CN116031124A - An arc chamber structure and working method for an ion source of an ion implanter - Google Patents
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Abstract
本发明提供一种用于离子注入机的离子源的起弧腔室结构及其工作方法,其适用于离子注入机的离子源,所述离子注入机的离子源包括灯丝组件、阴极组件、半圆筒型起弧腔室组件、工艺气体通入组件、反射极组件;半圆筒型起弧腔室组件采用半圆筒型腔室设计,反射极组件采用悬空的反射极设计。本发明的用于离子注入机的离子源的起弧腔室结构为半圆筒型起弧腔室,简化了离子源的组装和保养流程;本发明采用优化的灯丝和阴极组件,有效地延长了离子源的使用寿命,大大提高了离子注入机的产能。发明通过全新的研发设计,降低了离子源的能耗,提高了离子萃取的效率和束流的强度,进而提高了工艺产品的良率。
The invention provides an arc starting chamber structure and working method for an ion source of an ion implanter, which is suitable for an ion source of an ion implanter, and the ion source of the ion implanter includes a filament assembly, a cathode assembly, a semicircular Cylindrical arc starting chamber components, process gas inlet components, and reflector components; semi-cylindrical arc starting chamber components adopt a semi-cylindrical chamber design, and the reflector component adopts a suspended reflector design. The structure of the arcing chamber of the ion source used in the ion implanter of the present invention is a semi-cylindrical arcing chamber, which simplifies the assembly and maintenance process of the ion source; The service life of the ion source greatly improves the productivity of the ion implanter. Through a new R&D design, the invention reduces the energy consumption of the ion source, improves the efficiency of ion extraction and the intensity of the beam, and thus improves the yield rate of process products.
Description
技术领域technical field
本发明属于半导体设备技术领域,具体涉及一种用于离子注入机的离子源的起弧腔室结构及其工作方法。The invention belongs to the technical field of semiconductor equipment, and in particular relates to an arc-starting chamber structure and a working method for an ion source of an ion implanter.
背景技术Background technique
离子注入机的传统离子源在使用过程中存在很多问题,包括1.离子源使用寿命短(通常寿命在100小时左右),并且传统离子源在使用寿命的末端经常出现灯丝断裂,阴极打穿等现象。与此同时还会造成工艺作业突然中断,需要后续补打等非必要的麻烦。2.离子束电流太小且无法满足先进制成的工艺要求,传统离子源在使用过程中起弧相对比较困难,需要对离子源的各个部件施加相对大的能量才能萃取出比较少量的离子束。这就使得整个离子注入机的使用效率下降,进而影响产品的生产。3.离子束均匀性较差,且离子束上方存在缺角。传统的离子源对于离子束的均匀性有着很大的影响,并且越到离子源寿命的末期,离子束的均匀性越难控制。这就使得离子源的寿命进一步缩短,造成更多的停机困扰。4.起弧腔室的底部是平面型的,使得整个起弧腔室的容积相对较小,工艺气体的离化率相对较低。传统的离子源起弧腔室采用平面式设计,不能最大程度上优化起弧腔室的反应体积,使得通入起弧腔室的工艺气体不能充分离化。不仅浪费了大量的工艺气体,同时也使通入到起弧腔室中的大量工艺气体产生的副产物附着在离子源表面,进一步减少了离子源的使用寿命和离子束质量。There are many problems in the use of the traditional ion source of the ion implanter, including 1. The service life of the ion source is short (usually about 100 hours), and the traditional ion source often has filament breakage and cathode breakdown at the end of its service life. Phenomenon. At the same time, it will also cause a sudden interruption of the process operation, and unnecessary troubles such as follow-up reprinting are required. 2. The current of the ion beam is too small and cannot meet the technological requirements of advanced manufacturing. It is relatively difficult to start the arc during the use of the traditional ion source, and it is necessary to apply relatively large energy to each part of the ion source to extract a relatively small amount of ion beam. . This reduces the utilization efficiency of the entire ion implanter, thereby affecting the production of products. 3. The uniformity of the ion beam is poor, and there is a missing corner above the ion beam. Traditional ion sources have a great impact on the uniformity of the ion beam, and towards the end of the life of the ion source, the uniformity of the ion beam becomes more difficult to control. This shortens the lifetime of the ion source even further, causing more downtime headaches. 4. The bottom of the arcing chamber is planar, so that the volume of the entire arcing chamber is relatively small, and the ionization rate of the process gas is relatively low. The traditional ion source arcing chamber adopts a planar design, which cannot optimize the reaction volume of the arcing chamber to the greatest extent, so that the process gas passing into the arcing chamber cannot be fully ionized. Not only is a large amount of process gas wasted, but also the by-products produced by a large amount of process gas passed into the arcing chamber are attached to the surface of the ion source, further reducing the service life of the ion source and the quality of the ion beam.
