CN116735980A - Method and device for testing inductance bias inductance by double pulses - Google Patents
Method and device for testing inductance bias inductance by double pulses Download PDFInfo
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Abstract
The embodiment of the disclosure relates to a method and a device for testing inductance bias inductance by adopting double pulses. The method comprises the steps of enabling a double-pulse voltage signal containing a first pulse and a second pulse to act on two ends of an inductor to be tested; adjusting the first pulse to enable the current passing through the inductor to be tested to reach a target bias current; setting the voltage amplitude and the turn-on time of the second pulse; collecting the current variation passing through the inductance to be measured in the opening time of the second pulse; and calculating the inductance bias inductance of the inductance to be measured under the target bias current according to the voltage amplitude, the opening time and the current variation of the second pulse. According to the method, the pulse voltage is continuously applied to the two ends of the inductor to be tested twice, the first pulse controls the bias current, the second pulse obtains the bias inductance of the inductor, the bias current source is not required to be independently provided, a special inductor tester is not required, so that the equipment cost is reduced, and the problem that the direct current source interferes with the inductor tester is avoided.
Description
Technical Field
The embodiment of the disclosure relates to the technical field of power electronic testing, in particular to a method and a device for testing inductance bias inductance by adopting double pulses.
Background
The main circuits of the power electronic circuit, such as a basic BOOST circuit (BOOST circuit) and a BUCK circuit (BUCK circuit), have inductive storage elements. The inductance has a most basic characteristic that under the condition of applying direct current bias, the inductance changes, and the characteristic that the inductance changes along with the direct current is called as direct current bias of the inductance, and under normal conditions, the larger the current is, the smaller the inductance is, and the drop characteristic of the inductance is also called as drop characteristic. The DC bias inductance of the test inductor is of great significance for parameter control of the device and the true value of the inductor in the electrical loop.
In the related art, a method for testing inductance bias inductance is generally composed of a high-precision direct current source and an inductance measuring instrument, wherein the high-precision current source firstly provides current bias, and the inductance measuring instrument then tests inductance of the inductance. The two sets of equipment have high cost, and after the large current is introduced into the inductor, the inductor is used for testing, and the interference of the current source to the inductor is needed to be considered.
Regarding the above technical solution, the inventors found that at least some of the following technical problems exist: for example, the inductance bias inductance of the test inductance under bias current needs to additionally provide a bias direct current source, and then the inductance measuring instrument is adopted for testing, so that the equipment cost is high, and the problem that the direct current source interferes with the inductance tester exists.
Accordingly, there is a need to improve one or more problems in the related art as described above.
It should be noted that the information disclosed in the above background section is only for enhancing understanding of the background of the present disclosure and thus may include information that does not constitute prior art known to those of ordinary skill in the art.
Disclosure of Invention
The embodiment of the disclosure aims to provide a method and a device for testing inductance bias inductance by adopting double pulses, so as to at least solve the problems of high equipment cost and direct current source interference inductance tester.
The application adopts the following technical scheme:
in a first aspect, the application provides a method for testing inductance bias inductance using double pulses, comprising:
applying a double-pulse voltage signal containing a first pulse and a second pulse to two ends of the inductor to be tested;
adjusting the first pulse to enable the current passing through the inductor to be tested to reach a target bias current;
setting the voltage amplitude and the turn-on time of the second pulse;
collecting the current variation passing through the inductance to be measured in the opening time of the second pulse;
and calculating the inductance bias inductance of the inductance to be measured under the target bias current according to the voltage amplitude, the opening time and the current variation of the second pulse.
Optionally, the step of adjusting the first pulse to make the current passing through the inductance to be measured reach a target bias current further includes:
and enabling the current passing through the inductor to be tested to reach the target bias current by adjusting the opening time of the first pulse.
Optionally, the step of adjusting the on time of the first pulse to make the current passing through the inductance to be measured reach the target bias current further includes:
collecting the actual current passing through the inductor to be tested in the opening time of the first pulse;
comparing the actual current with the target bias current;
ending the first pulse when the actual current reaches the target bias current.
