CN117043215A - Epoxy resin, curable resin composition, and cured product of curable resin composition - Google Patents
Epoxy resin, curable resin composition, and cured product of curable resin composition Download PDFInfo
- Publication number
- CN117043215A CN117043215A CN202280022791.0A CN202280022791A CN117043215A CN 117043215 A CN117043215 A CN 117043215A CN 202280022791 A CN202280022791 A CN 202280022791A CN 117043215 A CN117043215 A CN 117043215A
- Authority
- CN
- China
- Prior art keywords
- parts
- resin composition
- curable resin
- epoxy resin
- epoxy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003822 epoxy resin Substances 0.000 title claims abstract description 68
- 229920000647 polyepoxide Polymers 0.000 title claims abstract description 68
- 239000011342 resin composition Substances 0.000 title claims abstract description 44
- 239000004593 Epoxy Substances 0.000 claims abstract description 23
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims abstract description 5
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims abstract description 5
- 239000011256 inorganic filler Substances 0.000 claims description 17
- 229910003475 inorganic filler Inorganic materials 0.000 claims description 17
- 239000000126 substance Substances 0.000 claims description 10
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 46
- 238000005227 gel permeation chromatography Methods 0.000 description 42
- -1 biphenol Chemical compound 0.000 description 40
- 239000005011 phenolic resin Substances 0.000 description 36
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 33
- 239000002904 solvent Substances 0.000 description 33
- 238000006243 chemical reaction Methods 0.000 description 32
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 32
- 238000005259 measurement Methods 0.000 description 29
- 229920005989 resin Polymers 0.000 description 27
- 239000011347 resin Substances 0.000 description 27
- 230000015572 biosynthetic process Effects 0.000 description 22
- 238000003786 synthesis reaction Methods 0.000 description 21
- 238000012360 testing method Methods 0.000 description 21
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 20
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 20
- 238000010438 heat treatment Methods 0.000 description 18
- 239000012044 organic layer Substances 0.000 description 18
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 16
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 16
- 150000002989 phenols Chemical class 0.000 description 15
- RGHHSNMVTDWUBI-UHFFFAOYSA-N 4-hydroxybenzaldehyde Chemical compound OC1=CC=C(C=O)C=C1 RGHHSNMVTDWUBI-UHFFFAOYSA-N 0.000 description 14
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 14
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 14
- BRLQWZUYTZBJKN-UHFFFAOYSA-N Epichlorohydrin Chemical compound ClCC1CO1 BRLQWZUYTZBJKN-UHFFFAOYSA-N 0.000 description 13
- 230000000052 comparative effect Effects 0.000 description 13
- 239000000047 product Substances 0.000 description 13
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 12
- 239000000853 adhesive Substances 0.000 description 12
- 230000001070 adhesive effect Effects 0.000 description 12
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 12
- 239000000203 mixture Substances 0.000 description 12
- 229910052757 nitrogen Inorganic materials 0.000 description 11
- 238000005979 thermal decomposition reaction Methods 0.000 description 11
- 230000000930 thermomechanical effect Effects 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 10
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 10
- 150000001875 compounds Chemical class 0.000 description 10
- 238000001816 cooling Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 10
- 238000010926 purge Methods 0.000 description 10
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 10
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 9
- 239000007787 solid Substances 0.000 description 9
- 239000000243 solution Substances 0.000 description 9
- XOUQAVYLRNOXDO-UHFFFAOYSA-N 2-tert-butyl-5-methylphenol Chemical compound CC1=CC=C(C(C)(C)C)C(O)=C1 XOUQAVYLRNOXDO-UHFFFAOYSA-N 0.000 description 8
- 239000000654 additive Substances 0.000 description 8
- 150000008044 alkali metal hydroxides Chemical class 0.000 description 8
- 239000003054 catalyst Substances 0.000 description 8
- 239000003795 chemical substances by application Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000002156 mixing Methods 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- IKEHOXWJQXIQAG-UHFFFAOYSA-N 2-tert-butyl-4-methylphenol Chemical compound CC1=CC=C(O)C(C(C)(C)C)=C1 IKEHOXWJQXIQAG-UHFFFAOYSA-N 0.000 description 7
- 238000011156 evaluation Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 229910000077 silane Inorganic materials 0.000 description 7
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 7
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 6
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 6
- 230000000996 additive effect Effects 0.000 description 6
- 125000003545 alkoxy group Chemical group 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 6
- HUMNYLRZRPPJDN-UHFFFAOYSA-N benzaldehyde Chemical compound O=CC1=CC=CC=C1 HUMNYLRZRPPJDN-UHFFFAOYSA-N 0.000 description 6
- 239000004203 carnauba wax Substances 0.000 description 6
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 6
- 239000004848 polyfunctional curative Substances 0.000 description 6
- 239000000843 powder Substances 0.000 description 6
- 238000007789 sealing Methods 0.000 description 6
- 229930185605 Bisphenol Natural products 0.000 description 5
- 239000006087 Silane Coupling Agent Substances 0.000 description 5
- 125000003118 aryl group Chemical group 0.000 description 5
- 239000004305 biphenyl Substances 0.000 description 5
- 235000010290 biphenyl Nutrition 0.000 description 5
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 5
- 239000007822 coupling agent Substances 0.000 description 5
- 238000004821 distillation Methods 0.000 description 5
- 125000000524 functional group Chemical group 0.000 description 5
- 239000005350 fused silica glass Substances 0.000 description 5
- 239000000499 gel Substances 0.000 description 5
- 239000006082 mold release agent Substances 0.000 description 5
- 238000000465 moulding Methods 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- MYRTYDVEIRVNKP-UHFFFAOYSA-N 1,2-Divinylbenzene Chemical compound C=CC1=CC=CC=C1C=C MYRTYDVEIRVNKP-UHFFFAOYSA-N 0.000 description 4
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 4
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- RRHGJUQNOFWUDK-UHFFFAOYSA-N Isoprene Chemical compound CC(=C)C=C RRHGJUQNOFWUDK-UHFFFAOYSA-N 0.000 description 4
- 230000002411 adverse Effects 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 4
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 4
- 230000018044 dehydration Effects 0.000 description 4
- 238000006297 dehydration reaction Methods 0.000 description 4
- DMBHHRLKUKUOEG-UHFFFAOYSA-N diphenylamine Chemical compound C=1C=CC=CC=1NC1=CC=CC=C1 DMBHHRLKUKUOEG-UHFFFAOYSA-N 0.000 description 4
- 230000006872 improvement Effects 0.000 description 4
- QNGNSVIICDLXHT-UHFFFAOYSA-N para-ethylbenzaldehyde Natural products CCC1=CC=C(C=O)C=C1 QNGNSVIICDLXHT-UHFFFAOYSA-N 0.000 description 4
- YGSDEFSMJLZEOE-UHFFFAOYSA-N salicylic acid Chemical compound OC(=O)C1=CC=CC=C1O YGSDEFSMJLZEOE-UHFFFAOYSA-N 0.000 description 4
- 239000000741 silica gel Substances 0.000 description 4
- 229910002027 silica gel Inorganic materials 0.000 description 4
- AYEKOFBPNLCAJY-UHFFFAOYSA-O thiamine pyrophosphate Chemical compound CC1=C(CCOP(O)(=O)OP(O)(O)=O)SC=[N+]1CC1=CN=C(C)N=C1N AYEKOFBPNLCAJY-UHFFFAOYSA-O 0.000 description 4
- 238000001721 transfer moulding Methods 0.000 description 4
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 4
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical class C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 3
- 239000004793 Polystyrene Substances 0.000 description 3
- 150000001299 aldehydes Chemical class 0.000 description 3
- 239000004918 carbon fiber reinforced polymer Substances 0.000 description 3
- 239000000835 fiber Substances 0.000 description 3
- 230000009477 glass transition Effects 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 239000003973 paint Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 229920000573 polyethylene Polymers 0.000 description 3
- 229920002223 polystyrene Polymers 0.000 description 3
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- 239000000565 sealant Substances 0.000 description 3
- 239000003566 sealing material Substances 0.000 description 3
- 238000005406 washing Methods 0.000 description 3
- KJPRLNWUNMBNBZ-QPJJXVBHSA-N (E)-cinnamaldehyde Chemical class O=C\C=C\C1=CC=CC=C1 KJPRLNWUNMBNBZ-QPJJXVBHSA-N 0.000 description 2
- SDRZFSPCVYEJTP-UHFFFAOYSA-N 1-ethenylcyclohexene Chemical compound C=CC1=CCCCC1 SDRZFSPCVYEJTP-UHFFFAOYSA-N 0.000 description 2
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical class C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 2
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 2
- UFERIGCCDYCZLN-UHFFFAOYSA-N 3a,4,7,7a-tetrahydro-1h-indene Chemical compound C1C=CCC2CC=CC21 UFERIGCCDYCZLN-UHFFFAOYSA-N 0.000 description 2
- INYHZQLKOKTDAI-UHFFFAOYSA-N 5-ethenylbicyclo[2.2.1]hept-2-ene Chemical compound C1C2C(C=C)CC1C=C2 INYHZQLKOKTDAI-UHFFFAOYSA-N 0.000 description 2
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 2
- SXRSQZLOMIGNAQ-UHFFFAOYSA-N Glutaraldehyde Chemical class O=CCCCC=O SXRSQZLOMIGNAQ-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical class OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- AFBPFSWMIHJQDM-UHFFFAOYSA-N N-methylaniline Chemical compound CNC1=CC=CC=C1 AFBPFSWMIHJQDM-UHFFFAOYSA-N 0.000 description 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 238000007259 addition reaction Methods 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- VSCWAEJMTAWNJL-UHFFFAOYSA-K aluminium trichloride Chemical compound Cl[Al](Cl)Cl VSCWAEJMTAWNJL-UHFFFAOYSA-K 0.000 description 2
- 150000001408 amides Chemical class 0.000 description 2
- 150000003935 benzaldehydes Chemical class 0.000 description 2
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- VHRGRCVQAFMJIZ-UHFFFAOYSA-N cadaverine Chemical compound NCCCCCN VHRGRCVQAFMJIZ-UHFFFAOYSA-N 0.000 description 2
- 235000013869 carnauba wax Nutrition 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- KJPRLNWUNMBNBZ-UHFFFAOYSA-N cinnamic aldehyde Chemical class O=CC=CC1=CC=CC=C1 KJPRLNWUNMBNBZ-UHFFFAOYSA-N 0.000 description 2
- 229940117916 cinnamic aldehyde Drugs 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- MLUCVPSAIODCQM-NSCUHMNNSA-N crotonaldehyde Chemical class C\C=C\C=O MLUCVPSAIODCQM-NSCUHMNNSA-N 0.000 description 2
- MLUCVPSAIODCQM-UHFFFAOYSA-N crotonaldehyde Chemical class CC=CC=O MLUCVPSAIODCQM-UHFFFAOYSA-N 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 150000005205 dihydroxybenzenes Chemical class 0.000 description 2
