CN116392722A

CN116392722A - Strong pulse light therapeutic instrument capable of monitoring light source luminous energy and energy monitoring method

Info

Publication number: CN116392722A
Application number: CN202310057380.1A
Authority: CN
Inventors: 吴小松; 于航; 颜培华
Original assignee: Zhuhai Xigu Medical Technology Co ltd
Current assignee: Zhuhai Xigu Medical Technology Co ltd
Priority date: 2022-09-19
Filing date: 2022-09-19
Publication date: 2023-07-07
Also published as: CN115252117A; CN115252117B

Abstract

The invention discloses a strong pulse light therapeutic apparatus capable of monitoring the light energy of a light source and an energy monitoring method. The strong pulse light therapeutic apparatus comprises a strong pulse light source, a monitoring light path, an attenuation unit and a first monitoring unit. The monitoring light path is used for capturing a part of light emitted by the strong pulse light source when the power-on work is performed, the attenuation unit is used for attenuating the captured light and providing the attenuated light to the first monitoring unit, and the first monitoring unit is used for measuring the luminous energy of the strong pulse light source when the power-on work is performed according to the attenuated light. The invention uses the innovative monitoring light path and the attenuation unit to carry out remarkable attenuation on the light emitted by the strong pulse light source after sampling so as to enable the light to accord with the monitoring range, and can accurately measure the luminous energy of the strong pulse light source in real time.

Description

Strong pulse light therapeutic instrument capable of monitoring light source luminous energy and energy monitoring method

Technical Field

The invention belongs to the technical field of intense pulse light sources, and particularly relates to an intense pulse light therapeutic apparatus capable of monitoring the luminous energy of a light source and a luminous energy monitoring method thereof.

Background

A strong pulsed light source is a light source capable of emitting light of very high intensity, also called pulsed intense light. After focusing and filtering, the strong pulse light can form high-energy light (note: it becomes a kind of broad spectrum light) with a certain wavelength range, and is emitted by pulse mode. The intense pulsed light is essentially incoherent ordinary light rather than laser light. Currently, intense pulsed light sources have been widely used in the medical field to improve light treatment techniques, for example for cosmetic treatment of the skin.

However, the intense pulsed light source naturally experiences light decay with use, and many intense pulsed light therapeutic devices have significantly reduced functionality after light decay occurs. For intense pulsed light source products in the field of phototherapy, it further affects the treatment.

Taking a strong pulse light therapeutic apparatus as an example, the main purpose of the strong pulse light therapeutic apparatus is to provide accurate high-energy pulse light, if the light emitted during use is inaccurate, the therapeutic effect is greatly reduced, so that the monitoring of the luminous energy of the strong pulse light source is particularly important. The problem is precisely that when monitoring the luminous energy of a strong pulsed light source, it is not easy to detect the luminous energy, because: on the one hand, the energy of the emergent light of the strong pulse light source is too strong, and the general sensor can directly explode the meter, so that the detection is impossible; on the other hand, the therapeutic head of the therapeutic apparatus has a limited size, and a detecting instrument cannot be placed on the therapeutic head, which not only increases weight and volume, but also is very unfriendly to operators.

In the prior art, a method for monitoring the luminous energy of a strong pulse light source is to record the use times, the use time and the like according to the experience value of the use times, and then prompt the replacement of the treatment head of the treatment instrument based on the record and the threshold comparison, which obviously leads to the failure of real-time monitoring; in addition, there is another method in which monitoring light is removed, and the voltage and current of discharge are monitored by calculating electric power. However, both of the above prior arts cannot realize accurate, real-time monitoring of the luminous energy of the intense pulsed light source because: the former way can only realize energy not lower than a certain percentage; the latter is that the conversion efficiency of the strong pulse light source to electric energy is reduced in the use process, so that the voltage and current cannot objectively and truly represent the light-emitting energy of the emergent light.

In view of this, how to conveniently and accurately monitor the luminous energy of the strong pulse light source in real time, and even further realize the calibration of the luminous energy of the strong pulse light source, is a technical problem to be solved in the art.

Disclosure of Invention

In order to solve the above technical problems, an object of the present application is to provide a strong pulse light therapeutic apparatus capable of monitoring the light energy of a light source. Specifically, the intense pulse light therapeutic apparatus described herein may include an intense pulse light source, a monitoring light path for capturing a portion of light emitted by the intense pulse light source when the intense pulse light source is powered on, an attenuation unit for attenuating the light captured by the monitoring light path, and a first monitoring unit for measuring the light emission energy of the intense pulse light source when the intense pulse light source is powered on based on the light attenuated by the attenuation unit.

The application also aims to provide a luminous energy monitoring method.

The technical problems of the application are solved by the following technical scheme.

In a first aspect, the present invention provides a strong pulse light therapeutic apparatus capable of monitoring light energy emitted by a light source, the strong pulse light therapeutic apparatus comprising a housing made of an opaque material and a strong pulse light source located in the housing, and the strong pulse light therapeutic apparatus further comprises:

at least one monitoring light path, wherein the at least one monitoring light path is defined by an internal channel within the housing and is used for capturing a portion of light emitted by the intense pulsed light source when the intense pulsed light source is energized, the internal channel being formed as a light sampling hole at the intense pulsed light source; the at least one monitoring light path comprises an L-shaped light path, and the L-shaped light path comprises a transverse monitoring light path and a longitudinal monitoring light path;

at least one attenuation unit located on the at least one monitoring light path, wherein the at least one attenuation unit is configured to attenuate the captured portion of the light and provide the attenuated light to the first monitoring unit;

the first monitoring unit is used for measuring the luminous energy of the strong pulse light source when the strong pulse light source is electrified to work according to the attenuated light;

Wherein the attenuated light is adapted to a range that the first monitoring unit is capable of monitoring.