Optionally, the step of adjusting the on time of the first pulse to make the current passing through the inductance to be measured reach the target bias current further includes:
the first pulse is set into a plurality of pulse sequences;
collecting the actual current passing through the inductor to be tested in the opening time of the first pulse;
continuing to transmit a next pulse sequence when the actual current at the end of each pulse sequence is less than the target bias current;
and ending the current pulse sequence and stopping sending the next pulse sequence when the actual current in each pulse sequence reaches the target bias current.
Optionally, the step of setting the voltage amplitude and the on time of the second pulse further includes:
the voltage amplitude of the second pulse is set smaller than the voltage amplitude of the first pulse.
Optionally, the step of calculating the inductance bias inductance of the inductance to be measured under the target bias current according to the voltage amplitude, the on time and the current variation of the second pulse further includes:
and obtaining the inductance bias inductance of the inductance to be tested under the target bias current by multiplying the voltage amplitude of the second pulse and the opening time and then dividing the multiplied voltage amplitude by the current variation.
In a second aspect, the present application provides an apparatus for testing inductance bias inductance using double pulses, comprising:
the double-pulse transmitting device is connected to two ends of the inductor to be tested and is used for enabling a double-pulse voltage signal containing first pulses and second pulses to act on the two ends of the inductor to be tested;
the current sensor is arranged at any end of the inductor to be tested and is used for collecting current passing through the inductor to be tested;
the voltage inductor is arranged at any end of the inductor to be tested and is used for collecting the voltage of the inductor to be tested;
the processor is respectively connected with the current sensor and the voltage sensor in a communication way and is used for processing and calculating the inductance bias inductance of the inductance to be tested under the target bias current;
the device for testing the inductance bias inductance by double pulses calculates the inductance bias inductance of the inductance to be tested under the target bias current according to the method for testing the inductance bias inductance by double pulses in any one of the above embodiments.
Optionally, the double pulse transmitting device includes: a direct current voltage source, a double pulse signal generator, a first switch and a flywheel diode;
the direct-current voltage source is connected with the first switch in series and then connected with two ends of the inductor to be tested in parallel;
the freewheeling diode is connected in parallel with two ends of the inductance to be tested, and the direction of the current allowed to pass by the freewheeling diode is from the negative end to the positive end of the direct-current voltage source;
the double-pulse signal generator is in control connection with the first switch and sends a first control pulse signal to the first switch, and the first control pulse signal is used for controlling the on-off of the first switch so as to control the on-time of the first pulse and the second pulse.
Optionally, the double pulse transmitting device further includes: a second switch;
the second switch is connected in parallel with two ends of the inductor to be tested;
the double-pulse signal generator is in control connection with the second switch and sends a second control pulse signal to the second switch, and the first control pulse signal and the second control pulse signal are complementary pulse signals.
Optionally, the direct current voltage source changes the output voltage according to the preset voltage after the first pulse is ended and before the second pulse is sent.
The technical scheme provided by the embodiment of the disclosure can comprise the following beneficial effects:
in the embodiment of the disclosure, through continuously adding pulse voltage to two ends of the inductor to be tested twice, the first pulse controls the bias current, and the second pulse obtains the inductance bias inductance value, so that a bias current source is not required to be provided independently, a special inductance tester is not required, the equipment cost is reduced, and the problem that a direct current source interferes with the inductance tester is also avoided.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the disclosure and together with the description, serve to explain the principles of the disclosure. It will be apparent to those of ordinary skill in the art that the drawings in the following description are merely examples of the disclosure and that other drawings may be derived from them without undue effort.