- 239000000539 dimer Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000012776 electronic material Substances 0.000 description 2
- 238000006735 epoxidation reaction Methods 0.000 description 2
- 229910052839 forsterite Inorganic materials 0.000 description 2
- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- QQVIHTHCMHWDBS-UHFFFAOYSA-N isophthalic acid Chemical compound OC(=O)C1=CC=CC(C(O)=O)=C1 QQVIHTHCMHWDBS-UHFFFAOYSA-N 0.000 description 2
- 150000002576 ketones Chemical class 0.000 description 2
- 238000004898 kneading Methods 0.000 description 2
- HCWCAKKEBCNQJP-UHFFFAOYSA-N magnesium orthosilicate Chemical compound [Mg+2].[Mg+2].[O-][Si]([O-])([O-])[O-] HCWCAKKEBCNQJP-UHFFFAOYSA-N 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- 239000012170 montan wax Substances 0.000 description 2
- NXPPAOGUKPJVDI-UHFFFAOYSA-N naphthalene-1,2-diol Chemical class C1=CC=CC2=C(O)C(O)=CC=C21 NXPPAOGUKPJVDI-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N naphthalene-acid Natural products C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- 150000004780 naphthols Chemical class 0.000 description 2
- SJYNFBVQFBRSIB-UHFFFAOYSA-N norbornadiene Chemical compound C1=CC2C=CC1C2 SJYNFBVQFBRSIB-UHFFFAOYSA-N 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 230000008520 organization Effects 0.000 description 2
- FJKROLUGYXJWQN-UHFFFAOYSA-N papa-hydroxy-benzoic acid Natural products OC(=O)C1=CC=C(O)C=C1 FJKROLUGYXJWQN-UHFFFAOYSA-N 0.000 description 2
- ZWLUXSQADUDCSB-UHFFFAOYSA-N phthalaldehyde Chemical class O=CC1=CC=CC=C1C=O ZWLUXSQADUDCSB-UHFFFAOYSA-N 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
- 239000002798 polar solvent Substances 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- 230000001737 promoting effect Effects 0.000 description 2
- KIDHWZJUCRJVML-UHFFFAOYSA-N putrescine Chemical compound NCCCCN KIDHWZJUCRJVML-UHFFFAOYSA-N 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 238000001953 recrystallisation Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000001226 reprecipitation Methods 0.000 description 2
- 238000007363 ring formation reaction Methods 0.000 description 2
- 229960004889 salicylic acid Drugs 0.000 description 2
- HHVIBTZHLRERCL-UHFFFAOYSA-N sulfonyldimethane Chemical compound CS(C)(=O)=O HHVIBTZHLRERCL-UHFFFAOYSA-N 0.000 description 2
- 150000003505 terpenes Chemical class 0.000 description 2
- 235000007586 terpenes Nutrition 0.000 description 2
- IMNIMPAHZVJRPE-UHFFFAOYSA-N triethylenediamine Chemical compound C1CN2CCN1CC2 IMNIMPAHZVJRPE-UHFFFAOYSA-N 0.000 description 2
- 239000002966 varnish Substances 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 239000001993 wax Substances 0.000 description 2
- 239000008096 xylene Substances 0.000 description 2
- JIAARYAFYJHUJI-UHFFFAOYSA-L zinc dichloride Chemical compound [Cl-].[Cl-].[Zn+2] JIAARYAFYJHUJI-UHFFFAOYSA-L 0.000 description 2
- LTVUCOSIZFEASK-MPXCPUAZSA-N (3ar,4s,7r,7as)-3a-methyl-3a,4,7,7a-tetrahydro-4,7-methano-2-benzofuran-1,3-dione Chemical compound C([C@H]1C=C2)[C@H]2[C@H]2[C@]1(C)C(=O)OC2=O LTVUCOSIZFEASK-MPXCPUAZSA-N 0.000 description 1
- MUTGBJKUEZFXGO-OLQVQODUSA-N (3as,7ar)-3a,4,5,6,7,7a-hexahydro-2-benzofuran-1,3-dione Chemical compound C1CCC[C@@H]2C(=O)OC(=O)[C@@H]21 MUTGBJKUEZFXGO-OLQVQODUSA-N 0.000 description 1
- KMOUUZVZFBCRAM-OLQVQODUSA-N (3as,7ar)-3a,4,7,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C=CC[C@@H]2C(=O)OC(=O)[C@@H]21 KMOUUZVZFBCRAM-OLQVQODUSA-N 0.000 description 1
- HEVMDQBCAHEHDY-UHFFFAOYSA-N (Dimethoxymethyl)benzene Chemical compound COC(OC)C1=CC=CC=C1 HEVMDQBCAHEHDY-UHFFFAOYSA-N 0.000 description 1
- FMGGHNGKHRCJLL-UHFFFAOYSA-N 1,2-bis(chloromethyl)benzene Chemical group ClCC1=CC=CC=C1CCl FMGGHNGKHRCJLL-UHFFFAOYSA-N 0.000 description 1
- GEYOCULIXLDCMW-UHFFFAOYSA-N 1,2-phenylenediamine Chemical compound NC1=CC=CC=C1N GEYOCULIXLDCMW-UHFFFAOYSA-N 0.000 description 1
- 125000001989 1,3-phenylene group Chemical group [H]C1=C([H])C([*:1])=C([H])C([*:2])=C1[H] 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- 125000001140 1,4-phenylene group Chemical group [H]C1=C([H])C([*:2])=C([H])C([H])=C1[*:1] 0.000 description 1
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 1
- DNMIWTRPMLDNKJ-UHFFFAOYSA-N 1-(dichloromethyl)-2-phenylbenzene Chemical group ClC(Cl)C1=CC=CC=C1C1=CC=CC=C1 DNMIWTRPMLDNKJ-UHFFFAOYSA-N 0.000 description 1
- BCCNTWSBUIVXFE-UHFFFAOYSA-N 1-(dimethoxymethyl)-2-phenylbenzene Chemical group COC(OC)C1=CC=CC=C1C1=CC=CC=C1 BCCNTWSBUIVXFE-UHFFFAOYSA-N 0.000 description 1
- RWNUSVWFHDHRCJ-UHFFFAOYSA-N 1-butoxypropan-2-ol Chemical compound CCCCOCC(C)O RWNUSVWFHDHRCJ-UHFFFAOYSA-N 0.000 description 1
- IYSVFZBXZVPIFA-UHFFFAOYSA-N 1-ethenyl-4-(4-ethenylphenyl)benzene Chemical group C1=CC(C=C)=CC=C1C1=CC=C(C=C)C=C1 IYSVFZBXZVPIFA-UHFFFAOYSA-N 0.000 description 1
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 1
- LNETULKMXZVUST-UHFFFAOYSA-N 1-naphthoic acid Chemical compound C1=CC=C2C(C(=O)O)=CC=CC2=C1 LNETULKMXZVUST-UHFFFAOYSA-N 0.000 description 1
- 102100026205 1-phosphatidylinositol 4,5-bisphosphate phosphodiesterase gamma-1 Human genes 0.000 description 1
- VILCJCGEZXAXTO-UHFFFAOYSA-N 2,2,2-tetramine Chemical compound NCCNCCNCCN VILCJCGEZXAXTO-UHFFFAOYSA-N 0.000 description 1
- PISLZQACAJMAIO-UHFFFAOYSA-N 2,4-diethyl-6-methylbenzene-1,3-diamine Chemical compound CCC1=CC(C)=C(N)C(CC)=C1N PISLZQACAJMAIO-UHFFFAOYSA-N 0.000 description 1
- FUIQBJHUESBZNU-UHFFFAOYSA-N 2-[(dimethylazaniumyl)methyl]phenolate Chemical compound CN(C)CC1=CC=CC=C1O FUIQBJHUESBZNU-UHFFFAOYSA-N 0.000 description 1
- LYXAQAXLWMRPOZ-UHFFFAOYSA-N 2-[1-(2-aminophenyl)-9h-fluoren-2-yl]aniline Chemical compound NC1=CC=CC=C1C1=CC=C(C=2C(=CC=CC=2)C2)C2=C1C1=CC=CC=C1N LYXAQAXLWMRPOZ-UHFFFAOYSA-N 0.000 description 1
- PQAMFDRRWURCFQ-UHFFFAOYSA-N 2-ethyl-1h-imidazole Chemical compound CCC1=NC=CN1 PQAMFDRRWURCFQ-UHFFFAOYSA-N 0.000 description 1
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 1
- ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 2-phenyl-1h-imidazole Chemical compound C1=CNC(C=2C=CC=CC=2)=N1 ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 0.000 description 1
- ZBMISJGHVWNWTE-UHFFFAOYSA-N 3-(4-aminophenoxy)aniline Chemical compound C1=CC(N)=CC=C1OC1=CC=CC(N)=C1 ZBMISJGHVWNWTE-UHFFFAOYSA-N 0.000 description 1
- RNLHGQLZWXBQNY-UHFFFAOYSA-N 3-(aminomethyl)-3,5,5-trimethylcyclohexan-1-amine Chemical compound CC1(C)CC(N)CC(C)(CN)C1 RNLHGQLZWXBQNY-UHFFFAOYSA-N 0.000 description 1
- YGYGASJNJTYNOL-CQSZACIVSA-N 3-[(4r)-2,2-dimethyl-1,1-dioxothian-4-yl]-5-(4-fluorophenyl)-1h-indole-7-carboxamide Chemical compound C1CS(=O)(=O)C(C)(C)C[C@@H]1C1=CNC2=C(C(N)=O)C=C(C=3C=CC(F)=CC=3)C=C12 YGYGASJNJTYNOL-CQSZACIVSA-N 0.000 description 1
- MIHQWNKDHBLQEZ-UHFFFAOYSA-N 3-tert-butyl-2-methylphenol Chemical compound CC1=C(O)C=CC=C1C(C)(C)C MIHQWNKDHBLQEZ-UHFFFAOYSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- KHYXYOGWAIYVBD-UHFFFAOYSA-N 4-(4-propylphenoxy)aniline Chemical compound C1=CC(CCC)=CC=C1OC1=CC=C(N)C=C1 KHYXYOGWAIYVBD-UHFFFAOYSA-N 0.000 description 1
- QKEUMLXGHGAUQG-UHFFFAOYSA-N 4-[4-[1-(4-aminophenoxy)cyclohexa-2,4-dien-1-yl]phenoxy]aniline Chemical group C1=CC(N)=CC=C1OC1=CC=C(C2(C=CC=CC2)OC=2C=CC(N)=CC=2)C=C1 QKEUMLXGHGAUQG-UHFFFAOYSA-N 0.000 description 1
- UTDAGHZGKXPRQI-UHFFFAOYSA-N 4-[4-[4-(4-aminophenoxy)phenyl]sulfonylphenoxy]aniline Chemical compound C1=CC(N)=CC=C1OC1=CC=C(S(=O)(=O)C=2C=CC(OC=3C=CC(N)=CC=3)=CC=2)C=C1 UTDAGHZGKXPRQI-UHFFFAOYSA-N 0.000 description 1
- AOFIWCXMXPVSAZ-UHFFFAOYSA-N 4-methyl-2,6-bis(methylsulfanyl)benzene-1,3-diamine Chemical compound CSC1=CC(C)=C(N)C(SC)=C1N AOFIWCXMXPVSAZ-UHFFFAOYSA-N 0.000 description 1
- ULKLGIFJWFIQFF-UHFFFAOYSA-N 5K8XI641G3 Chemical compound CCC1=NC=C(C)N1 ULKLGIFJWFIQFF-UHFFFAOYSA-N 0.000 description 1
- MWSKJDNQKGCKPA-UHFFFAOYSA-N 6-methyl-3a,4,5,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1CC(C)=CC2C(=O)OC(=O)C12 MWSKJDNQKGCKPA-UHFFFAOYSA-N 0.000 description 1
- 101100190617 Arabidopsis thaliana PLC2 gene Proteins 0.000 description 1
- 101100190618 Arabidopsis thaliana PLC3 gene Proteins 0.000 description 1
- 101100408456 Arabidopsis thaliana PLC8 gene Proteins 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- 239000005711 Benzoic acid Substances 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 101100464304 Caenorhabditis elegans plk-3 gene Proteins 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- BKJLNJYDEMKREK-UHFFFAOYSA-N FNB(F)F Chemical class FNB(F)F BKJLNJYDEMKREK-UHFFFAOYSA-N 0.000 description 1
- 101000691599 Homo sapiens 1-phosphatidylinositol 4,5-bisphosphate phosphodiesterase gamma-1 Proteins 0.000 description 1
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 1
- OYHQOLUKZRVURQ-HZJYTTRNSA-N Linoleic acid Chemical compound CCCCC\C=C/C\C=C/CCCCCCCC(O)=O OYHQOLUKZRVURQ-HZJYTTRNSA-N 0.000 description 1
- OKIZCWYLBDKLSU-UHFFFAOYSA-M N,N,N-Trimethylmethanaminium chloride Chemical compound [Cl-].C[N+](C)(C)C OKIZCWYLBDKLSU-UHFFFAOYSA-M 0.000 description 1
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000005062 Polybutadiene Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 101100093534 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) RPS1B gene Proteins 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 235000021355 Stearic acid Nutrition 0.000 description 1
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 1
- 235000010724 Wisteria floribunda Nutrition 0.000 description 1
- PFJGMUWBVMNSSU-UHFFFAOYSA-N [2-(hydroxymethyl)-3-phenylphenyl]methanol Chemical compound OCC1=CC=CC(C=2C=CC=CC=2)=C1CO PFJGMUWBVMNSSU-UHFFFAOYSA-N 0.000 description 1
- XMUZQOKACOLCSS-UHFFFAOYSA-N [2-(hydroxymethyl)phenyl]methanol Chemical compound OCC1=CC=CC=C1CO XMUZQOKACOLCSS-UHFFFAOYSA-N 0.000 description 1
- QLBRROYTTDFLDX-UHFFFAOYSA-N [3-(aminomethyl)cyclohexyl]methanamine Chemical compound NCC1CCCC(CN)C1 QLBRROYTTDFLDX-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000021736 acetylation Effects 0.000 description 1
- 238000006640 acetylation reaction Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000008065 acid anhydrides Chemical class 0.000 description 1
- 239000011825 aerospace material Substances 0.000 description 1
- 125000002723 alicyclic group Chemical group 0.000 description 1
- 150000005215 alkyl ethers Chemical class 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 235000019270 ammonium chloride Nutrition 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- 150000001491 aromatic compounds Chemical class 0.000 description 1
- 239000003849 aromatic solvent Substances 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- HFACYLZERDEVSX-UHFFFAOYSA-N benzidine Chemical compound C1=CC(N)=CC=C1C1=CC=C(N)C=C1 HFACYLZERDEVSX-UHFFFAOYSA-N 0.000 description 1
- 235000010233 benzoic acid Nutrition 0.000 description 1
- KXHPPCXNWTUNSB-UHFFFAOYSA-M benzyl(trimethyl)azanium;chloride Chemical compound [Cl-].C[N+](C)(C)CC1=CC=CC=C1 KXHPPCXNWTUNSB-UHFFFAOYSA-M 0.000 description 1
