CN116297336B - Method for detecting defect points on surface of metal sheet for outer layer protection - Google Patents
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Abstract
The invention provides a method for detecting defect points on the surface of a metal sheet for outer layer protection, which comprises the following steps: constructing a standard metal sheet theory surface light interference lattice model; constructing a detection light source platform and limiting the detection area of the light source detection platform; array converging light beams generated by a plurality of light sources on a light source detection platform, and converging at least two converged light beams to the same detection point on a metal sheet to be detected through a lens; performing interference analysis on all detection points on the metal sheet to be detected, and constructing a finite element model through analysis data; and (3) the data in the finite element model are brought into the standard metal sheet theoretical surface optical interference lattice model to be compared with the standard data, error data are obtained, the qualified metal sheet is judged when the error data are within a set threshold value, and the defective metal sheet is judged when the error data exceed the set threshold value.
Description
Technical Field
The invention belongs to the field of metal surface detection, and particularly relates to a method for detecting defect points on the surface of a metal sheet for outer layer protection.
Background
Space suit is a garment used in the space environment, usually made of textile material. The working environment of space suit generally comprises: 1. vacuum: the space suit is internally filled with vacuum, and air only flows on the surface of the space suit. Second, low temperature: space suit works in low temperature environment, for example below zero degrees celsius or below twenty degrees celsius. Third, microgravity: space suit can work against microgravity (1 gram per square meter). Fourth, high temperature: space suit can withstand high temperature environments, for example, operating at one hundred degrees celsius. Fifth, high humidity: high humidity in the space environment can cause injury to the human body, for example, leading to dry skin and reduced immunity. In general, the working environment of space suit is very demanding and dangerous, requiring special techniques and equipment to protect the safety of the staff.
The key of the space human body protection is the outer protective material of the extravehicular space suit. As the selection of the outer protective material of the outer space suit, the design experience of the protective material of the outer space suit at present, the research and analysis of related technical data and the subject group show that the material is not a single index and has simple composition as a structural material, and the material has high and low temperature resistance and mechanical stability; excellent thermo-optical properties and stability; high performance impact, stab and radiation resistant fabrics and good flexibility characteristics. The latest mainstream basic framework materials at present are multilayer structure materials of high-performance fibers and special coatings, which can play roles in thermal protection, microflow star protection, mechanical and optical stability and radiation resistance of the outer layers. The introduction of light, ultra-thin functional film materials such as polyimide films and phase change material films as an insulating protective layer is also a new concept. But has problems in research design of reasonable configuration of the connection and functions of each layer of the material. The mechanical stability, functional effectiveness and action mechanism of the material under extreme conditions still need to be characterized and researched so as to make the material lighter, softer and safer. The space environment is complex and harsh, people are accustomed to characterization and results in the normal state, and therefore more experiments simulating the space environment should be performed. Such as ultra-high and low temperature performance tests; light, heat and vacuum composite environment tests and tests of mechanical, thermal and optical stability of materials under the conditions; the micro-meteor impact and lancing test is prevented, so that the design and the shaping of the outer protective material which is safe for astronauts, suitable for wearing and light in weight are solved in theory and application. The civil market in this respect has also just started, and as an advance in the aviation industry, it is the achievement of this that must be done, in particular the actual achievement of the functionality, safety, stability and products of the outer protective material.
Defects such as air holes, stripes and the like may be generated on the surface of the metal material in the preparation process, and the defects generally do not substantially affect the performance of the metal material, but may affect the reliability of the metal structure. For example, air voids may result in reduced material strength, and streaks may affect the load carrying capacity and durability of the metal structure. In addition, some impurity filling defects exist in the space environment, and the defects can damage the metal surface, so that the material is degraded, the material performance is reduced and the like. In general, the impact of metal surface defects in space is very complex, requiring comprehensive assessment to ensure the safety and success of space missions. Therefore, a method for detecting the surface defect point of the metal sheet for protecting the outer layer is needed.
Disclosure of Invention
The invention provides a method for detecting the surface defect points of a metal sheet for outer layer protection, which solves the problems that the detection of the metal sheet arranged on the outermost layer of space suit in the prior art adopts a traditional detection mode at present, the detection precision is insufficient, and a part which is very fine is difficult to detect.
