CN117010514A - Method and device for judging drift of quantum bit parameter - Google Patents
Method and device for judging drift of quantum bit parameter Download PDFInfo
- Publication number
- CN117010514A CN117010514A CN202210452149.8A CN202210452149A CN117010514A CN 117010514 A CN117010514 A CN 117010514A CN 202210452149 A CN202210452149 A CN 202210452149A CN 117010514 A CN117010514 A CN 117010514A
- Authority
- CN
- China
- Prior art keywords
- parameter
- qubit
- physical model
- drift
- directed acyclic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002096 quantum dot Substances 0.000 title claims abstract description 109
- 238000000034 method Methods 0.000 title claims abstract description 41
- 230000001419 dependent effect Effects 0.000 claims abstract description 9
- 238000002474 experimental method Methods 0.000 claims description 21
- 238000004590 computer program Methods 0.000 claims description 18
- 238000003860 storage Methods 0.000 claims description 17
- 238000012360 testing method Methods 0.000 claims description 10
- 230000008054 signal transmission Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 7
- 230000006870 function Effects 0.000 description 7
- 238000012545 processing Methods 0.000 description 7
- 239000000523 sample Substances 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002689 soil Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 125000002015 acyclic group Chemical group 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000005610 quantum mechanics Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N10/00—Quantum computing, i.e. information processing based on quantum-mechanical phenomena
- G06N10/60—Quantum algorithms, e.g. based on quantum optimisation, quantum Fourier or Hadamard transforms
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mathematical Analysis (AREA)
- Data Mining & Analysis (AREA)
- Evolutionary Computation (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computational Mathematics (AREA)
- Mathematical Optimization (AREA)
- Pure & Applied Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Software Systems (AREA)
- Artificial Intelligence (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The application discloses a method and a device for judging drift of a qubit parameter, which are used for judging whether the first parameter drifts or not by utilizing a first directed acyclic graph and a physical model, wherein the first parameter is the qubit parameter corresponding to the position of a dependent node of the parameter to be detected in the first directed acyclic graph. According to the scheme for judging whether the quantum bit parameter is deviated or not, which is provided by the application, manual intervention is not needed, the drift condition of the quantum bit parameter can be rapidly judged, and the execution efficiency of the quantum computing task is improved to a certain extent.
Description
Technical Field
The application relates to the field of quantum computing, in particular to a method and a device for judging drift of quantum bit parameters.
Background
Quantum computation and quantum information are a cross subject for realizing computation and information processing tasks based on the principle of quantum mechanics, and have very close connection with subjects such as quantum physics, computer science, informatics and the like. There has been a rapid development in the last two decades. Quantum computer-based quantum algorithms in factorization, unstructured search, etc. scenarios exhibit far beyond the performance of existing classical computer-based algorithms, and this direction is expected to be beyond the existing computing power. Since quantum computing has a potential to solve specific problems far beyond the development of classical computer performance, in order to realize a quantum computer, it is necessary to obtain a quantum chip containing a sufficient number and a sufficient mass of qubits, and to enable quantum logic gate operation and reading of the qubits with extremely high fidelity.
The quantum chip is equivalent to the traditional computer of the CPU, and the quantum chip is the core component of the quantum computer. With the continuous research and advancement of quantum computing related technologies, the number of quantum bits on a quantum chip is also increasing year by year, and it is expected that larger-scale quantum chips will appear later, and at that time, the number of quantum bits in the quantum chip will be greater, and larger-scale quantum chips will be mounted in a quantum computer. With the increase of the number of the qubits in the quantum chip, the problem of parameter drift of some qubits is necessarily faced in the use process, and at this time, corresponding calibration operation is needed to be carried out on the qubits. When a quantum chip executes a quantum computing task, the performance of a quantum bit in the quantum chip is abnormal, and a specific parameter drift cannot be obtained in time. Aiming at the problem in the prior art, the method generally uses staff to judge according to past experience and output signals of quantum bits, and the scheme has lower efficiency and greatly influences the execution efficiency of quantum computing tasks.
Therefore, it is becoming an urgent problem in the art to propose a scheme capable of rapidly determining whether the qubit parameter is drifting.
It should be noted that the information disclosed in the background section of the present application is only for enhancement of understanding of the general background of the present application and should not be taken as an admission or any form of suggestion that this information forms the prior art already known to those skilled in the art.
