CN111077434A - M2M module testing method and device - Google Patents
M2M module testing method and device Download PDFInfo
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- CN111077434A CN111077434A CN202010000397.XA CN202010000397A CN111077434A CN 111077434 A CN111077434 A CN 111077434A CN 202010000397 A CN202010000397 A CN 202010000397A CN 111077434 A CN111077434 A CN 111077434A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- Environmental & Geological Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to a method and a device for testing an M2M module. The M2M module comprises a control module and at least one function extension pin; the device comprises a test fixture; the test fixture is electrically connected with the control module; each function expansion pin of the M2M module is connected into the test fixture through a connecting wire or a test needle; the control module is used for configuring each function expansion pin as a general input/output port during testing, then executing testing operation on each successfully configured function expansion pin, and judging whether each function expansion pin is normal according to a testing result. According to the method and the device, on one hand, the functional pin test of the M2M module can be realized, and on the other hand, the problem that the M2M module needs to be reworked or scrapped due to the fact that the pin of the M2M module is led out to the DAQ is avoided; in addition, because the pin of the M2M module is not required to be led out to the DAQ, the back-and-forth handshaking, the control and the delay waiting between the two modules can be correspondingly omitted, and the whole testing time is saved.
Description
Technical Field
The invention relates to the technical field of circuit testing, in particular to a method and a device for testing an M2M module.
Background
M2M (Machine to Machine) refers to connection and communication relationship between machines in industrial equipment, and M2M communication devices are equipment for realizing such communication relationship. At present, DAQ (Data acquisition) is generally used to test the pins of the M2M module, and in order to implement the test, all the pins of the M2M module need to be led out to the DAQ.
Because each pin of the module needs to be connected to the DAQ, the lead is easily contacted with the outside to introduce some high-energy voltage, a chip in the module is damaged, and meanwhile, because various complex environments exist outside, a plurality of factors (static electricity and surge) can cause the M2M module to be damaged in a conduction mode, and a corresponding production line can often feed back the function failure of the corresponding pin of the M2M module, so that the module has to be reworked or scrapped, and the loss in the production aspect is caused.
Disclosure of Invention
In view of the above, it is necessary to provide a method and apparatus for testing M2M module.
An M2M module testing device, the M2M module including a control module and at least one function extension pin; the device comprises a test fixture;
the test fixture is electrically connected with the control module; each function expansion pin of the M2M module is connected into the test fixture through a connecting wire or a test needle;
the control module is used for configuring each function expansion pin into a universal input/output pin during testing, then executing testing operation on each successfully configured function expansion pin, and judging whether each function expansion pin is normal according to a testing result.
In one embodiment, the M2M module further comprises an analog-to-digital converter; the analog-to-digital converter is connected between the test fixture and the control module.
In one embodiment, each of the function expansion pins is divided into at least two groups.
In one embodiment, the test fixture comprises at least two single-pole multi-throw switches, and each single-pole multi-throw switch is correspondingly connected with a group of function extension pins;
the input end of the single-pole multi-throw switch is connected with the function extension pin, the output end of the single-pole multi-throw switch is connected with the input end of the analog-to-digital converter, the control end of the single-pole multi-throw switch is connected with the control module, and the output end of the analog-to-digital converter is connected with the control module.
In one embodiment, the control module is further configured to detect a level of each of the function extension pins configured as a mode selection pin, and control the M2M module to enter a test mode or a normal mode according to a detection result.
In one embodiment, each of the function extension pins includes one or more of a GPIO pin, an I2S pin, an SPI pin, and a UART pin.
Based on the same inventive concept, the application also provides a test method of the M2M module, wherein the M2M module comprises a control module and at least one function extension pin; the test method uses an M2M module test device to carry out testing; the device comprises a test fixture; the test fixture is electrically connected with the control module; each function expansion pin is connected into the test fixture through a connecting wire or a test needle; the method comprises the following steps:
configuring each of the function expansion pins as a general input/output pin;
executing test operation on each function expansion pin after successful configuration;
and judging whether each function expansion pin is normal or not according to the test result.
In one embodiment, the M2M module further comprises an analog-to-digital converter; the analog-to-digital converter is connected between the test fixture and the control module; the test operation comprises:
controlling each function expansion pin configured as a general input/output pin to sequentially output a high level or a low level according to a preset time sequence;
and detecting whether the analog-to-digital converter receives a high level or a low level, and if not, judging that the corresponding function extension pin is abnormal.