FIG. 1 illustrates a flow diagram of a method of testing inductance bias inductance using double pulses in an exemplary embodiment of the present disclosure;
FIG. 2 illustrates waveforms of a double pulse voltage signal and a current of an inductor under test in an exemplary embodiment of the present disclosure;
FIG. 3 illustrates a waveform schematic of a first pulse in an exemplary embodiment of the present disclosure using a plurality of pulse trains;
FIG. 4 illustrates a waveform schematic diagram of a second pulse having a voltage amplitude lower than a voltage amplitude of a first pulse in an exemplary embodiment of the present disclosure;
FIG. 5 illustrates a circuit schematic of an apparatus for testing inductance bias inductance using double pulses in an exemplary embodiment of the present disclosure;
fig. 6 shows a schematic circuit diagram of a second switch employed in an apparatus for testing inductance bias inductance using double pulses in an exemplary embodiment of the present disclosure.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. However, the exemplary embodiments may be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
Furthermore, the drawings are merely schematic illustrations of the present disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus a repetitive description thereof will be omitted. Some of the block diagrams shown in the figures are functional entities and do not necessarily correspond to physically or logically separate entities. These functional entities may be implemented in software or in one or more hardware modules or integrated circuits or in different networks and/or processor devices and/or microcontroller devices.
In this example embodiment, a method for testing inductance bias inductance using double pulses is provided first. Referring to fig. 1, the method comprises the following steps:
step S101: and applying a double-pulse voltage signal containing a first pulse and a second pulse to two ends of the inductor to be tested.
Step S102: the first pulse is adjusted to bring the current through the inductor under test to the target bias current.
Step S103: setting the voltage amplitude and the on time of the second pulse.
Step S104: and collecting the current variation through the inductor to be tested in the on time of the second pulse.
Step S105: and calculating the inductance bias inductance of the inductance to be measured under the target bias current according to the voltage amplitude, the opening time and the current variation of the second pulse.
It is to be understood that the voltage amplitudes of the first pulse and the second pulse may be the same, and the voltage source used may be a voltage source outputting a fixed voltage. The voltage amplitudes of the first pulse and the second pulse may be different, and correspondingly, the voltage source used may be a voltage source capable of changing the output voltage according to preset conditions.
It is also understood that the voltage across the inductor is equal to the current variation divided by the corresponding variation time multiplied by the inductance. Therefore, the inductance bias inductance of the inductance to be measured under the target bias current is obtained by multiplying the voltage amplitude of the second pulse and the on time and then dividing the multiplied voltage amplitude by the current variation.
It should also be appreciated that the inductor is a linear element in which the current through the inductor increases linearly when a constant voltage is applied across the inductor, the current through the inductor remains constant when the voltage across the inductor is 0, and the current through the inductor decreases linearly when a constant voltage of opposite polarity is applied across the inductor. With this basic principle, the inductance bias inductance of the inductor can be tested.
It should be further understood that, referring to fig. 2, first, a constant first pulse voltage is applied to two ends of the measured inductor, so that the inductor current linearly rises in a first pulse time, the end current value of the rise of the inductor current depends on the first pulse voltage value and the first pulse time, and the higher the first pulse voltage value, the faster the current rising speed, and vice versa, the slower the current rising speed; the longer the first pulse time, the greater the termination current value and vice versa. Thus, by controlling both the first pulse voltage value and the first pulse time, the inductor current can be adjusted to reach the target bias current value.
It is further understood that the application obtains the inductance bias inductance by continuously applying pulse voltages to both ends of the inductance to be measured twice, wherein the first pulse voltage controls the bias current, and the second pulse voltage calculates the inductance dip. Compared with the traditional scheme of adopting a direct current bias current source and an inductance tester, the application utilizes a double-pulse testing method, the first pulse voltage controls the inductance to generate bias current, the second pulse calculates inductance bias inductance, the target bias current can be created by adjusting the first pulse voltage or the first pulse time, the requirement on the voltage source is reduced, and the bias current can be confirmed by utilizing the process of keeping the inductance current stable between the first pulse and the second pulse.
According to the method for testing the inductance bias inductance by adopting the double pulses, the two ends of the inductance to be tested are continuously provided with the pulse voltage twice, the bias current is controlled by the first pulse, the inductance bias inductance is acquired by the second pulse, the bias current source is not required to be provided independently, and a special inductance tester is not required, so that the equipment cost is reduced, and the problem that the direct current source interferes with the inductance tester is avoided.
