CN117368569A - AC modulation spectrum testing method and device and quantum computer - Google Patents
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Abstract
The invention discloses a testing method of an AC modulation spectrum and a quantum control system, which are characterized in that a physical model of the AC modulation spectrum of a quantum bit to be tested is firstly obtained, wherein the physical model is used for obtaining theoretical expectation that the bit frequency of the quantum bit to be tested changes along with voltage, and a first experiment is carried out on the quantum bit to be tested to obtain an experiment result that the bit frequency of the quantum bit to be tested changes along with voltage. And finally, acquiring whether the AC modulation spectrum of the quantum bit to be detected meets the requirements or not based on the physical model and the experimental result. The test method based on the AC modulation spectrum provided by the application tests the experimental result of the AC modulation spectrum, the whole test does not need manual intervention, whether the AC modulation spectrum meets the requirements can be rapidly judged, and the execution efficiency of the quantum chip test process is improved to a certain extent.
Description
Technical Field
The invention relates to the technical field of quantum computing, in particular to a testing method and device of an AC modulation spectrum and a quantum computer.
Background
Quantum computation and quantum information are a cross subject for realizing computation and information processing tasks based on the principle of quantum mechanics, and have very close connection with subjects such as quantum physics, computer science, informatics and the like. There has been a rapid development in the last two decades. Quantum computer-based quantum algorithms in factorization, unstructured search, etc. scenarios exhibit far beyond the performance of existing classical computer-based algorithms, and this direction is expected to be beyond the existing computing power. Since quantum computing has a potential to solve specific problems far beyond the development of classical computer performance, in order to realize a quantum computer, it is necessary to obtain a quantum chip containing a sufficient number and a sufficient mass of qubits, and to enable quantum logic gate operation and reading of the qubits with extremely high fidelity.
The quantum chip is a processor for executing quantum computation, and a plurality of quantum bits and reading cavities which are in one-to-one correspondence and are mutually coupled are integrated on the quantum chip. Before each quantum chip is formally used on line, each parameter of the quantum chip needs to be tested and characterized. The AC modulation spectrum is a very important parameter among parameters of the quantum bit, and the AC modulation spectrum of the quantum bit refers to a spectrum of a change in the quantum bit frequency with AC flux in the magnetic flux modulation line. In the test stage, the Ramsey experiment can be used for obtaining the quantum bit frequency under each voltage value, so as to obtain the AC modulation spectrum of the quantum bit, and whether the obtained AC modulation spectrum meets the requirements or not is also needed to be judged. Aiming at the problem, the prior art generally judges whether the obtained AC modulation spectrum meets the requirement according to the experimental result manually, and the scheme has lower efficiency and greatly influences the execution efficiency of the test process.
Therefore, the technical scheme of providing a test method of an AC modulation spectrum is increasingly becoming a problem to be solved in the field.
It should be noted that the information disclosed in the background section of the present application is only for enhancement of understanding of the general background of the present application and should not be taken as an admission or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Disclosure of Invention
The invention aims to provide a testing method and a quantum control system for an AC modulation spectrum, which are used for solving the problem of low testing efficiency of a quantum chip in the prior art.
In order to solve the above technical problems, in a first aspect, the present invention provides a method for testing an AC modulation spectrum, including:
acquiring a physical model of an AC modulation spectrum of a quantum bit to be detected, wherein the physical model is used for acquiring theoretical expectation that the bit frequency of the quantum bit to be detected changes along with voltage;
executing a first experiment on the quantum bit to be detected, and obtaining an experiment result that the bit frequency of the quantum bit to be detected changes along with the voltage;
and acquiring whether the AC modulation spectrum of the quantum bit to be detected meets the requirement or not based on the physical model and the experimental result.
Optionally, the obtaining a physical model of the AC modulation spectrum of the qubit to be measured includes:
the bit frequency as a function of voltage satisfies:
where Φ=pi M (x-offset), y represents the bit frequency, x represents the voltage, α represents the bit non-harmonic, f qmax Both M, offset are parameters of the physical model.