随着半导体工艺技术的发展和工艺要求的提高,设计和改造出一种低能耗,低维护,高稳定性,且能产生高质量离子束的离子源是意义重大的。With the development of semiconductor process technology and the improvement of process requirements, it is of great significance to design and transform an ion source with low energy consumption, low maintenance, high stability, and capable of producing high-quality ion beams.
发明内容Contents of the invention
基于现有技术存在的问题,本发明提供一种用于离子注入机的离子源的起弧腔室结构及其工作方法。Based on the problems existing in the prior art, the present invention provides an arc-starting chamber structure and working method for an ion source of an ion implanter.
依据本发明技术方案的第一方面,本发明提供了一种用于离子注入机的离子源的起弧腔室结构,其适用于离子注入机的离子源,所述离子注入机的离子源包括灯丝组件、阴极组件、半圆筒型起弧腔室组件、工艺气体通入组件、反射极组件;半圆筒型起弧腔室组件采用半圆筒型腔室设计,反射极组件采用悬空的反射极设计。According to the first aspect of the technical solution of the present invention, the present invention provides an arcing chamber structure for the ion source of the ion implanter, which is suitable for the ion source of the ion implanter, and the ion source of the ion implanter includes Filament assembly, cathode assembly, semi-cylindrical arc-starting chamber assembly, process gas inlet assembly, and reflector assembly; the semi-cylindrical arc-starting chamber assembly adopts a semi-cylindrical chamber design, and the reflector assembly adopts a suspended reflector design .
进一步地,灯丝组件是使灯丝受热产生自由电子,所产生自由电子在电场的作用下进入阴极,进而轰击阴极组件。阴极组件在接收来自灯丝电子的轰击后产生大量的自由电子并在电场的作用下进入起弧腔室组件。Further, the filament assembly generates free electrons when the filament is heated, and the free electrons enter the cathode under the action of an electric field, and then bombard the cathode assembly. After the cathode assembly receives the bombardment from the filament electrons, a large number of free electrons are generated and enter the arc chamber assembly under the action of the electric field.
更进一步地,用于离子注入机的离子源的起弧腔室结构包括灯丝夹、阴极绝缘器、灯丝、耐热螺栓和灯丝能量供给杆。耐热螺栓将2个灯丝夹固定到阴极绝缘件外侧,灯丝连接灯丝夹,并通过灯丝能量供给杆施加相应能量至灯丝,完成灯丝加热并产生电子。Furthermore, the structure of the arcing chamber for the ion source of the ion implanter includes a filament clamp, a cathode insulator, a filament, a heat-resistant bolt and a filament energy supply rod. The heat-resistant bolts fix the two filament clamps to the outside of the cathode insulator, the filament is connected to the filament clamp, and the corresponding energy is applied to the filament through the filament energy supply rod to complete the heating of the filament and generate electrons.