Hereinafter, each step of the above-described method for testing inductance bias feeling using double pulses in the present exemplary embodiment will be described in more detail with reference to fig. 1 to 4.
Optionally, referring to fig. 2 and 3, step S102 further includes:
step S201: and the current passing through the inductor to be tested reaches the target bias current by adjusting the opening time of the first pulse.
It should be understood that, since the inductor is used as a linear element, when a constant voltage is applied across the inductor, the current of the inductor increases linearly, and thus, the control of the current passing through the inductor to be measured can be achieved by adjusting the on time of the first pulse. And compared with the adjustment of the voltage amplitude of the first pulse, the adjustment of the opening time of the first pulse is simpler and more accurate in controlling the current passing through the inductor to be tested.
Optionally, referring to fig. 2, step S201 further includes:
step S301: the actual current passing through the inductor to be tested in the on time of the first pulse is collected.
Step S302: the actual current is compared with the target bias current.
Step S303: the first pulse is ended when the actual current reaches the target bias current.
It should be understood that the width of the on time of the first pulse is determined by the target value of the inductor bias current, and the first pulse is turned off immediately when the actual inductor bias current is greater than the preset target bias current value by comparing the actual inductor bias current with the preset target bias current value.
Optionally, referring to fig. 3, step S201 further includes:
step S401: the first pulse is arranged as a plurality of pulse trains.
Step S402: the actual current passing through the inductor to be tested in the on time of the first pulse is collected.
Step S403: when the actual current at the end of each pulse sequence is less than the target bias current, the next pulse sequence is continued to be transmitted.
Step S404: and ending the current pulse sequence and stopping sending the next pulse sequence when the actual current in each pulse sequence reaches the target bias current.
It should be understood that the first pulse actually consists of a plurality of pulse sequences, in each pulse sequence, the inductor current rises for a period of time, the inductor current rises stepwise in a segmented manner in the whole first pulse time, the pulse sequence in the first pulse is continuously sent out by comparing the actual inductor bias current with a preset target bias current value when the actual inductor bias current is smaller than the preset target bias current value, and the subsequent sequence of the first pulse is turned off when the actual inductor bias current is larger than the preset target bias current value. By dividing the pulse sequence, the situation that the first pulse time is too long, the current rising rate after the inductor falls is accelerated, and the actual bias current is uncontrollable is avoided. After being divided into pulse sequences, the pulse sequence is also convenient to sample in a segmented mode, and the bias current is accurately controlled.
Optionally, referring to fig. 4, step S103 further includes:
step S501: the voltage amplitude of the second pulse is set smaller than the voltage amplitude of the first pulse.
It should be understood that, because the amplitude of the second pulse voltage is reduced, the second pulse time is obviously prolonged under the condition that the current increment of the inductor is kept the same in the second pulse time, the longer the time is, the higher the measurement accuracy of the time is, and the more accurate the result of calculating the bias inductance by using the method is. Therefore, the voltage amplitude of the second pulse is reduced, which contributes to an improvement in the accuracy of calculating the offset inductance.
Further, in this exemplary embodiment, there is also provided an apparatus for testing inductance bias inductance using double pulses, as shown in fig. 5, including: the double pulse transmitting device comprises a current sensor I-sense, a voltage sensor V-sense and a processor.
The double pulse sending device is connected to two ends of the inductor to be tested and is used for enabling a double pulse voltage signal containing a first pulse and a second pulse to act on two ends of the inductor to be tested. The current sensor I-sense is arranged at any end of the inductor to be tested and is used for collecting current passing through the inductor to be tested. The voltage sensor V-sense is arranged at any end of the inductor to be tested and is used for collecting the voltage of the inductor to be tested. The processor is respectively connected with the current sensor I-sense and the voltage sensor V-sense in a communication way and is used for processing and calculating the inductance bias inductance of the inductance to be tested under the target bias current.
The device for testing the inductance bias inductance by double pulses calculates the inductance bias inductance of the inductance to be tested under the target bias current according to the method for testing the inductance bias inductance by double pulses in any one of the embodiments.
