CN116184516A - Inspection system and method of installing the same - Google Patents

Abstract

The application relates to an inspection system and a method of installing the same. The inspection system includes: a first imaging system, comprising: a first pod attached to the platform structure and a platform assembly being an integral n-type platform having a platform structure and first and second vertical arm structures located on either side of the platform structure, the first detector assembly being disposed in the platform assembly; and a second imaging system comprising: the upper arm frame is an integral n-type arm frame, a third vertical arm structure of the upper arm frame is attached to the second cabin, a fourth vertical arm structure of the upper arm frame is attached to the upper end of the vertical arm frame, and at least one of the side portion of the second cabin, the vertical arm frame and the upper arm frame comprises a second detector assembly, wherein the first vertical arm structure of the platform assembly is attached to the second cabin.

Description

Inspection system and method of installing the same

Technical Field

The present application relates to the field of security inspection, and more particularly to inspection systems and methods of installing the same.

Background

A quick inspection apparatus (also simply referred to as a quick inspection apparatus) is an apparatus designed for quick security inspection of goods, vehicles, and the like. The rapid inspection device can be used for rapid inspection under the condition that bulk goods such as ports, customs and the like are transported without stopping, and can provide high-resolution scanning images based on substance composition information, so that inspection staff can effectively and rapidly inspect smuggled articles and various forbidden articles hidden in goods, vehicles and the like under the condition of not stopping and opening boxes.

Disclosure of Invention

According to an aspect of the present application, there is provided an inspection system comprising: a first imaging system, the first imaging system comprising: a first enclosure including a first radiation scanning assembly; and a platform assembly, the platform assembly being an integral n-type platform having a platform structure and first and second vertical arm structures located on either side of the platform structure, the first pod being attached to the platform structure, the first detector assembly being disposed in the platform assembly; and a second imaging system, the second imaging system comprising: a second enclosure including a second radiation scanning assembly; the upper arm support is an integrated n-type arm support, the integrated n-type arm support is provided with a cross arm structure, a third vertical arm structure and a fourth vertical arm structure which are positioned at two sides of the cross arm structure, and the third vertical arm structure is attached to the second cabin; and a vertical boom, wherein an upper end of the vertical boom is attached to a fourth vertical boom structure, and wherein a second detector assembly is disposed in at least one of: a side portion of the second pod, an upper boom, and a vertical boom, wherein a lower end of the first vertical boom structure is attached to the second pod.

In some implementations, the first imaging system further includes a first column assembly having an upper end attached to the first vertical arm structure and a second column assembly having an upper end attached to the second vertical arm structure, the lower end of the first column assembly being attached to the second nacelle.

In some implementations, a lower end of the first column assembly is attached to the second nacelle at a function expansion interface.

In some implementations, the first vertical arm structure of the platform assembly is attached to the second pod at a function expansion interface.

In some implementations, the first mast assembly includes an electrical assembly to enable electrical communication with each other with the second pod through the function expansion interface.

In some implementations, the first vertical arm structure of the platform assembly includes an electrical assembly to enable electrical communication with each other with the second pod through the function expansion interface.

In some implementations, the lower end of the vertical boom and the lower end of the second column assembly are each maintained a distance from the ground by a bottom locator.

In some implementations, the bottom locator is telescoping for adjusting the levelness of the vertical boom and the second column assembly.

In some implementations, the bottom locator includes at least two supports, each independently telescoping.

In some implementations, at least one of the second pod and the vertical boom is provided with a level measurement device for adjusting the levelness of the at least one of the second pod and the vertical boom.

In some implementations, the third vertical arm structure is attached to the second pod by one of: flange, slide structure or rotating structure.

In some implementations, the fourth riser structure is attached to the upper end of the riser frame by a flange or fold.

In some implementations, each of the first nacelle, the platform assembly, and the first and second column assemblies includes an electrical assembly for enabling electrical communication with each other.

In some implementations, each of the second pod, the upper boom, and the upstand boom include electrical components for enabling electrical communication with each other.

In some implementations, the scanning system further includes a third imaging system including a third pod including a third ray scanning assembly and a third detector assembly, the third pod being attached to the second pod or the riser.

According to an aspect of the present application, there is provided a method of installing an inspection system, characterized by comprising: providing a first nacelle and a platform assembly, the first nacelle comprising a first radiation scanning assembly, the platform assembly being an integral n-type platform having a platform structure and first and second vertical arm structures located on either side of the platform structure, the first nacelle being attached to the platform structure, the first detector assembly being disposed in the platform assembly; providing a second enclosure comprising a second radiation scanning assembly; providing an upper arm support and a vertical arm support, wherein the upper arm support is an integrated n-type arm support, the integrated n-type arm support is provided with a cross arm structure, a third vertical arm structure and a fourth vertical arm structure which are positioned at two sides of the cross arm structure, and a second detector assembly is arranged in at least one of the following assemblies: the side part of the second cabin body, the upper arm support and the vertical arm support; attaching a third vertical arm structure to the second pod; attaching a fourth vertical arm structure to the upper end of the vertical arm support; and attaching a lower end of the first vertical arm structure to the second nacelle.

In some implementations, the method of installing the inspection system further includes: providing a first column assembly and a second column assembly, attaching an upper end of the first column assembly to the first vertical arm structure, attaching an upper end of the second column assembly to the second vertical arm structure, and attaching a lower end of the first column assembly to the second compartment.

In some implementations, the method of installing the inspection system further includes: the lower end of the first column assembly is attached to the second nacelle at a function expansion interface.

In some implementations, the method of installing the inspection system further includes: the first vertical arm structure of the platform assembly is attached to the second pod at the function expansion interface.

In some implementations, the first mast assembly includes an electrical assembly to enable electrical communication with each other with the second pod through the function expansion interface.

In some implementations, the first vertical arm structure of the platform assembly includes an electrical assembly to enable electrical communication with each other with the second pod through the function expansion interface.

In some implementations, the method of installing the inspection system further includes: the lower end of the vertical arm support and the lower end of the second upright post component are respectively kept at a certain distance from the ground through the bottom positioning seat.