Optionally, the obtaining whether the AC modulation spectrum of the qubit to be detected meets the requirement based on the physical model and the experimental result includes:
judging whether the experimental result of the first experiment meets the requirement or not based on the physical model;
and obtaining whether the AC modulation spectrum of the quantum bit to be detected meets the requirements or not according to the judging result, wherein if the judging result is that the experimental result does not meet the requirements, the AC modulation spectrum of the quantum bit to be detected is obtained, and if the judging result is that the experimental result meets the requirements, the AC modulation spectrum of the quantum bit to be detected is obtained.
Optionally, the determining, based on the physical model, whether the experimental result of the first experiment meets the requirement includes:
and judging whether the experimental result of the first experiment meets the requirements or not by using the fitting goodness of the experimental result of the physical model and the first experiment.
Optionally, the determining whether the experimental result of the first experiment meets the requirement by using the goodness of fit on the physical model and the experimental result of the first experiment includes:
obtaining the offset degree by using a goodness-of-fit for the theoretical expected value and the modulation condition, including:
constructing a first formula, wherein the first formula is as follows:
wherein R is 2 To the extent of offset, y fit For theoretical expectation of the physical model, y raw As a result of the experiment of the first experiment,is an average value of experimental results of the first experiment;
and comparing the offset degree obtained by the first formula with a preset threshold value, and judging whether an experimental result of the first experiment meets the requirement.
Optionally, the comparing the offset degree obtained by using the first formula with a preset threshold value, and determining whether the experimental result of the first experiment meets the requirement includes:
judging the R 2 Whether greater than a set threshold;
if yes, judging that the experimental result of the first experiment meets the requirement;
if not, judging that the experimental result of the first experiment is not satisfactory.
Optionally, the performing a first experiment on the to-be-detected qubit to obtain an experimental result that the bit frequency of the to-be-detected qubit changes with voltage, including:
when a quantum bit works at a degenerate point and a plurality of working voltages near the degenerate point, respectively corresponding bit frequencies are obtained;
acquiring a frequency prediction formula based on the degenerated points and the working voltages nearby the degenerated points and the corresponding bit frequencies;
acquiring prediction frequencies corresponding to all other voltage values to be detected except a plurality of obtained working points in a first preset range based on the frequency prediction formula, and respectively executing Ramsey experiments to acquire corresponding bit frequencies when the quantum bit works at the voltage values to be detected, wherein the driving frequency of a driving signal in the Ramsey experiments under the voltage values to be detected is set based on the corresponding prediction frequencies;
and acquiring an experimental result of the AC modulation spectrum of the quantum bit based on the obtained bit frequency and the corresponding operating point voltage.
Optionally, the obtaining, based on the frequency prediction formula, a predicted frequency corresponding to each of the remaining voltage values to be measured except for the obtained plurality of working points in the first preset range, and executing a Ramsey experiment to obtain a corresponding bit frequency when the qubit works at each of the voltage values to be measured, where a driving frequency of the driving signal in the Ramsey experiment under each of the voltage values to be measured is set based on the corresponding predicted frequency, includes:
acquiring a predicted frequency corresponding to a voltage value to be measured based on the frequency prediction formula;
executing a Ramsey experiment when the quantum bit works at the voltage value to be detected and acquiring a bit frequency, wherein the value of a driving frequency of the Ramsey experiment is determined based on the value of the predicted frequency;
and adjusting the voltage value to be measured and returning to execute the frequency prediction formula based on the frequency prediction formula to obtain the predicted frequency corresponding to the voltage value to be measured until the voltage value to be measured in the first preset range is traversed.