In a second aspect, the invention also discloses a method for monitoring the luminous energy of an intense pulsed light source, comprising:

s100: when the strong pulse light source is not electrified to emit light, an ADC signal in the first monitoring unit is collected and used as an environmental noise value ad1;

s200: sending a preset pulse signal to electrify the intense pulse light source; generating a plurality of pulse lights by the strong pulse light source according to the set pulse time;

s300: the first monitoring unit acquires the light attenuated by the light emitted by the strong pulse light source, acquires the ADC signal in the first monitoring unit once every a first preset time, and compares the acquired ad value with an environmental noise value ad 1:

if the absolute value of the difference between the acquired ad value and the environmental noise value ad1 is smaller than or equal to a first threshold value, marking that the strong pulse light source does not emit light at the moment;

otherwise, marking the strong pulse light source to emit an effective luminous signal, and subtracting the environmental noise value ad1 from the current acquired ad value to reserve;

s400: repeating the step S300 every first preset time within the second preset time until the light emission is detected to be finished, and integrating to calculate the sum of all ADC signals;

S500: fitting the energy X of the reference light with the sum of all ADC signals calculated by integration;

s600: repeating the steps S100 to S500 for a plurality of times, and finally obtaining the functional relation between the energy X of the reference light and the integral of the reference light through statistics and fitting to calculate the sum of all ADC signals;

s700: based on the functional relation, the first monitoring unit measures the luminous energy of the strong pulse light source when the strong pulse light source is electrified to work according to the attenuated light.

Compared with the prior art, the invention has the following advantages:

the invention creatively designs at least one monitoring light path and at least one attenuation unit to attenuate the light emitted by the strong pulse light source obviously after sampling so as to enable the light to accord with the monitoring range, thereby solving the problem of how to monitor the luminous energy of the strong pulse light source by measuring the luminous energy after sampling and attenuation and simultaneously remarkably reducing the requirements on photoelectric components and electronic components which are possibly used. In addition, the invention can further utilize means for measuring the luminous energy of the strong pulse light source for the second time under the condition that the strong pulse light source generates light attenuation, and further solve the problem of luminous energy calibration of the strong pulse light source while solving the problem of how to monitor the luminous energy of the strong pulse light source. The invention has ingenious conception, can realize a solution with small volume and low cost, and can avoid the influence of afterglow effect under the condition that the strong pulse light source is powered off, thereby being capable of accurately measuring the luminous energy of the strong pulse light source.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention.

FIG. 1 is a schematic diagram of an apparatus for monitoring the luminous energy of a strong pulsed light source in one embodiment of the invention;

FIG. 2 (A) is a first schematic diagram of a specific implementation of an apparatus for monitoring the luminous energy of a high-pulse light source in accordance with one embodiment of the present invention;

FIG. 2 (B) is a second schematic illustration of the apparatus for monitoring the light energy emitted by the intense pulsed light source shown in FIG. 2 (A);

FIG. 2 (C) is a third schematic illustration of the apparatus for monitoring the light energy emitted by the intense pulsed light source shown in FIG. 2 (A);

FIG. 3 is a cross-sectional view of an assembled embodiment of an apparatus for monitoring the luminous energy of a high pulse light source in accordance with one embodiment of the present invention;

FIG. 4 is a schematic diagram of a specific implementation of an apparatus for monitoring the luminous energy of a high-pulse light source, prior to assembly, in an embodiment of the present invention;

FIG. 5 is a flow chart of an apparatus for monitoring the luminous energy of a strong pulse light source in an embodiment of the invention;

Fig. 6 exemplarily discloses a possible curve relation S1 between the control voltage of the light intensity of the strong pulse light source and the light emission energy generated by the light source, and a curve relation S2 where the efficiency decreases as the number of uses increases gradually and becomes possible when light decay occurs;

FIG. 7 is a flow chart of a method for monitoring the luminous energy of a high-pulse light source in one embodiment of the invention;

fig. 8 to 11 are specific implementations of circuit parts of an apparatus for monitoring luminous energy of an intense pulsed light source and circuit schematic diagrams thereof in one embodiment of the present invention.

The description of the reference numerals is as follows:

fig. 2 (a), 2 (B), 2 (C) and 3:

1 denotes a strong pulsed light source, for example, the strong pulsed light source may be a xenon lamp;

2, for example, the device is realized as a detection head, which is realized as a device sleeved on the circumference of the strong pulse light source and does not affect the light emitting surface of the top end surface of the strong pulse light source;

3 represents a light guide crystal;

4, a small seal cap, which serves as a first seal cap;

5 represents a large sealing cover of the outer ring of the small sealing cover, which is used as a second sealing cover;

6 represents a filter;

7 denotes a seal cover at the filter as a third seal cover;

8 denotes a photodetector;

9 represents a glass tube in which the intense pulsed light source is circumferentially arranged;

10 denotes a light sampling hole.

Fig. 2 (B) and fig. 4:

6 represents a filter, namely a 1 st filter, a 2 nd filter and a 3 rd filter in sequence from top left to bottom right;

in the view of figure 8 of the drawings,

d17 represents a photodetector, converting an optical signal into a current signal;

u10 represents an operational amplifier for converting a current signal into a voltage signal and amplifying the voltage signal;

r54 represents a resistance for adjusting the magnification;

the output of the lower right 6 th leg of U10, PD1, provides a voltage output to the upper left PD1 leg of FIG. 9;

in fig. 9:

PD1 is connected with the voltage signal output by PD1 in FIG. 8;

c64 and R57 form a high-pass filter through an RC circuit;

q7 represents a voltage switch, and when fd_kz1 is high, the signal is grounded; when low, monitor the signal;

the FD_KZ1 pin is used for connecting with a control pin of the singlechip;

u11 denotes an operational amplifier for voltage amplification;

r55 and R56 resistances are used for adjusting multiple;

r58 and C67 form a low-pass filter through an RC circuit;

in fig. 10:

PD1OUT represents the analog signal after signal processing, which is input to pin 3 of U19 in FIG. 10;

U19, which implements ADC signal conversion for converting analog signals into digital signals;

ADS_CLK, ADC_SDO, ADS_SDI, ADS_CS, ADS_INT and ADS_CONVST pins are all used for connecting with pins of a singlechip for digital acquisition;

in fig. 11, a xenon lamp is taken as an example of a strong pulse light source:

the XENON pin is connected with the cathode of the XENON lamp, and high-intensity heavy current of the XENON lamp is introduced from the cathode;

the XENON_KZ pin is connected with a control pin of the Q13 MOS tube;

U20A denotes an amplifying circuit;

r85, R88 are used as resistors to adjust the magnification;

the Q12 MOS tube is used for driving the U21 optocoupler;

XENON_ENABLED foot connects the single-chip microcomputer, when the foot is low level, there is XENON lamp current; at this high level no xenon lamp current is present.