In one embodiment, the test fixture comprises at least two single-pole multi-throw switches, and the input end of each single-pole multi-throw switch is connected with a function expansion pin of the M2M module; wherein the testing operation further comprises:
enabling each of the single-pole, multi-throw switches, respectively;
and controlling the channels of the single-pole multi-throw switch in the enabling state to be opened in sequence according to the preset time sequence.
In one embodiment, before the step of configuring each of the function expansion pins as a general purpose input/output port, the testing method further includes:
detecting the level of each function expansion pin configured as a mode selection pin;
controlling the M2M module to enter a test mode or a normal mode according to the detection result; and if the mode selection pin is detected to be at a high level, controlling the M2M module to enter a test mode.
The method and the device for testing the M2M module access each function expansion pin of the M2M module to the test fixture through the connecting wire or the test pin, then access the test fixture back to the control module of the M2M module through the test fixture, finally configure each function expansion pin as a general input/output port through the control module during testing, then execute test operation on each successfully configured function expansion pin, and judge whether each function expansion pin is normal according to the test result. On one hand, the functional pin test of the M2M module can be realized, and on the other hand, the problem that the M2M module needs to be reworked or scrapped due to the fact that the pins of the M2M module are led out to the DAQ is avoided, so that the test risk can be reduced; in addition, because the pin of the M2M module is not required to be led out to the DAQ, the back-and-forth handshaking, the control and the delay waiting between the two modules can be correspondingly omitted, and the whole testing time is saved.
Drawings
FIG. 1 is a schematic diagram of an embodiment of an M2M module testing apparatus;
FIG. 2 is a schematic diagram of a part of the M2M module testing device in another embodiment;
FIG. 3 is a flowchart illustrating a method for testing an M2M module according to an embodiment;
FIG. 4 is a flowchart illustrating a sub-step of step S320 in FIG. 3;
fig. 5 is a flowchart illustrating a method for testing the M2M module in another embodiment.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present application are given in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
Please refer to fig. 1, which is a schematic structural diagram of an M2M module testing apparatus according to an embodiment of the present disclosure. The M2M module may include a control module 110 and at least one function extension pin, which may be a GPIO (General Purpose Input/Output) pin, an I2S (Inter-IC Sound) pin, an SPI (Serial Peripheral Interface) pin, and a UART (universal asynchronous Receiver/Transmitter) pin. The GPIO pin is generally used to control each functional module and power switch on the motherboard, the I2S pin is generally used to transmit audio data, and the SPI pin and the UART pin are generally used to communicate between microcontrollers and sensors.
In this embodiment, the testing apparatus may include a testing fixture 20, the testing fixture 20 being electrically connected to the control module 110 (the testing fixture 20 being controlled by the control module); each function extension pin 1, 2, 3, 4 … of the M2M module is connected to the test fixture 20 via a connecting wire or a test pin; that is, the present application brings each function extension pin 1, 2, 3, 4 … in the M2M module back inside the M2M module through the test fixture 20.
The control module 110 is implemented by burning or installing test software into a control chip such as a processor or a single chip microcomputer. Specifically, the control module 110 is configured to configure each of the function extension pins 1, 2, 3, and 4 … as a general-purpose input/output pin during testing, then perform a test operation on each of the function extension pins 1, 2, 3, and 4 … after successful configuration, and determine whether each of the function extension pins is normal according to a test result.
In the M2M module testing apparatus, each function extension pin of the M2M module is connected to the test fixture through a connecting wire or a test pin, and then connected back to the control module of the M2M module through the test fixture, and finally, each function extension pin is configured as a general input/output port through the control module during testing, and then, the testing operation is performed on each successfully configured function extension pin, and whether each function extension pin is normal is determined according to a testing result. On one hand, the functional pin test of the M2M module can be realized, and on the other hand, the problem that the M2M module needs to be reworked or scrapped due to the fact that the pins of the M2M module are led out to the DAQ is avoided; in addition, because the pin of the M2M module is not required to be led out to the DAQ, the back-and-forth handshaking, the control and the delay waiting between the two modules can be correspondingly omitted, and the whole testing time is saved.
