CN116298341A - Sample analysis system, transport control method, apparatus, and medium - Google Patents

Sample analysis system, transport control method, apparatus, and medium Download PDF

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Publication number
CN116298341A
CN116298341A CN202310259123.6A CN202310259123A CN116298341A CN 116298341 A CN116298341 A CN 116298341A CN 202310259123 A CN202310259123 A CN 202310259123A CN 116298341 A CN116298341 A CN 116298341A
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test tube
sample
samples
tube rack
retest
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CN202310259123.6A
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Chinese (zh)
Inventor
龙晚
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Shenzhen Dymind Biotechnology Co Ltd
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Shenzhen Dymind Biotechnology Co Ltd
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Priority to CN202310259123.6A priority Critical patent/CN116298341A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

The application discloses a sample analysis system, a method, equipment and a medium for controlling transportation. The sample analysis system comprises a sample injection device, a first sample analyzer, a second sample analyzer and control equipment, wherein the control equipment is used for controlling the sample injection device to scan a first test tube; after the first sample analyzer finishes sampling or grabbing a first test tube, controlling the feeding track to retract by a preset value so as to load a second test tube rack; controlling the sample injection device to sweep the code of the second test tube; and under the condition that the first sample analyzer samples or grabs the second first test tube of the first test tube rack, controlling the second sample analyzer to sample or grab the first second test tube of the second test tube rack. The control of the backspacing distance when loading the second test tube rack makes two sample analyzers sample or snatch the sample on two rows of test tube racks simultaneously, avoids feeding the track and need make a round trip movement between two sample analyzers, has alleviateed the loss degree that feeds the track.

Description

Sample analysis system, transport control method, apparatus, and medium
Technical Field
The present disclosure relates to the field of medical devices, and in particular, to a sample analysis system, a method and apparatus for controlling transportation, and a medium.
Background
In the existing dual sample analysis system, two rows of test tube racks are usually loaded on a track so that one sample analyzer corresponds to one row of test tube racks, and in order to improve the utilization rate of the two sample analyzers, the track needs to move back and forth in the two sample analyzers so as to timely convey test tubes on the first test tube rack to the second sample analyzer and timely convey test tubes on the second test tube rack to the second sample analyzer.
The track constantly moves back and forth between two sample analyzers for the wearing and tearing of track are big, and then have influenced the track and have stopped the degree of accuracy in position when loading, transporting the test-tube rack.
Disclosure of Invention
The application provides a sample analysis system, a control method for sample transportation, control equipment and a medium, so as to solve the technical problems.
In order to solve the above problems, a first aspect of the present application provides a sample analysis system, including a sample injection device, a first sample analyzer, a second sample analyzer, and a control device, where the sample injection device includes a feeding track for transporting a test tube rack, and a loading position, a scanning position, a first position, and a second position are disposed on the feeding track; the first sample analyzer and the second sample analyzer are arranged on the same side of the feeding track, detection items of the first sample analyzer and the second sample analyzer for samples are the same, the first sample analyzer is used for detecting the samples positioned at a first position, the second sample analyzer is used for detecting the samples positioned at a second position, the first sample analyzer is far away from the loading position relative to the second sample analyzer, the first position is far away from the loading position relative to the second position, and the scanning position is positioned between the loading position and the second position; the control equipment is respectively connected with the sample injection device, the first sample analyzer and the second sample analyzer, wherein the control equipment is used for: the sample injection device is controlled to move the first test tube rack to a scanning position so as to sweep the first test tube of the first test tube rack; the sample injection device is controlled to move the first test tube rack from scanning to a first position, so that the first sample analyzer samples or grabs a first test tube of the first test tube rack; when the first sample analyzer finishes sampling or grabbing a first test tube of the first test tube rack, controlling the feeding track to retract by a preset value so as to load a second test tube rack in a loading position; the sample injection device is controlled to move the second test tube rack to a scanning position so as to sweep the second test tube of the second test tube rack; the control sampling device is used for moving the second test tube rack from the scanning position to the second position so as to control the second sample analyzer to sample or grab the first second test tube of the second test tube rack under the condition that the first sample analyzer samples or grabs the second first test tube of the first test tube rack.
Further, the sample analysis system further includes a recheck initiation bit including a first recheck initiation bit and a second recheck initiation bit, wherein the first recheck initiation bit may be a first position, the second recheck initiation bit may be a second position or the first recheck initiation bit may be between the first position and the second position, and the second recheck initiation bit may be between the second position and the loading position.