In some implementations, the bottom nest is telescoping, and the method of installing the inspection system further comprises: and adjusting the bottom positioning seat to adjust levelness of the vertical arm support and the second upright post assembly.

In some implementations, the bottom locator includes at least two supports, each independently telescoping.

In some implementations, at least one of the second pod and the vertical boom is provided with a level measurement device, the method of installing the inspection system further comprising: and adjusting the levelness of at least one of the second cabin and the vertical arm support by using a level measuring device.

In some implementations, the method of installing the inspection system further includes: attaching the third vertical arm structure to the second pod by one of: flange, slide structure or rotating structure.

In some implementations, the method of installing the inspection system further includes: the fourth vertical arm structure is attached to the upper end of the vertical arm support by a flange or a fold.

In some implementations, each of the first nacelle, the platform assembly, and the first and second column assemblies includes an electrical assembly for enabling electrical communication with each other.

In some implementations, each of the second pod, the upper boom, and the upstand boom include electrical components for enabling electrical communication with each other.

In some implementations, the method of installing the inspection system further includes: a third pod is provided, the third pod including a third ray scanning assembly and a third detector assembly, and the third pod is attached to the first pod or the vertical boom.

According to the inspection system and the installation method thereof provided by the embodiment of the application, a dual-source dual-view imaging technology is adopted, wherein the first imaging system is used for scanning imaging from the vertical direction, and the second imaging system is used for scanning imaging from the horizontal direction, so that the material identification capability is improved, and the possibility of missed inspection is reduced. In addition, each imaging system adopts a smaller number of parts, which is beneficial to transition, installation and debugging, and can realize coplanarity without readjusting the beam surface of the detector and the beam surface of the ray scanning assembly during installation and debugging, thereby facilitating quick deployment on site.

Drawings

The features and advantages of the present invention will be more clearly understood by reference to the accompanying drawings, which are illustrative and should not be construed as limiting the invention in any way, in which:

FIG. 1 illustrates a front view of an inspection system according to an embodiment of the present application;

FIG. 2 illustrates a top view of the inspection system shown in FIG. 1 along direction A;

FIG. 3 illustrates a side view of the inspection system shown in FIG. 1 in the direction B;

FIG. 4 shows a schematic diagram of a first imaging system according to an embodiment of the present application;

FIG. 5 illustrates a schematic diagram of a platform assembly of a first imaging system according to an embodiment of the present application;

FIG. 6 shows a schematic diagram of a second imaging system according to an embodiment of the present application;

FIG. 7 illustrates a schematic view of a second pod of a second imaging system according to an embodiment of the present application; and

fig. 8 shows a flowchart of an installation method of an inspection system according to an embodiment of the present application.

Detailed Description

The traditional rapid inspection equipment has more separation parts, the transverse detector arm, the transverse beam upright support structure, the cabin body, the ray generator and the like are all installed in a split mode, the parts are provided with abundant adjustment amounts, and the whole structure is complex. The equipment is transferred to the customer site from the initial installation of the production plant to site setting, and is required to be re-set for each transition, so that the construction is complicated.

In addition, because the requirement of quick inspection is met, the traditional quick inspection equipment generally adopts a single-source single-view imaging technology, and the imaging technology has certain material identification capability, but the stacking position judgment information of different objects to be inspected is insufficient, so that objects stacked behind the objects are not easy to inspect, and the possibility of missed inspection exists.

In view of the above, the present application provides an inspection system and an installation method thereof that are relatively simple in structure, easy to transition and install and debug, and convenient for rapid deployment in the field. In addition, the inspection system and the installation method thereof according to the embodiment of the application also apply a dual-source dual-view imaging technology, and can acquire signal information for image generation in two horizontal and vertical scanning directions at the same time, so that the working efficiency is improved and the omission ratio is reduced.

An inspection system and an installation method thereof provided according to an embodiment of the present application are described below with reference to fig. 1 to 8.

An inspection system according to an embodiment of the present application will first be described with reference to fig. 1-7, wherein fig. 1 shows a front view of an inspection system according to an embodiment of the present application; FIG. 2 is a top view showing the inspection system shown in FIG. 1 in the direction A; FIG. 3 illustrates a side view of the inspection system shown in FIG. 1 in the direction B; FIG. 4 shows a schematic diagram of a first imaging system according to an embodiment of the present application; FIG. 5 illustrates a schematic diagram of a platform assembly of a first imaging system according to an embodiment of the present application; FIG. 6 shows a schematic diagram of a second imaging system according to an embodiment of the present application; and fig. 7 shows a schematic view of a second cabin of a second imaging system according to an embodiment of the present application.

Referring first to fig. 1-3, an inspection system according to an embodiment of the present application includes: a first imaging system and a second imaging system.

The first imaging system includes: a first cabin 1, the first cabin 1 comprising a first radiation scanning assembly 2; a platform assembly 3, the platform assembly 3 being a unitary n-type platform having a platform structure 31 and first and second vertical arm structures 32, 33 located on either side of the platform structure, the first hull 1 being attached to the platform structure 31; and a first column assembly 41 and a second column assembly 42 (in the drawings, the first column assembly 41 and the second column assembly 42 are also sometimes collectively shown with reference numeral 4), an upper end of the first column assembly 41 being attached to the first vertical arm structure 32 of the platform assembly 3, and an upper end of the second column assembly 42 being attached to the second vertical arm structure 33, wherein the first detector assembly is provided in at least one of the following: the platform assembly 3 (e.g., the bottom of the platform structure 31, the first vertical arm structure 32, and the second vertical arm structure 33), the first column assembly 41, and the second column assembly 42. In this context, "attached" includes the case where one component is connected to another component directly or via another component.