优选地,用于离子注入机的离子源的起弧腔室结构进一步包括阴极,将阴极插入支架的圆环中,用紧定螺丝锁紧。调整阴极位置,使紧定螺栓完全靠紧灯丝夹上孔道上的半圆形孔,锁紧螺栓。将灯丝缓缓推入阴极中,将支架上的2个定位销压入阴极绝缘件的销孔中,使支架和阴极绝缘件紧贴,中间没有间隙。Preferably, the arc-starting chamber structure for the ion source of the ion implanter further includes a cathode, which is inserted into the ring of the bracket and locked with a set screw. Adjust the position of the cathode so that the set bolt is completely close to the semicircular hole on the upper channel of the filament clamp, and lock the bolt. Slowly push the filament into the cathode, press the two positioning pins on the bracket into the pin holes of the cathode insulator, so that the bracket and the cathode insulator are close together without gaps in between.
依据本发明技术方案的第二方面,本发明提供了一种用于离子注入机的离子源的起弧腔室结构的工作方法,其包括以下步骤:According to the second aspect of the technical solution of the present invention, the present invention provides a working method for an arcing chamber structure of an ion source of an ion implanter, which includes the following steps:
步骤S1,灯丝组件受热产生电子轰击阴极;Step S1, the filament assembly is heated to generate electrons to bombard the cathode;
步骤S2,阴极组件产生大量电子进入起弧腔室;Step S2, the cathode assembly generates a large amount of electrons and enters the arcing chamber;
步骤S3,工艺气体通入起弧腔室;Step S3, the process gas is passed into the arcing chamber;
步骤S4,自由电子和反应气体碰撞产生等离子体;Step S4, free electrons and reaction gas collide to generate plasma;
步骤S5,反射极组件反射电子持续和工艺气体碰撞。In step S5, the reflector assembly continuously reflects electrons and collides with the process gas.
与现有技术相比,本发明的用于离子注入机的离子源的起弧腔室结构的有益技术效果如下:Compared with the prior art, the beneficial technical effect of the arcing chamber structure used for the ion source of the ion implanter of the present invention is as follows:
1、本发明的用于离子注入机的离子源的起弧腔室结构为半圆筒型起弧腔室,简化了离子源的组装和保养流程。1. The structure of the arcing chamber for the ion source of the ion implanter of the present invention is a semi-cylindrical arcing chamber, which simplifies the assembly and maintenance process of the ion source.
2、本发明采用优化的灯丝和阴极组件,有效地延长了离子源的使用寿命,大大提高了离子注入机的产能。2. The invention adopts the optimized filament and cathode assembly, which effectively prolongs the service life of the ion source and greatly improves the productivity of the ion implanter.
3、本发明通过全新的研发设计,降低了离子源的能耗,提高了离子萃取的效率和束流的强度,进而提高了工艺产品的良率。3. The present invention reduces the energy consumption of the ion source through a new research and development design, improves the efficiency of ion extraction and the intensity of the beam, and further improves the yield rate of the process product.
附图说明Description of drawings
图1是本发明用于离子注入机的离子源的起弧腔室结构的爆炸结构示意图。FIG. 1 is a schematic diagram of an exploded structure of an arcing chamber structure used in an ion source of an ion implanter according to the present invention.
图2是图1用于离子注入机的离子源的起弧腔室结构中的灯丝组件的结构示意图。FIG. 2 is a schematic structural view of the filament assembly in the arc-starting chamber structure of the ion source of the ion implanter in FIG. 1 .
图3是图1用于离子注入机的离子源的起弧腔室结构中的阴极组件的结构示意图。FIG. 3 is a schematic structural view of the cathode assembly in the arcing chamber structure of the ion source of the ion implanter in FIG. 1 .
图4是图1用于离子注入机的离子源的起弧腔室结构中的半圆筒型起弧腔室组件的结构示意图。FIG. 4 is a structural schematic diagram of the semi-cylindrical arcing chamber assembly used in the arcing chamber structure of the ion source of the ion implanter in FIG. 1 .
图5是图1用于离子注入机的离子源的起弧腔室结构中的反射极组件的结构示意图。FIG. 5 is a schematic structural view of the reflector assembly in the arcing chamber structure used in the ion source of the ion implanter in FIG. 1 .
图6是图1用于离子注入机的离子源的起弧腔室结构中的气体通入组件的结构示意图。FIG. 6 is a structural schematic diagram of a gas inlet component in the arcing chamber structure used in the ion source of the ion implanter in FIG. 1 .