In order to solve the above problems, a second aspect of the present application provides a control method for sample transportation, which is applied to the above sample analysis system, and the control method includes: the sample injection device is controlled to move the first test tube rack to a scanning position so as to sweep the first test tube of the first test tube rack; the sample injection device is controlled to move the first test tube rack from scanning to a first position, so that the first sample analyzer samples or grabs a first test tube of the first test tube rack; when the first sample analyzer finishes sampling or grabbing a first test tube of the first test tube rack, controlling the feeding track to retract by a preset value so as to load a second test tube rack in a loading position; the sample injection device is controlled to move the second test tube rack to a scanning position so as to sweep the second test tube of the second test tube rack; the control sampling device is used for moving the second test tube rack from the scanning position to the second position so as to control the second sample analyzer to sample or grab the first second test tube of the second test tube rack under the condition that the first sample analyzer samples or grabs the second first test tube of the first test tube rack.
Further, after the step of controlling the sample injection device to move the first test tube rack to the scanning position to scan the first test tube of the first test tube rack, before the step of controlling the sample injection device to move the first test tube rack from the scanning position to the first position, the control method further comprises: detecting whether the first sample analyzer is in a busy state; and in response to the first sample analyzer being in a busy state, controlling the sample injection device to move the first test tube rack from the scanning position to the second position so that the second sample analyzer samples or grabs a first test tube of the first test tube rack.
Further, the control method further includes: after the first samples on all the first test tube racks and the second samples on all the second test tube racks are subjected to primary detection, judging whether the retest samples exist in all the first samples and all the second samples; responding to the existence of the retest samples in all the first samples and/or all the second samples, controlling the feeding track to retract, and moving the test tube rack corresponding to the retest samples to the retest initial position; and controlling the feeding track to advance, and shifting the test tube rack corresponding to the re-inspection sample from the initial re-inspection to the initial inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample.
Further, in response to the presence of the retest samples in all the first samples and/or all the second samples, controlling the feeding track to retract, and moving the test tube rack corresponding to the retest samples to the retest initial position; the step of controlling the advance of the feeding track to move the test tube rack corresponding to the re-inspection sample from the initial displacement to the initial inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample comprises the following steps: in response to the presence of the retest samples in all the first samples and all the second samples, controlling the feed track to retract, moving the first test tube rack to a first retest initial position, and moving the second test tube rack to a second retest initial position; and controlling the feeding track to advance, and moving the first test tube rack from the first retest initial position to the first sample analyzer and moving the second test tube rack from the second retest initial position to the second sample analyzer so as to retest the retest samples.
Further, in response to the presence of the retest samples in all the first samples and/or all the second samples, controlling the feeding track to retract, and moving the test tube rack corresponding to the retest samples to the retest initial position; the step of controlling the advance of the feeding track to move the test tube rack corresponding to the re-inspection sample from the initial displacement to the initial inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample comprises the following steps: responding to the existence of the reinspection samples in all the first samples, and controlling the feeding track to retract if the reinspection samples do not exist in all the second samples, and moving the first test tube rack to a first reinspection initial position; and controlling the feeding track to advance, and initially moving the first test tube rack from the first retest to the first sample analyzer so as to retest the retest samples.
Further, in response to the presence of the retest samples in all the first samples and/or all the second samples, controlling the feeding track to retract, and moving the test tube rack corresponding to the retest samples to the retest initial position; the step of controlling the advance of the feeding track to move the test tube rack corresponding to the re-inspection sample from the initial displacement to the initial inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample comprises the following steps: in response to the absence of the retest sample in all the first samples and the presence of the retest sample in all the second samples, controlling the feeding track to retract, and moving the second test tube rack to a second retest initial position; and controlling the feeding track to advance, and initially displacing the second test tube rack from the second retest to the second sample analyzer so as to retest the retest samples.
In order to solve the above-mentioned problems, a third aspect of the present application provides a control apparatus including a memory for storing a computer program and a processor for executing the computer program to implement the above-mentioned control method.
In order to solve the above-mentioned problems, a fourth aspect of the present application provides a computer-readable storage medium having stored thereon a computer program for implementing the above-mentioned control method when executed by a processor.
The beneficial effects of this application lie in: compared with the prior art, the control method for sample conveying is applied to a sample analysis system, and the sample injection device is controlled to move the first test tube rack to a scanning position so as to scan the first test tube of the first test tube rack; the sample injection device is controlled to move the first test tube rack from scanning to a first position, so that the first sample analyzer grabs a first test tube of the first test tube rack, and performs primary detection on a first sample stored in the first test tube; controlling the feeding track to retract to a loading position so as to load a second test tube rack; the sample injection device is controlled to move the second test tube rack to a scanning position so as to sweep the second test tube of the second test tube rack; the sample injection device is controlled to move the second test tube rack from scanning to a second sampling position, so that the second sample analyzer can grab second test tubes of the second test tube rack and perform primary detection on second samples stored in the second test tubes. The second test tube rack is reloaded through the feeding track, and the first test tube rack and the second test tube rack are respectively detected on the first sample analyzer and the second sample analyzer, so that the detection efficiency of the sample analyzer is improved, the conveying distance of the test tube rack on the feeding track can be reduced, the abrasion to the feeding track is reduced, the service life of the feeding track is prolonged, and the accuracy of the stopping positions of the feeding track in the loading position, the first position, the second sampling position and the like is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art. Wherein:
FIG. 1 is a schematic diagram of an embodiment of a sample analysis system provided herein;
FIG. 2 is a flow chart of an embodiment of a method for controlling sample transport provided herein;
FIG. 3 is a flow chart illustrating an embodiment of the steps between the steps S1 and S2 in FIG. 2;
FIG. 4 is a flow chart of another embodiment of a method for controlling sample transport provided herein;
FIG. 5 is a schematic structural view of the control device provided in the present application;
fig. 6 is a schematic structural diagram of a computer-readable storage medium provided in the present application.
