CN108847899A - System, method, device and equipment for testing radio frequency communication performance of electronic equipment - Google Patents
System, method, device and equipment for testing radio frequency communication performance of electronic equipment Download PDFInfo
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Abstract
Description
技术领域technical field
本申请涉及无线通信技术领域,特别涉及一种电子设备射频通信性能测试系统、方法、装置及设备。The present application relates to the technical field of wireless communication, in particular to a radio frequency communication performance testing system, method, device and equipment for electronic equipment.
背景技术Background technique
具有无线射频功能的电子设备,在开发阶段需要对电子设备的无线距离覆盖、穿墙能力以及不同距离下的吞吐量等参数进行测试,以确保电子设备在实际使用中性能更稳定。For electronic equipment with wireless radio frequency functions, it is necessary to test parameters such as wireless distance coverage, wall penetration capability, and throughput at different distances of the electronic equipment during the development stage to ensure that the performance of the electronic equipment is more stable in actual use.
目前,对电子设备进行测试时,通常是通过搭建与实际的应用场景相似的测试环境,进行相关的无线性能测试。例如,如图1所示,在开放环境下搭建测试环境,其中N1、N2、N3、N4为不同的房间,并且各个房间之间通过建立墙体做隔离,同时在每个房间的一边设置房门以便于通行。在实际测试过程中,需要将待测设备(Device Under Test,简称为:DUT)放置在N1、N2、N3、N4房间,以模拟测试DUT在现实场景下、不同隔墙层数下的无线能力,同时在固定了DUT的位置后,对陪测设备(System Under Test,简称为:SUT)进行不同距离下的移动测试,以验证DUT在不同距离下的吞吐量等性能。At present, when testing an electronic device, a test environment similar to an actual application scenario is usually set up to perform a related wireless performance test. For example, as shown in Figure 1, build a test environment in an open environment, where N1, N2, N3, and N4 are different rooms, and each room is isolated by building a wall, and a room is set on one side of each room. door for easy access. In the actual test process, it is necessary to place the device under test (DUT for short) in rooms N1, N2, N3, and N4 to simulate and test the wireless capabilities of the DUT under different partition layers in real scenarios At the same time, after fixing the position of the DUT, the system under test (SUT) is subjected to mobile tests at different distances to verify the throughput and other performances of the DUT at different distances.
然而,由于在开放环境下搭建测试环境时,需要建立各房间之间的隔离墙体以及为各房间设置房门,这就使得测试环境的搭建,需要花费较多的成本,并且整个测试过程,还需要测试人员的参与来移动陪测设备,从而降低了测试效率。However, when building a test environment in an open environment, it is necessary to establish isolation walls between the rooms and to set doors for each room, which makes the construction of the test environment cost more, and the entire test process, It also requires the participation of testers to move the accompanying test equipment, thereby reducing the test efficiency.
发明内容Contents of the invention
本申请提供一种电子设备射频通信性能测试系统、方法、装置及设备,用于解决相关技术中,搭建测试环境花费成本高,以及需要测试人员参与,降低测试效率的问题。The present application provides a radio frequency communication performance testing system, method, device and equipment for electronic equipment, which are used to solve the problems in related technologies that the cost of building a test environment is high, and test personnel are required to participate, which reduces test efficiency.
本申请一方面实施例提供一种电子设备射频通信性能测试系统,该系统包括:陪测设备、信号衰减设备及控制设备;所述陪测设备的输出端通过所述信号衰减设备与所述陪测设备的天线连接;所述控制设备的第一连接端与所述陪测设备的控制端连接,用于控制所述陪测设备的工作模式;所述控制设备的第二连接端与所述信号衰减设备的控制端连接,用于控制所述信号衰减设备的衰减值;所述控制设备的第三连接端与被测电子设备连接,用于获取所述被测电子设备的吞吐量。An embodiment of the present application provides a radio frequency communication performance testing system for electronic equipment, the system includes: accompanying testing equipment, signal attenuation equipment and control equipment; connected to the antenna of the testing device; the first connection end of the control device is connected to the control terminal of the accompanying testing device for controlling the working mode of the accompanying testing device; the second connecting terminal of the control device is connected to the The control terminal of the signal attenuation device is connected to control the attenuation value of the signal attenuation device; the third connection terminal of the control device is connected to the electronic device under test for obtaining the throughput of the electronic device under test.
本申请另一方面实施例提供一种电子设备射频通信性能测试方法,该方法包括:根据当前被测电子设备的属性信息,确定所述被测电子设备的应用环境信息;根据所述被测电子设备的应用环境信息,确定信号衰减设备的目标衰减值;根据所述目标衰减值,调整所述信号衰减设备的衰减量,以获取所述被测电子设备的吞吐量。Another embodiment of the present application provides a method for testing radio frequency communication performance of an electronic device, the method including: determining the application environment information of the electronic device under test according to the attribute information of the electronic device under test; Determine the target attenuation value of the signal attenuation device according to the application environment information of the device; adjust the attenuation amount of the signal attenuation device according to the target attenuation value, so as to obtain the throughput of the electronic device under test.
本申请另一方面实施例提供一种电子设备射频通信性能测试装置,该装置包括:第一确定模块,用于根据当前被测电子设备的属性信息,确定所述被测电子设备的应用环境信息;第二确定模块,用于根据所述被测电子设备的应用环境信息,确定信号衰减设备的目标衰减值;调整模块,用于根据所述目标衰减值,调整所述信号衰减设备的衰减量,以获取所述被测电子设备的吞吐量。Another embodiment of the present application provides an electronic device radio frequency communication performance testing device, the device includes: a first determination module, configured to determine the application environment information of the electronic device under test according to the attribute information of the electronic device under test The second determination module is used to determine the target attenuation value of the signal attenuation device according to the application environment information of the electronic device under test; the adjustment module is used to adjust the attenuation amount of the signal attenuation device according to the target attenuation value , to obtain the throughput of the electronic device under test.
本申请又一方面实施例的电子设备,该电子设备包括:存储器、处理器及存储在存储器上并可在处理器上运行的计算机程序,所述处理器执行所述程序时,以实现第二方面实施例所述的电子设备射频通信性能测试方法。The electronic device according to the embodiment of another aspect of the present application, the electronic device includes: a memory, a processor, and a computer program stored on the memory and operable on the processor, when the processor executes the program, to realize the second The method for testing the radio frequency communication performance of an electronic device described in the embodiment of the aspect.
本申请再一方面实施例的计算机可读存储介质,其上存储有计算机程序,该计算机程序被处理器执行时,以实现第二方面实施例所述的电子设备射频通信性能测试方法。The computer-readable storage medium of another embodiment of the present application stores a computer program thereon, and when the computer program is executed by a processor, the method for testing the radio frequency communication performance of an electronic device described in the embodiment of the second aspect is implemented.
本申请再一方面实施例的计算机程序,当所述计算机程序被处理器执行时,实现第二方面实施例所述的电子设备射频通信性能测试方法。The computer program in the embodiment of another aspect of the present application, when the computer program is executed by the processor, implements the radio frequency communication performance testing method of the electronic device in the embodiment of the second aspect.
本申请公开的技术方案,具有如下有益效果:The technical solution disclosed in this application has the following beneficial effects:
通过将陪测设备输出端通过信号衰减器设备与陪测设备的天线连接,并将控制设备的第一连接端与陪测设备的控制端连接,以用于控制陪测设备的工作模式,控制设备的第二连接端与信号衰减设备的控制端连接,以用于控制信号衰减设备的衰减值,控制设备的第三连接端与被测电子设备连接,用于获取被测电子设备的吞吐量。由此,实现了利用信号衰减设备来模拟被测设备在实际应用场景中的空间路径衰减,从而使得对电子设备的射频通信能力进行测试时,通过调整信号衰减设备的衰减值,即可实现不同衰减场景下的测试,从而能够减少构建测试环境花费成本,并且还能提高测试效率,改善用户使用体验。By connecting the output end of the accompanying test device to the antenna of the accompanying test device through the signal attenuator device, and connecting the first connection end of the control device to the control terminal of the accompanying test device, it is used to control the working mode of the accompanying test device, control The second connection end of the device is connected to the control end of the signal attenuation device to control the attenuation value of the signal attenuation device, and the third connection end of the control device is connected to the electronic device under test to obtain the throughput of the electronic device under test . Thus, the signal attenuation device is used to simulate the spatial path attenuation of the device under test in the actual application scene, so that when testing the radio frequency communication capability of the electronic device, by adjusting the attenuation value of the signal attenuation device, different Tests in attenuation scenarios can reduce the cost of building a test environment, improve test efficiency, and improve user experience.
本申请附加的方面和优点将在下面的描述中部分给出,部分将从下面的描述中变得明显,或通过本申请的实践了解到。Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application.
