CN116400089A - Dual-machine sample analysis system, control method, equipment and medium - Google Patents

Dual-machine sample analysis system, control method, equipment and medium Download PDF

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Publication number
CN116400089A
CN116400089A CN202310260415.1A CN202310260415A CN116400089A CN 116400089 A CN116400089 A CN 116400089A CN 202310260415 A CN202310260415 A CN 202310260415A CN 116400089 A CN116400089 A CN 116400089A
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sample
analyzer
test tube
tube rack
recorded
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龙晚
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Shenzhen Dymind Biotechnology Co Ltd
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Shenzhen Dymind Biotechnology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

The application discloses a dual-computer sample analysis system, a control method, equipment and a medium. The double-machine sample analysis system comprises a sample injection device, a first sample analyzer, a second sample analyzer and control equipment, wherein the control equipment is used for: if the sample is the recheck sample, controlling the first sample analyzer and/or the second sample analyzer to record; controlling the feeding track to stop moving in response to completion of the first sample processing at the last position on the first test tube rack at the moment; and confirming a re-inspection analyzer for re-inspecting the re-inspected samples recorded on the first test tube rack and/or the second test tube rack from the first sample analyzer and the second sample analyzer, controlling the movement of the feeding track so that the recorded re-inspected samples are moved to processing positions corresponding to the re-inspection analyzer, and sequentially re-inspecting the recorded re-inspected samples by the re-inspection analyzer. By recording the recheck sample and controlling the feeding track to stop moving after the first sample at the last position is processed, the detection speed is increased, and the abrasion is reduced.

Description

Dual-machine sample analysis system, control method, equipment and medium
Technical Field
The application relates to the technical field of medical instruments, in particular to a dual-computer sample analysis system, a control method, equipment and a medium.
Background
In the existing double-machine sample analysis system, after the primary test of a certain test tube is finished, a feeding track is controlled to advance by one test tube position, the next test tube of the test tube is conveyed to a test tube processing position, a sample analyzer carries out primary test on the test tube, at the moment, if the primary test result of the test tube is abnormal and a sample needing to be rechecked appears, the feeding track is controlled to retreat by one test tube position after the primary test of the next test tube is finished, and the test tube is conveyed to the test tube processing position for rechecking. The test tube is used as a unit for instantly rechecking the sample to be rechecked, so that the detection efficiency of the double-machine sample analysis system is low, and meanwhile, the abrasion of the feeding track is large, and the accuracy of the stopping position of the feeding track when the test tube rack is loaded and transported is further affected.
Disclosure of Invention
The application provides a dual-computer sample analysis system, a control method, equipment and a medium, so as to solve the technical problems.
In order to solve the above problems, a first aspect of the present application provides a dual sample analysis system, including a sample injection device, a first sample analyzer, a second sample analyzer, and a control device, where the sample injection device includes a feeding track for transporting a test tube rack, a loading position, a first processing position corresponding to the first sample analyzer, and a second processing position corresponding to the second sample analyzer, the first sample analyzer is used for sampling or grabbing samples located at the first processing position, the second sample analyzer is used for sampling or grabbing samples located at the second processing position, and the first sample analyzer is set away from the loading position relative to the second sample analyzer; the control equipment is respectively connected with the sample injection device, the first sample analyzer and the second sample analyzer, wherein the control equipment is used for: after the first sample on the first test tube rack at the first processing position is processed by the first sample analyzer and/or the second sample on the second test tube rack at the second processing position is processed by the second sample analyzer, confirming whether the processing of the first sample at the last position on the first test tube rack is finished or not; if the first sample at the last position on the first test tube rack is not processed, the feeding track is controlled to advance, so that the first sample analyzer processes the first sample at the next position of the first test tube rack and/or the second sample analyzer processes the second sample at the next position of the second test tube rack, and meanwhile, whether the first sample at the first processing position and/or the second sample at the second processing position is a retest sample or not is judged, and if yes, the first sample analyzer and/or the second sample analyzer records; responding to the completion of the first sample processing at the last position on the first test tube rack, controlling the feeding track to stop moving, judging whether the first sample at the last position on the first test tube rack is a retest sample or not, and if so, recording by a first sample analyzer; and confirming a re-inspection analyzer for re-inspecting the re-inspected samples recorded on the first test tube rack and/or the second test tube rack from the first sample analyzer and the second sample analyzer, controlling the movement of the feeding track so that the recorded re-inspected samples are moved to processing positions corresponding to the re-inspection analyzer, and sequentially re-inspecting the recorded re-inspected samples by the re-inspection analyzer.