Reference numerals: a sample introduction device 10; a first sample analyzer 20; a second sample analyzer 21; a feed rail 11; a loading station 111; scanning bits 112; a first location 113; a second location 114.
Detailed Description
The following description of the technical solutions in the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The terms "first," "second," "third," "fourth" and the like in the description and in the claims of this application and in the above-described figures, if any, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the present application described herein may be implemented, for example, in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
An embodiment of the present application provides a sample analysis system, please refer to fig. 1, fig. 1 is a schematic structural diagram of an embodiment of the sample analysis system provided in the present application. The sample analysis system includes a sample introduction device 10, a first sample analyzer 20, a second sample analyzer 21, and a control device (not shown).
The sample introduction device 10 includes a feeding rail 11 for transporting a rack on which a plurality of test tubes are loaded, each of which contains a sample, and the types of samples in the test tubes may be the same or different. In some embodiments, the sample may be a sample containing various types of biological cell information or other biological information, such as a blood sample, a urine sample, other body fluids (hydrothorax and ascites, cerebrospinal fluid, serosal cavity effusion, synovial fluid), and the like.
The first sample analyzer 20 and the second sample analyzer 21 are identical two sample analyzers, and specifically, the first sample analyzer 20 and the second sample analyzer 21 are identical in terms of detection items, detection modes, and the like. The first sample analyzer 20 and the second sample analyzer 21 are located on the same side of the feed rail 11.
The first sample analyzer 20 and the second sample analyzer 21 share the sample introduction device 10, that is, when the sample introduction device 10 conveys a certain test tube loaded on the test tube rack to a front fixed position of the first sample analyzer 20 and the second sample analyzer 21 through the feed rail 11, the first sample analyzer 20 and the second sample analyzer 21 detect (primary or secondary) a sample contained in the test tube.
Specifically, if the front fixed positions of the first sample analyzer 20 and the second sample analyzer 21 are sampling positions where sampling can be performed, the first sample analyzer 20 and the second sample analyzer 21 sample the sample in the test tube, that is, the sampling parts of the first sample analyzer 20 and the second sample analyzer 21 protrude out of the first sample analyzer 20 and the second sample analyzer 21 to sample the sample in the test tube, and the sampling parts and the sample return to the first sample analyzer 20 and the second sample analyzer 21, and the rest parts in the first sample analyzer 20 and the second sample analyzer 21 perform sample analysis on the sample; if the front fixed positions of the first sample analyzer 20 and the second sample analyzer 21 are the grasping positions where grasping can be performed, the first sample analyzer 20 and the second sample analyzer 21 grasp the test tube, that is, the grasping members of the first sample analyzer 20 and the second sample analyzer 21 protrude out of the first sample analyzer 20 and the second sample analyzer 21 to grasp the test tube, and the grasping members and the test tube return to the first sample analyzer 20 and the second sample analyzer 21, at which time the sampling members in the first sample analyzer 20 and the second sample analyzer 21 sample the sample in the test tube, and the remaining members in the first sample analyzer 20 and the second sample analyzer 21 sample the sample.
The first sample analyzer 20 and the second sample analyzer 21 detect the sample contained in the test tube.
The detection items of the first sample analyzer 20 and the second sample analyzer 21 may be one or more of blood routine detection items, specific protein detection items, immunological detection items, saccharification detection items (saccharification detection items can detect glycosylated hemoglobin GHB), or the like. The detection mode of the first sample analyzer 20 and the second sample analyzer 21 for blood routine detection items may be any one mode or any combination of modes of CBC (whole blood count), DIFF (five-class white blood cell assay) and RET (reticulocyte), and the detection mode of the first sample analyzer 20 and the second sample analyzer 21 for specific protein detection items may be any one mode or any combination of modes of SAA (serum amyloid a), CRP (C-reactive protein), PCT (procalcitonin) or IL-6 (interleukin 6).
The feed rail 11 is provided with a loading position 111, a scanning position 112, a first position 113 and a second position 114.
The loading position 111 corresponds to a loading area, which is located on the other side of the feed rail 11. The test tube rack is loaded onto the feed rail 11 at the loading position 111, and is subsequently transported by the feed rail 11.
