CN116884470B - Storage product testing method and system, electronic equipment and storage medium - Google Patents
Storage product testing method and system, electronic equipment and storage medium Download PDFInfo
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Abstract
The invention discloses a storage product testing method, a storage product testing system, electronic equipment and a storage medium, and relates to the technical field of storage products. The storage product testing method comprises the following steps: the test host sends a test command to the main control platform; the main control platform forwards the test command to the corresponding product to be tested; according to the test command, the product to be tested executes the test operation and stores the test data into the first buffer area; the main control platform reads the test data in the first buffer area and stores the test data in the second buffer area; and the test host reads the test data in the second buffer area to obtain a test result of the product to be tested. According to the method for testing the storage products, disclosed by the embodiment of the invention, the plurality of products to be tested can be tested simultaneously through one test host, so that the large-scale automatic test of the storage products is realized, and the test efficiency is improved; and after the test host obtains the test result, the test result can be displayed through the display interface, so that personnel can visually check the result.
Description
Technical Field
The present invention relates to the field of storage products, and in particular, to a storage product testing method and system, an electronic device, and a storage medium.
Background
Memory products using nand flash (flash memory) such as eMMC (Embedded Multi Media Card ), UFS (Universal Flash Storage, universal flash memory) are increasingly used, and are widely applied to various platforms such as tablet computers, television boxes, mobile phones, car navigation, and the like.
In the production and development processes of memory products such as eMMC and UFS, various functional tests are required to be performed to ensure that the memory products can work normally and prevent defective products from flowing into the market. At present, when testing products such as eMMC/UFS, a host (master control platform) tests a device (product to be tested), so as to obtain a test result; however, by adopting the test mode, the test efficiency is low, the test result is not visual, and after the host obtains the test data, the test data is transmitted to the external equipment for data processing, so that the staff can see the test result.
Disclosure of Invention
The present invention aims to solve at least one of the technical problems existing in the prior art. Therefore, the invention provides a method and a system for testing a storage product, electronic equipment and a storage medium, which can realize large-scale automatic test of the storage product through one test host.
In one aspect, according to an embodiment of the present invention, based on a storage product testing system, the storage product testing system includes a testing host, a plurality of main control platforms, and a plurality of products to be tested, the testing host is electrically connected to the plurality of main control platforms, each of the main control platforms is electrically connected to a corresponding product to be tested, and the storage product testing method includes the following steps:
the test host sends a test command to the main control platform;
the main control platform forwards the test command to the corresponding product to be tested;
according to the test command, the product to be tested executes test operation and stores test data into a first buffer area;
the main control platform reads the test data in the first buffer area and stores the test data in a second buffer area;
and the test host reads the test data in the second buffer area to obtain a test result of the product to be tested.
According to some embodiments of the invention, the test host communicates with the main control platform through usb protocol; and the main control platform is communicated with the product to be tested through an emmc/ufs protocol.
According to some embodiments of the invention, the test data is transmitted in the form of data packets, the data packets including a data header and a data packet body.
According to some embodiments of the invention, the data packet header includes at least one of an identification character, a valid character length, all valid data lengths transmitted by a current command, a busy flag, a current data volume full flag, a command execution error flag, and a product status flag to be tested; wherein the identification character is used for representing the category of the data packet; the effective character length is used for representing the length of effective data in the first buffer area or the second buffer area; the length of all effective data transmitted by the current command is used for representing whether a data packet is lost in the transmission process; the busy/idle mark is used for representing whether the current command data transmission is finished or not; the current data volume full mark is used for representing whether the first buffer area or the second buffer area is full of data; the command execution error mark is used for representing the execution condition of the current command; the to-be-detected product state mark is used for representing the current state of the to-be-detected product.
According to some embodiments of the invention, the main control platform reads the test data in the first buffer area and stores the test data in a second buffer area, including:
the main control platform reads the data packet header of the test data in the first cache region;
identifying the current data body full flag of the data packet header;
and when the current data body full mark is set to be 1, the main control platform reads the data body of the test data and sets the current data body full mark to be 0.
According to some embodiments of the invention, the test host reads the test data in the second buffer area of each main control platform in a polling manner, so as to obtain a test result of the product to be tested.