With continued reference to fig. 1, the M2M module of the present application may further include an analog-to-digital converter 120, wherein the analog-to-digital converter 120 is connected to the circuit in which the test fixture 20 and the control module 110 are located; because most of the existing M2M modules have ADC sampling functions, in the design of the present application, the feature is fully utilized, the function extension pins 1, 2, 3, and 4 of the M2M module are led out, and are connected back to the ADC sampling pin of the M2M module after passing through the test fixture 20, so as to implement closed loop of signals, and then the test software is burned in the control module 110, so that the test of the function extension pins of the M2M module can be implemented. The analog-to-digital converter of the M2M module should have the characteristics of fast sampling speed, less delay and the like. In this embodiment, the time for completing the measurement of one function extension pin only needs 10ms by using the analog-to-digital converter of the M2M module.
Since the M2M module usually includes many function extension pins, on one hand, for convenience of testing, and on the other hand, for adapting to the existing test fixture, in the present application, the function extension pins of the M2M module are divided into at least two groups, as shown in fig. 2, for convenience of description, two groups of function extension pins are taken as an example and are respectively referred to as a function extension pin group 1 and a function extension pin group 2.
Further, since the number (usually, one) of the analog-to-digital converters 120(ADC ports) of the M2M module is far less than that of the function extension pins, in order to implement simultaneous testing of multiple function extension pins, at least two single-pole multi-throw switches may be disposed in the test fixture 20 of the present application, each single-pole multi-throw switch is correspondingly connected to one group of function extension pins, and optionally, the single-pole multi-throw switch may be a switch chip of a 16 input channel, a switch chip of an 8 input channel, or a switch chip of a 4 input channel; an input end (not shown) of the single-pole multi-throw switch is connected with the function extension pin, an output end (not shown) of the single-pole multi-throw switch is connected with an input end of the analog-to-digital converter 120, a control end (not shown) of the single-pole multi-throw switch is connected with the control module 110, and an output end (not shown) of the analog-to-digital converter 120 is connected with the control module 110; as shown in fig. 2, taking the single-pole multi-throw switch 1 and the single-pole multi-throw switch 2 as an example, each input terminal of the single-pole multi-throw switch 1 is connected to each function extension pin of the function extension pin group 1, each input terminal of the single-pole multi-throw switch 2 is connected to each function extension pin of the function extension pin group 2, the control terminal EN1 of the single-pole multi-throw switch 1 and the control terminal EN2 of the single-pole multi-throw switch 2 are both connected to the control module 110, the channel selection terminal SEL1 of the single-pole multi-throw switch 1 and the channel selection terminal SEL2 of the single-pole multi-throw switch 2 are both connected to the control module 110, and the output terminals of the single-pole multi-throw switch 1 and the single-pole multi-throw switch 2 are both connected to the input terminal of the analog-to-digital converter 120.
In some embodiments, the control module 110 of the present application is further configured to detect a level of each of the function extension pins configured as the mode selection pin, and control the M2M module to enter the test mode or the normal mode according to the detection result. Specifically, before performing the test, the M2M module may enter a different mode, such as a test mode or a normal mode, by the control module 110 detecting the level of the mode selection pin.
Based on the same inventive concept, the application also provides an M2M module testing method. Referring to fig. 1 and 3, the M2M module includes a control module 110 and at least one function extension pin; the test method uses an M2M module test device to carry out the test; the apparatus includes a test fixture 20; the test fixture 20 is electrically connected to the control module 110; each function expansion pin is connected into the test fixture 20 through a connecting wire or a test pin; as shown in fig. 3, the test method may include steps S310-S330.
In step S310, each of the function extension pins is configured as a general-purpose input/output pin.
Step S320, executing a test operation on each of the function extension pins after successful configuration.
Specifically, each function extension pin is configured as a General Purpose Input/Output pin, and the function extension pins may be a GPIO (General Purpose Input/Output) pin, an I2S (Inter-IC Sound) pin, an SPI (Serial Peripheral Interface) pin, a UART (Universal Asynchronous Receiver/Transmitter) pin, and the like.
Specifically, referring to both fig. 2 and 4, the M2M module may further include an analog-to-digital converter 20; the analog-to-digital converter 20 is connected between the test fixture 20 and the control module 110; the test operation may include steps S410-S420.
Step S410, controlling each of the function expansion pins configured as general input/output pins to sequentially output a high level or a low level according to a preset time sequence.
Step S420, detecting whether the analog-to-digital converter receives a high level or a low level, and if not, determining that the corresponding function extension pin is abnormal.