- XMSVKICKONKVNM-UHFFFAOYSA-N bicyclo[2.2.1]heptane-3,4-diamine Chemical compound C1CC2(N)C(N)CC1C2 XMSVKICKONKVNM-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000007767 bonding agent Substances 0.000 description 1
- 150000001642 boronic acid derivatives Chemical class 0.000 description 1
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 239000000378 calcium silicate Substances 0.000 description 1
- 229910052918 calcium silicate Inorganic materials 0.000 description 1
- OYACROKNLOSFPA-UHFFFAOYSA-N calcium;dioxido(oxo)silane Chemical compound [Ca+2].[O-][Si]([O-])=O OYACROKNLOSFPA-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000006229 carbon black Substances 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 238000003763 carbonization Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000013522 chelant Substances 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000000748 compression moulding Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- XCJYREBRNVKWGJ-UHFFFAOYSA-N copper(II) phthalocyanine Chemical compound [Cu+2].C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 XCJYREBRNVKWGJ-UHFFFAOYSA-N 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 229910002026 crystalline silica Inorganic materials 0.000 description 1
- 239000004643 cyanate ester Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 150000004985 diamines Chemical class 0.000 description 1
- 125000004772 dichloromethyl group Chemical group [H]C(Cl)(Cl)* 0.000 description 1
- QGBSISYHAICWAH-UHFFFAOYSA-N dicyandiamide Chemical compound NC(N)=NC#N QGBSISYHAICWAH-UHFFFAOYSA-N 0.000 description 1
- 235000014113 dietary fatty acids Nutrition 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 1
- 238000004455 differential thermal analysis Methods 0.000 description 1
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- CZZYITDELCSZES-UHFFFAOYSA-N diphenylmethane Chemical compound C=1C=CC=CC=1CC1=CC=CC=C1 CZZYITDELCSZES-UHFFFAOYSA-N 0.000 description 1
- ZZTCPWRAHWXWCH-UHFFFAOYSA-N diphenylmethanediamine Chemical compound C=1C=CC=CC=1C(N)(N)C1=CC=CC=C1 ZZTCPWRAHWXWCH-UHFFFAOYSA-N 0.000 description 1
- GPAYUJZHTULNBE-UHFFFAOYSA-N diphenylphosphine Chemical compound C=1C=CC=CC=1PC1=CC=CC=C1 GPAYUJZHTULNBE-UHFFFAOYSA-N 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 150000002118 epoxides Chemical class 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 239000004210 ether based solvent Substances 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 239000000194 fatty acid Substances 0.000 description 1
- 229930195729 fatty acid Natural products 0.000 description 1
- 150000004665 fatty acids Chemical class 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 150000002357 guanidines Chemical class 0.000 description 1
- 229940083094 guanine derivative acting on arteriolar smooth muscle Drugs 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 150000002460 imidazoles Chemical class 0.000 description 1
- 238000001802 infusion Methods 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 229910001504 inorganic chloride Inorganic materials 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000003456 ion exchange resin Substances 0.000 description 1
- 229920003303 ion-exchange polymer Polymers 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- 125000001261 isocyanato group Chemical group *N=C=O 0.000 description 1
- 239000005453 ketone based solvent Substances 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000003562 lightweight material Substances 0.000 description 1
- 235000020778 linoleic acid Nutrition 0.000 description 1
- OYHQOLUKZRVURQ-IXWMQOLASA-N linoleic acid Natural products CCCCC\C=C/C\C=C\CCCCCCCC(O)=O OYHQOLUKZRVURQ-IXWMQOLASA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229940018564 m-phenylenediamine Drugs 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002736 metal compounds Chemical class 0.000 description 1
- 229940098779 methanesulfonic acid Drugs 0.000 description 1
- VYKXQOYUCMREIS-UHFFFAOYSA-N methylhexahydrophthalic anhydride Chemical compound C1CCCC2C(=O)OC(=O)C21C VYKXQOYUCMREIS-UHFFFAOYSA-N 0.000 description 1
- 239000012778 molding material Substances 0.000 description 1
- JGGQWILNAAODRS-UHFFFAOYSA-N n-methyl-4-[4-(methylamino)phenyl]aniline Chemical compound C1=CC(NC)=CC=C1C1=CC=C(NC)C=C1 JGGQWILNAAODRS-UHFFFAOYSA-N 0.000 description 1
- NTNWKDHZTDQSST-UHFFFAOYSA-N naphthalene-1,2-diamine Chemical compound C1=CC=CC2=C(N)C(N)=CC=C21 NTNWKDHZTDQSST-UHFFFAOYSA-N 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 239000012766 organic filler Substances 0.000 description 1
- AFEQENGXSMURHA-UHFFFAOYSA-N oxiran-2-ylmethanamine Chemical compound NCC1CO1 AFEQENGXSMURHA-UHFFFAOYSA-N 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000010412 perfusion Effects 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- 150000004714 phosphonium salts Chemical class 0.000 description 1
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920006122 polyamide resin Polymers 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920001955 polyphenylene ether Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- YLLIGHVCTUPGEH-UHFFFAOYSA-M potassium;ethanol;hydroxide Chemical compound [OH-].[K+].CCO YLLIGHVCTUPGEH-UHFFFAOYSA-M 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
- AOHJOMMDDJHIJH-UHFFFAOYSA-N propylenediamine Chemical compound CC(N)CN AOHJOMMDDJHIJH-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 239000011369 resultant mixture Substances 0.000 description 1
- 238000006798 ring closing metathesis reaction Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 125000005504 styryl group Chemical group 0.000 description 1
- PXQLVRUNWNTZOS-UHFFFAOYSA-N sulfanyl Chemical class [SH] PXQLVRUNWNTZOS-UHFFFAOYSA-N 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- 150000003457 sulfones Chemical class 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 239000012085 test solution Substances 0.000 description 1
- DDFYFBUWEBINLX-UHFFFAOYSA-M tetramethylammonium bromide Chemical compound [Br-].C[N+](C)(C)C DDFYFBUWEBINLX-UHFFFAOYSA-M 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- KSBAEPSJVUENNK-UHFFFAOYSA-L tin(ii) 2-ethylhexanoate Chemical compound [Sn+2].CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O KSBAEPSJVUENNK-UHFFFAOYSA-L 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- TUQOTMZNTHZOKS-UHFFFAOYSA-N tributylphosphine Chemical compound CCCCP(CCCC)CCCC TUQOTMZNTHZOKS-UHFFFAOYSA-N 0.000 description 1
- SRPWOOOHEPICQU-UHFFFAOYSA-N trimellitic anhydride Chemical compound OC(=O)C1=CC=C2C(=O)OC(=O)C2=C1 SRPWOOOHEPICQU-UHFFFAOYSA-N 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 239000003643 water by type Substances 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
- 125000006839 xylylene group Chemical group 0.000 description 1
- 239000011592 zinc chloride Substances 0.000 description 1
- 235000005074 zinc chloride Nutrition 0.000 description 1
- 229910052845 zircon Inorganic materials 0.000 description 1
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/02—Polycondensates containing more than one epoxy group per molecule
- C08G59/04—Polycondensates containing more than one epoxy group per molecule of polyhydroxy compounds with epihalohydrins or precursors thereof
- C08G59/06—Polycondensates containing more than one epoxy group per molecule of polyhydroxy compounds with epihalohydrins or precursors thereof of polyhydric phenols
- C08G59/08—Polycondensates containing more than one epoxy group per molecule of polyhydroxy compounds with epihalohydrins or precursors thereof of polyhydric phenols from phenol-aldehyde condensates
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/32—Epoxy compounds containing three or more epoxy groups
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/01—Use of inorganic substances as compounding ingredients characterized by their specific function
- C08K3/013—Fillers, pigments or reinforcing additives
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Epoxy Resins (AREA)
Abstract
The invention provides an epoxy resin and a curable resin composition, which have excellent heat resistance and tracking resistance of a cured product thereof. An epoxy resin having a value obtained by dividing the epoxy equivalent (g/eq.) by the softening point (DEG C) of 2.0 or more and less than 2.2, represented by the following formula (1). ( In the formula (1), a plurality of R independently exist and represent methyl or hydrogen atoms; n is the average value of repetition number and is a real number of 1-10 )
Description
Technical Field
The present invention relates to an epoxy resin having a specific structure, a curable resin composition, and a cured product of the curable resin composition.
Background
Epoxy resins are widely used in the fields of electric and electronic fields such as casting molded articles, laminated boards, and integrated circuit (integrated circuit, IC) sealing materials, structural materials, adhesives, and paints, because they are excellent in electric properties (dielectric constant/dielectric loss tangent, insulation), mechanical properties, adhesion, thermal properties (heat resistance, etc.), and the like.
In recent years, in the electric and electronic fields, further improvements in properties such as improvement in flame retardancy, moisture resistance, adhesion, dielectric properties, and the like, higher purity, reduction in viscosity for highly filling a filler (inorganic filler or organic filler), and improvement in reactivity for shortening a molding cycle have been demanded for resin compositions (patent document 1). In addition, as a structural material, a lightweight material having excellent mechanical properties is required for aerospace materials, leisure/sports equipment applications, and the like.
In the field of semiconductor sealing, the substrate (substrate itself or its peripheral material) is complicated by the reduction in thickness, stacking, systemization, and three-dimensional formation of the semiconductor with the transition of the semiconductor, and a very high level of required characteristics such as heat resistance and high fluidity are required. In particular, as plastic packaging expands in vehicle applications, the demand for improved heat resistance becomes more stringent. Specifically, with the rise in driving temperature of semiconductors, very high heat resistance is required, and in recent years, there is a trend toward a wide bandgap semiconductor, and it is also required to cope with driving temperatures of 175 ℃ or even 200 ℃ or higher. For the driving temperature, the peripheral member is required to have sufficient heat resistance (Tg in glass transition temperature (Tg), particularly in thermo-mechanical characteristics (thermo-mechanical analysis (thermomechanical analysis, TMA)). Specifically, a temperature higher than the driving temperature by about 10% (in the case of 200 ℃, tg of 220 ℃ or higher, for example 225 ℃) is required, and the temperature is required to be increased year by year (non-patent document 1).
