CN116625640A - On-line testing method and system for irradiation under-plane array CCD - Google Patents
On-line testing method and system for irradiation under-plane array CCD Download PDFInfo
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Abstract
The invention relates to a radiation effect test system and method, in particular to an on-line test method and test system for an irradiation lower array CCD, which solves the technical problems that the working condition of the area array CCD cannot be fed back on line in real time and the real-time change rule of performance parameters in the irradiation process can not be realized when an area array CCD radiation damage effect ground simulation experiment is carried out. The method for testing the CCD of the irradiation lower array on line can solve the problem of complicated test when carrying out the ground simulation experiment of the CCD radiation damage effect, improves the experimental efficiency, and can acquire the performance parameters of the CCD of the area array in the irradiation process; a CCD driving circuit is arranged on the radiation plate; the radiation source and the light source are arranged on an emergent light path, a CCD device to be irradiated is arranged on the emergent light path, and a CCD driving circuit is connected with the CCD device to be irradiated.
Description
Technical Field
The invention relates to a radiation effect test system and a radiation effect test method, in particular to an on-line test method and a test system for an irradiation array CCD.
Background
A charge-coupled device (CCD) is a photoelectric image sensor that generates charges by light injection or electron injection, stores the charges by biasing a gate of the device, and transfers and outputs the charges by using a depletion layer coupling principle and an output amplifier, and has advantages of small size, light weight, low power consumption, high quantum efficiency, high image resolution, and wide dynamic range, and is widely used in fields of space exploration, space scanning, satellite observation, and the like. However, due to the specificity of the spatial environment, when the CCD is applied to an in-orbit satellite or space imaging system, the CCD may generate performance degradation or even functional failure phenomenon caused by irradiation damage. Radiation damage effects of CCDs generally include total dose effects, displacement effects, and single event transient effects.
High-energy particles such as protons, electrons, heavy ions and the like in the space environment can induce radiation damage effect of the CCD, so that the performance parameters of the CCD are degraded, and the normal operation of the CCD is further influenced, and even the internal structure of the CCD is damaged. Therefore, the development of CCD radiation damage effect ground simulation experiments has important significance for researching CCD radiation damage mechanism and CCD radiation-resistant reinforcement design. When the CCD is subjected to ground simulation experiments, the volume of the conventional test system is too large, and the post-irradiation test of the CCD is an off-line test, namely, the tested CCD is required to be taken out after the irradiation dose is accumulated to a target dose point, and the CCD is put into an irradiation room again for irradiation after the test is finished, so that great inconvenience is brought to the irradiation experiments, and the real-time change rule of the parameters in the irradiation process cannot be obtained.
Disclosure of Invention
The invention aims to solve the technical problem that the working condition of an area array CCD (charge coupled device) cannot be fed back in real time on line and the real-time change rule of performance parameters in the irradiation process when an area array CCD radiation damage effect ground simulation experiment is carried out, and provides an on-line test method and a test system for the irradiated area array CCD, which can effectively reduce the complexity of the test and the risk of experimenters when the traditional test system carries out the area array CCD radiation damage effect ground simulation experiment, thereby improving the experiment efficiency.
In order to solve the technical problems, the invention adopts the following technical scheme:
the on-line testing method of the irradiation array CCD is characterized by comprising the following steps of:
1) Preparation before test
1.1, arranging a CCD device to be irradiated on an emergent path of a radiation source;
1.2, setting the experimental environment temperature;
1.3, constructing a light source in an experimental environment, and enabling a photosensitive surface of the CCD device to be irradiated to be positioned on an emergent light path of the light source;
2) Testing performance parameters of CCD device to be irradiated before irradiation
Setting the integration time of the CCD device to be irradiated, starting a light source, collecting the first parameters of the CCD device to be irradiated for N times before irradiation, and storing; n is an integer greater than 1; the first parameter includes a linear saturated output and a total gain;
2.2, removing extremum of all pixels in the first parameter collected each time, and then averaging to obtain a performance parameter change curve before irradiation;
2.3, judging whether the CCD device to be irradiated works stably or not according to whether the performance parameter change curve before irradiation is stable or not;
if the CCD device to be irradiated works stably, the light source is turned off, the light source intensity is recorded, and the step 3) is executed;
if the CCD device to be irradiated works unstably, adjusting the integration time of the CCD device to be irradiated, and returning to the step 2.1;
3) Testing performance parameters of CCD device to be irradiated under irradiation
3.1, starting a radiation source and a light source with equal intensity before irradiation, collecting second parameters of the CCD device to be irradiated after irradiation for n times, and storing; n is an integer greater than 1; the second parameter includes a linear saturated output and a total gain;
3.2, removing extreme values of all pixels in the irradiated second parameter, and then averaging to obtain a performance parameter change curve of the irradiated CCD device;
3.3, judging whether the CCD device to be irradiated is damaged or not according to whether the performance parameter change curve after irradiation is stable or not;
if the CCD device to be irradiated is damaged, the radiation source and the light source are turned off, the CCD device to be irradiated is marked to be damaged, the step 1) is returned, and the subsequent work is continued;
if the CCD device to be irradiated is not damaged, the performance parameters of the CCD device to be irradiated after irradiation are stored, and the on-line test of the CCD under irradiation is completed.
