CN116318455A - Method and device for testing multipath transceiver, electronic equipment and storage medium - Google Patents

Method and device for testing multipath transceiver, electronic equipment and storage medium Download PDF

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Publication number
CN116318455A
CN116318455A CN202310140893.9A CN202310140893A CN116318455A CN 116318455 A CN116318455 A CN 116318455A CN 202310140893 A CN202310140893 A CN 202310140893A CN 116318455 A CN116318455 A CN 116318455A
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China
Prior art keywords
target channel
channel
signal
test
amplitude
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Chinese (zh)
Inventor
孔笑荷
庞明奇
韩滔
聂之君
郭晗
孙铮
周若臣
么鹏
赵玮
沈郁博
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CASIC Defense Technology Research and Test Center
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CASIC Defense Technology Research and Test Center
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Priority to CN202310140893.9A priority Critical patent/CN116318455A/en
Publication of CN116318455A publication Critical patent/CN116318455A/en
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D30/00—Reducing energy consumption in communication networks
    • Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks

Abstract

The application provides a multi-channel transceiver testing method, a device, electronic equipment and a storage medium, wherein the multi-channel transceiver comprises at least two channels, and the method comprises the following steps: applying an interference signal to at least one channel other than the target channel; and applying a test signal to the target channel, acquiring an output signal of the target channel corresponding to the test signal, and determining the performance parameter of the target channel in the multi-channel transceiver according to the output signal and/or the test signal. According to the method, the interference signals are applied to other channels, the interference possibly suffered by the target channel in the practical application environment is simulated, and meanwhile, the condition that the multipath transceivers work at the same time in the multipath channels can be simulated, so that the reliability of the multipath transceivers in application is effectively verified.