In recent years, among demands for electric vehicles and the like, demands for high-voltage power devices have been rapidly increased, and tracking resistance has been paid attention to. In addition, in applications such as solar power generation, wind power generation, and Electric Vehicles (EVs), tracking resistance is also important, and in particular, in severe applications, it is required that the tracking index (Comparative Tracking Index, CTI) exceeds 600.
Prior art literature
Patent literature
Patent document 1: japanese patent laid-open publication No. 2019-001841
Non-patent literature
Non-patent document 1: fuji motor technical report 2016, volume 89, 4, pages 247-250 (2016vol.89No.4 247-250)
Disclosure of Invention
Problems to be solved by the invention
Generally, an aromatic crosslinking unit is sometimes introduced for the purpose of improving the heat resistance of the resin composition, but in this case, since the main skeleton is aromatic, carbonization is easy and tracking resistance is lowered. In addition, when the heat resistance is improved by increasing the molecular weight, the molecular weight increases, so that the thermal decomposition temperature increases, and the tracking resistance decreases. That is, heat resistance has a trade-off relationship with the tracking characteristic, so it is very difficult to remove the tracking characteristic while maintaining heat resistance. Further, when a resin containing a multi-sensory aromatic compound is blended in order to impart properties such as flame retardancy, the tracking resistance is liable to deteriorate, and it is difficult to achieve both high tracking resistance and flame retardancy.
In general, material performance ratings (performance level category, PLC) are set according to the value of CTI. Since the PLC is classified into a smaller one, the size (surface distance) of the design of the device can be reduced, and the PLC is preferably 3 or less, and particularly preferably 1 or less.
Further, the PLC and CTI have the following relationship.
PLC1: CTI600 or more, PLC2: CTI400 or more and less than 600, PLC3:250 or more and less than 400, plc4:100 or more and less than 175, plc5: less than 100.
The present application has been made in view of such circumstances, and an object thereof is to provide an epoxy resin and a curable resin composition which are excellent in heat resistance and tracking resistance of cured products thereof.
Technical means for solving the problems
The present inventors have made an effort to solve the above problems, and as a result, have completed the present application. That is, the present application relates to the following [1] to [3]. In the present application, "(numerical values 1) to" (numerical value 2) "means that the upper and lower limit values are included.
[1]
An epoxy resin having a value obtained by dividing the epoxy equivalent (g/eq.) by the softening point (DEG C) of 2.0 or more and less than 2.2, represented by the following formula (1).
[ chemical 1]
(in the formula (1), R in the presence of a plurality of R independently represents methyl or hydrogen atom, n is the average value of repetition number and is a real number of 1-10)
[2]
A curable resin composition comprising the epoxy resin according to the above item [1 ].
[3]
The curable resin composition according to the preceding item [2], wherein the content of the inorganic filler is 74% by weight or more and 95% by weight or less in the total amount of the curable resin composition.
[4]
A cured product obtained by curing the curable resin composition according to the above [2] or the above [3 ].
ADVANTAGEOUS EFFECTS OF INVENTION
The present invention relates to an epoxy resin having a specific structure, a curable resin composition, and a cured product thereof, which cured product has excellent heat resistance and tracking resistance.
Therefore, the present invention is effectively used for insulating materials (high-reliability semiconductor sealing materials and the like) for electric and electronic parts, laminated boards (printed wiring boards, build-up boards and the like), various composite materials typified by carbon fiber reinforced plastics (carbon fiber reinforced plastic, CFRP), adhesives, paints and the like.
Drawings
FIG. 1 shows a gel permeation chromatography (gel permeation chromatography, GPC) chart of Synthesis example 1.
FIG. 2 shows a GPC chart of Synthesis example 2.
FIG. 3 shows a GPC chart of Synthesis example 3.
FIG. 4 shows a GPC chart of example 1.
FIG. 5 shows a GPC chart of example 2.
FIG. 6 shows a GPC chart of example 3.
FIG. 7 shows a GPC chart of comparative Synthesis example 1.
FIG. 8 shows a GPC chart of comparative Synthesis example 2.
FIG. 9 shows a GPC chart of FAE-2500.
FIG. 10 shows TMA charts of example 4, example 5, comparative example 1, and comparative example 2.
FIG. 11 shows a GPC chart of Synthesis example 4.
FIG. 12 shows a GPC chart of example 7.
FIG. 13 shows the CTI measurement results of examples 10 to 13 and comparative examples 5 to 8.
Detailed Description
The epoxy resin of the present invention is represented by the following formula (1), and has a value obtained by dividing the epoxy equivalent (g/eq.) by the softening point (. Degree. C.) of 2.0 or more and less than 2.2.
[ chemical 2]
(in the formula (1), a plurality of R independently exist, the R represents methyl or hydrogen atom, n is the average value of repeated numbers, and the n is a real number of 1-10).
In the above formula (1), n is calculated from the number average molecular weight obtained by gel permeation chromatography (GPC, detector: UV (ultraviolet) 254 nm) measurement or the area ratio of each of the separated peaks, and is preferably a real number of 1 to 5, particularly preferably a real number of 2 to 4.
When n=1 in the formula (1), it is preferably less than 50 area%, and more preferably less than 45 area%. In addition, the lower limit is 25 area%, and in the case where the lower limit is less than 25 area%, the fluidity of the resin is poor, and in the case where the resin is used as a sealing material, the productivity is deteriorated. As an index of fluidity, when the viscosity (ICI melt viscosity) is measured at 150 ℃ by the cone-plate method using the melt viscosity in the resin as an index, the viscosity is preferably 2pa·s or less. In addition, if the viscosity is too low, air or the like may be involved in molding to form voids, and blocking or the like may occur in blending (or modifying) a liquid resin or the like, so that it is preferably 0.4pa·s or more. Further, in view of the balance between heat resistance and thermal decomposition properties, it is preferably 0.45pa·s or more, and particularly preferably 0.5pa·s or more.
The compound having n of formula (1) of less than 1 is preferably contained in an amount of 0.5 to 10% by area, more preferably 0.5 to 5% by area, and particularly preferably 0.5 to 2.5% by area. Since the compound having n of less than 1 is a compound having a structure of less than 3 functions or an epoxy resin of t-butyl methylphenol, when the compound having n of less than 1 exceeds 10 area%, not only is the heat resistance suggested to be lowered, but there is a concern that odor or adverse effects on the human body during handling may be caused. On the other hand, when the compound having n of less than 1 is less than 0.5 area%, there is a concern that the weight reduction by thermal decomposition becomes large due to the network becoming too dense, and the thermal decomposition characteristics are adversely affected (and thus the tracking characteristics are presumed to be adversely affected).
The epoxy resin of the present invention is usually in the form of a resin solid at ordinary temperature, and its softening point is preferably 90℃or higher, more preferably 95℃or higher. In addition, the upper limit thereof is 150 ℃. When the softening point is higher than 150 ℃, solvent tends to remain when the resin is taken out, and voids tend to be formed when the resin is cured. In addition, foaming and the like are easy to occur during distillation of the solvent, and problems in production are also large. On the other hand, when the softening point is 90 ℃ or lower, the heat resistance and the thermal decomposition resistance are adversely affected. The epoxy equivalent is preferably 200g/eq to 300g/eq, and more preferably 205g/eq to 250g/eq. In the case where the epoxy equivalent is less than 200g/eq. The epichlorohydrin remains, or a large amount of epoxide remains as an impurity, and there is a possibility of deterioration of characteristics. In addition, when the content exceeds 300g/eq, the heat resistance is deteriorated.
In the present invention, the epoxy equivalent is measured by a method based on Japanese Industrial Standard (Japanese Industrial Standards, JIS) K-7236. The softening point was measured using a METTLER tolido (METTLER TOLEDO) company softening point determinator FP 90.
The epoxy resin of the present invention is preferably an epoxy resin having a high softening point and a large number of functional groups per unit molecular weight. The softening point tends to be higher as the molecular weight is larger. This means that the softening point is the temperature at which fluidity of the resin is observed when heated, and the larger the molecular weight, the more difficult the molecules are to move, i.e., the softening point rises. On the other hand, it is considered that, as the softening point increases, the heat resistance increases, but it is more effective to increase the number of functional groups per unit weight with respect to the increase in heat resistance, and the epoxy equivalent is a value related to the number of functional groups.
When the softening point is small and the epoxy equivalent is large, it is suggested that the functional group per molecule is small, whereas when the softening point is high and the epoxy equivalent is small, it is known that the functional group per molecule is large. Therefore, a compound having a high softening point and a small epoxy equivalent is preferable.
In the present invention, the value obtained by dividing the epoxy equivalent (g/eq.) by the softening point (. Degree. C.) is set as the parameter A, and the parameter A is preferably 2.0 or more and less than 2.2. When the parameter a is less than 2.0, it is considered that some impurities remain because the epoxy equivalent is too small, whereas when it is 2.2 or more, it means that the epoxy equivalent is large, the softening point is low relative to the value of the epoxy equivalent, and heat resistance and thermal decomposition characteristics cannot be achieved at the same time.
Here, the thermal decomposition characteristic is considered to be a parameter affecting the tracking resistance, and it is considered that the lower the thermal decomposition temperature in the tracking test, the more difficult it is to conduct between the electrodes, and thus the higher the withstand voltage can be. In general, if the molecular weight is increased, the thermal decomposition temperature tends to rise, but in the present invention, even if the molecular weight is increased, there is no large difference in the thermal decomposition temperature, and it is considered that the high tracking resistance can be maintained.
The method for producing the epoxy resin of the present invention is not particularly limited, and it can be obtained, for example, by causing an addition or ring closure reaction between a phenol resin represented by the following formula (2) and an epihalohydrin in the presence of a solvent and a catalyst.
[ chemical 3]
(in the formula (2), a plurality of R independently exist, and represent methyl or hydrogen atoms, and n is an average value of repetition numbers and is a real number of 1-10).
In the formula (2), n can be calculated from the number average molecular weight obtained by measurement by gel permeation chromatography (GPC, detector: UV 254 nm) or the area ratio of each of the separated peaks. n is further preferably 1 to 5, particularly preferably 1 to 3.
The hydroxyl equivalent weight of the phenol resin of formula (2) is preferably 140g/eq to 180g/eq, more preferably 140g/eq to 165g/eq. The amount of the compound having n=1 is preferably 30 to 60 area%, more preferably 40 to 60 area%. The total of the compounds having n of 2 or more is preferably 25 to 40 area%.
Here, a method for producing the phenol resin represented by the above formula (2) will be described.
The method for producing the phenol resin represented by the formula (2) is not particularly limited, and specifically, alkylphenols (3-methyl-6-t-butylphenol and 4-methyl-2-t-butylphenol) and parahydroxybenzaldehyde are polycondensed under acidic conditions to obtain novolak. Preferably, the ratio of alkylphenol (3-methyl-6-t-butylphenol and 4-methyl-2-t-butylphenol) to parahydroxyben-zaldehyde is 3: 2-2: 1, and the reaction was carried out. The ratio of 3-methyl-6-t-butylphenol to 4-methyl-2-t-butylphenol is preferably 3-methyl-6-t-butylphenol in 90% by weight or more of alkylphenols, and the ratio is adjusted by the amount of alkylphenol blended at the time of producing the phenol resin. Specifically, alkylphenol as a raw material is added in accordance with the introduction ratio of the target alkylphenol.
The hydroxyl group equivalent of the obtained phenol resin is preferably 140g/eq to 170g/eq, more preferably 145g/eq to 165g/eq, and particularly preferably 150g/eq to 160g/eq.
The acidic catalyst used in synthesizing the phenol resin represented by the above formula (2) may be exemplified by: hydrochloric acid, phosphoric acid, sulfuric acid, formic acid, zinc chloride, ferric chloride, aluminum chloride, p-toluenesulfonic acid, methanesulfonic acid, activated clay, ion exchange resins and the like. These may be used alone or in combination of two or more. The amount of the catalyst to be used is 0.1 to 50% by weight, preferably 1 to 30% by weight, based on the phenolic hydroxyl groups to be used, and if the amount is too large, the amount of waste is increased, and if the amount is too small, the progress of the reaction is slowed.