Detailed Description

The present invention will be described in further detail with reference to the drawings and embodiments. It is to be understood that the specific embodiments described herein are merely illustrative of the substances, and not restrictive of the invention. It should be further noted that, for convenience of description, only the portions related to the present invention are shown in the drawings.

In addition, the embodiments of the present invention and the features of the embodiments may be combined with each other without collision. The technical scheme of the present invention will be described in detail below with reference to the accompanying drawings in combination with embodiments.

Unless otherwise indicated, the exemplary implementations/embodiments shown are to be understood as providing exemplary features of various details of some of the ways in which the technical concepts of the present invention may be practiced. Thus, unless otherwise indicated, the features of the various implementations/embodiments may be additionally combined, separated, interchanged, and/or rearranged without departing from the technical concepts of the present invention.

Cross-hatching and/or shading may be used in the drawings to generally clarify the boundaries between adjacent components. As such, the presence or absence of cross-hatching or shading does not convey or represent any preference or requirement for a particular material, material property, dimension, proportion, commonality between illustrated components, and/or any other characteristic, attribute, property, etc. of a component, unless indicated. In addition, in the drawings, the size and relative sizes of elements may be exaggerated for clarity and/or descriptive purposes. While the exemplary embodiments may be variously implemented, the particular process sequence may be performed in a different order than that described. For example, two consecutively described processes may be performed substantially simultaneously or in reverse order from that described. Moreover, like reference numerals designate like parts.

When an element is referred to as being "on" or "over", "connected to" or "coupled to" another element, it can be directly on, connected or coupled to the other element or intervening elements may be present. However, when an element is referred to as being "directly on," "directly connected to," or "directly coupled to" another element, there are no intervening elements present. For this reason, the term "connected" may refer to physical connections, electrical connections, and the like, with or without intermediate components.

For descriptive purposes, the invention may use spatially relative terms such as "under … …," under … …, "" under … …, "" lower, "" above … …, "" upper, "" above … …, "" higher "and" side (e.g., as in "sidewall") to describe one component's relationship to another (other) component as illustrated in the figures. In addition to the orientations depicted in the drawings, the spatially relative terms are intended to encompass different orientations of the device in use, operation, and/or manufacture. For example, if the device in the figures is turned over, elements described as "under" or "beneath" other elements or features would then be oriented "over" the other elements or features. Thus, the exemplary term "below" … … can encompass both an orientation of "above" and "below". Furthermore, the device may be otherwise positioned (e.g., rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. Furthermore, when the terms "comprises" and/or "comprising," and variations thereof, are used in the present specification, the presence of stated features, integers, steps, operations, elements, components, and/or groups thereof is described, but the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof is not precluded. It is also noted that, as used herein, the terms "substantially," "about," and other similar terms are used as approximation terms and not as degree terms, and as such, are used to explain the inherent deviations of measured, calculated, and/or provided values that would be recognized by one of ordinary skill in the art.

Referring to fig. 1, in one embodiment, the present invention discloses a strong pulse light therapeutic apparatus capable of monitoring the light energy of a light source, the strong pulse light therapeutic apparatus includes a housing made of an opaque material and a strong pulse light source located in the housing, and the strong pulse light therapeutic apparatus further includes:

The at least one monitoring light path is defined by an internal channel of the casing and is used for capturing a part of light emitted by the strong pulse light source when the strong pulse light source is electrified and works, and the internal channel is formed into a small-aperture light sampling hole at the strong pulse light source. The at least one monitoring light path is used for capturing a part of light emitted by the strong pulse light source when the strong pulse light source is electrified and works;

at least one attenuation unit located on the at least one monitoring light path, wherein the at least one attenuation unit is configured to attenuate a portion of the captured light and provide the attenuated light to the first monitoring unit;

the first monitoring unit is used for measuring the luminous energy of the strong pulse light source when the power-on operation is performed according to the attenuated light;

wherein the attenuated light is adapted to the range that the first monitoring unit is able to monitor.

For this embodiment, it should be noted that: according to the embodiment, the light emitted by the strong pulse light source is subjected to remarkable attenuation after sampling through creatively designing at least one monitoring light path and at least one attenuation unit, so that the light meets the monitoring range, and therefore the problem of how to monitor the light emitting energy of the strong pulse light source is solved by measuring the light emitting energy after sampling and attenuation, and meanwhile the requirements on photoelectric components and electronic components which can be used are remarkably reduced.

In another embodiment, in the intense pulse light therapeutic apparatus capable of monitoring the light energy emitted by the light source, one end of at least one monitoring light path is provided with a small hole as a light sampling hole.

In another embodiment, at least one attenuation unit is provided with a filter in the intense pulsed light therapeutic apparatus that monitors the light energy emitted by the light source.

In another embodiment, at least one monitoring light path of the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted by the light source is provided with a cavity.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted by the light source, at least one monitoring light path includes an L-shaped light path.

In another embodiment, at least one monitoring light path of the intense pulsed light therapeutic apparatus that monitors the light energy emitted by the light source includes two cavities.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted by the light source, at least one attenuation unit is provided with a plurality of optical filters.

In another embodiment, in the intense pulse light therapeutic apparatus capable of monitoring the light source light emission energy, the intense pulse light therapeutic apparatus capable of monitoring the light source light emission energy is provided with a small hole, three optical filters and two cavities, so that the attenuation unit attenuates the light emission energy of the intense pulse light source to the range which can be monitored by the first monitoring unit, and the attenuation unit measures the light emission energy of the intense pulse light source when the intense pulse light source is electrified to work according to the attenuated light.