The specific manner of calculating the inductance bias inductance of the inductor to be tested at the target bias current by using the apparatus for testing the inductance bias inductance by using double pulses has been described in detail in the embodiments of the method for testing the inductance bias inductance by using double pulses, and will not be repeatedly described herein.
It should be understood that the processor may be a digital oscilloscope Scope, and after receiving the voltage and the current of the inductance to be measured, the processor may not only process and calculate the inductance bias inductance of the inductance to be measured under the target bias current, but also directly display the voltage and the current of the inductance to be measured and the calculation result (the inductance bias inductance of the inductance to be measured under the target bias current).
Next, the respective parts of the above-described apparatus for testing inductance bias feeling using double pulses in the present exemplary embodiment will be described in more detail with reference to fig. 5 to 6.
Optionally, referring to fig. 5, the double pulse transmission apparatus includes: a direct current voltage source DC1, a double pulse signal generator Ds1, a first switch S1 and a freewheeling diode D1.
The direct-current voltage source DC1 and the first switch S1 are connected in series and then connected in parallel to two ends of the inductor L1 to be tested. The freewheeling diode D1 is connected in parallel to two ends of the inductance L1 to be tested, and the direction of the current allowed to pass through the freewheeling diode D1 is from the negative end to the positive end of the DC voltage source DC 1. The double-pulse signal generator Ds1 is in control connection with the first switch S1 and sends a first control pulse signal to the first switch S1, and the first control pulse signal is used for controlling the on-off of the first switch S1 so as to control the on-time of the first pulse and the second pulse.
It should be understood that the direct current voltage source DC1, the first switch S1, and the inductance L1 to be measured are sequentially connected in series to form a loop, the freewheeling diode D1 is connected in anti-parallel to two ends of the inductance L1 to be measured, so as to generate a freewheeling loop, and the dipulse signal generator Ds1 is used for controlling the first switch S1, so that the voltage of the direct current voltage source DC1 is applied to two ends of the inductance L1 to be measured. The voltage sensor V-sense and the current sensor I-sense the voltage and the current of the inductor L1 to be measured respectively, and send the sensed signals into the digital oscilloscope Scope for display, measurement and calculation.
Optionally, referring to fig. 6, the double pulse transmission apparatus further includes: and a second switch S3.
The second switch S3 is connected in parallel to two ends of the inductance L1 to be measured. The double pulse signal generator Ds2 is in control connection with the second switch S3, and sends a second control pulse signal to the second switch S3, where the first control pulse signal and the second control pulse signal are complementary pulse signals.
It should be understood that the direct-current voltage source DC2, the first switch S2, and the inductance L1 to be tested are sequentially connected in series to form a loop, the freewheeling diode D2 is connected in anti-parallel to two ends of the inductance L1 to be tested, the double pulse signal generator Ds2 sends two complementary pulse signals, the first path is used for driving the first switch S2, and the second path is used for driving the second switch S3. Because the diode has about 0.7V voltage drop when being conducted, which is equivalent to providing low voltage with reverse polarity for the inductor L1 to be tested when the inductor L1 to be tested freewheels, the bias current of the inductor can not be kept constant at the moment, but the bias current of the inductor can slightly decline. After the second switch S3 is connected in parallel, in the freewheeling stage of the freewheeling diode D2, the second switch S3 is turned on, so as to offset the conduction voltage drop of the freewheeling diode D2, thereby keeping the bias current stable.
Alternatively, referring to fig. 4 and 5, the direct current voltage source DC1 changes the output voltage according to the preset voltage after the end of the first pulse and before the transmission of the second pulse. It should be understood that the DC voltage source DC1 may be adjusted according to a preset value, and the output voltage of the DC voltage source DC1 is changed according to a preset voltage value V2 after the first pulse voltage V1 is turned off and before the second pulse is turned on.
Further, the device for testing the inductance bias inductance by using double pulses according to the above more specific embodiment has the following specific working procedures:
after the device is started, the double pulse signal generator sends out two pulse signals for controlling the first switch to be turned on and off.