In order to solve the above problems, a second aspect of the present application provides a control method for sample review, which is applied to the above dual-machine sample analysis system, and the control method includes: after the first sample on the first test tube rack at the first processing position is processed by the first sample analyzer and/or the second sample on the second test tube rack at the second processing position is processed by the second sample analyzer, confirming whether the processing of the first sample at the last position on the first test tube rack is finished or not; if the first sample at the last position on the first test tube rack is not processed, the feeding track is controlled to advance, so that the first sample analyzer processes the first sample at the next position of the first test tube rack and/or the second sample analyzer processes the second sample at the next position of the second test tube rack, and meanwhile, whether the first sample at the first processing position and/or the second sample at the second processing position is a retest sample or not is judged, and if yes, the first sample analyzer and/or the second sample analyzer records; responding to the completion of the first sample processing at the last position on the first test tube rack, controlling the feeding track to stop moving, judging whether the first sample at the last position on the first test tube rack is a retest sample or not, and if so, recording by a first sample analyzer; and confirming a re-inspection analyzer for re-inspecting the re-inspected samples recorded on the first test tube rack and/or the second test tube rack from the first sample analyzer and the second sample analyzer, controlling the movement of the feeding track so that the recorded re-inspected samples are moved to processing positions corresponding to the re-inspection analyzer, and sequentially re-inspecting the recorded re-inspected samples by the re-inspection analyzer.
Further, when the recorded retest samples are one or more of the first samples, the retest analyzer that retests the recorded retest samples confirmed from the first and second sample analyzers is the first sample analyzer or the second sample analyzer.
Further, when the recorded retest samples are one or more of the second samples, the retest analyzer that retests the recorded retest samples confirmed from the first and second sample analyzers is the first sample analyzer or the second sample analyzer.
Further, in the case where the recorded retest samples are one or more of the first samples and the retest analyzer is the first sample analyzer and the recorded retest samples are one or more of the second samples and the retest analyzer is the second sample analyzer, the step of controlling the feeding track to move so that the recorded retest samples are moved to the processing bits corresponding to the retest analyzer includes: controlling the feeding track to retract so that the first recorded retest sample on the test tube rack is moved to a processing position corresponding to the retest analyzer; and then controlling the feeding track to advance so that the rest recorded retest samples on the test tube rack are sequentially moved to a processing position corresponding to the retest analyzer.
Further, in the case where the recorded retest samples are one or more of the first samples and the retest analyzer is the first sample analyzer and the recorded retest samples are one or more of the second samples and the retest analyzer is the second sample analyzer, the step of controlling the feeding track to move so that the recorded retest samples are moved to the processing bits corresponding to the retest analyzer includes: controlling the feeding track to remain motionless or controlling the feeding track to retract so that the last recorded retest sample on the test tube rack is moved to a processing position corresponding to the retest analyzer; and controlling the feeding track to retract so that the rest recorded retest samples on the test tube rack are sequentially moved to a processing position corresponding to the retest analyzer.
Further, in the case where the recorded retest samples are one or more of the first samples and the retest analyzer is the second sample analyzer, the step of controlling the feed rail movement so that the recorded retest samples are moved to the processing bits corresponding to the retest analyzer includes: controlling the feeding track to retract so that the first recorded retest sample on the first test tube rack is moved to a second processing position; and then controlling the feeding track to advance so that the rest recorded retest samples on the first test tube rack are sequentially moved to the second processing position.
Further, in the case where the recorded retest samples are one or more of the second samples and the retest analyzer is the first sample analyzer, the step of controlling the feed rail movement so that the recorded retest samples are moved to the processing bits corresponding to the retest analyzer includes: controlling the feeding track to advance so that the first recorded retest sample on the second test tube rack is moved to the first processing position; and then controlling the feeding track to continue to advance so that the rest recorded retest samples on the second test tube rack are sequentially moved to the first processing position.
In order to solve the above-mentioned problems, a third aspect of the present application provides a control apparatus including a memory for storing a computer program and a processor for executing the computer program to implement the above-mentioned control method.
In order to solve the above-mentioned problems, a fourth aspect of the present application provides a computer-readable storage medium having stored thereon a computer program for implementing the above-mentioned control method when executed by a processor.
The beneficial effects of this application lie in: compared with the prior art, the control equipment in the dual-machine sample analysis system is respectively connected with the sample injection device, the first sample analyzer and the second sample analyzer, and the control equipment specifically controls the first sample analyzer and the second sample analyzer to respectively record samples needing rechecking on the first test tube rack and the second test tube rack; specifically controlling the feeding track to stop moving after the first sample at the last position on the first test tube rack is processed; specifically controlling the sample injection device, particularly controlling the moving mode of the feeding track so as to enable the recorded re-inspection sample to be moved to a processing position corresponding to the re-inspection analyzer, and sequentially re-inspecting the re-inspection sample by the re-inspection analyzer; the initial detection speed of the rest first samples on the first test tube rack and the rest second samples on the second test tube rack is accelerated by recording the retest samples, meanwhile, the feeding track is controlled to stop moving after the first samples at the last position on the first test tube rack are processed, so that the feeding track can be prevented from moving possibly in a period from the completion of the first samples at the last position on the first test tube rack to the confirmation of the retest analyzer before the completion, the abrasion of the feeding track is reduced, the accuracy of the stopping position of the feeding track when the test tube racks are loaded and transported is improved, and the service life of the sample analysis system is prolonged.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art. Wherein:
FIG. 1 is a schematic diagram of an embodiment of a dual sample analysis system provided herein;
FIG. 2 is a flow chart of an embodiment of a control method for sample review provided in the present application;
FIG. 3 is a schematic structural view of the control device provided in the present application;
fig. 4 is a schematic structural diagram of a computer-readable storage medium provided in the present application.