Disclosure of Invention
The application aims to provide a method and a device for judging drift of a quantum bit parameter, which are used for solving the problems that the efficiency of a scheme for judging whether the quantum bit parameter drifts is lower in the prior art and the execution efficiency of a quantum computing task is greatly influenced.
In order to solve the above technical problems, the present application provides a method for determining that a qubit parameter drifts, including:
acquiring a first directed acyclic graph, wherein the first directed acyclic graph is used for representing a plurality of quantum bit parameters of a quantum bit to be detected and the dependency relationship among the plurality of quantum bit parameters;
acquiring a physical model of a to-be-measured parameter of the to-be-measured qubit, wherein the physical model is used for acquiring a theoretical expected value of the to-be-measured parameter;
and judging whether a first parameter is drifted or not by using the first directed acyclic graph and the physical model, wherein the first parameter is a qubit parameter corresponding to the position of a dependent node of the parameter to be measured in the first directed acyclic graph.
Optionally, the determining whether the first parameter drifts by using the first directed acyclic graph and the physical model includes:
performing a first test experiment on the quantum bit to be tested to obtain an experiment result of the parameter to be tested, wherein the first test experiment is an experiment of the quantum bit to be tested for obtaining the parameter to be tested;
acquiring the first parameter based on the first directed acyclic graph;
and judging whether the first parameter drifts or not based on the physical model and the experimental result.
Optionally, the determining whether the first parameter drifts based on the physical model and the experimental result includes:
acquiring the offset degree of the experimental result based on the physical model;
and judging whether the first parameter drifts or not based on the deviation degree.
Optionally, the determining whether the first parameter drifts based on the offset degree includes:
judging whether the offset degree is within a preset range or not;
if yes, judging that the first parameter does not drift;
if not, the first parameter is judged to drift.
Optionally, the obtaining, by the physical model, the offset degree of the experimental result includes:
obtaining a theoretical expected value of the parameter to be measured by using the physical model;
and obtaining the deviation degree of the experimental result based on the theoretical expected value.
Optionally, the obtaining the deviation degree of the experimental result based on the theoretical expected value includes:
and obtaining the offset degree by using the fitting goodness for the theoretical expected value and the experimental result.
Optionally, the obtaining the offset degree by using the goodness of fit for the theoretical expected value and the experimental result includes:
constructing a first formula, wherein the first formula is as follows:
wherein R is 2 For the degree of offset, y fit For the theoretical expected value, y raw In order to achieve the results of the experiments described,is the average value of the experimental results;
and obtaining the offset degree by using the first formula.
Based on the same inventive concept, the application also provides a method for calibrating the quantum bit parameter, which comprises the steps of judging the first parameter by using the judging method for drift of the quantum bit parameter in any one of the characteristic descriptions, and carrying out calibration operation on the first parameter when the judging result is yes.
Based on the same inventive concept, the application also provides a device for judging the drift of the quantum bit parameter, which comprises:
a directed acyclic graph acquisition module configured to acquire a first directed acyclic graph for characterizing a plurality of qubit parameters of a qubit to be measured and a dependency relationship between the plurality of qubit parameters;
a physical model acquisition module configured to acquire a physical model of a parameter to be measured of the quantum bit to be measured, the physical model being used to acquire a theoretical expected value of the parameter to be measured;
and the parameter drift judging module is configured to judge whether a first parameter is drifted or not by utilizing the first directed acyclic graph and the physical model, wherein the first parameter is a quantum bit parameter corresponding to the position of a dependent node of the parameter to be measured in the first directed acyclic graph.
Based on the same inventive concept, the application also provides a quantum control system, which utilizes the judging method of the drift of the quantum bit parameter in any one of the above feature descriptions to judge the first parameter or the judging device of the drift of the quantum bit parameter in the above feature descriptions.
Based on the same inventive concept, the application also provides a quantum computer, which comprises the quantum control system described in the above characteristic description.
Based on the same inventive concept, the application further provides a readable storage medium, on which a computer program is stored, which when executed by a processor can implement a method for determining that a qubit parameter of any one of the above feature descriptions is shifted, or implement a method for calibrating a qubit parameter of the above feature descriptions.