In a second aspect, the present application provides a test apparatus for an AC modulation spectrum, comprising:
a physical model acquisition module configured to acquire a physical model of an AC modulation spectrum of a quantum bit to be measured, wherein the physical model is used for acquiring theoretical expectation of a bit frequency of the quantum bit to be measured along with a voltage change;
an experiment result acquisition module configured to perform a first experiment on the to-be-detected qubit, and acquire an experiment result of a bit frequency of the to-be-detected qubit changing with voltage;
and the judging module is configured to acquire whether the AC modulation spectrum of the quantum bit to be detected meets the requirement or not based on the physical model and the experimental result.
In a third aspect, the present application provides a quantum control system, which uses the testing method of the AC modulation spectrum provided in the present application to determine the AC modulation spectrum, or includes the testing device of the AC modulation spectrum provided in the present application.
In a fourth aspect, the present application provides a quantum computer comprising the quantum control system provided in the third aspect of the present application.
In a fifth aspect, the present application provides a readable storage medium having stored thereon a computer program which, when executed by a processor, is capable of implementing the method for testing an AC modulation spectrum according to the first aspect of the present application.
Compared with the prior art, the invention has the following beneficial effects:
according to the AC modulation spectrum testing method, firstly, a physical model of an AC modulation spectrum of a quantum bit to be tested is obtained, wherein the physical model is used for obtaining theoretical expectation that the bit frequency of the quantum bit to be tested changes along with voltage, and a first experiment is carried out on the quantum bit to be tested, so that an experiment result that the bit frequency of the quantum bit to be tested changes along with voltage is obtained. And finally, acquiring whether the AC modulation spectrum of the quantum bit to be detected meets the requirements or not based on the physical model and the experimental result. The test method based on the AC modulation spectrum provided by the application tests the experimental result of the AC modulation spectrum, the whole test does not need manual intervention, whether the AC modulation spectrum meets the requirements can be rapidly judged, the blank of the prior art is made up, and the execution efficiency of the quantum chip test process is improved to a certain extent.
The testing device, the quantum control system, the readable storage medium and the quantum computer of the AC modulation spectrum provided by the invention belong to the same conception as the testing method of the AC modulation spectrum, so that the testing device and the quantum control system have the same beneficial effects and are not described in detail herein.
Drawings
Fig. 1 is a flow chart of a testing method of an AC modulation spectrum according to an embodiment of the present invention;
FIG. 2 is a schematic diagram showing the deviation degree of a physical model and an experimental result according to an embodiment of the present invention;
fig. 3 is another schematic diagram showing the deviation degree of the physical model and the experimental result according to the embodiment of the invention.
Detailed Description
Specific embodiments of the present invention will be described in more detail below with reference to the drawings. Advantages and features of the invention will become more apparent from the following description and claims. It should be noted that the drawings are in a very simplified form and are all to a non-precise scale, merely for convenience and clarity in aiding in the description of embodiments of the invention.
In the description of the present invention, it should be understood that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", etc., are based on the directions or positional relationships shown in the drawings, are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present invention, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
Referring to fig. 1, an embodiment of the present invention provides a method for testing an AC modulation spectrum, including:
s1: acquiring a physical model of an AC modulation spectrum of a quantum bit to be detected, wherein the physical model is used for acquiring theoretical expectation that the bit frequency of the quantum bit to be detected changes along with voltage;
s2: executing a first experiment on the quantum bit to be detected, and obtaining an experiment result that the bit frequency of the quantum bit to be detected changes along with the voltage;
s3: and acquiring whether the AC modulation spectrum of the quantum bit to be detected meets the requirement or not based on the physical model and the experimental result.
The method for testing the AC modulation spectrum provided by the embodiment of the invention is characterized in that a physical model of the AC modulation spectrum of the quantum bit to be tested is firstly obtained, wherein the physical model is used for obtaining theoretical expectation that the bit frequency of the quantum bit to be tested changes along with voltage, and a first experiment is performed on the quantum bit to be tested to obtain an experiment result that the bit frequency of the quantum bit to be tested changes along with voltage. And finally, acquiring whether the AC modulation spectrum of the quantum bit to be detected meets the requirements or not based on the physical model and the experimental result. The test method based on the AC modulation spectrum provided by the application tests the experimental result of the AC modulation spectrum, the whole test does not need manual intervention, whether the AC modulation spectrum meets the requirements can be rapidly judged, and the execution efficiency of the quantum chip test process is improved to a certain extent.