In another embodiment, see fig. 2 (a), 2 (B) and 2 (C), which illustrate one specific implementation of an apparatus for monitoring the luminous energy of a high-pulse light source and a schematic diagram thereof, wherein,

a strong pulse light source 1, which may be, for example, a xenon lamp, which is located at or near the center of the opaque casing, and a glass tube 9 circumferentially provided to the strong pulse light source is located outside the light source;

the device 2 for monitoring the luminous energy of the intense pulsed light source, which is composed of the above-mentioned casing and each component of the monitoring light path in the casing, for example, is realized as a detection head, which is sleeved on the circumference of the intense pulsed light source and does not affect the light-emitting surface of the top end face of the intense pulsed light source;

a small seal cap 4 as a first seal cap; a large sealing cover 5 of the outer ring of the small sealing cover is used as a second sealing cover; a sealing cover 7 at the optical filter 6 as a third sealing cover;

under the action of the plurality of optical filters 6, a part of the light emitted from the light source is attenuated and sensed via the photodetector 8, thereby converted into an electrical signal, and inputted as the electrical signal to the circuit part of the device 2 for monitoring the light emission energy of the intense pulsed light source to realize the monitoring of the light emission energy of the light source. The monitoring light path is shown by the dashed line label L in fig. 3. The light guide crystal 3 is a member for extracting light generated by the xenon lamp and acting on the eyelid.

It can be found that, in this embodiment, the device for monitoring the light emission energy of the intense pulsed light source is implemented as a device sleeved on the circumference of the intense pulsed light source in a compact and small manner, and the light emitting surface of the top end surface of the intense pulsed light source is not affected.

In another embodiment, the apparatus for treating intense pulsed light capable of monitoring the light energy of the light source further comprises a second monitoring unit;

when the second monitoring unit monitors that the strong pulse light source is electrified, the first monitoring unit works;

when the second monitoring unit monitors that the intense pulse light source is not electrified, the first monitoring unit does not work.

It should be noted that, in this embodiment, in order to avoid the influence of the afterglow effect on the first monitoring unit, a specific implementation manner of avoiding the afterglow effect of the present invention will be described in detail with reference to a specific circuit design.

In another embodiment, in the intense pulse light therapeutic apparatus capable of monitoring the light energy of the light source, the intense pulse light therapeutic apparatus capable of monitoring the light energy of the light source comprises a MOS tube;

when the second monitoring unit monitors that the strong pulse light source is electrified to work, the MOS tube is not conducted, and the first monitoring unit works;

when the second monitoring unit monitors that the strong pulse light source is not electrified, the MOS tube is conducted, and the first monitoring unit works.

It can be understood that the MOS transistor is a switching transistor that controls the operation of the first monitoring unit in this embodiment, for example, whether the first monitoring unit performs its measurement function and other functions.

In another embodiment, in the apparatus for treating a strong pulse light, the monitoring light path and the device on the monitoring light path are used for monitoring the luminous energy of the strong pulse light source, and calibrating the luminous energy of the strong pulse light source, so that the energy of the light emitted by the strong pulse light source is consistent with the set luminous energy.

For the embodiment, the method and the device fully explain the problem of how to monitor the luminous energy of the strong pulse light source, and can further utilize the means for measuring the luminous energy of the strong pulse light source for the second time under the condition that the strong pulse light source generates light attenuation, thereby further solving the problem of the luminous energy calibration of the strong pulse light source.

In another embodiment, in the intense pulse light therapeutic apparatus, the entrance of the light sampling hole is set to be circular and the diameter is selected to be any value in the range of 1-4mm, so that the light sampling hole can accurately sample the light actually emitted by the intense pulse light source while the function of the intense pulse light source is not affected.

Referring to fig. 3, in another embodiment, the apparatus for treating intense pulsed light, which can monitor the light energy of the light source, further includes a light guiding crystal 3 for contacting the user and conducting the monitoring light path of the intense pulsed light source. The light guide crystal 3 and the light sampling hole 10 are opposed to different positions of the intense pulsed light source 1.

Referring to fig. 4, in another embodiment, when the plurality of filters are 3 filters, the light emission energy of the intense pulsed light source is attenuated to the range that the first monitoring unit can monitor by changing the light transmittance of the filters and the combination thereof so that it measures the light emission energy when the intense pulsed light source is powered on according to the attenuated light.

It should be noted that, fig. 4 exemplarily expresses the following specific implementation manner: for the 3 optical filters 6, the 1 st optical filter, the 2 nd optical filter and the 3 rd optical filter are sequentially arranged from top left to bottom right, wherein the 1 st optical filter is positioned on a transverse monitoring light path, the 2 nd optical filter and the 3 rd optical filter are positioned on a longitudinal monitoring light path, the 1 st optical filter and the 2 nd optical filter are positioned in a first cavity, and the 3 rd optical filter is positioned in a second cavity. The surface of each cavity can be blackened.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted by the light source, at least one filter selects a full band filter.

In another embodiment, the transmittance of any filter in the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted by the light source is between 0.01% and 70%.

Referring to fig. 2 (B) and 3, the light emitted from the light source is attenuated to a range that can be monitored by the first monitoring unit after passing through the light sampling hole 10 and the first cavity, the second cavity perpendicular to the first cavity, and three filters 6 in the two cavities. For example, based on the light output energy of the light guide crystal being in the energy range of 5-20J, when the strong pulse light source is a xenon lamp and the xenon lamp emits light in the energy range, the light intensity after being attenuated by the at least one attenuation unit and finally entering the first monitoring unit needs to be all in the range that the first monitoring unit can monitor.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted from the light source, the first monitoring unit is provided with a photodetector.

In another embodiment, the L-shaped monitoring light path is composed of two sections of light paths perpendicular to each other, and the length of each section of light path is not more than 25mm.