Compared with the prior art, the application has the following beneficial effects:
the method for judging the drift of the qubit parameters judges whether the first parameters drift or not by utilizing the first directed acyclic graph and the physical model, wherein the first parameters are the qubit parameters corresponding to the positions of the dependent nodes of the parameters to be tested in the first directed acyclic graph. According to the scheme for judging whether the quantum bit parameter is deviated or not, which is provided by the application, manual intervention is not needed, the drift condition of the quantum bit parameter can be rapidly judged, and the execution efficiency of the quantum computing task is improved to a certain extent.
The calibration method of the quantum bit parameter, the judgment device of the drift of the quantum bit parameter, the quantum control system, the quantum computer and the readable storage medium provided by the application belong to the same conception as the judgment method of the drift of the quantum bit parameter, so that the calibration method has the same beneficial effects and is not repeated herein.
Drawings
Fig. 1 is a flow chart of a method for determining drift of a qubit parameter according to an embodiment of the present application;
FIG. 2 is a schematic illustration of a first directed acyclic graph according to an embodiment of the application;
FIG. 3 is a plot of DC voltage versus modulation of a read resonant cavity;
FIG. 4 is a plot of modulation of cavity frequency versus read signal amplitude;
fig. 5 is a schematic structural diagram of a device for determining drift of a qubit parameter according to another embodiment of the present application.
Detailed Description
Specific embodiments of the present application will be described in more detail below with reference to the drawings. Advantages and features of the application will become more apparent from the following description and claims. It should be noted that the drawings are in a very simplified form and are all to a non-precise scale, merely for convenience and clarity in aiding in the description of embodiments of the application.
In the description of the present application, it should be understood that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", etc., are based on the directions or positional relationships shown in the drawings, are merely for convenience in describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present application.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present application, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
Referring to fig. 1, an embodiment of the present application provides a method for determining drift of a qubit parameter, including:
s10: acquiring a first directed acyclic graph, wherein the first directed acyclic graph is used for representing a plurality of quantum bit parameters of a quantum bit to be detected and the dependency relationship among the plurality of quantum bit parameters;
s20: acquiring a physical model of a to-be-measured parameter of the to-be-measured qubit, wherein the physical model is used for acquiring a theoretical expected value of the to-be-measured parameter;
s30: and judging whether a first parameter is drifted or not by using the first directed acyclic graph and the physical model, wherein the first parameter is a qubit parameter corresponding to the position of a dependent node of the parameter to be measured in the first directed acyclic graph.
Compared with the prior art, the method for judging whether the quantum bit parameter drifts is characterized in that the first directed acyclic graph and the physical model are utilized to judge whether the first parameter drifts, wherein the first parameter is the quantum bit parameter corresponding to the dependence node position of the parameter to be detected in the first directed acyclic graph. According to the scheme for judging whether the quantum bit parameter is deviated or not, which is provided by the application, manual intervention is not needed, the drift condition of the quantum bit parameter can be rapidly judged, and the execution efficiency of the quantum computing task is improved to a certain extent.
In order to facilitate understanding of the technical solution of the present application, in this embodiment, all the first directed acyclic graphs are exemplified by the directed acyclic graph shown in fig. 2, please refer to fig. 2, where each node represents a different qubit parameter, for example, a parameter of a single-bit logic gate of a qubit or a parameter of a control signal of a qubit, where the parameter of the single-bit logic gate includes, but is not limited to, a voltage amplitude of a pi pulse or a frequency of a readout pulse, a pi pulse length, a pi/2 pulse length, a pi pulse amplitude and a pi/2 pulse amplitude, and parameters of a control signal of a qubit include, but are not limited to, a readout pulse frequency, a readout pulse length, a readout pulse power, and many other qubit parameters, which are not described herein in detail, and may be determined specifically according to a kind and characteristics of a qubit. The directed acyclic graph in fig. 2 shows the dependency of each qubit parameter, wherein the backward node is affected by a forward node (i.e. the dependency node) having a connection relationship, the forward node refers to the starting point of an arrow in the graph, the backward node refers to the pointing point of an arrow in the graph, and of course, the forward node and the backward node are defined relatively, and do not have a fixed relation to a certain node, for example, the node 2 is a backward node of the node 1 and is also a forward node of the node 3, so that the node 2 is affected by the node 1, the node 2 also affects the node 3 at the same time, and other nodes are not repeated herein. Node 1 in fig. 2 is the starting node of the entire directed acyclic graph, and node 13 is the ending node of the entire directed acyclic graph.