Description

Method and device for testing multipath transceiver, electronic equipment and storage medium
Technical Field
Background
Disclosure of Invention
Performance parameters of the target channel in the transceiver include:
performing a test procedure in a loop, the test procedure comprising: applying the test signal to the target channel, wherein the frequency and amplitude of the test signal in the first test process are lower than the highest working frequency and highest working amplitude of the target channel; acquiring an output signal of the target channel corresponding to the test signal; increasing the frequency and/or amplitude of the test signal;
responding to the fact that the frequency and the amplitude of the test signal are equal to the highest working frequency and the highest working amplitude of the target channel, the output signal is free from noise, stopping the test process, and determining the performance parameters of the target channel in the multi-channel transceiver according to the highest working frequency and the highest working amplitude of the target channel;
and in response to the frequency or amplitude of the test signal being less than the highest operating frequency or highest operating amplitude of the target channel, the output signal is noisy, stopping the test process, and determining a performance parameter of the target channel in the multi-channel transceiver according to the noise.
Optionally, the determining, according to the output signal and/or the test signal, a performance parameter of the target channel in the multi-channel transceiver includes: and determining the isolation degree between the target channel and other channels in the multi-channel transceiver according to the output signal and the test signal.
Optionally, the multi-way transceiver is of the model ALVC164245.
Based on the same inventive concept, the present application also provides a multi-way transceiver testing device, where the multi-way transceiver includes at least two ways of channels, and the device includes: an interference signal applying module configured to apply an interference signal to at least one channel other than the target channel; and the testing module is configured to apply a testing signal to the target channel, acquire an output signal corresponding to the testing signal of the target channel, and determine the performance parameter of the target channel in the multi-channel transceiver according to the output signal and/or the testing signal.
Based on the same inventive concept, the application also provides an electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method of any one of the above when executing the program.
Based on the same inventive concept, the present application also provides a non-transitory computer-readable storage medium storing computer instructions for causing a computer to perform the method of any one of the above.
From the foregoing, it can be seen that the method, apparatus, electronic device and storage medium for testing a multi-path transceiver provided in the present application, where the multi-path transceiver includes at least two paths, the method includes: applying an interference signal to at least one channel other than the target channel; and applying a test signal to the target channel, acquiring an output signal of the target channel corresponding to the test signal, and determining the performance parameter of the target channel in the multi-channel transceiver according to the output signal and/or the test signal. According to the method, the interference signals are applied to other channels, the interference possibly suffered by the target channel in the practical application environment is simulated, and meanwhile, the condition that the multipath transceivers work at the same time in the multipath channels can be simulated, so that the reliability of the multipath transceivers in application is effectively verified.
Drawings
In order to more clearly illustrate the technical solutions of the present application or related art, the drawings that are required to be used in the description of the embodiments or related art will be briefly described below, and it is apparent that the drawings in the following description are only embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort to those of ordinary skill in the art.
Fig. 1 is a flow chart of a testing method of a multi-path transceiver according to an embodiment of the present application;
fig. 2 is a flow chart illustrating a specific test procedure of the multi-transceiver according to an embodiment of the present application;
fig. 3 is a schematic diagram of a peripheral circuit of a multi-channel transceiver according to an embodiment of the present application;
fig. 4 is a schematic diagram of a hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
For the purposes of making the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail below with reference to the accompanying drawings.
It should be noted that unless otherwise defined, technical or scientific terms used in the embodiments of the present application should be given the ordinary meaning as understood by one of ordinary skill in the art to which the present application belongs. The terms "first," "second," and the like, as used in embodiments of the present application, do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that elements or items preceding the word are included in the element or item listed after the word and equivalents thereof, but does not exclude other elements or items. The terms "connected" or "connected," and the like, are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", etc. are used merely to indicate relative positional relationships, which may also be changed when the absolute position of the object to be described is changed.
In view of this, one embodiment of the present application provides a method for testing a multi-way transceiver, where the multi-way transceiver includes at least two channels, as shown in fig. 1, the method includes:
step S101, an interference signal is applied to at least one channel except the target channel.
Step S102, a test signal is applied to the target channel, an output signal corresponding to the test signal of the target channel is obtained, and the performance parameter of the target channel in the multi-channel transceiver is determined according to the output signal and/or the test signal.
According to the method, the interference signals are applied to other channels, the interference possibly suffered by the target channel in the practical application environment is simulated, and meanwhile, the condition that the multipath transceivers work at the same time in the multipath channels can be simulated, so that the reliability of the multipath transceivers in application is effectively verified.
It should be noted that the following specific embodiments may not relate to all cases of "determining the performance parameter according to the output signal and/or the test signal", but neither "determining the performance parameter according to the output signal only", "determining the performance parameter according to the test signal only", nor "determining the performance parameter according to the output signal and the test signal" affect the technical effects of the foregoing embodiments, and those skilled in the art will be able to make the foregoing arrangements without any inventive effort based on the inventive concept of the embodiments of the present application.
In a specific embodiment, the step S101 includes:
and applying the interference signal to at least one channel adjacent to the target channel.
The interference signals applied to the channels adjacent to the target channel can further simulate the possible interference of the target channel in the practical application environment, and further simulate the condition that the multipath transceivers work simultaneously in the multipath channels, so that the reliability of the multipath transceivers in application is effectively verified.
In some embodiments, the step S101 further includes:
an interference signal is applied to all channels except the target channel.
The interference signals are applied to all channels except the target channel, so that the interference of the target channel in an extreme practical application environment can be simulated, meanwhile, the full-load working condition of the multi-channel transceiver is simulated, high-quality devices are further screened, and the reliability of the multi-channel transceiver in application is effectively verified.