The row of tube racks that is loaded onto the feed rail 11 at the loading position 111 first of any two rows of tube racks is referred to as a first tube rack, and the subsequent row of tube racks of the first tube rack is referred to as a second tube rack.
The scan bit 112 corresponds to a scanning device. The scanning device needs to scan all test tubes on the test tube rack.
The scanning device scans the test tube, in particular, the bar code on the test tube, to read the relevant information about the test tube contained in the bar code. Specifically, the scanning device scans the bar code on the test tube to obtain the position information of the test tube on the test tube rack, the detection item information of the sample contained in the test tube, and the like.
The first position 113 is a front fixed position of the first sample analyzer 20, that is, the first sample analyzer 20 is configured to detect (primary or secondary) a sample located at the first position 113; the first position 113 may be a sampling position or a grabbing position.
The second position 114 is a front fixed position of the second sample analyzer 21, that is, the second sample analyzer 21 is configured to detect (primary or secondary) the sample located at the second position 114; the second location 114 may be a sampling location or a grasping location.
The first sample analyzer 20 is disposed away from the loading site 111 relative to the second sample analyzer 21; thus, on the feed rail 11, the first position 113 is also arranged away from the loading position 111 relative to the second position 114.
Since the feeding rail 11 also needs to pass through the scanning device between the loading of the test tube rack and the conveying of the test tube rack to the second position 114 and the first position 113, the scanning device scans all devices on the test tube rack, and thus the scanning position 112 is located between the loading position 111 and the second position 114.
It should be noted that the tests (primary test and secondary test) in this application are performed in units of test tube racks. For example, during the initial test, the feeding rail 11 moves the test tube rack to the first position 113, which means that all samples on the test tube rack are initially tested by the first sample analyzer 20; during the retest, the feeding track 11 moves the tube rack to the first position 113, which means that all retest samples on the tube rack are retested by the first sample analyzer 20. The feed rail 11 moves the rack to the second position 114 and vice versa.
The control device is respectively connected with the sample introduction device 10, the first sample analyzer 20 and the second sample analyzer 21, wherein the control device specifically controls the first sample analyzer 20 to sample or grab a test tube positioned at the first position 113 and then performs sample analysis on the sample according to the control method of sample transportation provided by the application; controlling the second sample analyzer 21 to sample or grasp the test tube at the second location 114 and subsequently sample analyze the sample; the sample introduction device 10, in particular the movement of the feed rail 11, is controlled such that in case the first sample analyzer 20 samples or grips a second first test tube of the first test tube rack, the second sample analyzer 21 samples or grips a first second test tube of the second test tube rack.
The first and second test tubes are referred to herein as first and second test tubes in the direction in which the first sample analyzer 20 is directed toward the second sample analyzer 21.
Specifically, the manner of controlling the movement of the feeding rail 11 includes controlling the feeding rail 11 to retract, which means controlling the feeding rail 11 to move in the direction in which the first sample analyzer 20 is directed to the second sample analyzer 21, and controlling the feeding rail 11 to advance, which means controlling the feeding rail 11 to move in the direction in which the second sample analyzer 21 is directed to the first sample analyzer 20.
Optionally, the sample analysis system further includes a re-inspection initiation bit (not shown), including a first re-inspection initiation bit (not shown) and a second re-inspection initiation bit (not shown). The first retest initial position corresponds to the first position 113, i.e. the retest sample that is retested on the first sample analyzer 20 needs to be moved to the first retest initial position first, from which it is moved to the first position 113; the second retest initiation bit corresponds to the second location 114, i.e. the retest sample that is retested on the second sample analyzer 21 needs to be moved to the second retest initiation bit first, from which it is moved to the second location 114.
The first re-inspection initiation bit may be a first location 113, the second re-inspection initiation bit may be a second location 114 or the first re-inspection initiation bit may be between the first location 113 and the second location 114, and the second re-inspection initiation bit may be between the second location 114 and the loading location 111.
The sample analysis system provided in this embodiment, the control device is connected with the sample injection device 10, the first sample analyzer 20 and the second sample analyzer 21 respectively, and the control device ensures that under the condition that the first sample analyzer 20 samples or grabs the second first test tube of the first test tube rack, the second sample analyzer 21 samples or grabs the first second test tube of the second test tube rack by controlling the movement mode of the feeding track 11, so that when the feeding track 11 conveys the test tubes on the two rows of test tube racks to the first position 113 and the second position 114 respectively, the feeding track 11 moves back and forth between the first sample analyzer 20 and the second sample analyzer 21, and the loss degree of the feeding track 11 is reduced.
The control method of sample transport according to the control apparatus of the above-described sample analysis system is as follows. Referring to fig. 2, fig. 2 is a flowchart of a first embodiment of a control method for sample transportation provided in the present application. The sample transport control method of the present embodiment is applied to the sample analysis system described above, and includes the following steps:
Step S1: the sample injection device is controlled to move the first test tube rack to a scanning position so as to sweep the first test tube of the first test tube rack.