Further, step 4) is also included:
and comparing the performance parameter change curve after irradiation with the performance parameter change curve before irradiation to obtain the influence of irradiation on the performance parameters of the CCD device to be irradiated.
Further, in step 2.1, the integration time of the CCD device to be irradiated is set by the upper computer.
Further, step 1.1 specifically includes:
after wiping the photosensitive surface of the CCD device to be irradiated, setting the beam direction of the radiation source to be perpendicular to the photosensitive surface of the CCD device to be irradiated.
Further, the step 1.3 specifically comprises:
and constructing a light source in an experimental environment, so that the light sensitive surface of the CCD device to be irradiated is perpendicular to the emergent light path of the light source.
Further, in step 2.3, whether the characteristic change curve is stable or not according to the pre-irradiation performance parameter is specifically:
judging whether the error between the linear saturated output parameters collected each time is +/-1000 DN and whether the error between the total gain parameters collected each time is +/-0.05 DN/e - ；
In step 3.3, the step of determining whether the performance parameter change curve is stable according to the irradiation is specifically as follows:
judging whether the error between the linear saturated output parameters collected each time is +/-1000 DN and whether the error between the total gain parameters collected each time is +/-0.05 DN/e - 。
Further, in step 1.2, the experimental ambient temperature is 25 ° ± 5 °;
in the step 2.1, the value of N is 30;
in step 3.1, n has a value of 100.
Meanwhile, the invention also provides an on-line testing system of the irradiation array CCD, which is used for realizing the on-line testing method of the irradiation array CCD, and is characterized in that: the device comprises a radiation source, a light source, a driving controller, an irradiation plate and an acquisition processor, wherein the radiation source, the light source, the driving controller, the irradiation plate and the acquisition processor are arranged outside an irradiation room and connected with the driving controller;
a CCD driving circuit is arranged on the irradiation plate;
the outside of the driving controller is provided with a signal shielding box
The radiation source and the light source are arranged on an emergent light path, a CCD device to be irradiated is arranged on the emergent light path, and a CCD driving circuit is connected with the CCD device to be irradiated;
the driving controller comprises an A/D conversion module and an FPGA main control module;
the FPGA main control module is respectively connected with the CCD driving circuit, the A/D conversion module and the acquisition processor;
the A/D conversion module is connected with the CCD device to be irradiated;
the A/D conversion module is used for carrying out double sampling treatment on an original CCD analog signal of the CCD device to be irradiated, converting the original CCD analog signal into a digital signal and transmitting the digital signal to the FPGA main control module;
the FPGA main control module is used for generating a time sequence driving signal meeting the voltage requirement of the CCD device to be irradiated and transmitting the digital signal to the acquisition processor;
the CCD driving circuit is used for converting the time sequence driving signal into a CCD driving signal so as to drive the CCD device to be irradiated.
Further, the device also comprises a light source moving motor connected with the light source and used for controlling the up-down position of the light source;
and a CCD socket connected with the CCD driving circuit is also arranged on the irradiation plate.
Further, the device also comprises a motion motor connected with the irradiation plate and used for adjusting the position of the CCD device to be irradiated by driving the irradiation plate.
Compared with the prior art, the technical scheme of the invention has the beneficial effects that:
1. the method for testing the CCD of the area array on line under irradiation can solve the problem of complicated test when carrying out the ground simulation experiment of the CCD radiation damage effect, improves the experimental efficiency, can acquire the performance parameters of the CCD of the area array in the irradiation process, and provides experimental test technical support for researching the radiation damage mechanism of the CCD of the area array and the radiation-resistant reinforcement design of the CCD of the area array.