Reference numerals: a sample introduction device 10; a first sample analyzer 20; a second sample analyzer 21; a feed rail 11; a loading station 111; a first processing bit 112; a second processing bit 113; a first test tube rack 30; a second rack 31;
Detailed Description
The following description of the technical solutions in the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The terms "first," "second," "third," "fourth" and the like in the description and in the claims of this application and in the above-described figures, if any, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the present application described herein may be implemented, for example, in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
An embodiment of the present application provides a dual sample analysis system, please refer to fig. 1, and fig. 1 is a schematic structural diagram of an embodiment of the dual sample analysis system provided in the present application. The dual sample analysis system includes a sample introduction device 10, a first sample analyzer 20, a second sample analyzer 21, and a control device (not shown).
The sample introduction device 10 includes a feed rail 11 for transporting the rack. The test tube rack is loaded with a plurality of test tubes, each test tube contains a sample, and the types of the samples in the test tubes can be the same or different. In some embodiments, the sample may be a sample containing various types of biological cell information or other biological information, such as a blood sample, a urine sample, other body fluids (hydrothorax and ascites, cerebrospinal fluid, serosal cavity effusion, synovial fluid), and the like.
The feed rail 11 is provided with a loading station 111, a first processing station 112 and a second processing station 113.
The test tube rack is loaded onto the feed rail 11 at the loading position 111, and is subsequently transported by the feed rail 11. The first sample analyzer 20 is located remotely from the loading site 111 relative to the second sample analyzer 21.
In the present dual sample analysis system, in order to improve the utilization ratio of the first sample analyzer 20 and the second sample analyzer 21, in many cases, the feed rail 11 transports two rows of test tube racks simultaneously, the row of test tube racks that is loaded onto the feed rail 11 at the loading position 111 first among any two rows of test tube racks is referred to as a first test tube rack 30, and the next row of test tube rack of the first test tube rack is referred to as a second test tube rack 31.
The first processing bit 112 corresponds to the first sample analyzer 20, and the first processing bit 112 is a fixed position in front of the first sample analyzer 20. The first sample analyzer 20 is used for sampling or grabbing samples at the first processing location 112, that is, when the feeding track 11 conveys a test tube loaded on the test tube rack to the first processing location 112, the first sample analyzer 20 samples or grabs samples contained in the test tube. Specifically, when the first processing bit 112 is the sampling position of the first sample analyzer 20, the first sample analyzer 20 samples the sample contained in the test tube, that is, the sampling component of the first sample analyzer 20 extends out of the first sample analyzer 20 to sample the sample contained in the test tube, the sampling component and the sample return to the first sample analyzer 20, and the rest components in the first sample analyzer 20 perform sample analysis on the sample; if the first processing station 112 is the gripping position of the first sample analyzer 20, the first sample analyzer 20 will grip the test tube, i.e. the gripping element of the first sample analyzer 20 extends out of the first sample analyzer 20 to grip the test tube, the gripping element and the test tube returns to the first sample analyzer 20, at which time the sampling element in the first sample analyzer 20 samples the sample contained in the test tube, and the remaining elements in the first sample analyzer 20 sample the sample.
The second processing bit 113 corresponds to the second sample analyzer 21, and the second processing bit 113 is a fixed position in front of the second sample analyzer 21. The second sample analyzer 21 is used for sampling or grabbing samples located at the second processing bit 113. The relevant content of the second processing bit 113 may be referred to the first processing bit 112, and will not be described herein.
The first processing bit 112 is located remotely from the loading bit 111 relative to the second processing bit 113.
The remaining components in the first sample analyzer 20 and the second sample analyzer 21 perform sample analysis on the sample, specifically, sample analysis related to the detection item of the sample. The detection items of the first sample analyzer 20 and the second sample analyzer 21 may be one or more of blood routine detection items, specific protein detection items, immunological detection items, saccharification detection items (saccharification detection items can detect glycosylated hemoglobin GHB), or the like. The detection mode of the sample analyzer 20 for blood routine detection items may be any one mode or any combination of modes of CBC (whole blood count), DIFF (five-class white blood cell assay) and RET (reticulocyte), and the detection mode of the sample analyzer 20 for specific protein detection items may be any one mode or any combination of modes of SAA (serum amyloid a), CRP (C-reactive protein), PCT (procalcitonin) or IL-6 (interleukin 6).
It should be noted that the processing (sampling or grabbing processing) and the detection (primary detection and secondary detection) in the present application are performed in units of test tube racks. For example, when the feed rail 11 moves the rack to the first processing position 112, it means that the first sample analyzer 20 processes (samples or grips) the samples at all positions on the rack to perform the initial inspection (or the re-inspection) of the samples at all positions on the rack. The feed rail 11 moves the rack to the second treatment station 113 and vice versa.