The technical scheme of the invention is realized as follows: a method for detecting surface defect points of a metal sheet for outer layer protection, the method comprising the steps of:
constructing a standard metal sheet theory surface light interference lattice model;
constructing a detection light source platform and limiting the detection area of the light source detection platform;
array converging light beams generated by a plurality of light sources on a light source detection platform, and converging at least two converged light beams to the same detection point on a metal sheet to be detected through a lens;
performing interference analysis on all detection points on the metal sheet to be detected, and constructing a finite element model through analysis data;
and (3) the data in the finite element model are brought into the standard metal sheet theoretical surface optical interference lattice model to be compared with the standard data, error data are obtained, the qualified metal sheet is judged when the error data are within a set threshold value, and the defective metal sheet is judged when the error data exceed the set threshold value.
The detection principle adopted in the application document is to adopt optical interference detection, and the detection principle is a method for detecting defects by utilizing the interference effect of light. The basic principle is to detect two mutually superimposed light fringes (frequency difference) to determine the location and type of defect. In optical interference detection, a laser is generally applied to an object to generate an optical interference effect. The opaque object may generate interference fringes during imaging, thereby forming an optical interference effect. The optical interference effect may be used to generate an optical wave field to detect the structure and composition of the object. In optical interferometry, light may be reflected into the detection device by an optical instrument, and then the field of light waves generated in the device is analyzed to identify the location and type of the defect.
As a preferred implementation mode, after the detection light source platform is constructed, the detection surface area of the metal sheet to be detected is measured and calculated, when the detection surface area is lower than the light source, array projection is carried out on the detection surface of the metal sheet to be detected by taking the center point of the detection surface area of the light source detection platform as the axis, and the detection surface is completely covered by a plurality of wheel array projections. When in actual use, the area of the metal sheet is possibly exceeding the detection coverage area, and in order to avoid the condition that the surface is not detected, coincidence detection is needed, the whole metal sheet is split according to the detection area, so that all positions can be covered by the detection light source, and detection dead angles are avoided.
When constructing a standard metal sheet theoretical surface light interference lattice model, firstly constructing a standard detection point position, carrying out annular array or rectangular array by using the center point of the standard metal sheet, constructing detection point positions by using the annular array, and arranging detection points of two adjacent annular lines at intervals; and constructing detection point positions by adopting a rectangular array, wherein adjacent detection point connecting lines on the vertexes of the rectangle form an L shape, and the intervals of the adjacent detection points on the vertexes are smaller than those of detection points on the edges of the rectangle. The detection area is also constructed through the change of the arrangement mode of the detection points, when annular detection is adopted, the detection points at different positions in a unit area are increased through the interval arrangement of the detection points of two adjacent annular lines, the condition that linear stripe defects are not detected is avoided, and the detection points of a rectangular array are adopted, and through the interval arrangement on the vertexes, the detection boundary can be clearly detected, and the detection area is determined.
As a preferred implementation mode, the detection points are constructed by adopting annular arrays, and the connection lines of two detection points of the outer ring and the adjacent detection points of the inner ring in two adjacent annular lines form isosceles triangles. By adopting the array mode, detection points constructed by the annular array can be detected to the greatest extent, and stripes can be effectively detected, and the influence range is wider because stripe defects appear on metal, and the flatness in the range can have certain fluctuation.
As a preferred embodiment, the distance between the lens and the light source detection platform is measured by limiting the detection area of the light source detection platform, and the detection area is adjusted by adjusting the distance between the lens and the light source detection platform when the detection area is adjusted.
As a preferred embodiment, the light source in the light detection platform adopts a laser light source, and two light sources adopted by the two light beams are respectively an XYZ-axis focusing laser light source and a YUV-axis focusing laser light source when the two light sources are collected, and the collected detection light beams are adjusted by adjusting the two light sources.
As a preferred embodiment, when the interference analysis is performed on the detection point, the distance between two light pulses in the converged light beam is determined, the phase difference between the two light pulses is obtained, the phase difference value is determined, an interference pattern is recorded when the phase difference value between the two light pulses is in the interference interval gap, the light change intensity data of the detection point is obtained according to the interference pattern, and the interference analysis data is constructed according to the light change intensity data.
As a preferred embodiment, when the finite element model is built, the light wave field generated in the light propagation process is simulated by light propagation simulation software, so that the intensity change of reflected light at the defect is analyzed, and finite element grids are built in the finite element model by using grid division software, so that the light and the defect point are simulated.