On the other hand, the storage product testing system according to the embodiment of the invention comprises a testing host, a plurality of main control platforms and a plurality of products to be tested, wherein the testing host is respectively and electrically connected with the plurality of main control platforms, each main control platform is respectively and electrically connected with the corresponding product to be tested, and the storage product testing system is used for realizing the storage product testing method according to the embodiment of the aspect.
According to some embodiments of the invention, the test host communicates with the main control platform through usb protocol; and the main control platform is communicated with the product to be tested through an emmc/ufs protocol.
On the other hand, the electronic device according to the embodiment of the invention includes:
a memory for storing program instructions;
and the processor is used for calling the program instructions stored in the memory and executing the storage product testing method according to the obtained program instructions.
On the other hand, according to the storage medium of the embodiment of the present invention, the storage medium stores computer-executable instructions for causing a computer to execute the storage product testing method described in the above embodiment.
The storage product testing method, the system, the electronic equipment and the storage medium have at least the following beneficial effects: through the arrangement, the test command can be issued through the test host, so that each main control platform can test the corresponding product to be tested simultaneously, and finally the test host can obtain a test result, and the test host can directly display the test result through a display interface. Therefore, according to the storage product testing method and the storage product testing system, a plurality of products to be tested can be tested at the same time, so that the testing efficiency is improved, and the testing result can be visually displayed through the testing host.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The foregoing and/or additional aspects and advantages of the invention will become apparent and may be better understood from the following description of embodiments taken in conjunction with the accompanying drawings in which:
FIG. 1 is a schematic diagram of a memory product testing system according to an embodiment of the present invention;
FIG. 2 is a flowchart illustrating steps of a method for testing a memory product according to an embodiment of the present invention;
reference numerals:
test host 100, master control platform 200, product 300 under test.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application. The step numbers in the following embodiments are set for convenience of illustration only, and the order between the steps is not limited in any way, and the execution order of the steps in the embodiments may be adaptively adjusted according to the understanding of those skilled in the art.
In the description of the present invention, it should be understood that references to orientation descriptions such as upper, lower, front, rear, left, right, etc. are based on the orientation or positional relationship shown in the drawings, are merely for convenience of description of the present invention and to simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.
The terms "first," "second," "third," and "fourth" and the like in the description and in the claims and drawings are used for distinguishing between different objects and not necessarily for describing a particular sequential or chronological order. Furthermore, the terms "comprise" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those listed steps or elements but may include other steps or elements not listed or inherent to such process, method, article, or apparatus.
Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the invention. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
eMMC: embedded Multi Media Card, an embedded multimedia card, is an embedded memory standard specification defined by the MMC society and mainly aimed at products such as mobile phones or tablet computers. The eMMC is an embedded non-volatile memory system, mainly comprising a flash memory, a flash memory access system, an eMMC protocol interface and the like, defines the physical architecture and the access interface and the protocol of the memory system based on an embedded multimedia card, has the advantages of small volume, low power consumption, large capacity and the like, and is very suitable for being used as a memory medium of electronic equipment such as a smart phone, a tablet personal computer, mobile internet equipment and the like.
UFS: universal Flash Storage the general flash memory is a high-speed storage technology, and is generally used for memory storage of mobile devices such as mobile phones and tablet computers. The transmission speed of the memory device can reach hundreds of megabytes per second, and the read-write performance of the memory device is greatly improved. The UFS flash memory is characterized in that sequential read-write and random read-write can be simultaneously supported, so that the efficiency is higher when a large amount of data is processed. In addition, the UFS flash memory has the advantages of low power consumption, good durability and the like, and is suitable for the storage requirement of mobile equipment. The capacity of UFS flash memory is also increasing, and the maximum UFS flash memory capacity in the market can reach 2TB. The capacity and performance of the UFS flash memory are improved, so that the UFS flash memory is more and more popular in mobile devices such as mobile phones and tablet computers.
Nand Flash: flash refers to Flash memory, which is a nonvolatile memory capable of being rapidly erased and programmed by electricity, and Flash can be divided into Nor Flash and Nand Flash from the chip technology. The Nand Flash memory is a Flash memory, and a nonlinear macro unit mode is adopted in the Nand Flash memory, so that a cheap and effective solution is provided for the realization of a solid-state large-capacity memory. The Nand Flash memory has the advantages of larger capacity, high rewriting speed and the like, and is suitable for storing a large amount of data, so that the Nand Flash memory is increasingly widely applied in industry, such as embedded products including digital cameras, MP3 walkman memory cards, small-sized U discs and the like.