附图说明Description of drawings
本申请上述的和/或附加的方面和优点从下面结合附图对实施例的描述中将变得明显和容易理解,其中,The above and/or additional aspects and advantages of the present application will become apparent and easy to understand from the following description of the embodiments in conjunction with the accompanying drawings, wherein,
图1为相关技术的电子设备射频通信性能测试系统的结构示意图;FIG. 1 is a schematic structural diagram of a radio frequency communication performance testing system for electronic equipment in the related art;
图2是根据本申请一个实施例的电子设备射频通信性能测试系统的结构示意图;2 is a schematic structural diagram of a radio frequency communication performance testing system for electronic equipment according to an embodiment of the present application;
图3是根据本申请另一个实施例的电子设备射频通信性能测试系统的结构示意图;3 is a schematic structural diagram of a radio frequency communication performance testing system for electronic equipment according to another embodiment of the present application;
图4是根据本申请又一个实施例的电子设备射频通信性能测试系统的结构示意图;4 is a schematic structural diagram of a radio frequency communication performance testing system for electronic equipment according to yet another embodiment of the present application;
图5是根据本申请再一个实施例的电子设备射频通信性能测试系统的结构示意图;5 is a schematic structural diagram of a radio frequency communication performance testing system for electronic equipment according to yet another embodiment of the present application;
图6是根据本申请一个实施例的电子设备射频通信性能测试方法的流程示意图;FIG. 6 is a schematic flowchart of a method for testing radio frequency communication performance of an electronic device according to an embodiment of the present application;
图7是根据本申请另一个实施例的电子设备射频通信性能测试方法的流程示意图;7 is a schematic flowchart of a method for testing radio frequency communication performance of an electronic device according to another embodiment of the present application;
图8是根据本申请又一个实施例的电子设备射频通信性能测试方法的流程示意图;FIG. 8 is a schematic flowchart of a method for testing radio frequency communication performance of an electronic device according to another embodiment of the present application;
图9是根据本申请一个实施例的电子设备射频通信性能测试装置的结构示意图;FIG. 9 is a schematic structural diagram of an electronic device radio frequency communication performance testing device according to an embodiment of the present application;
图10是根据本申请另一个实施例的电子设备射频通信性能测试装置的结构示意图;FIG. 10 is a schematic structural diagram of an electronic device radio frequency communication performance testing device according to another embodiment of the present application;
图11是根据本申请又一个实施例的电子设备射频通信性能测试装置的结构示意图;Fig. 11 is a schematic structural diagram of an electronic device radio frequency communication performance testing device according to another embodiment of the present application;
图12是根据本申请一个实施例的电子设备的结构示意图;FIG. 12 is a schematic structural diagram of an electronic device according to an embodiment of the present application;
图13是根据本申请另一个实施例的电子设备的结构示意图。Fig. 13 is a schematic structural diagram of an electronic device according to another embodiment of the present application.
附图标记:Reference signs:
电子设备射频通信性能测试系统-100、陪测设备-10、信号衰减设备-20、控制设备-30、被测电子设备-40、承载平台-50、屏蔽设备-60。Electronic equipment radio frequency communication performance test system-100, accompanying test equipment-10, signal attenuation equipment-20, control equipment-30, electronic equipment under test-40, carrying platform-50, shielding equipment-60.
具体实施方式Detailed ways
下面详细描述本申请的实施例,所述实施例的示例在附图中示出,其中自始至终相同或类似的标号表示相同或类似的元件或具有相同或类似功能的元件。下面通过参考附图描述的实施例是示例性的,旨在用于解释本申请,而不能理解为对本申请的限制。Embodiments of the present application are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary, and are intended to explain the present application, and should not be construed as limiting the present application.
本申请各实施例针对相关技术中,搭建测试环境花费成本高,以及需要测试人员参与,降低测试效率的问题,提出一种电子设备射频通信性能测试系统。Various embodiments of the present application aim at the problems of high cost of building a test environment and the need for the participation of testers in related technologies, which reduces test efficiency, and proposes a radio frequency communication performance test system for electronic equipment.
本申请实施例的电子设备射频通信性能测试系统,包括陪测设备、信号衰减设备及控制设备,通过将陪测设备的输出端通过信号衰减设备与陪测设备的天线进行连接,并将控制设备的第一连接端与陪测设备的控制端连接,用于控制陪测设备的工作模式,控制设备的第二连接端与信号衰减设备的控制端连接,用于控制信号衰减设备的衰减值,控制设备的第三连接端与被测电子设备连接,用于获取被测设备的吞吐量。由此,实现了利用信号衰减设备来模拟被测设备在实际应用场景中的空间路径衰减,从而使得对电子设备的射频通信能力进行测试时,通过调整信号衰减设备的衰减值,即可实现不同衰减场景下的测试,从而能够减少构建测试环境花费成本,并且还能提高测试效率,改善用户使用体验。The radio frequency communication performance test system of electronic equipment in the embodiment of the present application includes the accompanying testing equipment, signal attenuation equipment and control equipment, by connecting the output end of the accompanying testing equipment with the antenna of the accompanying testing equipment through the signal attenuating equipment, and connecting the control equipment The first connection end of the control device is connected to the control end of the accompanying test device for controlling the working mode of the accompanying test device, and the second connection end of the control device is connected to the control end of the signal attenuation device for controlling the attenuation value of the signal attenuation device. The third connection end of the control device is connected to the electronic device under test for obtaining the throughput of the device under test. Thus, the signal attenuation device is used to simulate the spatial path attenuation of the device under test in the actual application scene, so that when testing the radio frequency communication capability of the electronic device, by adjusting the attenuation value of the signal attenuation device, different Tests in attenuation scenarios can reduce the cost of building a test environment, improve test efficiency, and improve user experience.
下面参考附图描述本申请实施例的电子设备射频通信性能测试系统、方法、装置及设备进行详细说明。The radio frequency communication performance testing system, method, device and equipment of the electronic equipment according to the embodiments of the present application will be described in detail below with reference to the accompanying drawings.
首先,结合附图2,对本申请实施例提出的电子设备射频通信性能测试系统进行详细描述。Firstly, with reference to FIG. 2 , a detailed description will be given of the radio frequency communication performance testing system for electronic equipment proposed in the embodiment of the present application.
图2是根据本申请一个实施例的电子设备射频通信性能测试系统的结构示意图。Fig. 2 is a schematic structural diagram of a radio frequency communication performance testing system for electronic equipment according to an embodiment of the present application.
如图2所示,本申请电子设备射频通信性能测试系统100包括:陪测设备10、信号衰减设备20及控制设备30。As shown in FIG. 2 , the radio frequency communication performance testing system 100 of electronic equipment in the present application includes: a testing equipment 10 , a signal attenuation equipment 20 and a control equipment 30 .
其中,陪测设备10的输出端通过信号衰减设备20与陪测设备10的天线连接;Wherein, the output terminal of the accompanying test device 10 is connected to the antenna of the accompanying test device 10 through the signal attenuation device 20;
控制设备30的第一连接端与陪测设备10的控制端连接,用于控制陪测设备10的工作模式;The first connection terminal of the control device 30 is connected to the control terminal of the test companion device 10 for controlling the working mode of the test companion device 10;
控制设备30的第二连接端与信号衰减设备20的控制端连接,用于控制信号衰减设备20的衰减值;The second connection end of the control device 30 is connected to the control end of the signal attenuation device 20 for controlling the attenuation value of the signal attenuation device 20;
控制设备30的第三连接端与被测电子设备40连接,用于获取被测电子设备40的吞吐量。The third connection end of the control device 30 is connected to the electronic device under test 40 for obtaining the throughput of the electronic device under test 40 .
需要说明的是,在本实施例中,陪测设备10和被测电子设备40为相同类型的设备,比如,陪测设备10和被测电子设备40均为多输入多输出系统(Multiple-Input Multiple-Output,简称为MIMO)设备。其中,陪测设备10可以是智能手机、平板电脑等,相应的,被测电子设备40也可以是智能手机,平板电脑等。It should be noted that, in this embodiment, the device under test 10 and the electronic device under test 40 are devices of the same type, for example, the device under test 10 and the electronic device under test 40 are both multiple-input multiple-output systems Multiple-Output, referred to as MIMO) equipment. Wherein, the device under test 10 may be a smart phone, a tablet computer, etc. Correspondingly, the electronic device 40 under test may also be a smart phone, a tablet computer, or the like.
其中,在本实施例中,信号衰减设备20可以是可编程衰减器。Wherein, in this embodiment, the signal attenuation device 20 may be a programmable attenuator.
控制设备30可以是任一具有控制功能的硬件设备,比如电脑、单片机、微控制处理器等等,此处对其不作具体限定。The control device 30 may be any hardware device with a control function, such as a computer, a single-chip microcomputer, a microcontroller processor, etc., which is not specifically limited here.
可选的,本申请通过将信号衰减设备20设置在陪测设备10的输出端与陪测设备10的天线之间,以及将信号衰减设备20的控制端与控制设备30的第二连接端连接,并且将陪测设备10的控制端与控制设备30的第一连接端连接,从而使得控制设备30可以对陪测设备10的工作模式进行控制,并根据陪测设备10的工作模式对信号衰减设备20的衰减值进行控制,从而控制设备30可以利用被测设备10及信号衰减设备20对被测电子设备的射频通信性能进行测试。其中,射频通信性能主要是指被测电子设备的吞吐量。由此,实现了利用信号衰减设备来模拟被测设备在实际应用场景中的空间路径衰减,从而使得对电子设备的射频通信能力进行测试时,通过调整信号衰减设备的衰减值,即可实现不同衰减场景下的测试,从而能够减少构建测试环境花费成本,并且还能提高测试效率,改善用户使用体验。Optionally, the present application arranges the signal attenuation device 20 between the output end of the accompanying test device 10 and the antenna of the accompanying test device 10, and connects the control terminal of the signal attenuation device 20 to the second connection end of the control device 30 , and connect the control terminal of the accompanying test device 10 to the first connection terminal of the control device 30, so that the control device 30 can control the working mode of the accompanying testing device 10, and attenuate the signal according to the working mode of the accompanying testing device 10 The attenuation value of the device 20 is controlled, so that the control device 30 can use the device under test 10 and the signal attenuation device 20 to test the radio frequency communication performance of the electronic device under test. Among them, the radio frequency communication performance mainly refers to the throughput of the electronic equipment under test. Thus, the signal attenuation device is used to simulate the spatial path attenuation of the device under test in the actual application scene, so that when testing the radio frequency communication capability of the electronic device, by adjusting the attenuation value of the signal attenuation device, different Tests in attenuation scenarios can reduce the cost of building a test environment, improve test efficiency, and improve user experience.