The sample injection device 10 is controlled to move the first test tube rack from the loading position 111 to the scanning position 112, and the scanning device positioned on one side of the feeding track 11 scans the first test tubes of the first test tube rack and ensures that all the first test tubes of the first test tube rack are scanned.
In order to ensure that all test tubes on the rack can be scanned during the scanning operation, the feeding rail 11 is controlled to move in the following manner.
First, the feeding rail 11 moves the first test tube on the rack to the scanning position 112, and the bar code on the test tube is scanned by the scanning device. After confirming that the scanning of the bar code on the first test tube is completed, the feeding track 11 is advanced by one test tube distance, the second test tube of the test tube rack is moved to the scanning position 112, and the bar code on the test tube is scanned by the scanning device, and the scanning is sequentially performed.
Optionally, the scanning device and the bar code on the test tube keep a right-facing position relationship, so that the scanning action is convenient to carry out.
Step S2: the sample injection device is controlled to move the first test tube rack from scanning to a first position, so that the first sample analyzer samples or grabs a first test tube of the first test tube rack.
After controlling the sample introduction device 10 to move the first test tube rack and make all the first test tubes of the first test tube rack scanned, the first test tubes on the first test tube rack also need to be initially inspected by the first sample analyzer 20, so that the sample introduction device 10 is controlled to move the first test tube rack from the scanning position 112 to the first position 113, so that the first sample analyzer 20 samples or grabs the first test tubes of the first test tube rack.
Specifically, the sample injection apparatus 10 is controlled to first move the first test tube of the first test tube rack from the scanning position 112 to the first position 113, so that the first sample analyzer 20 samples or grabs the first test tube of the first test tube rack. After the initial test for the first test tube is completed, the sample injection device 10 moves the second first test tube of the first test tube rack to the first position 113, so that the first sample analyzer 20 samples or grabs the second first test tube of the first test tube rack sequentially.
Step S3: and after the first sample analyzer finishes sampling or grabbing a first test tube of the first test tube rack, controlling the feeding track to retract by a preset value so as to load a second test tube rack in a loading position.
After the first sample analyzer 20 finishes sampling or grabbing the first test tube of the first test tube rack, the first sample analyzer 20 ends the idle state, and the second sample analyzer 21 is still in the idle state. To improve the detection efficiency, the feeding rail 11 is controlled to retract to load the second rack at the loading position 111.
After the second test tube rack is successfully loaded, two rows of test tube racks are loaded on the feeding track 11, and the first test tube rack corresponds to the first sample analyzer 20, namely, the feeding track 11 moves the first test tube of the first test tube rack to the first position 113, and the first sample analyzer 20 is used for performing primary detection on the first test tube rack; the second tube rack corresponds to the second sample analyzer 21, i.e. the feeding track 11 moves the first test tubes of the second tube rack to the second position 114 for initial inspection by the second sample analyzer 21.
It should be noted that, for the purpose of optimizing the feeding track 11 to convey two rows of test tube racks, the feeding track 11 is controlled to retract, specifically, the feeding track 11 is controlled to retract by a preset value, and the preset value should satisfy the following conditions:
let X be the preset value, let S be the distance between the loading position 111 and the first position 113, let D be the distance between the first position 113 and the second position 114, let D be the distance between a test tube on the first rack and an adjacent test tube, s=x+d+d.
Step S4: and the sample injection device is controlled to move the second test tube rack to a scanning position so as to sweep the second test tube of the second test tube rack.
Likewise, the scanning device needs to scan the bar codes on all the second test tubes of the second test tube rack.
Step S5: the control sampling device is used for moving the second test tube rack from the scanning position to the second position so as to control the second sample analyzer to sample or grab the first second test tube of the second test tube rack under the condition that the first sample analyzer samples or grabs the second first test tube of the first test tube rack.
Similarly, after the sample injection device 10 is controlled to move the second tube rack and make all the second test tubes of the second tube rack scanned, the second test tubes on the second tube rack also need to be initially inspected by the second sample analyzer 21, so that the sample injection device 10 is controlled to move the second tube rack from the scanning position 112 to the second position 114, so that the second sample analyzer 21 samples or grabs the second test tubes of the second tube rack.
The above-mentioned preset value X controlling the retraction of the feeding track 11 satisfies s=x+d+d, so that the distance between the second first test tube of the first test tube rack and the first second test tube of the second test tube rack is D between the first position 113 and the second position 114, that is, when the sample injection device 10 is controlled to move the first second test tube of the second test tube rack to the second position 114, the second first test tube of the first test tube rack is just located at the first position 113, and in the case that the first sample analyzer 20 samples or grabs the second first test tube of the first test tube rack, the second sample analyzer 21 also samples or grabs the first second test tube of the second test tube rack at the same time.