The control device is respectively connected with the sample injection device 10, the first sample analyzer 20 and the second sample analyzer 21, wherein the control device specifically controls the first sample analyzer 20 to process (sample or grab) the first sample on the first test tube rack at the first processing position 112 according to the control method of sample review provided by the application; controlling the second sample analyzer 21 to process (sample or grasp) the second sample on the second rack of test tubes at the second processing position 113; the first sample analyzer 20 and the second sample analyzer 21 are specifically controlled to record samples to be retested on the first test tube rack 30 and the second test tube rack 31 respectively; specifically controlling the sample injection device 10, especially controlling the movement mode of the feeding track 11 to complete the processing of the first sample at all positions on the first test tube rack 30 and the second sample at all positions on the second test tube rack 31; specifically controlling the feed rail 11 to stop moving after the first sample processing at the last position on the first test tube rack 30 is completed; the sample feeding device 10 is specifically controlled, and particularly, the movement mode of the feeding track 11 is controlled so that the recorded retest samples are moved to processing positions corresponding to the retest analyzers, and the retest analyzers perform the retest of the retest samples in sequence.
The dual sample analysis system provided in this embodiment, the control device is respectively connected with the sample injection device 10, the first sample analyzer 20 and the second sample analyzer 21, and the control device specifically controls the first sample analyzer 20 and the second sample analyzer 21 to record samples to be re-inspected on the first test tube rack 30 and the second test tube rack 31 respectively; specifically controlling the feed rail 11 to stop moving after the first sample processing at the last position on the first test tube rack 30 is completed; specifically controlling the sample feeding device 10, especially controlling the moving mode of the feeding track 11 so that the recorded re-inspection sample is moved to a processing position corresponding to the re-inspection analyzer, and sequentially re-inspecting the re-inspection sample by the re-inspection analyzer; the initial detection speed of the rest first samples on the first test tube rack 30 and the rest second samples on the second test tube rack 31 is accelerated by recording the retest samples, meanwhile, the feeding track is controlled to stop moving after the first samples at the last position on the first test tube rack 30 are processed, so that the feeding track is prevented from moving possibly in a period from the completion of the first samples at the last position on the first test tube rack 30 to the confirmation of the retest analyzer, the abrasion of the feeding track 11 is reduced, the accuracy of the staying position of the feeding track 11 during loading and conveying the test tube racks is improved, and the service life of a sample analysis system is prolonged.
The control method of the sample review according to the control device of the dual sample analysis system is as follows. Referring to fig. 2, fig. 2 is a flow chart of an embodiment of a control method for sample review provided in the present application. The control method for sample rechecking comprises the following steps:
step S1: after the first sample on the first test tube rack at the first processing position is processed by the first sample analyzer and/or the second sample on the second test tube rack at the second processing position is processed by the second sample analyzer, whether the processing of the first sample at the last position on the first test tube rack is finished or not is confirmed.
To perform initial inspection of the first sample on the first rack 30 and the second sample on the second rack 31, the feed rail 11 conveys the first rack 30 to the first processing position 112 corresponding to the first sample analyzer 20, and conveys the second rack 31 to the second processing position 113 corresponding to the second sample analyzer 21, the first sample on the first rack 30 at the first processing position 112 is processed by the first sample analyzer 20, and the second sample on the second rack 31 at the second processing position 113 is processed by the second sample analyzer 21.
The process is specifically a sampling or grabbing process. When the processing is specifically sampling processing, the processing is completed, namely the sampling component of the sample analyzer extends out of the sample analyzer to sample the sample, and the sampling is completed; when the processing is specifically grabbing, the processing is completed, namely the grabbing component of the sample analyzer stretches out of the sample analyzer, the test tube is grabbed and conveyed to the inside of the sample analyzer, the sampling component of the sample analyzer samples the sample, and after the sampling is completed, the grabbing component of the sample analyzer stretches out of the sample analyzer, and the test tube is put back to the test tube rack.
After the first sample on the first tube rack 30 at the first processing position 112 is processed by the first sample analyzer 20 and/or the second sample on the second tube rack 31 at the second processing position 113 is processed by the second sample analyzer 21, it is confirmed whether or not the processing of the first sample at the last position on the first tube rack 30 is completed at this time. That is, after the first sample on the first rack 30 at the first processing position 112 is processed by the first sample analyzer 20, it is necessary to confirm whether the processing of the first sample at the last position on the first rack 30 is completed at this time; after the second sample on the second rack 31 at the second processing position 113 is processed by the second sample analyzer 21, it is also necessary to confirm whether the processing of the first sample at the last position on the first rack 30 is completed at this time; after the first sample on the first rack 30 at the first processing position 112 is processed by the first sample analyzer 20 and the second sample on the second rack 31 at the second processing position 113 is processed by the second sample analyzer 21, it is also necessary to confirm whether the processing of the first sample at the last position on the first rack 30 is completed at this time, which is a more specific case when the conveyance of the first rack 30 and the second rack 31 by the feeding rail 11 is exactly synchronized.
