CN208350898U - A kind of quantum chip port impedance test device - Google Patents
A kind of quantum chip port impedance test device Download PDFInfo
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- CN208350898U CN208350898U CN201820810194.5U CN201820810194U CN208350898U CN 208350898 U CN208350898 U CN 208350898U CN 201820810194 U CN201820810194 U CN 201820810194U CN 208350898 U CN208350898 U CN 208350898U
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Abstract
The utility model discloses a kind of quantum chip port impedance test devices, belong to quantum regime.The utility model quantum chip port impedance test device includes lock-in amplifier, relay array switching circuit, quantum chip, MCU controller, host computer, the output end of the lock-in amplifier connects the input terminal of the relay array switching circuit, the output end of the relay array switching circuit connects the input terminal of the lock-in amplifier, the relay array switching circuit is every to be connected with each port of quantum chip all the way, the relay array switching circuit includes dpdt relay, the dpdt relay connects the MCU controller, the MCU controller connects host computer.Utility model device and measurement method have the advantages that measurement efficiency it is high, it is easy to operate, avoid quantum chip puncture.
Description
Technical field
The utility model relates to a kind of quantum chip field, in particular to a kind of quantum chip port impedance test device.
Background technique
In quantum chip field, quantum chip port impedance is an important external table of quantum chip device performance parameters
Sign.The method of current measurement resistance is not fully appropriate for measurement quantum chip, because quantum chip measurement is needed with minimum
Voltage.General voltmeter cannot be tested directly, measure again after amplification, and influence of noise is also very big.If universal using tradition
The sub- chip of multimeter directly measured quantities can directly puncture quantum chip certain port.If also can using general electric bridge instrument
There is the uncertain voltage for quantum chip pressure resistance, the resistance of conducting wire can be brought to miss again using general resistance measurement with voltammetry
Difference.Since quantum chip measurement is needed with minimum voltage, it is meant that the electric current for flowing through chip is also smaller.Traditionally, it simulates
After switch is commonly used to channel switching, but analog switch is closed, the channel of closing also has certain small leakage current, exactly because
Electric current when for this leakage current close to measurement quantum chip, will cause error, therefore traditional analog switchs the amount of being also not suitable for
Sub- chip impedance Measurement channel switching.This, which means that, needs to be realized switching with mechanical switch, but general relay electromagnetism is dry
It disturbs relatively by force, there is also the pulse such problems for closing the switch moment, and it is breakdown to will lead to quantum chip.Now conventional is anti-
Its protection voltage of the ESD devices such as surge device such as TVS diode, varistor, gas-discharge tube is relative to some quantum chips
Measurement voltage it is all too high, do not have protective effect.
In addition, the prior art mainly adopts the methods manually tested, but the method for artificial manual test is on the one hand
It is inefficient, on the other hand, since the electrostatic of human body in operating process or artificial misoperation are easy to punch through damage quantum
Chip, by taking a 16 port chip ports as an example, if as soon as between two two-ports impedance be required to test time, number reaches
It is 120 times, cumbersome.
Therefore, how not only to meet quantum chip port impedance low-voltage, high-precision measurement request, but also avoid quantum
Chip be damaged in measurement process be in the prior art urgent need to resolve the technical issues of.
Utility model content
1, it to solve the problems, such as
, quantum chip low to the device and method measuring accuracy for measuring quantum chip impedance in the prior art is easy breakdown
And the problem of manual testing's low efficiency, the utility model provide it is a kind of really easily quantum chip port impedance test device and
Measurement method.The utility model carries out small signal using lock-in amplifier and exports weak-signal measurement, utilizes dpdt relay
Permutation realizes measurement route on hardware and arbitrarily switches between multiport, greatly improves measurement accuracy, electromagnetic security
And testing efficiency, avoid quantum wafer damage.