In this embodiment, the feeding track 11 is controlled to retract to specifically control the feeding track 11 to retract by a preset value when the loading position 111 loads the second test tube rack, and the preset value meets a specific condition, when the control sample feeding device 10 moves the first second test tube of the second test tube rack to the second position 114, the second first test tube of the first test tube rack is just located at the first position 113, and under the condition that the first sample analyzer 20 samples or grabs the second first test tube of the first test tube rack, the second sample analyzer 21 also samples or grabs the first second test tube of the second test tube rack at the same time, so that when the feeding track 11 respectively conveys the test tubes on the two rows of test tube racks to the first position 113 and the second position 114, the feeding track 11 moves back and forth between the first sample analyzer 20 and the second sample analyzer 21, and loss of the feeding track 11 is reduced.
Referring to fig. 3, fig. 3 is a flow chart illustrating an embodiment of the steps between step S1 and step S2 in fig. 2. Optionally, the first sample analyzer 20 samples or grabs the first test tubes of the first test tube rack, so that the condition that the first sample analyzer 20 is in an idle state at this time, rather than a busy state, needs to be satisfied, and thus, after all the first test tubes of the first test tube rack are scanned, before the sample injection device 10 moves the first test tube rack from the scanning position 112 to the first position 113, the following determination steps are further included: step S11: it is detected whether the first sample analyzer 20 is in a busy state. When it is detected that the first sample analyzer 20 is not busy, step S13 is performed: continuing to sample or grasp the first test tube of the first test tube rack by the first sample analyzer 20; when the first sample analyzer 20 is detected to be in the busy state, step S12 is performed: the sample introduction device 10 is controlled to move the first tube rack from the scanning position 112 to the second position 114 so that the second sample analyzer 21 samples or grips the first tube of the first tube rack. At this time, the first rack is actually a second row of racks (second racks) on the feeding rail 11 in the direction in which the first sample analyzer 20 is directed toward the second sample analyzer 21.
The arrangement of arranging the first samples stored in the first rack on the second sample analyzer 21 for initial inspection while the first sample analyzer 20 is in a busy state is a further arrangement for special cases of sample transportation, ensuring the completeness and stability of the control method of sample transportation.
Optionally, the control method for sample transportation further includes determining whether a re-inspection is required and a portion for re-inspecting the re-inspected sample. Correspondingly, the feeding track 11 is provided with a re-inspection initial bit, and the re-inspection initial bit comprises a first re-inspection initial bit and a second re-inspection initial bit.
After the first samples on all the first test tube racks and the second samples on all the second test tube racks are subjected to primary detection, judging whether the retest samples exist in all the first samples and all the second samples; specifically, the first sample analyzer 20 and the second sample analyzer 21 are used as the basis for judging whether the initial detection result of the sample is abnormal.
If it is determined that the primary test result is not abnormal in all the first samples and/or all the second samples, that is, there is no recheck sample in all the first samples and/or all the second samples, the recheck is not required, and the first test tube rack and the second test tube rack are unloaded from the feeding rail 11.
If it is determined that the primary detection result is abnormal in all the first samples and/or all the second samples, that is, the secondary detection samples are present in all the first samples and/or all the second samples, the secondary detection samples need to be subjected to secondary detection.
Responding to the existence of the retest samples in all the first samples and/or all the second samples, controlling the feeding track to retract, and moving the test tube rack corresponding to the retest samples to the retest initial position;
and controlling the feeding track to advance, and shifting the test tube rack corresponding to the re-inspection sample from the initial re-inspection to the initial inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample.
In this embodiment, the recheck initial position is set on the feeding rail, so that the accuracy of the stop position of the feeding rail 11 can be improved.
The first sample and the second sample are re-examined in three ways:
specifically, when the primary inspection results of the first sample analyzer 20 and the second sample analyzer 21 on the samples are that there is a primary inspection result abnormality in all the first samples and in all the second samples, that is, in response to the presence of the retest samples in all the first samples and all the second samples, the feeding rail 11 is controlled to be retracted, the first test tube rack is moved to the first retest initial position, and the second test tube rack is moved to the second retest initial position; the advance of the feed rail 11 is controlled to displace the first tube rack from the first retest initial stage to the first sample analyzer 20 and to displace the second tube rack from the second retest initial stage to the second sample analyzer 21 to retest the retest samples.
Specifically, when the primary detection results of the first sample analyzer 20 and the second sample analyzer 21 on the samples are that the primary detection results are abnormal in all the first samples, and the primary detection results are not abnormal in all the second samples, namely, in response to the presence of the re-detection samples in all the first samples and the absence of the re-detection samples in all the second samples, the feeding track 11 is controlled to be retracted, and the first test tube rack is moved to the first re-detection initial position; the feed rail 11 is controlled to advance to initially displace the first test tube rack from the first retest to the first sample analyzer 20 to retest the retest samples.