In some embodiments, the amplitude of the interference signal applied to any one channel is the highest operating amplitude of that channel.
The interference signal with the highest working amplitude can further simulate the interference possibly suffered by the target channel in the practical application environment, and further simulate the condition that the multipath transceivers work simultaneously in the multipath channels, so that the reliability of the multipath transceivers in application is effectively verified.
In some embodiments, the frequencies of the interference signals applied to different channels are different.
The application of the interference signals with different frequencies can simulate the practical application environment of complex multiple interference sources of the multi-path transceiver, so that the reliability of the multi-path transceiver in application is further verified.
In a specific embodiment, as shown in fig. 2, the step S102 includes:
the test process is circularly executed, and the test process comprises the following steps S201 to S203:
step S201, applying the test signal to the target channel, where the frequency and amplitude of the test signal in the first test process are lower than the highest working frequency and highest working amplitude of the target channel. In a more specific embodiment, the test signal is a square wave signal. The frequency and amplitude of the test signal in the first test process need to be set to reasonable values according to practical situations, and are not limited herein.
Step S202, obtaining an output signal of the target channel corresponding to the test signal.
Step S203, raising the frequency and/or amplitude of the test signal.
And in response to the frequency and amplitude of the test signal being equal to the highest operating frequency and highest operating amplitude of the target channel, and the output signal being free of noise, stopping the test process, and executing step S301: and determining the performance parameters of the target channel in the multi-channel transceiver according to the highest working frequency and the highest working amplitude of the target channel. In the implementation, since the target channel has no noise at the highest working frequency and the highest working amplitude, the target channel can be considered to meet the standard, and the performance parameters calibrated on the device manual of the multi-channel transceiver are the performance parameters corresponding to the highest working frequency and the highest working amplitude of the target channel, and at this time, the step S301 can be performed by referring to the device manual.
In response to the frequency or amplitude of the test signal being less than the highest operating frequency or highest operating amplitude of the target channel, the output signal is noisy, the test procedure is stopped, and step S302 is performed: and determining the performance parameters of the target channel in the multipath transceiver according to the noise.
In some embodiments, determining the performance parameter of the target channel in the multi-channel transceiver according to the output signal and the test signal in the step S102 includes:
and determining the isolation degree between the target channel and other channels in the multi-channel transceiver according to the output signal and the test signal.
The isolation measures the degree to which signals between different channels are unaffected by each other, and the signal isolation between different channels is measured as the ratio of the power level of the signal itself to the power level of the leakage to other channels. The inter-channel isolation between different types of transceivers may be calculated in different manners, and those skilled in the art can know the concept of isolation and the method of calculating the inter-channel isolation between different types of transceivers.
In a specific embodiment, the step S302 includes:
and determining the isolation between the target channel and other channels in the multi-channel transceiver according to the amplitude and the frequency spectrum of the noise.
In some embodiments, the model of the multi-way transceiver is ALVC164245.
ALVC164245 is a level shifting multiplexer for converting 3.3V level to 5V level, and has a signal frequency ranging from 10M to 500MHz. Fig. 3 shows a schematic diagram of a test circuit of an ALVC164245, in which peripheral circuits except for an ALVC164245 are all conventionally arranged, and those skilled in the art can perform corresponding arrangement according to the illustration, which is not repeated here.
In specific implementation, the method for testing a multi-path transceiver in the above embodiment is implemented in a multi-path transceiver testing system, where the system includes a control motherboard, a test daughter board, a dc power supply, a digital signal generator, and an oscilloscope, where:
the control motherboard takes an FPGA (Field Programmable Gate Array ) as a main controller, provides test signals and other control signals for the test daughter board through a serial port, collects output signals of the test daughter board, and sends data to an upper computer for processing through an RS422 serial port communication mode.
The multi-channel transceiver is positioned on the test sub-board, a circuit of the test sub-board is designed according to the basic working principle of the multi-channel transceiver (refer to fig. 3), an output port is provided with a load, a power end is connected with a direct current power supply, a test signal input end is connected with a control motherboard through a serial port, test signals input by the control motherboard and other control signals are received, and an output signal output end is connected with an oscilloscope.
The DC power supply is used for providing power supply voltage for the test daughter board and the control mother board.
The digital signal generator is connected with the control motherboard and is used for providing test signals for the control motherboard and the test daughter board.
The oscilloscope is used for acquiring waveforms of output signals, so that a technician can conveniently determine the isolation between a target channel and other channels according to the amplitude value and a spectrogram of the output signals.
It should be noted that, the method of the embodiments of the present application may be performed by a single device, for example, a computer or a server. The method of the embodiment can also be applied to a distributed scene, and is completed by mutually matching a plurality of devices. In the case of such a distributed scenario, one of the devices may perform only one or more steps of the methods of embodiments of the present application, and the devices may interact with each other to complete the methods.
It should be noted that some embodiments of the present application are described above. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments described above and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
Based on the same inventive concept, corresponding to the method of any embodiment, the present application further provides a testing device for a multi-path transceiver, where the multi-path transceiver includes at least two paths, and the device includes:
an interference signal applying module configured to apply an interference signal to at least one channel other than the target channel;
and the testing module is configured to apply a testing signal to the target channel, acquire an output signal corresponding to the testing signal of the target channel, and determine the performance parameter of the target channel in the multi-channel transceiver according to the output signal and/or the testing signal.
The device provided by the application simulates the interference possibly received by the target channel in the practical application environment by applying the interference signals to other channels, and simultaneously can simulate the condition that the multipath transceivers work simultaneously in the multipath channels, thereby effectively verifying the reliability of the multipath transceivers in application.
In some embodiments, the interfering signal applying module is further configured to:
an interference signal is applied to all channels except the target channel.
In some embodiments, the amplitude of the interference signal applied to any one channel is the highest operating amplitude of that channel.
In some embodiments, the frequencies of the interference signals applied to different channels are different.
In some embodiments, the test module is further configured to:
performing a test procedure in a loop, the test procedure comprising:
applying the test signal to the target channel, wherein the frequency and amplitude of the test signal in the first test process are lower than the highest working frequency and highest working amplitude of the target channel;
acquiring an output signal of the target channel corresponding to the test signal;
increasing the frequency and/or amplitude of the test signal;
responding to the fact that the frequency and the amplitude of the test signal are equal to the highest working frequency and the highest working amplitude of the target channel, the output signal is free from noise, stopping the test process, and determining the performance parameters of the target channel in the multi-channel transceiver according to the highest working frequency and the highest working amplitude of the target channel;
and in response to the frequency or amplitude of the test signal being less than the highest operating frequency or highest operating amplitude of the target channel, the output signal is noisy, stopping the test process, and determining a performance parameter of the target channel in the multi-channel transceiver according to the noise.
In some embodiments, the test module is further configured to:
and determining the isolation degree between the target channel and other channels in the multi-channel transceiver according to the output signal and the test signal.
In some embodiments, the model of the multi-way transceiver is ALVC164245.
For convenience of description, the above devices are described as being functionally divided into various modules, respectively. Of course, the functions of each module may be implemented in the same piece or pieces of software and/or hardware when implementing the present application.
The device of the foregoing embodiment is configured to implement the corresponding method for testing a multipath transceiver in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiment, which is not described herein.
Based on the same inventive concept, the application also provides an electronic device corresponding to the method of any embodiment, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor implements the method for testing the multi-path transceiver according to any embodiment when executing the program.
Fig. 4 shows a more specific hardware architecture of an electronic device according to this embodiment, where the device may include: a processor 1010, a memory 1020, an input/output interface 1030, a communication interface 1040, and a bus 1050. Wherein processor 1010, memory 1020, input/output interface 1030, and communication interface 1040 implement communication connections therebetween within the device via a bus 1050.
The processor 1010 may be implemented by a general-purpose CPU (Central Processing Unit ), microprocessor, application specific integrated circuit (Application Specific Integrated Circuit, ASIC), or one or more integrated circuits, etc. for executing relevant programs to implement the technical solutions provided in the embodiments of the present disclosure.
The Memory 1020 may be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory ), static storage device, dynamic storage device, or the like. Memory 1020 may store an operating system and other application programs, and when the embodiments of the present specification are implemented in software or firmware, the associated program code is stored in memory 1020 and executed by processor 1010.
The input/output interface 1030 is used to connect with an input/output module for inputting and outputting information. The input/output module may be configured as a component in a device (not shown) or may be external to the device to provide corresponding functionality. Wherein the input devices may include a keyboard, mouse, touch screen, microphone, various types of sensors, etc., and the output devices may include a display, speaker, vibrator, indicator lights, etc.
Communication interface 1040 is used to connect communication modules (not shown) to enable communication interactions of the present device with other devices. The communication module may implement communication through a wired manner (such as USB, network cable, etc.), or may implement communication through a wireless manner (such as mobile network, WIFI, bluetooth, etc.).
Bus 1050 includes a path for transferring information between components of the device (e.g., processor 1010, memory 1020, input/output interface 1030, and communication interface 1040).
It should be noted that although the above-described device only shows processor 1010, memory 1020, input/output interface 1030, communication interface 1040, and bus 1050, in an implementation, the device may include other components necessary to achieve proper operation. Furthermore, it will be understood by those skilled in the art that the above-described apparatus may include only the components necessary to implement the embodiments of the present description, and not all the components shown in the drawings.
The electronic device of the foregoing embodiment is configured to implement the corresponding method for testing a multipath transceiver in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiment, which is not described herein.
Based on the same inventive concept, corresponding to any of the above embodiments of the method, the present application further provides a non-transitory computer readable storage medium storing computer instructions for causing the computer to perform the multi-transceiver test method according to any of the above embodiments.
The computer readable media of the present embodiments, including both permanent and non-permanent, removable and non-removable media, may be used to implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of storage media for a computer include, but are not limited to, phase change memory (PRAM), static Random Access Memory (SRAM), dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), read Only Memory (ROM), electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by a computing device.
The storage medium of the foregoing embodiments stores computer instructions for causing the computer to execute the method for testing a multi-path transceiver according to any one of the foregoing embodiments, and has the advantages of the corresponding method embodiments, which are not described herein.
Those of ordinary skill in the art will appreciate that: the discussion of any of the embodiments above is merely exemplary and is not intended to suggest that the scope of the application (including the claims) is limited to these examples; the technical features of the above embodiments or in the different embodiments may also be combined within the idea of the present application, the steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the present application as described above, which are not provided in detail for the sake of brevity.
Additionally, well-known power/ground connections to Integrated Circuit (IC) chips and other components may or may not be shown within the provided figures, in order to simplify the illustration and discussion, and so as not to obscure the embodiments of the present application. Furthermore, the devices may be shown in block diagram form in order to avoid obscuring the embodiments of the present application, and this also takes into account the fact that specifics with respect to implementation of such block diagram devices are highly dependent upon the platform on which the embodiments of the present application are to be implemented (i.e., such specifics should be well within purview of one skilled in the art). Where specific details (e.g., circuits) are set forth in order to describe example embodiments of the application, it should be apparent to one skilled in the art that embodiments of the application can be practiced without, or with variation of, these specific details. Accordingly, the description is to be regarded as illustrative in nature and not as restrictive.
While the present application has been described in conjunction with specific embodiments thereof, many alternatives, modifications, and variations of those embodiments will be apparent to those skilled in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may use the embodiments discussed.
The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Accordingly, any omissions, modifications, equivalents, improvements and/or the like which are within the spirit and principles of the embodiments are intended to be included within the scope of the present application.

