CN116710958A - 对检查对象中包含的异物进行检测的方法及装置 - Google Patents

对检查对象中包含的异物进行检测的方法及装置 Download PDF

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Publication number
CN116710958A
CN116710958A CN202280009183.6A CN202280009183A CN116710958A CN 116710958 A CN116710958 A CN 116710958A CN 202280009183 A CN202280009183 A CN 202280009183A CN 116710958 A CN116710958 A CN 116710958A
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image data
foreign object
pixel
image
condition
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CN202280009183.6A
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English (en)
Chinese (zh)
Inventor
西尾和晃
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Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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Publication of CN116710958A publication Critical patent/CN116710958A/zh
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00Prospecting or detecting by optical means
    • G01V8/10Detecting, e.g. by using light barriers
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00Geometric image transformations in the plane of the image
    • G06T3/40Scaling of whole images or parts thereof, e.g. expanding or contracting
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10024Color image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10032Satellite or aerial image; Remote sensing
    • G06T2207/10036Multispectral image; Hyperspectral image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30128Food products

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN202280009183.6A 2021-01-26 2022-01-18 对检查对象中包含的异物进行检测的方法及装置 Pending CN116710958A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-010386 2021-01-26
JP2021010386 2021-01-26
PCT/JP2022/001492 WO2022163421A1 (ja) 2021-01-26 2022-01-18 検査対象に含まれる異物を検出する方法および装置

Publications (1)

Publication Number Publication Date
CN116710958A true CN116710958A (zh) 2023-09-05

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CN202280009183.6A Pending CN116710958A (zh) 2021-01-26 2022-01-18 对检查对象中包含的异物进行检测的方法及装置

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Country Link
US (1) US20230419478A1 (https=)
JP (1) JP7811739B2 (https=)
CN (1) CN116710958A (https=)
WO (1) WO2022163421A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7649952B2 (ja) * 2021-07-28 2025-03-24 パナソニックIpマネジメント株式会社 検査方法および検査装置
WO2024053302A1 (ja) * 2022-09-08 2024-03-14 パナソニックIpマネジメント株式会社 情報処理方法および撮像システム
JP7375963B1 (ja) * 2023-01-06 2023-11-08 株式会社サタケ トレーサビリティシステム

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JP2005094185A (ja) * 2003-09-16 2005-04-07 Konica Minolta Holdings Inc 画像処理システム、画像処理装置、および撮像制御方法
JP2007178407A (ja) * 2005-12-28 2007-07-12 Yamatake Corp 検査対象物の異物混入検査方法及びこれに用いる異物混入検査装置
CN105611117A (zh) * 2014-11-19 2016-05-25 松下知识产权经营株式会社 摄像装置以及分光系统
JP2016105084A (ja) * 2014-11-21 2016-06-09 和歌山県 食品検査装置
US20180100810A1 (en) * 2016-10-10 2018-04-12 Altria Client Services Llc Method and system of detecting foreign materials within an agricultural product stream
JP2018146251A (ja) * 2017-03-01 2018-09-20 株式会社Hielero 異物検出システム、異物検出方法、及びそのプログラム
JP6397952B1 (ja) * 2017-03-31 2018-09-26 西日本電信電話株式会社 画像処理装置、画像処理方法及びコンピュータプログラム
JP2020094955A (ja) * 2018-12-14 2020-06-18 セイコーエプソン株式会社 欠陥検出装置、及び欠陥検出方法
CN112218729A (zh) * 2018-06-11 2021-01-12 克里奥瓦克公司 用于检测外来物品的产品流的内置检查的过程和系统

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JP2011141809A (ja) * 2010-01-08 2011-07-21 Sumitomo Electric Ind Ltd 画像データ分析装置及び画像データ分析方法
JP2013164338A (ja) * 2012-02-10 2013-08-22 Sumitomo Electric Ind Ltd 植物または植物加工品の異物検出方法
JP6542477B2 (ja) * 2016-08-22 2019-07-10 キユーピー株式会社 食品検査装置、食品検査方法及び食品検査装置の識別手段の学習方法
US10902581B2 (en) * 2017-06-19 2021-01-26 Apeel Technology, Inc. System and method for hyperspectral image processing to identify foreign object
US12020493B2 (en) * 2018-07-27 2024-06-25 Ventana Medical Systems, Inc. Systems for automated in situ hybridization analysis
JP7720532B2 (ja) * 2020-03-26 2025-08-08 パナソニックIpマネジメント株式会社 信号処理方法、信号処理装置、および撮像システム
WO2021246192A1 (ja) * 2020-06-05 2021-12-09 パナソニックIpマネジメント株式会社 信号処理方法、信号処理装置、および撮像システム
US12443173B2 (en) * 2021-10-12 2025-10-14 Royal Engineered Composites, Inc. Systems and methods for composite fabrication with AI quality control modules

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005094185A (ja) * 2003-09-16 2005-04-07 Konica Minolta Holdings Inc 画像処理システム、画像処理装置、および撮像制御方法
JP2007178407A (ja) * 2005-12-28 2007-07-12 Yamatake Corp 検査対象物の異物混入検査方法及びこれに用いる異物混入検査装置
CN105611117A (zh) * 2014-11-19 2016-05-25 松下知识产权经营株式会社 摄像装置以及分光系统
JP2016105084A (ja) * 2014-11-21 2016-06-09 和歌山県 食品検査装置
US20180100810A1 (en) * 2016-10-10 2018-04-12 Altria Client Services Llc Method and system of detecting foreign materials within an agricultural product stream
JP2018146251A (ja) * 2017-03-01 2018-09-20 株式会社Hielero 異物検出システム、異物検出方法、及びそのプログラム
JP6397952B1 (ja) * 2017-03-31 2018-09-26 西日本電信電話株式会社 画像処理装置、画像処理方法及びコンピュータプログラム
CN112218729A (zh) * 2018-06-11 2021-01-12 克里奥瓦克公司 用于检测外来物品的产品流的内置检查的过程和系统
JP2020094955A (ja) * 2018-12-14 2020-06-18 セイコーエプソン株式会社 欠陥検出装置、及び欠陥検出方法

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WO2022163421A1 (ja) 2022-08-04
JPWO2022163421A1 (https=) 2022-08-04
JP7811739B2 (ja) 2026-02-06
US20230419478A1 (en) 2023-12-28

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