In the embodiment of the invention, the applicant establishes a physical model of the AC modulation spectrum, wherein the physical model reflects a theoretical experiment result of the quantum bit to be tested in the first experiment under normal conditions, and the theoretical experiment result mainly comprises theoretical expectation that the bit frequency of the quantum bit to be tested changes along with the voltage. Specifically, the physical model of the AC modulation spectrum comprises:
the change of the bit frequency of the quantum bit to be measured along with the voltage satisfies the following conditions:
where Φ=pi M (x-offset), y represents the bit frequency, x represents the voltage, α represents the bit non-harmonic, f qmax Both M, offset are parameters of the physical model.
In the embodiment of the invention, the first experiment is a Ramsey experiment, and other experimental methods can be adopted to obtain the experimental result that the bit frequency of the quantum bit to be detected changes along with the voltage.
Specifically, the Ramsey experiment includes:
applying two pi/2 quantum logic gate operations to one qubit, the time interval between the two operations being tau, and simultaneously applying a read pulse to the qubit after the second pi/2 quantum logic gate operation to obtain the excited state distribution P of the qubit 1 (τ) and varying the time interval τ to obtain P 1 (τ) a process. The pi/2 quantum logic gate operation referred to herein is referred to as pi/2 pulse. The result of a typical Ramsey experiment is P 1 (τ) is a mathematical model that satisfies the exponential oscillation decay over time interval τ as follows:
in formula 1, A and B are fitting coefficients, T 0 For decoherence time of qubits, f d Carrier frequency f of microwave pulse signal corresponding to pi/2 quantum logic gate operation 0 Is the oscillation frequency of the qubit, and f 0 True frequency f of the qubit q Carrier frequency of pi/2 quantum logic gate operation satisfies:
f 0 (f d )＝f q -f d (2)
from the above, in combination with equation 2, we can get: the result of the Ramsey experiment, namely the oscillation frequency of the curve is equal to the difference between the carrier frequency of the quantum logic gate operation and the real frequency of the quantum bit, so that the Ramsey experiment can be used for obtaining the decoherence time of the quantum bit and can also accurately obtain the real frequency of the quantum bit.
Specifically, in the embodiment of the application, the Ramsey experiment is performed under different working voltages by changing the working voltage of the to-be-detected qubit, so as to obtain the experimental result that the bit frequency changes along with the voltage.
Further, in an embodiment of the present application, the obtaining, based on the physical model and the experimental result, whether the AC modulation spectrum of the qubit to be detected meets the requirement includes:
judging whether the experimental result of the first experiment meets the requirement or not based on the physical model;
and obtaining whether the AC modulation spectrum of the quantum bit to be detected meets the requirements or not according to the judging result, wherein if the judging result is that the experimental result does not meet the requirements, the AC modulation spectrum of the quantum bit to be detected is obtained, and if the judging result is that the experimental result meets the requirements, the AC modulation spectrum of the quantum bit to be detected is obtained.
It will be appreciated by those skilled in the art that in different application scenarios, the accuracy requirements for the experimental results are different, and that some nodes with low accuracy requirements may be acceptable for the experimental results deviating from a certain range, but for some nodes with high accuracy requirements, the experimental results need to be very close to the physical model.
