CN117233436A - Kelvin test switching device and test switching method for discrete device - Google Patents
Kelvin test switching device and test switching method for discrete device Download PDFInfo
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- CN117233436A CN117233436A CN202311514577.XA CN202311514577A CN117233436A CN 117233436 A CN117233436 A CN 117233436A CN 202311514577 A CN202311514577 A CN 202311514577A CN 117233436 A CN117233436 A CN 117233436A
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- 238000004806 packaging method and process Methods 0.000 abstract description 3
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Abstract
The invention relates to the technical field of semiconductor packaging, in particular to a Kelvin test switching device of a discrete device and a test switching method thereof, wherein the device comprises a test board and a dial; the dial device is provided with a plurality of dial codes, a plurality of pins on the test board are correspondingly connected with the plurality of dial codes respectively, and the test board is connected with the test end of the discrete device. Each pin comprises an S end and an F end, the S end of each pin is correspondingly connected with one end of the corresponding dial, and the F end of each pin is correspondingly connected with the other end of the corresponding dial. The invention relates to the technical field of semiconductor packaging, and can solve the problem that the Kelvin test and the non-Kelvin test in the prior art are inconvenient to switch.
Description
Technical Field
The invention relates to the technical field of semiconductor packaging, in particular to a Kelvin test switching device and a Kelvin test switching method for discrete devices.
Background
In the Kelvin test of discrete devices, kelvin test is required to be performed through different pins on a test board, and the pins need to be switched back and forth to be replaced in the test process, so that the Kelvin test state and the non-Kelvin test state are switched. At present, the conventional switching modes are: the connecting wire between test board pin and the discrete device is manually disassembled, and the connecting wire is re-welded to a new test board pin, so that the operation is inconvenient, time and labor are wasted, and the test efficiency is low. Therefore, it is necessary to provide a device for switching the kelvin test of a discrete device, which can solve the problem of inconvenient switching between the kelvin test and the non-kelvin test in the prior art.
Disclosure of Invention
The invention aims to provide a Kelvin test switching device and a Kelvin test switching method for discrete devices, which can solve the problem that Kelvin test and non-Kelvin test are inconvenient to switch in the prior art.
The invention is realized in the following way:
a Kelvin test switching device for discrete devices comprises a test board and a dial; the dial device is provided with a plurality of dial codes, a plurality of pins on the test board are correspondingly connected with the plurality of dial codes respectively, and the test board is connected with the test end of the discrete device.
Each pin comprises an S end and an F end, the S end of each pin is correspondingly connected with one end of the corresponding dial, and the F end of each pin is correspondingly connected with the other end of the corresponding dial.
The dialing code comprises an ON end and an OFF end; when the dial head of the dial dials to the ON end, the dial is conducted and short-circuited with the S end and the F end of the corresponding pin; when the dial head of the dial dials to the OFF end, the dial disconnects the S end and the F end of the corresponding pin.
A test switching method of Kelvin test switching device of discrete device includes the following steps:
step 1: the S end of each pin of the test board is correspondingly connected with one end of each dial on the dial, and the F end of each pin of the test board is correspondingly connected with the other end of each dial on the dial;
step 2: connecting the test board with the discrete device;
step 3: when Kelvin testing is carried out ON the split device, selecting a corresponding pin ON the test board according to the test requirement, and poking a poking head of a poking code corresponding to the pin to an ON end;
step 4: the dialing is conducted and short-circuited with the S end and the F end of the pin, and Kelvin test is conducted on the split device through the pin of the test board;
step 5: after the test is finished, the poking head of the poking code corresponding to the pin is poked to the OFF end, so that the poking code breaks the S end and the F end of the pin and is switched to a non-Kelvin test state;
step 6: and (3) repeating the steps 3 to 5 according to different subsequent testing requirements, and sequentially selecting corresponding pins for testing.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention is provided with the dialer, so that the corresponding pins of the test board can be respectively conducted through a plurality of dialers to enter a Kelvin test state and test discrete devices, or the corresponding pins are respectively disconnected through a plurality of dialers to enter a non-Kelvin test state; the Kelvin test state can be switched by poking the poking port between the ON end and the OFF end, the operation is convenient and fast, the time and the labor are saved, and the test efficiency can be improved while the test effect is ensured.
2. The invention has the advantages that the dial indicator is arranged, the test switching method is simple and easy to operate, and the test switching method can be completed by only poking the dial-up head, thereby being beneficial to improving the test efficiency and convenience of discrete devices.
Drawings
Fig. 1 is a front view of a kelvin test switching arrangement of a discrete device of the present invention.
In the figure, 1 test board, 101 pins, 2 dialer, 201 dialer, 3 discrete devices.
Detailed Description
The invention will be further described with reference to the drawings and the specific examples.
Referring to fig. 1, a kelvin test switching device for discrete devices includes a test board 1 and a dial 2; a plurality of dialing codes 201 are arranged on the dialing device 2, a plurality of pins 101 on the testing board 1 are correspondingly connected with the plurality of dialing codes 201 respectively, and the testing board 1 is connected with the testing end of the discrete device 3.
The plurality of dialing codes 201 of the dialing device 2 are communicated with different pins 101 on the testing board 1, so that Kelvin testing of the discrete device 3 is facilitated through the different pins 101, the testing board is not required to be manually disassembled and connecting wires are not required to be welded again, and Kelvin testing and non-Kelvin testing states are switched more simply and conveniently.
The number of the dialing codes 201 on the dialing device 2 is not less than the number of the pins 101 according to the number of the pins 101 on the testing board 1, so that the corresponding pins 101 can be controlled through each dialing code 201, and the operation is convenient and accurate.