Further, the test fixture 20 may include at least two single-pole, multi-throw switches, each having an input connected to a function extension pin of the M2M module; the test operation may further comprise the steps of:
enabling each of the single-pole, multi-throw switches, respectively;
and controlling the channels of the single-pole multi-throw switch in the enabling state to be opened in sequence according to the preset time sequence.
Step S330, determining whether each of the function extension pins is normal according to the test result.
Specifically, during the actual test, the single-pole multi-throw switches may be enabled by the control module 110, that is, the test of the function expansion pins may be performed according to a certain sequence (e.g., group number and pin serial number). For example, taking fig. 2 as an example, the control module 110 configures each function extension pin in the function extension pin group 1 as a general purpose input/output pin, then enables the single-pole multi-throw switch 1, and then controls each function extension pin configured as a general purpose input/output pin to sequentially output a high level according to a preset timing sequence, where the preset timing sequence may be performed according to a sequence number of the pin, for example, first GPIO1, then GPIO2, and so on; correspondingly, when the GPIO1 has a high level output to the spdt switch 1, the control module 110 selects the channel connected to the GPIO1 to be turned on through the channel selection pin SEL1 of the spdt switch 1, and then detects whether the analog-to-digital converter 120 receives the high level, if the high level is not received, it determines that the pin of the GPIO1 is abnormal, and so on until all the function extension pins in the function extension pin group 1 are tested; after the function extension pin group 1 is tested, the function extension pin group 2 is tested by the same method until all the function extension pins to be tested of the M2M module are tested.
The testing method comprises the steps that each function expansion pin of the M2M module is firstly connected into a testing fixture through a connecting wire or a testing needle, then is connected back to a control module of the M2M module through the testing fixture, finally, each function expansion pin is configured into a universal input/output port through the control module during testing, then testing operation is carried out on each successfully configured function expansion pin, and whether each function expansion pin is normal or not is judged according to a testing result. On one hand, the functional pin test of the M2M module can be realized, and on the other hand, the problem that the M2M module needs to be reworked or scrapped due to the fact that the pins of the M2M module are led out to the DAQ is avoided, so that the test risk can be reduced; in addition, because the pin of the M2M module is not required to be led out to the DAQ, the back-and-forth handshaking, the control and the delay waiting between the two modules can be correspondingly omitted, and the whole testing time is saved.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. An M2M module testing device, the M2M module including a control module and at least one function extension pin; the device is characterized by comprising a test fixture;
the test fixture is electrically connected with the control module; each function expansion pin of the M2M module is connected into the test fixture through a connecting wire or a test needle;
the control module is used for configuring each function expansion pin into a universal input/output pin during testing, then executing testing operation on each successfully configured function expansion pin, and judging whether each function expansion pin is normal according to a testing result.
2. The M2M module testing device of claim 1, wherein the M2M module further comprises an analog-to-digital converter; the analog-to-digital converter is connected between the test fixture and the control module.
3. The M2M module testing device of claim 2, wherein each of the function expansion pins is divided into at least two groups.
4. The M2M module testing device of claim 3, wherein the test fixture includes at least two single-pole, multi-throw switches, each single-pole, multi-throw switch being connected to a corresponding set of function extension pins;
the input end of the single-pole multi-throw switch is connected with the function extension pin, the output end of the single-pole multi-throw switch is connected with the input end of the analog-to-digital converter, the control end of the single-pole multi-throw switch is connected with the control module, and the output end of the analog-to-digital converter is connected with the control module.
5. The M2M module testing device of claim 1, wherein the control module is further configured to detect a high or low level of each of the function extension pins configured as a mode selection pin, and control the M2M module to enter a test mode or a normal mode according to the detection result.
6. The M2M module testing device of claim 1, wherein each of the function extension pins includes one or more of a GPIO pin, an I2S pin, an SPI pin, and a UART pin.
7. A test method of M2M module, wherein the M2M module comprises a control module and at least one function extension pin; the testing method is characterized in that the testing method uses an M2M module testing device for testing; the device comprises a test fixture; the test fixture is electrically connected with the control module; each function expansion pin is connected into the test fixture through a connecting wire or a test needle; the method comprises the following steps:
configuring each of the function expansion pins as a general input/output pin;
executing test operation on each function expansion pin after successful configuration;
and judging whether each function expansion pin is normal or not according to the test result.