As will be appreciated by those skilled in the art, in a quantum computer, a quantum chip is a processor that performs quantum computation, a plurality of qubits and reading resonators are integrated on the quantum chip, the qubits and the reading resonators are in one-to-one correspondence and are coupled to each other, a section of each reading resonator, which is far away from the corresponding qubit, is connected to a reading signal transmission line integrally provided on the quantum chip, and each qubit is coupled to an XY signal transmission line and a Z signal transmission line. The XY signal transmission line is used for receiving the quantum state regulation and control signal, the Z signal transmission line is used for receiving the magnetic flux regulation and control signal, the magnetic flux regulation and control signal comprises a bias voltage signal (DC voltage) and/or a pulse bias regulation and control signal, the bias voltage signal and the pulse bias regulation and control signal can regulate and control the frequency of the quantum bit, and the reading signal transmission line is used for receiving the reading detection signal and transmitting the reading feedback signal.
In addition, it should be noted that the execution process of quantum computation can be briefly described as: and adjusting the frequency of the quantum bit to the working frequency by utilizing a magnetic flux adjusting and controlling signal on the Z signal transmission line, applying a quantum state adjusting and controlling signal to perform quantum state adjustment and control on the quantum bit in an initial state through the XY signal transmission line, and reading the quantum state of the quantum bit after adjustment and control by adopting a reading resonant cavity. Specifically, a carrier frequency pulse signal is applied through a read signal transmission line, which is generally called a read detection signal, the read detection signal is generally a microwave signal with the frequency of 4-8GHz, and the quantum state of the quantum bit is determined by analyzing a read feedback signal output by the read signal transmission line. The fundamental reason that the read resonator is capable of reading the quantum state of the qubit is that the different quantum states of the qubit have different dispersion frequency shifts to the read resonator, such that the different quantum states of the qubit have different responses to a read probe signal applied to the read resonator, which response signal is referred to as a read feedback signal. Only when the carrier frequency of the read probe signal of the qubit is very close to the natural frequency (also called resonant frequency) of the read resonant cavity, the read resonant cavity has a maximized distinguishable level due to the obvious difference of the response of the qubit to the read probe signal in different quantum states.
In the embodiment of the application, the physical model is used for obtaining the theoretical expected value of the parameter to be tested, a corresponding physical model is established for each node in the first directed acyclic graph, the physical model of each node is a theoretical expected value of current node experimental data, and whether the experimental result data accords with the theoretical expected value of the physical model is verified by fitting the experimental result data and then comparing the experimental result data with the theoretical expected value of the physical model. When the experimental result data of a certain node cannot reach the theoretical expectation of a physical model, the result data is considered to be caused by the drift of a forward node, namely the dependent node, and by the scheme, the specific parameter of the output sub-bit can be rapidly judged. To facilitate the understanding of the technical solution of the present application by a person skilled in the art, the following description is aided by examples of physical models of several qubit parameters:
assuming that a certain node in the first directed acyclic graph is used for acquiring the modulation of the DC voltage on the read resonant cavity, for convenience of understanding, we can assume here that this node is node 2 in fig. 2, which reflects the coupling condition of the read resonant cavity and the qubit mainly through experiments, and the applicant establishes the following physical model for parameters of this node:
modulation f of DC voltage to read resonant cavity r (v) The method meets the following conditions:
wherein f q (v) Representing the modulation of the DC voltage to the qubit frequency, g representing the coupling strength of the read resonator and the qubit, delta representing the detuned difference between the qubit and the read resonator, f c Representing the non-harmonic content of the qubit.
Referring to fig. 3, the curve a in fig. 3 shows a modulation curve of the DC voltage to the read resonant cavity obtained by fitting the experimental result, and the curve B shows a modulation curve of the DC voltage to the read resonant cavity in the physical model, so that the experimental result is not completely consistent with the physical model, but still acceptable, and can be considered to be in accordance with the requirements in some application occasions with higher tolerance.