2, technical solution
The utility model is to solve above-mentioned technical problem by the following technical programs:
A kind of quantum chip port impedance test device, including lock-in amplifier, relay array switching circuit, quantum core
Piece, MCU controller, host computer, the output end of the lock-in amplifier connect the input terminal of the relay array switching circuit,
The output end of the relay array switching circuit connects the input terminal of the lock-in amplifier, the relay array switching electricity
Per being connected all the way with each port of quantum chip, the relay array switching circuit includes dpdt relay on road,
The dpdt relay connects the MCU controller, and the MCU controller connects host computer.
Preferably, the relay array switching circuit is connected per dpdt relay all the way with single channel filter, institute
Single channel filter is stated to be connected with the quantum chip single port.
Preferably, the relay array switching circuit further includes hilted broadsword relay, and the dpdt relay passes through
The hilted broadsword relay is connected to the quantum chip port.
Preferably, the coil both ends of the dpdt relay and the hilted broadsword relay be respectively equipped with filter capacitor and
Diode, common end are equipped with filter, connect filter capacitor between contact.
Preferably, the lock-in amplifier connects PC machine by cable, and there is the PC machine display reading locking phase to put
The data outputting module of the voltage of the electric current and lock-in amplifier input terminal of big device output end.
Preferably, the lock-in amplifier and the relay array switching circuit pass through BNC cable connection.
Preferably, the MCU controller connects toggle switch.
Preferably, the MCU controller is connected to host computer by USB interface or UART interface.
It preferably, further include circuit board, the MCU controller, relay array, USB interface or UART serial ports and control
The toggle switch for making the relay array switching circuit is set on circuit board.
3, beneficial effect
Compared with the prior art, the utility model has the following beneficial effects:
(1) the utility model is measured using the small voltage that lock-in amplifier provides, can be breakdown to avoid quantum chip, lock
Influence of the phase amplifier to noise has outstanding inhibiting effect, has not only improved the safety of measurement but also has improved the accurate of measurement
Property, realize that measurement route switches between quantum chip multiport, utilizes MCU microcontroller people using dpdt relay array
Machine interaction is completed to circuit-switched control is measured to the method that impedance measures between several ports, so that measurement is more
It is convenient and efficient, to improve testing efficiency, reduce wafer damage rate.
(2) per being connected all the way with single channel filter, the single channel filters the relay array switching circuit of the utility model
Device is connected with the quantum chip single port, and the filter between relay and quantum chip can eliminate extraneous and relay and open
Bring voltage wave is closed, voltage surge between quantum chip port is reduced using filter and drop EMI processing is carried out to relay,
Reduce the breakdown probability of chip.
(3) the utility model dpdt relay and single-pole single-throw(SPST relay assembly, which close selection, can provide quantum chip
High level, low level, high-impedance state tri-state, the scope of application are wider.
(4) the utility model is equipped with filter capacitor and freewheeling diode, common end at dpdt relay coil both ends
Equipped with filter, filter capacitor is connected between contact, realizes and drop EMI processing has been carried out to relay, greatly improves measurement essence
Degree, electromagnetic security.
(5) test instrumentation of the utility model can connect PC machine, test chip resistance using lock-in amplifier by cable
The electric current of lock-in amplifier output end and the voltage of input terminal can be directly read when anti-in PC machine, therefore can online from the background
Port Impedance is calculated, testing efficiency is greatly improved.
(6) lock-in amplifier of the utility model and the relay array switching circuit are by BNC cable connection, quite
In Kelvin's measuring resistance method, the influence of test line resistance superposition is eliminated, test accuracy is improved.
(7) the utility model uses two kinds of man-machine interaction modes of serial ports and toggle switch, greatly facilitates tester, so that
Operation is more flexible.
(8) the MCU controller of the utility model is connected to PC machine by USB interface or UART interface, and connection type is more
It is flexible and varied, convenient for operation.