The reaction may be carried out using an organic solvent as needed, or may be carried out in the absence of a solvent. Among them, water to be purified in the reaction is azeotropically dehydrated to more efficiently carry out the reaction, and therefore, a solvent which can azeotropically react with water is preferably used. In the present invention, it is particularly preferable to use a hydrocarbon-based organic solvent such as toluene or xylene.
Thereafter, the resin is taken out after the solvent is flowed through the washing with water, neutralization, or the like, or the resin may be taken out by a method such as reprecipitation or recrystallization. Since the softening point of the phenol resin represented by the above formula (2) is extremely high, it is preferably extracted by a method such as reprecipitation or recrystallization, and for example, a method of replacing the solvent with a poor solvent to precipitate the same can be used.
The phenol resin represented by the formula (2) is a crystalline or resin solid, and the ratio of n=1 in GPC in this case is preferably less than 60%. Particularly 55 area% or less, and further 50 area% or less. The total amount of the residual raw material monomers is preferably 5 area% or less, and each peak is preferably less than 1.5 area%. The amount of the monomer affects the residual amount of the epoxy resin having a low molecular weight, and the amount affects heat resistance and the like.
Next, a method for producing the epoxy resin of the present invention will be described.
As described above, the method for producing the epoxy resin of the present invention is not particularly limited, and the epoxy resin can be obtained, for example, by subjecting the phenol resin represented by the formula (2) and an epihalohydrin to addition or ring-closure reaction in the presence of a solvent and a catalyst.
The epihalohydrin is used in an amount of usually 1.0 to 20.0 mol, preferably 1.5 to 10.0 mol, based on 1 mol of phenolic hydroxyl groups of the phenol resin.
Examples of the alkali metal hydroxide that can be used in the epoxidation reaction include sodium hydroxide and potassium hydroxide. The alkali metal hydroxide may be a solid substance, or an aqueous solution thereof may be used. In the case of using an aqueous solution, the following method may be used: the aqueous alkali metal hydroxide solution is continuously added to the reaction system, and water and epihalohydrin are continuously distilled off under reduced pressure or normal pressure, and then separated to remove water, whereby epihalohydrin is continuously returned to the reaction system. The amount of the alkali metal hydroxide to be used is usually 0.9 to 2.5 moles, preferably 0.95 to 1.5 moles, based on 1 mole of the phenolic hydroxyl groups of the phenol resin. If the amount of the alkali metal hydroxide used is small, the reaction does not proceed sufficiently. On the other hand, the use of an alkali metal hydroxide in an amount exceeding 2.5 moles based on 1 mole of phenolic hydroxyl groups of the phenol resin results in the by-production of unnecessary waste.
In order to promote the reaction, a quaternary ammonium salt such as tetramethylammonium chloride, tetramethylammonium bromide, trimethylbenzyl ammonium chloride, etc. may be added as a catalyst. The amount of the quaternary ammonium salt used is usually 0.1g to 15g, preferably 0.2g to 10g, based on 1 mol of phenolic hydroxyl groups of the phenol resin. If the amount is too small, a sufficient reaction promoting effect cannot be obtained, and if the amount is too large, the amount of quaternary ammonium salt remaining in the epoxy resin increases, which may cause deterioration of electrical reliability.
In the epoxidation reaction, it is preferable to add alcohols such as methanol, ethanol and isopropanol, aprotic polar solvents such as dimethyl sulfone, dimethyl sulfoxide, tetrahydrofuran and dioxane for the reaction. In the case of using an alcohol, the amount thereof is usually 2 to 50% by weight, preferably 4 to 20% by weight, relative to the amount of the epihalohydrin. In the case of using the aprotic polar solvent, the amount of the epihalohydrin to be used is usually 5 to 100% by weight, preferably 10 to 80% by weight. The reaction temperature is usually 30℃to 90℃and preferably 35℃to 80 ℃. The reaction time is usually 0.5 to 100 hours, preferably 1 to 30 hours.
After the reaction, the reaction product is washed with water, or the epihalohydrin, the solvent, or the like is removed under reduced pressure and heating without washing with water. In order to produce an epoxy resin having less hydrolyzable halogen, the recovered epoxy resin may be dissolved in a solvent such as toluene or methyl isobutyl ketone, and an aqueous solution of an alkali metal hydroxide such as sodium hydroxide or potassium hydroxide may be added to react with each other to thereby ensure ring closure. In this case, the amount of the alkali metal hydroxide to be used is usually 0.01 to 0.3 mol, preferably 0.05 to 0.2 mol, based on 1 mol of phenolic hydroxyl groups of the phenol resin used for glycidation. The reaction temperature is usually 50 to 120 ℃, and the reaction time is usually 0.5 to 24 hours. After the completion of the reaction, the produced salt is removed by filtration, washing with water or the like, and then the solvent is distilled off under reduced pressure with heating, whereby the epoxy resin of the present invention is obtained.
Hereinafter, the curable resin composition of the present invention will be described.
The epoxy resin represented by the formula (1) may be used alone or in combination with other epoxy resins. When the epoxy resin represented by the formula (1) is used in combination, the proportion of the epoxy resin is preferably 10 to 98% by weight, more preferably 30 to 95% by weight, and still more preferably 60 to 95% by weight, based on the total amount of the epoxy resins. By setting the addition amount of the epoxy resin represented by the above formula (1) to 10% or more, an improvement in the elastic modulus and a low water absorption can be exhibited.
Specific examples of the other epoxy resin that can be used in combination with the epoxy resin represented by the above formula (1) include: polycondensates of bisphenols (bisphenol a, bisphenol F, bisphenol S, biphenol, bisphenol AD, etc.) or phenols (phenol, alkyl-substituted phenol, aromatic-substituted phenol, naphthol, alkyl-substituted naphthol, dihydroxybenzene, alkyl-substituted dihydroxybenzene, dihydroxynaphthalene, etc.) with various aldehydes (formaldehyde, acetaldehyde, alkyl aldehyde, benzaldehyde, alkyl-substituted benzaldehyde, hydroxybenzaldehyde, naphthalene aldehyde, glutaraldehyde, phthalaldehyde, crotonaldehyde, cinnamaldehyde, etc.); polymers of the phenols with various diene compounds (dicyclopentadiene, terpenes, vinylcyclohexene, norbornadiene, vinylnorbornene, tetrahydroindene, divinylbenzene, divinylbiphenyl, caspoylbiphenyl, butadiene, isoprene, etc.); polycondensates of said phenols with ketones (acetone, methyl ethyl ketone, methyl isobutyl ketone, acetophenone, benzophenone, etc.); polycondensates of the above-mentioned phenols with aromatic diols (such as xylylene glycol and biphenyldimethanol); polycondensates of the above phenols with aromatic dichloromethyl groups (α, α' -dichloroxylene, dichloromethyl biphenyl, etc.); polycondensates of the phenols with aromatic dialkoxymethyl groups (dimethoxymethylbenzene, dimethoxymethylbiphenyl, diphenoxymethylbiphenyl, etc.); the polycondensates of the bisphenol and various aldehydes or glycidyl ether-based epoxy resins, alicyclic epoxy resins, glycidyl amine-based epoxy resins, glycidyl ester-based epoxy resins, and the like obtained by glycidation of alcohols and the like are not limited to these, as long as they are epoxy resins that are generally used. These may be used alone or in combination of two or more.
Examples of the curing agent that can be used in the curable resin composition of the present invention include: amine-based hardeners, acid anhydride-based hardeners, amide-based hardeners, phenol-based hardeners, and the like. As specific examples of the usable hardener, examples thereof include o-phenylenediamine, m-phenylenediamine, p-phenylenediamine, 4' -diaminodiphenyl sulfone, 3' -diaminodiphenyl sulfone, 2' -diaminodiphenyl sulfone, diethyltoluenediamine, dimethylthiotoluenediamine, diaminodiphenylmethane, 3' -dimethyl-4, 4' -diaminodiphenylmethane, 3' -diethyl-4, 4' -diaminodiphenylmethane, 4' -diamino-3, 3' -diethyl-5, 5' -dimethyldiphenylmethane, 4' -diamino-3, 3',5,5' -tetramethyl diphenylmethane, 4' -diamino-3, 3',5,5' -tetraethyl-diphenyl-methane, 4' -diamino-3, 3',5,5' -tetraisopropyl diphenylmethane, 4' -methylenebis (N-methylaniline), bis (aminophenyl) fluorene, 3,4' -diaminodiphenyl ether, 4' -diaminodiphenyl ether, 2' -bis [4- (4-aminophenoxy) phenyl ] propane, bis [4- (4-aminophenoxy) phenyl ] sulfone, 1,3' -bis (4-aminophenoxy) benzene, 1,4' -bis (4-aminophenoxy) biphenyl, 4' - (1, 3-phenylene) diphenylamine, 4' - (1, 4-phenylene) diphenylamine, aromatic amine compounds such as naphthalene diamine, benzidine, dimethyl benzidine, and aromatic amine compounds described in Synthesis example 1 and Synthesis example 2 of International publication No. 2017/170551; aliphatic amines such as 1, 3-bis (aminomethyl) cyclohexane, isophorone diamine, 4' -methylenebis (cyclohexylamine), norbornanediamine, ethylenediamine, propylenediamine, tetramethylenediamine, pentamethylene diamine, hexamethylenediamine, dimer diamine, triethylenetetramine, and the like, but are not limited thereto, and can be suitably used depending on the properties to be imparted to the composition. In order to ensure pot life, an aromatic amine is preferably used, and in the case where immediate hardenability is to be imparted, an aliphatic amine is preferably used. By using an amine compound containing a difunctional component as a main component as a curing agent, a network (network) having high linearity can be constructed at the time of curing reaction, and particularly excellent toughness can be exhibited. Further, amide compounds such as dicyandiamide, and polyamide resins synthesized from dimer of linoleic acid and ethylenediamine; anhydride compounds such as phthalic anhydride, trimellitic anhydride, pyromellitic anhydride, maleic anhydride, tetrahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methylnadic anhydride, hexahydrophthalic anhydride, and methylhexahydrophthalic anhydride; bisphenol (bisphenol a, bisphenol F, bisphenol S, bisphenol AD, etc.) or a polymer of phenols (phenol, alkyl-substituted phenol, aromatic-substituted phenol, naphthol, alkyl-substituted naphthol, dihydroxybenzene, alkyl-substituted dihydroxybenzene, dihydroxynaphthalene, etc.) with various aldehydes (formaldehyde, acetaldehyde, alkyl aldehyde, benzaldehyde, alkyl-substituted benzaldehyde, hydroxybenzaldehyde, naphthalene aldehyde, glutaraldehyde, phthalaldehyde, crotonaldehyde, cinnamaldehyde, etc.), or a polycondensate of the phenols with various diene compounds (dicyclopentadiene, terpenes, vinylcyclohexene, norbornadiene, vinylnorbornene, tetrahydroindene, divinylbenzene, butadiene, isoprene, etc.), or a polycondensate of the phenols with ketones (acetone, methyl ethyl ketone, methyl isobutyl ketone, acetophenone, benzophenone, etc.), or a polycondensate of the phenols with aromatic dimethiconols (xylylene, diphenyl dimethanol, etc.), or a polycondensate of the phenols with aromatic dimethyl (α, α' -dimethyl chloride, methyl chloride, bisphenol-modified bisphenol, etc.), bisphenol-modified bisphenol, etc.; imidazole, trifluoroborane-amine complexes, guanidine derivatives, and the like, but are not limited thereto.
In the curable resin composition of the present invention, the amount of the curing agent to be used is preferably 0.5 to 1.5 equivalents, particularly preferably 0.6 to 1.2 equivalents, based on 1 equivalent of the epoxy group of the epoxy resin. By setting the amount to 0.5 to 1.5 equivalents, good hardening properties can be obtained.