Referring to fig. 5, in another embodiment, the intense pulsed light therapeutic apparatus further includes at least a single chip microcomputer and an ADC module, and monitors the light emission energy of the intense pulsed light source by implementing the following steps:

S100: when the strong pulse light source is not electrified to emit light, ADC signals in the first monitoring unit are collected in advance and used as environmental noise values ad1;

s200: the singlechip sends a preset pulse signal, and the strong pulse light source is electrified; according to the set pulse time, the strong pulse light source can generate a plurality of pulse lights;

s300: the ADC signal is acquired every first preset time, and the acquired ad value is compared with the environmental noise value ad 1:

otherwise, the strong pulse light source is marked to emit effective luminous signals, and the acquired ad value is reserved after the environmental noise value ad1 is subtracted;

s500: simultaneously, fitting the energy X of the reference light with the sum of all ADC signals calculated by integral calculation;

in some embodiments, the energy X of the reference light is acquired using a third party specialized detection device.

S600: repeating the steps S100 to S500 for a plurality of times, and finally calculating a functional relation between the energy X of the measured light and the total sum of all ADC signals through statistics and fitting;

s700: on the basis of the functional relation, the first monitoring unit measures the luminous energy of the strong pulse light source when the strong pulse light source is electrified to work according to the light attenuated by the attenuation unit.

In another embodiment, the first predetermined time is any value from 50-200 microseconds, such as 100 microseconds, 150 microseconds, or the like.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the light energy of the light source, the second predetermined time is adapted to the pulse time set in step S200, for example, the second predetermined time and the pulse time are the same, and are 1 to 2 seconds.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted by the light source, the energy X of the light measured and the integral calculate the function of the sum of all ADC signals as follows:

sum＝aX+b；

where a represents the slope and b represents the intercept.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the light energy emitted by the light source, the energy of the light emitted by the intense pulsed light source is further adjusted by performing the following steps:

S800: when the intense pulse light therapeutic apparatus leaves the factory, according to the first J1 of luminous energy when the intense pulse light source is electrified and works, the first J1 of luminous energy of the intense pulse light source is set so that the set luminous energy is consistent with the actually measured luminous energy, and therefore product calibration when leaving the factory is completed;

s900: along with the use of the intense pulse light therapeutic apparatus, when judging that the intense pulse light source generates light attenuation, the energy of the actual light emitted by the intense pulse light source is less than the first J1, and the attenuation of the intense pulse light source is the second J2, wherein the second J2 is smaller than the first J1, and at the moment:

when the function relation between the measured energy X of the light and the integral and the sum of all ADC signals is a linear relation, the energy of the actual light emission of the intense pulse light source is linearly increased from the second J2J to the first J1 according to the proportional relation between the second J2J and the first J1;

s1000: along with the continuous use of the intense pulse light therapeutic apparatus, when judging that the intense pulse light source generates light attenuation again, the energy of the actual light emission of the intense pulse light source is less than the first joule J1, and the attenuation of the intense pulse light source is third joule J3, wherein the third joule J3 is smaller than the first joule J1, and at the moment:

When the function relation between the measured energy X of the light and the integral and the sum of all ADC signals is a linear relation, the energy of the actual light emission of the intense pulse light source is linearly increased from the second J3J to the first J1J 3J 1;

s1100: similarly, by measuring the energy of the light source of the strong pulse light, the energy of the light emitted by the strong pulse light source is always ensured, and the set light-emitting energy is met.

In another embodiment, in the intense pulsed light therapeutic apparatus capable of monitoring the energy emitted by the light source, the energy of the light emitted by the intense pulsed light source is further adjusted by performing the following steps:

s801: when the intense pulse light therapeutic apparatus leaves the factory, according to the first J1 of the luminous energy of the intense pulse light source when the electrified work is performed, the luminous energy of the intense pulse light source is set to be the first J1, so that the set luminous energy is consistent with the actually measured luminous energy, and the product calibration when leaving the factory is completed.

S901: along with the use of the intense pulse light therapeutic apparatus, when judging that the intense pulse light source generates light attenuation, the energy of the actual light emitted by the intense pulse light source is less than the first J1, and the attenuation of the intense pulse light source is the second J2, wherein the second J2 is smaller than the first J1, and at the moment:

When a functional relation between the energy X of the measured light and the integral is calculated, the fitting relation between the energy X of the measured light reflected by the functional relation and the integral is calculated, and the energy of the strong pulse light source for actually emitting light is increased from a second J2J and increased to a first J1J;

s1001: along with the continuous use of the intense pulse light therapeutic apparatus, when judging that the intense pulse light source generates light attenuation again, the energy of the actual light emission of the intense pulse light source is less than the first joule J1, and the attenuation of the intense pulse light source is third joule J3, wherein the third joule J3 is smaller than the first joule J1, and at the moment:

when a functional relation of all ADC signal sum is calculated based on the energy X of the measured light and the integral, the fitting relation of all ADC signal sum is calculated according to the energy X of the measured light reflected by the functional relation and the integral, and the energy of the strong pulse light source for actually emitting light is increased from a third joule J3 to a first joule J1;

s1101: similarly, by measuring the energy of the light source of the strong pulse light, the energy of the light emitted by the strong pulse light source is always ensured, and the set light-emitting energy is met.

Based on the adjustment in the steps S900-S1100 or the steps S901-S1101, the energy of the light actually emitted by the intense pulsed light source can be consistent with the set luminous energy, so as to avoid the occurrence of poor treatment effect caused by the weak luminous intensity of the intense pulsed light therapeutic apparatus due to the attribute of the light guide crystal.

Referring to fig. 6, an exemplary graph S1 of the possible relationship between the control voltage of the intensity of the intense pulsed light source and the luminous energy generated by the source is disclosed, as well as a graph S2 in which the efficiency decreases as the number of uses increases and becomes possible as light decay occurs. Since the emission energy indicated by the ordinate of A, B is desirably unchanged, the control voltage needs to be adjusted from V1 to V2. Then, by measuring the energy of the light source of the strong pulse light, the energy of the light actually emitted is always ensured to meet the set luminous energy, which can be completely realized by the technical proposal disclosed by the invention.