图7是用于离子注入机的离子源的起弧腔室结构的工作流程示意图。Fig. 7 is a schematic working flow diagram of the structure of the arcing chamber for the ion source of the ion implanter.
附图中的附图标记说明:Explanation of the reference signs in the accompanying drawings:
灯丝夹1;阴极绝缘器2;灯丝3;阴极4;阴极套5;第一阴极终端板6;第二阴极终端板7;校准平衡销8;阴极内衬套9;阴极侧隔离板10;陶瓷螺母11;反射极12;反射极侧隔离板13;反射极端板14,反射极绝缘器15;反射极夹子16;半圆筒形隔离板17;起弧腔室18;耐热螺栓19;阴极支架20;工艺气体通入管21;锁紧螺栓22;灯丝能量供给杆23;阴极能量供给杆24;起弧室外层盖板25;起弧室内层盖板26。
具体实施方式Detailed ways
为使本发明的目的、技术方案和优点更加清楚,下面将结合本发明中的附图,对本发明中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the present invention. Obviously, the described embodiments are part of the embodiments of the present invention , but not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
另外还需要说明的是,为了便于描述,附图中仅示出了与有关发明相关的部分。在不冲突的情况下,本发明中的实施例及实施例中的特征可以相互组合。It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings. In the case of no conflict, the embodiments and the features in the embodiments of the present invention can be combined with each other.
需要注意,本发明中提及的“第一”、“第二”等概念仅用于对不同的装置、模块或单元进行区分,并非用于限定这些装置、模块或单元所执行的功能的顺序或者相互依存关系。It should be noted that concepts such as "first" and "second" mentioned in the present invention are only used to distinguish different devices, modules or units, and are not used to limit the sequence of functions performed by these devices, modules or units or interdependence.
需要注意,本发明中提及的“一个”、“多个”的修饰是示意性而非限制性的,本领域技术人员应当理解,除非在上下文另有明确指出,否则应该理解为“一个或多个”。It should be noted that the modifications of "one" and "multiple" mentioned in the present invention are illustrative and not restrictive, and those skilled in the art should understand that unless the context clearly indicates otherwise, it should be understood as "one or more" multiple".
本发明提供一种用于离子注入机的离子源的起弧腔室结构及工作方法,装备所述用于离子注入机的离子源的起弧腔室结构的离子源为一种低能耗,低维护,高稳定性,且能产生高质量离子束的离子源。该离子源包括优化的灯丝组件、阴极组件、半圆筒型起弧腔室组件、工艺气体通入组件、反射极组件以及隔离各组件的绝缘子。The present invention provides an arc-starting chamber structure and working method for an ion source of an ion implanter. The ion source equipped with the arc-starting chamber structure of an ion source for an ion implanter is a kind of low energy consumption, low Maintenance-free, high-stability ion source that produces a high-quality ion beam. The ion source includes an optimized filament assembly, a cathode assembly, a semi-cylindrical arc-starting chamber assembly, a process gas inlet assembly, a reflector assembly and an insulator for isolating each assembly.
如图2所示,离子源中的灯丝组件中灯丝采用更大的尺寸和更优化的材质,使得灯丝的耐热程度和产生电子的能力大大提高.如图3所示,阴极组件采用更厚的阴极设计以及更优化的材质和结构调整,使得阴极产生电子的能力大大提高,以及使用寿命的有效延长同样是本设计的一大亮点。如图4所示,半圆筒型起弧腔室组件摒弃固有的平面化设计,采用全新的半圆筒型腔室设计,使得反应腔室容量变大,气体分布更加均匀,气体离化率得以有效提高。如图5所示的反射极组件采用悬空的反射极设计,使得反射效率有所增加。如图6所示,优化的气体通入组件使得工艺气体在进入起弧腔室时分布更加均匀,压力分布更加合理,有效地提高了工艺气体的利用率。As shown in Figure 2, the filament in the filament assembly in the ion source adopts a larger size and more optimized material, which greatly improves the heat resistance of the filament and the ability to generate electrons. As shown in Figure 3, the cathode assembly adopts a thicker The unique cathode design and more optimized material and structure adjustment greatly improve the ability of the cathode to generate electrons, and the effective extension of the service life is also a highlight of this design. As shown in Figure 4, the semi-cylindrical arc striking chamber assembly abandons the inherent planar design and adopts a new semi-cylindrical chamber design, which makes the capacity of the reaction chamber larger, the gas distribution is more uniform, and the gas ionization rate can be effectively improved. improve. The reflector assembly shown in FIG. 5 adopts a suspended reflector design, so that the reflection efficiency is increased. As shown in Figure 6, the optimized gas inlet assembly makes the distribution of the process gas more uniform and the pressure distribution more reasonable when it enters the arcing chamber, effectively improving the utilization rate of the process gas.
