CN116931081A - Verification method of diffraction wave imaging method - Google Patents
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- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V1/00—Seismology; Seismic or acoustic prospecting or detecting
- G01V1/28—Processing seismic data, e.g. analysis, for interpretation, for correction
- G01V1/30—Analysis
- G01V1/301—Analysis for determining seismic cross-sections or geostructures
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- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V1/00—Seismology; Seismic or acoustic prospecting or detecting
- G01V1/28—Processing seismic data, e.g. analysis, for interpretation, for correction
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Abstract
The method includes the steps of establishing a combined model and parameter setting thereof, establishing an observation system and parameter setting thereof, simulating seismic wave data, obtaining full wave field data and ray tracing data, obtaining dip-domain common imaging point offset gathers, obtaining positive dip offset imaging bodies and negative dip offset imaging bodies, outputting a corresponding imaging result schematic diagram, obtaining positive dip product offset imaging bodies and negative dip product offset imaging bodies, and outputting a corresponding product schematic diagram, namely a diffraction wave imaging section. The design can provide a verification method for a diffraction wave imaging method, which is effective in verification and can process original full-wave field data without diffraction wave and reflected wave field separation.
Description
Technical Field
The application relates to the technical field of seismic migration imaging, in particular to a verification method of a diffraction wave imaging method.
Background
Global carbonates account for only about 20% of sedimentary rocks, but more than 50% of the oil and gas exploration reserves. The Chinese carbonate rock has wide stratum distribution, rich oil and gas resources and huge exploration potential. In a carbonate rock detection area, a reservoir space is mainly represented by small-scale geologic bodies such as faults, holes, cracks and the like, and the reservoir has the characteristics of irregularity, multiple scales, strong heterogeneity and the like, and earthquake response is often represented by diffraction wave characteristics. The diffraction wave imaging method is utilized to detect underground small-scale structures and salt dome edges to become the hot spot research direction of seismic migration imaging, and the method is widely focused and researched.
The mainstream seismic migration imaging technique uses reflected wave signals in the seismic wave field for imaging, while the diffracted wave imaging technique uses diffracted signals other than reflection for imaging. Diffracted wave signals are orders of magnitude weaker than reflected wave signals and tend to flood and become indistinguishable in full wave field signals. Therefore, the key of diffraction wave imaging is how to suppress the reflected wave signal, highlighting the diffraction wave response. Based on this idea, more diffraction wave imaging studies can be referred to. These technical methods can be largely classified into two types of methods, namely, a data domain and an offset domain. The data domain diffraction wave imaging method is to convert full-wave field data into different domains and image the full-wave field data by using separated diffraction wave information. Like some dynamic correction filtering methods, dynamic correction dip filtering methods (Bansal and Imhof, 2005), dynamic correction singular value filtering methods (Xu Jun, etc., 2019), dynamic correction radon transform methods, etc. After the original wave field data is dynamically corrected, the method separates out diffraction wave signals by means of linear FK filtering, singular value decomposition, radon transformation or the like based on the in-phase axis difference of the reflected wave and the diffraction wave, and images the diffraction wave signals. The filtering method has the advantages of visual thought, simple realization, poor separation effect, large calculated amount, poor parameter control and the like, and is easy to introduce additional noise. In addition, there is a method of data domain diffraction wave imaging implemented in the plane wave domain (Taner et al, 2006, fomel et al, 2007, zhu Shengwang et al, 2013). The method comprises the steps of converting full-wave field data into a plane wave domain, carrying out p decomposition, applying plane wave deconstruction filtering to different p sections to remove reflected wave signals, screening diffracted wave energy, and then imaging. The plane wave decomposition diffraction wave imaging method is deep in research and obvious in effect. However, the method has complex process and complicated steps. In general, the data domain diffraction-like wave separation imaging method is a conventional and mature diffraction wave method, but the separation effect is affected by a plurality of factors.
The diffraction wave imaging method of the offset domain is to suppress/attenuate reflected wave energy in the offset process so as to realize diffraction imaging. Such as dip diffraction wave imaging methods that separate from the difference in phase axis of diffraction and reflection in dip domain common-image point gather (Landa et al, 2008, zhang and Zhang,2014, klokov and Fomel,2012, liu et al, 2014, li Zhengwei et al, 2018). In the dip angle domain common imaging point, diffraction wave information is leveled, and reflected waves are hyperbolic, and can be separated locally by searching stable image points or by a radon transformation method. There is also a class of anti-phase-stable offset domain diffraction wave imaging methods that compress the reflected energy during the offset process by changing the offset kernel or adding an anti-phase-stable filter (Kozlov et al, 2004, moser and Howard,2008, li Xiaofeng et al, 2015). How the method determines the threshold parameters is critical in the implementation process.
From the above summary, it can be seen that the current diffracted wave imaging technique still relies on wave field separation, and it is necessary to find the difference between the reflected wave and the diffracted wave for wave field separation, both before and during migration. In practice, the reflected wave and the diffracted wave are generalized diffracted waves, which are essentially responses of point scattering or point aggregate scattering, and complete separation is impossible. Therefore, most of the problems of unsatisfactory separation effect, poor control of filtering or threshold parameters and the like exist, and extra noise is easy to introduce.
The disclosure of this background section is only intended to increase the understanding of the general background of the application and should not be taken as an admission or any form of suggestion that this information forms the prior art that is already known to a person of ordinary skill in the art.
Disclosure of Invention
The application aims to overcome the defects in the prior art and provide a verification method of a diffraction wave imaging method, which is effective in verification and can process original full-wave field data without diffraction wave and reflected wave field separation.
In order to achieve the above object, the technical solution of the present application is: a method for verifying diffraction wave imaging method; the diffraction wave imaging method comprises the following steps: acquiring inclination domain common imaging point offset gathers according to full wave field data, speed field parameters, observation system parameters and ray tracing data, respectively acquiring a positive inclination offset imaging body and a negative inclination offset imaging body based on the inclination domain common imaging point offset gathers, and multiplying the positive inclination offset imaging body and the negative inclination offset imaging body to acquire a positive inclination product offset imaging body and a negative inclination product offset imaging body, namely a diffraction wave imaging section;
the verification method comprises the following steps:
the first step: firstly, establishing a combined model, wherein the horizontal length of the combined model is 8km, the depth of the combined model is 3km, a continuous reflection interface and a plurality of isolated diffraction points are arranged in the combined model, the continuous reflection interface comprises a 0-degree inclination angle and positive and negative 45-degree inclination angle inclined structures, and an observation system is arranged;
the parameters of the velocity field include: the background speed of the combined model is 2km/s, and the speeds of the diffraction points and the continuous reflection interface are all 2.2km/s;
the parameters of the observation system include: uniformly arranging 201 cannons at intervals within the range of 0-8km at the top of the combined model to serve as vibration source points, wherein the cannon distance is 40m, and uniformly arranging 801 channels of detectors within the same range of 0-8km to serve as receiving points, wherein the channel distance is 10m;
and a second step of: firstly, performing seismic wave data simulation to generate full-wave field data U (s, r, t), and meanwhile, performing ray tracing calculation on each seismic source point and each receiving point to calculate weight W (x, alpha) and t=tau (s, x, r) when the seismic wave travels, and substituting the weight W (x, alpha) and the full-wave field data into the following formula I to obtain an inclination domain common imaging point offset gather:
wherein I (x, alpha) is the inclination angle alphaThe corresponding offset of the imaging volume is performed,respectively representing the observation line or observation plane where the vibration source point and the receiving point are located, s, r and x are respectively coordinate vectors of the vibration source point, the receiving point and the underground imaging point, W is a weight function, U is input wave field data, tau is alpha when the earthquake wave travels 0 Alpha is the offset inclination angle of the ray pair (s-x-r) at the imaging point x in the offset process, and delta is a dirac function;
and a third step of: based on the inclination angle domain common imaging point offset gather, a positive inclination angle offset imaging body is obtained by calculation according to the following formula II,
generating a corresponding positive imaging result schematic diagram; then the negative inclination angle offset imaging body is obtained by calculation according to the following formula III,
and generating a corresponding negative imaging result schematic diagram; wherein I (x, alpha) is the tilt domain common imaging point offset gather, an
Fourth step: the positive inclination angle offset imaging body and the negative inclination angle offset imaging body are subjected to point-to-point multiplication according to the following formula IV to obtain a positive inclination angle product offset imaging body,
and generating a corresponding product result diagram, namely a diffraction wave imaging section.
The continuous reflection interface comprises a first mutation point, a second mutation point, a third mutation point, a fourth mutation point and a fifth mutation point which are sequentially connected, wherein adjacent mutation points are connected with each other to form a 0-degree inclination angle and positive and negative 45-degree inclination angle inclination structure, and the structure is displayed as a left horizontal line, an upper inclination line, a lower inclination line and a right horizontal line.
The isolated diffraction points comprise three left diffraction points and three right diffraction points, wherein the three left diffraction points are all positioned on the left side of the upper inclined line, and the three right diffraction points are all positioned on the right side of the lower inclined line.
The dirac function delta is obtained according to the following formula:
where H is a step function and Δα is an interval of an angle interval set to a predetermined value.
After the positive imaging result schematic diagram is obtained, judging whether the positive inclination angle offset imaging body is correct or not according to the diagram, and judging that:
because the amplitude of the continuous reflection interface is stronger than the diffraction amplitude, imaging of diffraction points is suppressed, wherein the diffraction points near the left side of the combined model are suppressed to a greater extent than the diffraction points near the right side of the combined model;
after the negative imaging result schematic diagram is obtained, judging whether the negative inclination angle offset imaging body is correct or not according to the diagram, and judging that:
since the continuous reflection interface amplitude is stronger than the diffraction amplitude, imaging of diffraction points is suppressed, wherein diffraction points near the right side of the combined model are suppressed to a greater extent than diffraction points near the left side of the combined model.
After the positive imaging result schematic diagram and the negative imaging result schematic diagram are obtained, the positive inclination angle offset imaging body and the negative inclination angle offset imaging body are firstly subjected to the summation offset imaging body with positive inclination angle and negative inclination angle, a corresponding summation result schematic diagram is generated, and then the summation result schematic diagram is compared with a continuous reflection interface and an isolated diffraction point to judge the imaging quality, and the imaging quality is judged:
diffraction point imaging amplitudes are weaker than continuous reflection interfaces.
After the product result schematic diagram is obtained, comparing the product result schematic diagram with a continuous reflection interface and isolated diffraction points to judge imaging quality, and judging:
the imaging quality of the isolated diffraction point and the abrupt point in the continuous reflection interface is greater than that of a line interface comprising a left horizontal line, an upper inclined line, a lower inclined line, and a right horizontal line.
The source point selects a Rake wavelet simulation.
Compared with the prior art, the application has the beneficial effects that:
1. the application relates to a verification method of diffraction wave imaging method, which sequentially comprises the steps of establishing a combination model and parameter setting thereof, establishing an observation system and parameter setting thereof, simulating seismic wave data, obtaining full wave field data and ray tracing data, obtaining dip angle domain common imaging point offset gathers, obtaining positive and negative dip angle offset imaging bodies, outputting a corresponding imaging result schematic diagram, obtaining a positive and negative dip angle product offset imaging body, outputting a corresponding product result schematic diagram, namely, the diffraction wave imaging profile, not only can a novel diffraction wave imaging method be provided, which does not need to perform diffraction wave field separation at all, can avoid the influence of separation on imaging, but also can provide a specially designed verification method (comprising a specially designed combination model and a specially corresponding design of a verification step) so as to verify the result of the aforementioned diffraction wave imaging method, thereby proving the effectiveness of the diffraction wave imaging method. Therefore, the present application can provide a method for verifying a diffraction wave imaging method, which is effective in verification and can process the original full-wave-field data without separating the diffracted wave from the reflected wave field.
2. In the verification method of the diffraction wave imaging method, after the positive and negative inclination angle offset imaging bodies are obtained, corresponding imaging result diagrams are output, the correctness of the positive and negative inclination angle offset imaging bodies can be effectively verified in time by the design, whether the expected design effect is achieved or not can be judged, whether the follow-up verification method is continued or how to improve can be provided, and the diffraction wave imaging method can be compared with an initial built combined model or even a final obtained product result diagram to judge the imaging quality, so that the validity of the diffraction wave imaging method is verified, and the verification purpose is truly achieved. Therefore, the diffraction wave imaging method is high in quality and high in verification effectiveness.
Drawings
FIG. 1 is a schematic diagram of a combined model according to the present application.
FIG. 2 is a schematic diagram of a positive imaging result corresponding to a positive tilt shift imaging body according to the present application.
FIG. 3 is a diagram of a negative imaging result corresponding to a negative tilt offset imager according to the present application.
FIG. 4 is a graph showing the result of the product shift between positive and negative tilt angles.
FIG. 5 is a diagram showing the result of the addition of positive and negative tilt angles to the corresponding offset imaging body.
Detailed Description
The application is described in further detail below with reference to the accompanying drawings and detailed description.
Referring to fig. 1-5, a method of verifying a diffraction wave imaging method; the diffraction wave imaging method comprises the following steps: acquiring inclination domain common imaging point offset gathers according to full wave field data, speed field parameters, observation system parameters and ray tracing data, respectively acquiring a positive inclination offset imaging body and a negative inclination offset imaging body based on the inclination domain common imaging point offset gathers, and multiplying the positive inclination offset imaging body and the negative inclination offset imaging body to acquire a positive inclination product offset imaging body and a negative inclination product offset imaging body, namely a diffraction wave imaging section;
the verification method comprises the following steps:
the first step: firstly, establishing a combined model, wherein the horizontal length of the combined model is 8km, the depth of the combined model is 3km, a continuous reflection interface and a plurality of isolated diffraction points are arranged in the combined model, the continuous reflection interface comprises a 0-degree inclination angle and positive and negative 45-degree inclination angle inclined structures, and an observation system is arranged;
the parameters of the velocity field include: the background speed of the combined model is 2km/s, and the speeds of the diffraction points and the continuous reflection interface are all 2.2km/s;
the parameters of the observation system include: uniformly arranging 201 cannons at intervals within the range of 0-8km at the top of the combined model to serve as vibration source points, wherein the cannon distance is 40m, and uniformly arranging 801 channels of detectors within the same range of 0-8km to serve as receiving points, wherein the channel distance is 10m;
and a second step of: firstly, performing seismic wave data simulation to generate full-wave field data U (s, r, t), and meanwhile, performing ray tracing calculation on each seismic source point and each receiving point to calculate weight W (x, alpha) and t=tau (s, x, r) when the seismic wave travels, and substituting the weight W (x, alpha) and the full-wave field data into the following formula I to obtain an inclination domain common imaging point offset gather:
wherein I (x, alpha) is an offset imaging body corresponding to the inclination angle alpha,respectively representing the observation line or observation plane where the vibration source point and the receiving point are located, s, r and x are respectively coordinate vectors of the vibration source point, the receiving point and the underground imaging point, W is a weight function, U is input wave field data, tau is alpha when the earthquake wave travels 0 Alpha is the offset inclination angle of the ray pair (s-x-r) at the imaging point x in the offset process, and delta is a dirac function;
and a third step of: based on the inclination angle domain common imaging point offset gather, a positive inclination angle offset imaging body is obtained by calculation according to the following formula II,
generating a corresponding positive imaging result schematic diagram; then the negative inclination angle offset imaging body is obtained by calculation according to the following formula III,
and generating a corresponding negative imaging result schematic diagram; wherein I (x, alpha) is the tilt domain common imaging point offset gather, an
Fourth step: the positive inclination angle offset imaging body and the negative inclination angle offset imaging body are subjected to point-to-point multiplication according to the following formula IV to obtain a positive inclination angle product offset imaging body,
and generating a corresponding product result diagram, namely a diffraction wave imaging section.
The continuous reflection interface comprises a first mutation point, a second mutation point, a third mutation point, a fourth mutation point and a fifth mutation point which are sequentially connected, wherein adjacent mutation points are connected with each other to form a 0-degree inclination angle and positive and negative 45-degree inclination angle inclination structure, and the structure is displayed as a left horizontal line, an upper inclination line, a lower inclination line and a right horizontal line.
The isolated diffraction points comprise three left diffraction points and three right diffraction points, wherein the three left diffraction points are all positioned on the left side of the upper inclined line, and the three right diffraction points are all positioned on the right side of the lower inclined line.
The dirac function delta is obtained according to the following formula:
where H is a step function and Δα is an interval of an angle interval set to a predetermined value.
After the positive imaging result schematic diagram is obtained, judging whether the positive inclination angle offset imaging body is correct or not according to the diagram, and judging that:
because the amplitude of the continuous reflection interface is stronger than the diffraction amplitude, imaging of diffraction points is suppressed, wherein the diffraction points near the left side of the combined model are suppressed to a greater extent than the diffraction points near the right side of the combined model;
after the negative imaging result schematic diagram is obtained, judging whether the negative inclination angle offset imaging body is correct or not according to the diagram, and judging that:
since the continuous reflection interface amplitude is stronger than the diffraction amplitude, imaging of diffraction points is suppressed, wherein diffraction points near the right side of the combined model are suppressed to a greater extent than diffraction points near the left side of the combined model.
After the positive imaging result schematic diagram and the negative imaging result schematic diagram are obtained, the positive inclination angle offset imaging body and the negative inclination angle offset imaging body are firstly subjected to the summation offset imaging body with positive inclination angle and negative inclination angle, a corresponding summation result schematic diagram is generated, and then the summation result schematic diagram is compared with a continuous reflection interface and an isolated diffraction point to judge the imaging quality, and the imaging quality is judged:
diffraction point imaging amplitudes are weaker than continuous reflection interfaces.
After the product result schematic diagram is obtained, comparing the product result schematic diagram with a continuous reflection interface and isolated diffraction points to judge imaging quality, and judging:
the imaging quality of the isolated diffraction point and the abrupt point in the continuous reflection interface is greater than that of a line interface comprising a left horizontal line, an upper inclined line, a lower inclined line, and a right horizontal line.
The source point selects a Rake wavelet simulation.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a combined model in the present application, namely a velocity model with a horizontal length of 8km, a depth of 3km, a model grid number of 1601×601, and a grid spacing of 5×5m. The combination model is internally provided with 6 isolated diffraction points and a continuous reflection interface comprising a tilt structure with 0 degree tilt angle and positive and negative 45 degrees tilt angles. The background speed of the speed model is 2km/s, and the speed of the diffraction point and the interface is 2.2km/s. The synthetic data of the present verification method was numerically modeled using the scattered wave field integral equation. The earthquake source is excited on the ground surface, 201 cannons are arranged at uniform intervals within the range of 0-8km, and the cannon spacing is 40m. The 801 detectors are uniformly arranged in the same range, and the track spacing is 10m. The seismic source selects the Rake wavelet simulation with a maximum frequency of 30Hz. The recording length is 5s and the time sampling interval is 5ms.
The full-wave field data is directly used as input, and the verification method or the diffraction imaging method in the application can respectively obtain a positive inclination angle offset imaging body and an imaging schematic diagram thereof (shown in fig. 2), a negative inclination angle offset imaging body and an imaging schematic diagram thereof (shown in fig. 3), a positive inclination angle product offset imaging body and an imaging schematic diagram thereof (shown in fig. 4), and a positive inclination angle sum offset imaging body and an imaging schematic diagram thereof (shown in fig. 5).
As shown in fig. 2, it can be seen that a portion of the diffraction point and 45 ° reflection interface are imaged, and the imaging of the diffraction point is suppressed, especially by the diffraction point on the left side of the model, because the reflection interface has a much stronger amplitude than the diffraction amplitude.
As shown in fig. 3, it can be seen that part of the diffraction points and the-45 ° reflection interface are imaged, and similarly, the imaging of the diffraction points is suppressed, especially by the diffraction points on the right side of the model.
As shown in fig. 5, it can be seen that both the diffraction point and the reflection interface are effectively imaged, but the diffraction point imaging amplitude is very weak.
As shown in fig. 4, it can be clearly seen that both isolated diffraction points and diffraction peaks (i.e., abrupt points) at the interface connection are well imaged, while horizontal and sloped continuous reflection interfaces are not.
The above description is merely of preferred embodiments of the present application, and the scope of the present application is not limited to the above embodiments, but all equivalent modifications or variations according to the present disclosure will be within the scope of the claims.
Claims (8)
1. A method for verifying a diffraction wave imaging method is characterized in that:
the diffraction wave imaging method comprises the following steps: acquiring inclination domain common imaging point offset gathers according to full wave field data, speed field parameters, observation system parameters and ray tracing data, respectively acquiring a positive inclination offset imaging body and a negative inclination offset imaging body based on the inclination domain common imaging point offset gathers, and multiplying the positive inclination offset imaging body and the negative inclination offset imaging body to acquire a positive inclination product offset imaging body and a negative inclination product offset imaging body, namely a diffraction wave imaging section;
the verification method comprises the following steps:
the first step: firstly, establishing a combined model, wherein the horizontal length of the combined model is 8km, the depth of the combined model is 3km, a continuous reflection interface and a plurality of isolated diffraction points are arranged in the combined model, the continuous reflection interface comprises a 0-degree inclination angle and positive and negative 45-degree inclination angle inclined structures, and an observation system is arranged;
the parameters of the velocity field include: the background speed of the combined model is 2km/s, and the speeds of the diffraction points and the continuous reflection interface are all 2.2km/s;
the parameters of the observation system include: uniformly arranging 201 cannons at intervals within the range of 0-8km at the top of the combined model to serve as vibration source points, wherein the cannon distance is 40m, and uniformly arranging 801 channels of detectors within the same range of 0-8km to serve as receiving points, wherein the channel distance is 10m;
and a second step of: firstly, performing seismic wave data simulation to generate full-wave field data U (s, r, t), and meanwhile, performing ray tracing calculation on each seismic source point and each receiving point to calculate weight W (x, alpha) and t=tau (s, x, r) when the seismic wave travels, and substituting the weight W (x, alpha) and the full-wave field data into the following formula I to obtain an inclination domain common imaging point offset gather:
wherein I (x, alpha) is an offset imaging body corresponding to the inclination angle alpha,respectively representing the observation line or observation plane where the vibration source point and the receiving point are located, s, r and x are respectively coordinate vectors of the vibration source point, the receiving point and the underground imaging point, W is a weight function, U is input wave field data, tau is alpha when the earthquake wave travels 0 Alpha is the offset inclination angle of the ray pair (s-x-r) at the imaging point x in the offset process, and delta is a dirac function;
and a third step of: based on the inclination angle domain common imaging point offset gather, a positive inclination angle offset imaging body is obtained by calculation according to the following formula II,
generating a corresponding positive imaging result schematic diagram; then the negative inclination angle offset imaging body is obtained by calculation according to the following formula III,
and generating a corresponding negative imaging result schematic diagram; wherein I (x, alpha) is the tilt domain common imaging point offset gather, an
Fourth step: the positive inclination angle offset imaging body and the negative inclination angle offset imaging body are subjected to point-to-point multiplication according to the following formula IV to obtain a positive inclination angle product offset imaging body,
and generating a corresponding product result diagram, namely a diffraction wave imaging section.
2. The method for verifying a diffracted wave imaging method as defined in claim 1, wherein: the continuous reflection interface comprises a first mutation point, a second mutation point, a third mutation point, a fourth mutation point and a fifth mutation point which are sequentially connected, wherein adjacent mutation points are connected with each other to form a 0-degree inclination angle and positive and negative 45-degree inclination angle inclination structure, and the structure is displayed as a left horizontal line, an upper inclination line, a lower inclination line and a right horizontal line.
3. The method for verifying a diffracted wave imaging method as defined in claim 1, wherein: the isolated diffraction points comprise three left diffraction points and three right diffraction points, wherein the three left diffraction points are all positioned on the left side of the upper inclined line, and the three right diffraction points are all positioned on the right side of the lower inclined line.
4. A method of validating a diffracted wave imaging method as claimed in claim 1, 2 or 3, wherein: the dirac function delta is obtained according to the following formula:
where H is a step function and Δα is an angular interval given to a predetermined setting.
5. A method of validating a diffracted wave imaging method as claimed in claim 1, 2 or 3, wherein:
after the positive imaging result schematic diagram is obtained, judging whether the positive inclination angle offset imaging body is correct or not according to the diagram, and judging that:
because the amplitude of the continuous reflection interface is stronger than the diffraction amplitude, imaging of diffraction points is suppressed, wherein the diffraction points near the left side of the combined model are suppressed to a greater extent than the diffraction points near the right side of the combined model;
after the negative imaging result schematic diagram is obtained, judging whether the negative inclination angle offset imaging body is correct or not according to the diagram, and judging that:
since the continuous reflection interface amplitude is stronger than the diffraction amplitude, imaging of diffraction points is suppressed, wherein diffraction points near the right side of the combined model are suppressed to a greater extent than diffraction points near the left side of the combined model.
6. A method of validating a diffracted wave imaging method as claimed in claim 1, 2 or 3, wherein: after the positive imaging result schematic diagram and the negative imaging result schematic diagram are obtained, the positive inclination angle offset imaging body and the negative inclination angle offset imaging body are firstly subjected to the summation offset imaging body with positive inclination angle and negative inclination angle, a corresponding summation result schematic diagram is generated, and then the summation result schematic diagram is compared with a continuous reflection interface and an isolated diffraction point to judge the imaging quality, and the imaging quality is judged:
diffraction point imaging amplitudes are weaker than continuous reflection interfaces.
7. The method for verifying a diffracted wave imaging method as defined in claim 2, wherein: after the product result schematic diagram is obtained, comparing the product result schematic diagram with a continuous reflection interface and isolated diffraction points to judge imaging quality, and judging:
the imaging quality of the isolated diffraction point and the abrupt point in the continuous reflection interface is greater than that of a line interface comprising a left horizontal line, an upper inclined line, a lower inclined line, and a right horizontal line.
8. A method of validating a diffracted wave imaging method as claimed in claim 1, 2 or 3, wherein: the source point selects a Rake wavelet simulation.
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