The double pulse is composed of three parts, a first high-level pulse part T1, and a second high-level pulse part T3, and a low-level part T2 between the two pulses.
In the first stage T1 period, a first high-level pulse is sent out to control the first switch S1 to be conducted, at the moment, current is sent out from the positive electrode of the direct current source, passes through the first switch S1 and the inductor L1 to be tested, and returns to the negative electrode of the direct current source. The equivalent circuit at this stage is equivalent to directly applying the DC power supply voltage to the two ends of the inductor to be tested, and the current in the inductor to be tested is linearly increased due to the constant DC power supply voltage; and controlling the first switch S1 to be turned off until the first high-level pulse is turned off, and stopping the current in the inductor to be tested from continuously rising.
In the second stage T2 period, the double pulse signal generator outputs a low level, and the first switch S1 is in an off state. At this time, energy is stored in the inductor to be tested, continuous freewheeling is needed, freewheeling can only be carried out through the freewheeling diode D1, the direction of the inductor current is kept unchanged, the diode is an ideal diode, the voltage drop during conduction can be ignored, then the voltage at two ends of the inductor is equal to the voltage drop of the diode, and according to the basic principle of the inductor, when the voltage at two ends of the loaded inductor is almost 0V, the current of the inductor is unchanged, namely the inductor current is consistent and kept stable.
By keeping the inductance current constant in the period T2, the bias current of the inductance can be accurately measured in the stage, whether the bias current value set in the first stage meets the requirement or not can be confirmed in the second stage. If the bias current is less than the target set point, the first stage can be repeated to enable the bias current to continuously rise; if the bias current is greater than the target set point, resetting the pulse time or the power supply voltage in the first stage, and restarting the test.
In the third stage T3, the second pulse is started to control the first switch S1 to be continuously conducted, the inductance current to be measured continuously rises on the basis of the bias current, the pulse voltage amplitude in the stage can be properly reduced, the rising speed of the current is controlled, and the rising variation of the inductance current is avoided.
The inductance current and the inductance voltage from the first stage to the third stage are respectively sent into a digital oscilloscope Scope through a current sensor I-sense, the bias current IA in the period of the second stage T2 is measured in the oscilloscope, the second pulse voltage amplitude V, the second pulse duration T and the variation dI of the inductance current in the second pulse time are calculated, the inductance L under the bias current IA is calculated as the voltage amplitude V multiplied by the pulse duration T and then divided by the variation dI of the current, and the formula is expressed as: l=v×t/dI.
When the inductance under different bias currents is required to be measured, only the pulse voltage amplitude or pulse time width of the first stage is required to be controlled, so that the target value of the rising of the inductance current of the first stage is controlled, the bias current is confirmed in the second stage, and the inductance under the target bias current can be obtained through measurement and calculation in the third stage.
It should be noted that although in the above detailed description several modules or units of a device for action execution are mentioned, such a division is not mandatory. Indeed, the features and functionality of two or more modules or units described above may be embodied in one module or unit in accordance with embodiments of the present disclosure. Conversely, the features and functions of one module or unit described above may be further divided into a plurality of modules or units to be embodied. The components shown as modules or units may or may not be physical units, may be located in one place, or may be distributed across multiple network elements. Some or all of the modules may be selected according to actual needs to achieve the objectives of the disclosed solution. Those of ordinary skill in the art will understand and implement the present application without undue burden.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any adaptations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
Claims (10)
1. A method for testing inductance bias inductance using double pulses, comprising:
applying a double-pulse voltage signal containing a first pulse and a second pulse to two ends of the inductor to be tested;
adjusting the first pulse to enable the current passing through the inductor to be tested to reach a target bias current;
setting the voltage amplitude and the turn-on time of the second pulse;
collecting the current variation passing through the inductance to be measured in the opening time of the second pulse;
and calculating the inductance bias inductance of the inductance to be measured under the target bias current according to the voltage amplitude, the opening time and the current variation of the second pulse.
