CN116400143A - Method, equipment and medium for sampling plane near field data - Google Patents
Method, equipment and medium for sampling plane near field data Download PDFInfo
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Abstract
The application discloses a sampling method, equipment and medium of plane near field data, which relate to the technical field of data acquisition, and the method comprises the following steps: determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe; determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates; and carrying out data sampling on the antenna according to the data sampling points through the sampling probe. The circular motion of the antenna to be tested is used, the sampling probe moves in an arc mode around one point, one end of the arc is the circle center of the antenna to be tested, and bidirectional sampling is achieved. Meanwhile, in order to meet the requirement that the sampling points accord with matrix point distribution, near-far field transformation sampling points which actually need to meet rectangular distribution are obtained through a sampling point Lagrange plane interpolation method, namely, the testing efficiency is improved on the basis of not losing testing precision, and meanwhile, the cost of sampling equipment is greatly reduced.
Description
Technical Field
The present disclosure relates to the field of data acquisition technologies, and in particular, to a method, an apparatus, and a medium for sampling planar near field data.
Background
Antenna pattern measurements are classified into far field measurements and near field measurements. The far field measurement belongs to direct measurement, the amplitude and phase information of the antenna far field pattern vector electric field is directly obtained through a microwave instrument, and the information is directly drawn into the needed amplitude and phase pattern shape. Near field measurement belongs to indirect measurement, and the near field measurement needs to sample amplitude phase data of the near field of an antenna through a microwave instrument and then transform the amplitude phase data into amplitude phase data of a far field through Fourier transformation, so that a far field pattern is obtained. The near field measurement is divided into planar near field measurement, cylindrical near field measurement and spherical near field measurement, the three planar measurement are suitable for different types of antenna patterns, and the antenna patterns can be represented by two orthogonal tangential planes of azimuth and pitching. Planar near field measurements with narrow beams if the patterns of both directions are; if the pattern of one direction is a narrow beam and the pattern of one direction is a wide beam, cylindrical near field measurement is used; spherical near field measurements are used if the patterns of both directions are broad beam.
At present, a planar near field in the market is to establish a two-dimensional plane in front of an antenna to be detected, travel a matrix-form sampling point matrix on the two-dimensional plane on the basis of meeting the Nyquist sampling theorem, and the near-far field transformation can be met only by distributing sampling points in a square shape, sampling is performed point by point on the sampling matrix points by using a sampling probe, if the sampling point is 100 multiplied by 100, the sampling probe needs to walk 10000 sampling points through a two-dimensional sampling scanning frame, and the sampling scheme is slow in speed and low in efficiency.
Disclosure of Invention
In order to solve the above problems, the present application proposes a method for sampling planar near field data, which is applied to a system for sampling planar near field data, where the system includes an antenna and a sampling probe; the method comprises the following steps: determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe; determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates; and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
In one example, determining the rotation track corresponding to the antenna specifically includes: determining a first circle center preset on the antenna, and determining a rotation interval of the antenna; determining corresponding rotary motion of the antenna according to the first circle center and the rotary interval; and determining a rotation track corresponding to the rotation motion.
In one example, determining the circular arc track corresponding to the sampling probe specifically includes: determining a second circle center preset on the sampling probe, and determining a following track of the second circle center according to the rotating track; determining a preset sampling quantity, and determining the circular arc motion of the sampling probe according to the following track and the sampling quantity; and determining the arc track corresponding to the arc motion.
In one example, determining sampling coordinates according to the rotation track and the arc track specifically includes: and determining an intersection point of the rotation track and the arc track, and determining the sampling coordinates according to the intersection point.
In one example, the method further comprises: determining the degree of the rotation interval, and determining the rotation times of the antenna according to the degree of the rotation interval; and determining single rotation time of the antenna, and determining the rotation time of the antenna according to the single rotation time and the rotation times.
In one example, the method further comprises: and determining single sampling time and sampling quantity of the sampling probe, and determining the sampling time of the sampling probe according to the rotation times, the single sampling time and the sampling quantity.