The second imaging system includes: a second cabin 5, the second cabin 5 comprising a second radiation scanning assembly 6; an upper boom 7, the upper boom 7 being an integral n-type boom having a cross arm structure 71 and third and fourth vertical arm structures 72, 73 located on both sides of the cross arm structure, wherein the third vertical arm structure 72 is attached to the second nacelle 5; and a vertical boom 8, wherein an upper end 81 of the vertical boom 8 is attached to the fourth vertical boom structure 73, and wherein the second detector assembly is disposed in at least one of: the side part of the second cabin 5, the upper arm support 7 and the vertical arm support 8. Here, as understood by those skilled in the art, the side of the second tank 5 where the second detector assembly is provided means the side of the second tank 3 facing the object to be inspected. Hereinafter, "sides" provided with the detector assembly have the same or similar meaning and are not described in detail.

As shown in fig. 3, the lower end of the first upright assembly 41 is attached to the second nacelle 5, i.e. the first upright arm structure 32 of the platform assembly 3 is attached to the second nacelle 5 via the first upright assembly 41.

In some embodiments, the first upright assembly 41 may also be omitted, such that the first upright arm structure 32 of the platform assembly 3 is directly attached to the second hull 5. In some embodiments, the second upright assembly 42 may also be omitted, such that the second upright structure 33 of the platform assembly 3 is also attached to the upper end 81 of the upright support 8.

In some embodiments, the lower end of the first mast assembly 41 is attached to the second nacelle 5 at a function expansion interface. In some embodiments, the first vertical arm structure 32 of the platform assembly 3 is attached to the second pod 5 at a function expansion interface.

In some embodiments, the first mast assembly 41 includes electrical components to enable electrical communication with each other of the second pod 5 through a function expansion interface. In some embodiments, the first vertical arm structure 32 of the platform assembly 3 includes electrical components to enable electrical communication with each other with the second pod 5 through a function expansion interface.

According to the inspection system provided by the embodiment of the application, a dual-source dual-view imaging technology is adopted, wherein the first imaging system is used for scanning imaging from the vertical direction, and the second imaging system is used for scanning imaging from the horizontal direction, so that the material identification capability is improved, and the possibility of missed inspection is reduced. In addition, each imaging system adopts a smaller number of parts, which is beneficial to transition, installation and debugging, and can realize coplanarity without readjusting the beam surface of the detector and the beam surface of the ray scanning assembly during installation and debugging, thereby facilitating quick deployment on site.

It should be appreciated that while embodiments were described above with reference to fig. 1-3 in which the first imaging system and the second imaging system are used in combination, the first imaging system and the second imaging system may be used alone. The case where the first imaging system and the second imaging system can be used alone will be described below with reference to fig. 4 to 7. It is also to be understood that the features described in the context of the use of the combination or the features described in the context of the use of the combination alone may be used in different situations of use and in different embodiments as desired, all of which are within the scope of the present application.

The first imaging system is described below. FIG. 4 shows a schematic diagram of a first imaging system according to an embodiment of the present application; and FIG. 5 illustrates a schematic diagram of a platform assembly of a first imaging system according to an embodiment of the present application. As shown in fig. 4 and 5, in the first imaging system, the first nacelle 1 includes a first radiation scanning assembly 2. The radiation scanning assembly 2 comprises a radiation source (not shown), such as an electron linear accelerator, an electron induction accelerator, an X-ray tube (X-ray machine) or an isotope source, for emitting radiation, such as X-rays, for irradiating the object under examination. In some embodiments, the first radiation scanning assembly includes a flying spot device for generating a flying spot for backscatter inspection of the inspected object. In such a case, the first detector assembly (in particular the backscatter detector) may be provided only at the bottom of the platform structure 31. In some implementations, the radiation beam emitted by the radiation scanning assembly 2 has a fan-like form in order to achieve an overall scan of the object under examination. The beam is maintained within a fan beam angle that is adjustable and set according to the size of the platform assembly and the mast assembly. The first compartment 1 has a mounting assembly for mounting the radiation scanning assembly 2 therein, so that the radiation scanning assembly 2 is replaceable. It should be appreciated that the configuration and type of the radiation scanning assembly 2 is not limited.

The platform assembly 3 is an integral n-type platform, as shown in fig. 5, which has a platform structure 31 and a first vertical arm structure 32 and a second vertical arm structure 33 located at both sides of the platform structure, the first nacelle 1 is attached to the platform structure 31, and the bottom of the platform structure 31 is provided with a first detector assembly. The inspection system of the embodiment of the application has the advantages that each part of the inspection system weighs several tons, so that the platform assembly adopts an n-type structure, the platform assembly is kept in an installation and debugging posture during transportation after disassembly, and deformation easily caused during reverse transportation of the platform assembly is avoided. It should be appreciated that although the platform structure 31 and the first and second vertical arm structures 32, 33 of the platform assembly are shown as being rectilinear such that the platform assembly 3 is a right angle n-arm support, in some embodiments the platform structure 31 and the first and second vertical arm structures 32, 33 of the platform assembly may be curved such that the platform assembly 3 is an arc angle n-arm support. It should also be appreciated that although the first and second vertical arm structures 32, 33 of the platform assembly are shown as having substantially the same length, in some embodiments the second vertical arm structure 33 may be provided with a shorter length as long as it can be attached to the second upright 42 or to the upper end 81 of the vertical arm support 8, and in such a case the length of the second upright 42 or the vertical arm support 8 needs to be adjusted accordingly so that the heights of the two sides of the channel are substantially equivalent.

In the case of a column assembly, the upper end of the first column assembly 41 is attached to the first vertical arm structure 32 of the platform assembly 3 and the upper end of the second column assembly 42 is attached to the second vertical arm structure 33. When the first imaging system is used alone, the first and second column assemblies 41 and 42 may have the same height, thereby enabling the first imaging system to be stably placed on the ground. When the first imaging system is used in combination with the second imaging system, the first column assembly 41 is attached to the second nacelle 5, where the length of the first column assembly 41 is shorter than the length of the second column assembly 42. It will be appreciated that in either case, the height of the column assembly may be adjusted according to design requirements to suit different inspection height requirements.