Specifically, when the primary detection results of the first sample analyzer 20 and the second sample analyzer 21 on the samples are that no primary detection result abnormality exists in all the first samples, and no primary detection result abnormality exists in all the second samples, that is, in response to the presence of no re-detection sample in all the first samples and the presence of the re-detection sample in all the second samples, the feeding track 11 is controlled to be retracted, and the second test tube rack is moved to the second re-detection initial position; the feed rail 11 is controlled to advance to move the second test tube rack from the second retest initial position to the second sample analyzer 21 to retest the retest samples.
In order to implement the above-mentioned control method for sample transportation, the present application further provides a control device, please refer to fig. 5, fig. 5 is a schematic structural diagram of the control device provided in the present application.
The control device 50 provided in the present application includes a memory 51 and a processor 52.
Specifically, the memory 51 is coupled to the processor 52, and the program instructions are stored in the memory 51, and the processor 52 is configured to execute the program instructions in the memory 51, so as to implement the sample transportation control method in the above embodiment.
In the present embodiment, the processor 52 may also be referred to as a CPU (central processing unit). The processor 52 may be an integrated circuit chip having signal processing capabilities. Processor 52 may also be a general purpose processor, a digital signal processor (DSP, digitalSignalProcess), an application specific integrated circuit (ASIC, applicationSpecificIntegratedCircuit), a field programmable gate array (FPGA, fieldProgrammableGateArray) or other programmable logic device, a discrete gate or transistor logic device, a discrete hardware component. The general purpose processor may be a microprocessor or the processor 52 may be any conventional processor or the like.
The control device provided in the embodiment of the present application may achieve the same technical effects as the sample analysis system and the sample transport control method provided in the foregoing embodiments, and in order to avoid repetition, no description is repeated here.
The present application further provides a computer readable storage medium, please refer to fig. 6, fig. 6 is a schematic structural diagram of the computer readable storage medium provided in the present application. The computer readable storage medium 60 has stored therein program instructions 61 for implementing the control method of sample transport of the above-described embodiments when the program instructions 61 are executed by the processor 52.
Embodiments of the present application are implemented in the form of software functional units and sold or used as a stand-alone product, which may be stored on a computer readable storage medium. Based on such understanding, the technical solution of the present application may be embodied in essence or a part contributing to the prior art or all or part of the technical solution, or in the form of a software product stored in a storage medium, including several instructions to cause a computer device (which may be a personal computer, a computer device, or a network device, etc.) or a processor (processor) to perform all or part of the steps of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: a usb disk, a removable hard disk, a Read-only memory (ROM), a random access memory (RAM, randomAccessMemory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing description is only of embodiments of the present application, and is not intended to limit the scope of the patent application, and all equivalent structures or equivalent processes using the descriptions and the contents of the present application or other related technical fields are included in the scope of the patent application.

Claims (10)

1. The sample analysis system is characterized by comprising a sample injection device, a first sample analyzer, a second sample analyzer and control equipment, wherein the sample injection device comprises a feeding track for conveying a test tube rack, and a loading position, a scanning position, a first position and a second position are arranged on the feeding track; the first sample analyzer and the second sample analyzer are arranged on the same side of the feeding track, detection items of samples by the first sample analyzer and the second sample analyzer are the same, the first sample analyzer is used for detecting the samples positioned at the first position, the second sample analyzer is used for detecting the samples positioned at the second position, the first sample analyzer is far away from the loading position relative to the second sample analyzer, the first position is far away from the loading position relative to the second position, and the scanning position is between the loading position and the second position;
The control equipment is respectively connected with the sample injection device, the first sample analyzer and the second sample analyzer, wherein the control equipment is used for:
controlling the sample injection device to move the first test tube rack to the scanning position so as to sweep the first test tube of the first test tube rack;
controlling the sample injection device to move the first test tube rack from the scanning position to the first position so that the first sample analyzer samples or grabs a first test tube of the first test tube rack;
when the first sample analyzer finishes sampling or grabbing a first test tube of the first test tube rack, controlling the feeding track to retract by a preset value so as to load a second test tube rack in the loading position;
controlling the sample injection device to move the second test tube rack to the scanning position so as to sweep the second test tube of the second test tube rack;
the sample injection device is controlled to move the second test tube rack from the scanning position to the second position, so that the second sample analyzer is controlled to sample or grab a first second test tube of the second test tube rack under the condition that the first sample analyzer samples or grabs a second first test tube of the first test tube rack.
2. The sample analysis system of claim 1, further comprising a recheck initiation bit comprising a first recheck initiation bit and a second recheck initiation bit, wherein the first recheck initiation bit may be the first position, the second recheck initiation bit may be the second position or the first recheck initiation bit may be between the first position and the second position, and the second recheck initiation bit may be between the second position and the loading position.