Memory products using Nand Flash such as eMMC and UFS are increasingly widely used, and are widely used in various platforms such as tablet personal computers, television boxes, mobile phones, car navigation, and the like. In the production and development processes of memory products such as eMMC and UFS, various functional tests are required to be performed to ensure that the memory products can work normally and prevent defective products from flowing into the market. At present, when testing products such as eMMC/UFS, a host (master control platform) tests a device (product to be tested), so as to obtain a test result; however, by adopting the test mode, the test efficiency is low, the test result is not visual, and after the host obtains the test data, the test data is transmitted to the external equipment for data processing, so that the staff can see the test result.
Therefore, the embodiment of the invention provides a storage product testing method and a storage product testing system, wherein the storage product testing system comprises a testing host, a plurality of main control platforms and a plurality of products to be tested, the testing host is respectively and electrically connected with the plurality of main control platforms, and each main control platform is respectively and electrically connected with the corresponding product to be tested; based on the storage product testing system, the storage product testing method of the embodiment of the invention comprises the following steps:
the test host sends a test command to the main control platform;
the main control platform forwards the test command to the corresponding product to be tested;
according to the test command, the product to be tested executes test operation and stores test data into a first buffer area;
the main control platform reads the test data in the first buffer area and stores the test data in a second buffer area;
and the test host reads the test data in the second buffer area to obtain a test result of the product to be tested.
According to the storage product testing method and the storage product testing system, one testing host can be connected with a plurality of main control platforms at the same time, each main control platform is respectively connected with a corresponding product to be tested, through the arrangement, a testing command can be issued through the testing host, each main control platform can test the corresponding product to be tested at the same time, and finally the testing host can obtain a testing result, and the testing host can directly display the testing result through a display interface. Therefore, according to the storage product testing method and the storage product testing system, a plurality of products to be tested can be tested at the same time, so that the testing efficiency is improved, and the testing result can be visually displayed through the testing host.
The following describes in detail a method, a system, an electronic device, and a storage medium for testing a storage product according to embodiments of the present invention with reference to fig. 1-2.
In one aspect, as shown in fig. 1, a storage product testing system is provided in an embodiment of the present invention, and the storage product testing system includes a testing host 100 (i.e., a PC), a plurality of main control platforms 200 (i.e., host), and a plurality of products 300 to be tested (i.e., devices), where the testing host 100 is electrically connected to the plurality of main control platforms 200, and each main control platform 200 is electrically connected to a corresponding product 300 to be tested. The test host 100 is responsible for sending a test command and acquiring test data, so as to obtain a test result; the main control platform 200 is responsible for forwarding the test command sent by the test host 100 to the product 300 to be tested and forwarding the test data sent by the product 300 to be tested to the test host 100; the product 300 to be tested is responsible for receiving the test command and executing the corresponding test operation, thereby obtaining test data, and sending the test data to the test host 100 through the main control platform 200, so that the test host 100 obtains a test result.
Specifically, in this example, the test host 100 and the master control platforms 200 communicate with each other by using a customized usb protocol, which is a one-to-many relationship, and one test host 100 may be connected to more than 256 master control platforms 200, and one management thread is respectively established in the test host 100 for each master control platform 200.
The communication between the main control platform 200 and the product 300 to be tested is performed by using eMMC/UFS protocol, depending on the type of the product 300 to be tested, if the product 300 to be tested is eMMC, the communication is performed by using eMMC private command, and if the product 300 to be tested is UFS, the communication is performed by using UFS private command.
Each product 300 to be tested is provided with a first buffer zone (buffer), and after the product 300 to be tested acquires test data, the test data is stored in the first buffer zone; each main control platform 200 is respectively provided with a second buffer, and after the main control platform 200 reads the test data from the first buffer, the test data is stored in the second buffer, and the test host 300 waits for reading the test data from the second buffer.
The test command sent by the test host 100 is transmitted in the form of a structured string, which may be in the following specific format: command name (parameter 1, parameter 2, parameter 3 … …). The test data sent by the product 300 to be tested is transmitted in the form of data packets, and the structure of the data packets is shown in table 1:
| data structure | device | host |
| Header | 512Bytes | 512Bytes |
| Body | 16k-512Bytes | 64k-512Bytes |
TABLE 1
The structure of the data packet includes a data packet Header (i.e., header) and a data packet Body (i.e., body), wherein the data packet Header is used to indicate various states of the data, and the data packet Body is the data content to be sent by the product 300 to be tested to the test host 100.