In addition, referring to fig. 7, in another embodiment, the present invention also discloses a method for monitoring the luminous energy of an intense pulsed light source, the method comprising the steps of:

s10: under the condition that the strong pulse light source is electrified, capturing a part of light emitted by the strong pulse light source when the strong pulse light source is electrified to work;

s20: attenuating a portion of the captured light to a range that can be monitored;

s30: and measuring the luminous energy of the strong pulse light source when the power-on work is performed according to the attenuated light.

In another embodiment, in step S10, at least one monitoring light path is used to capture a portion of the light emitted by the intense pulsed light source during the power-on operation.

In another embodiment, at least one attenuation unit is utilized to attenuate a portion of the captured light in step S20.

In another embodiment, in step S30, the first monitoring unit is used to measure the luminous energy of the strong pulse light source when the power is on according to the attenuated light.

In another embodiment, in a method for monitoring the luminous energy of an intense pulsed light source, the method further comprises the steps of:

s40: when the light attenuation of the strong pulse light source is judged, the light emission energy of the strong pulse light source is calibrated according to the actually measured light emission energy of the strong pulse light source when the strong pulse light source is electrified to work.

Furthermore, in the following embodiments, specific implementations of circuit parts relating to an apparatus for monitoring the luminous energy of a high-pulse light source are disclosed.

Referring to fig. 8 to 11, among others,

in the view of figure 8 of the drawings,

r54 represents a resistance for adjusting the magnification;

in fig. 9:

PD1 is connected with the voltage signal output by PD1 in FIG. 8;

C64 and R57 form a high-pass filter through an RC circuit;

the FD_KZ1 pin is used for connecting with a control pin of the singlechip;

u11 denotes an operational amplifier for voltage amplification;

r55 and R56 resistances are used for adjusting multiple;

r58, C67 form a low pass filter through an RC circuit through which the output of U11 is connected to pin 3 of U19 of fig. 10;

in fig. 10:

ADS_CLK, ADC_SDO, ADS_SDI, ADS_CS, ADS_INT and ADS_CONVST pins are all used for connecting with pins of a singlechip so as to be used for digital acquisition under the control of the singlechip;

in fig. 11, a xenon lamp is taken as an example of a strong pulse light source:

the XENON pin is connected with the cathode of the XENON lamp, and high-intensity heavy current of the XENON lamp is introduced from the XENON lamp;

the XENON_KZ pin is connected with a control pin of the Q13 MOS tube;

U20A denotes an amplifying circuit;

r85, R88 are used as resistors to adjust the magnification;

the Q12 MOS tube is used for driving the U21 optical coupler, and the adoption of the optical coupler improves the circuit isolation and the safety performance of a device for monitoring the luminous energy of the strong pulse light source;

The XENON_ENABLED is connected with the singlechip by a pin, and when the pin is at a low level, the current of the XENON lamp is indicated to flow through the XENON lamp; when the foot is at a high level, no xenon lamp current flows through the xenon lamp;

as shown in fig. 8, 9, 10, 11, wherein,

in fig. 8, the circuit shown converts the current signal obtained by the photodetector into a voltage signal;

in fig. 9, the circuit shown filters and amplifies the voltage signal;

in fig. 10, the circuit shown uses a 16-bit precision ADC to convert an analog signal into a digital signal for an operation process;

in fig. 11, a xenon lamp is taken as an example of a strong pulse light source, and the circuit is shown to illustrate a xenon lamp voltage and current monitoring circuit;

the above circuit is further described as follows:

the 2 nd pin in fig. 8 is connected with a photoelectric detector, the U10 operational amplifier converts current into voltage and outputs the voltage through the 6 th pin, voltage signals are further transmitted to PD1 in fig. 9 through a connector with shielding, then the voltage signals are filtered through a high-pass filter consisting of R57 and C64, further amplified to a reasonable multiple through U11 in fig. 9, then filtered through a filter consisting of R58 and C67, and then connected with the 3 rd pin of U19 in fig. 10 through a PD1OUT pin, and then an analog signal is converted into a digital signal through a U19 ADC chip in fig. 10;

Referring to fig. 11, in the XENON lamp power state, the xenon_kz pin will send a signal to the control pin of Q13; further, when current flows in the XENON lamp, as the XENON pin is connected with the cathode of the XENON lamp, the current of the XENON lamp flows through R89 to the ground through the XENON end and Q13, the 3 rd pin of U20A collects a current signal, the U21 isolation optocoupler is driven after a certain proportion of the current is amplified, when the current flows in the R89, the U21 is conducted, and the XENON_ENABLED pin is in a low level; when no current flows in the XENON lamp, R89 does not flow, U21 is not conducted, and XENON_ENABLED is in a high level; therefore, the invention can detect the high and low level of the XENON_ENABLE pin through the singlechip to judge whether the luminous energy of the XENON lamp is monitored by utilizing the subsequent circuit.

The detailed description is as follows:

1) When no current flows in the XENON lamp, no current flows in R89, the XENON_ENABLED is in a high level, and as the signal of the XENON_ENABLED pin is used as an input signal of the singlechip, the signal can control a control pin of the singlechip, and when the XENON_ENABLED is in a high level, the output of the control pin of the singlechip is also in a high level, so that the FD_KZ1 pin is also in a high level, and the Q7 MOS tube of FIG. 9 is conducted, so that the rapid discharge can be realized; therefore, the singlechip does not need to execute the step S200 and the like to monitor the luminous energy of the strong pulse light source; but at this time, the foregoing step S100 may be performed so as to collect the ADC signal of U19 in fig. 10 in advance and take it as the environmental noise value ad1;

2) When the singlechip sends a preset pulse signal to enable the XENON lamp to be electrified, the singlechip sends a signal to a control pin of Q13 through a XENON_KZ pin, and the XENON lamp generates a plurality of pulse lights in the pulse time according to the set pulse time; when current flows in the XENON lamp, R89 has current flowing, XENON_ENABLED is low level, because the signal of XENON_ENABLED pin is used as the input signal of the singlechip, the control pin of the singlechip can be controlled, and when XENON_ENABLED is low level, the output of the control pin of the singlechip is also low level, the FD_KZ1 pin is also low level, the Q7 MOS tube of FIG. 9 is not conducted, the signal of PD1 pin in FIG. 9 is input to U11 after being filtered by a high-pass filter and then amplified to a reasonable multiple, then after being filtered by a filter composed of R58 and C67, the signal is connected with the 3 rd pin of U19 in FIG. 10 by the PD1OUT pin, and then the analog signal is converted into a digital signal by the U19 ADC chip in FIG. 10, so that the steps S200 and S300 and the like before can be executed to monitor the luminous energy of the strong pulse light source.