3. A control method of sample transport, characterized by being applied to the sample analysis system according to claim 1 or 2, the control method comprising:
controlling the sample injection device to move the first test tube rack to the scanning position so as to sweep the first test tube of the first test tube rack;
controlling the sample injection device to move the first test tube rack from the scanning position to the first position so that the first sample analyzer samples or grabs a first test tube of the first test tube rack;
when the first sample analyzer finishes sampling or grabbing a first test tube of the first test tube rack, controlling the feeding track to retract by a preset value so as to load a second test tube rack in the loading position;
Controlling the sample injection device to move the second test tube rack to the scanning position so as to sweep the second test tube of the second test tube rack;
the sample injection device is controlled to move the second test tube rack from the scanning position to the second position, so that the second sample analyzer is controlled to sample or grab a first second test tube of the second test tube rack under the condition that the first sample analyzer samples or grabs a second first test tube of the first test tube rack.
4. The control method according to claim 3, wherein after the step of controlling the sample injection device to move the first rack to the scanning position to scan the first test tube of the first rack, the control method further comprises, before the step of controlling the sample injection device to displace the first rack from the scanning position to the first position:
detecting whether the first sample analyzer is in a busy state;
and responding to the first sample analyzer in the busy state, controlling the sample injection device to move the first test tube rack from the first position to the second position so that the second sample analyzer samples or grabs a first test tube of the first test tube rack.
5. A control method according to claim 3, characterized in that the control method further comprises:
after all the first samples on the first test tube rack and all the second samples on the second test tube rack are subjected to primary detection, judging whether recheck samples exist in all the first samples and all the second samples;
controlling the feeding track to retract in response to the presence of the retest samples in all the first samples and/or all the second samples, and moving the test tube rack corresponding to the retest samples to a retest initial position;
and controlling the feeding track to advance, and initially displacing the test tube rack corresponding to the re-inspection sample from the re-inspection initial position to the primary inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample.
6. The control method according to claim 5, wherein in response to the presence of the retest samples in all the first samples and/or all the second samples, the feeding track is controlled to retract, and the test tube rack corresponding to the retest samples is moved to a retest initial position; the step of controlling the advance of the feed rail to initially displace the test tube rack corresponding to the re-inspection sample from the re-inspection initial position to the primary inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample comprises the following steps:
Controlling the feed track to retract, moving the first test tube rack to a first retest initial position and moving the second test tube rack to a second retest initial position in response to the retest samples being present in all the first samples and all the second samples;
controlling the feed track to advance, displacing the first test tube rack from the first retest initial stage to the first sample analyzer, and displacing the second test tube rack from the second retest initial stage to the second sample analyzer, so as to retest the retest samples.
7. The control method according to claim 5, wherein in response to the presence of the retest samples in all the first samples and/or all the second samples, the feeding track is controlled to retract, and the test tube rack corresponding to the retest samples is moved to a retest initial position; the step of controlling the advance of the feed rail to initially displace the test tube rack corresponding to the re-inspection sample from the re-inspection initial position to the primary inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample comprises the following steps:
in response to the presence of the retest samples in all the first samples and the absence of the retest samples in all the second samples, controlling the feeding track to retract, and moving the first test tube rack to a first retest initial position;
And controlling the feeding track to advance, and initially displacing the first test tube rack from the first retest to the first sample analyzer so as to retest the retest sample.
8. The control method according to claim 5, wherein in response to the presence of the retest samples in all the first samples and/or all the second samples, the feeding track is controlled to retract, and the test tube rack corresponding to the retest samples is moved to a retest initial position; the step of controlling the advance of the feed rail to initially displace the test tube rack corresponding to the re-inspection sample from the re-inspection initial position to the primary inspection analyzer corresponding to the re-inspection sample so as to re-inspect the re-inspection sample comprises the following steps:
in response to the absence of the retest sample in all the first samples and the presence of the retest sample in all the second samples, controlling the feeding track to retract, and moving the second test tube rack to a second retest initial position;
and controlling the feeding track to advance, and initially displacing the second test tube rack from the second retest to the second sample analyzer so as to retest the retest sample.
9. A control device comprising a memory for storing a computer program and a processor for executing the computer program to implement the control method according to any one of claims 3-8.
10. A computer readable storage medium, characterized in that the computer readable storage medium has stored thereon a computer program for realizing the control method according to any of claims 3-8 when being executed by a processor.
CN202310259123.6A 2023-03-09 2023-03-09 Sample analysis system, transport control method, apparatus, and medium Pending CN116298341A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310259123.6A CN116298341A (en) 2023-03-09 2023-03-09 Sample analysis system, transport control method, apparatus, and medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310259123.6A CN116298341A (en) 2023-03-09 2023-03-09 Sample analysis system, transport control method, apparatus, and medium

Publications (1)

Publication Number Publication Date
CN116298341A true CN116298341A (en) 2023-06-23

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