Assuming node 3 in fig. 2 is the location of the cavity frequency for the 0 state read when the test DC voltage is at its maximum, which refers to the frequency of the read resonant cavity, applicants build the following physical model for the parameters of this node:
wherein A1, A2, A3 and A4 are all pre-configured coefficients, fr represents the cavity frequency in the 0 state, Q1 represents the quality factor of the read resonant cavity, y represents the amplitude of the read signal (which is the result of our experimental measurement), x represents the cavity frequency, and x is the amount to be scanned in this experiment.
Referring to fig. 4, where the curve C in fig. 4 represents a modulation curve of the cavity frequency to the amplitude of the read signal obtained by fitting the experimental result, the curve D represents a modulation curve of the cavity frequency to the amplitude of the read signal in the physical model, and it can be seen that the experimental result does not completely conform to the physical model, but the result is still acceptable, and the experimental result can be considered to conform to the requirements in some application occasions with higher tolerance. In some application occasions with lower tolerance, the experimental result is considered to be unsatisfactory, and at the moment, by combining the directed acyclic graph of fig. 2, it can be determined that the parameters corresponding to the node 2 deviate. It will be understood by those skilled in the art that in practical application, the number of parameters to be measured is large, so there are many physical models corresponding to the parameters, and only two of the physical models and many other types of physical models are illustrated in the embodiment, which are not described in detail herein.
Specifically, in this embodiment, the determining, by using the first directed acyclic graph and the physical model, whether the first parameter drifts includes:
performing a first test experiment on the quantum bit to be tested to obtain an experiment result of the parameter to be tested, wherein the first test experiment is an experiment of the quantum bit to be tested for obtaining the parameter to be tested;
acquiring the first parameter based on the first directed acyclic graph;
and judging whether the first parameter drifts or not based on the physical model and the experimental result.
It will be appreciated by those skilled in the art that the first test experiment corresponds to the parameter to be measured, for example, the first test experiment corresponding to the node 2 in fig. 2 is an experiment for obtaining the modulation of the DC voltage to the read resonant cavity, and the first test experiment corresponding to the node 3 is an experiment for modulating the amplitude of the read signal by the cavity frequency.
Further, the determining whether the first parameter drifts based on the physical model and the experimental result includes:
acquiring the offset degree of the experimental result based on the physical model;
and judging whether the first parameter drifts or not based on the deviation degree.
Note that in the present embodiment, the degree of deviation refers to the degree of deviation of the experimental result from the physical model, such as curve a and curve B in fig. 3, and curve C and curve D in fig. 4.
Different application scenarios, different requirements on the size of the offset degree, some nodes with low requirements on accuracy may be acceptable for the experimental result deviating from a certain range, in which case the threshold value of the offset degree may be set larger, but for some nodes with high requirements on accuracy, the experimental result needs to be very close to the physical model, and at this time, the threshold value of the offset degree needs to be set smaller. In this embodiment, the determining whether the first parameter drifts based on the offset degree includes:
judging whether the offset degree is within a preset range or not;
if yes, judging that the first parameter does not drift;
if not, the first parameter is judged to drift.
Specifically, the obtaining, by the physical model, the offset degree of the experimental result includes:
obtaining a theoretical expected value of the parameter to be measured by using the physical model;
and obtaining the deviation degree of the experimental result based on the theoretical expected value.
It will be appreciated by those skilled in the art that in the present embodiment, the theoretical expected value of the parameter to be measured is obtained by using the physical model, and in fact, a fitted curve of the parameter to be measured is obtained by using the physical model, which is similar to the curve B in fig. 3 and the curve D in fig. 4.
To obtain the offset degree of the experimental result, the applicant proposes to use a Goodness of Fit (Goodness of Fit) which refers to the fitting degree of the regression line to the observed value. The fitting degree of the model to the sample observation value is checked by mainly using the judgment coefficient and the regression standard deviation. When the interpretation variable is a multiple, the adjusted goodness of fit is used to account for the effect of variable element additions on goodness of fit. Assuming that a population can be classified into r classes, a sample is now obtained from the population, which is a collection of classification data from which we need to start to determine if the probability of occurrence of the population class matches the known probability. For example, if a dice is to be uniformly checked, the dice may be thrown several times, the number of occurrences of each face may be recorded, and from these data, whether the probability of occurrence of each face is 1/6, the goodness-of-fit check is used to check whether the overall distribution from which a batch of classified data is derived corresponds to a certain theoretical distribution. Specifically, the obtaining the deviation degree of the experimental result based on the theoretical expected value includes:
and obtaining the offset degree by using the fitting goodness for the theoretical expected value and the experimental result.