The first detector assembly is disposed in the platform assembly. In some embodiments, the first detector assembly is disposed at the bottom of the platform structure 31, the side of the first vertical arm structure 32, and/or the side of the second vertical arm structure 33. In the case of using the column assembly, the first detector assembly is provided in at least one of the following: a platform assembly 3, a first column assembly 41 and a second column assembly 42. In an embodiment in which the first detector assembly is arranged at the bottom of the platform structure 31, this detector assembly is arranged at the bottom of the platform structure 31 to be adapted and capable of detecting the radiation beam exiting the radiation scanning device 2 of the first nacelle 1 and scattered through the object under examination, so that information of the respective parts of the object under examination is obtained as much as possible. Thereby, a backscatter detection scan in the vertical direction can be achieved.

In an embodiment in which the first vertical arm structure 32 and/or the second vertical arm structure 33 are arranged with a first detector assembly, this detector assembly is arranged at a side of the first vertical arm structure 32 and/or at a side of the second vertical arm structure 33 to be adapted and capable of detecting a radiation beam exiting the radiation scanning device 2 of the first capsule 1 and transmitted through the object under examination, so as to obtain as much information as possible of the respective parts of the object under examination. Thereby, transmission detection scanning in the vertical direction can be realized. In an embodiment in which at least one of the first column assembly 41 and the second column assembly 42 is provided with a first detector assembly, this detector assembly is provided at a side portion of the first column assembly 41 and the second column assembly 42 to be adapted and capable of detecting a radiation beam emitted from the radiation scanning apparatus 2 of the first capsule 1 and transmitted through the inspected object, thereby acquiring information of respective portions of the inspected object as much as possible. Thereby, transmission detection scanning in the vertical direction can also be achieved. At this time, it is preferable that an additional transmission detector be further provided on the side of the object to be inspected away from the radiation scanning device 2.

In embodiments in which the first detection assembly is arranged in both the bottom of the platform structure 31 of the platform assembly 3 and in the first and/or second vertical arm structures 32, 33 and/or the first and second column assemblies 41, 42, the above-described backscatter detection scan in the vertical direction and transmission detection scan in the vertical direction may be achieved simultaneously.

In some embodiments, the lower end of the second mast assembly 42 may be maintained at a distance from the ground by a bottom locator. The underside of the second mast assembly 42 is suspended. The bottom positioning seat does not approximate the attitude of the second mast assembly 42, but only limits the oscillations caused by the wind blowing the second mast assembly 42.

In some embodiments, a bottom locator is telescopically disposed at a lower end of the second column assembly 42 for adjusting the levelness of the second column assembly 42. In some embodiments, the bottom locator base 5 can comprise at least two supports, each of which can be independently telescoping. The front end of the support or the whole of the support may be composed of a material having elasticity (e.g., hard rubber elastomer). Therefore, when the support piece contacts the ground, the positions and the postures of the second upright post assembly 42 and the second arm support 3 attached to the second upright post assembly can be adjusted according to the landform and the like, the ground contact stability of the second upright post assembly 42 and the like is ensured, and the coplanarity of the beam surface of the detector and the beam surface of the ray scanning assembly is further ensured.

In some embodiments, the lower end of the first mast assembly 41 is attached to a function expansion interface of the second nacelle 5 described below. In some embodiments, the first mast assembly 41 includes electrical components to enable electrical communication with each other of the second pod 5 through a function expansion interface.

In some embodiments, the first vertical arm structure 32 of the platform assembly 3 and the first upright assembly 41 may be attached by a flange. In some embodiments, the second vertical arm structure 33 of the platform assembly 3 and the first column assembly 42 may be attached by a flange. In some embodiments, the first vertical arm structure 32 of the platform assembly 3 and the first upright assembly 41 may be attached by a fold. The folder may include a hinge structure. In some embodiments, the second vertical arm structure 33 of the platform assembly 3 and the first upright assembly 42 may be attached by a fold. In the case of using the folder, the column assemblies 41 and 42 and the platform assembly 3 do not need to be completely detached at the time of transfer transportation, and the column assemblies 41 and 42 and the first platform assembly 3 can be installed by simply opening the folder at the time of installation, thereby further simplifying installation adaptation.

In some embodiments, each of the first hull 1, the platform assembly 3, and the first and second column assemblies 41, 42 include electrical components for enabling electrical communication with each other.

The above embodiment shows a case where the first column assembly 41 and the second column assembly 42 are used. It should be appreciated that the description of the bottom nest, attachment to the function expansion interface, electrical components, etc. above also applies to the first and second vertical arm structures 32, 33 of the platform assembly 3 without the use of the first and second column assemblies 41, 42.

According to the first imaging system, the integrated n-type platform assembly, the attached cabin body and the upright post assembly are in modularized design, the integrated door opening type imaging system is integrally formed, a channel is formed between vertical arm structures on two sides of the platform assembly, objects to be detected such as goods and vehicles pass through, and the platform structure is arranged above the channel. The first detector assembly is disposed at least in the platform assembly. When the radiation emitted from the radiation source of the radiation scanning assembly 2 is emitted from the first cabin 1, the detected object is irradiated towards the channel, the radiation beam scattered by the detected object is finally reflected to the first detector assembly arranged at the bottom of the platform structure, a back scattering scanning detection signal in the vertical direction is generated, and the radiation beam transmitted by the detected object is finally irradiated to the first vertical arm structure 32, the second vertical arm structure 33 and/or the first detector assembly arranged in the first vertical column assembly 41 and the second vertical column assembly 42, so that a transmission scanning detection signal in the vertical direction is generated.

According to the first imaging system provided by the embodiment of the application, the modular design of the integrated n-type platform assembly, the attached cabin and the upright post assembly simplifies the number of parts and is beneficial to transition, installation and debugging. In addition, according to the first imaging system provided by the application, the cabin body is attached to the platform assembly, the cabin body is not required to be detached during transition, and the coplanarity can be realized without readjusting the beam surface of the ray scanning assembly in the cabin body and the beam surface of the detector in the upright post assembly during installation and debugging, so that the rapid deployment on site is facilitated.

The second imaging system is described below. FIG. 6 shows a schematic diagram of a second imaging system according to an embodiment of the present application; and fig. 7 shows a schematic view of a second cabin of a second imaging system according to an embodiment of the present application.