为了能够更清楚的说明本申请实施例,下面对被测电子设备的吞吐量测试过程进行详细说明。In order to describe the embodiment of the present application more clearly, the throughput testing process of the electronic device under test will be described in detail below.
假设本申请中是通过陪测设备10向被测电子设备40发送电磁波信号,并根据被测电子设备40接收到的电磁波信号确定被测电子设备40的吞吐量,那么控制设备30可根据预先配置的陪测设备10、信号衰减设备20以及被测电子设备40的工作参数信息,控制陪测设备10、信号衰减设备20以及被测电子设备40处于相匹配的工作状态下,并当设置好相关控制信息之后,可向陪测设备10发送触发操作,以控制陪测设备10向被测电子设备40发送对应的电磁波信号,同时控制信号衰减设备20利用设置好的衰减值,对陪测设备10发送的电磁波信号进行衰减,当被测电子设备40接收到经过衰减的电磁波信号之后,可将接收到的电磁波信号发送给控制设备30,从而控制设备30可根据被测电子设备40发送的电磁波信号与陪测设备10发送的电磁波信号进行比对,并根据比对结果可以确定出被测电子设备40的吞吐量情况。Assuming that in this application, the accompanying device 10 sends electromagnetic wave signals to the electronic device under test 40, and determines the throughput of the electronic device under test 40 according to the electromagnetic wave signal received by the electronic device under test 40, then the control device 30 can The working parameter information of the companion device 10, the signal attenuation device 20 and the electronic device under test 40, the control companion device 10, the signal attenuation device 20 and the electronic device under test 40 are in a matching working state, and when the related After controlling the information, a trigger operation can be sent to the device under test 10 to control the device under test 10 to send a corresponding electromagnetic wave signal to the electronic device under test 40, and at the same time control the signal attenuation device 20 to use the set attenuation value to The transmitted electromagnetic wave signal is attenuated. After the electronic device under test 40 receives the attenuated electromagnetic wave signal, it can send the received electromagnetic wave signal to the control device 30, so that the control device 30 can transmit the electromagnetic wave signal according to the electronic device under test 40. It is compared with the electromagnetic wave signal sent by the device under test 10, and the throughput of the electronic device under test 40 can be determined according to the comparison result.
其中,在本实施例中,可通过公式(1)确定信号衰减设备20的衰减值:Wherein, in this embodiment, the attenuation value of the signal attenuation device 20 can be determined by formula (1):
S=32.44+20log10F+20log10d…………………………………………(1)S=32.44+ 20log10F + 20log10d ……………………………………(1)
其中,S为衰减值,F为陪测设备的工作频率,d为被测电子设备与陪测设备间的距离。Among them, S is the attenuation value, F is the working frequency of the device under test, and d is the distance between the electronic device under test and the device under test.
在实际使用时,通过改变F和d即可确定不同的衰减值,从而为衰减设备配置不同的衰减值,即可实现对被测电子设备在不同频段、不同距离下的吞吐量的测试。In actual use, different attenuation values can be determined by changing F and d, so that different attenuation values can be configured for the attenuation device, and the throughput test of the electronic device under test in different frequency bands and different distances can be realized.
需要说明的是,在本实施例中,控制设备30可以根据实际需要设置为一个或多个,本实施例对此不作具体限定。It should be noted that, in this embodiment, one or more control devices 30 may be set according to actual needs, which is not specifically limited in this embodiment.
举例来说,若控制设备30为一个,则通过将陪测设备10、信号衰减设备20以及被测电子设备40的相关信息预先配置在控制设备30中,使得控制设备30对被测电子设备40进行吞吐量测试时,可以根据预先配置的信息进行准确可靠的测试。其中,相关信息可以是陪测设备10、信号衰减设备20以及被测电子设备40的工作模式、工作频率、工作带宽等等,此处对其不作具体限定。For example, if there is only one control device 30, by pre-configuring the relevant information of the accompanying device 10, the signal attenuation device 20, and the electronic device under test 40 in the control device 30, the control device 30 can control the electronic device under test 40 When performing throughput testing, accurate and reliable testing can be performed based on pre-configured information. Wherein, the relevant information may be the working mode, working frequency, working bandwidth, etc. of the accompanying device 10 , the signal attenuating device 20 and the electronic device under test 40 , which are not specifically limited here.
若控制设备30为多个,则需要将陪测设备10、信号衰减设备20以及被测电子设备40的相关信息分别预先配置在多个控制设备30中,从而使得多个控制设备30对被测电子设备40进行吞吐量测试时,可以保证各控制设备30之间的信息同步,从而保证被测电子设备40的吞吐量测试结果准确可靠。If there are multiple control devices 30, it is necessary to pre-configure the relevant information of the accompanying test device 10, the signal attenuation device 20, and the electronic device under test 40 respectively in multiple control devices 30, so that the multiple control devices 30 can control the When the electronic device 40 performs the throughput test, the information synchronization among the control devices 30 can be guaranteed, so as to ensure that the throughput test result of the electronic device 40 under test is accurate and reliable.
然而,由于设置多个控制设备30可能会增大花费成本,并且测试难度也可能会根据控制设备30的增多而变大,因此为了节省花费以及降低测试难度,本实施例则以设置一个控制设备30为例对本申请进行具体说明。作为一种可选的实现形式,本实施例可根据一个控制设备30对陪测设备10的工作模式及信号衰减设备20的衰减值进行控制,并根据陪测设备10的工作模式及信号衰减设备20的衰减值,获取被测电子设备10的吞吐量。However, since arranging multiple control devices 30 may increase the cost, and the difficulty of testing may also increase according to the number of control devices 30, so in order to save costs and reduce the difficulty of testing, this embodiment uses one control device 30 as an example to describe this application in detail. As an optional implementation form, this embodiment can control the working mode of the accompanying test device 10 and the attenuation value of the signal attenuation device 20 according to a control device 30, and according to the working mode of the accompanying test device 10 and the signal attenuation device The attenuation value of 20 is used to obtain the throughput of the electronic device under test 10 .
由于在实际的应用中,电磁环境复杂,存在大量不稳定的无线电磁波的干扰,从而会影响整个测试效率和测试结果,并且还会对存在的问题复现和解决,带来不利影响。因此,为了避免无线电磁波的干扰,如图3所示,本实施例电子设备射频通信性能测试系统100还包括:根据被测电子设备40的属性信息,产生屏蔽环境的屏蔽设备60。Due to the complex electromagnetic environment in practical applications, there is a large amount of unstable wireless electromagnetic wave interference, which will affect the entire test efficiency and test results, and will also have an adverse effect on the recurrence and resolution of existing problems. Therefore, in order to avoid the interference of radio electromagnetic waves, as shown in FIG. 3 , the radio frequency communication performance testing system 100 of electronic equipment in this embodiment further includes: a shielding device 60 for generating a shielding environment according to the attribute information of the electronic equipment under test 40 .
其中,被测电子设备40的属性信息可以是被测电子设备40的工作频率、工作带宽等,此处不作具体限定。Wherein, the attribute information of the electronic device under test 40 may be an operating frequency, an operating bandwidth, etc. of the electronic device under test 40 , which are not specifically limited here.
也就是说,本申请通过获取被测电子设备40的属性信息,以根据属性信息产生与属性信息对应的屏蔽设备60,使得整个测试系统处于屏蔽环境中,从而保证测试结果的稳定和可靠。That is to say, the present application obtains the attribute information of the electronic device under test 40 to generate a shielding device 60 corresponding to the attribute information, so that the entire test system is in a shielded environment, thereby ensuring the stability and reliability of the test results.
进一步的,由于被测电子设备的天线在不同角度下,所对应的无线性能存在差别,因此为了对被测电子设备40的天线在不同角度下的吞吐量进行测试,本实施例电子设备射频通信性能测试系统100还包括:用于放置被测电子设备40的承载平台50,具体参见图4所示。Further, since the antennas of the electronic device under test have different wireless performances at different angles, in order to test the throughput of the antenna of the electronic device under test 40 at different angles, the radio frequency communication of the electronic device in this embodiment The performance testing system 100 also includes: a bearing platform 50 for placing the electronic device 40 under test, as shown in FIG. 4 for details.
可选的,本实施例中承载平台50的控制端与控制设备30的第四连接端连接,用于在控制设备30的控制下,带动被测电子设备40旋转,从而控制设备30,还用于:获取被测电子设备40在不同旋转角度时的吞吐量。由此实现了通过控制承载平台50的转动,来控制被测电子设备40的角度,从而方便测量不同角度下的被测电子设备40的吞吐量性能,实现了对被测电子设备40的全方位的测试。Optionally, in this embodiment, the control end of the carrying platform 50 is connected to the fourth connection end of the control device 30, and is used to drive the electronic device under test 40 to rotate under the control of the control device 30, so as to control the device 30, and also use In: obtaining the throughput of the electronic device under test 40 at different rotation angles. In this way, the angle of the electronic device under test 40 can be controlled by controlling the rotation of the carrying platform 50, thereby facilitating the measurement of the throughput performance of the electronic device under test 40 at different angles, and realizing an all-round view of the electronic device under test 40 test.
在实际应用时,由于被测电子设备40为MIMO设备,因此被测电子设备40可以具有多个天线,而为了对每个天线的吞吐量都能进行测试,本申请可以将电子设备射频通信性能测试系统100中的信号衰减设备20,根据被测电子设备40的天线数量,设置为对应的多个,如图5所示。也就是说,本实施例中信号衰减设备20,可以包括:N个信号衰减器,其中,N为大于1的整数。In actual application, since the electronic device under test 40 is a MIMO device, the electronic device under test 40 may have multiple antennas, and in order to test the throughput of each antenna, the present application may use the radio frequency communication performance of the electronic device The signal attenuation devices 20 in the test system 100 are set in corresponding multiples according to the number of antennas of the electronic device 40 under test, as shown in FIG. 5 . That is to say, the signal attenuation device 20 in this embodiment may include: N signal attenuators, where N is an integer greater than 1.