When the hardening reaction is carried out using the hardening agent, a hardening accelerator may also be used in combination. Examples of usable hardening accelerators include: imidazoles such as 2-methylimidazole, 2-ethylimidazole, 2-phenylimidazole, and 2-ethyl-4-methylimidazole; tertiary amines such as 2- (dimethylaminomethyl) phenol, triethylenediamine, triethanolamine, 1, 8-diazabicyclo (5, 4, 0) undecene-7; organic phosphines such as triphenylphosphine, diphenylphosphine, tributylphosphine, etc.; metal compounds such as tin octoate; tetra-substituted phosphonium tetra-substituted borates such as tetraphenylphosphonium tetra-phenylborates and tetraphenylphosphonium ethyl triphenylborates; tetraphenylboron salts such as 2-ethyl-4-methylimidazole-tetraphenylborate and N-methylmorpholine-tetraphenylborate; benzoic acid, phthalic acid, isophthalic acid, terephthalic acid, naphthoic acid, salicylic acid, and the like. From the viewpoint of promoting the curing reaction of the amine compound and the epoxy resin, a carboxylic acid compound such as salicylic acid is preferable. The hardening accelerator may be used in an amount of 0.01 to 15 parts by weight, as required, based on 100 parts by weight of the epoxy resin.
Further, an inorganic filler may be added to the curable resin composition of the present invention as needed. Examples of the inorganic filler include powders of crystalline silica, fused silica, alumina, zircon, calcium silicate, calcium carbonate, silicon carbide, silicon nitride, boron nitride, zirconia, forsterite (forsterite), steatite (steatite), spinel, titania, talc, and the like, and beads obtained by spheroidizing these, but the present invention is not limited thereto. These may be used alone or in combination of two or more. The amount of the inorganic filler used varies depending on the application, but in the case of use as a sealant for a semiconductor, for example, the inorganic filler is preferably used in an amount of 20 wt% or more, more preferably 30 wt% or more, particularly preferably 70 wt% to 95 wt% in terms of heat resistance, moisture resistance, mechanical properties, flame retardancy, and the like of a cured product of the curable resin composition.
In the present invention, the content of the inorganic filler is important in particular for improving the tracking resistance. In view of tracking resistance, the inorganic filler is preferably contained in the total amount of the curable resin composition of the present invention in an amount of 74% by weight or more and 95% by weight or less, particularly preferably 78% by weight or more and 95% by weight or less. In the case of the epoxy resin structure of the present invention, it was confirmed that when the amount is 74 wt% or more, the tracking resistance is significantly improved, and when the amount is less than 74 wt%, for example, less than 70 wt%, the tracking resistance is less superior than that of other epoxy resins.
In the curable resin composition of the present invention, a release agent may be blended in order to improve the release from the mold during molding. As the release agent, any conventionally known one can be used, and examples thereof include: ester waxes such as carnauba wax (carnauba wax) and montan wax (montan wax); fatty acids such as stearic acid and olentic acid, and metal salts thereof; polyolefin waxes such as oxidized polyethylene and nonoxidized polyethylene. These may be used alone or in combination of two or more. The amount of these release agents to be blended is preferably 0.5 to 3% by weight based on the total organic components. If the amount is too small, the release from the mold becomes poor, and if the amount is too large, the adhesion to the lead frame or the like becomes poor.
In the curable resin composition of the present invention, a coupling agent may be blended in order to improve the adhesion between the inorganic filler and the resin component. As the coupling agent, any of conventionally known ones can be used, and examples thereof include: vinyl alkoxy silane, ethyl alkoxy silane, styryl alkoxy silane, methyl acryloxy alkoxy silane, amino alkoxy silane, mercapto alkoxy silane, isocyanato alkoxy silane and other alkoxy silane compounds, alkoxy titanium compound, aluminum chelate compound, etc. These may be used alone or in combination of two or more. The method of adding the coupling agent may be to mix the inorganic filler with the resin after the surface of the inorganic filler is treated with the coupling agent in advance, or may be to mix the inorganic filler after the coupling agent is mixed with the resin.
Further, in the curable resin composition of the present invention, a known additive may be formulated as needed. Specific examples of the additive that can be used include: polybutadiene and its modified product, modified product of acrylonitrile copolymer, polyphenylene ether, polystyrene, polyethylene, polyimide, fluororesin, maleimide compound, cyanate ester compound, silicone gel, silicone oil, and coloring agent such as carbon black, phthalocyanine blue and phthalocyanine green.
The curable resin composition of the present invention is obtained by uniformly mixing the above components. The curable resin composition of the present invention can be easily produced into a cured product by the same method as conventionally known methods. For example, the curable resin composition of the present invention can be obtained by sufficiently mixing the epoxy resin with the curing agent and, if necessary, the curing accelerator, inorganic filler, mold release agent, silane coupling agent and additive to homogeneity using an extruder, kneader, roll or the like, molding the composition by melt casting, transfer molding, injection molding, compression molding or the like, and heating the resultant mixture at 80 to 200℃for 2 to 10 hours.
The curable resin composition of the present invention may contain a solvent as required. The cured product of the curable resin composition of the present invention can be produced by impregnating a fibrous substance (base material) such as glass fibers, carbon fibers, polyester fibers, polyamide fibers, alumina fibers, paper, etc. with a curable resin composition (epoxy resin varnish) containing a solvent, heating and drying the resultant prepreg to obtain a prepreg, and hot-press-molding the obtained prepreg. The solvent content of the curable resin composition is usually about 10 to 70% by weight, preferably about 15 to 70% by weight, based on the internal proportion. Examples of the solvent include: gamma-butyrolactones; amide solvents such as N-methylpyrrolidone, N-dimethylformamide, N-dimethylacetamide, and N, N-dimethylimidazolidone; sulfones such as tetramethylene sulfone; ether solvents such as diethylene glycol dimethyl ether, diethylene glycol diethyl ether, propylene glycol monomethyl ether acetate, and propylene glycol monobutyl ether, preferably mono-or di-lower (C1-3) alkyl ethers of lower (C1-3) alkylene glycols; ketone solvents such as methyl ethyl ketone and methyl isobutyl ketone, more preferably, di-lower (C1-3) alkyl ketones having the same or different alkyl groups; aromatic solvents such as toluene and xylene. These may be used alone or in combination of two or more kinds.
The epoxy resin varnish is coated on a release film, and the solvent is removed by heating to perform B-staging, whereby a sheet-like adhesive can be obtained. The sheet-like adhesive can be used as an interlayer insulating layer in a multilayer substrate or the like.
The cured product obtained in the present invention can be used for various applications. Specifically, general uses using thermosetting resins such as epoxy resins are exemplified by: adhesive, paint, coating agent, molding material (including sheet, film, FRP, etc.), insulating material (including printed board, wire coating, etc.), sealant, and further additives to other resins, etc.
Examples of the adhesive include: an adhesive for civil engineering, construction, automobile, general business, medical use, and an adhesive for other electronic materials. Among these, as an adhesive for electronic materials, there can be mentioned: interlayer adhesives for multilayer substrates such as build-up substrates, die bonding agents, and adhesives for semiconductors such as underfills; and mounting adhesives such as underfill for Ball Grid Array (BGA) reinforcement, anisotropic conductive film (anisotropic conductive film, ACF), anisotropic conductive paste (anisotropic conductive paste, ACP), and the like.
As the sealant, there may be mentioned: infusion sealing, dip sealing, transfer mold sealing for capacitors, transistors, diodes, light emitting diodes, ICs, large scale integrated circuits (large scale integration circuit, LSI), etc.; perfusion sealing for ICs, LSI-like Chip On Board (COB), chip On Film (COF), tape automated bonding (tape automated bonding, TAB), and the like; underfill for flip-chip; and sealing (including reinforcing underfill) at the time of mounting an IC package such as a quad flat package (quad flat package, QFP), a Ball Grid Array (BGA), a chip size package (chip size package, CSP), or the like.
Examples
The present invention will be described more specifically by way of examples, and unless otherwise specified, parts are parts by weight. Furthermore, the present invention is not limited to these examples.
Epoxy equivalent
The measurement was carried out according to the method based on JIS K-7236.
Softening point
The measurement was performed using a softening point measuring instrument FP90 from METTLER TOLEDO (METTLER toldo).
Hydroxyl equivalent
The sample was acetylated with acetic anhydride in pyridine solution, after completion of the acetylation, the remaining anhydride was decomposed with water, and the residue was titrated with a 0.5N KOH ethanol solution by a potentiometric titrator to measure the free acetic acid, and the hydroxyl equivalent was determined from the result.
GPC (gel permeation chromatography)
(measurement condition 1)
The device comprises: volter (Waters) e2695
And (3) pipe column: showa electric (SHODEX) GPC KF-401HQ, KF-402HQ, KF-403HQ, KF-404HQ total 4
Flow rate: 0.3ml/min
Column temperature: 40 DEG C
The solvent used: tetrahydrofuran (tetra hydro furan, THF)
A detector: UV 254nm
(measurement condition 2)
The device comprises: dongcao (TOSOH) Inc. HLC-8220GPC
And (3) pipe column: east Cao (TOSOH) Co., ltd., TSK gel G3000HXL 1 root, TSK gel G2000HXL 2 root, total 3 roots
Flow rate: 1.065ml/min
Column temperature: 40 DEG C
The solvent used: tetrahydrofuran (tetra hydro furan, THF)
A detector: UV 254nm
(measurement condition 3)
The device comprises: tosoh corporation HLC-8420GPC
And (3) pipe column: east Cao (TOSOH) Co., ltd., TSK gel G3000HXL 1 root, TSK gel G2000HXL 2 root, total 3 roots
Flow rate: 1.065ml/min
Column temperature: 40 DEG C
The solvent used: tetrahydrofuran (tetra hydro furan, THF)
A detector: UV 254nm
Standard polystyrene (Tosoh Co., ltd.)
PStQuickC, PStQuickD (styrene was added as an internal standard (Internal standard) for calibration in molecular weight measurement)
Synthesis example 1
While nitrogen purging was performed on a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer, 137.2 parts of 3-methyl-6-t-butylphenol, 0.16 part of 4-methyl-2-t-butylphenol, 60 parts of p-hydroxybenzaldehyde, 142 parts of toluene and 1.4 parts of p-toluenesulfonic acid were added, and the reaction was performed at 110℃to 115℃for 8 hours. After the completion of the reaction, 25% naoh water was added thereto, and toluene was removed by azeotropic dehydration distillation. Thereafter, 75% sulfuric acid was added thereto, the pH was adjusted to 5 to 7, and the precipitated resin powder was filtered and dried at 60 ℃, whereby 186 parts of a phenol resin (P1) was obtained. The obtained phenol resin (P1) was powdery, had a softening point of 150 ℃ or higher, and had a hydroxyl equivalent weight of 155g/eq, based on GPC, 48.8 area% when n=1. GPC chart (measurement condition 1) is shown in FIG. 1.
Synthesis example 2
153.1 parts of 3-methyl-6-t-butylphenol, 0.17 part of 4-methyl-2-t-butylphenol, 60 parts of p-hydroxybenzaldehyde, 142 parts of toluene and 0.6 part of p-toluenesulfonic acid were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while purging with nitrogen, and the reaction was carried out at 100℃to 105℃for 6 hours. After the completion of the reaction, 25% naoh water was added thereto, and toluene was removed by azeotropic dehydration distillation. Thereafter, 75% sulfuric acid was added thereto, the pH was adjusted to 5 to 7, and the precipitated resin powder was filtered and dried at 60℃to obtain 198 parts of a phenol resin (P2). The obtained phenol resin (P2) was powdery, had a softening point of 150 ℃ or higher, a hydroxyl equivalent weight of 144g/eq, and was 51.7 area% based on GPC, when n=1. GPC chart (measurement condition 1) is shown in FIG. 2.
Synthesis example 3
While nitrogen purging was performed on a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer, 137.2 parts of 3-methyl-6-t-butylphenol, 0.16 part of 4-methyl-2-t-butylphenol, 60 parts of p-hydroxybenzaldehyde, 142 parts of toluene and 1.4 parts of p-toluenesulfonic acid were added, and the reaction was performed at 110℃to 115℃for 8 hours. After the completion of the reaction, 25% naoh water was added thereto, and toluene was removed by azeotropic dehydration distillation. Thereafter, 75% sulfuric acid was added thereto, the pH was adjusted to 5 to 7, and the precipitated resin powder was filtered and dried at 60℃to obtain 180 parts of a phenol resin (P3). The obtained phenol resin (P3) was powdery, had a softening point of 150 ℃ or higher, a hydroxyl equivalent weight of 153g/eq, and was 47.6 area% when n=1 based on GPC. GPC chart (measurement condition 1) is shown in FIG. 3.