In one example, determining the preset number of samples specifically includes: determining the rotation times of the antenna, and determining the rotation sampling number of the sampling probe according to the rotation times; a center point of the rotational movement is determined and the number of samples is determined based on the number of rotational samples and the center point.
In one example, determining the circular arc motion of the sampling probe from the follow-up trajectory and the number of samples specifically includes: and determining the movement radius of the sampling probe according to the lever arm of the sampling probe and the lever arm so as to determine the circular arc movement according to the movement radius.
On the other hand, the application also provides a sampling device of the planar near field data, which is applied to a sampling system of the planar near field data, wherein the system comprises an antenna and a sampling probe; the apparatus comprises: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the planar near field data sampling device to perform: determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe; determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates; and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
In another aspect, the present application further proposes a non-volatile computer storage medium storing computer executable instructions for use in a planar near field data sampling system, the system comprising an antenna and a sampling probe; the computer-executable instructions are configured to: determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe; determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates; and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
The circular motion of the antenna to be tested is used, the sampling probe moves in an arc mode around one point, one end of the arc is the circle center of the antenna to be tested, and bidirectional sampling is achieved. Meanwhile, in order to meet the requirement that the sampling points accord with matrix point distribution, near-far field transformation sampling points which actually need to meet rectangular distribution are obtained through a sampling point Lagrange plane interpolation method, namely, the testing efficiency is improved on the basis of not losing testing precision, and meanwhile, the cost of sampling equipment is greatly reduced.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute an undue limitation to the application. In the drawings:
FIG. 1 is a schematic diagram of a principle of an inverted T-shaped sampling frame for realizing planar rectangular grid data point acquisition in an embodiment of the application;
FIG. 2 is a diagram of a sampling probe implementation plane rectangular grid data point acquisition path of an inverted T-shaped sampling frame in an embodiment of the present application;
fig. 3 is a schematic diagram of a calculation principle of a planar near-field acquisition formula in an embodiment of the present application;
FIG. 4 is a schematic diagram of a near field amplitude profile in an embodiment of the present application;
FIG. 5 is a schematic diagram of an amplitude profile of near field conversion to far field in an embodiment of the present application;
fig. 6 is a flow chart of a method for sampling planar near field data in an embodiment of the present application;
FIG. 7 is a schematic diagram illustrating the data point collection implemented by the axial movement of the antenna to be tested and the sampling probe in the embodiment of the present application;
FIG. 8 is a diagram of a path for implementing data point collection reciprocation by axial movement of both the antenna to be tested and the sampling probe in the embodiment of the present application;
fig. 9 is a schematic diagram of a planar near field data sampling device in an embodiment of the present application.
Detailed Description
For the purposes, technical solutions and advantages of the present application, the technical solutions of the present application will be clearly and completely described below with reference to specific embodiments of the present application and corresponding drawings. It will be apparent that the described embodiments are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The following describes in detail the technical solutions provided by the embodiments of the present application with reference to the accompanying drawings.
The planar near field antenna measurement technique is applicable to a strong directivity antenna, which generally refers to a "pen-shaped" beam antenna with a relatively narrow two-dimensional pattern of the antenna, and the pattern measurement of the antenna can be performed by adopting a planar near field method to measure the pattern of the antenna. As shown in fig. 1 below, the planar near field method typically utilizes an inverted "T" sampling gantry to effect acquisition of X-direction (lateral) and Y-direction (vertical) data of the plane.
As shown in fig. 2, during near field measurement, the antenna to be measured is stationary, after the sampling probe on the inverted T-shaped near field scanning sampling frame is stepped once at equal intervals on the X-axis, all sampling points on the Y-axis are stepped at equal intervals on the Y-axis, and then the X-axis moves to the next sampling interval point.
The planar near field test utilizes the principle of amplitude-phase distribution of a near field region and amplitude-phase distribution of a far field region of an antenna to obtain the amplitude-phase acquisition of a sampling probe in the near field region of the antenna by utilizing a planar near field sampling scanning frame and a microwave measurement system, and performs Fourier transform calculation on acquired amplitude-phase and position data to obtain the far field region distribution of the antenna, so that analysis on radiation parameters, gain and the like of a directional diagram of the antenna is realized.
A specific calculation principle of the antenna near field far field fourier transform is shown in fig. 3. According to the planar field theory, the output of the sampling probe is derived from the following formula:
wherein, the liquid crystal display device comprises a liquid crystal display device,
is the amplitude phase information output by the sampling waveguide, x, y and z are the spatial three-dimensional coordinate information of the probe>
Is distance information>
Is the planar spectrum of the antenna to be measured, < >>
Is the spectrum of the sampling probe. />
；/>
；
K is the Boltzmann constant, +.>
、/>
Is the spatial coordinate angle of the probe.
Therefore, the plane spectrum of the antenna to be measured can be derived by performing inverse Fourier transform on the left side and the right side:
where S is the flat spectrum of the probe. Finally, a far field pattern can be derived:
the near field amplitude distribution effect is shown in fig. 4, and the amplitude pattern result of the transformation to the far field is shown in fig. 5. The near field measurement acquisition data must be located in a rectangular grid coordinate system, which is a requirement for near-far field conversion. The above teaches the traditional planar near field data point acquisition method and the calculation principle of fourier transform to far field. The near field measurement of the antenna can be realized by the conventional method.
For example, when the antenna plane near field measurement is performed, a Ku band aperture-to-wavelength ratio is calculated at 20, the antenna to be measured needs to sample 100 amplitude phase data points at equal intervals on the X-axis, that is, 0.5 times of wavelength, and also needs to sample 100 amplitude phase data points at equal intervals on the Y-axis, that is, 0.5 times of wavelength, and then needs to collect 100×100=10000 sampling points, 100 sampling points on the Y-axis need to be moved 99 times, and then the X-axis is moved once again, so as to complete the first column data collection, as shown in fig. 2. Each time the moving time is 1s, the data acquisition is 100s, the data acquisition is 10000s, which is equivalent to about 2.78h, and the measurement of the antenna can be completed only in 3 hours.
The two-dimensional sampling frame needs to ensure the positioning precision of +/-0.01 mm to +/-0.05 mm and the flatness of +/-0.01 mm to +/-0.05 mm of a scanning plane of each axis of an X axis and a Y axis, wherein +/-0.01 mm is a requirement of 100GHz, and +/-0.05 mm is a requirement of 40 GHz. Firstly, the precision of the conventional sampling scanning frame is about +/-0.1 mm at present, and the use requirement is not met; secondly, although the high-precision scanning frame can be realized, the magnetic grating or the optical grating needs to be added to ensure the positioning precision, a Z axis needs to be added in the telescoping direction of the probe to ensure the flatness of the acquisition surface through telescoping compensation during testing, and the cost of the whole sampling frame is high after the whole sampling frame is realized; finally, the occupied space is large, secondary electromagnetic wave reflection is easy to cause, and the testing precision is affected.
In a word, the positioning accuracy of the X, Y axis of the sampling scanning frame is high by the traditional plane near-field measurement, the flatness requirement for forming flatness is high, the method can be realized, but the cost is extremely high, meanwhile, the occupied space is large, and the electromagnetic wave secondary reflection is easy to cause to influence the testing accuracy of the sampling probe.
As shown in fig. 6, in order to solve the above-mentioned problem, the method for sampling planar near field data provided in the embodiments of the present application is applied to a system for sampling planar near field data, as shown in fig. 7, where the system includes an antenna and a sampling probe; the method comprises the following steps:
s101, determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe.
In one embodiment, the antenna to be measured makes a spinning motion around the center of its rotation circular axis (referred to herein as the first center), the sampling probe is parallel to the port surface of the antenna to be measured, and makes a spinning motion around a designated center, i.e., follows a track. Therefore, the antenna to be tested and the sampling probe do axial movement, and the acquisition of near-field amplitude phase data is rapidly completed by utilizing the advantages of the rotation movement speed and the linear movement speed.
S102, determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates.
As shown in fig. 7 and 8, the antenna to be measured makes 360-degree rotation movement with its own axis as a center, and the sampling probe makes reciprocating circular arc movement around a set center (herein, the second center). The sampling probe collects the concentric ring of the antenna to be tested and the arc intersection point of the sampling probe as sampling points, and the required data collection is completed.
S103, data sampling is carried out on the antenna through the sampling probe according to the data sampling points.
In one embodiment, an antenna to be measured with the aperture wavelength ratio of the Ku wave band at 20 is sampled under the polar coordinate of the invention, and in order to ensure the interpolation precision, the antenna to be measured spins at intervals of 3 degrees, and spins 119 times in the case of 360 degrees, and the single rotation time is 0.1s; 120 points are collected by the sampling probe, because the center point is collected for 1 time, namely 119 points are collected each time except for the first time, the single time is 0.1s, the total collection time is 1416.2 s=23.6 min, the same antenna is tested by the sampling in less than half an hour, and the test efficiency is greatly improved.
In one embodiment, the single axis swing arm of the sampling probe is a machined part, the precision of which can ensure high machining precision through modern numerical control machining. The rotation of the antenna to be tested or the circular arc rotation of the sampling probe is axial movement, and the angular movement precision is controlled to be 0.01 DEG by a motor, so that the operation is easy. Compared with the linear precision of the motor drive speed reducer, the gear rack or the ball screw converted into the guide rail, the linear precision is easier to control and ensure. And the larger the X-axis and Y-axis dimensions of the inverted T-shaped scanning frame are, the larger the scanning frame is required to be large for a large antenna to be tested, and the more difficult the positioning accuracy and the flatness are ensured.
In one embodiment, the flatness can be ensured by machining a tool for erecting the antenna to be tested and a tool for swinging an arm sampling probe, once two circular motion planes are debugged, the flatness of the sampling frame is not changed, and the flatness under high precision needs to be adjusted by adding a Z axis.
In one embodiment, the inverted T-shaped sampling frame adopts a gear, rack structure or a ball and screw structure, and the motor is required to drive the gear rack or the ball screw to move N circles for linear movement so as to realize linear stepping on the linear guide rail, and the required time and the mode of the invention are relatively longer. The motor shaft is adopted to move in the embodiment, and for the same motor, the angle reaching speed is obviously higher than that of the linear movement. For example, when the linear motion is carried out for a distance of 1500mm, the sampling point is ensured to be uniform, acceleration and deceleration are required for starting and stopping, and under the condition of the motion speed of the precision, the time is generally required for 15 seconds; however, in the case of the shaft movement of 360 °, it generally takes 3 to 5 seconds, and since the motor is a direct action, the rotational angle positioning accuracy is more easily superior to the linear positioning accuracy.
In one embodiment, since the sampling points are not rectangular grid distribution, plane interpolation is needed to be performed on the sampling points to obtain numerical points needed by actual fast fourier transform, and a plurality of plane interpolation methods are adopted.
As shown in fig. 9, the embodiment of the application further provides a sampling device for planar near field data, which is applied to a sampling system for planar near field data, wherein the system comprises an antenna and a sampling probe; the device comprises:
at least one processor; the method comprises the steps of,
a memory communicatively coupled to the at least one processor; wherein, the liquid crystal display device comprises a liquid crystal display device,
the memory stores instructions executable by the at least one processor to enable the sampling device of the one planar near field data to perform:
determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe;
determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates;
and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
The embodiment of the application also provides a nonvolatile computer storage medium which stores computer executable instructions and is applied to a sampling system of planar near field data, wherein the system comprises an antenna and a sampling probe; the computer-executable instructions are configured to:
determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe;
determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates;
and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
All embodiments in the application are described in a progressive manner, and identical and similar parts of all embodiments are mutually referred, so that each embodiment mainly describes differences from other embodiments. In particular, for the apparatus and medium embodiments, the description is relatively simple, as it is substantially similar to the method embodiments, with reference to the section of the method embodiments being relevant.
The devices and media provided in the embodiments of the present application are in one-to-one correspondence with the methods, so that the devices and media also have similar beneficial technical effects as the corresponding methods, and since the beneficial technical effects of the methods have been described in detail above, the beneficial technical effects of the devices and media are not described in detail herein.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In one typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include volatile memory in a computer-readable medium, random Access Memory (RAM) and/or nonvolatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of computer-readable media.
Computer readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of storage media for a computer include, but are not limited to, phase change memory (PRAM), static Random Access Memory (SRAM), dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), read Only Memory (ROM), electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by a computing device. Computer-readable media, as defined herein, does not include transitory computer-readable media (transmission media), such as modulated data signals and carrier waves.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article or apparatus that comprises the element.
The foregoing is merely exemplary of the present application and is not intended to limit the present application. Various modifications and changes may be made to the present application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc. which are within the spirit and principles of the present application are intended to be included within the scope of the claims of the present application.
Claims (10)
1. A method for sampling planar near field data, which is characterized by being applied to a system for sampling planar near field data, wherein the system comprises an antenna and a sampling probe; the method comprises the following steps:
determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe;
determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates;
and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
2. The method according to claim 1, wherein determining the rotation track corresponding to the antenna specifically comprises:
determining a first circle center preset on the antenna, and determining a rotation interval of the antenna;
determining corresponding rotary motion of the antenna according to the first circle center and the rotary interval;
and determining a rotation track corresponding to the rotation motion.
3. The method according to claim 1, wherein determining the circular arc trajectory corresponding to the sampling probe specifically comprises:
determining a second circle center preset on the sampling probe, and determining a following track of the second circle center according to the rotating track;
determining a preset sampling quantity, and determining the circular arc motion of the sampling probe according to the following track and the sampling quantity;
and determining the arc track corresponding to the arc motion.
4. The method according to claim 1, characterized in that determining sampling coordinates from the rotation trajectory and the arc trajectory, in particular comprises:
and determining an intersection point of the rotation track and the arc track, and determining the sampling coordinates according to the intersection point.
5. The method according to claim 2, wherein the method further comprises:
determining the degree of the rotation interval, and determining the rotation times of the antenna according to the degree of the rotation interval;
and determining single rotation time of the antenna, and determining the rotation time of the antenna according to the single rotation time and the rotation times.
6. The method of claim 5, wherein the method further comprises:
and determining single sampling time and sampling quantity of the sampling probe, and determining the sampling time of the sampling probe according to the rotation times, the single sampling time and the sampling quantity.
7. A method according to claim 3, characterized in that determining the preset number of samples comprises in particular:
determining the rotation times of the antenna, and determining the rotation sampling number of the sampling probe according to the rotation times;
a center point of the rotational movement is determined and the number of samples is determined based on the number of rotational samples and the center point.
8. A method according to claim 3, characterized in that determining the circular arc motion of the sampling probe from the follow-up trajectory and the number of samples, in particular comprises:
and determining the movement radius of the sampling probe according to the lever arm of the sampling probe and the lever arm so as to determine the circular arc movement according to the movement radius.
9. A sampling device for planar near field data, characterized by being applied in a sampling system for planar near field data, said system comprising an antenna and a sampling probe; the apparatus comprises:
at least one processor; the method comprises the steps of,
a memory communicatively coupled to the at least one processor; wherein, the liquid crystal display device comprises a liquid crystal display device,
the memory stores instructions executable by the at least one processor to enable the sampling device of the one planar near field data to perform:
determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe;
determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates;
and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
10. A non-volatile computer storage medium storing computer executable instructions for use in a planar near field data sampling system, the system comprising an antenna and a sampling probe; the computer-executable instructions are configured to:
determining a rotation track corresponding to the antenna and determining an arc track corresponding to the sampling probe;
determining sampling coordinates according to the rotation track and the arc track, and determining data sampling points according to the sampling coordinates;
and carrying out data sampling on the antenna according to the data sampling points through a sampling probe.
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