2. The on-line testing system for the irradiation array CCD below adopts the design mode of separating the irradiation plate from the sub-mother plate of the drive controller, can effectively reduce the influence of the radiation source on the drive controller and ensures the stable operation of the system.
3. According to the on-line testing system for the irradiation lower array CCD, the acquisition processor is arranged outside the irradiation chamber, so that remote transmission and communication can be realized, a system connection mode is simplified, the acquisition processor for receiving data can be positioned at a safe position to avoid the influence of irradiation, the remote operation of an experimenter on the testing system in a safe environment is realized through the remote control function of the acquisition processor, the frequency of the experimenter entering the irradiation chamber is reduced, the danger of the experimenter is effectively reduced, and the problem of on-line measurement of the array CCD after the ground radiation damage effect simulation irradiation experiment is solved.
4. According to the on-line testing system for the irradiation lower array CCD, the FPGA main control module is arranged in the signal shielding box during experiments, so that the influence of a radiation source on signal processing is reduced, and the stable operation of the system is ensured.
Drawings
FIG. 1 is a schematic diagram of an embodiment of an on-line testing system for an illuminated area array CCD of the present invention;
FIG. 2 is a control block diagram of a drive controller in an embodiment of an on-line testing system for an illuminated area array CCD of the present invention;
FIG. 3 is a flow chart of an embodiment of an on-line testing method of an illuminated area array CCD according to the present invention.
The reference numerals in the drawings are:
the device comprises a 1-radiation source, a 2-light source, a 3-light source mobile motor, a 4-CCD image sensor, a 5-irradiation plate, a 51-CCD socket, a 52-CCD driving circuit, a 6-motion motor, a 7-driving controller, a 71-A/D conversion module, a 72-FPGA main control module, an 8-signal shielding box, a 9-flexible flat cable, a 10-USB data line and an 11-acquisition processor.
Detailed Description
The following description of the embodiments of the present invention will be made apparent and complete in conjunction with the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the present invention. Based on the technical solutions of the present invention, all other embodiments obtained by a person skilled in the art without making any creative effort fall within the protection scope of the present invention.
As shown in fig. 1, the on-line testing system of the irradiation lower array CCD comprises a radiation source 1, a light source 2, a light source moving motor 3, an irradiation plate 5, a moving motor 6, a driving controller 7, a signal shielding box 8 and an acquisition processor 11 which is arranged outside the irradiation chamber and connected with the driving controller 7.
As shown in fig. 2, the irradiation board 5 is provided with a CCD socket 51 and a CCD driving circuit 52; the driving controller 7 is externally provided with a signal shielding box 8; the CCD device to be irradiated is positioned on the emergent light paths of the radiation source 1 and the light source 2 and is connected with a CCD driving circuit 52 through a CCD socket 51; the drive controller 7 comprises an A/D conversion module 71 and an FPGA main control module 72; the FPGA main control module 72 is respectively connected with the CCD driving circuit 52, the A/D conversion module 71 and the acquisition processor 11; the a/D conversion module 71 is connected to the CCD device to be irradiated.
The radiation source 1 is used for inducing radiation damage to the CCD device to be irradiated. The light source 2 provides a stable and uniform light source 2 for the CCD device to be irradiated; the light source moving motor 3 is used to control the position of the light source 2 so that the light source 2 can move up and down. The movement motor 6 is used to drive the position of the irradiation plate 5 so that the irradiation plate 5 can move up and down and left and right. In the experiment, the CCD device to be irradiated can be arranged on the CCD socket 51, and the light source 2, the radiation source 1 and the irradiation plate 5 are kept at the same horizontal position, so that the beam of the radiation source 1 and the emergent light of the light source 2 vertically irradiate on the CCD device to be irradiated. The CCD device to be irradiated completes image acquisition under the drive of a time sequence driving signal, and outputs an original CCD analog signal; the CCD driving circuit 52 is used for converting a time sequence driving signal generated by the FPGA main control module 72 into a time sequence driving signal meeting the voltage requirement of the CCD device to be irradiated.
The a/D conversion module 71 includes an analog signal preprocessing circuit and an analog-to-digital conversion circuit; the analog signal preprocessing circuit comprises a constant current driving circuit and a filtering amplifying circuit, performs pre-filtering, signal amplification, dark level clamping and denoising related double sampling processing on an input original CCD analog signal, and converts the original CCD analog signal output by the CCD device to be irradiated into a digital signal through an analog-to-digital conversion circuit in the A/D conversion module 71 to be transmitted to the FPGA main control module 72.