(9) the utility model further includes circuit board, the MCU controller, relay array, USB interface or UART serial ports
And the toggle switch of the control relay array switching circuit is set on circuit board, circuit board is with having reserved a variety of current potentials
Switching selection or do not connect, easily facilitate operator and select, it is more convenient.
(10) measurement method of the utility model is for testing high-efficient, easy to operate, survey when quantum chip port impedance
Measure it is accurate, highly-safe, not will cause quantum chip breakdown.
Detailed description of the invention
Fig. 1 is the schematic illustration of the utility model quantum chip port impedance test device；
Fig. 2 is the relay array switching circuit structural schematic diagram of the utility model；
Fig. 3 is the filter construction schematic diagram of the utility model.
Specific embodiment
In order to clearly describe the utility model, the utility model is described in detail with reference to the accompanying drawing.
The utility model is further described below combined with specific embodiments below.
Embodiment 1
With reference to Fig. 1 and Fig. 2, a kind of quantum chip port impedance test device, including lock-in amplifier, relay array are cut
Circuit, quantum chip, MCU controller, host computer are changed, the output end of lock-in amplifier connects the defeated of relay array switching circuit
Enter end, the input terminal of the output end connection lock-in amplifier of relay array switching circuit provides small electricity using lock-in amplifier
Output and small voltage measurement are pressed, wants the needs of extremely low and raising measuring accuracy for meeting test voltage between quantum chip port.
Relay array switching circuit realizes locking phase per being connected all the way with each port of quantum chip, using relay array switching circuit
Amplifier voltage output end and voltage detection terminal to each quantum chip port channel switching, instead of manually dismounting joint one by one
The workload of port switching.Relay array switching circuit includes dpdt relay, and dpdt relay connects MCU control
Device processed, MCU controller connect host computer.In addition, there is power-supply system to connect with MCU controller, relay array switching circuit, USB
Mouth chip connection.Wherein lock-in amplifier between host computer by cable with being connected, the voltage and current letter of lock-in amplifier measurement
Breath reaches host computer, available by lock-in amplifier upper computer software.
In addition, with reference to Fig. 1, relay array switching circuit, toggle switch, MCU controller, USB interface conversion chip with
And power-supply system is integrated and is made on one piece of circuit board, and for the ease of replacing quantum chip to be measured, quantum chip is placed in one
In tooling, it is connected on circuit board by tooling FPC connector, FPC line, then is connected with filter.In this example, the lock of use
The model SR830 of phase amplifier, host computer use PC machine.
When work, the working principle of the present apparatus is: the data transmission after lock-in amplifier measurement is to PC machine, MCU controller
The state of each dpdt relay in relay array is controlled, PC machine is referred to by USB interface to the transmission of MCU controller
It enables.The output of lock-in amplifier signal is adjusted to 0V first, according still further to the upper connection type, all parts are connected,
Then the output of lock-in amplifier signal is adjusted to test voltage value, the test voltage value is less than the breakdown voltage of quantum chip
Value, due to technique difference, the breakdown voltage value of different quantum chips is also different.PC machine communication program is opened, PC machine lock is opened
Phase amplifier program, sends instructions to MCU controller by PC machine communication program and controls relay array, and it is double that corresponding double-pole is arranged
Throw relay on-off.Using PC machine lock-in amplifier software collection voltage and current data, voltage data is lock-in amplifier input
The voltage at end, current data are the electric current of lock-in amplifier output end, and the ratio of voltage and current is port resistive.For example,
Some quantum chip port impedances are predominantly wherein several to there is certain resistance value between any two, open between remaining several port
It road only need to be by the first dpdt relay by taking the impedance between 1 port of quantum chip and 9 ports for measuring 16 ports as an example
One of them connects that another meets low potential (-) in high potential (+) with the 9th dpdt relay, other double-pole double throw relays
Device meets low potential (-), and using PC machine lock-in amplifier software collection voltage and current data, voltage data is lock-in amplifier input
The voltage at end, current data are the electric current of lock-in amplifier output end, and the ratio of voltage and current is port resistive.