In order to obtain whether the experimental result meets the requirement, the applicant proposes to use a Goodness of Fit (Goodness of Fit) which refers to the fitting degree of the regression line to the observed value. The fitting degree of the model to the sample observation value is checked by mainly using the judgment coefficient and the regression standard deviation. When the interpretation variable is a multiple, the adjusted goodness of fit is used to account for the effect of variable element additions on goodness of fit. Assuming that a population can be classified into r classes, a sample is now obtained from the population, which is a collection of classification data from which we need to start to determine if the probability of occurrence of the population class matches the known probability. For example, if a dice is to be uniformly checked, the dice may be thrown several times, the number of occurrences of each face may be recorded, and from these data, whether the probability of occurrence of each face is 1/6, the goodness-of-fit check is used to check whether the overall distribution from which a batch of classified data is derived corresponds to a certain theoretical distribution. Specifically, in the embodiment of the present application, the determining, based on the physical model, whether the experimental result of the first experiment meets the requirement includes:
and judging whether the experimental result of the first experiment meets the requirements or not by using the fitting goodness of the experimental result of the physical model and the first experiment.
Further, the determining whether the experimental result of the first experiment meets the requirement by using the goodness of fit on the physical model and the experimental result of the first experiment includes:
constructing a first formula, wherein the first formula is as follows:
wherein R is 2 To the extent of offset, y fit For theoretical expectation of the physical model, y raw As a result of the experiment of the first experiment,is an average value of experimental results of the first experiment;
and comparing the offset degree obtained by the first formula with a preset threshold value, and judging whether an experimental result of the first experiment meets the requirement.
In this embodiment, the R 2 The closer to 1, the less the modulation deviates from the theoretical expected value of the physical model, by fitting R in the goodness-of-fit method 2 Namely, the deviation degree can intuitively find the fitting degree of the experimental result and the physical model, and further judge whether the AC modulation spectrum meets the requirement. From the above analysis, it can be known that, in different application scenarios, the accuracy requirements for the experimental results are different, and some nodes with low accuracy requirements may be acceptable for the experimental results deviating from a certain range, so that the preset threshold may be suitableWhen less than 1, for example, R can be set as 2 Not less than 0.8 or 0.7, etc. However, for some nodes with higher accuracy requirements, the experimental result needs to be very close to the physical model, and the preset threshold needs to be set relatively close to 1, for example, may be set as R 2 Not less than 0.9 or 0.95, etc. It should be noted that the above-mentioned preset threshold is only for the convenience of the skilled person to better understand the technical solution of the present application, and should not be construed as limiting the technical solution of the present application.
Optionally, the comparing the offset degree obtained by using the first formula with a preset threshold value, and determining whether the experimental result of the first experiment meets the requirement includes:
judging the R 2 Whether greater than 0.99;
if yes, judging that the experimental result of the first experiment meets the requirement;
if not, judging that the experimental result of the first experiment is not satisfactory.
In this embodiment, the above steps are used to determine whether the experimental result of the first experiment meets the requirement.
Taking part in fig. 2, fig. 2 is a schematic diagram showing the deviation degree of the physical model and the experimental result provided in an embodiment of the present application, wherein the abscissa represents the voltage, the ordinate represents the bit frequency, the curve a represents the theoretical expectation that the physical model obtains the bit frequency changing with the voltage, the curve B represents the experimental result that the bit frequency obtained based on the first experiment changes with the voltage, it can be seen from fig. 1 that the deviation degree of the curve a and the curve B is small, R 2 Is 0.999939; referring to fig. 3, fig. 3 is another schematic diagram showing the degree of deviation between the physical model and the experimental result according to an embodiment of the present application, where it can be seen that the degree of deviation between the curve a and the curve B is larger, R 2 Is 0.966718.