The FPGA main control module 72 is the core of the system of the present invention, and is used for generating a time sequence driving signal meeting the voltage requirement of the CCD device to be irradiated, providing a clamping and sampling/holding pulse signal required by a/D processing of the original CCD analog signal, and simultaneously buffering image data by using a built-in memory resource and transmitting the image data to the acquisition processor 11.
When an irradiation experiment is carried out, the driving controller 7 is arranged in the signal shielding box 8, and the signal shielding box 8 is used for shielding the influence of the radiation source 1 on the driving controller 7, so that the driving controller 7 is arranged in an irradiation chamber, the transmission distance between the irradiation plate 5 and the driving controller 7 is reduced, and the stable operation of the system is ensured. The irradiation board 5 is connected with the A/D conversion module 71 and the FPGA main control module 72 through the flexible flat cable 9, and the drive time sequence signal provided by the FPGA main control module 72 is converted by the CCD drive circuit 52 to obtain the drive time sequence signal meeting the voltage requirement of the CCD device to be irradiated, and the CCD is controlled to output an original CCD analog signal and is converted into quantized digital data through the A/D conversion module 71. The driving controller 7 transmits the collected quantized digital data to the upper computer through the USB data line 10 for processing and storage.
In this embodiment, the bit-embedded and sample/hold pulse signals required by the conversion process of the CCD driving time sequence and the a/D conversion module 71 in the driving controller 7 are all realized by the FPGA master control module 72 through Verilog HDL hardware description language programming, the CCD driving time sequence uses the external system clock source of the FPGA master control module 72 as the reference clock, and the internal phase-locked loop is utilized to double the frequency and then the frequency is divided by the counter by decimal to obtain the time sequence driving signal meeting the time sequence requirement of each path of the CCD; the a/D conversion module 71 needs the FPGA main control module 72 to provide correct register configuration data and sampling clock signals meeting timing requirements, so that normal operation of the a/D conversion module can be ensured, the internal registers are set by the FPGA main control module 72 through three-wire serial ports, setting of functions such as input clamping, analog-to-digital conversion, related double sampling and the like is achieved, an external system clock of the FPGA main control module 72 is used as a reference clock, and the counter is used for frequency division to obtain timing signals meeting timing requirements of each path of the a/D conversion module 71.
Specifically, the CCD device to be irradiated adopts the area array CCD image sensor 4, the collecting processor 11 selects the upper computer, the driving time sequence generated by the FPGA main control module 72 obtains the time sequence driving signal meeting the voltage requirement of the CCD image sensor 4 through the CCD driving circuit 52 module, the CCD image sensor 4 outputs the original analog signal under the action of the time sequence driving signal, the a/D conversion module 71 filters, denoises and analog-to-digital converts the original analog signal, the obtained digital data is buffered in the internal storage resource of the FPGA main control module 72, and the collected digital data is transmitted to the upper computer through the USB chip and the interface, and the CCD performance parameter is obtained after the processing of the upper computer.
As shown in FIG. 3, the method for testing the irradiation of the array CCD on line by using the system of the invention specifically comprises the following steps:
step one, preparation before test
1.1, wiping the photosurface of the CCD image sensor 4, and enabling the beam direction of the radiation source 1 to be perpendicular to the photosurface of the CCD image sensor 4;
1.2, controlling the experimental environment temperature to be 25 degrees+/-5 degrees, and controlling the influence of the temperature on the performance parameters of the CCD image sensor 4;
1.3, constructing a visible light source 2 in an irradiation room, so that emergent light of the light source 2 can irradiate a light sensitive surface of the CCD image sensor 4, and ensuring that the CCD image sensor 4 works under a uniform illumination condition during testing;
step two, testing the performance parameters of the CCD device to be irradiated before irradiation
2.1, setting the integration time of the CCD device to be irradiated through an upper computer, starting a light source 2, collecting the first parameter before the CCD device to be irradiated is irradiated for 30 times, and storing the first parameter. The first parameter includes a linear saturated output and a total gain;
2.2, removing extremum of all pixels in the first parameter collected each time, and then averaging to obtain a performance parameter change curve before irradiation;
2.3, judging whether the CCD image sensor 4 works stably according to the performance parameter change curve before irradiation;
if the CCD device to be irradiated works stably, the light source 2 is turned off, the intensity of the light source 2 is recorded, and the step 3) is executed;
if the CCD device to be irradiated works unstably, adjusting the integration time of the CCD device to be irradiated, and returning to the step 2.1;
step three, testing the performance parameters of the CCD device to be irradiated under irradiation
3.1, starting the radiation source 1 and the light source 2 with equal intensity before irradiation, collecting the second parameters after irradiation of the CCD device to be irradiated for 100 times, and storing; the second parameter includes a linear saturated output and a total gain;
3.2, removing extreme values of all pixels in the irradiated second parameter, and then averaging to obtain a performance parameter change curve of the irradiated CCD device;
3.3, judging whether the CCD device to be irradiated is damaged or not according to whether the performance parameter change curve after irradiation is stable or not;
if the CCD device to be irradiated is damaged, the radiation source 1 and the light source 2 are turned off, the CCD device to be irradiated is marked to be damaged, the step 1) is returned, and the subsequent work is continued;
if the CCD device to be irradiated is not damaged, the performance parameters of the CCD device to be irradiated after irradiation are stored, and the on-line test of the CCD under irradiation is completed.
Step four, comparison
And comparing the performance parameter change curve after irradiation with the performance parameter change curve before irradiation to obtain the influence of irradiation on the performance parameters of the CCD device to be irradiated.
In this embodiment, in step 2.3, according to whether the performance parameter change curve before irradiation is stable or not, the method specifically comprises: when the error between the linear saturated output parameters of each acquisition is +/-1000 DN, and the error between the total gain parameters of each acquisition is +/-0.05 DN/e - The change curve of the performance parameter before irradiation is stable. In the step 3.3, according to whether the performance parameter change curve after irradiation is stable or not, the method specifically comprises the following steps: when the error between the linear saturated output parameters of each acquisition is +/-1000 DN, and the error between the total gain parameters of each acquisition is +/-0.05 DN/e - And (3) a performance parameter change curve after irradiation.
The method for testing the irradiation lower array CCD on line can effectively reduce the complexity of testing and the risk of experimenters when the traditional testing system develops the radiation damage effect ground irradiation simulation experiment of the CCD image sensor 4, thereby improving the experimental efficiency and acquiring the radiation performance parameters of the CCD image sensor 4 in the irradiation process; meanwhile, the system adopts the design scheme of the sub-mother board with the irradiation plate 5 and the driving controller 7 separated, so that the influence of the radiation source 1 on the driving controller 7 can be effectively reduced, and the stable operation of the system is ensured.
Claims (10)
1. An on-line testing method of an irradiation array CCD is characterized by comprising the following steps:
1) Preparation before test
1.1, arranging a CCD device to be irradiated on an emergent path of a radiation source (1);
1.2, setting the experimental environment temperature;
1.3, constructing a light source (2) in an experimental environment, and enabling a photosensitive surface of the CCD device to be irradiated to be positioned on an emergent light path of the light source (2);
2) Testing performance parameters of CCD device to be irradiated before irradiation
2.1, setting the integration time of the CCD device to be irradiated, starting a light source (2), collecting the first parameters of the CCD device to be irradiated for N times before irradiation, and storing; n is an integer greater than 1; the first parameter includes a linear saturated output and a total gain;
2.2, removing extremum of all pixels in the first parameter collected each time, and then averaging to obtain a performance parameter change curve before irradiation;
2.3, judging whether the CCD device to be irradiated works stably or not according to whether the performance parameter change curve before irradiation is stable or not;
if the CCD device to be irradiated works stably, the light source (2) is turned off, the intensity of the light source (2) is recorded, and the step 3) is executed;
if the CCD device to be irradiated works unstably, adjusting the integration time of the CCD device to be irradiated, and returning to the step 2.1;
3) Testing performance parameters of CCD device to be irradiated under irradiation
3.1, starting a radiation source (1) and a light source (2) with equal intensity before irradiation, collecting second parameters of the CCD device to be irradiated after irradiation for n times, and storing; n is an integer greater than 1; the second parameter includes a linear saturated output and a total gain;
3.2, removing extreme values of all pixels in the irradiated second parameter, and then averaging to obtain a performance parameter change curve of the irradiated CCD device;
3.3, judging whether the CCD device to be irradiated is damaged or not according to whether the performance parameter change curve after irradiation is stable or not;
if the CCD device to be irradiated is damaged, the radiation source (1) and the light source (2) are turned off, the CCD device to be irradiated is marked to be damaged, the step 1) is returned, and the subsequent work is continued;
if the CCD device to be irradiated is not damaged, the performance parameters of the CCD device to be irradiated after irradiation are stored, and the on-line test of the CCD under irradiation is completed.
2. The method for on-line testing of an illuminated area array CCD according to claim 1, further comprising step 4):
and comparing the performance parameter change curve after irradiation with the performance parameter change curve before irradiation to obtain the influence of irradiation on the performance parameters of the CCD device to be irradiated.
3. An on-line testing method for irradiating an underlying array CCD according to claim 2, wherein:
in step 2.1, the integration time of the CCD device to be irradiated is set through the upper computer.
4. An on-line testing method for irradiating an underlying array CCD according to claim 3, wherein step 1.1 specifically comprises:
after wiping the photosensitive surface of the CCD device to be irradiated, setting the beam direction of the radiation source (1) to be perpendicular to the photosensitive surface of the CCD device to be irradiated.
5. The method for on-line testing of an irradiation array CCD according to claim 4, wherein the step 1.3 is specifically:
and constructing a light source (2) in an experimental environment, so that the light sensitive surface of the CCD device to be irradiated is perpendicular to an emergent light path of the light source (2).
6. The method for on-line testing of an illuminated area array CCD according to claim 5, wherein:
in step 2.3, the step of determining whether the performance parameter change curve is stable or not according to the irradiation is specifically as follows:
judging whether the error between the linear saturated output parameters collected each time is +/-1000 DN and whether the error between the total gain parameters collected each time is +/-0.05 DN/e - ；
In step 3.3, the step of determining whether the performance parameter change curve is stable according to the irradiation is specifically as follows:
judging whether the error between the linear saturated output parameters collected each time is +/-1000 DN, and collecting each timeWhether the error between the total gain parameters of the set is + -0.05 DN/e - 。
7. The method for on-line testing of an illuminated area array CCD according to claim 6, wherein:
in the step 1.2, the experimental environment temperature is 25 degrees plus or minus 5 degrees;
in step 2.1, the value of N is 30;
in step 3.1, the value of n is 100.
8. An on-line testing system for an irradiation-based planar array CCD, for implementing the on-line testing method for an irradiation-based planar array CCD according to any one of claims 1 to 6, characterized in that: comprises a radiation source (1), a light source (2), a driving controller (7), an irradiation plate (5) and an acquisition processor (11) which is arranged outside the irradiation chamber and connected with the driving controller (7);
a CCD driving circuit (52) is arranged on the irradiation plate (5);
a signal shielding box (8) is arranged outside the driving controller (7);
the outgoing light paths of the radiation source (1) and the light source (2) are used for arranging CCD devices to be irradiated, and the CCD driving circuit (52) is connected with the CCD devices to be irradiated;
the driving controller (7) comprises an A/D conversion module (71) and an FPGA main control module (72);
the FPGA main control module (72) is respectively connected with the CCD driving circuit (52), the A/D conversion module (71) and the acquisition processor (11);
the A/D conversion module (71) is connected with the CCD device to be irradiated;
the A/D conversion module (71) is used for carrying out double sampling treatment on an original CCD analog signal of the CCD device to be irradiated, converting the original CCD analog signal into a digital signal and transmitting the digital signal to the FPGA main control module (72);
the FPGA main control module (72) is used for generating a time sequence driving signal meeting the voltage requirement of the CCD device to be irradiated and transmitting the digital signal to the acquisition processor (11);
the CCD driving circuit (52) is used for converting the time sequence driving signal into a CCD driving signal so as to drive the CCD device to be irradiated.
9. An on-line testing system for irradiating an underlying array CCD according to claim 8, wherein:
the light source moving motor (3) is connected with the light source (2) and is used for controlling the up-down position of the light source (2);
and a CCD socket (51) connected with a CCD driving circuit (52) is also arranged on the irradiation plate (5).
10. An on-line testing system for irradiating an underlying array CCD according to claim 9, wherein:
the device also comprises a motion motor (6) connected with the irradiation plate (5) and used for adjusting the position of the CCD device to be irradiated by driving the irradiation plate (5) to move up and down.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310442820.5A CN116625640A (en) | 2023-04-23 | 2023-04-23 | On-line testing method and system for irradiation under-plane array CCD |
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