For using that the device measures as a result, the current value and lock-in amplifier voltage of lock-in amplifier voltage output end
The voltage value of detection input can be directly obtained directly by lock-in amplifier upper computer software, convenient for record and processing meter
It calculates.There are two types of the modes for switching several ports of quantum chip to be measured: one is being arranged by toggle switch, MCU controller is swept
The state of corresponding toggle switch position is retouched, to control the state of corresponding relay, achievees the purpose that reconfigurable circuit, so as to
Measure the impedance between corresponding several ports；Second is by communicating with PC machine, and operator is soft by PC machine host computer
Part sends instructions to MCU controller, and MCU controller controls the state of corresponding relay according to the instruction received, reaches reconstruct
The purpose of circuit, to be capable of measuring the impedance between corresponding several ports of quantum chip.The state of each relay has
One indicator light, for the correctness of operator's confirmation operation.The mode for switching several ports of quantum chip to be measured, is reduced
Artificial replacement measurement access directly contacts quantum chip and the number with test device contact, imitates to improve test
Rate reduces wafer damage rate.
The utility model quantum chip port impedance test device is measured using the small voltage that lock-in amplifier provides, can be with
Avoid quantum chip breakdown, influence of the lock-in amplifier to noise has outstanding inhibiting effect, has both improved the safety of measurement
Property improve the accuracy of measurement again, realize that measurement route is cut between quantum chip multiport using dpdt relay array
It changes, is completed to circuit-switched control is measured to impedance between several quantum chip ports using the human-computer interaction of MCU controller
The method measured, to improve testing efficiency, reduces wafer damage rate so that measurement enhanced convenience is quick.
With reference to Fig. 1-3, a kind of measurement method of quantum chip port impedance test device of the utility model, including following step
It is rapid:
1) the signal output of the lock-in amplifier is adjusted to 0V.In this example, the type of the lock-in amplifier of use
Number be SR830.
2) lock-in amplifier, relay array switching circuit, quantum chip are linked together.Specifically, will lock
The output end of phase amplifier connects the input terminal of the relay array switching circuit, the relay array switching circuit it is defeated
Outlet connects the input terminal of the lock-in amplifier, and the relay array switching circuit is per each with the quantum chip all the way
Port is connected, and the relay array switching circuit includes dpdt relay, described in the dpdt relay connection
MCU controller, the MCU controller connect host computer.
3) the signal output of the lock-in amplifier is adjusted to test voltage value, test voltage value is less than quantum chip
Breakdown voltage value, due to technique difference, the breakdown voltage value of different quantum chips is also different.
4) communication program for opening the host computer, opens the lock-in amplifier program of the host computer, for control pair
MCU controller, which sends instructions, controls relay array, controls corresponding relay on-off.
5) sent instructions by the communication program of the host computer to the MCU controller and control the relay array switching
Circuit in turn switches on the port that the quantum chip needs to measure.Specifically, when single-pole single-throw(SPST relay disconnects, then accordingly
Quantum chip port be hanging high-impedance state；When single-pole single-throw(SPST relay closure, coupled dpdt relay packet
Two states are included, one is measurement level high potential is connect, then quantum chip port connects high potential；Second is to connect measurement level
Low potential, then quantum chip port connects low potential.If should be noted that measure several quantum chip ports and dry measure
Port Impedance between sub- chip port just has electric current to flow through because to there is pressure difference, so by corresponding quantum chip port
One termination high level, another termination low level of quantum chip port.
It 6), in the present embodiment, can be with using the lock-in amplifier programmed acquisition voltage and current data of the host computer
It is connected using cable with host computer and is communicated.Wherein, the voltage data is the voltage value of lock-in amplifier input terminal, described
Current data is the current value of lock-in amplifier output end, and the ratio of voltage value and current value is port resistive.