Further, the performing a first experiment on the to-be-detected qubit to obtain an experimental result of a bit frequency of the to-be-detected qubit along with a voltage change, including:
when a quantum bit works at a degenerate point and a plurality of working voltages near the degenerate point, respectively corresponding bit frequencies are obtained;
acquiring a frequency prediction formula based on the degenerated points and the working voltages nearby the degenerated points and the corresponding bit frequencies;
acquiring prediction frequencies corresponding to all other voltage values to be detected except a plurality of obtained working points in a first preset range based on the frequency prediction formula, and respectively executing Ramsey experiments to acquire corresponding bit frequencies when the quantum bit works at the voltage values to be detected, wherein the driving frequency of a driving signal in the Ramsey experiments under the voltage values to be detected is set based on the corresponding prediction frequencies;
and acquiring an experimental result of the AC modulation spectrum of the quantum bit based on the obtained bit frequency and the corresponding operating point voltage.
Further, the obtaining, based on the frequency prediction formula, a predicted frequency corresponding to each of the remaining to-be-measured voltage values except for the obtained plurality of working points in the first preset range, and executing a Ramsey experiment to obtain a corresponding bit frequency when the qubit works at each to-be-measured voltage value, where a driving frequency of a driving signal in the Ramsey experiment under each to-be-measured voltage value is set based on the corresponding predicted frequency, includes:
acquiring a predicted frequency corresponding to a voltage value to be measured based on the frequency prediction formula;
executing a Ramsey experiment when the quantum bit works at the voltage value to be detected and acquiring a bit frequency, wherein the value of a driving frequency of the Ramsey experiment is determined based on the value of the predicted frequency;
and adjusting the voltage value to be measured and returning to execute the frequency prediction formula based on the frequency prediction formula to obtain the predicted frequency corresponding to the voltage value to be measured until the voltage value to be measured in the first preset range is traversed.
In this embodiment, the experimental result of the time-dependent change of the bit frequency of the quantum bit to be detected is obtained through the above steps.
Based on the same inventive concept, the embodiment of the present application further provides a testing device for an AC modulation spectrum, including:
a physical model acquisition module configured to acquire a physical model of an AC modulation spectrum of a quantum bit to be measured, wherein the physical model is used for acquiring theoretical expectation of a bit frequency of the quantum bit to be measured along with a voltage change;
an experiment result acquisition module configured to perform a first experiment on the to-be-detected qubit, and acquire an experiment result of a bit frequency of the to-be-detected qubit changing with voltage;
and the judging module is configured to acquire whether the AC modulation spectrum of the quantum bit to be detected meets the requirement or not based on the physical model and the experimental result.
It will be appreciated that the physical model obtaining module, the experimental result obtaining module and the judging module may be combined in one device to be implemented, or any one of the modules may be split into a plurality of sub-modules, or at least part of functions of one or more of the physical model obtaining module, the experimental result obtaining module and the judging module may be combined with at least part of functions of other modules and implemented in one functional module. According to embodiments of the present invention, at least one of the physical model acquisition module, the experimental result acquisition module, and the determination module may be implemented at least in part as hardware circuitry, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or any other reasonable manner of integrating or packaging a circuit, or in hardware or firmware, or in a suitable combination of software, hardware, and firmware implementations. Alternatively, at least one of the physical model acquisition module, the experimental result acquisition module, and the judgment module may be at least partially implemented as a computer program module, which when executed by a computer, may perform the functions of the corresponding module.
Based on the same inventive concept, the embodiment of the application also provides a quantum control system, which uses the testing method of the AC modulation spectrum described in any one of the above feature descriptions to judge the AC modulation spectrum, or uses the testing device of the AC modulation spectrum described in the above feature descriptions.
Based on the same inventive concept, the embodiments of the present application also provide a quantum computer, including the quantum control system described in the above feature description.
Based on the same inventive concept, the embodiments of the present application further provide a readable storage medium having stored thereon a computer program, which when executed by a processor, enables a method for testing an AC modulation spectrum according to any of the above-mentioned feature descriptions.