The header includes at least the contents as shown in table 2:
TABLE 2
As shown in table 2, the header includes an identification character (i.e., mac), a valid character length (i.e., valid_len), all valid data lengths (i.e., log_len) of the current command transfer, a busy flag (i.e., rb_flag), a current data volume full flag (i.e., frame_full), a command execution error flag (command_err), and a product status under test flag (i.e., dev_status). Wherein, the magic is used for representing the category of the data packet; valid_len is used for representing the length of effective data in a buffer (a first buffer area/a second buffer area); log_len is used for judging whether a data packet is lost in the transmission process; the rb_flag is used for judging whether the current command data transmission is finished or not; the frame_full is used for judging whether a buffer (a first buffer area/a second buffer area) is full of data; the command_err is used for judging whether the execution condition of the current command has errors or not; dev_status is used to characterize the current status (e.g., online, offline, or failed status) of the product 300 under test.
When the test host 100 reads the test data in the second buffer area of the main control platform 200 by means of the timing polling, the data packet header is read first, and when the frame_full field in the data packet header is found to be set to 1 (i.e. the second buffer area is fully written with data), the test host 100 will continue to read the data packet header at this time, take the data away, and set the frame_full field to 0; if the test host 100 reads the packet header, it finds that the frame_full field in the packet header is 0, it will not continue to read the packet header, but will continue to read the packet header after waiting for the frame_full field to be set to 1, thereby improving the data reading efficiency and avoiding wasting time.
Similarly, after the product 300 to be tested performs the test, the test data is stored in the first buffer area, and the main control platform 200 waits for reading. When the main control platform 200 reads the test data of the first buffer area of the product 300 to be tested, the data packet header is read first, and when the frame_full field in the data packet header is found to be set to 1 (i.e. the first buffer area is fully filled with data), the main control platform 200 continues to read the data packet header, take the data away, and set the frame_full field to 0; if the master control platform 200 reads the packet header, it finds that the frame_full field in the packet header is 0, it will not continue to read the packet header, but will continue to read the packet header after waiting for the frame_full field to be set to 1, thereby improving the data reading efficiency and avoiding wasting time.
According to the storage product testing system provided by the embodiment of the invention, a plurality of products 300 to be tested can be tested simultaneously through one testing host 100, so that the large-scale automatic testing of the storage products is realized, and the testing efficiency is improved; and after the test host 100 obtains the test result, the test result can be displayed through the display interface, so that a person can visually check the result. In addition, the data is transmitted in a special data packet mode, so that the data transmission process is more stable and reliable, and the transmission efficiency is higher.
On the other hand, based on the above-mentioned storage product testing system, as shown in fig. 2, the embodiment of the invention further provides a storage product testing method, which includes the following steps:
step S100: the test host 100 sends a test command to the main control platform 200;
step S200: the main control platform 200 forwards the test command to the corresponding product 300 to be tested;
step S300: according to the test command, the product 300 to be tested executes the test operation and stores the test data into the first buffer;
step S400: the main control platform 200 reads the test data in the first buffer area and stores the test data in the second buffer area;
step S500: the test host 100 reads the test data in the second buffer area to obtain the test result of the product 300 to be tested.
Specifically, first, the test host 100 sends a test command to the master control platform 200 through the usb protocol, and then the master control platform 200 forwards the test command to the product 300 to be tested by using the emmc/ufs protocol. Wherein, the test command is transmitted in the form of a structured character string, and the specific format can be: command name (parameter 1, parameter 2, parameter 3 … …).