In this embodiment, the obtaining the offset degree by using the goodness of fit for the theoretical expected value and the experimental result includes:
constructing a first formula, wherein the first formula is as follows:
wherein R is 2 For the degree of offset, y fit For the theoretical expected value, y raw The experimental result is the average value of the experimental result;
and obtaining the offset degree by using the first formula.
It should be noted that R is as follows 2 The closer the value is to 1, the smaller the offset is, e.g., R in FIG. 3 2 0.955, the experimental results in fig. 3 are not too far from the physical model. R in FIG. 4 2 The degree of deviation of the experimental result in the soil from the physical model is 0.914, which is in a acceptable position, but is not acceptable for some occasions with higher precision requirements, and the experimental result in the soil can be specifically adjusted according to actual needs without limitation.
Based on the same inventive concept, the embodiment of the application further provides a method for calibrating the quantum bit parameter, the method for judging that the quantum bit parameter drifts according to any one of the above feature descriptions is used for judging the first parameter, and when the judgment result is yes, the first parameter is calibrated.
Referring to fig. 5, based on the same inventive concept, an embodiment of the present application further provides a device for determining that a qubit parameter drifts, including:
a directed acyclic graph acquisition module 100 configured to acquire a first directed acyclic graph for characterizing a plurality of qubit parameters of a qubit to be measured and a dependency relationship between the plurality of qubit parameters;
a physical model acquisition module 200 configured to acquire a physical model of a parameter to be measured of the qubit to be measured, the physical model being used to acquire a theoretical expected value of the parameter to be measured;
and the parameter drift judging module 300 is configured to judge whether a first parameter is drifted or not by using the first directed acyclic graph and the physical model, wherein the first parameter is a qubit parameter corresponding to a dependent node position of the parameter to be measured in the first directed acyclic graph.
It will be appreciated that the directed acyclic graph obtaining module 100, the physical model obtaining module 200, and the parameter drift determining module 300 may be combined in one device, or any one of the modules may be split into a plurality of sub-modules, or at least part of the functions of one or more of the directed acyclic graph obtaining module 100, the physical model obtaining module 200, and the parameter drift determining module 300 may be combined with at least part of the functions of other modules and implemented in one functional module. At least one of the directed acyclic graph acquisition module 100, the physical model acquisition module 200, and the parameter drift determination module 300 may be implemented at least in part as hardware circuitry, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system-on-chip, a system-on-a-substrate, a system-on-a-package, an Application Specific Integrated Circuit (ASIC), or any other reasonable manner of integrating or packaging circuitry, or in hardware or firmware, or in a suitable combination of software, hardware, and firmware implementations, in accordance with embodiments of the present application. Alternatively, at least one of the directed acyclic graph acquisition module 100, the physical model acquisition module 200, and the parameter drift determination module 300 may be at least partially implemented as a computer program module, which when executed by a computer, may perform the functions of the respective module.
Based on the same inventive concept, the embodiment of the application further provides a quantum control system, which uses the method for judging the drift of the quantum bit parameter in any one of the above feature descriptions to judge the first parameter, or comprises the device for judging the drift of the quantum bit parameter in the above feature description.
Based on the same inventive concept, the embodiment of the application also provides a quantum computer, which comprises the quantum control system described in the above characteristic description.
Based on the same inventive concept, the embodiment of the application further provides a readable storage medium, on which a computer program is stored, where the computer program when executed by a processor can implement a method for determining that a qubit parameter drift occurs in any one of the above feature descriptions, or implement a method for calibrating the qubit parameter described in the above feature descriptions.