Claims (10)

1. A method of testing a multi-way transceiver, the multi-way transceiver comprising at least two ways, the method comprising:
applying an interference signal to at least one channel other than the target channel;
and applying a test signal to the target channel, acquiring an output signal of the target channel corresponding to the test signal, and determining the performance parameter of the target channel in the multi-channel transceiver according to the output signal and/or the test signal.
2. The method of claim 1, wherein said applying an interference signal to at least one channel other than the target channel comprises:
an interference signal is applied to all channels except the target channel.
3. The method of claim 1, wherein the amplitude of the interfering signal applied to any channel is the highest operating amplitude of that channel.
4. The method of claim 1, wherein the frequencies of the interfering signals applied to different lanes are different.
5. The method of claim 1, wherein the applying a test signal to the target channel and obtaining an output signal of the target channel corresponding to the test signal, and determining the performance parameter of the target channel in the multi-channel transceiver according to the output signal and/or the test signal, comprises:
performing a test procedure in a loop, the test procedure comprising:
applying the test signal to the target channel, wherein the frequency and amplitude of the test signal in the first test process are lower than the highest working frequency and highest working amplitude of the target channel;
acquiring an output signal of the target channel corresponding to the test signal;
increasing the frequency and/or amplitude of the test signal;
responding to the fact that the frequency and the amplitude of the test signal are equal to the highest working frequency and the highest working amplitude of the target channel, the output signal is free from noise, stopping the test process, and determining the performance parameters of the target channel in the multi-channel transceiver according to the highest working frequency and the highest working amplitude of the target channel;
and in response to the frequency or amplitude of the test signal being less than the highest operating frequency or highest operating amplitude of the target channel, the output signal is noisy, stopping the test process, and determining a performance parameter of the target channel in the multi-channel transceiver according to the noise.
6. The method of claim 5, wherein said determining the performance parameter of the target channel in the multi-way transceiver from the output signal and/or the test signal comprises:
and determining the isolation degree between the target channel and other channels in the multi-channel transceiver according to the output signal and the test signal.
7. The method of claim 1, wherein the multi-way transceiver is model number alcc 164245.
8. A multi-way transceiver test apparatus, the multi-way transceiver comprising at least two ways, the apparatus comprising:
an interference signal applying module configured to apply an interference signal to at least one channel other than the target channel;
and the testing module is configured to apply a testing signal to the target channel, acquire an output signal corresponding to the testing signal of the target channel, and determine the performance parameter of the target channel in the multi-channel transceiver according to the output signal and/or the testing signal.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method of any one of claims 1 to 7 when the program is executed by the processor.
10. A non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the method of any one of claims 1 to 7.
CN202310140893.9A 2023-02-15 2023-02-15 Method and device for testing multipath transceiver, electronic equipment and storage medium Pending CN116318455A (en)

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CN202310140893.9A CN116318455A (en) 2023-02-15 2023-02-15 Method and device for testing multipath transceiver, electronic equipment and storage medium

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CN202310140893.9A CN116318455A (en) 2023-02-15 2023-02-15 Method and device for testing multipath transceiver, electronic equipment and storage medium

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CN116318455A true CN116318455A (en) 2023-06-23

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