After the test command is obtained, the product 300 to be tested executes corresponding test operations (such as reading, writing, erasing, etc.) according to the test command, so as to obtain test data, and stores the test data into the first buffer area, and waits for the main control platform 200 to read; after the main control platform 200 reads the data, the test data is stored in the second buffer area, and waits for the test host 100 to read. The test data is transmitted in the form of a data packet, and the structure of the data packet includes a data packet Header (i.e., header) and a data packet Body (i.e., body), where the data packet Header is used to indicate various states of the data, and the data packet Body is the data content to be sent by the product 300 to be tested to the test host 100. The header includes an identification character (i.e., magic), a valid character length (i.e., valid_len), all valid data lengths (i.e., log_len) for the current command transfer, a busy flag (i.e., rb_flag), a current data body full flag (i.e., frame_full), a command execution error flag (command_err), and a product status under test flag (i.e., dev_status). Wherein, the magic is used for representing the category of the data packet; valid_len is used for representing the length of effective data in a buffer (a first buffer area/a second buffer area); log_len is used for judging whether a data packet is lost in the transmission process; the rb_flag is used for judging whether the current command data transmission is finished or not; the frame_full is used for judging whether a buffer (a first buffer area/a second buffer area) is full of data; the command_err is used for judging whether the execution condition of the current command has errors or not; dev_status is used to characterize the current status (e.g., online, offline, or failed status) of the product 300 under test.
When the main control platform 200 needs to read the test data of the first buffer area, the data packet header is read first, and when the frame_full field in the data packet header is found to be set to 1 (i.e. the first buffer area is fully filled with data), the main control platform 200 continues to read the data packet header at this time, takes the data away, and sets the frame_full field to 0; if the master control platform 200 reads the packet header, it finds that the frame_full field in the packet header is 0, it will not continue to read the packet header, but will continue to read the packet header after waiting for the frame_full field to be set to 1, thereby improving the data reading efficiency and avoiding wasting time.
After the main control platform 200 reads the test data, the test data is stored in the second buffer area, and waits for the test host 100 to read. When the test host 100 reads the test data in the second buffer area of the main control platform 200 by means of the timing polling, the data packet header is read first, and when the frame_full field in the data packet header is found to be set to 1 (i.e. the second buffer area is fully written with data), the test host 100 will continue to read the data packet header at this time, take the data away, and set the frame_full field to 0; if the test host 100 reads the packet header, it finds that the frame_full field in the packet header is 0, it will not continue to read the packet header, but will continue to read the packet header after waiting for the frame_full field to be set to 1, thereby improving the data reading efficiency and avoiding wasting time.
According to the storage product testing method provided by the embodiment of the invention, a plurality of products 300 to be tested can be tested simultaneously through one testing host 100, so that the large-scale automatic testing of the storage products is realized, and the testing efficiency is improved; and after the test host 100 obtains the test result, the test result can be displayed through the display interface, so that a person can visually check the result. In addition, the data is transmitted in a special data packet mode, so that the data transmission process is more stable and reliable, and the transmission efficiency is higher.
On the other hand, the embodiment of the invention also provides electronic equipment, which comprises:
a memory for storing program instructions;
and the processor is used for calling the program instructions stored in the memory and executing the storage product testing method according to the obtained program instructions.
It should be noted that, the content in the above method embodiment is applicable to the present electronic device embodiment, and the functions specifically implemented by the present electronic device embodiment are the same as those of the above method embodiment, and the achieved beneficial effects are the same as those of the above method embodiment.
Although specific embodiments are described herein, those of ordinary skill in the art will recognize that many other modifications or alternative embodiments are also within the scope of the present disclosure. For example, any of the functions and/or processing capabilities described in connection with a particular device or component may be performed by any other device or component. In addition, while various exemplary implementations and architectures have been described in terms of embodiments of the present disclosure, those of ordinary skill in the art will recognize that many other modifications to the exemplary implementations and architectures described herein are also within the scope of the present disclosure.
Certain aspects of the present disclosure are described above with reference to block diagrams and flowchart illustrations of systems, methods, systems and/or computer program products according to example embodiments. It will be understood that one or more blocks of the block diagrams and flowchart illustrations, and combinations of blocks in the block diagrams and flowchart illustrations, respectively, can be implemented by executing computer-executable program instructions. Also, some of the blocks in the block diagrams and flowcharts may not need to be performed in the order shown, or may not need to be performed in their entirety, according to some embodiments. In addition, additional components and/or operations beyond those shown in blocks of the block diagrams and flowcharts may be present in some embodiments.
Accordingly, blocks of the block diagrams and flowchart illustrations support combinations of means for performing the specified functions, combinations of elements or steps for performing the specified functions and program instruction means for performing the specified functions. It will also be understood that each block of the block diagrams and flowchart illustrations, and combinations of blocks in the block diagrams and flowchart illustrations, can be implemented by special purpose hardware-based computer systems that perform the specified functions, elements or steps, or combinations of special purpose hardware and computer instructions.