Step S1 indicates that the feeding rail 11 does not limit whether the first tube rack 30 and the second tube rack 31 are transported in synchronization. However, the conveyance of the first tube rack 30 and the second tube rack 31, whether synchronized or unsynchronized, needs to satisfy the following conditions: the time node at which the first sample processing at the last position on the first tube rack 30 is completed is between the time node at which the second sample processing at the penultimate position on the second tube rack 31 is completed and the time node at which the second sample processing at the last position on the second tube rack 31 is completed (before completion or at the same time as completion). Such condition settings are to ensure that: if the processing is completed in response to the first sample at the last position on the first tube rack 30 at this time, the processed first sample on the first tube rack 30 at the first processing position 112 and/or the processed second sample on the second tube rack 31 at the second processing position 113 are/is the first sample at the last position on the first tube rack 30 and/or the second sample at the last position on the second tube rack 31.
And step S20, in response to the fact that the first sample at the last position on the first test tube rack is not processed, the feeding track is controlled to advance, so that the first sample analyzer processes the first sample at the next position of the first test tube rack and/or the second sample analyzer processes the second sample at the next position of the second test tube rack, meanwhile, whether the first sample at the first processing position and/or the second sample at the second processing position is a reinspected sample or not is judged, and if yes, the first sample analyzer and/or the second sample analyzer record.
In response to the fact that the first sample at the last position on the first rack 30 is not processed, that is, the processed first sample on the first rack 30 at the first processing position 112 and/or the processed second sample on the second rack 31 at the second processing position 113 are not processed, the feeding rail 11 is controlled to advance so that the first sample analyzer 20 processes the first sample at the next position on the first rack 30 and/or the second sample analyzer 21 processes the second sample at the next position on the second rack 31. This is so arranged that the first sample analyzer 20 processes the first samples at all positions on the first tube rack 30 and the second sample analyzer 21 processes the second samples at all positions on the second tube rack 31.
While determining whether the first sample previously located at the first processing bit 112 and/or the second sample located at the second processing bit 113 is a retest sample, and if so, recording by the first sample analyzer 20 and/or the second sample analyzer 21. The setting of recording the re-inspection samples is to take into account the acceleration of the initial inspection speed of the remaining first samples on the first tube rack 30 and the remaining second samples on the second tube rack 31.
And step S2, in response to the completion of the processing of the first sample at the last position on the first test tube rack, controlling the feeding track to stop moving, judging whether the first sample at the last position on the first test tube rack and/or the second sample at the last position on the second test tube rack are retested samples or not, and if so, recording by the first sample analyzer and/or the second sample analyzer.
In response to the completion of the first sample processing at the last position on the first tube rack 30 at this time, that is, the first sample on the first tube rack 30 at the first processing position 112 and/or the second sample on the second tube rack 31 at the second processing position 113 at which the processing is completed, being the first sample at the last position on the first tube rack 30 and/or the second sample at the last position on the second tube rack 31, the movement of the feed rail 11 is controlled to stop. At this time, the feeding rail 11 is controlled to stop moving, so that the feeding rail 11 is maximally prevented from moving which may occur during a period of time from when the first sample processing at the last position on the first rack 30 is completed to before the next step starts.
Meanwhile, whether the first sample at the last position on the first test tube rack 30 and/or the second sample at the last position on the second test tube rack 31 are retested samples is judged, and if so, the first sample analyzer 20 and/or the second sample analyzer 21 record the second sample.
And S3, confirming a re-inspection analyzer for re-inspecting the re-inspected samples recorded on the first test tube rack and/or the second test tube rack from the first sample analyzer and the second sample analyzer, controlling the movement of the feeding track so that the recorded re-inspected samples are moved to processing positions corresponding to the re-inspection analyzer, and sequentially re-inspecting the recorded re-inspected samples by the re-inspection analyzer.
When all the processing of the first samples on the first test tube rack 30 is completed and the judgment of whether the first samples on the first test tube rack 30 need to be retested and the recording are completed, the retesting step for the retested samples recorded on the first test tube rack 30 can be started; when the second sample on the second test tube rack 31 is completely processed and the judgment of whether the second sample on the second test tube rack 31 needs to be retested and the recording are completely completed, the retesting step for the retested sample recorded on the second test tube rack 31 can be started. Thus, after the first sample analyzer 20 and/or the second sample analyzer 21 determines whether the first sample at the last position on the first rack 30 and/or the second sample at the last position on the second rack 31 is the retest sample and the recording is completed, the step of the retest section may be started.
The re-inspection analyzer for re-inspecting the re-inspected samples recorded on the first test tube rack 30 and/or the second test tube rack 31 is confirmed from the first sample analyzer 20 and the second sample analyzer 21, and the re-inspection of the re-inspected samples on the first test tube rack 30 in this embodiment is not necessarily performed by the first sample analyzer 20, and the re-inspected samples on the second test tube rack 31 is not necessarily performed by the second sample analyzer 21.
That is, when the recorded retest samples are one or more of the first samples, the retest analyzer that performs the retest on the recorded retest samples, which is confirmed from the first sample analyzer 20 and the second sample analyzer 21, is the first sample analyzer 20 (in this case, the original retest) or the second sample analyzer 21 (in this case, the replacement retest); when the recorded retest samples are one or more of the second samples, the retest analyzer that performs the retest on the recorded retest samples, which is confirmed from the first sample analyzer 20 and the second sample analyzer 21, is the first sample analyzer 20 (in this case, the machine change retest) or the second sample analyzer 21 (in this case, the machine change retest).