It is real according to quantum chip for the signal output of the lock-in amplifier is adjusted to test voltage value in step 3)
Border minimum breakdown value setting test voltage is being worth, and test voltage value should be less than the minimum breakdown voltage value of quantum chip, otherwise measure
Sub- chip can be breakdown, test voltage value is generally set as 1/2 minimum breakdown voltage value, but test voltage value can not be too small,
Otherwise more noises can be introduced, cause resultant error bigger than normal.In the present embodiment, quantum chip minimum breakdown voltage value is only
5mV, setting measurement voltage value is 2mV, 2mV voltage is exported from lock-in amplifier voltage output end, using the resistance of BNC cable
Loss is added in voltage between quantum chip port and is less than 2mV, but since cable and quantum chip are concatenated, so locking phase is put
The electric current that big device voltage output end is measured is accurate.
The principle of the measurement method of this quantum chip port impedance test device: lock-in amplifier voltage output end passes through company
It connects cable and exports a small voltage, small voltage is added between several ports of quantum chip, forms faint electric current, at this time locking phase
Amplifier voltage output end can automatic read current value.Meanwhile lock-in amplifier voltage detection terminal also connecting cable, the cable
Other one is also added between several ports of the quantum chip, in this way, the small voltage between several ports of quantum chip is logical
It crosses the cable and transmits one to lock-in amplifier voltage detection terminal, it is small that lock-in amplifier voltage detection terminal can accurately measure this
Voltage, the ratio of voltage and the automatic read current of lock-in amplifier voltage output end energy that lock-in amplifier voltage detection terminal is measured
Value is the impedance value of corresponding several ports of quantum chip.Wherein, cable uses BNC cable in this example.
The measurement method of the utility model provides small signal output and weak-signal measurement using lock-in amplifier, for meeting
Test voltage wants extremely low demand and improves measuring accuracy between quantum chip port, for testing quantum chip port impedance timeliness
Rate is high, easy to operate, measurement is accurate, highly-safe, not will cause the breakdown of quantum chip.
Embodiment 2
With reference to Fig. 2, with embodiment 1 the difference is that the relay array switching circuit is per double-pole double throw relay all the way
Device is connected with single channel filter, and the single channel filter is connected with the quantum chip single port.
As shown in the figure be filter construction and connection type with reference to Fig. 3, relay array switching circuit per all the way with single channel
Filter is connected, and the single channel filter is connected with the quantum chip single port.Single-pole single-throw(SPST relay and quantum chip
Filter form between port is the fertile hereby low pass LC filter of 3 grades of Barts, by 10uF capacitor C1,22uH inductance L, 10uF capacitor
C2 and 22uF capacitor C3 is constituted.The ground terminal of filter should be connected to the low potential (-) of lock-in amplifier output end, the filter
Access have good inhibitory effect to the electromagnetic interference of relay and the surge of switching moments, 22uF capacitor C3, which need to be arranged in, to be leaned on
Nearly quantum chip port, for preventing the induced voltage of opening and closing moment inductance from damaging chip.
Filter between the relay and quantum chip of the utility model can eliminate extraneous and relay and be opened and closed bring
Voltage wave is reduced voltage surge between quantum chip port using filter and carries out drop EMI processing to relay, reduces core
The breakdown probability of piece.
Embodiment 3
In the present embodiment, circuit structure is essentially identical with above-described embodiment, the difference is that, relay array switching
Circuit further includes hilted broadsword relay, and relay array is made of multiple dpdt relays and single-pole single-throw(SPST relay, quantum
Each port of chip respectively corresponds a dpdt relay and a single-pole single-throw(SPST relay, dpdt relay warp
It crosses the hilted broadsword relay and is connected to the quantum chip port.Can be provided in this way for each quantum chip port high level,
Low level and hanging high-impedance state, the more convenient impedance flexibly tested between several ports.
The connection of the connection type, relay array and filter of lock-in amplifier and relay array is shown in Fig. 2
Mode, the connection type of filter and quantum chip and relay permutation building form.Each quantum chip port successively passes through
Wave filter, single-pole single-throw(SPST relay, dpdt relay, lock-in amplifier are connected.