Program modules, applications, etc. described herein may include one or more software components including, for example, software objects, methods, data structures, etc. Each such software component may include computer-executable instructions that, in response to execution, cause at least a portion of the functions described herein (e.g., one or more operations of the exemplary methods described herein) to be performed.
The software components may be encoded in any of a variety of programming languages. An exemplary programming language may be a low-level programming language, such as an assembly language associated with a particular hardware architecture and/or operating system platform. Software components including assembly language instructions may need to be converted into executable machine code by an assembler prior to execution by a hardware architecture and/or platform. Another exemplary programming language may be a higher level programming language that may be portable across a variety of architectures. Software components, including higher-level programming languages, may need to be converted to an intermediate representation by an interpreter or compiler before execution. Other examples of programming languages include, but are not limited to, a macro language, a shell or command language, a job control language, a scripting language, a database query or search language, or a report writing language. In one or more exemplary embodiments, a software component containing instructions of one of the programming language examples described above may be executed directly by an operating system or other software component without first converting to another form.
The software components may be stored as files or other data storage constructs. Software components having similar types or related functionality may be stored together, such as in a particular directory, folder, or library. The software components may be static (e.g., preset or fixed) or dynamic (e.g., created or modified at execution time).
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of one of ordinary skill in the art without departing from the spirit of the present invention.
Claims (8)
1. The storage product testing method is based on a storage product testing system, the storage product testing system comprises a testing host, a plurality of main control platforms and a plurality of products to be tested, the testing host is respectively and electrically connected with the main control platforms, and each main control platform is respectively and electrically connected with the corresponding products to be tested, and is characterized by comprising the following steps:
the test host sends a test command to the main control platform;
the main control platform forwards the test command to the corresponding product to be tested;
according to the test command, the product to be tested executes test operation and stores test data into a first buffer area;
the main control platform reads the test data in the first buffer area and stores the test data in a second buffer area;
the test host reads the test data in the second buffer area to obtain a test result of the product to be tested;
the test data are transmitted in a data packet form, the data packet comprises a data packet head and a data packet body, and the data packet head comprises at least one of identification characters, an effective character length, all effective data lengths transmitted by a current command, busy and idle marks, a current data body full mark, a command execution error mark and a to-be-tested product state mark; wherein the identification character is used for representing the category of the data packet; the effective character length is used for representing the length of effective data in the first buffer area or the second buffer area; the length of all effective data transmitted by the current command is used for representing whether a data packet is lost in the transmission process; the busy/idle mark is used for representing whether the current command data transmission is finished or not; the current data volume full mark is used for representing whether the first buffer area or the second buffer area is full of data; the command execution error mark is used for representing the execution condition of the current command; the to-be-detected product state mark is used for representing the current state of the to-be-detected product.
2. The method of claim 1, wherein the test host communicates with the host platform via usb protocol; and the main control platform is communicated with the product to be tested through an emmc/ufs protocol.
3. The method of claim 1, wherein the main control platform reads the test data in the first buffer and stores the test data in a second buffer, comprising:
the main control platform reads the data packet header of the test data in the first cache region;
identifying the current data body full flag of the data packet header;
and when the current data body full mark is set to be 1, the main control platform reads the data body of the test data and sets the current data body full mark to be 0.
4. The method according to claim 1, wherein the test host reads the test data in the second buffer area of each master control platform in a polling manner to obtain a test result of the product to be tested.
5. A storage product testing system, comprising a testing host, a plurality of main control platforms and a plurality of products to be tested, wherein the testing host is respectively and electrically connected with the plurality of main control platforms, each main control platform is respectively and electrically connected with the corresponding products to be tested, and the storage product testing system is used for realizing the storage product testing method according to any one of claims 1-4.
6. The storage product testing system of claim 5, wherein the test host communicates with the master platform via usb protocol; and the main control platform is communicated with the product to be tested through an emmc/ufs protocol.
7. An electronic device, comprising:
a memory for storing program instructions;
a processor for invoking program instructions stored in the memory and executing the stored product testing method of any of claims 1-4 in accordance with the obtained program instructions.
8. A storage medium having stored thereon computer-executable instructions for causing a computer to perform the storage product testing method of any one of claims 1-4.
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