The readable storage medium may be a tangible device that can hold and store instructions for use by an instruction execution device, such as, but not limited to, an electronic storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the preceding. More specific examples (a non-exhaustive list) of the readable storage medium would include the following: portable computer disks, hard disks, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static Random Access Memory (SRAM), portable compact disk read-only memory (CD-ROM), digital Versatile Disks (DVD), memory sticks, floppy disks, mechanical coding devices, punch cards or in-groove structures such as punch cards or grooves having instructions stored thereon, and any suitable combination of the foregoing. The computer program described herein may be downloaded from a readable storage medium to a respective computing/processing device or to an external computer or external storage device via a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmissions, wireless transmissions, routers, firewalls, switches, gateway computers and/or edge servers. The network interface card or network interface in each computing/processing device receives the computer program from the network and forwards the computer program for storage in a readable storage medium in the respective computing/processing device. Computer programs for carrying out operations of the present invention may be assembly instructions, instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, c++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer program may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, aspects of the present invention are implemented by personalizing electronic circuitry, such as programmable logic circuits, field Programmable Gate Arrays (FPGAs), or Programmable Logic Arrays (PLAs), with state information for a computer program, which can execute computer-readable program instructions.
Aspects of the present invention are described herein with reference to flowchart illustrations and/or block diagrams of methods, systems, and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer programs. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the programs, when executed by the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks. These computer programs may also be stored in a readable storage medium that can direct a computer, programmable data processing apparatus, and/or other devices to function in a particular manner, such that the readable storage medium storing the computer program includes an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.
The computer program may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the computer program which is executed on the computer, other programmable apparatus or other devices implements the functions/acts specified in the flowchart and/or block diagram block or blocks.
In the description of the present specification, a description of the terms "one embodiment," "some embodiments," "examples," or "particular examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics may be combined in any suitable manner in any one or more embodiments. Further, one skilled in the art can engage and combine the different embodiments or examples described in this specification.
The foregoing is merely a preferred embodiment of the present invention and is not intended to limit the present invention in any way. Any person skilled in the art will make any equivalent substitution or modification to the technical solution and technical content disclosed in the invention without departing from the scope of the technical solution of the invention, and the technical solution of the invention is not departing from the scope of the invention.
Claims (12)
1. A method for testing an AC modulation spectrum, comprising:
acquiring a physical model of an AC modulation spectrum of a quantum bit to be detected, wherein the physical model is used for acquiring theoretical expectation that the bit frequency of the quantum bit to be detected changes along with voltage;
executing a first experiment on the quantum bit to be detected, and obtaining an experiment result that the bit frequency of the quantum bit to be detected changes along with the voltage;
and acquiring whether the AC modulation spectrum of the quantum bit to be detected meets the requirement or not based on the physical model and the experimental result.
2. The method for testing an AC modulation spectrum according to claim 1, wherein the obtaining a physical model of the AC modulation spectrum of the qubit to be tested comprises:
the bit frequency as a function of voltage satisfies:
where Φ=pi M (x-offset), y represents the bit frequency, x represents the voltage, α represents the bit non-harmonic, f qmax Both M, offset are parameters of the physical model.
3. The method for testing the AC modulation spectrum according to claim 1, wherein said obtaining whether the AC modulation spectrum of the qubit to be tested meets the requirements based on the physical model and the experimental result comprises:
judging whether the experimental result of the first experiment meets the requirement or not based on the physical model;
and obtaining whether the AC modulation spectrum of the quantum bit to be detected meets the requirements or not according to the judging result, wherein if the judging result is that the experimental result does not meet the requirements, the AC modulation spectrum of the quantum bit to be detected is obtained, and if the judging result is that the experimental result meets the requirements, the AC modulation spectrum of the quantum bit to be detected is obtained.
4. The method for testing an AC modulation spectrum according to claim 1, wherein said determining whether the experimental result of said first experiment meets the requirement based on said physical model comprises:
and judging whether the experimental result of the first experiment meets the requirements or not by using the fitting goodness of the experimental result of the physical model and the first experiment.