After the completion of the review analyzer is confirmed, the feeding rail 11 is controlled to move so that the recorded review sample is moved to a processing position corresponding to the review analyzer, and the recorded review sample is sequentially subjected to the review by the review analyzer.
In the control method for re-testing samples provided in the embodiment, the first sample analyzer 20 and the second sample analyzer 21 record samples to be re-tested on the first test tube rack 30 and the second test tube rack 31 respectively; in response to completion of the first sample processing at the last position on the first rack 30, the feeding rail 11 is controlled to stop moving; controlling the movement of the feeding track 11 so that the recorded re-inspection samples are moved to processing positions corresponding to the re-inspection analyzers, and sequentially re-inspecting the re-inspection samples by the re-inspection analyzers; the initial detection speed of the rest first samples on the first test tube rack 30 and the rest second samples on the second test tube rack 31 is accelerated by recording the retest samples, meanwhile, the feeding track 11 is controlled to stop moving after the first samples at the last position on the first test tube rack 30 are processed, so that the feeding track 11 is prevented from moving possibly in a period from the completion of the first samples at the last position on the first test tube rack 30 to the confirmation of the retest analyzer, the abrasion of the feeding track 11 is reduced, the accuracy of the stopping position of the feeding track 11 when the test tube racks are loaded and transported is improved, and the service life of a sample analysis system is prolonged.
Alternatively, when both the recorded retest samples on the first tube rack 30 and the recorded retest samples on the second tube rack 31 are subjected to the original retest, that is, in the case where the recorded retest samples are one or more of the first samples and the retest analyzer is the first sample analyzer 20 and the recorded retest samples are one or more of the second samples and the retest analyzer is the second sample analyzer 21, the following two moving manners exist for the feeding rail 11.
The first moving mode is as follows: controlling the feeding track 11 to retract so that the first recorded retest sample on the test tube rack is moved to a processing position corresponding to the retest analyzer; the feeding rail 11 is controlled to advance so that the rest of the recorded retest samples on the test tube rack are sequentially moved to the processing positions corresponding to the retest analyzers. The first moving mode corresponds to the re-inspection sequence from the first recorded re-inspection sample on the test tube rack to the last recorded re-inspection sample on the test tube rack, wherein the first moving mode is sequentially moved to the processing position corresponding to the original sample analyzer, and the original sample analyzer sequentially performs re-inspection.
The second moving mode: the feeding track 11 is controlled to be kept still (namely, the sample at the last position on the test tube rack is the retest sample at the moment) or the feeding track 11 is controlled to be retracted so that the last recorded retest sample on the test tube rack is moved to a processing position corresponding to the retest analyzer; the feeding track 11 is controlled to retract so that the rest recorded retest samples on the test tube rack are sequentially moved to the processing position corresponding to the retest analyzer. The second moving mode corresponds to the re-inspection sequence from the last recorded re-inspection sample on the test tube rack to the first recorded re-inspection sample on the test tube rack, wherein the first recorded re-inspection sample is sequentially moved to the processing position corresponding to the original sample analyzer, and the original sample analyzer sequentially performs re-inspection.
Alternatively, when the recorded retest samples on the first test tube rack 30 are subjected to the change-over retest, that is, in the case where the recorded retest samples are one or more of the first samples and the retest analyzer is the second sample analyzer 21, the feeding rail 11 has the following two moving manners.
The first moving mode is as follows: controlling the feeding rail 11 to retract so that the first recorded retest sample on the first test tube rack 30 is moved to the second processing position 113; the feeding rail 11 is controlled to advance again so that the remaining recorded retest samples on the first tube rack 30 are sequentially moved to the second processing position 113. The first moving mode corresponds to a re-inspection sequence from the first recorded re-inspection sample on the first test tube rack 30 to the last recorded re-inspection sample on the first test tube rack 30, which is sequentially moved to the second processing position 113, and is sequentially re-inspected by the second sample analyzer 21.
The second moving mode: controlling the feeding track 11 to retract so that the last recorded retest sample on the first test tube rack 30 is moved to the second processing position 113; the feeding rail 11 is controlled to retract continuously, so that the rest of the recorded retest samples on the first test tube rack 30 are sequentially moved to the second processing position 113. The second moving means corresponds to a re-inspection sequence from the last recorded re-inspection sample on the first test tube rack 30 to the first recorded re-inspection sample on the first test tube rack 30, which is sequentially moved to the second processing position 113, and sequentially re-inspected by the second sample analyzer 21.
Alternatively, when the recorded retest samples on the second test tube rack 31 are subjected to the change-over retest, that is, in the case where the recorded retest samples are one or more of the second samples and the retest analyzer is the first sample analyzer 20, the feeding rail 11 has the following two moving manners.
The first moving mode is as follows: controlling the advance of the feed rail 11 so that the first recorded retest sample on the second rack 31 is moved to the first processing position 112; the feed rail 11 is controlled to advance further so that the remaining recorded retest samples on the second rack 31 are sequentially moved to the first processing station 112.