2. The method of testing inductance bias inductance using double pulses according to claim 1, wherein the step of adjusting the first pulse to bring the current through the inductance to be tested to a target bias current further comprises:
and enabling the current passing through the inductor to be tested to reach the target bias current by adjusting the opening time of the first pulse.
3. The method of testing inductance bias inductance using double pulses according to claim 2, wherein the step of adjusting the on time of the first pulse to achieve the target bias current through the inductance to be tested further comprises:
collecting the actual current passing through the inductor to be tested in the opening time of the first pulse;
comparing the actual current with the target bias current;
ending the first pulse when the actual current reaches the target bias current.
4. The method of testing inductance bias inductance using double pulses according to claim 2, wherein the step of adjusting the on time of the first pulse to achieve the target bias current through the inductance to be tested further comprises:
the first pulse is set into a plurality of pulse sequences;
collecting the actual current passing through the inductor to be tested in the opening time of the first pulse;
continuing to transmit a next pulse sequence when the actual current at the end of each pulse sequence is less than the target bias current;
and ending the current pulse sequence and stopping sending the next pulse sequence when the actual current in each pulse sequence reaches the target bias current.
5. The method of claim 1, wherein the step of setting the voltage amplitude and on time of the second pulse further comprises:
the voltage amplitude of the second pulse is set smaller than the voltage amplitude of the first pulse.
6. The method of claim 1-5, wherein the step of calculating the inductance bias inductance of the inductance under test at the target bias current according to the voltage amplitude, the on-time, and the current variation of the second pulse further comprises:
and obtaining the inductance bias inductance of the inductance to be tested under the target bias current by multiplying the voltage amplitude of the second pulse and the opening time and then dividing the multiplied voltage amplitude by the current variation.
7. An apparatus for testing inductance bias inductance using double pulses, comprising:
the double-pulse transmitting device is connected to two ends of the inductor to be tested and is used for enabling a double-pulse voltage signal containing first pulses and second pulses to act on the two ends of the inductor to be tested;
the current sensor is arranged at any end of the inductor to be tested and is used for collecting current passing through the inductor to be tested;
the voltage inductor is arranged at any end of the inductor to be tested and is used for collecting the voltage of the inductor to be tested;
the processor is respectively connected with the current sensor and the voltage sensor in a communication way and is used for processing and calculating the inductance bias inductance of the inductance to be tested under the target bias current;
the device for testing the inductance bias inductance by double pulses calculates the inductance bias inductance of the inductance to be tested under the target bias current according to the method for testing the inductance bias inductance by double pulses of any one of claims 1 to 6.
8. The apparatus for testing inductance bias sensing using double pulses according to claim 7, wherein said double pulse transmitting means comprises: a direct current voltage source, a double pulse signal generator, a first switch and a flywheel diode;
the direct-current voltage source is connected with the first switch in series and then connected with two ends of the inductor to be tested in parallel;
the freewheeling diode is connected in parallel with two ends of the inductance to be tested, and the direction of the current allowed to pass by the freewheeling diode is from the negative end to the positive end of the direct-current voltage source;
the double-pulse signal generator is in control connection with the first switch and sends a first control pulse signal to the first switch, and the first control pulse signal is used for controlling the on-off of the first switch so as to control the on-time of the first pulse and the second pulse.
9. The apparatus for testing inductance bias sensing using double pulses according to claim 8, wherein said double pulse transmitting means further comprises: a second switch;
the second switch is connected in parallel with two ends of the inductor to be tested;
the double-pulse signal generator is in control connection with the second switch and sends a second control pulse signal to the second switch, and the first control pulse signal and the second control pulse signal are complementary pulse signals.
10. The apparatus for measuring inductance bias sensing using double pulse according to any one of claims 7 to 9, wherein the dc voltage source changes the output voltage according to a preset voltage after the end of the first pulse and before the second pulse is transmitted.
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| CN118191433A (en) * | 2024-04-15 | 2024-06-14 | 深圳威派森电磁科技有限公司 | Inductance value test circuit |
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