In the second imaging system, the second pod 5 includes a second radiation scanning assembly 6. The radiation scanning assembly 6 comprises a radiation source (not shown), such as an electron linear accelerator, an electron induction accelerator, an X-ray tube (X-ray machine) or an isotope source, for emitting radiation, such as X-rays, for irradiating the object under examination. In some implementations, the radiation beam emitted by the radiation scanning assembly 6 has a fan-like form in order to achieve an overall scan of the object under examination. The ray bundle is kept within a certain fan bundle angle which can be adjusted and set according to the sizes of the upper arm support and the vertical arm support. The second compartment 5 has a mounting assembly for mounting the radiation scanning assembly 6 therein, so that the radiation scanning assembly 6 is replaceable. It should be appreciated that the configuration and type of the radiation scanning assembly 6 is not limited.

The upper boom 7 is an integral n-type boom having a cross arm structure 71 and third and fourth vertical arm structures 72, 73 located on both sides of the cross arm structure 71, wherein the third vertical arm structure 72 of the upper boom 7 is attached to the second nacelle 5. The inspection system of the embodiment of the application has the advantages that each part of the inspection system weighs several tons, so that the n-type structure is adopted by the arm support, the posture of the arm support during installation and debugging is kept during transportation after disassembly, and deformation easily caused during the reverse transportation of the arm support is avoided. It should be appreciated that although the cross arm structure 71 and the third and fourth vertical arm structures 72, 73 of the upper boom are shown as being straight such that the upper boom 7 is a right angle n-type boom, in some embodiments, the cross arm structure 71 and the third and fourth vertical arm structures 72, 73 of the upper boom may have an arc such that the upper boom 7 is an arc angle n-type boom. It will also be appreciated that although the third and fourth boom structures 72, 73 of the upper boom are shown in the figures as having substantially the same length, in some embodiments the fourth boom structure 73 may be provided as a shorter length as long as it can be attached to the boom 8, and in this case the length of the boom 8 needs to be adjusted accordingly so that the heights of the two sides of the channel are substantially equivalent.

The upper end 81 of the vertical boom 8 is attached to the fourth vertical boom structure 73 of the upper boom 7. The second detector assembly is disposed in at least one of the following: the side part of the second cabin 5, the upper arm support 7 and the vertical arm support 8. In an embodiment in which a second detector assembly is arranged at the side of the second compartment 5, this detector assembly is arranged at the side of the second compartment 5 to be adapted and able to detect the radiation beam exiting from the radiation scanning device 6 of the second compartment 5 and scattered through the object to be examined, so that information of the various parts of the object to be examined is obtained as much as possible. Thereby, side scatter detection scanning in the horizontal direction can be achieved.

In an embodiment in which the first detector assembly is arranged in at least one of the upper boom 7 and the vertical boom 8, this detector assembly is provided in the upper boom 7 and the vertical boom 8 to be adapted and capable of detecting a radiation beam emitted from the radiation scanning device 6 of the second capsule 5 and transmitted through the object to be inspected, so that information of the respective parts of the object to be inspected is obtained as much as possible. Thereby, transmission detection scanning in the horizontal direction can be realized.

In an embodiment in which the second detection assembly is arranged on the side of the second cabin 5 and at least one of the upper boom 7 and the vertical boom 8, the above-described side scatter detection scanning in the horizontal direction and transmission detection scanning in the horizontal direction can be simultaneously achieved.

In some embodiments, in the second imaging system, as shown in fig. 6, the lower end 82 of the vertical boom 8 is kept at a distance from the ground by a bottom locator seat 9. The lower part of the vertical arm support 8 is suspended. The bottom positioning seat 9 does not restrict the posture of the vertical arm support 8, and only restricts the swing caused by wind blowing the vertical arm support 8.

In some embodiments, the bottom locator base 9 is telescopically disposed at the lower end 82 of the vertical arm support 8. In some embodiments, as shown in fig. 1, the bottom locator base 9 may comprise at least two supports, each of which is independently retractable. The front end of the support or the whole of the support may be composed of a material having elasticity (e.g., hard rubber elastomer). Therefore, when the support piece contacts the ground, the positions and the postures of the vertical arm support 8 and the upper arm support 7 attached to the vertical arm support can be adjusted according to the landform and the like, the ground contact stability of the vertical arm support 8 and the like is ensured, and the coplanarity of the beam surface of the detector and the beam surface of the ray scanning assembly is further ensured.

In some embodiments, level measuring means, such as level gauges, are provided in the second nacelle 5 and in the vertical boom 8 for adjusting the levelness of the second nacelle 5 and the vertical boom 8. In this case, the second cabin 5 as the carrier may be fixed first, and then the upper boom 7 and the vertical boom 8 may be attached in order, and the level measuring device of the vertical boom 8 may be adjusted according to the level measuring device of the second cabin 5 when the upper boom 8 is attached so that the level measuring devices of both are at the same inclination (may be 0 degrees) as compared to the horizontal position, and the relative positions of the second cabin 5 and the vertical boom 8 may be calibrated. By thus providing the level measuring device, it is further ensured that the beam surface of the detector is coplanar with the beam surface of the radiation scanning assembly.

In some embodiments, as shown in fig. 7, the second pod 5 includes a flange interface 51 and a function expansion interface 52. The flange interface 51 may be used for attachment with a third vertical arm structure 72 of the upper arm rest 7. The function expansion interface 52 is used to attach additional function devices so that the second pod 5 can configure more functions as desired. For example, the function expansion interface 52 may be used to attach the first column assembly 41 or the first vertical arm structure 32 of the first imaging system. The function expansion interface 52 may include a mechanical interface, an electrical interface, and the like. Although the function expansion interface 55 is shown at the top corner of the second pod 5, it should be appreciated that the location of the function expansion interface 52 in the second pod 5 is not limited, e.g., the function expansion interface 52 may be disposed at any location on any side of the second pod 5. In some embodiments, the additional function device may be, for example, a portal device with a top view transmission scan or a back scatter scan function, and by attaching the portal device directly to the function expansion interface 52 at the top of the cabin, scanning inspection in both the horizontal view and the vertical view may be achieved. In some embodiments, the additional function device may be a mobile cart (AGV) with backscatter scanning functions, which may be implemented for scanning inspection of both horizontal transmission and horizontal backscatter functions by attaching the mobile cart to a function expansion interface 52 provided on the front side of the cabin (in FIG. 1, the reader facing side). In addition, a function expansion interface can be arranged on the front side of the vertical arm support 8, so that scanning inspection of horizontal transmission and horizontal bidirectional backscattering functions can be realized. The location of the function expansion interface 52, the type of the additional function device, and the like may be customized according to actual requirements.