The readable storage medium may be a tangible device that can hold and store instructions for use by an instruction execution device, such as, but not limited to, an electronic storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the preceding. More specific examples (a non-exhaustive list) of the readable storage medium would include the following: portable computer disks, hard disks, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static Random Access Memory (SRAM), portable compact disk read-only memory (CD-ROM), digital Versatile Disks (DVD), memory sticks, floppy disks, mechanical coding devices, punch cards or in-groove structures such as punch cards or grooves having instructions stored thereon, and any suitable combination of the foregoing. The computer program described herein may be downloaded from a readable storage medium to a respective computing/processing device or to an external computer or external storage device via a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmissions, wireless transmissions, routers, firewalls, switches, gateway computers and/or edge servers. The network interface card or network interface in each computing/processing device receives the computer program from the network and forwards the computer program for storage in a readable storage medium in the respective computing/processing device. Computer programs for carrying out operations of the present application may be assembly instructions, instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, c++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer program may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, aspects of the present application are implemented by personalizing electronic circuitry, such as programmable logic circuits, field Programmable Gate Arrays (FPGAs), or Programmable Logic Arrays (PLAs), with state information for a computer program, which can execute computer-readable program instructions.
Aspects of the present application are described herein with reference to flowchart illustrations and/or block diagrams of methods, systems, and computer program products according to embodiments of the application. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer programs. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the programs, when executed by the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks. These computer programs may also be stored in a readable storage medium that can direct a computer, programmable data processing apparatus, and/or other devices to function in a particular manner, such that the readable storage medium storing the computer program includes an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.
The computer program may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the computer program which is executed on the computer, other programmable apparatus or other devices implements the functions/acts specified in the flowchart and/or block diagram block or blocks.
In the description of the present specification, a description of the terms "one embodiment," "some embodiments," "examples," or "particular examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics may be combined in any suitable manner in any one or more embodiments. Further, one skilled in the art can engage and combine the different embodiments or examples described in this specification.
The foregoing is merely a preferred embodiment of the present application and is not intended to limit the present application in any way. Any person skilled in the art will make any equivalent substitution or modification to the technical solution and technical content disclosed in the application without departing from the scope of the technical solution of the application, and the technical solution of the application is not departing from the scope of the application.
Claims (12)
1. A method for judging drift of a qubit parameter is characterized by comprising the following steps:
acquiring a first directed acyclic graph, wherein the first directed acyclic graph is used for representing a plurality of quantum bit parameters of a quantum bit to be detected and the dependency relationship among the plurality of quantum bit parameters;
acquiring a physical model of a to-be-measured parameter of the to-be-measured qubit, wherein the physical model is used for acquiring a theoretical expected value of the to-be-measured parameter;
and judging whether a first parameter is drifted or not by using the first directed acyclic graph and the physical model, wherein the first parameter is a qubit parameter corresponding to the position of a dependent node of the parameter to be measured in the first directed acyclic graph.
2. The method of claim 1, wherein said determining whether a first parameter has drifted using said first directed acyclic graph and said physical model comprises:
performing a first test experiment on the quantum bit to be tested to obtain an experiment result of the parameter to be tested, wherein the first test experiment is an experiment of the quantum bit to be tested for obtaining the parameter to be tested;
acquiring the first parameter based on the first directed acyclic graph;
and judging whether the first parameter drifts or not based on the physical model and the experimental result.
3. The method of claim 2, wherein the determining whether the first parameter drifts based on the physical model and the experimental result comprises:
acquiring the offset degree of the experimental result based on the physical model;
and judging whether the first parameter drifts or not based on the deviation degree.
4. The method of claim 3, wherein the determining whether the first parameter drifts based on the degree of offset comprises:
judging whether the offset degree is within a preset range or not;
if yes, judging that the first parameter does not drift;
if not, the first parameter is judged to drift.
5. The method of claim 3, wherein the obtaining the degree of offset of the experimental result by the physical model comprises:
obtaining a theoretical expected value of the parameter to be measured by using the physical model;
and obtaining the deviation degree of the experimental result based on the theoretical expected value.
6. The method of claim 5, wherein the obtaining the degree of offset of the experimental result based on the theoretical expected value comprises:
and obtaining the offset degree by using the fitting goodness for the theoretical expected value and the experimental result.
7. The method of claim 6, wherein said obtaining said degree of offset from said theoretical expected value and said experimental result using a goodness of fit comprises:
constructing a first formula, wherein the first formula is as follows:
wherein R is 2 For the degree of offset, y fit For the theoretical expected value, y raw In order to achieve the results of the experiments described,is the average value of the experimental results;
and obtaining the offset degree by using the first formula.