其中,N个信号衰减器分别与陪测设备10的N个输出端及陪测设备10的N个天线连接;Wherein, the N signal attenuators are respectively connected with the N output terminals of the accompanying test device 10 and the N antennas of the accompanying test device 10;
控制设备30,还用于根据当前待测电子设备40中包含的天线数量M,控制N个信号衰减器的工作状态,其中M为小于或等于N的整数。The control device 30 is further configured to control the working states of the N signal attenuators according to the number M of antennas contained in the current electronic device 40 under test, where M is an integer less than or equal to N.
可以理解的是,通过控制设备30根据当前待测电子设备40包含的天线数量M,对N个信号衰减器的工作状态分别进行控制,以实现对当前待测电子设备40包含的M个天线均能进行吞吐量的测试。It can be understood that the working states of the N signal attenuators are respectively controlled by the control device 30 according to the number M of antennas contained in the current electronic device 40 to be tested, so as to realize the equalization of the M antennas contained in the current electronic device 40 to be tested. Ability to test throughput.
举例来说,若待测电子设备40包括2个天线,而陪测设备10中包含4条天线,那么在对待测电子设备40进行测试时,即可仅控制2个信号衰减器工作,另外的2个信号衰减器处于无效状态即可,从而即可实现对待测电子设备40包含的2个天线的吞吐量进行测试。For example, if the electronic device under test 40 includes two antennas, and the accompanying device 10 includes four antennas, then when the electronic device under test 40 is tested, only two signal attenuators can be controlled to work, and the other It only needs that the two signal attenuators are in an invalid state, so that the throughput of the two antennas included in the electronic device 40 to be tested can be tested.
本申请实施例提供的电子设备射频通信性能测试系统,通过将陪测设备输出端通过信号衰减器设备与陪测设备的天线连接,并将控制设备的第一连接端与陪测设备的控制端连接,以用于控制陪测设备的工作模式,控制设备的第二连接端与信号衰减设备的控制端连接,以用于控制信号衰减设备的衰减值,控制设备的第三连接端与被测电子设备连接,用于获取被测电子设备的吞吐量。由此,实现了利用信号衰减设备来模拟被测设备在实际应用场景中的空间路径衰减,从而使得对电子设备的射频通信能力进行测试时,通过调整信号衰减设备的衰减值,即可实现不同衰减场景下的测试,从而能够减少构建测试环境花费成本,并且还能提高测试效率,改善用户使用体验。The radio frequency communication performance test system of electronic equipment provided by the embodiment of the present application connects the output end of the accompanying testing equipment to the antenna of the accompanying testing equipment through a signal attenuator device, and connects the first connection terminal of the control equipment to the control terminal of the accompanying testing equipment connected to control the working mode of the accompanying device under test, the second connection end of the control device is connected to the control end of the signal attenuation device for controlling the attenuation value of the signal attenuation device, the third connection end of the control device is connected to the tested Electronics connection to obtain the throughput of the electronic device under test. Thus, the signal attenuation device is used to simulate the spatial path attenuation of the device under test in the actual application scene, so that when testing the radio frequency communication capability of the electronic device, by adjusting the attenuation value of the signal attenuation device, different Tests in attenuation scenarios can reduce the cost of building a test environment, improve test efficiency, and improve user experience.
基于上述实施例提供的电子设备射频通信性能测试系统,本申请实施例还提出了一种电子设备射频通信性能测试方法。Based on the radio frequency communication performance testing system of electronic equipment provided in the above embodiments, the embodiment of the present application also proposes a radio frequency communication performance testing method of electronic equipment.
具体的,如图6所示,本申请电子设备射频通信性能测试方法可以包括以下步骤:Specifically, as shown in Figure 6, the method for testing the radio frequency communication performance of electronic equipment in this application may include the following steps:
步骤601,根据当前被测电子设备的属性信息,确定被测电子设备的应用环境信息。Step 601: Determine the application environment information of the electronic device under test according to the attribute information of the electronic device under test.
其中,本申请实施例提供的电子设备射频通信性能测试方法,可以由电子设备执行,该电子设备中具有电子设备射频通信测试系统,以实现对被测电子设备的测试进行控制。Wherein, the method for testing the radio frequency communication performance of the electronic device provided in the embodiment of the present application can be executed by the electronic device, and the electronic device has a radio frequency communication test system for the electronic device in order to control the test of the electronic device under test.
在本实施例中,当前被测电子设备的属性信息可以为,工作频率、工作带宽、谐振频率等等,此处对其不作具体限定。In this embodiment, the current attribute information of the electronic device under test may include operating frequency, operating bandwidth, resonance frequency, etc., which are not specifically limited here.
也就是说,通过获取当前被测电子设备的属性信息,以根据当前被测电子设备的属性信息,即可确定出当前被测电子设备当前所在的应用环境信息。That is to say, by acquiring the attribute information of the current electronic device under test, the application environment information where the current electronic device under test is currently located can be determined according to the attribute information of the current electronic device under test.
步骤602,根据被测电子设备的应用环境信息,确定信号衰减设备的目标衰减值。Step 602: Determine the target attenuation value of the signal attenuation device according to the application environment information of the electronic device under test.
可选的,当确定出被测电子设备的应用环境信息之后,电子设备即可根据应用环境信息确定出信号衰减设备的目标衰减值。Optionally, after the application environment information of the electronic device under test is determined, the electronic device can determine the target attenuation value of the signal attenuation device according to the application environment information.
作为一种可选的实现形式,本实施例根据被测电子设备的应用环境信息,确定信号衰减设备的目标衰减值,可以通过公式(2)实现:As an optional implementation form, this embodiment determines the target attenuation value of the signal attenuation device according to the application environment information of the electronic device under test, which can be realized by formula (2):
S=32.44+20log10F+20log10d…………………………………………(2)S=32.44+ 20log10F + 20log10d ……………………………………(2)
其中,S为目标衰减值,F为陪测设备的工作频率,d为被测电子设备与陪测设备间的距离。Wherein, S is the target attenuation value, F is the operating frequency of the device under test, and d is the distance between the electronic device under test and the device under test.
步骤603,根据目标衰减值,调整信号衰减设备的衰减量,以获取被测电子设备的吞吐量。Step 603: Adjust the attenuation of the signal attenuation device according to the target attenuation value, so as to obtain the throughput of the electronic device under test.
可选的,当确定出信号衰减设备的目标衰减值之后,电子设备即可根据目标衰减值,调整信号衰减设备的衰减量,从而获取被测电子设备的吞吐量。Optionally, after the target attenuation value of the signal attenuation device is determined, the electronic device can adjust the attenuation amount of the signal attenuation device according to the target attenuation value, so as to obtain the throughput of the electronic device under test.
在本申请的另一个实施例中,由于在实际的应用中,电磁环境复杂,存在大量不稳定的无线电磁波的干扰,从而会影响整个测试效率和测试结果,并且还会对存在的问题的复现和解决,带来不利影响。因此,为了避免无线电磁波的干扰,本实施例电子设备射频通信性能测试方法,还包括:根据所述被测电子设备的属性信息,确定目标屏蔽环境;根据所述目标屏蔽环境,调整屏蔽设备的工作参数。其中,被测电子设备的属性信息可以是被测电子设备的工作频率、工作带宽等,此处不作具体限定。In another embodiment of the present application, due to the complex electromagnetic environment in practical applications, there are a large number of unstable wireless electromagnetic wave interference, which will affect the entire test efficiency and test results, and will also complicate the existing problems. Find and solve, bring adverse effects. Therefore, in order to avoid the interference of wireless electromagnetic waves, the method for testing the radio frequency communication performance of electronic equipment in this embodiment further includes: determining the target shielding environment according to the attribute information of the electronic device under test; adjusting the shielding device according to the target shielding environment. working parameters. Wherein, the attribute information of the electronic device under test may be an operating frequency, an operating bandwidth, etc. of the electronic device under test, which are not specifically limited here.
也就是说,本申请通过获取被测电子设备的属性信息,以根据属性信息确定目标屏蔽环境,从而根据目标屏蔽环境,调整屏蔽设备的工作参数,使得整个测试系统处于屏蔽环境中,从而保证测试结果的稳定和可靠。That is to say, this application obtains the attribute information of the electronic device under test to determine the target shielding environment according to the attribute information, thereby adjusting the working parameters of the shielding device according to the target shielding environment, so that the entire test system is in the shielding environment, thereby ensuring the test Stable and reliable results.
本发明实施例提供的电子设备射频通信性能测试方法,通过将陪测设备输出端通过信号衰减器设备与陪测设备的天线连接,并将控制设备的第一连接端与陪测设备的控制端连接,以用于控制陪测设备的工作模式,控制设备的第二连接端与信号衰减设备的控制端连接,以用于控制信号衰减设备的衰减值,控制设备的第三连接端与被测电子设备连接,用于获取被测电子设备的吞吐量。由此,实现了利用信号衰减设备来模拟被测设备在实际应用场景中的空间路径衰减,从而使得对电子设备的射频通信能力进行测试时,通过调整信号衰减设备的衰减值,即可实现不同衰减场景下的测试,从而能够减少构建测试环境花费成本,并且还能提高测试效率,改善用户使用体验。The method for testing the radio frequency communication performance of an electronic device provided by the embodiment of the present invention is to connect the output terminal of the accompanying testing equipment to the antenna of the accompanying testing equipment through a signal attenuator device, and connect the first connection terminal of the control equipment to the control terminal of the accompanying testing equipment connected to control the working mode of the accompanying device under test, the second connection end of the control device is connected to the control end of the signal attenuation device for controlling the attenuation value of the signal attenuation device, the third connection end of the control device is connected to the tested Electronics connection to obtain the throughput of the electronic device under test. Thus, the signal attenuation device is used to simulate the spatial path attenuation of the device under test in the actual application scene, so that when testing the radio frequency communication capability of the electronic device, by adjusting the attenuation value of the signal attenuation device, different Tests in attenuation scenarios can reduce the cost of building a test environment, improve test efficiency, and improve user experience.