In some embodiments, the third vertical arm structure 72 of the upper boom 7 is attached to the second nacelle 5 by a flange, and the fourth vertical arm structure 73 of the upper boom 7 is attached to the upper end 81 of the vertical boom by a flange. The use of flanges facilitates easy installation and removal of the modules. In some embodiments, the second pod 5 and the third vertical arm structure 72 of the upper boom 7 may be positioned by a locating pin, and the fourth vertical arm structure 73 of the upper boom 7 and the upper end 11 of the vertical boom 8 may be positioned by a locating pin, thereby aiding alignment and facilitating installation and removal.

In some embodiments, the third vertical arm structure 72 of the upper arm rest 7 and the second nacelle 5 may also be attached by a slide structure or a swivel structure. In some embodiments, a slide structure may be provided on the second pod 5, to which the third vertical arm structure 72 is connected, so that the third vertical arm structure 72 may slide along the slide structure within a predetermined range, and thus may swing the cross arm structure, the fourth vertical arm structure 73, and the attached vertical arm frame 8 within a small range. In some embodiments, a rotation structure may be provided above the second nacelle 5, to which the third vertical arm structure 72 is connected, so that the third vertical arm structure 72, and thus the cross arm structure, the fourth vertical arm structure 73, and the attached vertical arm support 8 may rotate within a small angle range (e.g. 5-10 °) under the drive of the rotation structure. Correspondingly, the radiation scanning assembly 6 may likewise be arranged in the second compartment 5 by means of a slide or swivel arrangement and may be configured to be able to slide or swivel in synchronization with the third vertical arm arrangement 72, so that a small angle scanning is achieved.

In some embodiments, the vertical arm support 8 may be foldably attached to the fourth vertical arm structure 73 by a fold. In this case, the vertical arm frame 8 and the fourth vertical arm structure 73 do not need to be completely detached at the time of transfer transportation, and the installation of the vertical arm frame 8 and the fourth vertical arm structure 73 can be achieved only by opening the folding member at the time of installation, thereby further simplifying the installation adaptation.

In some embodiments, at least one of the vertical boom 8 and the upper boom 7 may also include a sensor assembly. The sensor assembly may include, for example, a laser velocimeter, a laser rangefinder, an infrared curtain, etc. It should be understood that the type and configuration of the sensor assembly is not limited.

In some embodiments, each of the second pod 5, upper boom 7, and upright boom 8 include electrical components for enabling electrical communication with each other. The electrical components may include, for example, various accessory electrical equipment arrangements, power distribution, control lines, and the like.

The second imaging system according to the embodiment of the application adopts a three-section modular design of a second cabin, an integral n-type upper arm frame and a vertical arm frame, the whole is a door opening type, the second cabin 5 is a supporting body of the whole scanning system, the second cabin 5 and the vertical arm frame 8 are arranged on two sides and serve as channels between the two sides so as to facilitate passing of objects to be inspected such as goods, vehicles and the like, the integral n-type upper arm frame 7 is arranged above the channels, a third vertical arm structure 72 of the upper arm frame 7 is attached to the second cabin 5, and a fourth vertical arm structure 73 of the upper arm frame 7 is attached to the vertical arm frame 8. The second detector assembly is provided in at least one of the side of the second nacelle 5, the upper boom 7 and the vertical boom 8. After the radiation emitted by the radiation source of the radiation scanning assembly is emitted from the second cabin 5, the detected object is irradiated towards the channel, the radiation beam scattered by the detected object is finally irradiated onto the second detector assembly arranged on the side part of the second cabin, the side scattering scanning detection signal in the horizontal direction is generated, and the radiation beam transmitted by the detected object is finally irradiated onto the second detector assembly arranged on the upper arm support and/or the vertical arm support, and the transmission scanning detection signal in the horizontal direction is generated.

According to the second imaging system provided by the embodiment of the application, the three-section modularized design of the cabin, the integrated n-type upper arm support and the vertical arm support is adopted, so that the number of parts is simplified, and the transition, the installation and the debugging are facilitated. In addition, according to the inspection system provided by the application, a traditional split transverse and vertical arm structure is eliminated, a supporting structure and an arm support are integrated, and when the inspection system is installed and debugged, coplanarity can be realized without readjusting the beam surface of the detector of the upper arm support and the vertical arm support and the beam surface of the ray scanning assembly, so that quick on-site deployment is facilitated.

The inspection system of the present application combines the first imaging system and the second imaging system, with the first imaging system attached (e.g., via a functional expansion interface) to the second pod of the second imaging system via its first vertical arm structure or first column assembly, thereby enabling at least dual source dual view scanning detection. For each imaging system, a smaller number of components are used, facilitating transfer and transportation, and only these parts need to be attached for reinstallation. When the system is disassembled and reinstalled, the beam surface of the detector of the upper arm frame and each vertical arm structure which are installed subsequently can be coplanar with the beam surface of the corresponding ray scanning assembly without adjustment, so that the on-site rapid deployment is facilitated.