It should be noted that, the key inventive concept of the circuit portion is as follows:

1) R54 of fig. 8, although used to adjust the magnification, cannot be too large nor too small; according to practical findings: for the invention, when the light-emitting energy of the light guide crystal is 20J with the maximum energy, the voltage of the 6 th pin of U10 is preferably not more than 2V; when the light-emitting energy of the light guide crystal is 5J which is minimum, the minimum is not lower than 100mV; this is because, in practice, it is found that: if the voltage exceeds 2V, the circuit is extremely easy to overflow; if less than 100mV, the circuit is easily disturbed;

2) In fig. 9, the high-pass filter composed of C64 and R57, the low-pass filter composed of R58 and C67, and the cut-off frequency cannot exceed the range of the effective frequency; the practice finds that: the frequency of the filtering is preferably 5.88Hz to 111.1Hz;

3) In fig. 9, in the voltage operational amplifier circuit formed by U11, R55 and R56 adjust the amplification factors to satisfy: when the energy is maximum and minimum, the measurement range of the ADC chip is shown in fig. 10u 19. For example, the voltage at PD1OUT is at an optimal magnification of 2V-2.5V at 20J energy;

4) In fig. 11, when xenon_enable is low, i.e. when a XENON lamp emits light, Q7 shown in fig. 9 is turned off, and voltage converted from an optical signal acquired by a photodetector is allowed to be transmitted to the 1 st pin of U11 in fig. 9, so that a signal is detected when the XENON lamp discharges, once the XENON lamp does not emit light, xenon_enable is high, under the action of xenon_enable, the output of the control pin of the singlechip is also high, so that fd_kz1 pin is also high, the Q7 MOS tube of fig. 9 is turned on, thereby directly grounding the 1 st pin of U11 in fig. 9, the potential at R57 is quickly grounded to 0, and U11 and other post-stage circuits are substantially equal to non-operation, which greatly reduces the workload of algorithm, and avoids inaccurate measurement caused by an afterglow effect. In other words, in the circuit implementation mode of the invention, after the photoelectric detector obtains the electric signal through the detection of light, the electric signal is amplified in the primary stage, filtered in the primary stage, and then is connected to the input end of the secondary stage amplification, and then is connected to the MOS tube controlled by the single chip microcomputer in parallel, wherein the control end of the MOS tube is controlled by the high and low level of the single chip microcomputer, and one end of the remaining two ends is connected with the input end of the secondary stage amplification, and the other end is grounded.

The disclosure in connection with the previous embodiments is:

the attenuated light is adapted to a range which can be monitored by the first monitoring unit;

when the second monitoring unit monitors that the strong pulse light source is not electrified, the MOS tube is conducted, and the first monitoring unit does not work;

it can be found that:

in the embodiment disclosed in figures 8 to 11,

the first monitoring unit and the second monitoring unit belong to the division of units on a functional and logic level;

when the singlechip controls the Q7 MOS tube in FIG. 9 to be non-conductive, a loop formed by the XENON_ENABLED end from the singlechip to the FD_KZ1 forms a second monitoring circuit, and a circuit which is operated by the rest of the singlechip, a circuit except for the Q7 in FIG. 9 and a circuit which is operated by the related circuits in FIG. 8, FIG. 10 and FIG. 11 form a first monitoring unit so as to measure the luminous energy of the XENON lamp, namely the exemplary strong pulse light source when the XENON lamp is electrified and works according to the attenuated light sensed by the D17 in FIG. 8; the range that the first monitoring unit can monitor is exemplified by 5J to 20J;

Under the condition that the singlechip controls the conduction of the Q7 MOS tube in FIG. 9, a loop formed by the XENON_ENABLED end from the singlechip to the FD_KZ1 still forms a second monitoring circuit, but at the moment, the first monitoring unit is taken as a complete functional unit, and the first monitoring unit does not work substantially.

Furthermore, it will be appreciated that, in the specific embodiments disclosed with respect to FIGS. 8-11,

the single chip microcomputer and the ADC U19 in fig. 10 are mainly used for executing the steps S200 to S1100 and the steps S8001 to S1101 described above.

In the description of the present specification, reference to the terms "one embodiment/manner," "some embodiments/manner," "example," "specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment/manner or example is included in at least one embodiment/manner or example of the present application. In this specification, the schematic representations of the above terms are not necessarily for the same embodiment/manner or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments/modes or examples. Furthermore, the various embodiments/modes or examples described in this specification and the features of the various embodiments/modes or examples can be combined and combined by persons skilled in the art without contradiction.

Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the meaning of "plurality" is at least two, such as two, three, etc., unless explicitly defined otherwise.

It will be appreciated by persons skilled in the art that the above embodiments are provided for clarity of illustration only and are not intended to limit the scope of the invention. Other variations or modifications will be apparent to persons skilled in the art from the foregoing disclosure, and such variations or modifications are intended to be within the scope of the present invention.

Claims

1. A strong pulse light therapeutic apparatus capable of monitoring light source luminous energy, the strong pulse light therapeutic apparatus comprises a casing made of opaque materials and a strong pulse light source positioned in the casing, the strong pulse light therapeutic apparatus is characterized in that the strong pulse light therapeutic apparatus further comprises:

2. The intense pulsed light therapeutic apparatus of claim 1 wherein the energy emitted by the light source is monitored by:

the at least one monitoring optical path comprises a first cavity and a second cavity, and the second cavity is perpendicular to the first cavity;

the at least one attenuation unit comprises a 1 st optical filter, a 2 nd optical filter and a 3 rd optical filter, wherein the 1 st optical filter is positioned on the transverse monitoring light path, the 2 nd optical filter and the 3 rd optical filter are positioned on the longitudinal monitoring light path, the 1 st optical filter and the 2 nd optical filter are positioned in the first cavity, and the 3 rd optical filter is positioned in the second cavity.