The first moving mode corresponds to a re-inspection sequence from the first recorded re-inspection sample on the second test tube rack 31 to the last recorded re-inspection sample on the second test tube rack 31, which is sequentially moved to the first processing position 112, and is sequentially re-inspected by the first sample analyzer 20.
The second moving mode: controlling the feed rail 11 to advance so that the last recorded retest sample on the second tube rack 31 is moved to the first processing position 112; the feeding rail 11 is controlled to retract so that the rest of the recorded retest samples on the second rack 31 are sequentially moved to the first processing position 112.
The second moving mode corresponds to a re-inspection sequence from the last recorded re-inspection sample on the second test tube rack 31 to the first recorded re-inspection sample on the second test tube rack 31, which is sequentially moved to the first processing position 112, and is sequentially re-inspected by the first sample analyzer 20.
In order to implement the above-mentioned control method for sample review, the present application further provides a control device, please refer to fig. 3, fig. 3 is a schematic structural diagram of the control device provided in the present application.
The control device 30 provided in the present application includes a memory 31 and a processor 32.
Specifically, the memory 31 is coupled to the processor 32, the program instructions are stored in the memory 31, and the processor 32 is configured to execute the program instructions in the memory 31, so as to implement the control method for sample review in the above embodiment.
In the present embodiment, the processor 32 may also be referred to as a CPU (central processing unit). The processor 32 may be an integrated circuit chip having signal processing capabilities. Processor 32 may also be a general purpose processor, a digital signal processor (DSP, digitalSignalProcess), an application specific integrated circuit (ASIC, applicationSpecificIntegratedCircuit), a field programmable gate array (FPGA, fieldProgrammableGateArray) or other programmable logic device, a discrete gate or transistor logic device, a discrete hardware component. The general purpose processor may be a microprocessor or the processor 32 may be any conventional processor or the like.
The control device provided in the embodiment of the present application may achieve the same technical effects as the sample analysis system and the control method for sample review provided in the foregoing embodiments, so that repetition is avoided and no further description is provided herein.
The present application further provides a computer readable storage medium, please refer to fig. 4, fig. 4 is a schematic structural diagram of the computer readable storage medium provided in the present application. The computer readable storage medium 40 stores program instructions 41, which program instructions 41, when executed by the processor 32, are configured to implement the sample review control method of the above-described embodiment.
Embodiments of the present application are implemented in the form of software functional units and sold or used as a stand-alone product, which may be stored on a computer readable storage medium. Based on such understanding, the technical solution of the present application may be embodied in essence or a part contributing to the prior art or all or part of the technical solution, or in the form of a software product stored in a storage medium, including several instructions to cause a computer device (which may be a personal computer, a computer device, or a network device, etc.) or a processor (processor) to perform all or part of the steps of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: a usb disk, a removable hard disk, a Read-only memory (ROM), a random access memory (RAM, randomAccessMemory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing description is only of embodiments of the present application, and is not intended to limit the scope of the patent application, and all equivalent structures or equivalent processes using the descriptions and the contents of the present application or other related technical fields are included in the scope of the patent application.

Claims (10)

1. The double-machine sample analysis system is characterized by comprising a sample injection device, a first sample analyzer, a second sample analyzer and control equipment, wherein the sample injection device comprises a feeding track for conveying test tube racks, a loading position, a first processing position corresponding to the first sample analyzer and a second processing position corresponding to the second sample analyzer are arranged on the feeding track, the first sample analyzer is used for sampling or grabbing samples positioned at the first processing position, the second sample analyzer is used for sampling or grabbing samples positioned at the second processing position, and the first sample analyzer is far away from the loading position relative to the second sample analyzer;
the control equipment is respectively connected with the sample injection device, the first sample analyzer and the second sample analyzer, wherein the control equipment is used for:
After the first sample on the first test tube rack at the first processing position is processed by the first sample analyzer and/or the second sample on the second test tube rack at the second processing position is processed by the second sample analyzer, confirming whether the processing of the first sample at the last position on the first test tube rack is finished or not;
controlling the feeding track to advance in response to the fact that the first sample at the last position on the first test tube rack is not processed, so that the first sample analyzer processes the first sample at the next position of the first test tube rack and/or the second sample analyzer processes the second sample at the next position of the second test tube rack, and meanwhile judging whether the first sample at the first processing position and/or the second sample at the second processing position is a recheck sample or not, and if yes, recording by the first sample analyzer and/or the second sample analyzer;
responding to the completion of the first sample processing at the last position on the first test tube rack, controlling the feeding track to stop moving, judging whether the first sample at the last position on the first test tube rack is a retest sample or not, and if so, recording by the first sample analyzer;
And confirming a re-inspection analyzer for re-inspecting the re-inspected samples recorded on the first test tube rack and/or the second test tube rack from the first sample analyzer and the second sample analyzer, controlling the feeding track to move so that the recorded re-inspected samples are moved to processing positions corresponding to the re-inspection analyzer, and sequentially re-inspecting the recorded re-inspected samples by the re-inspection analyzer.