8. A method for calibrating a qubit parameter, characterized in that the first parameter is judged by using the method for judging that the qubit parameter drifts according to any one of claims 1 to 7, and when the judgment result is yes, the first parameter is calibrated.
9. A device for determining drift of a qubit parameter, comprising:
a directed acyclic graph acquisition module configured to acquire a first directed acyclic graph for characterizing a plurality of qubit parameters of a qubit to be measured and a dependency relationship between the plurality of qubit parameters;
a physical model acquisition module configured to acquire a physical model of a parameter to be measured of the quantum bit to be measured, the physical model being used to acquire a theoretical expected value of the parameter to be measured;
and the parameter drift judging module is configured to judge whether a first parameter is drifted or not by utilizing the first directed acyclic graph and the physical model, wherein the first parameter is a quantum bit parameter corresponding to the position of a dependent node of the parameter to be measured in the first directed acyclic graph.
10. A quantum control system, characterized in that the first parameter is judged by the judging method of the drift of the qubit parameter according to any one of claims 1 to 7, or the judging device of the drift of the qubit parameter according to claim 9 is included.
11. A quantum computer comprising the quantum control system of claim 10.
12. A readable storage medium having stored thereon a computer program, which when executed by a processor is capable of implementing the method for determining the occurrence of a drift in a qubit parameter according to any one of claims 1 to 7, or of implementing the method for calibrating a qubit parameter according to claim 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210452149.8A CN117010514A (en) | 2022-04-27 | 2022-04-27 | Method and device for judging drift of quantum bit parameter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210452149.8A CN117010514A (en) | 2022-04-27 | 2022-04-27 | Method and device for judging drift of quantum bit parameter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117010514A true CN117010514A (en) | 2023-11-07 |
Family
ID=88571348
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210452149.8A Pending CN117010514A (en) | 2022-04-27 | 2022-04-27 | Method and device for judging drift of quantum bit parameter |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117010514A (en) |
-
2022
- 2022-04-27 CN CN202210452149.8A patent/CN117010514A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10643143B2 (en) | Performing a calibration process in a quantum computing system | |
| CN109804387B (en) | Automatic qubit calibration | |
| CN111656374B (en) | Qubit calibration | |
| CN114720763B (en) | Adjustable coupler, calibration method and device thereof and quantum measurement and control system | |
| WO2022121809A1 (en) | Method and device for calibrating frequency of superconducting qubit, and readable storage medium | |
| CN115470921B (en) | Quantum bit calibration method and device and quantum computer | |
| US10296628B2 (en) | Sample size estimator | |
| CN117010514A (en) | Method and device for judging drift of quantum bit parameter | |
| CN115577784B (en) | Method and device for calibrating qubit regulation signal and readable storage medium | |
| CN115840126B (en) | Quantum bit frequency acquisition method, quantum measurement and control system and quantum computer | |
| US20220261679A1 (en) | Probe of qubit-resonator dispersive shift using ac stark shift | |
| CN117010520A (en) | Method and device for testing parameters of reading cavity and quantum computer | |
| CN115470920B (en) | Quantum bit calibration method and device and quantum computer | |
| CN115423110B (en) | Quantum state reading and determining method and system for quantum bits and quantum computer | |
| CN117368569A (en) | AC modulation spectrum testing method and device and quantum computer | |
| CN115470922B (en) | Quantum bit calibration method and device, quantum control system and quantum computer | |
| Quan et al. | Genetic algorithm for accurate modeling of distributed Bragg reflector laser power and wavelength | |
| CN115902393B (en) | AC modulation spectrum acquisition method and device and quantum computer | |
| CN117196047A (en) | Quantum bit energy relaxation time parameter testing method and quantum control system | |
| CN115598489B (en) | Quantum bit parameter measuring method and device and quantum chip testing method | |
| CN117521818A (en) | Method and device for testing two-quantum bit logic gate parameters and quantum computer | |
| CN117196046A (en) | Quantum bit phase relaxation time parameter testing method and quantum control system | |
| CN118036760A (en) | Method and device for adjusting two-quantum bit logic gate and quantum computer | |
| CN117313874A (en) | Testing method of single-quantum bit logic gate and quantum control system | |
| CN115902442A (en) | Quantum bit noise intensity coefficient measuring method and system and quantum computer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |