CN117665414A

CN117665414A - Near field measurement method, device, terminal and readable storage medium

Info

Publication number: CN117665414A
Application number: CN202410129927.9A
Authority: CN
Inventors: 徐晨; 张书瀚; 秦一峰; 李飞鹏; 冯纪强; 钟勤
Original assignee: Shenzhen University
Current assignee: Shenzhen University
Priority date: 2024-01-31
Filing date: 2024-01-31
Publication date: 2024-03-08
Anticipated expiration: 2044-01-31
Also published as: CN117665414B

Abstract

The application is applicable to the field of electromagnetic field measurement, and provides a near field measurement method, a near field measurement device, a near field measurement terminal and a readable storage medium, wherein the method comprises the following steps: selecting a sampling plane in the near field region range of the target antenna to obtain a plurality of sampling planes to be divided; performing block division on each sampling plane to be divided based on electric field values of different points to obtain a target sampling plane with the sampling points reaching the preset point requirements; performing electric field interpolation processing of point positions on the target sampling plane to obtain interpolation electric field data; and calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolation electric field data of the target sampling planes. The scheme can improve the near-field measurement speed.

Description

Near field measurement method, device, terminal and readable storage medium

Technical Field

The application belongs to the field of electromagnetic field measurement, and particularly relates to a near field measurement method, a near field measurement device, a near field measurement terminal and a readable storage medium.

Background

Today, communication technology is rapidly developing, and the caliber and frequency of antennas are increasing. In measuring antenna near field data, if accuracy of the measured data is to be ensured, the number of sampling points needs to be correspondingly increased based on the increased caliber and frequency. However, as the number of sampling points increases, the sampling time increases, meaning that the measurement time increases and the measurement speed decreases. Therefore, a near field measurement method capable of improving the measurement speed is urgently needed.

Disclosure of Invention

The embodiment of the application provides a near field measurement method, a near field measurement device, a near field measurement terminal and a readable storage medium, so as to solve the problem of low measurement speed in the prior art.

A first aspect of an embodiment of the present application provides a near field measurement method, including:

selecting a sampling plane in the near field region range of the target antenna to obtain a plurality of sampling planes to be divided;

performing block division on each sampling plane to be divided based on electric field values of different points to obtain a target sampling plane with the sampling points reaching the preset point requirements;

performing electric field interpolation processing of point positions on the target sampling plane to obtain interpolation electric field data;

and calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolation electric field data of the target sampling planes.

A second aspect of embodiments of the present application provides a near field measurement apparatus, including:

the selecting module is used for selecting a sampling plane in the near field region range of the target antenna to obtain a plurality of sampling planes to be divided;

the block division module is used for dividing the blocks of each sampling plane to be divided based on the electric field values of different points to obtain a target sampling plane with the sampling points reaching the preset point requirements;

The interpolation module is used for carrying out electric field interpolation processing on the point positions of the target sampling plane to obtain interpolation electric field data;

and the calculation module is used for calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolation electric field data of the target sampling planes.

A third aspect of the embodiments of the present application provides a terminal comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the steps of the method according to the first aspect when executing the computer program.

A fourth aspect of the embodiments of the present application provides a computer-readable storage medium storing a computer program which, when executed by a processor, implements the steps of the method according to the first aspect.

A fifth aspect of the present application provides a computer program product for causing a terminal to carry out the steps of the method of the first aspect described above when the computer program product is run on the terminal.

From the above, the present application selects a sampling plane within a near field region of a target antenna to obtain a plurality of sampling planes to be divided, and performs block division on the plurality of sampling planes to be divided based on electric field values of different points, and after the block division, if the number of sampling points reaches a preset point requirement, the target sampling plane is obtained. And performing point-location electric field interpolation processing on the target sampling planes to obtain interpolation electric field data, and then calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolation electric field data of the plurality of target sampling planes. The method and the device have the advantages that the requirement of the preset point number is set, namely, the number of the sampling points is limited, the sampling time can be reduced, and the measuring speed is improved. Meanwhile, the sampling points are not selected at will, but the sampling points can be determined by combining electric field values of different points and dividing the sampling plane to be divided into blocks, so that more valuable sampling points are obtained, the data accuracy is improved, and meaningless measurement is avoided.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following description will briefly introduce the drawings that are needed in the embodiments or the description of the prior art, it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Fig. 1 is a flowchart of a near field measurement method according to an embodiment of the present application;

fig. 2 is a block division schematic diagram of a quarter method of a sampling plane to be divided according to an embodiment of the present application;

fig. 3 is a schematic plan view of sparse sampling according to an embodiment of the present application;

FIG. 4 is a schematic diagram of a fast Fourier iteration provided in an embodiment of the present application;

fig. 5 is a phase distribution contrast diagram of a horn antenna according to an embodiment of the present application;

fig. 6 is a phase distribution contrast diagram of a super-surface antenna according to an embodiment of the present application;

fig. 7 is a second flowchart of a near field measurement method according to an embodiment of the present application;

fig. 8 is a block diagram of a near field measurement device according to an embodiment of the present application;

fig. 9 is a block diagram of a terminal according to an embodiment of the present application.

Detailed Description

In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system configurations, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It is also to be understood that the terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.

It should be further understood that the term "and/or" as used in this specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.

As used in this specification and the appended claims, the term "if" may be interpreted in context as "when …" or "upon" or "in response to a determination" or "in response to detection. Similarly, the phrase "if a determination" or "if a [ described condition or event ] is detected" may be interpreted in the context of meaning "upon determination" or "in response to determination" or "upon detection of a [ described condition or event ]" or "in response to detection of a [ described condition or event ]".

In particular implementations, the terminals described in embodiments of the present application include, but are not limited to, other portable devices such as mobile phones, laptop computers, or tablet computers having a touch-sensitive surface (e.g., a touch screen display and/or a touch pad). It should also be appreciated that in some embodiments, the device is not a portable communication device, but a desktop computer having a touch-sensitive surface (e.g., a touch screen display and/or a touch pad).

In the following discussion, a terminal including a display and a touch sensitive surface is described. However, it should be understood that the terminal may include one or more other physical user interface devices such as a physical keyboard, mouse, and/or joystick.

The terminal supports various applications, such as one or more of the following: drawing applications, presentation applications, word processing applications, website creation applications, disk burning applications, spreadsheet applications, gaming applications, telephony applications, video conferencing applications, email applications, instant messaging applications, workout support applications, photo management applications, digital camera applications, digital video camera applications, web browsing applications, digital music player applications, and/or digital video player applications.

Various applications that may be executed on the terminal may use at least one common physical user interface device such as a touch sensitive surface. One or more functions of the touch-sensitive surface and corresponding information displayed on the terminal may be adjusted and/or changed between applications and/or within the corresponding applications. In this way, the common physical architecture (e.g., touch-sensitive surface) of the terminal may support various applications with user interfaces that are intuitive and transparent to the user.

It should be understood that the sequence number of each step in this embodiment does not mean the sequence of execution, and the execution sequence of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present application.

In order to illustrate the technical solutions described in the present application, the following description is made by specific examples.

Referring to fig. 1, fig. 1 is a flowchart of a near field measurement method according to an embodiment of the present application. As shown in fig. 1, a near field measurement method includes the steps of:

and step 101, selecting a sampling plane in the near field region range of the target antenna to obtain a plurality of sampling planes to be divided.

Specifically, the present application provides a planar near-field measurement method, where a plurality of sampling planes to be divided are firstly selected from the near-field region range of the target antenna. The sampling plane to be divided is parallel to the caliber plane of the target antenna. In order to facilitate block division and numerical calculation, the sampling plane to be divided is defined as a rectangular plane. Wherein, the target antenna is a horn antenna, a super-surface antenna or a spiral antenna, etc., which are not listed in this application.

Specifically, the subsequent phase iterative recovery is realized according to the concept of a plane wave expansion method, which is to simulate electromagnetic wave propagation in space. Namely, a plurality of planes are selected to form a transmissible space, and the phase in the interpolation electric field data is iteratively recovered by means of the electric field propagation rule of the antenna electromagnetic wave when the space formed by the planes propagates, so that the phase distribution data in the near field region range of the target antenna can be obtained. The two sampling planes to be divided can form a space, the subsequent phase iteration is realized by means of a plane wave unfolding method, and the purpose of the application is to improve the measuring speed, so that the two sampling planes to be divided are generally selected.

Specifically, for convenience of distinction, the two selected sampling planes to be divided are referred to as a first sampling plane to be divided and a second sampling plane to be divided. The first to-be-divided sampling plane and the second to-be-divided sampling plane are parallel to the caliber plane of the target antenna. Next, description will be made about the first to-be-divided sampling plane and the second to-be-divided sampling plane when describing the scheme of the present application.

Specifically, the distance between the first to-be-divided sampling plane and the aperture plane of the target antenna isThe distance between the second sampling plane to be divided and the caliber plane of the target antenna is +.>. The first sampling plane to be divided and the second sampling plane to be divided are rectangular planes. The area of the first sampling plane to be divided is larger than that of the caliber plane, and the area of the second sampling plane to be divided is also larger than that of the caliber planeThe area of the aperture plane is used for covering the aperture plane of the antenna, so that the data accuracy is improved.

And 102, dividing the blocks of each sampling plane to be divided based on the electric field values of different points to obtain a target sampling plane with the sampling points reaching the preset point requirements.

Specifically, in order to increase the measurement speed, the preset point number requirement is set, namely the point number is limited, the whole sampling plane to be divided is not directly subjected to sampling measurement, the sampling plane to be divided is subjected to block division, the sampling points are determined from the sampling plane to be divided, and near-field measurement is performed. In addition, the sampling points are not randomly selected, but are combined with the electric field values to carry out block division, so that the sampling points are determined, more representative and valuable sampling electric field data can be obtained from the sampling plane to be divided, and the accuracy of near-field measurement data is improved.

Specifically, the block division is performed on each sampling plane to be divided based on electric field values of different points to obtain a target sampling plane with sampling points reaching a preset point requirement, including: performing block division on each sampling plane to be divided to obtain an initial sampling plane containing a plurality of sub-blocks to be selected; calculating the electric field change value of the sub-block to be selected of each sub-block to be selected in the initial sampling plane; selecting the sub-block to be selected with the largest electric field change value of the sub-block to be selected for block division to obtain a sparse sampling plane; and determining the sparse sampling plane as the target sampling plane under the condition that the sparse sampling point number in the sparse sampling plane meets the preset point number requirement.

Specifically, firstly, block division is introduced, and the block division is performed by a quartering method and divided into two block division stages. In the first block dividing stage, each independent small block which is not divided in the sampling plane to be divided is divided into four smaller blocks. And (3) uniformly dividing each small block in the sampling plane to be divided by taking the midpoint of each side of each small block to obtain a smaller block, wherein the divided blocks are rectangular planes. And in the second block dividing stage, selecting the sub-blocks to be selected, wherein the electric field change value of the sub-blocks to be selected reaches the set change requirement, and further dividing the sub-blocks to be selected so as to realize that more sampling points are set in a high change rate electric field region.

Specifically, the user sets a target sampling point according to the needs, wherein the target sampling point is，/>And the point limit data is set for the user by the user and is far smaller than the sampling point corresponding to the Nyquist sampling theorem. Thus, the sampling time in the present application is greatly reduced compared with the sampling time corresponding to the nyquist sampling theorem.

Specifically, in a first block division stage, each of the sampling planes to be divided is divided into the initial sampling planes including a plurality of sub-blocks to be selected.

Specifically, the block division is performed on each sampling plane to be divided to obtain an initial sampling plane including a plurality of sub-blocks to be selected, including: performing block division on each sampling plane to be divided; calculating the initial sampling points in the sampling plane to be divided after each block division; and stopping block division on the sampling plane to be divided under the condition that the initial sampling point number is greater than or equal to the target sampling point number, and selecting the sampling plane to be divided before the last block division as the initial sampling plane.

Specifically, the sampling plane to be divided is subjected to block division, and after each block division, the initial sampling point number in the sampling plane to be divided is calculated. The initial sampling points are used for judging whether the whole of the sampling plane to be divided is uniformly divided in a first block dividing stage or a second block dividing stage is entered for partial division.

Specifically, when the initial sampling point number is greater than or equal to the target sampling point number, stopping block division, namely ending the first block division stage, and obtaining the initial sampling plane containing a plurality of sub-blocks to be selected. At this time, the sampling plane to be divided is divided into the initial sampling planes containing a plurality of the sub-blocks to be selected.

Specifically, as shown in fig. 2, fig. 2 is a block division schematic diagram of a quarter method of a sampling plane to be divided according to an embodiment of the present application. The left side, the middle part and the right side of the figure 2 are respectively provided with 3 maximum rectangles with equal areas, and the maximum rectangles are the sampling planes to be divided. The left rectangle is an original sampling plane to be divided, which is not subjected to block division processing and only comprises a B0 block, the left rectangle comprises 1 rectangle, namely 1 sub-block B0, four corner positions of the left rectangle are initial sampling point positions, and black dots are adopted to mark the initial sampling points in fig. 2. The first block division is carried out on the left rectangle by a quartering method, the left rectangle is divided into a middle rectangle containing 4 sub-blocks B1, black dots in the middle rectangle are the initial sampling points, the blocks corresponding to the middle rectangle are increased, the number of the blocks is 4, the initial sampling points are also increased, and the initial sampling points are 9. The block division is performed again by the quarter method based on the middle rectangle, so that a right rectangle containing 16 sub-blocks B2 is obtained, the number of blocks of the right rectangle is 16, and the number of initial sampling points is 25. Each time a block is divided, the number of sub-blocks and the number of initial sampling points are increased.

Specifically, after each block division, calculating an initial sampling point number in the sampling plane to be divided, wherein the initial sampling point number isWhere n is the number of block divisions. This formula is used only for the point calculation of the first block division stage.

Specifically, if the initial sampling point number is smaller than the target sampling point numberIt is necessary to continue the block divisionDivide, block division count->. If the initial sampling point number is greater than or equal to the target sampling point number +.>At this time, the block division is stopped. In the first block division stage, the point number of the sampling plane to be divided increases extremely fast after each block division, in this case, if the sampling plane to be divided obtained by the last block division is selected as the initial sampling plane, the initial sampling point number is already greater than or equal to the set target sampling point number, but at this time, the initial sampling points are uniformly distributed in the sampling plane to be divided, and the purpose of multi-sampling the high-change-rate electric field region cannot be achieved. In order to execute subsequent adaptive sparse sampling, more sampling points are selected in a high-change-rate electric field area in the initial sampling plane, data accuracy is improved, and the sampling plane to be divided obtained by the last block division is selected to be determined as the initial sampling plane.

Specifically, the first to-be-divided sampling plane and the second to-be-divided sampling plane are respectively subjected to block division through a quartering method. After each block division, the first initial sampling point number in the first to-be-divided sampling plane and the second initial sampling point number in the second to-be-divided sampling plane are recalculated.

Further, the first initial sampling point number and the second initial sampling point number are respectively compared with the target sampling point numberA comparison is made. In the case that the first initial sampling point number is greater than or equal to the target sampling point number +.>Under the condition of (1), stopping block division on the first to-be-divided sampling plane, and selecting the first to-be-divided sampling plane obtained by the last division as a first initial stageAnd starting a sampling plane to obtain the first initial sampling plane containing a plurality of first sub-blocks to be selected. In the case that the second initial sampling point is greater than or equal to the target sampling point +.>And (3) stopping performing block division on the second sampling plane to be divided, and selecting the second sampling plane to be divided obtained by the last division as a second initial sampling plane to obtain the second initial sampling plane containing a plurality of second sub-blocks to be selected.

Specifically, since the first initial sampling point number and the second initial sampling point number are both the same as the target sampling point numberThe comparison is performed, so in practical application, the number of block division times of the first to-be-divided sampling plane and the second to-be-divided sampling plane in the block division process is the same.

Specifically, since the sampling plane to be divided obtained by dividing the previous block is selected to be determined as the initial sampling plane, the initial sampling plane is that the initial sampling point number is smaller than the target sampling point numberThe most dense and uniform division of the sampling plane is realized, namely the number of points set by a user is not reached, the existing number of point differences are required to be complemented, the residual difference points are complemented at the position with large sampling electric field change rate, the effective utilization rate of the sampling points is improved, and the accuracy of electric field data recovered in subsequent iteration is improved. In this regard, the present application proposes a solution, where the sub-block to be selected having the largest electric field variation value of the sub-block to be selected is determined from a plurality of sub-blocks to be selected, and the sub-block to be selected is divided, that is, the electric field high variation area in the initial sampling plane is locally divided, and the sampling points are added in the electric field high variation area to complement the point difference. The method for determining the sub-block to be selected with the largest electric field change value is described below.

Specifically, the calculating the electric field variation value of the sub-block to be selected of each sub-block to be selected in the initial sampling plane includes: determining a plurality of interpolated points in the initial sampling plane based on a target interpolation interval; summing the electric field difference values between the interpolated points and the initial sampling points contained in each sub-block to be selected, and calculating to obtain the total electric field change amount of the sub-block to be selected corresponding to each sub-block to be selected; summing the electric field change total amount of the sub-blocks to be selected of each sub-block to be selected to obtain the plane electric field change total amount of the initial sampling plane; calculating the ratio of the electric field variation of the total electric field variation of each sub-block to be selected to the total electric field variation of the plane in the initial sampling plane; calculating the area ratio of the area of the sub-block to be selected of each sub-block to be selected in the initial sampling plane to the total area of the planes of the initial sampling plane; and calculating to obtain the electric field variation value of the sub-block to be selected of each sub-block to be selected based on the electric field variation ratio and the area ratio of each sub-block to be selected in the initial sampling plane.

Specifically, the maximum wavelength of the target antenna is obtainedTaking +.about.of the maximum wavelength>As the target interpolation interval, i.e., the target interpolation interval +.>。

Specifically, interpolation is performed in each initial sampling plane according to the target interpolation interval, and a plurality of interpolated points are determined, wherein the positions of the interpolated points are coincident with the positions of the initial sampling points.

Specifically, after the first block division stage is finished, a plurality of initial sampling points are uniformly distributed in the initial sampling plane. And measuring electric field values of a plurality of initial sampling points through measuring equipment to obtain an initial sampling electric field corresponding to each initial sampling point. And according to the known initial sampling electric field and interpolation method, the interpolation electric field corresponding to each interpolated point is obtained by estimation.

Specifically, the measuring equipment used in the method is mechanical mobile single-probe equipment, compared with multi-probe measuring equipment, the single-probe equipment is more practical and better in adaptability, a probe array does not need to be customized, so that the cost is low, the coupling complexity of the single probe is far smaller than that of the multi-probe coupling, and the problem of decoupling difficulty of the measuring equipment and the measuring data caused by the multi-probe equipment is avoided.

Specifically, the interpolation method is a linear interpolation method, a lagrangian interpolation method, a newton interpolation method, a spline interpolation method, or the like, and can be selected as required.

Specifically, as can be seen from fig. 2, the four vertices of the sub-block are sampling points, so that each of the sub-blocks to be selected includes a plurality of initial sampling points. Since the target sampling interval is the sampling interval corresponding to the nyquist sampling theorem, the number of the interpolated points is far greater than the number of the initial sampling points, that is, the density of the interpolated points is far greater than the density of the sampling points, which also means that each sub-block to be selected contains a plurality of the interpolated points.

Specifically, the calculating, based on the electric field difference between the interpolated point and the initial sampling point included in each sub-block to be selected, to obtain the total amount of electric field change of the sub-block to be selected corresponding to each sub-block to be selected includes: determining the initial sampling point closest to each interpolated point in each sub-block to be selected; calculating the point location electric field difference value of each interpolated point and the initial sampling point closest to the interpolated point; and summing the point location electric field difference values in each sub-block to be selected to obtain the total electric field change amount of the sub-block to be selected corresponding to each sub-block to be selected.

Specifically, after the initial sampling electric field and the interpolation electric field are obtained, determining the initial sampling point closest to each interpolated point in each sub-block to be selected, and calculating the electric field difference value between each block interpolation point and the initial sampling point closest to each block interpolation point, namely performing difference operation on the interpolation electric field of each interpolated point and the initial sampling electric field of the initial sampling point closest to each interpolation point to obtain the electric field difference value between two points, thereby obtaining the point electric field difference value. If a certain interpolated point corresponds to a plurality of nearest neighbor initial sampling points, one is selected for calculation.

Specifically, the sum is performed after taking absolute values of all the point location electric field difference values in each sub-block to be selected, so as to obtain the total electric field change amount of the sub-block to be selected corresponding to each sub-block to be selected.

Specifically, the following formula (1) is a calculation formula for the total amount of electric field change of the sub-block to be selected.

（1）。

Wherein in formula (1)For the interpolation electric field of the j-th interpolated point in the sub-block to be selected, +.>And the initial sampling electric field corresponding to the initial sampling point closest to the j-th interpolated point in the sub-block to be selected is obtained. / >Is the absolute value of the difference in the point electric field between the interpolated point and the initial sampling point closest to it. />Is the number of interpolated points in the sub-block to be selected. />For all interpolated points in the sub-block to be selected to be nearest to the interpolated pointsAnd the sum of absolute values of electric field difference values of adjacent initial sampling points, namely the total electric field change amount of the sub-block to be selected.

Specifically, the first initial sampling plane and the second initial sampling plane are respectively interpolated in accordance with the target interpolation interval. After interpolation processing, the first initial sampling plane corresponds to a plurality of first interpolated points, and the second initial sampling plane corresponds to a plurality of second interpolated points.

Specifically, the electric fields of the first initial sampling points and the electric fields of the second initial sampling points are measured by the measuring equipment, so that a first initial sampling electric field corresponding to each first initial sampling point and a second initial sampling electric field corresponding to each second initial sampling point are obtained.

Specifically, according to the known first initial sampling electric field and interpolation method, a first interpolation electric field corresponding to each first interpolated point is calculated, and according to the known second initial sampling electric field and interpolation method, a second interpolation electric field corresponding to each second interpolated point is calculated. The calculation here is a prediction of unknown data, i.e. the interpolated electric field, from known data.

Further, the total electric field change amount of the first sub-block to be selected of each first sub-block to be selected and the total electric field change amount of the second sub-block to be selected of each second sub-block to be selected are obtained through calculation of a formula (1).

Specifically, summing the total electric field change amount of all the sub-blocks to be selected in each initial sampling plane to obtain the total plane electric field change amount of the initial sampling plane.

Further, an electric field variation ratio of the total electric field variation amount of each sub-block to be selected in each initial sampling plane to the total electric field variation amount of the plane is calculated, and the following formula (2) is used for calculating the electric field variation ratio.

（2）。

Wherein,for the total amount of electric field change of the sub-block to be selected, +.>The number of sub-blocks to be selected in the initial sampling plane, is->Representing the total amount of electric field change of the sub-block to be selected of the kth sub-block to be selected in the initial sampling plane,/>Total amount of plane electric field change for the initial sampling plane, +.>The electric field variation ratio of the sub-blocks to be selected.

Specifically, a first electric field variation ratio of each first to-be-selected sub-block in the first initial sampling plane and a second electric field variation ratio of each second to-be-selected sub-block in the second initial sampling plane are calculated according to formula (2).

Meanwhile, the area of the sub-block to be selected of each sub-block to be selected in each initial sampling plane and the total plane area of the initial sampling plane are required to be calculated.

Specifically, after the area of the sub-block to be selected of each sub-block to be selected and the total area of the plane of the initial sampling plane are calculated, the area ratio of the area of the sub-block to be selected of each sub-block to be selected in each initial sampling plane to the total area of the plane of the initial sampling plane is calculated based on the data, so as to obtain the area ratio of each sub-block to be selected. The following formula (3) is used for calculating the area ratio of the sub-blocks to be selected.

（3）。

Wherein,for the area of the sub-block to be selected, < > for>For the number of sub-blocks to be selected in the initial sampling plane, and (2)>Representing the area of the sub-block to be selected of the kth sub-block to be selected in the initial sampling plane,/->For the total planar area of the initial sampling plane,is the area ratio of the sub-blocks to be selected.

Similarly, a first area ratio of each first to-be-selected sub-block in the first initial sampling plane and a second area ratio of each second to-be-selected sub-block in the second initial sampling plane may be calculated according to the formula (3).

Specifically, substituting the electric field variation ratio of the sub-block to be selected and the area ratio of the sub-block to be selected into a formula (4) to obtain the electric field variation value of the sub-block to be selected.

（4）。

Wherein,for the electric field variation ratio of the sub-blocks to be selected, < +.>For the area ratio of the sub-blocks to be selected, +.>The electric field change value of the sub-block to be selected is the sub-block to be selected of the sub-block to be selected. I.e. the sum of the electric field variations through the sub-blocks to be selectedAnd determining the electric field change condition of the sub-blocks to be selected according to the sizes of the sub-blocks to be selected. />The larger the field change, the more intense the field change.

Specifically, the sub-block to be selected with the largest G value is a high-change-rate electric field region capable of being further divided, and a sampling point is added. Similarly, a first to-be-selected sub-block with the maximum G value can be determined from the first initial sampling plane according to the formula (4), and the first to-be-selected sub-block with the maximum G value is subjected to block division. And determining a second sub-block with the maximum G value from the second initial sampling plane, and performing block division on a second sub-block to be selected with the maximum G value.

In particular, the purpose of further dividing the sub-block to be selected with the largest G value is to complement the initial sampling point number and the target sampling point number in the initial sampling plane The difference in points between them. And meanwhile, the electric field area with high change rate in the initial sampling plane is sampled as much as possible, so that the accuracy of measurement data is improved.

Specifically, the block after comparing the G values is divided into partial divisions, so that after division, there may be a difference in the areas of the sub-blocks in the initial sampling plane, that is, the sampling points are not uniformly distributed on the plane. The sampling plane divided by the local block is referred to as a sparse sampling plane. As shown in fig. 3, fig. 3 is a schematic plan view of sparse sampling according to an embodiment of the present application. The largest rectangle in fig. 3 is the sparse sampling plane, and the black dots are sampling points. As can be seen from fig. 3, the sub-block sizes in the sparse sampling plane are not exactly the same, and the sampling points in the sparse sampling plane are in a non-uniformly distributed state. The region with more sampling points in the sparse sampling plane is a region with intense electric field change degree, namely a high change rate electric field region.

Specifically, after each partial block division, the number of points is increased by 5 correspondingly, and the sparse sampling points in the sparse sampling plane are counted, wherein the sparse sampling points are the sum of the initial sampling points corresponding to the initial sampling plane and the newly increased sampling points after all the partial blocks are divided.

Specifically, the sparse sampling point number and the target sampling point number are comparedComparing, if the sparse sampling point number is smaller than the target sampling point number +.>If the sparse sampling point number does not meet the preset point number requirement, calculating an electric field change value of each sub-block in the sparse sampling plane according to the formula (1) -formula (4), searching a sub-block with the largest new electric field change value, and performing local block division until the sparse sampling point number is greater than or equal to the target sampling point number%>Considering that the sparse sampling point number reaches the preset point number requirement, stopping the calculation of an electric field change value and the local block division, and enabling the sparse sampling point number to be greater than or equal to the target sampling point number +.>Is determined as the target sampling plane.

Specifically, the sparse sampling points are counted after each partial block division, and the points are increased by 5 and the amplitude is not large after each partial block division, so the total point of the finally obtained target sampling plane is equal to the target sampling pointOr slightly greater than the target sampling point number +.>The measuring speed is not affected.

Correspondingly, if the first initial sampling plane also undergoes local block division, correspondingly obtaining a first sparse sampling plane, judging whether the first sparse sampling point number in the first sparse sampling plane meets the preset point number requirement, if not, continuing to perform local block division, and if so, determining a first target sampling plane.

Similarly, if the second initial sampling plane is also subjected to local block division, a second sparse sampling plane is correspondingly obtained, whether the number of second sparse sampling points in the second sparse sampling plane reaches the preset point number requirement is judged, if not, local block division is continued, and if so, a second target sampling plane is determined.

Specifically, the method and the device are based on global analysis, and the sampling points are gradually set in the high-change-rate electric field area while meeting the requirement of the preset point number, so that self-adaptive sparse sampling is performed, and the accuracy of interpolation electric field data in step 103 is improved.

And 103, performing point-location electric field interpolation processing on the target sampling plane to obtain interpolation electric field data.

Specifically, the interpolated points are determined based on the target interpolation interval, and the interpolated points obtained by dividing the block may be introduced into the target sampling plane.

Specifically, the sampling electric field data of each sampling point in the target sampling plane is obtained through measurement of a measuring device, and the interpolation electric field data of each interpolated point in the target sampling plane is obtained through prediction based on an interpolation method and the sampling electric field data of each sampling point in the target sampling plane.

Specifically, for the first target sampling plane, first sampled electric field data is measured). For the second target sampling plane, measuring to obtain second sampled electric field data +.>)。

Specifically, a spatial coordinate system is constructed with reference to the aperture plane of the target antenna. X, y and d above and below are the abscissa, ordinate and ordinate of the sample point, and the subscript is used to distinguish points of different properties for different target sample planes.

Correspondingly, predicting first interpolation electric field data of the first target sampling plane) Predicting second interpolation electric field data of the second target sampling plane)。

Step 104, calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolation electric field data of the target sampling planes.

Specifically, the electric field phase distribution data in the near field region range of the target antenna is calculated according to the interpolation electric field data of a plurality of target sampling planes. The interpolation electric field data are predicted data, the difference between the phase data in the interpolation electric field data and the real data is larger, and the difference between the phase data in the interpolation electric field data and the real data is reduced by the following method, namely the data accuracy of the phase data in the interpolation electric field data is improved.

Specifically, the calculating, based on the interpolated electric field data of the plurality of target sampling planes, electric field phase distribution data in the near field region range of the target antenna includes: performing inter-plane phase iteration based on the interpolated electric field data; calculating iteration errors before and after each iteration, and counting the iteration times; and under the condition that the iteration error or the iteration frequency reaches a set iteration requirement, calculating to obtain the electric field phase distribution data in the near field region range of the target antenna based on electric field data output by the last phase iteration.

Specifically, the inter-plane phase iteration is performed based on the interpolation electric field data, and the iteration is calculated before and after each iterationAnd counting the iteration times. After the iteration error reaches a set termination errorWhen, or the iteration number reaches the set iteration number +.>And stopping iteration. And then calculating to obtain the electric field phase distribution data in the near field region range of the target antenna according to the electric field data output by the last phase iteration.

Specifically, the method realizes phase iteration among planes through a fast Fourier iterative algorithm. The following describes how the present application achieves phase recovery by fourier iterative transformation based on the first sampled electric field data and the first interpolated electric field data of the first target sampling plane region and the second sampled electric field data and the second interpolated electric field data of the second target sampling plane region.

Specifically, the number of iterations is initializedInitializing iterative electric field data into the interpolation electric field data, namely，)。

Specifically, the calculation process of the formula (5) is referred to as positive direction calculation, and temporary electric field data from the first target sampling plane to the second target sampling plane is calculated by the formula (5):

（5）。

wherein,representing the fast fourier transform, ">Representing an inverse fast fourier transform, ">Representing wave number in z propagation direction, based on plane position of sampling point, sampling period and electromagnetic wave wavelength. The sampling period refers to the distance d, that is, the wave number is calculated based on the spatial position of the sampling point and the wavelength of the electromagnetic wave, and the calculation process is not repeated in the application. />

Specifically, the electric field amplitude of the second interpolated electric field data using the second target sampling plane) I and the second sampled electric field data of the second target sampling plane) The amplitude and phase values in the temporary electric field are replaced, the electric field amplitude is first of all +.>) I substitution, reusing a smaller number of the second sampled electric field data) Performing amplitude substitution and phase value substitution to obtain +.>. The replacing operation can limit the phase distribution, so that the solution of the phase distribution is converged, and more accurate data are calculated when the near-field electric field value and the far-field electric field value are calculated later.

Specifically, the electric field amplitude of the second interpolation electric field data is used for replacing the amplitude in the temporary electric field, so that the temporary electric field data corresponding to the second sampling electric field data can be conveniently and quickly found from the temporary electric field data. Since the phase value of the second sampled electric field data is a very accurate phase value measured by the measuring device, after finding, the phase value of the second sampled electric field data is used to replace the phase value in the corresponding temporary electric field data, and since the amplitude in the second interpolated electric field data is the predicted data, there is a small error, the amplitude replacement is also performed by using a smaller amount of the second sampled electric field data.

Then, performing reverse direction calculation through formula (6), and calculating temporary electric field data from the second target sampling plane to the first target sampling plane:

（6）。

specifically, the electric field amplitude of the first interpolated electric field data using the first target sampling plane) I and the first sampled electric field data of the first target sampling plane) The amplitude and phase values in the temporary electric field data are replaced, and the electric field amplitude is replaced first >) I substitution, reusing a smaller number of the second sampled electric field data) Performing amplitude substitution and phase value substitution to obtain +.>。

Similarly, the electric field amplitude of the first interpolation electric field data is used for replacing the amplitude in the temporary electric field, so that the temporary electric field data corresponding to the first sampling electric field data can be conveniently and quickly found from the temporary electric field data. Since the phase value of the first sampled electric field data is a very accurate phase value measured by the measuring device, after finding, the phase value of the first sampled electric field data is used to replace the phase value in the corresponding temporary electric field data, and since the amplitude in the first interpolated electric field data is the predicted data, a small error exists, the amplitude replacement is also performed by using a small amount of the first sampled electric field data.

Specifically, one forward direction calculation and one reverse direction calculation are recorded as one iteration. After each iteration, the iteration number i corresponds to +1, and the iteration error also needs to be calculatedIf->Or->And (4) indicating that the iteration effect reaches the iteration requirement, stopping iteration, and outputting electric field data corresponding to the last phase iteration. Otherwise, continuing the iteration according to the formula (5) and the formula (6).

Specifically, the phase data is recovered by inter-plane phase iteration. The electric field data output after the last phase iteration is data with accuracy reaching the user requirement, at this time, the phase data in the electric field data is data with higher iterative recovery quality, and the electric field phase distribution data in the near field region range of the target antenna can be obtained through calculation based on the electric field data.

Specifically, as shown in fig. 4, fig. 4 is a schematic diagram of a fast fourier iteration provided in an embodiment of the present application. The sparse sampling plane 1 in fig. 4 is the first target sampling plane, the sparse sampling plane 2 is the second target sampling plane, the aperture plane of the sample to be measured is the aperture plane of the target antenna, and the aperture of the sample to be measured is the aperture of the target antenna. As can be seen from fig. 4, the sparse sampling plane 1 and the sparse sampling plane 2 are subdivided into planes containing many small lattices, which is the effect achieved after interpolation according to the target interpolation interval. And simulating electric field propagation in two planes, and calculating phase distribution by combining a fast Fourier iteration method to obtain electric field phase distribution data of the target antenna. According to the method and the device, the measuring speed is improved, and meanwhile, the accuracy of measured data is guaranteed not to be greatly affected through phase iteration.

Specifically, as shown in fig. 5, fig. 5 is a phase distribution contrast diagram of a horn antenna according to an embodiment of the present application. In fig. 5, (a) (b) (c) is a set of phase distribution contrast maps, and (d) (e) (f) is another set of phase distribution contrast maps. (a) is a true phase profile of a target sampling plane at 100% sampling rate and 50mm from the antenna aperture plane, (b) is an interpolated phase profile corresponding to a target sampling plane at 40% sampling rate and 50mm from the antenna aperture plane, and (c) is an iteratively recovered phase profile corresponding to a target sampling plane at 40% sampling rate and 50mm from the antenna aperture plane. (d) The real phase distribution diagram of the target sampling plane which is 100mm away from the antenna aperture plane at the sampling rate of 100 percent, (e) the interpolated phase distribution diagram corresponding to the target sampling plane which is 100mm away from the antenna aperture plane at the sampling rate of 40 percent, and (f) the iteratively recovered phase distribution diagram corresponding to the target sampling plane which is 100mm away from the antenna aperture plane at the sampling rate of 40 percent. The sampling rate is the ratio of the actual sampling point number to the sampling point number corresponding to the Nyquist sampling theorem, and the sampling point number of the method is far smaller than the sampling point number corresponding to the Nyquist sampling theorem. According to the method, the number of sampling points is reduced, interpolation data are calculated through existing data, and the phenomenon of smearing of the phase after interpolation is serious by combining (b) and (e), and the phase distribution map of (c) and (f) can be obtained after phase iteration, so that the smearing feeling caused by interpolation is reduced, and the data accuracy is improved. According to the method, the sampling point number is reduced, the measuring speed is improved, and meanwhile, the phase deviation generated by phase iteration compensation iteration is improved, so that the accuracy of measured data is improved.

Specifically, as shown in fig. 6, fig. 6 is a phase distribution contrast diagram of a super-surface antenna according to an embodiment of the present application. In fig. 6, (a) (b) (c) is a set of phase distribution contrast maps, and (d) (e) (f) is another set of phase distribution contrast maps. (a) is a true phase profile of a target sampling plane at 100% sampling rate and 300mm from the antenna aperture plane, (b) is an interpolated phase profile corresponding to a target sampling plane at 50% sampling rate and 300mm from the antenna aperture plane, and (c) is an iteratively recovered phase profile corresponding to a target sampling plane at 50% sampling rate and 300mm from the antenna aperture plane. (d) The real phase distribution diagram of the target sampling plane which is 600mm away from the antenna caliber plane at the sampling rate of 100 percent, (e) the interpolated phase distribution diagram corresponding to the target sampling plane which is 600mm away from the antenna caliber plane at the sampling rate of 50 percent, and (f) the iteratively recovered phase distribution diagram corresponding to the target sampling plane which is 600mm away from the antenna caliber plane at the sampling rate of 50 percent. As can be seen from fig. 6, the measurement method of the present application can improve the measurement speed and ensure that the accuracy of the measurement data is not greatly affected.

In particular, as can be seen in conjunction with fig. 5 and 6, the near field measurement method of the present application can be applied to different types of antenna near field measurements. The data can be iteratively restored under the near field planes with different distances and different sampling rates, more accurate phase distribution data is obtained, the measuring speed and the measuring data accuracy are considered, and the measuring effect is particularly good.

In the embodiment of the application, a sampling plane is selected in a near field region range of a target antenna to obtain a plurality of sampling planes to be divided, the plurality of sampling planes to be divided are respectively divided into blocks based on electric field values of different points, and after the blocks are divided, if the number of sampling points reaches the preset point number requirement, the target sampling plane is obtained. And performing point-location electric field interpolation processing on the target sampling planes to obtain interpolation electric field data, and then calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolation electric field data of the plurality of target sampling planes. The method and the device have the advantages that the requirement of the preset point number is set, namely, the number of the sampling points is limited, the sampling time can be reduced, and the measuring speed is improved. Meanwhile, the sampling points are not selected at will, but the sampling points can be determined by combining electric field values of different points and dividing the sampling plane to be divided into blocks, so that more valuable sampling points are obtained, the data accuracy is improved, and meaningless measurement is avoided.

Referring to fig. 7, fig. 7 is a flowchart two of a near field measurement method according to an embodiment of the present application. As shown in fig. 7, a near field measurement method includes the steps of:

step 201, selecting a sampling plane in a near field region of a target antenna to obtain a plurality of sampling planes to be divided.

The implementation process of this step is the same as that of step 101 in the foregoing embodiment, and will not be described here again.

Step 202, performing block division on each sampling plane to be divided based on electric field values of different points to obtain a target sampling plane with the sampling points reaching the preset point requirements.

The implementation process of this step is the same as that of step 102 in the foregoing embodiment, and will not be described here again.

And 203, performing point-location electric field interpolation processing on the target sampling plane to obtain interpolation electric field data.

The implementation process of this step is the same as that of step 103 in the foregoing embodiment, and will not be described here again.

Step 204, calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolation electric field data of the target sampling planes.

The implementation process of this step is the same as that of step 104 in the foregoing embodiment, and will not be described here again.

Step 205, calculating, based on the electric field phase distribution data, electric field values of the rest near field planes in the near field region and far field electric field values corresponding to the target antenna.

Specifically, after the electric field phase distribution data is obtained, electric field values of the rest near field planes in the near field region range are calculated based on the electric field phase distribution data and the sampled electric field amplitude measured before, so that the near field measurement speed is improved.

Specifically, based on the electric field phase distribution data and the sampled electric field amplitude measured previously, electric field values of the rest near field planes in the near field region are calculated. According to the method and the device, far-field data are calculated through the near-field data, the problems of high site construction cost and high measurement difficulty of the far-field darkroom are solved, and the method and the device are simple, efficient, economical and practical.

In addition to calculating the electric field values, the electric field phase distribution data and the sampled electric field amplitudes measured before can be used to calculate the magnetic field data corresponding to the near field and the far field, which will not be described further herein.

In the embodiment of the application, after electric field phase distribution data is obtained, electric field values of the rest near-field planes in the near-field region range and far-field electric field values corresponding to the target antenna are calculated according to the electric field phase distribution data. Corresponding data can be obtained without measuring the far fields of other near-field planes and the target antenna, so that the method is convenient and quick, and the cost investment is reduced.

Referring to fig. 8, fig. 8 is a block diagram of a near field measurement apparatus provided in an embodiment of the present application, and for convenience of explanation, only a portion related to the embodiment of the present application is shown.

The near field measurement apparatus 300 includes: the system comprises a selection module 301, a block division module 302, an interpolation module 303 and a calculation module 304.

The selecting module 301 is configured to select a sampling plane within a near field region of the target antenna, so as to obtain a plurality of sampling planes to be divided.

The block division module 302 is configured to perform block division on each of the sampling planes to be divided based on electric field values of different points, so as to obtain a target sampling plane with sampling points reaching a preset point requirement.

And the interpolation module 303 is configured to perform electric field interpolation processing on the point location on the target sampling plane, so as to obtain interpolation electric field data.

The calculating module 304 is configured to calculate electric field phase distribution data in the near field region range of the target antenna based on the interpolated electric field data of the plurality of target sampling planes.

The block dividing module 302 is specifically configured to:

performing block division on each sampling plane to be divided to obtain an initial sampling plane containing a plurality of sub-blocks to be selected;

Calculating the electric field change value of the sub-block to be selected of each sub-block to be selected in the initial sampling plane;

selecting the sub-block to be selected with the largest electric field change value of the sub-block to be selected for block division to obtain a sparse sampling plane;

and determining the sparse sampling plane as the target sampling plane under the condition that the sparse sampling point number in the sparse sampling plane meets the preset point number requirement.

Performing block division on each sampling plane to be divided;

calculating the initial sampling points in the sampling plane to be divided after each block division;

and stopping block division on the sampling plane to be divided under the condition that the initial sampling point number is greater than or equal to the target sampling point number, and selecting the sampling plane to be divided before the last block division as the initial sampling plane.

Determining a plurality of interpolated points in the initial sampling plane based on a target interpolation interval;

summing the electric field difference values between the interpolated points and the initial sampling points contained in each sub-block to be selected, and calculating to obtain the total electric field change amount of the sub-block to be selected corresponding to each sub-block to be selected;

Summing the electric field change total amount of the sub-blocks to be selected of each sub-block to be selected to obtain the plane electric field change total amount of the initial sampling plane;

calculating the ratio of the electric field variation of the total electric field variation of each sub-block to be selected to the total electric field variation of the plane in the initial sampling plane;

calculating the area ratio of the area of the sub-block to be selected of each sub-block to be selected in the initial sampling plane to the total area of the planes of the initial sampling plane;

and calculating to obtain the electric field variation value of the sub-block to be selected of each sub-block to be selected based on the electric field variation ratio and the area ratio of each sub-block to be selected in the initial sampling plane.

Determining the initial sampling point closest to each interpolated point in each sub-block to be selected;

calculating the point location electric field difference value of each interpolated point and the initial sampling point closest to the interpolated point;

and summing the point location electric field difference values in each sub-block to be selected to obtain the total electric field change amount of the sub-block to be selected corresponding to each sub-block to be selected.

Wherein, the computing module 304 is specifically configured to:

Performing inter-plane phase iteration based on the interpolated electric field data;

calculating iteration errors before and after each iteration, and counting the iteration times;

and under the condition that the iteration error or the iteration frequency reaches a set iteration requirement, calculating to obtain the electric field phase distribution data in the near field region range of the target antenna based on electric field data output by the last phase iteration.

Specifically, the device further comprises an electric field value calculation module for:

and calculating electric field values of the rest near field planes in the near field region range and far field electric field values corresponding to the target antenna based on the electric field phase distribution data.

The near field measurement device provided in the embodiment of the present application can implement each process of the embodiment of the near field measurement method, and can achieve the same technical effects, so that repetition is avoided, and no further description is provided herein.

Fig. 9 is a block diagram of a terminal according to an embodiment of the present application. As shown in the figure, the terminal 4 of this embodiment includes: at least one processor 40 (only one is shown in fig. 9), a memory 41 and a computer program 42 stored in the memory 41 and executable on the at least one processor 40, the processor 40 implementing the steps in any of the various method embodiments described above when executing the computer program 42.

The terminal 4 may be a computing device such as a desktop computer, a notebook computer, a palm computer, a cloud server, etc. The terminal 4 may include, but is not limited to, a processor 40, a memory 41. It will be appreciated by those skilled in the art that fig. 9 is merely an example of the terminal 4 and is not limiting of the terminal 4, and may include more or fewer components than shown, or may combine some components, or different components, e.g., the terminal may further include an input-output device, a network access device, a bus, etc.

The processor 40 may be a central processing unit (Central Processing Unit, CPU), but may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory 41 may be an internal storage unit of the terminal 4, such as a hard disk or a memory of the terminal 4. The memory 41 may also be an external storage device of the terminal 4, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card) or the like, which are provided on the terminal 4. Further, the memory 41 may also include both an internal storage unit and an external storage device of the terminal 4. The memory 41 is used for storing the computer program as well as other programs and data required by the terminal. The memory 41 may also be used for temporarily storing data that has been output or is to be output.

It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.

In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.

Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus/terminal and method may be implemented in other manners. For example, the apparatus/terminal embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.

The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.

The integrated modules/units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above embodiment, or may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each method embodiment described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a removable hard disk, a magnetic disk, an optical disk, a computer Memory, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), an electrical carrier signal, a telecommunications signal, a software distribution medium, and so forth. It should be noted that the computer readable medium contains content that can be appropriately scaled according to the requirements of jurisdictions in which such content is subject to legislation and patent practice, such as in certain jurisdictions in which such content is subject to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.

The present application may implement all or part of the procedures in the methods of the above embodiments, and may also be implemented by a computer program product, which when run on a terminal causes the terminal to implement steps in the embodiments of the methods described above.

The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.

Claims

1. A near field measurement method, comprising:

2. The method according to claim 1, wherein the block dividing each sampling plane to be divided based on the electric field values of different points to obtain a target sampling plane with a sampling point reaching a preset point requirement includes:

3. The method according to claim 2, wherein the block-dividing each of the sampling planes to be divided into a plurality of initial sampling planes including a plurality of sub-blocks to be selected comprises:

Performing block division on each sampling plane to be divided;

4. The method of claim 2, wherein said calculating a candidate sub-block electric field variation value for each of said candidate sub-blocks in said initial sampling plane comprises:

5. The method of claim 4, wherein the calculating the total amount of electric field change of the sub-block to be selected corresponding to each sub-block to be selected based on the electric field difference between the interpolated point and the initial sampling point included in each sub-block to be selected includes:

6. The method of claim 1, wherein the calculating electric field phase distribution data within the near field region of the target antenna based on the interpolated electric field data for a plurality of the target sampling planes comprises:

7. The method according to claim 1, wherein after calculating electric field phase distribution data in the near field region range of the target antenna based on the interpolated electric field data of the plurality of target sampling planes, further comprising:

8. A near field measurement apparatus, comprising:

9. A terminal comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the steps of the method according to any of claims 1 to 7 when the computer program is executed.

10. A computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor implements the steps of the method according to any one of claims 1 to 7.