In some embodiments, the inspection system of the present application further comprises a third imaging system comprising a third pod (not shown) comprising a third radiation scanning assembly and a third detector assembly, wherein the third pod is attached to the front side (in fig. 1, the side facing the reader) of the second pod 5 or the vertical boom 8. In some embodiments, two third pods are attached to the front sides of the second pod 5 and the vertical boom 8, respectively. The third detector assembly is arranged at the side part of the third cabin body and is used for adapting and detecting the ray beams emitted from the ray scanning device of the third cabin body and scattered through the detected object, so that information of each part of the detected object can be acquired as much as possible. Thereby, a backscatter detection scan of another scan plane in the horizontal direction can be achieved. It should be understood that the ray beam emitted from the ray scanning device of the third cabin and transmitted through the object to be inspected can also be scanned and received by the second group of detectors arranged in the upper arm support 7 and the vertical arm support 8, so as to further enhance the transmission detection scanning signal in the horizontal direction.

Furthermore, it should be understood that the dimensional proportions of the various parts shown in the drawings are not necessarily drawn to scale, but that these illustrations are merely schematic, the dimensions of the various parts of the system being designed and optimized according to the constraints of the various modes of transportation, minimizing the amount of boxing and stowage.

The above is an explanation of the inspection system according to the embodiment of the present application, and the method of installing the inspection system according to the embodiment of the present application is described below with reference to fig. 8.

As shown in fig. 8, the installation method of the inspection system according to the embodiment of the present application includes S801 to S806.

At S801, a first pod and platform assembly is provided. The first nacelle includes a first radiation scanning assembly, the platform assembly being an integral n-type platform having a platform structure and first and second vertical arm structures located on either side of the platform structure, the first nacelle being attached to the platform structure, the first detector assembly being disposed in the platform assembly. The first pod and the platform assembly may form a first imaging system.

At S802, a second pod is provided, the second pod including a second radiation scanning assembly.

At S803, an upper boom and a vertical boom are provided, the upper boom being an integral n-type boom having a cross arm structure and third and fourth vertical boom structures located on both sides of the cross arm structure, the second detector assembly being disposed in at least one of the following assemblies: the side part of the second cabin body, the upper arm support and the vertical arm support. The second cabin, the upper arm support and the vertical arm support can form a second imaging system.

At S804, a third vertical arm structure is attached to the second pod.

At S805, a fourth vertical arm structure is attached to the upper end of the vertical arm support.

At S806, a lower end of the first vertical arm structure is attached to the second nacelle.

In some embodiments, the method of installing an inspection system further comprises: providing a first column assembly and a second column assembly, attaching an upper end of the first column assembly to the first vertical arm structure, attaching a lower end of the first column assembly to the second nacelle, and attaching an upper end of the second column assembly to the second vertical arm structure.

In some embodiments, the method of installing an inspection system further comprises: the lower end of the first column assembly is attached to the second nacelle at a function expansion interface. In some embodiments, the first mast assembly includes an electrical assembly to enable electrical communication with each other with the second pod through the function expansion interface.

In some embodiments, the method of installing an inspection system further comprises: and attaching the lower end of the second vertical arm structure to the upper end of the vertical arm support.

In some embodiments, the method of installing an inspection system further comprises: the lower end of the first column assembly is attached to the second nacelle at a function expansion interface.

In some embodiments, the method of installing an inspection system further comprises: the first vertical arm structure of the platform assembly is attached to the second pod at the function expansion interface.

In some embodiments, the first mast assembly includes an electrical assembly to enable electrical communication with each other with the second pod through the function expansion interface.

In some embodiments, the first vertical arm structure of the platform assembly includes an electrical assembly to enable electrical communication with each other with the second pod through the function expansion interface.

In some embodiments, the method of installing an inspection system further comprises: the lower end of the vertical arm support and the lower end of the second upright post component are respectively kept at a certain distance from the ground through the bottom positioning seat.

In some embodiments, the bottom nest is telescoping, and the method of installing the inspection system further comprises: and adjusting the bottom positioning seat to adjust levelness of the vertical arm support and the second upright post assembly.

In some embodiments, the bottom locator includes at least two supports, each independently telescoping.

In some embodiments, at least one of the second pod and the vertical boom is provided with a level measurement device, the method of installing the inspection system further comprising: and adjusting the levelness of at least one of the second cabin and the vertical arm support by using a level measuring device.

In some embodiments, the method of installing an inspection system further comprises: attaching the third vertical arm structure to the second pod by one of: flange, slide structure or rotating structure. More specifically, in the case of flange attachment, the third vertical arm structure may also be positioned with the second nacelle by a locating pin. In the case of using a slide structure and a rotation structure, a slide structure or a rotation structure may be provided on the second deck, to which the third vertical arm structure is connected, so that the third vertical arm structure may slide along the slide structure or rotate with the rotation structure within a predetermined range, and further the fourth vertical arm structure and the attached vertical arm frame may swing or rotate within a small range. Accordingly, the radiation scanning assembly may also be disposed in the nacelle by a slider structure or a rotating structure as well, and may be configured to be able to slide or rotate in synchronization with the third vertical arm structure as well, thereby achieving a small angle scan. It should be appreciated that the above-described structure of the second imaging system is also applicable to the first imaging system.

In some embodiments, the method of installing an inspection system further comprises: the fourth vertical arm structure is attached to the upper end of the vertical arm support by a flange or a fold. More specifically, in the case of flange attachment, the fourth vertical arm structure and the upper end of the vertical arm frame may also be positioned by a positioning pin. In the case of using the folding piece, the vertical arm frame and the fourth vertical arm structure do not need to be completely detached during transition transportation, and during installation, the vertical arm frame and the fourth vertical arm structure can be installed only by opening the folding piece, so that installation and adaptation are further simplified.

In some embodiments, each of the first nacelle, the platform assembly, and the first and second column assemblies includes an electrical assembly for enabling electrical communication with each other. In some embodiments, each of the second pod, the upper boom, and the upstand boom include electrical components for enabling electrical communication with each other. The electrical components may include, for example, various accessory electrical equipment arrangements, power distribution, control lines, and the like.

In some embodiments, the method of installing an inspection system further comprises: a third pod is provided that includes a third ray scanning assembly and a third detector assembly, and the third pod is attached to the second pod and/or the vertical boom. The third pod may be a third imaging system. The third pod may be attached to the second pod and/or to the function expansion interface of the vertical boom via the function expansion interface.