进一步地,所述灯丝组件是使灯丝受热产生自由电子的源头,所产生自由电子在电场的作用下进入阴极,进而轰击阴极组件。所述阴极组件在接收来自灯丝电子的轰击后产生大量的自由电子并在电场的作用下进入起弧腔室组件。并且巧妙的阴极组件设计使得阴极和灯丝的距离控制更加简单化和可靠,从而离子源组装过程的重复率和成功率均大幅提高。并且适当的灯丝尺寸和阴极厚度搭配,很大程度地提高了灯丝和阴极寿命。所述半圆筒型起弧腔室组件有效地增大了起弧腔室的体积,并且巧妙的半圆筒型设计更有利于工艺气体分子和原子与自由电子在起弧腔室中充分的碰撞,进而产生更多的离子。这种设计不仅增加了工艺气体的离化率,同时还可以减少工艺气体的使用量,进而减少附着在离子源表面的副产物以及提高离子源的使用寿命和提高离子束的质量。所述工艺气体通入组件优化了通入起弧腔室的工艺气体的压力分布和均匀度,进而使得工艺气体的离化程度有所提高。所述反射极组件使得起弧腔室中的电子在运行到反射极附近时能更有效及时地反弹回去,继续和起弧腔室中的工艺气体进行碰撞,产生更多的离子。所述各隔离组件地绝缘子提供了高效的电势隔离,使得灯丝、阴极和起弧腔室之间的电势互相独立,可靠运行。Further, the filament assembly is the source of heating the filament to generate free electrons, and the generated free electrons enter the cathode under the action of an electric field, and then bombard the cathode assembly. The cathode assembly generates a large number of free electrons after being bombarded by electrons from the filament and enters the arcing chamber assembly under the action of an electric field. And the ingenious design of the cathode assembly makes the distance control between the cathode and the filament more simple and reliable, so that the repetition rate and success rate of the ion source assembly process are greatly improved. And the appropriate filament size and cathode thickness can greatly improve the life of the filament and cathode. The semi-cylindrical arcing chamber assembly effectively increases the volume of the arcing chamber, and the ingenious semi-cylindrical design is more conducive to the full collision of process gas molecules and atoms with free electrons in the arcing chamber. This in turn generates more ions. This design not only increases the ionization rate of the process gas, but also reduces the amount of process gas used, thereby reducing the by-products attached to the surface of the ion source, improving the service life of the ion source and improving the quality of the ion beam. The process gas inlet assembly optimizes the pressure distribution and uniformity of the process gas fed into the arcing chamber, thereby improving the degree of ionization of the process gas. The repellent assembly enables the electrons in the arc starting chamber to bounce back more effectively and timely when they run to the vicinity of the reflex electrode, and continue to collide with the process gas in the arc starting chamber to generate more ions. The insulators of the isolation components provide high-efficiency potential isolation, so that the potentials among the filament, the cathode and the arcing chamber are independent of each other and operate reliably.