Example 1
310 parts of the phenol resin (P1) obtained in Synthesis example 1, 973 parts of epichlorohydrin, 274 parts of dimethyl sulfoxide and 15 parts of water were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while nitrogen purging was performed, and the internal temperature was raised to 45 ℃. After adding 16 parts of sodium hydroxide in portions over 1.5 hours, the mixture was reacted at 45℃for 2 hours and at 70℃for 1 hour. Unreacted epichlorohydrin and the solvent were distilled off under reduced pressure with heating. Methyl isobutyl ketone (methyl isobutyl ketone, MIBK) 1040 parts was added and the organic layer was washed once with 440 parts of water. The organic layer was returned to the reaction vessel, and 20 parts of a 30 wt% aqueous sodium hydroxide solution was added thereto to react at 70℃for 2 hours. After leaving to cool, the organic layer was washed four times with 130 parts of water, and the solvent was distilled off under a reduced pressure with heating to obtain 170 parts of an epoxy resin (E1) as a solid resin. The epoxy equivalent was 214g/eq, the ICI viscosity (150 ℃) was 0.57 Pa.s, the softening point was 100℃and the parameter A was 2.14. The average repeating unit n estimated by GPC (detector UV 254 nm) was 2.4, 42.3 area% when n=1, and 1.57 area% when n was less than 1. GPC chart (measurement condition 2) is shown in FIG. 4.
Example 2
310 parts of the phenol resin (P1), 584 parts of epichlorohydrin, 274 parts of dimethyl sulfoxide and 15 parts of water obtained in Synthesis example 1 were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while nitrogen purging was performed, and the internal temperature was raised to 45 ℃. After adding 16 parts of sodium hydroxide in portions over 1.5 hours, the mixture was reacted at 45℃for 2 hours and at 70℃for 1 hour. Unreacted epichlorohydrin and the solvent were distilled off under reduced pressure with heating. The organic layer was washed once with 440 parts of water by adding 1040 parts of MIBK. The organic layer was returned to the reaction vessel, and 20 parts of 30wt% aqueous sodium hydroxide solution was added thereto to react at 70℃for 2 hours. After leaving to cool, the organic layer was washed four times with 130 parts of water, and the solvent was distilled off under a reduced pressure with heating to obtain 141 parts of epoxy resin (E2) as a solid resin. The epoxy equivalent was 225g/eq., ICI viscosity (150 ℃ C.) was 1.92 Pa.s, softening point was 110 ℃ C., and parameter A was 2.05. The average repeating unit n estimated by GPC (detector UV 254 nm) was 2.9, 31.1 area% when n=1, and 1.28 area% when n was less than 1. GPC chart (measurement condition 2) is shown in FIG. 5.
Example 3
310 parts of the phenol resin (P3) obtained in Synthesis example 3, 778 parts of epichlorohydrin, 274 parts of dimethyl sulfoxide and 15 parts of water were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while nitrogen purging was performed, and the internal temperature was raised to 45 ℃. After adding 16 parts of sodium hydroxide in portions over 1.5 hours, the mixture was reacted at 45℃for 2 hours and at 70℃for 1 hour. Unreacted epichlorohydrin and the solvent were distilled off under reduced pressure with heating. The organic layer was washed once with 440 parts of water by adding 1040 parts of MIBK. The organic layer was returned to the reaction vessel, and 20 parts of a 30wt% aqueous sodium hydroxide solution was added thereto to react at 70℃for 2 hours. After leaving to cool, the organic layer was washed four times with 130 parts of water, and the solvent was distilled off under a reduced pressure with heating to obtain 303 parts of an epoxy resin (E3) as a solid resin. The epoxy equivalent was 216g/eq, the total chlorine was 440ppm (based on International Standard organization (International Standardization Organization, ISO) 21627-3), the inorganic chloride ion concentration was 0.3ppm, the ICI viscosity (150 ℃ C.) was 0.64 Pa.s, the softening point was 100 ℃ C., and the parameter A was 2.16. Mn as estimated by GPC (detector UV 254 nm) was 1059, mw was 2001 (in terms of polystyrene), 39.5 area% when n=1, and 1.95 area% when n is less than 1. GPC chart (measurement condition 3) is shown in FIG. 6.
Comparative Synthesis example 1
288 parts of the phenol resin (P2), 584 parts of epichlorohydrin, 274 parts of dimethyl sulfoxide and 15 parts of water obtained in Synthesis example 2 were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while nitrogen purging was performed, and the internal temperature was raised to 45 ℃. After adding 16 parts of sodium hydroxide in portions over 1.5 hours, the mixture was reacted at 45℃for 2 hours and at 70℃for 1 hour. Unreacted epichlorohydrin and the solvent were distilled off under reduced pressure with heating. The organic layer was washed once with 440 parts of water by adding 1040 parts of MIBK. The organic layer was returned to the reaction vessel, and 20 parts of a 30 wt% aqueous sodium hydroxide solution was added thereto to react at 70℃for 2 hours. After leaving to cool, the organic layer was washed four times with 130 parts of water, and the solvent was distilled off under a reduced pressure with heating to obtain 165 parts of epoxy resin (E4) as a solid resin. The epoxy equivalent was 223g/eq., ICI viscosity (150 ℃ C.) was 0.60 Pa.s, softening point was 99.7 ℃ C., and parameter A was 2.24. The average repeating unit n estimated by GPC was 2.4, 43.9 area% when n=1, and 1.9 area% when n was less than 1. GPC chart (measurement condition 2) is shown in FIG. 7.
Comparative Synthesis example 2
288 parts of the phenol resin (P2), 487 parts of epichlorohydrin, 274 parts of dimethyl sulfoxide and 15 parts of water obtained in Synthesis example 2 were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while nitrogen purging was performed, and the internal temperature was raised to 45 ℃. After adding 16 parts of sodium hydroxide in portions over 1.5 hours, the mixture was reacted at 45℃for 2 hours and at 70℃for 1 hour. Unreacted epichlorohydrin and the solvent were distilled off under reduced pressure with heating. The organic layer was washed once with 440 parts of water by adding 1040 parts of MIBK. The organic layer was returned to the reaction vessel, and 20 parts of a 30 wt% aqueous sodium hydroxide solution was added thereto to react at 70℃for 2 hours. After leaving to cool, the organic layer was washed four times with 130 parts of water, and the solvent was distilled off under a reduced pressure with heating to obtain 161 parts of epoxy resin (E5) as a solid resin. The epoxy equivalent was 224g/eq., ICI viscosity (150 ℃ C.) was 0.66 Pa.s, softening point was 100.9 ℃ C., and parameter A was 2.22. The average repeating unit n estimated by GPC was 2.3, 43 area% when n=1, and 2.1 area% when n was less than 1. GPC chart (measurement condition 2) is shown in FIG. 8.
[ example 4, example 5, comparative example 1, comparative example 2]
The test pieces for evaluation were obtained by using FAE-2500 (manufactured by Japanese chemical Co., ltd., analysis results are described later) as the epoxy resins E1, E2, E4 and E6 obtained in the examples and synthesis examples, the triphenolmethane-type phenol resin (Kayahard) KTG-105 manufactured by Japanese chemical Co., ltd., a catalyst, triphenylphosphine, and 1phr of triphenylphosphine, respectively, as the catalyst, and mixing and kneading the same with the epoxy resins using a mixing roll, demolding, and curing at 160 ℃. Times.2 hours+180 ℃. Times.6 hours.
The epoxy equivalent of FAE-2500 was 213g/eq., ICI viscosity (150 ℃ C.) was 0.30 Pa.s, softening point was 93.5 ℃ C., and parameter A was 2.28.GPC chart (measurement condition 2) is shown in FIG. 9.
The results of measurement of the test piece for evaluation under the following conditions are shown in table 1. In addition, a thermo-mechanical analysis (thermo mechanical analysis, TMA) chart is shown in fig. 10.
Dynamic viscoelasticity measurement (DMA)
The glass transition temperature (temperature at which tan δ is the maximum value) and the value of tan δ at that time were measured using a dynamic viscoelasticity tester.
Dynamic viscoelasticity tester: DMA-2980 manufactured by TA-instruments
Temperature increase rate: 2 ℃/min
< measurement of thermo-mechanical Property (TMA) >)
The glass transition temperature (Tg) and the linear expansion change rate (coefficient of thermal expansion, CTE) were evaluated by using a thermo-mechanical property measuring device.
Thermal gravimetric differential thermal determination (thermogravimetric-thermal differential analysis (thermo gravimetric-differential thermal analysis, TG-DTA) >)
The thermal decomposition temperature and the residual carbon content at 500℃were measured by TG-DTA.
Measuring a sample: the powder (passing through 100 μm mesh sieve and remaining in 75 μm mesh sieve) is 5mg to 10mg
Measurement conditions: 200ml of Air flow (Air flow) with a heating rate of 10 ℃/min
TABLE 1
Example 6, comparative example 3
The curable resin composition was obtained by uniformly mixing/kneading using an epoxy resin (E1), an epoxy resin (E6, FAE-2500 (manufactured by Japanese chemical Co., ltd.), a Sirocco (XYLOK) phenol resin (MEHC-7800 SS manufactured by Ming dyno chemical Co., ltd.), triphenylphosphine (TPP, manufactured by Tokyo chemical Co., ltd.), silica gel (fused silica MSR-2212 manufactured by Tokyo chemical Co., ltd.), palm wax (Xin Le Likang (manufactured by Cera Rica) field) as a mold release agent, and a silane coupling agent (trade name: KBM-303 Xinyue chemical industry Co., ltd.) as an additive.
The curable resin composition is pulverized and then tableted by a tablet press. The sheeted curable resin composition was subjected to transfer molding (175 ℃ C. For 60 minutes to 150 minutes), and after demolding, cured under the conditions of 160 ℃ C..times.2 hours+180 ℃ C..times.6 hours, to obtain test pieces for evaluation. The following evaluation was performed using the test piece. The measurement results are shown in Table 2.
< test of tracking resistance >)
Applicable specification IEC-Pub.60112-2003 (fourth edition) and JIS-C2134-2007
The test voltage of the object is 400V-600V
Test solution ammonium chloride 0.1% aqueous solution
Drop count 50 when the test piece was broken by less than 50 drops, the test piece was judged to be NG
The temperature and humidity of the laboratory are between 21 and 23 ℃ and between 40 and 45 percent RH
YST-112 tracking resistance tester manufactured by Yamayo testing device sub Ma Yang (Yamayo) testing machine Co., ltd
Test sample shape diameter 50mm and thickness 3mm
1 Point per sheet
TABLE 2
From the results of table 1, it was confirmed that the epoxy resin of the present invention has high heat resistance and also has dimensional stability (low linear expansion). In addition, from the results of table 2, it was confirmed that the epoxy resin of the present invention has high tracking resistance.
Synthesis example 4
130.3 parts of 3-methyl-6-t-butylphenol, 0.2 part of 4-methyl-2-t-butylphenol, 60 parts of p-hydroxybenzaldehyde, 142 parts of toluene and 1.4 parts of p-toluenesulfonic acid were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while purging with nitrogen, and the reaction was carried out at 110℃to 115℃for 8 hours. After the completion of the reaction, 25% naoh water was added thereto, and toluene was removed by azeotropic dehydration distillation. Thereafter, 75% sulfuric acid was added thereto, the pH was adjusted to 5 to 7, and the precipitated resin powder was filtered and dried at 60 ℃, whereby 186 parts of phenol resin (P4) was obtained. The obtained phenol resin (P4) was powdery, had a softening point of 200 ℃ or higher, a hydroxyl equivalent weight of 160g/eq, and was 37.0 area% based on GPC, when n=1. GPC chart (measurement condition 1) is shown in FIG. 11.