3. The intense pulsed light therapeutic apparatus of claim 2 wherein the energy emitted by the light source is monitored by:

When the device works, light emitted by the strong pulse light source is attenuated to a range which can be monitored by the first monitoring unit after passing through the light sampling hole, the first cavity, the second cavity, the 1 st optical filter, the 2 nd optical filter and the 3 rd optical filter.

4. A high pulse light therapeutic apparatus capable of monitoring light energy emitted from a light source according to claim 3, wherein:

the 1 st optical filter, the 2 nd optical filter and the 3 rd optical filter are all-band optical filters; and/or

The light transmittance of any one of the 1 st filter, the 2 nd filter and the 3 rd filter is 0.01% -70%.

5. A high pulse light therapeutic apparatus capable of monitoring light energy emitted from a light source according to claim 3, wherein:

the lateral monitoring light path and the longitudinal monitoring light path are perpendicular to each other, and the respective lengths of the lateral monitoring light path and the longitudinal monitoring light path are not greater than 25mm.

6. The intense pulsed light therapeutic apparatus of any one of claims 1-5 wherein the light source emits light energy is characterized by:

the intense pulse light therapeutic instrument also comprises a second monitoring unit;

when the second monitoring unit monitors that the strong pulse light source is electrified to work, the first monitoring unit works;

And when the second monitoring unit monitors that the strong pulse light source is not electrified, the first monitoring unit does not work.

7. The intense pulsed light therapeutic apparatus of claim 6 wherein:

the intense pulse light therapeutic instrument comprises an MOS tube;

when the second monitoring unit monitors that the strong pulse light source is not electrified, the MOS tube is conducted, and the first monitoring unit does not work.

8. The intense pulsed light therapeutic apparatus according to any one of claims 1 to 5, wherein:

the strong pulse light source is a xenon lamp; the intense pulse light therapeutic instrument further comprises a light guide crystal which is used for contacting a user and is communicated with the light path of the intense pulse light source, wherein the light guide crystal and the light sampling hole are opposite to different positions of the intense pulse light source.

9. A method for monitoring the luminous energy of a source of intense pulsed light, comprising:

10. The method for monitoring the luminous energy of an intense pulsed light source of claim 9, further comprising:

s800: according to the first joule J1 of the luminous energy of the strong pulse light source measured in the step S700 when the strong pulse light source is powered on, setting the luminous energy of the strong pulse light source to be the first joule J1, so that the set luminous energy is consistent with the actually measured luminous energy to complete the calibration process;

s900: when judging that the intense pulse light source generates light attenuation, the energy of the actual light emitted by the intense pulse light source is less than that of a first J1, and the energy is attenuated into a second J2, wherein the second J2 is smaller than the first J1, and at the moment:

when the functional relation between the energy X of the reference light and the integral calculation sum of all ADC signals is a linear relation, the energy of the actual light emission of the strong pulse light source is linearly increased from the second J2J to the first J1 according to the proportional relation between the second J2J and the first J1;

s1000: when judging that the intense pulse light source generates light attenuation again, the energy of the actual light emitted by the intense pulse light source is less than the first J1, and the energy is attenuated into a third J3, wherein the third J3 is smaller than the first J1, and at the moment:

When the functional relation between the energy X of the reference light and the sum of all ADC signals calculated by integration is a linear relation, the energy of the actual light emission of the strong pulse light source is linearly increased from the third joule J3 to the first joule J1 according to the proportional relation between the third joule J3 and the first joule J1;

s1100: and by analogy, the energy of the light actually emitted by the strong pulse light source is always ensured by measuring the energy of the light actually emitted by the strong pulse light source, and the set light-emitting energy is met.

11. The method for monitoring the luminous energy of an intense pulsed light source of claim 9, further comprising:

s801: completing a calibration process according to the first joule J1 of the luminous energy of the strong pulse light source measured in the step S700 when the strong pulse light source is electrified and works;

s901: when judging that the intense pulse light source generates light attenuation, the energy of the actual light emitted by the intense pulse light source is less than that of a first J1, and the energy is attenuated into a second J2, wherein the second J2 is smaller than the first J1, and at the moment:

when a functional relation of all ADC signal sum is calculated based on the energy X of the reference light and the integral, the fitting relation of all ADC signal sum is calculated according to the energy X of the reference light reflected by the functional relation and the integral, and the energy of the actual light emission of the strong pulse light source is increased from a second J2 to a first J1;

S1001: when judging that the intense pulse light source generates light attenuation again, the energy of the actual light emitted by the intense pulse light source is less than the first J1, and the energy is attenuated into a third J3, wherein the third J3 is smaller than the first J1, and at the moment:

when a functional relation of all ADC signal sum is calculated based on the energy X of the reference light and the integral, a fitting relation of all ADC signal sum is calculated according to the energy X of the reference light reflected by the functional relation and the integral, and the energy of the strong pulse light source for actually emitting light is increased from a third joule J3 to a first joule J1;

s1101: and by analogy, the energy of the light actually emitted by the strong pulse light source is always ensured by measuring the energy of the light actually emitted by the strong pulse light source, and the set light-emitting energy is met.

12. The method for monitoring the luminous energy of an intense pulsed light source according to any one of claims 9 to 11, characterized in that:

the first predetermined time is selected from any value within 50-200 microseconds, and the second predetermined time is adapted to the pulse time set in the step S200.

13. The method for monitoring the luminous energy of an intense pulsed light source according to any one of claims 9 to 11, characterized in that:

The energy X of the reference light is integrated to calculate the sum of all ADC signals as follows:

sum＝aX+b；

where a represents the slope and b represents the intercept.