Specifically, quantum chip port is connected with filter by taking some quantum chip port as an example, filter and hilted broadsword list
It throws relay to be connected, the terminal short circuit of dpdt relay common end two is connected with single-pole single-throw(SPST relay again.Double-pole double throw
Relay includes two groups of contacts: one group of contact is normally opened contact, and another group of contact is normally-closed contact, and all there are two ends for every group of contact
Son.Lock-in amplifier voltage output end and voltage detecting input terminal are bnc interface, by BNC cable connection to circuit board,
BNC cable inner conductor is labeled as high level (+), and BNC cable outer conductor is labeled as low level (-), and lock-in amplifier voltage is defeated
The high level (+) of the high level of outlet+and lock-in amplifier voltage detecting input terminal is connect respectively on two normally opened contact terminals,
The low level (-) of the low level (-) of lock-in amplifier voltage output end and lock-in amplifier voltage detecting input terminal is connect respectively
On two normally-closed contact terminals, by the way that corresponding relay on-off reconfigurable measurement channel is arranged, when single-pole single-throw(SPST relay is disconnected
When opening, then corresponding quantum chip port is hanging high-impedance state.When single-pole single-throw(SPST relay closure, coupled double-pole is double
Throwing relay, there are two types of states, and one is measurement level high level (+) is connect, then quantum chip port meets high level (+)；Second
It is the low level (-) for connecing measurement level, then quantum chip port meets low level (-)；To measure several quantum chip ports and
Port Impedance between several quantum chip ports is it is necessary to connecing high level (+) and several for corresponding several quantum chip ports
Corresponding several quantum chip ports meet low level (-).For example, 1 port of quantum chip connects measurement level high level (+), 2 ports
It connecing 1 port and connects measurement level low level (-), other ports are hanging, then the result measured impedance between 1 and 2 port, with
This analogizes, can also survey a port between multiple ports impedance and multiple ports with the impedance between multiple ports.
It should be noted that the quantity of dpdt relay and the quantity of single-pole single-throw(SPST relay should be greater than or equal to
The quantity of quantum die terminals port, in the present embodiment, the quantity of the quantity of dpdt relay and single-pole single-throw(SPST relay,
The quantity of quantum die terminals port is equal.
The hilted broadsword relay that the utility model is connected between dpdt relay and quantum chip port is also applied for hanging
Dead end mouth is external, and the scope of application is wider.
Embodiment 4
With reference to Fig. 2, a kind of quantum chip port impedance test device of the present embodiment, circuit structure and 1 base of embodiment
This is identical, and application artificially solves the problems, such as drop EMI, at the coil both ends of the dpdt relay and the hilted broadsword relay
It is respectively equipped with filter capacitor and diode, common end is equipped with filter, connects filter capacitor between contact.
Coil both ends when parallel connection 10uF capacitor is used to slow down control on-off between two terminals of each relay control coil
The speed of voltage change, to reduce the EMI of relay.Parallel diode between two terminals of each relay control coil,
The cathode of diode will be connected with the high point of power-supply system, and induced current when powering off suddenly for coil in this way provides access,
To reduce induced voltage, reduces the damage to power-supply system, reduce relay coil electromagnetic interference, reduce EMI.
Equal parallel connection 10uF capacitor is used to absorb voltage pulse when being closed between each relay common end and normally-open normally-close terminal contacts, reduces
The amplitude of relay switch closure momentary pulse, effectively prevents the influence of relay breakdown quantum chip.
The quantum chip port impedance test device of the utility model is equipped with filtering at dpdt relay coil both ends
Capacitor and freewheeling diode, common end are equipped with filter, and filter capacitor is connected between contact, and realization has carried out drop EMI to relay
Processing, greatly improves measurement accuracy, electromagnetic security and testing efficiency.