5. The method for testing an AC modulation spectrum according to claim 4, wherein said determining whether the experimental result of said first experiment meets the requirements using goodness of fit for the physical model and the experimental result of said first experiment comprises:
obtaining the offset degree by using the goodness of fit for the theoretical expected value and the modulation condition, including:
constructing a first formula, wherein the first formula is as follows:
wherein R is 2 For the degree of offset, y fit For theoretical expectation of the physical model, y raw As a result of the experiment of the first experiment,is an average value of experimental results of the first experiment;
and comparing the offset degree obtained by the first formula with a preset threshold value, and judging whether an experimental result of the first experiment meets the requirement.
6. The method for testing an AC modulation spectrum according to claim 5, wherein comparing the degree of offset obtained by using the first formula with a preset threshold value, and determining whether the experimental result of the first experiment meets the requirement comprises:
judging the R 2 Whether greater than a set threshold;
if yes, judging that the experimental result of the first experiment meets the requirement;
if not, judging that the experimental result of the first experiment is not satisfactory.
7. The method for testing an AC modulation spectrum according to claim 1, wherein performing a first experiment on the qubit to be tested to obtain an experimental result of a bit frequency of the qubit to be tested according to a voltage change, comprises:
when a quantum bit works at a degenerate point and a plurality of working voltages near the degenerate point, respectively corresponding bit frequencies are obtained;
acquiring a frequency prediction formula based on the degenerated points and the working voltages nearby the degenerated points and the corresponding bit frequencies;
acquiring prediction frequencies corresponding to all other voltage values to be detected except a plurality of obtained working points in a first preset range based on the frequency prediction formula, and respectively executing Ramsey experiments to acquire corresponding bit frequencies when the quantum bit works at the voltage values to be detected, wherein the driving frequency of a driving signal in the Ramsey experiments under the voltage values to be detected is set based on the corresponding prediction frequencies;
and acquiring an experimental result of the AC modulation spectrum of the quantum bit based on the obtained bit frequency and the corresponding operating point voltage.
8. The method for testing an AC modulation spectrum according to claim 7, wherein said obtaining, based on said frequency prediction formula, a predicted frequency corresponding to each of remaining voltage values to be tested except for a number of operation points that have been obtained in a first preset range, performing Ramsey experiments to obtain a corresponding bit frequency when the qubit is operated at each of the voltage values to be tested, respectively, wherein a driving frequency of a driving signal in the Ramsey experiments at each of the voltage values to be tested is set based on the corresponding predicted frequency thereof, comprises:
acquiring a predicted frequency corresponding to a voltage value to be measured based on the frequency prediction formula;
executing a Ramsey experiment when the quantum bit works at the voltage value to be detected and acquiring a bit frequency, wherein the value of a driving frequency of the Ramsey experiment is determined based on the value of the predicted frequency;
and adjusting the voltage value to be measured and returning to execute the frequency prediction formula based on the frequency prediction formula to obtain the predicted frequency corresponding to the voltage value to be measured until the voltage value to be measured in the first preset range is traversed.
9. A test device for AC modulation spectra, comprising:
a physical model acquisition module configured to acquire a physical model of an AC modulation spectrum of a quantum bit to be measured, wherein the physical model is used for acquiring theoretical expectation of a bit frequency of the quantum bit to be measured along with a voltage change;
an experiment result acquisition module configured to perform a first experiment on the to-be-detected qubit, and acquire an experiment result of a bit frequency of the to-be-detected qubit changing with voltage;
and the judging module is configured to acquire whether the AC modulation spectrum of the quantum bit to be detected meets the requirement or not based on the physical model and the experimental result.
10. A quantum control system characterized in that the AC modulation spectrum is judged by the test method of the AC modulation spectrum according to any one of claims 1 to 8 or the test device of the AC modulation spectrum according to claim 9 is included.
11. A quantum computer comprising the quantum control system of claim 11.
12. A readable storage medium having stored thereon a computer program, which when executed by a processor is capable of implementing the method of testing an AC modulation spectrum according to any of claims 1 to 8.
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