8. The M2M module testing method of claim 7, wherein the M2M module further comprises an analog-to-digital converter; the analog-to-digital converter is connected between the test fixture and the control module; the test operation comprises:
controlling each function expansion pin configured as a general input/output pin to sequentially output a high level or a low level according to a preset time sequence;
and detecting whether the analog-to-digital converter receives a high level or a low level, and if not, judging that the corresponding function extension pin is abnormal.
9. The M2M module testing method of claim 8, the test fixture including at least two single-pole, multi-throw switches, each single-pole, multi-throw switch having an input connected to a function extension pin of the M2M module; wherein the testing operation further comprises:
enabling each of the single-pole, multi-throw switches, respectively;
and controlling the channels of the single-pole multi-throw switch in the enabling state to be opened in sequence according to the preset time sequence.
10. The M2M module testing method of claim 7, wherein prior to the step of configuring each of the function expansion pins as a general purpose input/output port, the testing method further comprises:
detecting the level of each function expansion pin configured as a mode selection pin;
controlling the M2M module to enter a test mode or a normal mode according to the detection result; and if the mode selection pin is detected to be at a high level, controlling the M2M module to enter a test mode.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113933688A (en) * | 2021-10-13 | 2022-01-14 | 京东科技信息技术有限公司 | Method and device for testing intelligent module and testing jig bottom plate |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101902771A (en) * | 2009-05-26 | 2010-12-01 | 中兴通讯股份有限公司 | System and method for realizing M2M terminal test and M2M test platform |
| KR20130063866A (en) * | 2011-12-07 | 2013-06-17 | 모다정보통신 주식회사 | Diagonosis system for m2m device and the method thereof |
| CN104316863A (en) * | 2014-10-30 | 2015-01-28 | 天津津伯仪表技术有限公司 | Artificial intelligence-based universal circuit debugging and troubleshooting interaction system and method |
| CN204650511U (en) * | 2015-04-24 | 2015-09-16 | 深圳市铂盛科技有限公司 | A kind of Multifunctional main board diagnostic card |
| CN205483800U (en) * | 2016-03-04 | 2016-08-17 | 中国汽车工程研究院股份有限公司 | Sheet metal resistance spot welding solder joint variable angle loading mechanical testing anchor clamps |
| CN205921125U (en) * | 2016-07-18 | 2017-02-01 | 恒宝股份有限公司 | Chip cassette and communication device |
| CN106771967A (en) * | 2016-12-07 | 2017-05-31 | 深圳市科陆物联信息技术有限公司 | Core board test device and method |
| CN107015206A (en) * | 2017-03-20 | 2017-08-04 | 南京理工大学 | Adaptive antenna interference detection system and method |
| CN110632498A (en) * | 2019-09-19 | 2019-12-31 | 西安广和通无线通信有限公司 | Test method and system |
-
2020
- 2020-01-02 CN CN202010000397.XA patent/CN111077434A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101902771A (en) * | 2009-05-26 | 2010-12-01 | 中兴通讯股份有限公司 | System and method for realizing M2M terminal test and M2M test platform |
| KR20130063866A (en) * | 2011-12-07 | 2013-06-17 | 모다정보통신 주식회사 | Diagonosis system for m2m device and the method thereof |
| CN104316863A (en) * | 2014-10-30 | 2015-01-28 | 天津津伯仪表技术有限公司 | Artificial intelligence-based universal circuit debugging and troubleshooting interaction system and method |
| CN204650511U (en) * | 2015-04-24 | 2015-09-16 | 深圳市铂盛科技有限公司 | A kind of Multifunctional main board diagnostic card |
| CN205483800U (en) * | 2016-03-04 | 2016-08-17 | 中国汽车工程研究院股份有限公司 | Sheet metal resistance spot welding solder joint variable angle loading mechanical testing anchor clamps |
| CN205921125U (en) * | 2016-07-18 | 2017-02-01 | 恒宝股份有限公司 | Chip cassette and communication device |
| CN106771967A (en) * | 2016-12-07 | 2017-05-31 | 深圳市科陆物联信息技术有限公司 | Core board test device and method |
| CN107015206A (en) * | 2017-03-20 | 2017-08-04 | 南京理工大学 | Adaptive antenna interference detection system and method |
| CN110632498A (en) * | 2019-09-19 | 2019-12-31 | 西安广和通无线通信有限公司 | Test method and system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113933688A (en) * | 2021-10-13 | 2022-01-14 | 京东科技信息技术有限公司 | Method and device for testing intelligent module and testing jig bottom plate |
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Application publication date: 20200428 |