2. A control method for sample review applied to the dual sample analysis system according to claim 1, wherein the control method comprises:
after the first sample on the first test tube rack at the first processing position is processed by the first sample analyzer and/or the second sample on the second test tube rack at the second processing position is processed by the second sample analyzer, confirming whether the processing of the first sample at the last position on the first test tube rack is finished or not;
controlling the feeding track to advance in response to the fact that the first sample at the last position on the first test tube rack is not processed, so that the first sample analyzer processes the first sample at the next position of the first test tube rack and/or the second sample analyzer processes the second sample at the next position of the second test tube rack, and meanwhile judging whether the first sample at the first processing position and/or the second sample at the second processing position is a recheck sample or not, and if yes, recording by the first sample analyzer and/or the second sample analyzer;
Responding to the completion of the first sample processing at the last position on the first test tube rack, controlling the feeding track to stop moving, judging whether the first sample at the last position on the first test tube rack is a retest sample or not, and if so, recording by the first sample analyzer;
and confirming a re-inspection analyzer for re-inspecting the re-inspected samples recorded on the first test tube rack and/or the second test tube rack from the first sample analyzer and the second sample analyzer, controlling the feeding track to move so that the recorded re-inspected samples are moved to processing positions corresponding to the re-inspection analyzer, and sequentially re-inspecting the recorded re-inspected samples by the re-inspection analyzer.
3. The control method according to claim 2, wherein when the recorded retest samples are one or more of first samples, a retest analyzer that retests the recorded retest samples, which is confirmed from among the first sample analyzer and the second sample analyzer, is the first sample analyzer or the second sample analyzer.
4. The control method according to claim 2, wherein when the recorded retest samples are one or more of second samples, a retest analyzer that retests the recorded retest samples, which is confirmed from among the first sample analyzer and the second sample analyzer, is the first sample analyzer or the second sample analyzer.
5. The control method according to claim 3 or 4, wherein, in a case where the re-inspection sample being recorded is one or more of first samples, and the re-inspection analyzer is one or more of the first sample analyzer and the re-inspection sample being recorded is one or more of second samples, and the re-inspection analyzer is the second sample analyzer, the step of controlling the feeding track to move so that the re-inspection sample being recorded is moved to a processing bit corresponding to the re-inspection analyzer includes:
controlling the feeding track to retract so that the first recorded retest sample on the test tube rack is moved to a processing position corresponding to the retest analyzer;
and then controlling the feeding track to advance so that the rest recorded retest samples on the test tube rack are sequentially moved to a processing position corresponding to the retest analyzer.
6. The control method according to claim 3 or 4, wherein, in a case where the re-inspection sample being recorded is one or more of first samples, and the re-inspection analyzer is one or more of the first sample analyzer and the re-inspection sample being recorded is one or more of second samples, and the re-inspection analyzer is the second sample analyzer, the step of controlling the feeding track to move so that the re-inspection sample being recorded is moved to a processing bit corresponding to the re-inspection analyzer includes:
Controlling the feeding track to be kept motionless or controlling the feeding track to retract so as to enable the last recorded retest sample on the test tube rack to be moved to a processing position corresponding to the retest analyzer;
and controlling the feeding track to retract so that the rest recorded retest samples on the test tube rack are sequentially moved to a processing position corresponding to the retest analyzer.
7. A control method according to claim 3, wherein, in the case where the re-inspection sample being recorded is one or more of the first samples and the re-inspection analyzer is the second sample analyzer, the step of controlling the feed rail movement so that the re-inspection sample being recorded moves to a processing bit corresponding to the re-inspection analyzer includes:
controlling the feeding track to retract so that the first recorded retest sample on the first test tube rack is moved to the second processing position;
and then controlling the feeding track to advance so that the rest recorded retest samples on the first test tube rack are sequentially moved to the second processing position.
8. The control method according to claim 4, wherein, in the case where the re-inspection sample being recorded is one or more of second samples and the re-inspection analyzer is the first sample analyzer, the step of controlling the feed rail movement so that the re-inspection sample being recorded is moved to a processing bit corresponding to the re-inspection analyzer includes:
Controlling the feed track to advance so that the first recorded retest sample on the second test tube rack is moved to the first processing position;
and then controlling the feeding track to continue to advance so that the rest recorded retest samples on the second test tube rack are sequentially moved to the first processing position.
9. A control device comprising a memory for storing a computer program and a processor for executing the computer program to implement the control method according to any one of claims 2-8.
10. A computer readable storage medium, characterized in that the computer readable storage medium has stored thereon a computer program for realizing the control method according to any of claims 2-8 when being executed by a processor.
CN202310260415.1A 2023-03-10 2023-03-10 Dual-machine sample analysis system, control method, equipment and medium Pending CN116400089A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310260415.1A CN116400089A (en) 2023-03-10 2023-03-10 Dual-machine sample analysis system, control method, equipment and medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310260415.1A CN116400089A (en) 2023-03-10 2023-03-10 Dual-machine sample analysis system, control method, equipment and medium

Publications (1)

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CN116400089A true CN116400089A (en) 2023-07-07

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