如图1所示,本实施例的用于离子注入机的离子源的起弧腔室结构包括灯丝夹1、阴极绝缘器2、灯丝3、阴极4、阴极套5、第一阴极终端板6、第二阴极终端板7、校准平衡销8、阴极内衬套9、阴极侧隔离板10、陶瓷螺母11、反射极12、反射极侧隔离板13、反射极端板14、反射极绝缘器15、反射极夹子16、半圆筒形隔离板17、起弧腔室18、耐热螺栓19、阴极支架20、工艺气体通入管21、锁紧螺栓22、灯丝能量供给杆23、阴极能量供给杆24、起弧室外层盖板25和起弧室内层盖板26。As shown in Figure 1, the structure of the arcing chamber for the ion source of the ion implanter in this embodiment includes a
耐热螺栓19将2个灯丝夹1固定到阴极绝缘件2外侧,灯丝3连接灯丝夹1,并通过灯丝能量供给杆23施加相应能量至灯丝,完成灯丝加热并产生电子。将阴极4插入支架20的圆环中,用紧定螺丝22锁紧。调整阴极4位置,使紧定螺栓22完全靠紧灯丝夹1上孔道上的半圆形孔,锁紧螺栓22。将灯丝缓缓推入阴极中,将支架上的2个定位销压入阴极绝缘件的销孔中,使支架和阴极绝缘件紧贴,中间没有间隙。用螺栓锁紧支架和阴极绝缘件,将衬套5旋到支架上,旋入时,要使衬套与阴极同轴心推入。打开灯丝夹子,调整灯丝位置,把灯丝1向内推入,直至紧贴阴极2内侧。将螺栓22拧松,调整阴极2位置,使螺栓22从半圆形孔中移出至长形孔位置,灯丝1与2内侧形成间距,锁紧螺丝22。,将校准平衡销8插入起弧腔室18反射极端的定位销孔内。将反射极端板14装到起弧腔室上,装配时,反射极端板14上的定位销孔对准起弧腔室上的定位销。用螺栓和陶瓷螺母11将反射极绝缘件15安装到起弧腔室上,反射极绝缘件15上的定位销孔对准定位销,压入,使反射极绝缘件15与端板紧贴。用耐热螺栓19将反射极夹子16安装在反射极绝缘件上。将2个定位销8插入起弧腔室的定位销孔内,插入时向孔内推到里端,将阴极内衬套9压入阴极内端板7内。将阴极内端板7上的2个定位销孔对准起弧腔室上的两个定位销套入,贴紧起弧腔室阴极侧。将阴极端板6上的2个定位销孔对准起弧腔室上的2个定位销并套入,紧贴阴极内端板。压稳阴极侧两个端板,把阴极侧隔离板10塞入起弧腔室与阴极内端板之间的凹槽内,把反射极侧隔离板13塞入起弧腔室与反射极端板之间的凹槽内,将半圆筒形隔离板17装入起弧腔室,两者上的圆孔要对准。将反射极12穿过0.5mm塞片的孔,将反射极12和塞板安装到起弧腔室上,并靠紧反射极隔离板。将0.5mm塞片取出,反射极12与起弧腔室-离子源反射极隔离板的间距为0.5mm。将起弧室内层盖板26和外层盖板25装到起弧腔室上面,装配时,起弧室内层盖板26以及外层盖板25与起弧腔室居中对齐。将工艺气体通入管21插入到起弧腔室一侧的圆孔内上,转动工艺气体通入管21,调整位置使气孔向下,使气管插入到工艺气体通入管21的气孔中。The heat-
其中灯丝组件由灯丝夹1、灯丝3、耐热螺栓19和灯丝能量供给杆23共同组成。灯丝组件的主要作用是在灯丝电源的作用下产生原始的电子源,从而轰击阴极组件,灯丝3的主要材质是耐高温的钨。The filament assembly is composed of a
阴极组件由阴极4、阴极套5、第一阴极终端板6、第二阴极终端板7、阴极内衬套9、阴极支架20、锁紧螺栓22、阴极能量供给杆24共同组成。阴极组件的主要作用是受到灯丝组件产生的电子轰击后由阴极4产生大量的电子并进入起弧腔室,阴极4的主要材质也是耐高温的钨。The cathode assembly is composed of cathode 4 , cathode sleeve 5 , first cathode terminal plate 6 , second
半圆筒型起弧腔室组件由阴极侧隔离板10、反射极侧隔离板13、半圆筒形隔离板17、起弧腔室18、起弧室外层盖板25和起弧室内层盖板26共同组成。半圆筒型起弧腔室组件的主要作用是作为阴极组件产生的电子和工艺气体通入组件通入的工艺气体的反应腔室,使工艺气体电离产生等离子体。The semi-cylindrical arc-starting chamber assembly consists of a cathode-
工艺气体通入组件主要由工艺气体通入管21及其他一些附属部件组成,其主要作用是通入工艺气体,提供分布均匀且压力稳定的反应气体。The process gas inlet assembly is mainly composed of a process
反射极组件由反射极12、反射极端板14和反射极夹子16组成,其主要作用是反射起弧腔室中运动的电子,使其在起弧腔室中和工艺气体持续碰撞,提高工艺气体的解离效率。隔离各组件的绝缘子包括:阴极绝缘器2、校准平衡销8、陶瓷螺母11和反射极绝缘器15。其主要作用是隔绝不同组件之间施加的不同电势。The reflector assembly is composed of the
使用本发明用于离子注入机的离子源的起弧腔室结构的离子源运行时,灯丝受热产生的电子在电场的作用下都汇聚于阴极4,并轰击阴极,使其受热并产生大量的电子,从而大量电子受电场作用进入起弧腔室18。当有反应气体通过进气管路21进入起弧腔室时,阴极产生的大量电子会在电场的作用下和通入的工艺气体产生激烈碰撞,从而使得工艺气体的最外层价电子剥落,形成相应的带电离子。因此,剥落不同元素的外层价电子所需要的能量是不同的,通常遵循的规律是相对原子质量越小的元素所需要的能量越高。这是因为外层价电子离原子核越近,就需要越多的能量让外层价电子脱离原子核的束缚。When using the ion source of the arcing chamber structure of the ion source of the ion implanter according to the present invention to operate, the electrons generated by the heating of the filament all gather at the cathode 4 under the action of the electric field, and bombard the cathode, causing it to be heated and generate a large amount of electrons. Electrons, so a large number of electrons enter the arcing
为了将足够的能量转移到通入起弧腔室中的工艺气体原子或分子上,离子源需要大量的自由电子。这些自由电子被静电势加速,加速的自由电子撞击并且把能量传递到相应的工艺气体原子或分子上,只有一小部分能量(大约1/5至1/10的加速度)被传递到掺杂剂目标上。同时,为了增加自由电子在起弧腔室中和工艺气体原子或分子碰撞的几率,本实施例中反射极12所起的作用是通过一定量的电子堆积在反射极表面以行成相对应的负电势,从而排斥自由电子并使大量自由电子反射回起弧腔室继续和反射弧腔室中的工艺气体原子或分子持续碰撞,形成更多的目标离子。In order to transfer sufficient energy to the process gas atoms or molecules passing into the arc chamber, the ion source requires a large number of free electrons. These free electrons are accelerated by the electrostatic potential, the accelerated free electrons strike and transfer energy to the corresponding process gas atoms or molecules, only a small part of the energy (about 1/5 to 1/10 of the acceleration) is transferred to the dopant on target. At the same time, in order to increase the probability of free electrons colliding with process gas atoms or molecules in the arcing chamber, the function of the
用于离子注入机的离子源的起弧腔室结构的工作步骤如下:The working steps of the arcing chamber structure for the ion source of the ion implanter are as follows:
步骤S1,灯丝组件受热产生电子轰击阴极;Step S1, the filament assembly is heated to generate electrons to bombard the cathode;
步骤S2,阴极组件产生大量电子进入起弧腔室;Step S2, the cathode assembly generates a large amount of electrons and enters the arcing chamber;
步骤S3,工艺气体通入起弧腔室;Step S3, the process gas is passed into the arcing chamber;
步骤S4,自由电子和反应气体碰撞产生等离子体;Step S4, free electrons and reaction gas collide to generate plasma;
步骤S5,反射极组件反射电子持续和工艺气体碰撞。In step S5, the reflector assembly continuously reflects electrons and collides with the process gas.