According to the installation method of the installation system of the embodiment of the application, the first imaging system and the second imaging system can be used in combination, and only the first vertical arm structure of the first imaging system and the second cabin of the second imaging system are required to be attached. For the first imaging system part, the first cabin and the platform assembly are transported together, so that the first cabin and the platform assembly are sometimes only required to be erected on the upright post assembly, and for the second imaging system, beam surface coplanarity can be realized by only attaching and adjusting the parts and the horizontal postures of the second cabin and the vertical arm structure, so that quick deployment on site is facilitated.

The foregoing detailed description of embodiments of the invention contains many specifics in order to provide a thorough understanding of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without some of these specific details. The above description of embodiments is merely intended to provide a clearer understanding of the present invention by showing examples of the present invention. The invention is in no way limited to any specific configuration and method steps set forth below, but covers any modifications, substitutions, and improvements in the relevant elements, components, and method steps without departing from the teachings of the invention.

It should be noted that in the claims, the word "comprising" or "comprises" does not exclude the presence of elements or components not listed in a claim. The article "a" or "an" preceding an element or component does not exclude the presence of a plurality of such elements or components.

Furthermore, it should be noted that the language used in the specification has been principally selected for readability and instructional purposes, and may not have been selected to delineate or circumscribe the inventive subject matter. Accordingly, many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the appended claims. The description is intended to be illustrative, but not limiting, of the scope of the invention, which is defined by the appended claims.

Claims (16)

1. An inspection system, comprising:

a first imaging system, the first imaging system comprising:

a first pod comprising a first radiation scanning assembly; and

a platform assembly being an integral n-type platform having a platform structure and first and second vertical arm structures located on either side of the platform structure, the first pod being attached to the platform structure, a first detector assembly being disposed in the platform assembly; and

a second imaging system, the second imaging system comprising:

a second enclosure including a second radiation scanning assembly;

the upper arm support is an integrated n-type arm support, the integrated n-type arm support is provided with a cross arm structure, a third vertical arm structure and a fourth vertical arm structure, the third vertical arm structure and the fourth vertical arm structure are positioned on two sides of the cross arm structure, and the third vertical arm structure is attached to the second cabin; and

a vertical boom, wherein an upper end of the vertical boom is attached to the fourth vertical boom structure, and wherein a second detector assembly is disposed in at least one of: the side part of the second cabin, the upper arm support and the vertical arm support,

Wherein a lower end of the first vertical arm structure is attached to the second pod.

2. The inspection system of claim 1, wherein the first imaging system further comprises a first column assembly and a second column assembly, an upper end of the first column assembly being attached to the first vertical arm structure, an upper end of the second column assembly being attached to the second vertical arm structure, and a lower end of the first column assembly being attached to the second nacelle.

3. The inspection system of claim 2, wherein the lower end of the vertical boom and the lower end of the second column assembly are each maintained at a distance from the ground by a bottom locator.

4. An inspection system according to claim 3, wherein the bottom locator includes at least two supports, each independently telescoping.

5. The inspection system of claim 1, wherein at least one of the second pod and the vertical boom is provided with a level measurement device for adjusting the levelness of the at least one of the second pod and the vertical boom.

6. The inspection system of claim 1, wherein the third vertical arm structure and the second pod are attached by one of: flange, slide structure or rotating structure.

7. The inspection system of claim 1, wherein the fourth riser structure is attached to an upper end of the riser mount by a flange or fold.

8. The inspection system of claim 1, wherein the inspection system further comprises a third imaging system comprising a third pod comprising a third ray scanning assembly and a third detector assembly, the third pod attached to the second pod or the vertical boom.

9. A method of installing an inspection system, comprising:

providing a first nacelle and a platform assembly, the first nacelle comprising a first radiation scanning assembly, the platform assembly being a unitary n-type platform having a platform structure and first and second vertical arm structures located on either side of the platform structure, the first nacelle being attached to the platform structure, a first detector assembly being disposed in the platform assembly;

providing a second enclosure comprising a second radiation scanning assembly;

the method comprises the steps of providing an upper arm support and a vertical arm support, wherein the upper arm support is an integrated n-type arm support, the integrated n-type arm support is provided with a cross arm structure, a third vertical arm structure and a fourth vertical arm structure, the third vertical arm structure and the fourth vertical arm structure are positioned on two sides of the cross arm structure, and a second detector assembly is arranged in at least one of the following assemblies: the side part of the second cabin, the upper arm support and the vertical arm support;

Attaching the third vertical arm structure to the second pod;

attaching the fourth vertical arm structure to the upper end of the vertical arm support; and

a lower end of the first vertical arm structure is attached to the second pod.

10. The method of installing an inspection system of claim 9, further comprising: providing a first column assembly and a second column assembly, attaching an upper end of the first column assembly to the first vertical arm structure, attaching an upper end of the second column assembly to the second vertical arm structure, and attaching a lower end of the first column assembly to the second nacelle.

11. The method of installing an inspection system of claim 10, further comprising: and the lower end of the vertical arm support and the lower end of the second upright post assembly are respectively kept at a certain distance from the ground through a bottom positioning seat.

12. The method of installing an inspection system of claim 11, wherein the bottom locator includes at least two supports, each support being independently telescoping.

13. The installation method of an inspection system according to claim 9, wherein at least one of the second cabin and the vertical boom is provided with a level measurement device, the installation method of an inspection system further comprising: and adjusting levelness of at least one of the second cabin and the vertical arm support by using the level measuring device.

14. The method of installing an inspection system of claim 9, further comprising: attaching the third vertical arm structure with the second pod by one of: flange, slide structure or rotating structure.

15. The method of installing an inspection system of claim 9, further comprising: the fourth vertical arm structure is attached to the upper end of the vertical arm support by a flange or a fold.

16. The method of installing an inspection system of claim 9, further comprising:

providing a third enclosure comprising a third radiation scanning assembly and a third detector assembly, an

The third pod is attached to the second pod or the vertical boom.

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