Each pin 101 includes an S end and an F end, the S end of each pin 101 is correspondingly connected with one end of the corresponding dial 201 through a wire, and the F end of each pin 101 is correspondingly connected with the other end of the corresponding dial 201 through a wire.
The dial 201 may be a dial switch in the prior art, and the dial switch controls on/off of the S end and the F end of the pin 101, so that when the S end and the F end of the pin 101 are turned on, the pin 101 of the test board 1 is in a kelvin test state, and can be used for performing a kelvin test on the discrete device 3, otherwise, when the S end and the F end of the pin 101 are turned off, the pin 101 of the test board 1 is in a non-kelvin test state, so as to facilitate switching the kelvin test state.
The dial 201 includes an ON end and an OFF end; when the toggle head of the toggle 201 toggles to the ON end, the toggle head 201 is conducted and short-circuits the S end and the F end of the corresponding pin 101; when the dial head of the dial 201 dials to the OFF end, the dial 201 disconnects the S end and the F end of the corresponding pin 101.
When the toggle head of the toggle 201 toggles to the ON end, the inside of the toggle 201 is conducted to form a conducting wire state for shorting the S end and the F end of the corresponding pin 101, so that the kelvin test state is entered. When the toggle head of the toggle 201 toggles to the OFF end, the inside of the toggle 201 is disconnected, and the S end and the F end of the corresponding pin 101 cannot be communicated, so that the non-kelvin test state is entered.
Referring to fig. 1, a test switching method of a kelvin test switching apparatus for discrete devices includes the following steps:
step 1: the S end of each pin of the test board 1 is correspondingly connected with one end of each dial 201 on the dial 2 through a wire, and the F end of each pin of the test board 1 is correspondingly connected with the other end of each dial 201 on the dial 2 through a wire.
Step 2: the test board 1 is connected to a discrete device 3.
The test board 1 can be connected to the discrete devices 3 in a conventional manner, which will not be described here.
Step 3: when Kelvin testing is performed ON the discrete device 3, the corresponding pin 101 ON the test board 1 is selected according to the test requirement, and the toggle head of the toggle code 201 corresponding to the pin 101 is toggled to the ON end.
Step 4: the dial 201 is turned on and shorts the S terminal and the F terminal of the pin 101, so that the split device 3 can be subjected to kelvin test through the pin 101 of the test board 1.
Step 5: after the test is finished, the toggle head of the toggle 201 corresponding to the pin 101 is toggled to the OFF end, so that the toggle 201 disconnects the S end and the F end of the pin 101 and switches to a non-kelvin test state.
Step 6: and (3) repeating the steps 3 to 5 according to different subsequent testing requirements, and sequentially selecting the corresponding pins 101 for testing.
The selection and switching operation methods of the Kelvin state and the non-Kelvin state of the different pins 101 are the same, and will not be described here again.
The foregoing description of the preferred embodiments of the invention is not intended to limit the scope of the invention, and therefore, any modifications, equivalents, improvements, etc. that fall within the spirit and principles of the invention are intended to be included within the scope of the invention.
Claims (4)
1. A Kelvin test switching device for discrete devices is characterized in that: comprises a test board (1) and a dial device (2); a plurality of dialing codes (201) are arranged on the dialing device (2), a plurality of pins (101) on the testing board (1) are respectively and correspondingly connected with the dialing codes (201), and the testing board (1) is connected with the testing end of the discrete device (3).
2. The device of claim 1, wherein the device is further configured to: each pin (101) comprises an S end and an F end, the S end of each pin (101) is correspondingly connected with one end of the corresponding dial (201), and the F end of each pin (101) is correspondingly connected with the other end of the corresponding dial (201).
3. The kelvin test switching apparatus of discrete devices according to claim 2, wherein: the dialing code (201) comprises an ON end and an OFF end; when the poking head of the poking code (201) pokes to the ON end, the poking code (201) is conducted and short-circuits the S end and the F end of the corresponding pin (101); when the toggle head of the toggle (201) is toggled to the OFF end, the toggle (201) disconnects the S end and the F end of the corresponding pin (101).
4. A test switching method using the kelvin test switching apparatus of claim 3, characterized in that: the method comprises the following steps:
step 1: the S end of each pin of the test board (1) is correspondingly connected with one end of each dial (201) on the dial (2), and the F end of each pin of the test board (1) is correspondingly connected with the other end of each dial (201) on the dial (2);
step 2: connecting the test board (1) with the discrete device (3);
step 3: when Kelvin testing is carried out ON the split device (3), selecting a corresponding pin (101) ON the test board (1) according to the test requirement, and poking a poking head of a poking code (201) corresponding to the pin (101) to an ON end;
step 4: the dialing code (201) is conducted and short-circuited with the S end and the F end of the pin (101), and Kelvin test is conducted on the split device (3) through the pin (101) of the test board (1);
step 5: after the test is finished, the toggle head of the toggle head (201) corresponding to the pin (101) is toggled to the OFF end, so that the toggle head (201) disconnects the S end and the F end of the pin (101) and switches to a non-Kelvin test state;
step 6: and (3) repeating the steps 3 to 5 according to different subsequent testing requirements, and sequentially selecting corresponding pins (101) for testing.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311514577.XA CN117233436B (en) | 2023-11-15 | 2023-11-15 | Kelvin test switching device and test switching method for discrete device |
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| CN202311514577.XA CN117233436B (en) | 2023-11-15 | 2023-11-15 | Kelvin test switching device and test switching method for discrete device |
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| CN117233436B CN117233436B (en) | 2024-06-25 |
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