As a preferred embodiment, in the light simulation, the light field wavelength and the light field intensity obtained by the central wavelength of the cross section of the light beam and the outer diameter of the cross section are simulated, the intensity change of the reflected light of the defect is simulated in a finite element model, and the change of the reflected light intensity at the defect is determined by analyzing an interference pattern.
After the technical scheme is adopted, the invention has the beneficial effects that:
the optical interference detection is adopted by relying on the interference effect of light, so that high precision can be obtained. Small defects can be detected because they can appear in a small range, the detection of the metal sheet surface by the interference fringes of light can cause interference fringe fluctuations that can be detected, and thus the detection accuracy is high.
By non-contact detection, detection fluctuation errors can be effectively avoided, and the detection fluctuation errors are based on the interference effect of light. The defect measurement with high precision can be obtained in the rapid detection process, and the detection flow is controlled and regulated by software, so that automatic defect detection is realized, the detection efficiency can be improved, and the labor cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the invention, and that other drawings can be obtained according to these drawings without inventive faculty for a person skilled in the art.
FIG. 1 is a flow chart of the method of the present invention.
Description of the embodiments
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Examples
As shown in fig. 1, a method for detecting defect points on the surface of a metal sheet for protecting an outer layer comprises the following steps:
constructing a standard metal sheet theory surface light interference lattice model; constructing a detection light source platform and limiting the detection area of the light source detection platform; array converging light beams generated by a plurality of light sources on a light source detection platform, and converging at least two converged light beams to the same detection point on a metal sheet to be detected through a lens; performing interference analysis on all detection points on the metal sheet to be detected, and constructing a finite element model through analysis data; and (3) the data in the finite element model are brought into the standard metal sheet theoretical surface optical interference lattice model to be compared with the standard data, error data are obtained, the qualified metal sheet is judged when the error data are within a set threshold value, and the defective metal sheet is judged when the error data exceed the set threshold value.
In space suit, outer metal detection is very important. The outer metal surface in space suit inevitably has defects due to severe temperature differences and microgravity effects in the space environment. Without an effective detection method, risks such as defect leakage and explosion may occur when space suit is used for a long time. In order to ensure safe and effective operation of the space suit, high-precision detection of the outer metal is required. The traditional detection methods such as X-ray detection, ion spectrum analysis and the like have the defects of low detection sensitivity, inaccurate detection results and the like. The present application uses optical interferometry techniques. Since the optical interference detection relies on the interference effect of light, defects in the outer metal can be detected with high sensitivity. By using the optical interference detection technology in the space suit, the safety and the effective operation of the space suit can be effectively ensured. In a word, in space suit, outer metal detection has important meaning, and high-efficiency and high-precision optical interference detection technology is required to ensure safe and effective operation of space suit.
When the method is used, firstly, a standard metal sheet theoretical surface light interference lattice model is built, the model is formed by formulating surface light interference lattice models with different standards according to the characteristics of different metal sheets, after the preparation is completed, detected actual data can be compared with standard data, and if the error value is larger than a set threshold value, the metal sheet is detected to be inconsistent with the standard requirement. After a standard metal sheet theory surface light interference lattice model is manufactured, a detection light source platform is constructed, the platform is a light source generation and detection platform, a light source is generated through a laser generator on the detection light source platform, the laser generator is arranged through a setting angle, so that the light sources generated by at least two laser generators are converged together to form light beams, a plurality of light beams are converged on a lens through adjustment of the angle of the light beams, a plurality of detection light beams are converged through the lens to form a detection light beam, at the same time, a plurality of different light beams pass through respective lenses to form a plurality of detection light beams, annular array detection or rectangular array detection is formed according to preset array points, and the light interference detection of detection points is compared with the standard model to obtain whether the currently detected metal sheet is qualified or not.
After the detection light source platform is constructed, measuring and calculating the detection surface area of the metal sheet to be detected, and when the detection surface area is lower than the light source, performing array projection on the detection surface of the metal sheet to be detected by taking the center point of the detection area of the light source detection platform as the axis, and completely covering the detection surface through a plurality of wheel array projections. When in actual use, the area of the metal sheet is possibly exceeding the detection coverage area, and in order to avoid the condition that the surface is not detected, coincidence detection is needed, the whole metal sheet is split according to the detection area, so that all positions can be covered by the detection light source, and detection dead angles are avoided.