通过上述实施例可知,本申请通过确定被测电子设备的应用环境信息,以确定信号衰减设备的目标衰减值,从而根据目标衰减值对信号衰减设备的衰减量进行调整,从而获取被测电子设备的吞吐量。It can be known from the above embodiments that the present application determines the target attenuation value of the signal attenuation device by determining the application environment information of the electronic device under test, thereby adjusting the attenuation amount of the signal attenuation device according to the target attenuation value, thereby obtaining the electronic device under test. throughput.
在具体实现时,由于被测电子设备可以为MIMO设备,因此被测电子设备40可以具有多个天线,而为了对每个天线的吞吐量都能进行测试,则需要设置包括多个信号衰减器的信号衰减设备,比如设置具有N个信号衰减器的信号衰减设备,其中N为大于1的整数,从而通过上述具有N个信号衰减器的信号衰减设备,对被测电子设备中多个天线的吞吐量进行测试。下面结合图7,对本申请电子设备射频通信性能测试方法进行进一步的说明。In a specific implementation, since the electronic device under test can be a MIMO device, the electronic device under test 40 can have multiple antennas, and in order to test the throughput of each antenna, it is necessary to set a plurality of signal attenuators For example, a signal attenuation device with N signal attenuators is set, wherein N is an integer greater than 1, so that through the above-mentioned signal attenuation device with N signal attenuators, the multiple antennas in the electronic device under test Throughput was tested. The method for testing the radio frequency communication performance of the electronic device of the present application will be further described below in conjunction with FIG. 7 .
图7是本申请的另一个实施例的电子设备射频通信性能测试方法的流程示意图。Fig. 7 is a schematic flowchart of a method for testing radio frequency communication performance of an electronic device according to another embodiment of the present application.
如图7所示,本申请电子设备射频通信性能测试方法可以包括以下步骤:As shown in Figure 7, the method for testing the radio frequency communication performance of electronic equipment in this application may include the following steps:
步骤701,根据当前被测电子设备的属性信息,确定所述被测电子设备的应用环境信息。Step 701: Determine the application environment information of the electronic device under test according to the attribute information of the electronic device under test.
步骤702,根据被测电子设备中包含的天线数量及应用环境信息,确定N个信号衰减分别对应的目标工作状态及目标衰减量。Step 702, according to the number of antennas included in the electronic device under test and the application environment information, determine the target working states and target attenuation amounts corresponding to the N signal attenuations respectively.
其中,由于陪测设备、信号衰减设备及被测电子设备的参数信息是预先设置在控制设备中,因此电子设备可以根据控制设备中预先设置的参数信息确定出被测电子设备包含的天线数量,从而根据确定的天线数量即可对应确定出N个信号衰减分别对应的目标工作状态及目标衰减量。Among them, since the parameter information of the accompanying test device, the signal attenuation device and the electronic device under test are preset in the control device, the electronic device can determine the number of antennas contained in the electronic device under test according to the parameter information preset in the control device, Therefore, according to the determined number of antennas, the target working states and target attenuation amounts respectively corresponding to the N signal attenuations can be correspondingly determined.
步骤703,根据N个信号衰减分别对应的目标工作状态及目标衰减量,对N个信号衰减器进行控制,以获取被测电子设备的吞吐量。Step 703: Control the N signal attenuators according to the target working states and target attenuation amounts respectively corresponding to the N signal attenuators, so as to obtain the throughput of the electronic device under test.
可选的,当确定出N个信号衰减分别对应的目标工作状态及目标衰减辆之后,电子设备即可对具有N各信号衰减器的信号衰减设备进行控制,以获取被测电子设备的吞吐量。Optionally, after determining the target working states and target attenuation vehicles corresponding to the N signal attenuators, the electronic device can control the signal attenuation devices with N signal attenuators to obtain the throughput of the electronic device under test .
可以理解的是,通过根据当前待测电子设备包含的天线数量,对N个信号衰减器分别进行控制,以实现对被测电子设备包含的M个天线分别进行吞吐量的测试。It can be understood that the N signal attenuators are respectively controlled according to the number of antennas included in the current electronic device under test, so as to implement the throughput test for the M antennas included in the electronic device under test respectively.
通过上述实施例可知,本申请根据被测电子设备中包含的天线数量,确定N个信号衰减分别对应的目标工作状态及目标衰减量,并根据确定的目标工作状态及目标衰减辆,对N个信号衰减器进行控制,以实现对被测电子设备包含的多个天线分别进行吞吐量的测试。It can be seen from the above-mentioned embodiments that the present application determines the target operating states and target attenuation amounts corresponding to the N signal attenuations according to the number of antennas contained in the electronic equipment under test, and according to the determined target operating states and target attenuation vehicles, the N The signal attenuator is controlled, so as to realize the throughput test of the plurality of antennas contained in the electronic device under test respectively.
在具体实现时,由于被测电子设备的天线在不同角度下,所对应的无线性能存在差别,因此为了对被测电子设备的天线在不同角度下的吞吐量进行测试,可以将被测电子设备放置在可旋转的承载平台上,以通过控制承载平台的旋转,对被测电子设备的天线在不同角度下的吞吐量进行测试。下面结合图8,对本申请电子设备射频通信性能测试方法进行进一步的说明。In the specific implementation, since the antenna of the electronic device under test has different wireless performances at different angles, in order to test the throughput of the antenna of the electronic device under test at different angles, the electronic device under test can be Placed on a rotatable carrying platform to test the throughput of the antenna of the electronic device under test at different angles by controlling the rotation of the carrying platform. The method for testing the radio frequency communication performance of the electronic device of the present application will be further described below in conjunction with FIG. 8 .
图8是本申请的另一个实施例的电子设备射频通信性能测试方法的流程示意图。Fig. 8 is a schematic flowchart of a method for testing radio frequency communication performance of an electronic device according to another embodiment of the present application.
如图8所示,本申请电子设备射频通信性能测试方法可以包括以下步骤:As shown in Figure 8, the method for testing the radio frequency communication performance of electronic equipment in this application may include the following steps:
步骤801,根据当前被测电子设备的属性信息,确定被测电子设备的应用环境信息及承载平台的目标旋转方式,其中,承载平台用于放置被测电子设备。Step 801, according to the attribute information of the current electronic device under test, determine the application environment information of the electronic device under test and the target rotation mode of the carrying platform, wherein the carrying platform is used to place the electronic device under test.
其中,当前被测电子设备的属性信息可以是天线的设置位置,以及天线的工作频率、工作带宽等,此处对其不作具体限定。Wherein, the attribute information of the current electronic device under test may be the installation position of the antenna, and the working frequency and working bandwidth of the antenna, etc., which are not specifically limited here.
可选的,承载平台的目标旋转方式可以是每次旋转的角度、旋转的时间间隔等等。Optionally, the target rotation mode of the carrying platform may be an angle of each rotation, a time interval of rotation, and the like.
步骤802,根据被测电子设备的应用环境信息,确定信号衰减设备的目标衰减值。Step 802: Determine the target attenuation value of the signal attenuation device according to the application environment information of the electronic device under test.
步骤803,根据目标衰减值,调整信号衰减设备的衰减量,并根据目标旋转方式,控制承载平台带动被测电子设备旋转,以获取被测电子设备的吞吐量。Step 803, adjust the attenuation of the signal attenuation device according to the target attenuation value, and control the bearing platform to drive the electronic device under test to rotate according to the target rotation mode, so as to obtain the throughput of the electronic device under test.
例如,目标旋转方式为每次旋转15°,那么电子设备可以控制承载平台每次旋转15°,然后对被测电子设备的天线的吞吐量进行测试。For example, if the target rotation mode is 15° each time, the electronic device may control the carrying platform to rotate 15° each time, and then test the throughput of the antenna of the electronic device under test.
也就是说,通过控制承载平台的转动,来控制被测电子设备的角度,从而方便测量不同角度下的被测电子设备的吞吐量性能,实现了对被测电子设备的全方位的测试。That is to say, by controlling the rotation of the bearing platform, the angle of the electronic device under test is controlled, so as to facilitate the measurement of the throughput performance of the electronic device under test at different angles, and realize the all-round test of the electronic device under test.
为了实现上述实施例,本申请还提出了一种电子设备射频通信性能测试装置。In order to realize the above embodiments, the present application also proposes a device for testing radio frequency communication performance of electronic equipment.
图9是本申请一个实施例的电子设备射频通信性能测试装置的结构示意图。Fig. 9 is a schematic structural diagram of an electronic device radio frequency communication performance testing device according to an embodiment of the present application.
如图9所示,本申请的电子设备射频通信性能测试装置包括:第一确定模块11、第二确定模块12以及调整模块13。As shown in FIG. 9 , the device for testing radio frequency communication performance of electronic equipment of the present application includes: a first determination module 11 , a second determination module 12 and an adjustment module 13 .
其中,第一确定模块11用于根据当前被测电子设备的属性信息,确定所述被测电子设备的应用环境信息;Wherein, the first determining module 11 is used to determine the application environment information of the electronic device under test according to the attribute information of the electronic device under test;
第二确定模块12用于根据所述被测电子设备的应用环境信息,确定信号衰减设备的目标衰减值;The second determination module 12 is used to determine the target attenuation value of the signal attenuation device according to the application environment information of the electronic device under test;
调整模块13用于根据所述目标衰减值,调整所述信号衰减设备的衰减量,以获取所述被测电子设备的吞吐量。The adjustment module 13 is configured to adjust the attenuation of the signal attenuation device according to the target attenuation value, so as to obtain the throughput of the electronic device under test.
作为本申请的一种可选的实现形式,所述第一确定模块11包括:第一确定单元和第一调整单元。As an optional implementation form of the present application, the first determining module 11 includes: a first determining unit and a first adjusting unit.
其中,第一确定单元用于根据所述被测电子设备的属性信息,确定目标屏蔽环境;Wherein, the first determining unit is configured to determine the target shielding environment according to the attribute information of the electronic device under test;
第一调整单元用于根据所述目标屏蔽环境,调整屏蔽设备的工作参数。The first adjusting unit is used for adjusting the working parameters of the shielding device according to the target shielding environment.
需要说明的是,前述对电子设备射频通信性能测试方法实施例的解释说明也适用于该实施例的电子设备射频通信性能测试装置,其实现原理类似,此处不再赘述。It should be noted that the foregoing explanations of the embodiment of the method for testing the radio frequency communication performance of electronic equipment are also applicable to the device for testing the radio frequency communication performance of electronic equipment in this embodiment, and its implementation principles are similar, so details will not be repeated here.
本实施例提供的电子设备射频通信性能测试装置,通过将陪测设备输出端通过信号衰减器设备与陪测设备的天线连接,并将控制设备的第一连接端与陪测设备的控制端连接,以用于控制陪测设备的工作模式,控制设备的第二连接端与信号衰减设备的控制端连接,以用于控制信号衰减设备的衰减值,控制设备的第三连接端与被测电子设备连接,用于获取被测电子设备的吞吐量。由此,实现了利用信号衰减设备来模拟被测设备在实际应用场景中的空间路径衰减,从而使得对电子设备的射频通信能力进行测试时,通过调整信号衰减设备的衰减值,即可实现不同衰减场景下的测试,从而能够减少构建测试环境花费成本,并且还能提高测试效率,改善用户使用体验。The device for testing the radio frequency communication performance of electronic equipment provided in this embodiment connects the output end of the accompanying testing equipment to the antenna of the accompanying testing equipment through a signal attenuator device, and connects the first connection end of the control equipment to the control terminal of the accompanying testing equipment. , to control the working mode of the accompanying test device, the second connection end of the control device is connected to the control end of the signal attenuation device for controlling the attenuation value of the signal attenuation device, the third connection end of the control device is connected to the electronic device under test Device connection for obtaining the throughput of the electronic device under test. Thus, the signal attenuation device is used to simulate the spatial path attenuation of the device under test in the actual application scene, so that when testing the radio frequency communication capability of the electronic device, by adjusting the attenuation value of the signal attenuation device, different Tests in attenuation scenarios can reduce the cost of building a test environment, improve test efficiency, and improve user experience.
在示例性实施例中,还提供了一种电子设备射频通信性能测试装置。In an exemplary embodiment, a device for testing radio frequency communication performance of electronic equipment is also provided.
图10为本申请另一个实施例的电子设备射频通信性能测试装置的结构示意图。FIG. 10 is a schematic structural diagram of an electronic device radio frequency communication performance testing device according to another embodiment of the present application.
参照图10所示,本申请的电子设备射频通信性能测试装置可以包括:第一确定模块11、第二确定模块12、第一控制模块14。Referring to FIG. 10 , the device for testing radio frequency communication performance of electronic equipment of the present application may include: a first determination module 11 , a second determination module 12 , and a first control module 14 .
其中,第一确定模块11用于根据当前被测电子设备的属性信息,确定所述被测电子设备的应用环境信息;Wherein, the first determining module 11 is used to determine the application environment information of the electronic device under test according to the attribute information of the electronic device under test;
第二确定模块12具体用于根据被测电子设备中包含的天线数量及应用环境信息,确定N个信号衰减分别对应的目标工作状态及目标衰减量。The second determination module 12 is specifically configured to determine the target working states and target attenuations respectively corresponding to the N signal attenuations according to the number of antennas included in the electronic device under test and the application environment information.
其中,信号衰减设备中包括N个信号衰减器。Wherein, the signal attenuation device includes N signal attenuators.
第一控制模块14用于根据N个信号衰减分别对应的目标工作状态及目标衰减量,对N个信号衰减器进行控制,以获取被测电子设备的吞吐量。The first control module 14 is configured to control the N signal attenuators according to the target operating states and target attenuation amounts respectively corresponding to the N signal attenuators, so as to obtain the throughput of the electronic device under test.
需要说明的是,本实施例的电子设备射频通信性能测试装置的实施过程和技术原理参见前述对第二方面实施例的电子设备射频通信性能测试方法的解释说明,此处不再赘述。It should be noted that, for the implementation process and technical principles of the radio frequency communication performance testing device of electronic equipment in this embodiment, please refer to the above-mentioned explanation of the radio frequency communication performance testing method of electronic equipment in the embodiment of the second aspect, which will not be repeated here.
本申请实施例提供的电子设备射频通信性能测试装置,通过根据当前待测电子设备包含的天线数量,对N个信号衰减器分别进行控制,以实现对被测电子设备包含的M个天线分别进行吞吐量的测试。The electronic device radio frequency communication performance test device provided in the embodiment of the present application controls the N signal attenuators respectively according to the number of antennas contained in the electronic device under test, so as to realize the M antennas contained in the electronic device under test respectively. Throughput test.
在示例性实施例中,还提供了一种电子设备射频通信性能测试装置。In an exemplary embodiment, a device for testing radio frequency communication performance of electronic equipment is also provided.
图11为本申请又一个实施例的电子设备射频通信性能测试装置的结构示意图。FIG. 11 is a schematic structural diagram of an electronic device radio frequency communication performance testing device according to another embodiment of the present application.
如图11所示,本申请的电子设备射频通信性能测试装置可以包括:第一确定模块11、第二确定模块12、第二控制模块15As shown in Figure 11, the electronic device radio frequency communication performance testing device of the present application may include: a first determination module 11, a second determination module 12, and a second control module 15
其中,第一确定模块11具体用于根据当前被测电子设备的属性信息,确定被测电子设备的应用环境信息及承载平台的目标旋转方式,其中,承载平台用于放置被测电子设备;Wherein, the first determination module 11 is specifically used to determine the application environment information of the electronic device under test and the target rotation mode of the carrying platform according to the attribute information of the current electronic device under test, wherein the carrying platform is used to place the electronic device under test;
第二确定模块12用于根据所述被测电子设备的应用环境信息,确定信号衰减设备的目标衰减值;The second determination module 12 is used to determine the target attenuation value of the signal attenuation device according to the application environment information of the electronic device under test;
第二控制模块15用于根据目标衰减值,调整信号衰减设备的衰减量,并根据目标旋转方式,控制承载平台带动被测电子设备旋转,以获取被测电子设备的吞吐量。The second control module 15 is used to adjust the attenuation of the signal attenuation device according to the target attenuation value, and control the bearing platform to drive the electronic device under test to rotate according to the target rotation mode, so as to obtain the throughput of the electronic device under test.
需要说明的是,前述对电子设备射频通信性能测试方法实施例的解释说明也适用于该实施例的电子设备射频通信性能测试装置,其实现原理类似,此处不再赘述。It should be noted that the foregoing explanations of the embodiment of the method for testing the radio frequency communication performance of electronic equipment are also applicable to the device for testing the radio frequency communication performance of electronic equipment in this embodiment, and its implementation principles are similar, so details will not be repeated here.
本实施例提供的电子设备射频通信性能测试装置,通过控制承载平台的转动,来控制被测电子设备的角度,从而方便测量不同角度下的被测电子设备的吞吐量性能,实现了对被测电子设备的全方位的测试。The electronic device radio frequency communication performance test device provided in this embodiment controls the angle of the electronic device under test by controlling the rotation of the carrying platform, thereby facilitating the measurement of the throughput performance of the electronic device under test at different angles, and realizing the test of the electronic device under test. Comprehensive testing of electronic equipment.
为了实现上述实施例,本申请还提出一种电子设备。In order to implement the above embodiments, the present application also proposes an electronic device.
图12为本申请一个实施例的电子设备的结构示意图。图12显示的电子设备仅仅是一个示例,不应对本申请实施例的功能和使用范围带来任何限制。FIG. 12 is a schematic structural diagram of an electronic device according to an embodiment of the present application. The electronic device shown in FIG. 12 is only an example, and should not limit the functions and scope of use of this embodiment of the present application.
如图12所示,上述电子设备200包括:存储器210、处理器220及存储在存储器210上并可在处理器220上运行的计算机程序,所述处理器220执行所述程序时,以实现第二方面实施例所述的电子设备射频通信性能测试方法。As shown in FIG. 12, the above-mentioned electronic device 200 includes: a memory 210, a processor 220, and a computer program stored on the memory 210 and operable on the processor 220. When the processor 220 executes the program, the first The method for testing the radio frequency communication performance of electronic equipment described in the second aspect of the embodiment.
在一种可选的实现形式中,如图13所示,该电子设备200还可以包括:存储器210及处理器220,连接不同组件(包括存储器210和处理器220)的总线230,存储器210存储有计算机程序,当处理器220执行所述程序时实现本申请实施例所述的电子设备射频通信性能测试方法。In an optional implementation form, as shown in FIG. 13 , the electronic device 200 may further include: a memory 210 and a processor 220, a bus 230 connecting different components (including the memory 210 and the processor 220), and the memory 210 stores There is a computer program, and when the processor 220 executes the program, the method for testing the radio frequency communication performance of an electronic device described in the embodiment of the present application is realized.
总线230表示几类总线结构中的一种或多种,包括存储器总线或者存储器控制器,外围总线,图形加速端口,处理器或者使用多种总线结构中的任意总线结构的局域总线。举例来说,这些体系结构包括但不限于工业标准体系结构(ISA)总线,微通道体系结构(MAC)总线,增强型ISA总线、视频电子标准协会(VESA)局域总线以及外围组件互连(PCI)总线。Bus 230 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus structures. These architectures include, by way of example, but are not limited to Industry Standard Architecture (ISA) bus, Micro Channel Architecture (MAC) bus, Enhanced ISA bus, Video Electronics Standards Association (VESA) local bus, and Peripheral Component Interconnect ( PCI) bus.
电子设备200典型地包括多种计算机设备可读介质。这些介质可以是任何能够被电子设备200访问的可用介质,包括易失性和非易失性介质,可移动的和不可移动的介质。Electronic device 200 typically includes a variety of computer device readable media. These media can be any available media that can be accessed by electronic device 200 and include both volatile and nonvolatile media, removable and non-removable media.
存储器210还可以包括易失性存储器形式的计算机系统可读介质,例如随机存取存储器(RAM)240和/或高速缓存存储器250。电子设备200可以进一步包括其他可移动/不可移动的、易失性/非易失性计算机系统存储介质。仅作为举例,存储系统260可以用于读写不可移动的、非易失性磁介质(图13未显示,通常称为“硬盘驱动器”)。尽管图13中未示出,可以提供用于对可移动非易失性磁盘(例如“软盘”)读写的磁盘驱动器,以及对可移动非易失性光盘(例如CD-ROM,DVD-ROM或者其他光介质)读写的光盘驱动器。在这些情况下,每个驱动器可以通过一个或者多个数据介质接口与总线230相连。存储器210可以包括至少一个程序产品,该程序产品具有一组(例如至少一个)程序模块,这些程序模块被配置以执行本申请各实施例的功能。Memory 210 may also include computer system readable media in the form of volatile memory, such as random access memory (RAM) 240 and/or cache memory 250 . The electronic device 200 may further include other removable/non-removable, volatile/nonvolatile computer system storage media. By way of example only, storage system 260 may be used to read and write to non-removable, non-volatile magnetic media (not shown in FIG. 13, commonly referred to as a "hard drive"). Although not shown in FIG. 13, a disk drive for reading and writing to removable non-volatile disks (such as "floppy disks") may be provided, as well as for removable non-volatile optical disks (such as CD-ROM, DVD-ROM or other optical media) CD-ROM drive. In these cases, each drive may be connected to bus 230 through one or more data media interfaces. The memory 210 may include at least one program product having a set (for example, at least one) of program modules configured to execute the functions of the various embodiments of the present application.
具有一组(至少一个)程序模块270的程序/实用工具280,可以存储在例如存储器210中,这样的程序模块270包括——但不限于——操作系统、一个或者多个应用程序、其他程序模块以及程序数据,这些示例中的每一个或某种组合中可能包括网络环境的实现。程序模块270通常执行本申请所描述的实施例中的功能和/或方法。Program/utility 280 having a set (at least one) of program modules 270, such as may be stored in memory 210, such program modules 270 including - but not limited to - an operating system, one or more application programs, other program Modules and program data, each or some combination of these examples may include the implementation of the network environment. The program module 270 generally executes the functions and/or methods in the embodiments described in this application.
电子设备200也可以与一个或多个外部设备290(例如键盘、指向设备、显示器291等)通信,还可与一个或者多个使得用户能与该电子设备200交互的设备通信,和/或与使得该电子设备200能与一个或多个其他计算设备进行通信的任何设备(例如网卡,调制解调器等等)通信。这种通信可以通过输入/输出(I/O)接口292进行。并且,电子设备200还可以通过网络适配器293与一个或者多个网络(例如局域网(LAN),广域网(WAN)和/或公共网络,例如因特网)通信。如图所示,网络适配器293通过总线230与电子设备200的其他模块通信。应当明白,尽管图中未示出,可以结合电子设备200使用其他硬件和/或软件模块,包括但不限于:微代码、设备驱动器、冗余处理单元、外部磁盘驱动阵列、RAID系统、磁带驱动器以及数据备份存储系统等。The electronic device 200 can also communicate with one or more external devices 290 (such as keyboards, pointing devices, displays 291, etc.), and can also communicate with one or more devices that enable the user to interact with the electronic device 200, and/or communicate with Any device (eg, network card, modem, etc.) that enables the electronic device 200 to communicate with one or more other computing devices. Such communication may occur through input/output (I/O) interface 292 . Moreover, the electronic device 200 can also communicate with one or more networks (such as a local area network (LAN), a wide area network (WAN) and/or a public network such as the Internet) through the network adapter 293 . As shown, the network adapter 293 communicates with other modules of the electronic device 200 through the bus 230 . It should be appreciated that although not shown, other hardware and/or software modules may be used in conjunction with electronic device 200, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives And data backup storage system, etc.
需要说明的是,本实施例的电子设备的实施过程和技术原理参见前述对第二方面实施例的电子设备射频通信性能测试方法的解释说明,此处不再赘述。It should be noted that, for the implementation process and technical principle of the electronic device in this embodiment, refer to the above-mentioned explanation of the radio frequency communication performance test method of the electronic device in the embodiment of the second aspect, and will not be repeated here.
本申请实施例提供的电子设备,通过将陪测设备输出端通过信号衰减器设备与陪测设备的天线连接,并将控制设备的第一连接端与陪测设备的控制端连接,以用于控制陪测设备的工作模式,控制设备的第二连接端与信号衰减设备的控制端连接,以用于控制信号衰减设备的衰减值,控制设备的第三连接端与被测电子设备连接,用于获取被测电子设备的吞吐量。由此,实现了利用信号衰减设备来模拟被测设备在实际应用场景中的空间路径衰减,从而使得对电子设备的射频通信能力进行测试时,通过调整信号衰减设备的衰减值,即可实现不同衰减场景下的测试,从而能够减少构建测试环境花费成本,并且还能提高测试效率,改善用户使用体验。The electronic device provided by the embodiment of the present application is used to To control the working mode of the accompanying test device, the second connection end of the control device is connected to the control end of the signal attenuation device to control the attenuation value of the signal attenuation device, and the third connection end of the control device is connected to the electronic device under test. To obtain the throughput of the electronic device under test. Thus, the signal attenuation device is used to simulate the spatial path attenuation of the device under test in the actual application scene, so that when testing the radio frequency communication capability of the electronic device, by adjusting the attenuation value of the signal attenuation device, different Tests in attenuation scenarios can reduce the cost of building a test environment, improve test efficiency, and improve user experience.
为实现上述目的,本申请还提出一种计算机可读存储介质。To achieve the above purpose, the present application also proposes a computer-readable storage medium.
其中该计算机可读存储介质,其上存储有计算机程序,该程序被处理器执行时,以实现第二方面实施例所述的电子设备射频通信性能测试方法。Wherein the computer-readable storage medium has a computer program stored thereon, and when the program is executed by a processor, the method for testing the radio frequency communication performance of an electronic device described in the embodiment of the second aspect can be realized.
一种可选实现形式中,本实施例可以采用一个或多个计算机可读的介质的任意组合。计算机可读介质可以是计算机可读信号介质或者计算机可读存储介质。计算机可读存储介质例如可以是——但不限于——电、磁、光、电磁、红外线、或半导体的系统、装置或器件,或者任意以上的组合。计算机可读存储介质的更具体的例子(非穷举的列表)包括:具有一个或多个导线的电连接、便携式计算机磁盘、硬盘、随机存取存储器(RAM)、只读存储器(ROM)、可擦式可编程只读存储器(EPROM或闪存)、光纤、便携式紧凑磁盘只读存储器(CD-ROM)、光存储器件、磁存储器件、或者上述的任意合适的组合。在本文件中,计算机可读存储介质可以是任何包含或存储程序的有形介质,该程序可以被指令执行系统、装置或者器件使用或者与其结合使用。In an optional implementation form, this embodiment may use any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. A computer readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (non-exhaustive list) of computer readable storage media include: electrical connections with one or more leads, portable computer disks, hard disks, random access memory (RAM), read only memory (ROM), Erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination of the above. In this document, a computer-readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.
计算机可读的信号介质可以包括在基带中或者作为载波一部分传播的数据信号,其中承载了计算机可读的程序代码。这种传播的数据信号可以采用多种形式,包括——但不限于——电磁信号、光信号或上述的任意合适的组合。计算机可读的信号介质还可以是计算机可读存储介质以外的任何计算机可读介质,该计算机可读介质可以发送、传播或者传输用于由指令执行系统、装置或者器件使用或者与其结合使用的程序。A computer readable signal medium may include a data signal carrying computer readable program code in baseband or as part of a carrier wave. Such propagated data signals may take many forms, including - but not limited to - electromagnetic signals, optical signals, or any suitable combination of the foregoing. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium, which can send, propagate, or transmit a program for use by or in conjunction with an instruction execution system, apparatus, or device. .
计算机可读介质上包含的程序代码可以用任何适当的介质传输,包括——但不限于——无线、电线、光缆、RF等等,或者上述的任意合适的组合。Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including - but not limited to - wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
可以以一种或多种程序设计语言或其组合来编写用于执行本发明操作的计算机程序代码,所述程序设计语言包括面向对象的程序设计语言—诸如Java、Smalltalk、C++,还包括常规的过程式程序设计语言—诸如”C”语言或类似的程序设计语言。程序代码可以完全地在用户计算机上执行、部分地在用户计算机上执行、作为一个独立的软件包执行、部分在用户计算机上部分在远程计算机上执行、或者完全在远程计算机或服务器上执行。在涉及远程计算机的情形中,远程计算机可以通过任意种类的网络——包括局域网(LAN)或广域网(WAN)—连接到用户计算机,或者,可以连接到外部计算机(例如利用因特网服务提供商来通过因特网连接)。Computer program code for carrying out the operations of the present invention may be written in one or more programming languages, or combinations thereof, including object-oriented programming languages—such as Java, Smalltalk, C++, and conventional Procedural programming language—such as "C" or a similar programming language. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In cases involving a remote computer, the remote computer can be connected to the user computer through any kind of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computer (such as through an Internet service provider). Internet connection).
为实现上述目的,本申请还提出一种计算机程序。其中当计算机程序被处理器执行时,以实现第二方面实施例所述的电子设备射频通信性能测试方法。To achieve the above purpose, the present application also proposes a computer program. Wherein, when the computer program is executed by the processor, the method for testing the radio frequency communication performance of the electronic device described in the embodiment of the second aspect is realized.
在本申请中,除非另有明确的规定和限定,术语“设置”、“连接”等术语应做广义理解,例如,可以是机械连接,也可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通或两个元件的相互作用关系,除非另有明确的限定。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在本申请中的具体含义。In this application, unless otherwise clearly specified and limited, the terms "arrangement", "connection" and other terms should be understood in a broad sense, for example, it can be mechanical connection or electrical connection; it can be direct connection or through An indirect connection through an intermediary may be an internal communication between two elements or an interaction relationship between two elements, unless otherwise clearly defined. Those of ordinary skill in the art can understand the specific meanings of the above terms in this application according to specific situations.
在本说明书的描述中,参考术语“一个实施例”、“一些实施例”、“示例”、“具体示例”、或“一些示例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特点包含于本申请的至少一个实施例或示例中。In the description of this specification, descriptions referring to the terms "one embodiment", "some embodiments", "example", "specific examples", or "some examples" mean that specific features described in connection with the embodiment or example , structure, material or characteristic is included in at least one embodiment or example of the present application.
此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include at least one of these features.
流程图中或在此以其他方式描述的任何过程或方法描述可以被理解为,表示包括一个或更多个用于实现特定逻辑功能或过程的步骤的可执行指令的代码的模块、片段或部分,并且本申请的优选实施方式的范围包括另外的实现,其中可以不按所示出或讨论的顺序,包括根据所涉及的功能按基本同时的方式或按相反的顺序,来执行功能,这应被本申请的实施例所属技术领域的技术人员所理解。Any process or method descriptions in flowcharts or otherwise described herein may be understood to represent modules, segments or portions of code comprising one or more executable instructions for implementing specific logical functions or steps of the process , and the scope of preferred embodiments of the present application includes additional implementations in which functions may be performed out of the order shown or discussed, including in substantially simultaneous fashion or in reverse order depending on the functions involved, which shall It should be understood by those skilled in the art to which the embodiments of the present application belong.
应当理解,本申请的各部分可以用硬件、软件、固件或它们的组合来实现。在上述实施方式中,多个步骤或方法可以用存储在存储器中且由合适的指令执行系统执行的软件或固件来实现。例如,如果用硬件来实现,和在另一实施方式中一样,可用本领域公知的下列技术中的任一项或他们的组合来实现:具有用于对数据信号实现逻辑功能的逻辑门电路的离散逻辑电路,具有合适的组合逻辑门电路的专用集成电路,可编程门阵列(PGA),现场可编程门阵列(FPGA)等。It should be understood that each part of the present application may be realized by hardware, software, firmware or a combination thereof. In the embodiments described above, various steps or methods may be implemented by software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented by any one or combination of the following techniques known in the art: Discrete logic circuits, ASICs with suitable combinational logic gates, programmable gate arrays (PGAs), field programmable gate arrays (FPGAs), etc.
本技术领域的普通技术人员可以理解实现上述实施例方法携带的全部或部分步骤是可以通过程序来指令相关的硬件完成,所述的程序可以存储于一种计算机可读存储介质中,该程序在执行时,包括方法实施例的步骤之一或其组合。Those of ordinary skill in the art can understand that all or part of the steps carried by the methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium. During execution, one or a combination of the steps of the method embodiments is included.
上述提到的存储介质可以是只读存储器,磁盘或光盘等。尽管上面已经示出和描述了本申请的实施例,可以理解的是,上述实施例是示例性的,不能理解为对本申请的限制,本领域的普通技术人员在本申请的范围内可以对上述实施例进行变化、修改、替换和变型。The storage medium mentioned above may be a read-only memory, a magnetic disk or an optical disk, and the like. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limitations on the present application, and those skilled in the art can make the above-mentioned The embodiments are subject to changes, modifications, substitutions and variations.
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110445558A (en) * | 2019-08-13 | 2019-11-12 | 普联技术有限公司 | Performance test methods, device and terminal device |
CN110492909A (en) * | 2019-08-30 | 2019-11-22 | 北京智芯微电子科技有限公司 | Wireless isolated form power line carrier communication performance test methods and system |
CN112714451A (en) * | 2020-12-22 | 2021-04-27 | 深圳市吉祥腾达科技有限公司 | Method for testing wireless throughput of mobile phone with attenuation |
CN113824613A (en) * | 2021-09-22 | 2021-12-21 | 深圳创维数字技术有限公司 | Network reliability test method, test system and storage medium |
CN114006661A (en) * | 2020-07-28 | 2022-02-01 | 矽品精密工业股份有限公司 | Detection device |
CN115327275A (en) * | 2022-08-22 | 2022-11-11 | 北京计算机技术及应用研究所 | Test system suitable for environmental test |
CN119135301A (en) * | 2024-11-14 | 2024-12-13 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | Relay function detection system, relay function detection method and receiving test equipment |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101409653A (en) * | 2008-11-27 | 2009-04-15 | 深圳华为通信技术有限公司 | Method and system for testing communication product |
CN104469839A (en) * | 2014-12-05 | 2015-03-25 | 上海斐讯数据通信技术有限公司 | Wireless throughput capacity testing method and system capable of reducing influence of human factors |
CN105187135A (en) * | 2015-08-10 | 2015-12-23 | 福建联迪商用设备有限公司 | Method and system for testing wireless equipment |
CN105656569A (en) * | 2016-03-15 | 2016-06-08 | 深圳市共进电子股份有限公司 | Wireless signal measurement system |
US20160373334A1 (en) * | 2015-06-19 | 2016-12-22 | Ixia | Methods, systems, and computer readable media for microburst testing |
CN107147541A (en) * | 2017-03-31 | 2017-09-08 | 北京奇艺世纪科技有限公司 | A kind of WIFI Performance Test Systems and method |
CN108092725A (en) * | 2018-01-11 | 2018-05-29 | 深圳市吉祥腾达科技有限公司 | A kind of test System and method for of Beamforming functions |
-
2018
- 2018-06-19 CN CN201810628660.2A patent/CN108847899A/en active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101409653A (en) * | 2008-11-27 | 2009-04-15 | 深圳华为通信技术有限公司 | Method and system for testing communication product |
CN104469839A (en) * | 2014-12-05 | 2015-03-25 | 上海斐讯数据通信技术有限公司 | Wireless throughput capacity testing method and system capable of reducing influence of human factors |
US20160373334A1 (en) * | 2015-06-19 | 2016-12-22 | Ixia | Methods, systems, and computer readable media for microburst testing |
CN105187135A (en) * | 2015-08-10 | 2015-12-23 | 福建联迪商用设备有限公司 | Method and system for testing wireless equipment |
CN105656569A (en) * | 2016-03-15 | 2016-06-08 | 深圳市共进电子股份有限公司 | Wireless signal measurement system |
CN107147541A (en) * | 2017-03-31 | 2017-09-08 | 北京奇艺世纪科技有限公司 | A kind of WIFI Performance Test Systems and method |
CN108092725A (en) * | 2018-01-11 | 2018-05-29 | 深圳市吉祥腾达科技有限公司 | A kind of test System and method for of Beamforming functions |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110445558A (en) * | 2019-08-13 | 2019-11-12 | 普联技术有限公司 | Performance test methods, device and terminal device |
CN110492909A (en) * | 2019-08-30 | 2019-11-22 | 北京智芯微电子科技有限公司 | Wireless isolated form power line carrier communication performance test methods and system |
CN110492909B (en) * | 2019-08-30 | 2022-08-19 | 北京智芯微电子科技有限公司 | Wireless isolation type power line carrier communication performance test method |
CN114006661A (en) * | 2020-07-28 | 2022-02-01 | 矽品精密工业股份有限公司 | Detection device |
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CN112714451A (en) * | 2020-12-22 | 2021-04-27 | 深圳市吉祥腾达科技有限公司 | Method for testing wireless throughput of mobile phone with attenuation |
CN113824613A (en) * | 2021-09-22 | 2021-12-21 | 深圳创维数字技术有限公司 | Network reliability test method, test system and storage medium |
CN115327275A (en) * | 2022-08-22 | 2022-11-11 | 北京计算机技术及应用研究所 | Test system suitable for environmental test |
CN115327275B (en) * | 2022-08-22 | 2024-06-07 | 北京计算机技术及应用研究所 | Test system suitable for environmental test |
CN119135301A (en) * | 2024-11-14 | 2024-12-13 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | Relay function detection system, relay function detection method and receiving test equipment |
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