Embodiment 5
A kind of quantum chip port impedance test device of the present embodiment, structure is substantially the same manner as Example 1, more into one
Step: lock-in amplifier can connect PC machine by cable, can directly read locking phase in PC machine when testing chip impedance and put
The electric current of big device output end and the voltage of lock-in amplifier input terminal.
The ratio of the electric current of the voltage and lock-in amplifier output end of lock-in amplifier input terminal is quantum chip port
Impedance, in this way since can online hind computation port Impedance, greatly improve testing efficiency.
Embodiment 6
The lock-in amplifier and institute with reference to Fig. 1, in a kind of quantum chip port impedance test device of the present embodiment
It states relay array switching circuit and passes through BNC cable connection.The lock-in amplifier of the utility model is cut with the relay array
Circuit is changed by BNC cable connection, is equivalent to Kelvin's measuring resistance method, eliminates the influence of test line resistance superposition.This quantum
Chip port impedance test device, using relay array reconfigurable measurement access, by a pair of of BNC connector to several ports it
Between the method that measures of impedance, realize that not having to hand disassembly BNC is to test to complete the impedance of several ports between any two.?
In other embodiments, BNC cable can also be replaced using other paired cables.
Embodiment 7
With reference to Fig. 1 and Fig. 2, in order to enable tester's operation is more convenient, in the present embodiment, connect in the MCU controller
Connect toggle switch.The utility model uses two kinds of man-machine interaction modes of serial ports and toggle switch, greatly facilitates tester, so that
Operation is more flexible.
The reconstruct of the relay array switching circuit array of the present apparatus is controlled by MCU controller, the man-machine friendship of MCU controller
Mutual two ways: one is being arranged by toggle switch, then MCU controller is controlled by the state of scanning toggle switch
The state of relay processed.Second is by communicating with host computer, such as PC machine host computer, and operator passes through PC machine host computer
Software sends instructions to MCU controller, and MCU controller controls the state of corresponding relay according to the instruction received.
There are two kinds of modes of operation of serial communication and manual toggle switch based on the control of MCU controller and human-computer interaction, to grasp
Make relay array reconfigurable measurement circuit, reduce the number that human body is contacted with test device, it is each both to have avoided manual operations replacement
The BNC connector bring electrostatic of a measurement port and maloperation, and measurement efficiency is improved, and toggle switch digit should be greater than
Or it is equal to quantum chip port number.
Embodiment 8
With reference to Fig. 1, the utility model quantum chip port impedance test device further includes circuit board, the MCU controller,
Relay array, USB interface or UART serial ports and the toggle switch of the control relay array switching circuit are set to electricity
On the plate of road.In the present embodiment, relay array switching circuit, toggle switch, MCU controller, USB interface conversion chip and electricity
The source system integration is done on circuit boards.Quantum chip is placed in tooling, is connected to electricity by FPC connector, the FPC line in tooling
On the plate of road, then it is connected with filter, is conveniently replaceable quantum chip to be measured.
Wherein, MCU controller is connected to PC machine by USB interface or UART interface, and host computer is by USB interface to MCU
Controller send instructions.In other embodiments, USB interface can also be substituted using network interface, RS2 interface etc. or UART connects
Mouthful, but network interface hardware and development cost are preferably high, and applicability is not strong.
The MCU controller of the utility model is connected to PC machine by USB interface or UART interface, is connected using USB interface
It is convenient, convenient for operation, need another circumscribed USB to turn UART interface module using UART interface, connection type is more flexible and varied.
Further, opening for the toggle switch for controlling relay, UART serial ports or USB interface is also reserved on circuit board
Disconnected, test board has been reserved the switching selection on a variety of current potential ground or has not been connect, and easily facilitates operator and selects, more just
It is prompt.
Schematically the utility model is created above and embodiments thereof are described, description is not limiting,
Shown in the drawings is also one of the embodiment that the utility model is created, and actual structure is not limited to this.So such as
Those of ordinary skill in the art are inspired by it for fruit, in the case where not departing from this creation objective, not inventively designs
Frame mode similar with the technical solution and embodiment, should belong to the protection scope of this patent.
Claims (9)
1. a kind of quantum chip port impedance test device, which is characterized in that including lock-in amplifier, relay array switching electricity
The output end of road, quantum chip, MCU controller, host computer, the lock-in amplifier connects the relay array switching circuit
Input terminal, the output end of the relay array switching circuit connects the input terminal of the lock-in amplifier, the relay
For array switching circuit per being connected all the way with each port of quantum chip, the relay array switching circuit includes that double-pole is double
Relay is thrown, the dpdt relay connects the MCU controller, and the MCU controller connects host computer.
2. quantum chip port impedance test device according to claim 1, which is characterized in that the relay array switching
Circuit is connected per dpdt relay all the way with single channel filter, the single channel filter and the quantum chip single port
It is connected.
3. quantum chip port impedance test device according to claim 2, which is characterized in that the relay array switching
Circuit further includes hilted broadsword relay, and the dpdt relay is connected to the quantum die terminals by the hilted broadsword relay
Mouthful.
4. quantum chip port impedance test device according to claim 3, which is characterized in that the dpdt relay
It is respectively equipped with filter capacitor and diode with the coil both ends of the hilted broadsword relay, common end is equipped with filter, connects between contact
Connect filter capacitor.
5. quantum chip port impedance test device according to claim 1, which is characterized in that the lock-in amplifier passes through
Cable connects PC machine, the electric current and lock-in amplifier input terminal that there is the PC machine display to read the lock-in amplifier output end
Voltage data outputting module.
6. quantum chip port impedance test device according to claim 1, which is characterized in that the lock-in amplifier and institute
It states relay array switching circuit and passes through BNC cable connection.
7. quantum chip port impedance test device according to claim 1 or 6, which is characterized in that the MCU controller
Connect toggle switch.
8. quantum chip port impedance test device according to claim 7, which is characterized in that the MCU controller is logical
It crosses USB interface or UART interface is connected to host computer.
9. quantum chip port impedance test device according to claim 8, which is characterized in that it further include circuit board, it is described
MCU controller, relay array, USB interface or UART serial ports and the dial-up of the control relay array switching circuit are opened
Pass is set on circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820810194.5U CN208350898U (en) | 2018-05-29 | 2018-05-29 | A kind of quantum chip port impedance test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820810194.5U CN208350898U (en) | 2018-05-29 | 2018-05-29 | A kind of quantum chip port impedance test device |
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| CN208350898U true CN208350898U (en) | 2019-01-08 |
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| CN201820810194.5U Active CN208350898U (en) | 2018-05-29 | 2018-05-29 | A kind of quantum chip port impedance test device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108445293A (en) * | 2018-05-29 | 2018-08-24 | 合肥本源量子计算科技有限责任公司 | A kind of quantum chip port impedance test device and measurement method |
| CN113759862A (en) * | 2020-06-05 | 2021-12-07 | 北京广利核系统工程有限公司 | Signal switching device and signal control method |
| CN117233436A (en) * | 2023-11-15 | 2023-12-15 | 青岛泰睿思微电子有限公司 | Kelvin test switching device and test switching method for discrete device |
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2018
- 2018-05-29 CN CN201820810194.5U patent/CN208350898U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108445293A (en) * | 2018-05-29 | 2018-08-24 | 合肥本源量子计算科技有限责任公司 | A kind of quantum chip port impedance test device and measurement method |
| CN113759862A (en) * | 2020-06-05 | 2021-12-07 | 北京广利核系统工程有限公司 | Signal switching device and signal control method |
| CN117233436A (en) * | 2023-11-15 | 2023-12-15 | 青岛泰睿思微电子有限公司 | Kelvin test switching device and test switching method for discrete device |
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