Example 7
320 parts of the phenol resin (P4) obtained in Synthesis example 4, 973 parts of epichlorohydrin, 274 parts of dimethyl sulfoxide and 15 parts of water were added to a flask equipped with a thermometer, a cooling tube, a fractionating tube and a stirrer while nitrogen purging was performed, and the internal temperature was raised to 45 ℃. After adding 16 parts of sodium hydroxide in portions over 1.5 hours, the mixture was reacted at 45℃for 2 hours and at 70℃for 1 hour. Unreacted epichlorohydrin and the solvent were distilled off under reduced pressure with heating. The organic layer was washed once with 440 parts of water by adding 1040 parts of MIBK. The organic layer was returned to the reaction vessel, and 20 parts of a 30 wt% aqueous sodium hydroxide solution was added thereto to react at 70℃for 2 hours. After leaving to cool, the organic layer was washed four times with 130 parts of water, and the solvent was distilled off under a reduced pressure with heating to obtain 107 parts of epoxy resin (E7) as a solid resin. The epoxy equivalent is 220g/eq., ICI viscosity (150 ℃) is above 0.8 Pa.s, the softening point is 108.5 ℃, and the parameter A is 2.03. The average repeating unit n estimated by GPC (detector UV 254 nm) was 3.4, 24.9 area% when n=1, and 2.91 area% when n was less than 1. GPC chart (measurement condition 3) is shown in FIG. 12. The Retention time (recovery time) of each peak was 1.75% in 35.619 minutes, and the other peaks were 1.5 area% or less.
Example 8, example 9
The epoxy resin E3, the epoxy resin E7, the triphenolmethane-type phenol resin (Kayahard) KTG-105 hydroxyl equivalent 102g/eq. Manufactured by Japan chemical), the biphenyl aralkyl-type phenol resin (Kayahard) GPH-65 hardener hydroxyl equivalent 200g/eq. Manufactured by Japan chemical), the triphenylphosphine (TPP, manufactured by Tokyo chemical Co.) as a catalyst, the silica gel (fused silica MSR-2212, manufactured by Tokyo chemical Co.) as an inorganic filler, the palm wax (Cera Rica) Le Likang (manufactured by Cera Rica) as a mold release agent, and the silane coupling agent (trade name: KBM-303 Xinyue chemical industry manufacturing) as additives were used as obtained in the examples, and were blended in the proportions (parts by weight) of Table 3, and after being further demolded, the mixture was uniformly mixed and kneaded, cured under the conditions of 160 ℃. Times.2 hours+180 ℃ for 6 hours to obtain test pieces for evaluation. The test piece was used to conduct an electric leakage tracking resistance test. The measurement results are shown in Table 3.
TABLE 3
Example 9, comparative example 4
The epoxy resin E1 obtained in the above example, a biphenyl aralkyl type epoxy resin (NC-3000 manufactured by Nippon chemical Co., ltd.), a Sirocco (XYLOK) phenol resin (MEHC-7800 SS manufactured by Ming and Chemie chemical Co., ltd.), triphenylphosphine (TPP, manufactured by Tokyo chemical Co., ltd.), silica gel (fused silica MSR-2212 manufactured by Tokyo chemical Co., ltd.), palm wax (Cera Le Likang (manufactured by Cera Rica)) as a mold release agent, a silane coupling agent (trade name: KBM-303 Xueyue chemical Co., ltd.) as an additive, and a mixing roll were used to uniformly mix/knead to obtain a curable resin composition.
The curable resin composition is pulverized and then tableted by a tablet press. The sheeted curable resin composition was subjected to transfer molding (175 ℃ C. For 60 minutes to 15 minutes), and after demolding, cured under the conditions of 160 ℃ C..times.2 hours+180 ℃ C..times.6 hours, to obtain test pieces for evaluation. The test piece was used to conduct an electric leakage tracking resistance test. The measurement results are shown in Table 4.
TABLE 4
Examples 10 to 13 and comparative examples 5 to 8
The epoxy resin E1 obtained in the above example, a biphenyl aralkyl type epoxy resin (NC-3000 manufactured by Nippon chemical Co., ltd.), a Sirocco (XYLOK) type phenol resin (MEHC-7800 SS manufactured by Ming and Chemie chemical Co., ltd.), a biphenyl aralkyl type phenol resin (Kayahard (KAYAHARD) GPH-65 manufactured by Nippon chemical Co., ltd.), triphenylphosphine (TPP, manufactured by Tokyo chemical Co., ltd.), silica gel (fused silica MSR-2212 manufactured by Dragon) as an inorganic filler, palm wax (Xin Le Likang (manufactured by Cera Rica)) as a mold release agent, a silane coupling agent (trade name: KBM-303 manufactured by Korea chemical Co., ltd.) as an additive were used, and uniformly mixed/kneaded using a mixing roll to obtain a curable resin composition.
The curable resin composition is pulverized and then tableted by a tablet press. The sheeted curable resin composition was subjected to transfer molding (175 ℃ C. For 60 minutes to 15 minutes), and after demolding, cured under the conditions of 160 ℃ C..times.2 hours+180 ℃ C..times.6 hours, to obtain test pieces for evaluation. The test piece was used to conduct an electric leakage tracking resistance test. In particular, with respect to CTI, the measurement was performed using an IEC-Pub.60112-2003 (4 th edition) based measurement method. The measurement results are shown in Table 5 and FIG. 13.
TABLE 5
From the above results, it was confirmed that the cured product using the epoxy resin of the present invention maintains a relatively high CTI, and particularly, the CTI rate increases as compared with other compositions in a formulation in which the amount of the inorganic filler to be blended is 74% by weight or more, more preferably 78% by weight or more.
Industrial applicability
The epoxy resin of the present invention is useful for applications of vehicle-mounted materials, particularly power device peripheral materials, and particularly for applications requiring heat resistance and high relative tracking index (CTI).
Claims (4)
1. An epoxy resin having a value obtained by dividing the epoxy equivalent (g/eq.) by the softening point (DEG C) of 2.0 or more and less than 2.2,
[ chemical 1]
In the formula (1), a plurality of R independently exist and represent methyl or hydrogen atoms; n is an average value of repetition numbers and is a real number of 1 to 10.
2. A curable resin composition comprising the epoxy resin according to claim 1.
3. The curable resin composition according to claim 2, wherein the content of the inorganic filler is 74% by weight or more and 95% by weight or less based on the total amount of the curable resin composition.
4. A cured product obtained by curing the curable resin composition according to claim 2 or 3.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021101988 | 2021-06-18 | ||
JP2021-101988 | 2021-06-18 | ||
PCT/JP2022/024317 WO2022265096A1 (en) | 2021-06-18 | 2022-06-17 | Epoxy resin, curable resin composition, and cured object therefrom |
Publications (1)
Publication Number | Publication Date |
---|---|
CN117043215A true CN117043215A (en) | 2023-11-10 |
Family
ID=84527126
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202280022791.0A Pending CN117043215A (en) | 2021-06-18 | 2022-06-17 | Epoxy resin, curable resin composition, and cured product of curable resin composition |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7230285B1 (en) |
KR (1) | KR20240021736A (en) |
CN (1) | CN117043215A (en) |
TW (1) | TW202313751A (en) |
WO (1) | WO2022265096A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01252624A (en) * | 1987-12-16 | 1989-10-09 | Sumitomo Chem Co Ltd | Production of polyphenol glycidyl ether |
JPH01252625A (en) * | 1987-12-16 | 1989-10-09 | Sumitomo Chem Co Ltd | Polyphenol glycidyl ether and its composition |
JPH07258382A (en) * | 1994-03-24 | 1995-10-09 | Sumitomo Chem Co Ltd | Production of epoxy resin |
JPH08259662A (en) * | 1995-03-27 | 1996-10-08 | Nippon Kayaku Co Ltd | Production of epoxy resin |
JPH1149766A (en) * | 1997-07-31 | 1999-02-23 | Sumitomo Chem Co Ltd | Partially etherified compound, its production, epoxy resin composition, and product using the same composition |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001089546A (en) * | 1999-09-27 | 2001-04-03 | Sumitomo Chem Co Ltd | Production of phenol-aldehyde resin |
JP2019001841A (en) | 2017-06-12 | 2019-01-10 | 信越化学工業株式会社 | Epoxy resin composition and semiconductor device having cured product of composition |
-
2022
- 2022-06-17 JP JP2022557655A patent/JP7230285B1/en active Active
- 2022-06-17 TW TW111122616A patent/TW202313751A/en unknown
- 2022-06-17 CN CN202280022791.0A patent/CN117043215A/en active Pending
- 2022-06-17 WO PCT/JP2022/024317 patent/WO2022265096A1/en active Application Filing
- 2022-06-17 KR KR1020237031690A patent/KR20240021736A/en unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01252624A (en) * | 1987-12-16 | 1989-10-09 | Sumitomo Chem Co Ltd | Production of polyphenol glycidyl ether |
JPH01252625A (en) * | 1987-12-16 | 1989-10-09 | Sumitomo Chem Co Ltd | Polyphenol glycidyl ether and its composition |
JPH07258382A (en) * | 1994-03-24 | 1995-10-09 | Sumitomo Chem Co Ltd | Production of epoxy resin |
JPH08259662A (en) * | 1995-03-27 | 1996-10-08 | Nippon Kayaku Co Ltd | Production of epoxy resin |
JPH1149766A (en) * | 1997-07-31 | 1999-02-23 | Sumitomo Chem Co Ltd | Partially etherified compound, its production, epoxy resin composition, and product using the same composition |
Also Published As
Publication number | Publication date |
---|---|
WO2022265096A9 (en) | 2023-01-19 |
WO2022265096A1 (en) | 2022-12-22 |
KR20240021736A (en) | 2024-02-19 |
TW202313751A (en) | 2023-04-01 |
JPWO2022265096A1 (en) | 2022-12-22 |
JP7230285B1 (en) | 2023-02-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN112334513B (en) | Maleimide resin, curable resin composition, and cured product thereof | |
TWI648303B (en) | Aromatic amine resin, maleimide resin, curable resin composition and cured product thereof | |
JP6366504B2 (en) | Epoxy resin, epoxy resin composition and cured product | |
JP5019585B2 (en) | Epoxy resin composition, cured product thereof, and fiber-reinforced composite material | |
KR20080064167A (en) | Epoxy resin, curable resin composition, and cured product thereof | |
TW201835136A (en) | Oxazolidone ring-containing epoxy resin, method for producing thereof, curable resin composition and cured product having excellent properties of high heat resistance, low dielectric constant, low dielectric loss tangent and high adhesion | |
JP5386352B2 (en) | Liquid epoxy resin, epoxy resin composition, and cured product | |
WO2008020594A1 (en) | Modified liquid epoxy resin, epoxy resin composition using the same, and cured product thereof | |
TWI739976B (en) | Alkenyl-containing resin, curable resin composition and hardened product | |
JP7185383B2 (en) | Curable resin composition and its cured product | |
JP7268256B1 (en) | Epoxy resin, curable resin composition, and cured product thereof | |
WO2022209642A1 (en) | Epoxy resin and production method therefor, curable resin composition, and cured product thereof | |
JP5448137B2 (en) | Polyhydric phenol resin, epoxy resin composition, and cured product thereof | |
JP7230285B1 (en) | Epoxy resin, curable resin composition, and cured product thereof | |
JP7185384B2 (en) | Epoxy resin, curable resin composition, and cured product thereof | |
JP5170724B2 (en) | Epoxy resin, epoxy resin composition and cured product thereof | |
WO2022107678A1 (en) | Epoxy resin, curable resin composition, and cured object therefrom | |
JP2022147099A (en) | Epoxy resin, curable resin composition, and cured product thereof | |
TW202330703A (en) | Phenolic resin, epoxy resin, curable resin composition and cured products thereof | |
TW202307055A (en) | Epoxy resin mixture, epoxy resin composition and cured product of same | |
TW202337945A (en) | Epoxy resin, epoxy resin composition, and epoxy resin cured product |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |