lateral upright 201, and the mounting plate 5 can be arranged in the guide slide rail 7, so that the space of the testing device 1 is saved; this is particularly important for limited work environments; in addition, the design of the pulley 8 and the guide slide rail 7 enables the mounting plate 5 to be conveniently maintained and adjusted; if the mounting plate 5 needs to be replaced or adjusted, the replacement can be realized through the movement of the pulley 8, so that the complexity of maintenance and adjustment is reduced; in a comprehensive way, the stability of the device can be improved, the friction force is reduced, the loading and unloading are convenient, the space is saved, and the maintenance and adjustment are convenient by arranging the guide sliding rail 7 and the pulley 8 on the lateral upright post 201; These benefits contribute to an increase in efficiency and ease of operation of the test device 1; the mounting plate 5 is provided with a plurality of sleeve shafts 9 which are sleeved with each other, each sleeve shaft 9 is arranged in a telescopic way relative to the adjacent sleeve shaft 9, the sleeve shafts 9 and the mounting plate 5 are arranged in a one-to-one correspondence, the sleeve shafts 9 penetrate through and are fixed in the mounting plate 5, and the mounting plate 5 is close to the end part position of the sleeve shaft 9; the fixing and penetrating arrangement of the sleeve shaft 9 can ensure that the mounting plate 5 can realize accurate positioning on the sleeve shaft 9; this helps to maintain stability and accuracy of the test object, avoiding test errors caused by positional shifts or sloshing.
As shown in fig. 3-4, the rest plate 6 is provided with a plurality of positioning strips 10, the adjacent positioning strips 10 are parallel to each other, and a placement area for placing the semiconductor device is formed between the adjacent positioning strips 10 and the rest plate 6; the placement of the alignment bars 10 ensures that the semiconductor device has an accurate position and alignment within the placement area; this helps to maintain stability and accuracy of the test object, avoiding test errors caused by positional deviation or shaking; and the design of the placement area can effectively prevent the semiconductor device from sliding or shifting; by the structures of the positioning strips 10 and the rest plates 6, the support and limitation of the semiconductor device during placement can be provided, and the stability of the semiconductor device is maintained; And the semiconductor device can be conveniently placed on the placing plate 6 by the design of the placing area; the positioning strips 10 can help operators to rapidly and accurately place the semiconductor devices, so that the working efficiency is improved, and in addition, the semiconductor devices can be orderly arranged and organized due to the design of the placement area; thus, the specific semiconductor device can be conveniently managed and searched, and the confusion and errors in the operation process are reduced; in addition, the structure of the placement region can provide a function of protecting the semiconductor device, reducing the risk of accidental collision or damage; the appearance and the encapsulation of the semiconductor device can be protected and the service life of the semiconductor device can be prolonged by limiting and supporting the placement area; in summary, the placement plate 6 is provided with the positioning strips 10 and forms a placement area, so that the advantages of positioning and alignment, preventing the sliding of the semiconductor device, improving the working efficiency, being convenient for management and organization, protecting the semiconductor device and the like can be realized; these advantages contribute to an improvement in efficiency, reliability and ease of operation of the test device 1; a slide plate 11 is arranged in a placement area on the placement plate 6, a test seat 12 for stacking semiconductor devices is arranged on the slide plate 11, and a first driving component 13 for driving the slide plate 11 is arranged on the placement plate 6; the first driving component 13 of the driving slide plate 11 can realize the automatic discharging process of the semiconductor device, reduce the requirement of manual operation and improve the working efficiency and the production efficiency; The first driving component 13 on the placing plate 6 can accurately control the movement of the sliding plate 11 to accurately slide into the detection device; this helps ensure that the semiconductor device enters the inspection apparatus accurately, improving the accuracy and reliability of the test, and the test socket 12 on the sled 11 can provide protection for the semiconductor device; the test seat 12 can prevent devices from being collided or damaged in the blanking process, keep the integrity and the reliability of the devices, and can conveniently maintain and replace semiconductor devices through the design of the slide plate 11 and the test seat 12; if the device needs to be replaced or maintained, the device can be realized through the driving assembly of the sliding plate 11, so that the complexity of operation is reduced; In addition, the method comprises the steps of; through an automatic blanking process, the risk of manual operation