When a standard metal sheet theoretical surface light interference lattice model is constructed, firstly, constructing a standard detection point position, carrying out annular array or rectangular array by using the center point of the standard metal sheet, constructing detection point positions by adopting the annular array, and arranging detection points of two adjacent annular lines at intervals; and constructing detection point positions by adopting a rectangular array, wherein adjacent detection point connecting lines on the vertexes of the rectangle form an L shape, and the intervals of the adjacent detection points on the vertexes are smaller than those of detection points on the edges of the rectangle. The detection area is also constructed through the change of the arrangement mode of the detection points, when annular detection is adopted, the detection points at different positions in a unit area are increased through the interval arrangement of the detection points of two adjacent annular lines, the condition that linear stripe defects are not detected is avoided, and the detection points of a rectangular array are adopted, and through the interval arrangement on the vertexes, the detection boundary can be clearly detected, and the detection area is determined.
The detection points constructed by the annular array are adopted, and the connection lines of two detection points of the outer ring and the adjacent detection points of the inner ring in the two adjacent annular lines form an isosceles triangle. By adopting the array mode, detection points constructed by the annular array can be detected to the greatest extent, and stripes can be effectively detected, and the influence range is wider because stripe defects appear on metal, and the flatness in the range can have certain fluctuation.
The distance between the lens and the light source detection platform is measured by limiting the detection area of the light source detection platform, and when the detection area is adjusted, the detection area is adjusted by adjusting the distance between the lens and the light source detection platform.
The light source in the light detection platform adopts a laser light source, two light sources adopted by the two light beams during collection are an XYZ-axis focusing laser light source and a YUV-axis focusing laser light source respectively, and the collected detection light beams are adjusted by adjusting the two light sources. The XYZ-axis focusing laser light source is used for adjusting the axis position of the laser light source so as to be suitable for different detection requirements, for example, the laser light source can be adjusted to different axis positions in the horizontal direction and the vertical direction so as to meet the different detection requirements. The YUV axis focusing laser light source is used for detecting the distance between the two beams of light so as to accurately position the defect, and the YUV axis focusing laser light source can adjust the intensity of the light beams in two wave bands so as to adapt to different detection requirements.
When interference analysis is carried out on the detection points, the distance between two light pulses in the converged light beams is determined, the phase difference between the two light pulses is obtained, the phase difference value is determined, an interference pattern is recorded when the phase difference value between the two light pulses is in an interference interval gap, light change intensity data of the detection points are obtained according to the interference pattern, and interference analysis data are constructed through the light change intensity data.
When the finite element model is built, the light wave field generated in the light propagation process is simulated through light propagation simulation software, so that the intensity change of reflected light at the defect is analyzed, and finite element grids are built in the finite element model by using grid division software, so that the light and the defect point are simulated.
When the light simulation is carried out, the light wave field wavelength and the light wave field intensity obtained through the central wavelength of the cross section of the light beam and the outer diameter of the cross section are used for simulating the intensity change of the reflected light of the defect in the finite element model, and the change of the reflected light intensity at the defect is determined by analyzing the interference pattern
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, alternatives, and improvements that fall within the spirit and scope of the invention.
Claims (8)
1. A method for detecting defect points on the surface of a metal sheet for outer layer protection, which is characterized by comprising the following steps:
constructing a standard metal sheet theory surface light interference lattice model;
constructing a detection light source platform and limiting the detection area of the light source detection platform;
array converging light beams generated by a plurality of light sources on a light source detection platform, and converging at least two converged light beams to the same detection point on a metal sheet to be detected through a lens;
performing interference analysis on all detection points on the metal sheet to be detected, and constructing a finite element model through analysis data;
the data in the finite element model is brought into a standard metal sheet theoretical surface optical interference lattice model to be compared with the standard data, error data are obtained, the qualified metal sheet is judged when the error data are within a set threshold value, and the defective metal sheet is judged when the error data exceed the set threshold value;
when a standard metal sheet theory surface light interference lattice model is built, the metal sheet theory surface light interference lattice model is prepared according to the characteristics of the metal sheet, and the standard surface light interference lattice model is corresponding to the standard surface light interference lattice model;
when the finite element model is built, the light wave field generated in the light propagation process is simulated through light propagation simulation software, so that the intensity change of reflected light at the defect is analyzed, and finite element grids are built in the finite element model by using grid division software, so that the light and the defect point are simulated.