与现有技术相比较,本发明采用一体化的起弧腔室,并设计相对应的内部保护层,增加了离子源工作可靠性的同时也使得离子源更易于组装和维护保养。除此之外,优化的工艺气体通入管设计使得工艺气体进入起弧腔室的压力和均匀性得到有效的控制,其目的是为了增加工艺气体的离化率,提高从离子源中萃取出来的离子数量,进而提高工艺产能。并且本实施例采用了优化设计的灯丝,无论从材质和尺寸上都有一定程度的改进,使得灯丝的使用寿命大幅上升。升级后的阴极安装和固定装置使得阴极的稳定性和使用寿命都有长足的提升。Compared with the prior art, the present invention adopts an integrated arcing chamber and designs a corresponding inner protective layer, which not only increases the reliability of the ion source, but also makes the ion source easier to assemble and maintain. In addition, the optimized design of the process gas inlet pipe enables the pressure and uniformity of the process gas to enter the arc chamber to be effectively controlled. The purpose is to increase the ionization rate of the process gas and improve the extraction from the ion source. The number of ions, thereby increasing the process throughput. In addition, this embodiment adopts an optimally designed filament, which is improved to a certain extent in terms of material and size, so that the service life of the filament is greatly increased. The upgraded cathode installation and fixing device have greatly improved the stability and service life of the cathode.
最后应说明的是:以上实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: it can still be Modifications are made to the technical solutions described in the foregoing embodiments, or equivalent replacements are made to some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100584791B1 (en) * | 2005-05-06 | 2006-05-30 | 삼성전자주식회사 | Ion source and ion implantation apparatus having same |
KR20160134293A (en) * | 2015-05-15 | 2016-11-23 | 위너스 주식회사 | Source head for semiconductor equipment |
KR20170055794A (en) * | 2015-11-12 | 2017-05-22 | 주식회사 밸류엔지니어링 | Arc chamber for ion implanter |
CN108475606A (en) * | 2016-01-29 | 2018-08-31 | 瓦里安半导体设备公司 | ceramic ion source chamber |
CN110729159A (en) * | 2019-10-12 | 2020-01-24 | 武汉新芯集成电路制造有限公司 | Installation device of ion source |
CN111902904A (en) * | 2018-03-30 | 2020-11-06 | 瓦里安半导体设备公司 | Ion implantation foil assembly |
CN114360991A (en) * | 2021-12-21 | 2022-04-15 | 北京凯世通半导体有限公司 | Carbon ion source device with reflector power supply |
CN219575557U (en) * | 2022-12-31 | 2023-08-22 | 北京凯世通半导体有限公司 | Arcing chamber structure of ion source for ion implanter |
-
2022
- 2022-12-31 CN CN202211738220.5A patent/CN116031124A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100584791B1 (en) * | 2005-05-06 | 2006-05-30 | 삼성전자주식회사 | Ion source and ion implantation apparatus having same |
KR20160134293A (en) * | 2015-05-15 | 2016-11-23 | 위너스 주식회사 | Source head for semiconductor equipment |
KR20170055794A (en) * | 2015-11-12 | 2017-05-22 | 주식회사 밸류엔지니어링 | Arc chamber for ion implanter |
CN108475606A (en) * | 2016-01-29 | 2018-08-31 | 瓦里安半导体设备公司 | ceramic ion source chamber |
CN111902904A (en) * | 2018-03-30 | 2020-11-06 | 瓦里安半导体设备公司 | Ion implantation foil assembly |
CN110729159A (en) * | 2019-10-12 | 2020-01-24 | 武汉新芯集成电路制造有限公司 | Installation device of ion source |
CN114360991A (en) * | 2021-12-21 | 2022-04-15 | 北京凯世通半导体有限公司 | Carbon ion source device with reflector power supply |
CN219575557U (en) * | 2022-12-31 | 2023-08-22 | 北京凯世通半导体有限公司 | Arcing chamber structure of ion source for ion implanter |
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