can be reduced, and accidents are reduced; this helps to improve the safety of the working environment, protecting the physical health and safety of the operators; in sum, the placing plate 6 is provided with the sliding plate 11 and the test seat 12, and the driving of the sliding plate 11 is realized through the first driving component 13, so that an automatic and efficient blanking process can be realized, and the efficiency, the reliability and the safety of the working environment of the test device 1 are improved; the first driving assembly 13 comprises a first driving motor 1301 arranged on the shelving board 6 and a fixed block 1302 arranged at the bottom of the sliding plate 11, wherein a sliding rod 1303 and a screw rod 1304 are arranged in the fixed block 1302, and the output end of the first driving motor 1301 is connected with the screw rod 1304; By connecting the first driving motor 1301 with the screw rod 1304, accurate control of the slide plate 11 can be achieved; the rotary motion of the screw rod 1304 can convert the rotation of the motor into linear motion, thereby realizing accurate driving and positioning of the slide plate 11; and the fixed block 1302 is internally provided with a sliding rod 1303 and a screw 1304, which can provide stable support for the sliding plate 11; the design of the sliding rod 1303 can ensure that the sliding plate 11 keeps stable movement in the driving process, so that shaking or vibration is avoided, the stability and accuracy of work are improved, moreover, the first driving motor 1301 is used as a core part of a driving assembly, and the output end of the first driving motor 1301 is connected with the screw rod 1304, so that a stable and reliable power source can be provided; This helps to ensure that the slide plate 11 can be stably moved to the inside of the detection device, improving the reliability and success rate of discharging; in summary, the first drive assembly 13 includes the first drive motor 1301, the fixed block 1302, the slide bar 1303 and the screw 1304 components, which facilitate improving the efficiency, reliability and ease of maintenance of the test apparatus 1.
As shown in fig. 4, the interior of the rest plate 6 is provided with a plurality of through holes 14; the through holes 14 can increase the ventilation of the rest plate 6 and promote the air flow, thereby improving the heat dissipation effect; and the through holes 14 can reduce the weight of the rest plate 6; by providing the through-holes 14 inside the rest plate 6, the amount of material used can be reduced, thereby reducing the weight of the entire apparatus; the burden of the mobile equipment or the equipment to be carried can be reduced, and the convenience of carrying and use is improved; the through holes 14 can facilitate installation and maintenance work; in addition, the through holes 14 can also be used for easy inspection, adjustment or replacement of the semiconductor devices on the rest plate 6; in summary, by providing a plurality of through holes 14 in the interior of the rest plate 6, it is possible to improve heat dissipation performance, reduce weight, optimize wiring and layout, strengthen structural stability, and facilitate installation and maintenance; these advantages help to improve the performance, reliability and operability of the device; the positioning strip 10 is provided with a guide rail, a sliding piece is arranged between the guide rail and the sliding plate 11, and the sliding plate 11 is arranged on the guide rail in a sliding way through the sliding piece; by the design of the guide rail and the sliding piece, the accurate positioning of the sliding plate 11 can be realized; the sliding piece can slide stably along the track of the guide rail, so that the accurate positioning of the sliding plate 11 in the moving process is ensured, and deviation or out of control is avoided; the matched design between the guide rail and the sliding piece can reduce friction in the sliding process; the sliding part is usually made of a low-friction material, such as a lubricating material or a sliding bearing, so that the sliding resistance can be effectively reduced, and the smoothness and efficiency of sliding can be improved; the structure of the guide rail and the sliding member can improve the stability of the sliding plate 11; the guide rail can play a role of fixing the sliding piece, so that the sliding piece is prevented from shaking or separating from the track in the sliding process, and the stability and the safety of the sliding plate 11 are ensured; by forming sliding contact between the guide rail and the sliding piece, the direct friction of the sliding plate 11 and other parts can be reduced, and the durability of the sliding plate 11 is improved; the sliding piece can bear the abrasion in the sliding process, so that the abrasion to the sliding plate 11 is reduced, and the service life of the sliding plate 11 is prolonged; in summary, by providing the guide rail on the positioning strip 10 and providing the sliding member between the guide rail and the sliding plate 11, accurate positioning, reduced friction, improved stability, and increased durability can be achieved; these advantages help to improve the accuracy, reliability and maintainability of the skid plate 11, enhancing the performance and use experience of the device.
As shown in fig. 3 to 4, the test seat 12 is provided with a reinforcing cross bar 15, one side of the rest plate 6 is provided with a fixed plate 16, the fixed plate 16 is provided with a mounting cross beam 17, and the mounting cross beam 17 is provided with a locking piece 18 for locking the reinforcing cross bar 15 on the test seat 12; the reinforcing cross bar 15 on the test seat 12 is locked by the locking piece 18, so that the test seat 12 is conveniently locked on the shelving board 6, and the stability of the test seat 12 in the lifting process is ensured; it is worth noting that the locking piece 18 comprises a mounting vertical plate arranged on the mounting cross beam 17 and an electric telescopic rod arranged on the fixing plate 16, the mounting vertical plate is provided with a mounting vertical plate, the output end of the electric telescopic rod is movably connected with a first connecting rod, one end of the first connecting rod is connected with the output end of the electric telescopic rod, the middle part of the first connecting rod is hinged with the mounting vertical plate, the other end of the first connecting rod is hinged with a second connecting rod, one end of the second connecting rod is connected with the first connecting rod, the other end of the second connecting rod is rotationally provided with a sliding plate, a sliding rail is arranged between the sliding plate and the mounting vertical plate, a fixing piece is arranged on the sliding plate, a rotating shaft is arranged on the fixing piece, a locking rod is arranged on the rotating shaft, a torsion spring is arranged in the fixing piece, one end of the torsion spring is connected with the fixing piece, one end of the locking rod is provided with a bayonet matched with the reinforcing cross rod 15, one end of the locking rod is lifted up by starting a power supply of the electric telescopic rod, at the moment, the first connecting rod rotates around the mounting vertical plate, the second connecting rod is interlocked, the second connecting rod is pushed towards the direction of the reinforcing cross rod 15, the reinforcing cross rod is meshed with the direction, the sliding plate is fixed between the locking rod and the reinforcing cross rod 15, the stable fixing between the locking plate and the fixing plate 15 is realized; by achieving stable fixation between the reinforcing cross bar 15 and the fixing plate 16, reliable fixation can be provided, sliding and collision of the test seat 12 are prevented, and convenient and safe handling and operation are facilitated; these benefits may improve the operational effectiveness and safety of the test seat 12, protecting the stability and integrity of the items within the test seat 12; in addition, the mounting longitudinal plate is provided with a limiting plate, the limiting plate is positioned on one side of the sliding plate, an arc-shaped guide groove is formed in the limiting plate, the lock catch rod is provided with an outer extending rod, one end of the outer extending rod is connected with the middle part of the lock catch rod, and the other end of the outer extending rod moves in the arc-shaped guide groove; in the process that the sliding plate is close to the reinforcing cross rod 15, relative displacement is generated between the limiting plate and the sliding plate, and under the guiding effect of the arc-shaped guide groove, the locking rod rotates around the fixing piece until the bayonet on the locking rod is meshed with the reinforcing cross rod 15, so that the linkage effect is realized.
Working principle: before use, the semiconductor device is stacked inside the test seat 12, the test seat 12 is placed between two adjacent positioning strips 10, and the locking piece 18 is used for locking the reinforcing cross rod 15 on the test seat 12, so that the test seat 12 is conveniently locked on the shelving board 6, and the stability of the test seat 12 in the lifting process is ensured.
After the test seat 12 on the shelving board 6 is fixed; by starting the power supply of the multi-section cylinder 3, the shelving board 6 slides in the guide sliding rail 7 through the pulley 8, when the shelving board 6 is lifted to a proper height, the sealing door at the inlet of the testing device 1 is opened, and then the first driving component 13 is started, so that the sliding board 11 passes through the inlet of the testing device 1 and enters the testing device 1, thereby conveniently, quickly and efficiently testing the semiconductor device.
The above embodiments are not intended to limit the scope of the present application, so: all equivalent changes in structure, shape and principle of the application should be covered in the scope of protection of the application.