2. A method for detecting surface defects of a sheet metal for outer layer protection as claimed in claim 1, wherein: after the detection light source platform is constructed, measuring and calculating the detection surface area of the metal sheet to be detected, and when the detection surface area is lower than the light source, performing array projection on the detection surface of the metal sheet to be detected by taking the center point of the detection area of the light source detection platform as the axis, and completely covering the detection surface through a plurality of wheel array projections.
3. A method for detecting surface defects of a sheet metal for outer layer protection as claimed in claim 1, wherein: when a standard metal sheet theoretical surface light interference lattice model is constructed, firstly, constructing a standard detection point position, carrying out annular array or rectangular array by using the center point of the standard metal sheet, constructing detection point positions by adopting the annular array, and arranging detection points of two adjacent annular lines at intervals; and constructing detection point positions by adopting a rectangular array, wherein adjacent detection point connecting lines on the vertexes of the rectangle form an L shape, and the intervals of the adjacent detection points on the vertexes are smaller than those of detection points on the edges of the rectangle.
4. A method for detecting surface defects of a sheet metal for outer layer protection as claimed in claim 3, wherein: the detection points constructed by the annular array are adopted, and the connection lines of two detection points of the outer ring and the adjacent detection points of the inner ring in the two adjacent annular lines form an isosceles triangle.
5. A method for detecting surface defects of a sheet metal for outer layer protection as claimed in claim 1, wherein: the distance between the lens and the light source detection platform is measured by limiting the detection area of the light source detection platform, and when the detection area is adjusted, the detection area is adjusted by adjusting the distance between the lens and the light source detection platform.
6. A method for detecting surface defects of a sheet metal for outer layer protection as claimed in claim 1, wherein: the light source in the light source detection platform adopts a laser light source, two light sources adopted by the two light beams during collection are an XYZ-axis focusing laser light source and a YUV-axis focusing laser light source respectively, and the collected detection light beams are adjusted by adjusting the two light sources.
7. A method for detecting surface defects of a sheet metal for outer layer protection as claimed in claim 1, wherein: when interference analysis is carried out on the detection points, the distance between two light pulses in the converged light beams is determined, the phase difference between the two light pulses is obtained, the phase difference value is determined, an interference pattern is recorded when the phase difference value between the two light pulses is in an interference interval gap, light change intensity data of the detection points are obtained according to the interference pattern, and interference analysis data are constructed through the light change intensity data.
8. A method for detecting surface defects of a sheet metal for outer layer protection as claimed in claim 1, wherein: when the light simulation is carried out, the light wave field wavelength and the light wave field intensity are obtained through the central wavelength of the cross section of the light beam and the outer diameter of the cross section, the intensity change of the reflected light of the defect is simulated in the finite element model, and the change of the intensity of the reflected light at the defect is determined through analysis of the interference pattern.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106442564A (en) * | 2016-10-17 | 2017-02-22 | 中国科学院上海光学精密机械研究所 | Large-aperture ultra-smooth surface defect detection device and method |
| CN108648168A (en) * | 2018-03-15 | 2018-10-12 | 北京京仪仪器仪表研究总院有限公司 | IC wafer surface defects detection methods |
| CN107726990B (en) * | 2017-09-18 | 2019-06-21 | 西安电子科技大学 | The acquisition of dot matrix grid image and recognition methods in a kind of Sheet metal forming strain measurement |
| CN111929310A (en) * | 2020-09-25 | 2020-11-13 | 歌尔股份有限公司 | Surface defect detection method, device, equipment and storage medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106442564A (en) * | 2016-10-17 | 2017-02-22 | 中国科学院上海光学精密机械研究所 | Large-aperture ultra-smooth surface defect detection device and method |
| CN107726990B (en) * | 2017-09-18 | 2019-06-21 | 西安电子科技大学 | The acquisition of dot matrix grid image and recognition methods in a kind of Sheet metal forming strain measurement |
| CN108648168A (en) * | 2018-03-15 | 2018-10-12 | 北京京仪仪器仪表研究总院有限公司 | IC wafer surface defects detection methods |
| CN111929310A (en) * | 2020-09-25 | 2020-11-13 | 歌尔股份有限公司 | Surface defect detection method, device, equipment and storage medium |
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