Claims (5)
1. Lifting loading and unloading device for semiconductor device testing device (1), including locating mounting bracket (2) on testing device (1), its characterized in that: the mounting rack (2) is provided with a plurality of sections of cylinders (3), a plurality of output shafts (4) are arranged in the sections of cylinders (3), the output shafts (4) are provided with mounting plates (5), the mounting plates (5) are provided with a placing plate (6) for placing semiconductor devices, and the placing plate (6) is arranged at the inlet of the testing device (1) in a lifting mode;
The mounting frame (2) comprises a plurality of lateral upright posts (201), the lateral upright posts (201) are arranged on the outer wall of the testing device (1) and are positioned on two sides of the inlet of the testing device (1), the top of each lateral upright post (201) is provided with a fixed cross beam (202), and the fixed cross beams (202) are fixedly connected with the multi-section air cylinders (3);
the lateral upright post (201) is provided with a guide sliding rail (7), a pulley (8) is arranged between the guide sliding rail (7) and the mounting plate (5), the pulley (8) is arranged on the mounting plate (5), and the mounting plate (5) is movably arranged in the guide sliding rail (7) through the pulley (8);
The placing plate (6) is provided with a plurality of positioning strips (10), the adjacent positioning strips (10) are parallel to each other, and a placing area for placing the semiconductor device is formed between the adjacent positioning strips (10) and the placing plate (6);
A sliding plate (11) is arranged in a placement area on the placement plate (6), a test seat (12) for stacking semiconductor devices is arranged on the sliding plate (11), and a first driving assembly (13) for driving the sliding plate (11) is arranged on the placement plate (6);
the test seat (12) is provided with a reinforcing cross rod (15), one side of the rest plate (6) is provided with a fixing plate (16), the fixing plate (16) is provided with a mounting cross beam (17), and the mounting cross beam (17) is provided with a locking piece (18) for locking the reinforcing cross rod (15) on the test seat (12).
2. The lifting loading and unloading device for the semiconductor device testing apparatus (1) according to claim 1, wherein: the sleeve shaft is characterized in that a plurality of sleeve shafts (9) which are sleeved with each other are arranged on the mounting plate (5), each sleeve shaft (9) is arranged in a telescopic mode relative to the adjacent sleeve shafts (9), the sleeve shafts (9) and the mounting plate (5) are arranged in a one-to-one correspondence mode, the sleeve shafts (9) penetrate through and are fixed in the mounting plate (5), and the mounting plate (5) is close to the end portion position of the sleeve shaft (9).
3. The lifting loading and unloading device for the semiconductor device testing apparatus (1) according to claim 1, wherein: the first driving assembly (13) comprises a first driving motor (1301) arranged on the shelving plate (6) and a fixed block (1302) arranged at the bottom of the sliding plate (11), a sliding rod (1303) and a screw rod (1304) are arranged in the fixed block (1302), and the output end of the first driving motor (1301) is connected with the screw rod (1304).
4. A lifting loading and unloading device for a semiconductor device testing apparatus (1) according to claim 3, characterized in that: the interior of the rest plate (6) is provided with a plurality of through holes (14).
5. The lifting loading and unloading device for the semiconductor device testing apparatus (1) according to claim 1, wherein: the positioning strip (10) is provided with a guide rail, a sliding piece is arranged between the guide rail and the sliding plate (11), and the sliding plate (11) is arranged on the guide rail in a sliding way through the sliding piece.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311293390.1A CN117263081B (en) | 2023-10-07 | Lifting loading and unloading device for semiconductor device testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311293390.1A CN117263081B (en) | 2023-10-07 | Lifting loading and unloading device for semiconductor device testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN117263081A CN117263081A (en) | 2023-12-22 |
| CN117263081B true CN117263081B (en) | 2024-07-12 |
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| CN115385265A (en) * | 2022-08-23 | 2022-11-25 | 嵊州陌桑高科股份有限公司 | Single-arm lifter |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112520413A (en) * | 2020-12-11 | 2021-03-19 | 苏州乾鸣自动化科技有限公司 | Full-automatic aging test loading and unloading system and method |
| CN115385265A (en) * | 2022-08-23 | 2022-11-25 | 嵊州陌桑高科股份有限公司 | Single-arm lifter |
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